ETC OMR117HVSR

OMR117 4/4/2000 11:46 AM Page 1
OMR117AHVSR OMR117AHVST OMR117AHVNM OMR117AHVNH
100 kRAD RADIATION TOLERANT 1.5 AMP
POSITIVE ADJUSTABLE VOLTAGE REGULATOR
100K Rad Tolerant Three Terminal,
Precision Adjustable Positive Voltage
Regulator In Hermetic Packages
Please see mechanical
outlines herein
FEATURES
•
•
•
•
•
•
•
•
Electrically Similar To Industry Standard LM117AHV
Adjustable Output Voltage
Built In Thermal Overload Protection
Short Circuit Current Limiting
Available In Four Hermetic Package Styles
Maximum Output Voltage Tolerance Is Guaranteed to + 1%
Radiation Tolerant up to 150 K Rad (Si)
Available Hi-Rel Screened, Class B and Class S, MIL-STD-883
DESCRIPTION
These three terminal positive regulators are supplied in high density hermetically sealed
packages and available Hi-Rel screened. All protective features are designed into the circuit,
including thermal shutdown, current-limiting, and safe-area control. With heat sinking, these
devices can deliver up to 1.5 amps of output current. These units also feature output voltages
that can be fixed from 1.2 volts to 57 volts using external resistors. These devices are ideally
suited for Space applications where small size, high reliability, and radiation tolerance is
required. The high level of Radiation Tolerance of these devices makes them a desirable
choice for LEO and many MEO and GEO communication satellites. Radiation testing is
performed on a single wafer by wafer basis. Random die samples per wafer are selected,
packaged and radiation tested to qualify each individual semiconductor wafer-by-wafer.
ABSOLUTE MAXIMUM RATINGS Tc @ 25°C
Power Dissipation: TO-205 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.1 W
TO-257/SMD/ D2 Pac . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 20 W
Input - Output Voltage Differential . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 60 V
Operating Junction Temperature Range . . . . . . . . . . . . . . . . . . . . . - 55°C to + 150°C
Storage Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . - 65°C to + 150°C
Lead Temperature (Soldering 10 seconds) . . . . . . . . . . . . . . . . . . . . . . . . . . . 300°C
Thermal Resistance, Junction to Case:
TO-205 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 17°C/W
TO-257(Isolated), D2 Pac (Isolated).. . . . . . . . . . . .. . . . . . . . . . . . . . . . . . . . . . 4.2°C/W
TO-257 (Non-Isolated) and SMD-1 . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 3.5°C/W
Maximum Output Current: TO-205. . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .5 A
Case-All Others . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 1.5A
Recommended Operating Conditions:
Output Voltage Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .1.2 to 57 VDC
Input Voltage Range . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4.25 to 61.25 VDC
Radiation Tolerant - Total Dose . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 K Rad (Si)
Surface Mount Package Soldering Temperature . . . . . . . . . . . . . . . . . . . . . . . . . . .250°C
0 04 R2
Supersedes 9 12 R1
OMR117 4/4/2000 11:46 AM Page 2
OMR117AHVSR, OMR117AHVST, OMR117AHVNM, OMR117AHVNH
ELECTRICAL CHARACTERISTICS
-55°C ≤ TA ≤ 125°C, IL = 8mA (unless otherwise specified)
Parameter
Symbol
Test Conditions
Min.
Max.
Reference Voltage
VREF
VDIFF = 3.0V, TA = 25°C
1.238
1.262
1.225
1.270
1.225
1.270
1.225
1.270
•
•
•
VDIFF = 3.3V
(Note 4)
VDIFF = 40V
VDIFF = 60V
Line Regulation
RLINE
3.0V ≤ VDIFF ≤ 40V, Vout = Vref, TA = 25°C
3.3V ≤ VDIFF ≤ 40V, Vout = Vref
(Note 1, 4)
40V ≤ VDIFF ≤ 60V, Vout = Vref
RLOAD
9
•
10
15
•
15
VDIFF = 40V, 10mA ≤ IL ≤ 300mA, TA = 25°C
VDIFF = 40V, 10mA ≤ IL ≤ 195mA
Thermal Regulation
15
15
Vin = 14.6V, IL = 1.5A
VRTH
mV
15
•
•
VDIFF = 60V, 10mA ≤ IL ≤ 30mA
mV
5
VDIFF = 3.0V, 10mA ≤ IL ≤ 1.5A, TA = 25°C
VDIFF = 3.3V, 10mA ≤ IL ≤ 1.5A
(Note 1, 4)
V
4.5
•
40V ≤ VDIFF ≤ 60V, Vout = Vref, TA = 25°C
Load Regulation
Unit
5
mV
Pd = 20 Watts, t = 20 ms, TA = 25°C
Ripple Rejection
RN
•
f = 120 Hz, Vout = Vref
66
dB
CAdj = 10 µF, Iout = 100 mA
Adjustment Pin
VDIFF = 3.0V, TA = 25°C
IAdj
100
•
•
•
VDIFF = 3.3V
Current
VDIFF = 40V
VDIFF = 60V
(Note 4)
Adjustment Pin
∆IAdj
100
5
•
5
VDIFF = 40V, 10mA ≤ IL ≤ 300mA, TA = 25°C
VDIFF = 40V, 10mA ≤ IL ≤ 195mA
5
•
5
3.0V ≤ VDIFF ≤ 40V, TA = 25°C
•
•
3.3V ≤ VDIFF ≤ 60V
ILmin
5
5
VDIFF = 3.0V, Vout = 1.4V (forced)
10
•
•
•
•
VDIFF = 3.3V, Vout = 1.4V (forced)
VDIFF = 40V, Vout = 1.4V (forced)
VDIFF = 60V, Vout = 1.4V (forced)
Current Limit
ICL
VDIFF = 5V
(Note 2, 4)
µA
5
3.3V ≤ VDIFF ≤ 40V
Minimum Load Current
µA
100
VDIFF = 3.0V, 10mA ≤ IL ≤ 1.5A, TA = 25°C
VDIFF = 3.3V, 10mA ≤ IL ≤ 1.5A
Current Change
100
mA
1.5
3.5
VDIFF = 40V, TA = 25°C
0.3
1.5
VDIFF = 60V, TA = 25°C
0.05
0.5
A
Notes:
1.Load and Line Regulation are measured at a constant junction temperature using a low duty cycle pulse technique.
Changes in output voltage due to heating effects must be taken into account separately.
2.If not tested, shall be guaranteed to the specified limits.
3.The • denotes the specifications which apply over the full temperature range.
4.Refer to curves for typical characteristics versus Total Dose Radiation Levels.
RADIATION TEST PROGRAM
The following chart is a summary of the test data collected on Radiation Tolerant
OMR117AHV at various doses. The chart depicts the Total Radiation Dose that
each device was exposed to on a step stress irradiation basis prior to failure. Failure
is defined as any electrical test that does not meet the limits of the device per the
published data sheet specifications after radiation testing.
Omnirel P/N
5K
10K
20K 30K
50K
60K
70K
80K
100K
150K 200K RAD
OMR117AHV
Test Points
X
X
X
X
OMR117 4/4/2000 11:46 AM Page 3
OMR117AHVSR, OMR117AHVST, OMR117AHVNM, OMR117AHVNH
OMNIREL’S RADIATION TEST PROCEDURE
•
•
•
•
•
•
•
Radiation Testing is performed on a single wafer by wafer basis.
Each wafer is identified and a random sample of 5 die per wafer is selected.
The die are then individually assembled in a hermetic package, data logged, electrically
tested, hi-rel screened and then submitted to radiation testing.
The packaged die are submitted to Steady State Total Dose radiation per Method 1019,
Condition A, at a dose rate of 50 RAD/sec biased at maximum supply voltage.
Final electrical test is performed within two hours of both Total Dose Radiation level from
a Cobalt 60 source and 168 hr, 100°C annealing process. Read and record data
including two non-radiated control samples.
The wafer is then qualified only if samples from wafers meet full electrical specifications
after 150% of total dose rating as specified in each product data sheet.
Omnirel’s controlling specifications are as follows: For Voltage Regulators the
controlling specification is MIL-PRF- 38534/MIL-STD-883. For Rectifiers/Schottky the
controlling specification is MIL-PRF-19500/MIL-STD-750.
AVAILABLE PRODUCT SCREENING
Standard Class Level Screening
Per MIL-PRF-38535
Screen
Wafer Lot Acceptance
Non-destructive Bond Pull
Pre-Cap Visual Inspection
Temperature Cycle
Constant Acceleration
Visual Inspection
PIND Test
Serialization
Pre-Burn-In Electrical
Burn-In
Interim Electrical
PDA Calculations
Final Electrical
Fine & Gross Seal
Radiographic
Conformance Inspection
Final Visual Inspection
*Level B
*Level S
Test Method
Required
Test Method
Required
--------2010
1010
2001
------------Data Sheet
1015/160 hrs.
----5% Functional
Data Sheet
1014
----GR A&B
2009
--------100%
100%
100%
100%
--------100%
100%
----Lot
100%
100%
----Sample
Sample
5007
----2010
1010
2001
----2020
----Data Sheet
1015/240hrs.
Data Sheet
5% Functional
Data Sheet
1014
2012/Two Views
GR A&B
2009
100%
----100%
100%
100%
100%
100%
100%
100%
100%
100%
Lot
100%
100%
100%
Sample
Sample
*Note: For “B” Level Screening add “M” to part number, for “S” Level Screening add “S” to part
number. See Part Number Designator.
OMR117 4/4/2000 11:46 AM Page 4
OMR117AHVSR, OMR117AHVST, OMR117AHVNM, OMR117AHVNH
TYPICAL RADIATION CURVES
STANDARD APPLICATION
Vout
Vin
OMR117AHV
* Cin is required if regulator is located an
appreciable distance from the power supply.
** Cout is not needed for stability, however it does
improve transient response.
Vout = 1.25 V (1 + R2/R1) + IAd j R2
Since IAdj is controlled to less than 100 µA,
the error associated with this term is negligible
in most applications.
R1
240Ω
IAdj
Adjust
Cin*
0.1 µF
Cout**
1.0 µF
R2
OMR117 4/4/2000 11:46 AM Page 5
OMR117AHVSR, OMR117AHVST, OMR117AHVNM, OMR117AHVNH
MECHANICAL OUTLINES
“H” P/N DESIGNATOR
“T” P/N DESIGNATOR
.200
.190
.420
.410
.045
.035
.665
.645
.150
.140
.537
.527
1 2 3
.430
.410
.038 MAX.
.750
.500
.035
.025
.005
.120 TYP.
.100 TYP.
TO-257AA
OMR117AHVST
Isolated/Front View
Pin 1
Pin 2
Pin 3
Tab
-
TO-205AF (TO-39)
OMR117AHVNH
Non-Isolated
Adjust
Output
Input
Isolated
Add “T” to part number for
TO-257 Package
Pin 1 Input
Pin 2 Adjust
Pin 3 Output (Case)
Add “H” to part number for TO-205 Package
“M” P/N DESIGNATOR
“R” P/N DESIGNATOR
.140
.015
.450
.140
.140
1
2
.050
.157
.050
.030
MIN.
.625
3
.415
.037
TOP VIEW
SIDE VIEW
Hermetic
Pac
OMR117AHVSR
Isolated
SMD-1
Front View
Pin 1 - Adjust
Pin 2 - Output
Pin 3 - Input
Tab - Isolated
Add “R” to part number for
D2 Pac Package
Omnirel
Rad-Tolerant
BOTTOM VIEW
OMR117AHVNM
D2
OMR
.375
Pin 1 - Adjust
Pin 2 - Input
Pin 3 - Output
Add “M” to part number for
SMD (Surface Mount Package)
PART NUMBER DESIGNATOR
(Example OMR117AHVSTM)
117
AHV
S
Device
Type
1% Hi-Volt
Isolated
Package
T
M
Package
Style
Screening
Level
OMR117 4/4/2000 11:46 AM Page 6
THANK YOU FOR YOUR INTEREST IN
OMNIREL’S PRODUCTS!
205 Crawford Street, Leominster, MA 01453 USA (978) 534-5776 FAX (978) 537-4246
Visit Our Web Site at www.omnirel.com