MCNIX MX28F2100B

PRELIMINARY
MX28F2100B
2M-BIT [256K x 8/128K x 16] CMOS FLASH MEMORY
FEATURES
• 262,144x8/131,072x16 switchable
• Fast access time: 70/90/120ns
• Low power consumption
– 50mA maximum active current
– 100uA maximum standby current
• Programming and erasing voltage 12V ± 7%
• Command register architecture
– Byte/Word Programming (50 us typical)
– Auto chip erase 5 sec typical
(including preprogramming time)
– Block Erase (Any one from 5 blocks:16K-Byte x1,
8K-Byte x2, 96K-Byte x1, and 128K-Byte x1)
– Auto Erase with Erase Suspend capability
• Status Register feature for Device status detection
• Auto Erase (chip & block) and Auto Program
– Status Registers
• 10,000 minimum erase/program cycles
• Latch-up protected to 100mA from -1 to VCC+1V
• Package type:
– 44-pin SOP
– 48-pin TSOP (Type 1)
GENERAL DESCRIPTION
perform the High Reliability Erase and auto Program/
Erase algorithms.
The MX28F2100B is a 2-mega bit Flash memory organized as 256K bytes of 8 bits or 128K words of 16
bits switchable. MXIC's Flash memories offer the
most cost-effective and reliable read/write nonvolatile random access memory. The MX28F2100B
is packaged in 44-pin SOP and 48-pin TSOP(I). It is
designed to be reprogrammed and erased in-system
or in-standard EPROM programmers.
The highest degree of latch-up protection is
achieved with MXIC's proprietary non-epi process.
Latch-up protection is proved for stresses up to 100
milliamps on address and data pin from -1V to VCC
+ 1V.
The standard MX28F2100B offers access times as
fast as 70ns, allowing operation of high-speed
microprocessors without wait states. To eliminate
bus contention, the MX28F2100B has separate chip
enable (CE) and output enable (OE ) controls.
BLOCK STRUCTURE
A16~A0
128 K-BYTE BLOCK
MXIC's Flash memories augment EPROM functionality with in-circuit electrical erasure and
programming. The MX28F2100B uses a command
register to manage this functionality. The command
register allows for 100% TTL level control inputs and
fixed power supply levels during erase and
programming, while maintaining maximum EPROM
compatibility.
10000H
0FFFFH
96 K-BYTE BLOCK
04000H
03FFFH
03000H
02FFFH
02000H
01FFFH
MXIC Flash technology reliably stores memory contents even after 10,000 erase and program cycles.
The MXIC cell is designed to optimize the erase and
programming mechanisms. In addition, the combination of advanced tunnel oxide processing and low
internal electric fields for erase and programming
operations produces reliable cycling.
The
MX28F2100B uses a 12.0V ± 7% VPP supply to
P/N: PM0382
1FFFFH
8 K-BYTE BLOCK
8 K-BYTE BLOCK
16 K-BYTE BLOCK
00000H
Word Mode (x16) Memor y Map
*Byte Mode operation should include
A-1(LSB) for addressing
1
REV. 1.5, MAR. 24, 1998
MX28F2100B
PIN CONFIGURATIONS
TSOP (TYPE 1) (12mm x 20mm)
VPP
NC
NC
A7
A6
A5
A4
A3
A2
A1
A0
CE
GND
OE
Q0
Q8
Q1
Q9
Q2
Q10
Q3
Q11
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
MX28F2100B
44 SOP(500 mil)
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
RP
WE
A8
A9
A10
A11
A12
A13
A14
A15
A16
BYTE
GND
Q15/A-1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
A15
A14
A13
A12
A11
A10
A9
A8
NC
NC
WE
RP
VPP
NC
NC
NC
NC
A7
A6
A5
A4
A3
A2
A1
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
MX28F2100B
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
A16
BYTE
GND
Q15/A-1
Q7
Q14
Q6
Q13
Q5
Q12
Q4
VCC
Q11
Q3
Q10
Q2
Q9
Q1
Q8
Q0
OE
GND
CE
A0
(NORMAL TYPE)
PIN DESCRIPTION:
SYMBOL
PIN NAME
A0~A16
Address Input
Q0~Q14
Data Input/Output
Q15/A-1
Q15(Word mode)/LSB addr(Byte mode)
CE
Chip Enable Input
WE
Write Enable Input
BYTE
Word/Byte Selction input
RP
Reset/Deep Power Down
OE
Output Enable Input
VPP
Power supply for Program and Erase
VCC
Power Supply Pin (+5V)
GND
Ground Pin
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MX28F2100B
BLOCK DIAGRAM
CE
OE
WE
BYTE
RP
CONTROL
INPUT
HIGH VOLTAGE
LOGIC
LATCH
BUFFER
Y-DECODER
AND
X-DECODER
ADDRESS
Q15/A-1
A0-A16
PROGRAM/ERASE
WRITE
STATE
MACHINE
(WSM)
STATE
REGISTER
MX28F2100B
FLASH
ARRAY
Y-PASS GATE
SENSE
AMPLIFIER
PGM
DATA
HV
ARRAY
SOURCE
HV
COMMAND
DATA
DECODER
COMMAND
DATA LATCH
PROGRAM
DATA LATCH
Q0-Q15/A-1
I/O BUFFER
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MX28F2100B
AUTOMATIC PROGRAMMING
AUTOMATIC ERASE ALGORITHM
The MX28F2100B is byte/word programmable using
the Automatic Programming algorithm. The Automatic
Programming algorithm does not require the system to
time out or verify the data programmed. The typical
room temperature chip programming time of the
MX28F2100B is less than 5 seconds.
MXIC's Automatic Erase algorithm requires the user to
only write an Erase Set-up command and an Erase
command. The device will automatically pre-program
and verify the entire array. Then the device automatically times the erase pulse width, provides the erase
verify, and counts the number of sequences. A status
register provides feedback to the user as to the status
of the erase operation. It is noted that after an Erase
Set-up command, if the next command is not an Erase
command, then the state-machine will set both the
program status and Erase Status bits of the Status
Register to a "1", place the device into the read Status
Register state, and wait for another command.
AUTOMATIC CHIP ERASE
The entire chip is bulk erased using 10 ms erase
pulses according to MXIC's High Reliability Chip Erase
algorithm. Typical erasure at room temperature is
accomplished in less than five seconds. The device
may also be erased using the Automatic Erase
algorithm. The Automatic Erase algorithm automatically programs the entire array prior to electrical erase.
The timing and verification of electrical erase are
controlled internally.
Commands are written to the command register using
standard microprocessor write timings. Register contents serve as inputs to an internal state-machine
which controls the erase and programming circuitry.
During write cycles, the command register internally
latches address and data needed for the programming
and erase operations. During a system write cycle,
addresses are latched on the falling edge, and data is
latched on the rising edge of WE .
AUTOMATIC BLOCK ERASE
MXIC's Flash technology combines years of EPROM
experience to produce the highest levels of quality, reliability, and cost effectiveness. The MX28F2100B electrically erases all bits within a sector or chip simultaneously
using Fowler-Nordheim tunneling. The array is programmed one byte/word at a time using the EPROM
programming mechanism of hot electron injection.
The MX28F2100B is block(s) erasable using MXIC's
Auto Block Erase algorithm. Block erase modes allow
one of 5 blocks of the array to be erased in one erase
cycle. The Automatic Block Erase algorithm automatically programs the specified block(s) prior to electrical
erase. The timing and verification of electrical erase
are controlled internal to the device.
During a program cycle, the state-machine will control the
program sequences and command register will not respond to any command set. During a Sector/Chip Erase
cycle, the command register will respond to Erase Suspend command. After Erase Suspend completed, the
device stays at status register Read state. After the state
machine has completed its task, it will allow the command
register to respond to its full command set.
AUTOMATIC PROGRAMMING ALGORITHM
MXIC's Automatic Programming algorithm requires
the user to only write a program set-up command and
a program command (program data and address). The
device automatically times the programming pulse
width, provides the program verify, and counts the
number of sequences. A status register scheme provides feedback to the user as to the status of the
programming operation.
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MX28F2100B
TABLE 1. SOFTWARE COMMAND DEFINITIONS
COMMAND
BUS
CYCLE
Mode
FIRST BUS CYCLE
Address
Data
X8
X16
Read Memory Array
1
Write
X
Setup Auto program/
2
Write
X
FFH
Auto Program
Mode
XXFFH
--Write
10H
XX10H
or 40H
or XX40H
SECOND BUS CYCLE
Address
Data
X8
X16
---
---
---
Program Program Program
Address
Data
Data
Setup Erase/Erase(Chip)
2
Write
X
20H
XX20H
Write
X
20H
XX20H
Setup Erase/Erase(Block)
2
Write
X
60H
XX60H
Write
Block
60H
XX60H
Setup Auto Erase/
2
Write
X
30H
XX30H
Write
X
30H
XX30H
2
Write
X
20H
XX20H
Write
Block
D0H
XXD0H
2
Write
Verify
A0H
XXA0H
Read
Verify
Verify
Data
Data
Address
Auto Erase(Chip)
Setup Auto Erase/
Auto Erase(Block)
Erase Verify
Address
X
Address
Read device identifier code
2
Write
X
90H
XX90H
Read
ADI
DDI
DDI
Erase Suspend
1
Write
X
B0H
XXB0H
---
---
---
---
Erase Resume
1
Write
X
D0H
XXD0H
---
---
---
---
Read Status Register
2
Write
X
70H
XX70H
Read
X
SRD
SRD
Clear Status Register
1
Write
X
50H
XX50H
---
---
---
---
Note:
1. Write and Read mode are defined in mode selection table.
2. ADI = Address of Device identifier; A0 = 0 for manufacture code, A0 = 1 for device code.
DDI = Data of Device identifier : C2H for manufacture code, 2BH for device code(Byte = VIL) ; 00C2H for
manufacture code, 002BH for device code(Byte =VIH)
X = X can be VIL or VIH
SRD = Status Register Data
COMMAND DEFINITIONS
Placing high voltage on the VPP pin enables read/write
operations. Device operations are selected by writing
specific data patterns into the command register. Table 1 defines these MX28F2100B register commands.
Table 2 defines the bus operations of MX28F2100B.
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MX28F2100B
TABLE 2. MX28F2100B BUS OPERATION
Pins
A0
A9
CE
OE
WE
VPP
Data I/O
Mode
Byte
D0~D7
D8~D14
D15/A-1
Read
A0
A9
VIL
VIL VIH
VPPL
Data Out
Hi-Z
A-1
Output Disable
X
X
VIL
VIH VIH
VPPL
Hi-Z
Hi-Z
X
X
X
VIH
VPPL
Hi-Z
Hi-Z
X
Read-Only Standby
X
X
Mode
Read Silicon ID(Mfr)(2)
VIL VID(3) VIL
VIL VIH
VPPL
Data=C2H
Hi-Z
VIL
BYTE
Read Silicon ID(Device)(2) VIH VID(3) VIL
VIL VIH
VPPL
Data=2BH
Hi-Z
VIL
=L
Read
A0
A9
VIL
VIL VIH VPPH Data Out(4)
Hi-Z
A-1
X
X
VIL
VIH VIH VPPH
Hi-Z
Hi-Z
X
Standby(5)
X
X
VIH
VPPH
Hi-Z
Hi-Z
X
Write
A0
A9
VIL
VIH VIL
VPPH
Data In(6)
X
A-1
Read
A0
A9
VIL
VIL VIH
VPPL
Data Out
Data Out
Data Out
X
X
VIL
VIH VIH
VPPL
Hi-Z
Hi-Z
Hi-Z
X
X
VIH
VPPL
Hi-Z
Hi-Z
Hi-Z
Read/Write Output Disable
Read-Only Output Disable
X
X
Word
Standby
X
X
Mode
Read Silicon ID(Mfr)(2)
VIL VID(3) VIL
VIL VIH
VPPL
Data=C2H Data=00H(8)
0B
BYTE
Read Silicon ID(Device)(2) VIH VID(3) VIL
VIL VIH
VPPL
Data=2BH Data=00H(8)
0B
=H
Read
A0
A9
VIL
VIL VIH VPPH Data Out(4)
X
X
VIL
VIH VIH VPPH
Standby(5)
X
X
VIH
Write
A0
A9
VIL
Read/Write Output Disable
NOTES:
1. VPPL may be grounded, a no-connect with a resistor tied
to ground, or < VCC + 2.0V. VPPH is the programming
voltage specified for the device. When VPP = VPPL,
memory contents can be read but not written or erased.
2. Manufacturer and device codes may also be accessed
via a command register write sequence. Refer to Table
1. All other addresses are low.
X
X
VIH VIL
Data Out
Data Out
Hi-Z
Hi-Z
Hi-Z
VPPH
Hi-Z
Hi-Z
Hi-Z
VPPH
Data In(6)
Data In(6) Data In(6)
3. VID is the Silicon-ID-Read high voltage, 11.5V to 13V.
4. Read operations with VPP = VPPH may access array
data or Silicon ID codes.
5. With VPP at high voltage, the standby current equals ICC
+ IPP (standby).
6. Refer to Table 1 for valid Data-In during a write operation.
7. X can be VIL or VIH.
8. Includes D15
TABLE 3. SILICON ID CODE
Pins A0 D15 D14 D13 D12 D11 D10 D9 D8 D7 D6 D5 D4 D3 D2 D1 D0
Code(Hex)
Code
BYTE
Manufacture code
VIL VIL ---
---
---
---
---
---
---
1
1
0
0
0
0
1
0
C2H
=L
Device code
VIH VIL ---
---
---
---
---
---
---
0
0
1
0
1
0
1
1
2BH
BYTE
Manufacture code
VIL
0
0
0
0
0
0
0
0
1
1
0
0
0
0
1
0
00C2H
=H
Device code
VIH
0
0
0
0
0
0
0
0
0
0
1
0
1
0
1
1
002BH
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MX28F2100B
READ COMMAND
ERASE-VERIFY COMMAND
While VPP is high, for erasure and programming,
memory contents can also be accessed via the Read
command. The read operation is initiated by writing
XXFFH into the command register. Microprocessor
read cycles retrieve array data. The device remains
enabled for reads until the command register contents
are altered.
After each erase operation, all bytes must be verified.
The Erase Verify operation is initiated by writing
XXA0H into the command register. The address for
the byte to be verified must be supplied as it is latched
on the falling edge of the WE pulse.
The MX28F2100B applies an internally generated
margin voltage to the addressed byte. Reading
FFFFH from the addressed byte indicates that all bits
in the byte are erased.
RESET COMMAND
The Erase-Verify command must be written to the
command register prior to each byte verification to
latch its address. The process continues for each byte
in the array until a byte does not return FFFFH data, or
the last address is accessed.
A Reset command is provided as a means to safely
abort the erase- or program-command sequences.
Following Set-up command with two consecutive
writes of XXFFH for ERS (or one write of XXFFH for
PGM) will safely abort the operation. Memory contents
will not be altered. A valid command must then be
written to place the device in the desired state.
In the case where the data read is not FFFFH, another
erase operation needs to be performed. (Refer to Setup Erase/Erase). Verification then resumes from the
address of the last-verified byte. Once all bytes in the
array have been verified, the erase step is complete.
The device can be programmed. At this point, the
verify operation is terminated by writing a valid
command (e.g. Program Set-up) to the command
register. The High Reliability Erase algorithm
illustrates how commands and bus operations are
combined to perform electrical erasure of the
MX28F2100B.
SILICON-ID-READ COMMAND
Flash-memories are intended for use in applications
where the local CPU alters memory contents. As such,
manufacturer- and device-codes must be accessible
while the device resides in the target system. PROM
programmers typically access signature codes by raising A9 to a high voltage. However, multiplexing high
voltage onto address lines is not a desired systemdesign practice.
The MX28F2100B contains a Silicon-ID-Read
operation to supplement traditional PROMprogramming methodology. The operation is initiated
by writing XX90H into the command register.
Following the command write, a read cycle with
A0=VIL retrieves the manufacturer code of
C2H(BYTE=VIL, 00C2H(BYTE=VIH). A read cycle
with A0=VIH returns the device code of 2BH(BYTE =
VIL), 002BH(BYTE = VIH).
SET-UP AUTOMATIC CHIP ERASE/ERASE
COMMANDS
The Automatic Chip Erase does not require the device
to be entirely pre-programmed prior to excuting the
Automatic Set-up Erase command and Automatic Chip
Erase command. Upon executing the Automatic Chip
Erase command, the device automatically will
program and verify the entire memory for an all-zero
data pattern. When the device is automatically verified
to contain an all-zero pattern, a self-timed chip erase
and verify begin. The erase and verify operations are
completed by the feed back of the status register. The
system is not required to provide any control or timing
during these operations.
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MX28F2100B
When using the Automatic Chip Erase algorithm, note
that the erase automatically terminates when
adequate erase margin has been achieved for the
memory array(no erase verify command is required).
The margin voltages are internally generated in the
same manner as when the standard Erase Verify
command is used.
When using the Automatic Block Erase algorithm, note
that the erase automatically terminates when adequate
erase margin has been achieved for the memory array
(no erase verify command is required). The margin
voltages are internally generated in the same manner
as when the standard Erase Verify command is used.
The Automatic Set-up Block Erase command is a command only operation that stages the device for automatic electrical erasure of selected blocks in the array.
Automatic Set-up Block Erase is performed by writing
XX20H to the command register. To enter Automatic
Block Erase, the user must write the command D0H to
the command register. Block addresses selected are
loaded into internal register on the second falling edge
of WE. Each successive block load cycle started by the
falling edge of WE must begin within 30us from the
rising edge of the preceding WE. Otherwise, the
loading period ends and internal auto block erase cycle
starts.
If the Erase operation was unsuccessful, bit 5 of the
Status Register will be set to a "1", indicating an Erase
Failure. If Vpp was not within acceptable limits after
the Erase command is issued, the state machine will
not execute an erase sequence; in stead, bit 5 of the
Status Register is set to a "1" to indicate an Erase
Failure, and bit 3 is set to a "1" to indentify that Vpp
supply voltage was not within acceptable limits.
The Automatic Set-up Erase command is a command
only operation that stages the device for automatic
electrical erasure of all bytes in the array. Automatic
set-up erase is performed by writing XX30H to the
command register.
ERASE SUSPEND
To commence Automatic Chip Erase, the command
XX30H must be written again to the command register.
This command only has meaning while the state machine is executing Automatic Chip/Block Erase operation, and therefore will only be responded to during
Automatic Chip/Block Erase operation. It is noted that
Erase Suspend is meaningful for block erase only after
block addresses load are finished (100 us after the last
address is loaded). After this command has been executed, the command register will initiate erase suspend mode. The state machine will set DQ7, DQ6 as 1,
1, after suspend is ready. At this time, state machine
only allows the command register to respond to the
Read Memory Array, Erase Resume and Read Status
Register.
SET-UP AUTOMATIC BLOCK ERASE/ERASE
COMMANDS
The Automatic Block Erase does not require the device
to be entirely pre-programmed prior to executing the
Automatic Set-up Block Erase command and
Automatic Block Erase command. Upon executing the
Automatic Block Erase command, the device
automatically will program and verify the block(s)
memory for an all-zero data pattern. The system is not
required to provide any controls or timing during these
operations.
When the block(s) is automatically verified to contain
an all-zero pattern, a self-timed block erase and verify
begin. The system is not required to provide any
control or timing during these operations.
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MX28F2100B
ERASE RESUME
The Status Register bits are output on DQ[0:7],
whether the device is in the byte-wide (x8) or wordwide (x16) mode. In the word-wide mode the upper
byte, DQ[8:15], is set to 00H during a Read Status
command. In the byte-wide mode, DQ[8:14] are tristated and DQ15/A-1 retains the low order address
function.
This command will cause the command register to clear
the suspend state and set DQ6, DQ7, back to 0, 0, but
only if an Erase Suspend command was previously
issued. Erase Resume will not have any effect in all other
conditions.
The contents of the Status Register are latched on the
falling edge of OE or CE, whichever occurs last in the
read cycle. This prevents possible bus errors which
might occur if the contents of the Status Register
change while reading the Status Register. CE or OE
must be toggled with each subsequent status read, or
the completion of a Program or Erase operation will not
be evident from the Status Register.
SET-UP AUTOMATIC PROGRAM/PROGRAM
COMMANDS
The Automatic Set-up Program is a command only
operation that stages the device for automatic programming. Automatic Set-up Program is performed by
writing XX10H/XX40H to the command register.
Program command is the command for byte-program
or word-program.
When the state machine is active, this register will
indicate the status of the state machine, and will also
hold the bits indicating whether or not the state
machine was successful in performing the desired
operation.
Once the Automatic Set-up Program operation is performed, the next WE pulse causes a transition to an
active programming operation. Addresses are latched
on the falling edge, and data are internally latched on
the rising edge of the WE pulse. The rising edge of WE
also begins the programming operation. The system is
not required to provide further controls or timings. The
device will automatically provide an adequate
internally generated program pulse and verify margin.
CLEARING THE STATUS REGISTER
The state machine sets status bits "3" through "7" to
"1", and clears bits "6" and "7" to "0", but cannot clear
status bits "3" through "5" to "0". Bits 3 through 5 can
only be cleared by the controlling CPU through the use
of the Clear Status Register command. These bits can
indicate various error conditions. By allowing the
system software to control the resetting of these bits,
several operations may be performed (such as
cumulatively programming several bytes or erasing
multiple blocks in sequence). The Status Register may
then be read to determine if an error occurred during
that programming or erasure series. This adds
flexibility to the way the device may be programmed or
erased. Once an error occured, the command
Interface Only responds to clear Status Register, Read
Status Register and Read Array. To clear the Status
Register, the Clear Status Register command is written
to the command interface. Then, any other command
may be issued to the command interface. Note, again,
that before read cycle can be initiated, a Read Array
command must be written to the command interface to
specify whether the read data is to come from the
Memory Array, Status Register, or Sili-con -ID.
If the program opetation was unsuccessful, bit 4 of the
Status Register will be set to a "1", indicating a
program failure. If Vpp was not within acceptable limits
after the program command is issued, the state
machine will not execute a program sequence; in
stead, bit 4 of the Status Register is set to a "1" to
indicate a Program Failure, and bit 3 is set to a "1" to
identify that Vpp supply voltage was not within
acceptable limits.
STATUS REGISTER
The device contains a Status Register which may be
read to determine when a Program or Erase operation
is complete, and whether that operation completed
successfully. The Status Register may be read at any
time by writing the Read Status command to the
command interface. After writing this command, all
subsequent Read operations output data from the
Status Register until another command is written to the
command interface. A Read Array command must be
written to the command interface to return to the read
array mode.
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MX28F2100B
Status Register Bit Definition
WSMS
ESS
ES
PS
VPPS
7
6
5
4
3
SR.7 = WRITE STATE MACHINE STATUS(WSMS)
1 = Ready
0 = Busy
NOTE :
State machine bit must first be checked to determine
Byte/Word program or Block Erase completion, before
the Program or Erase Status bits are checked for success.
When Erase Suspend is issued, state machine halts
execution and sets both WSMS and ESS bits to "1," ESS
bit remains set to "1" until an Erase Resume command is
issued.
SR.6 = ERASE-SUSPEND STATUS (ESS)
1 = Erase Suspended
0 = Erase in Progress/Completed
SR.5 = ERASE STATUS
1 = Error in Erase
0 = Successful Erasure
When this bit set to "1," state machine has applied the
maximum number of erase pulses to the device and is still
unable to successfully verify erasure.
SR.4 = PROGRAM STATUS
1 = Error in Byte/Word Program
0 = Successful Byte/Word Program
When this bit is set to "1," state machine has attempted
but failed to program a byte or word.
SR.3 = Vpp STATUS
1 = Vpp Low Detect, Operation Abort
0 = Vpp OK
The Vpp status bit, unlike an A/D converter, does not
provide continuous indication of Vpp level. The state
machine interrogates Vpp level only after the Byte Write
or Erase command sequences have been entered, and
informs the system if Vpp has not been switched on.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
10
MX28F2100B
DATA PROTECTION
POWER SUPPLY DECOUPLING
The MX28F2100B is designed to offer protection against
accidental erasure or programming caused by spurious
system level signals that may exist during power transition.
During power up the device automatically resets the state
machine in the Read mode. In addition, with its control
register architecture, alteration of the memory contents
only occurs after successful completion of specific
command sequences. The device also incorporates
several features to prevent inadvertent write cycles
resulting from VCC power-up and power-down transition
or system noise.
In order to reduced power switching effect, each device
should have a 0.1uF ceramic capacitor connected between
its VCC and GND, and between its VPP and GND.
VPP TRACE ON PRINTED CIRCUIT BOARD
Programming flash memories, while they reside in the
target system, requires that the printed circuit board
designer pay attention to the Vpp power supply trace.
The Vpp pin supplies the memory cell current for
programming. Use similar trace widths and layout
considerations given to the Vcc power bus. Adequate
Vpp supply traces and decoupling will decrease Vpp
voltage spikes and overshoots.
LOW VPP WRITE INHIBIT
To avoid initiation of a write cycle during VPP power-up
and power-down a write cycle is locked out for VPP less
DEEP POWER DOWN MODE
than VPPLK(typically 9V). If VPP < VPPLK, the command
register is disabled and all internal program/erase circuits
are disabled. Subsequent writes will be ignored until the
This mode is enabled by RP pin. During Read modes, RP
going low deselects the memory and place the output
drivers in a high-Z state.
VPP level is greater than VPPLK. It is the user's responsibility
to ensure that the control pins are logically correct to
In erase or program modes, RP low will abort erase or
program operations, but the memory contents are no
longer valid as the data has been corrupted by RP
function. RP transition to VIL, or turning power off to the
device will clear up Status Register and automatically
defaults to the read array mode.
prevent unintentional write when VPP is above VPPLK.
WRITE PULSE "GLITCH" PROTECTION
Noise pulses of less than 5ns(typical) on CE or WE will not
initiate a write cycle.
POWER-UP SEQUENCE
LOGICAL INHIBIT
The MX28F2100B powers up in the Read only mode. In
addition, the memory contents may only be altered after
successful completion of a two-step command sequence.
Vpp and Vcc power up sequence is not required.
Writing is inhibited by holding any one of OE = VIL, CE =
VIH or WE = VIH. To initiate a write cycle CE and WE must
be a logical zero while OE is a logical one.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
11
MX28F2100B
NOTICE:
Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operational
sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended period may
affect reliability.
ABSOLUTE MAXIMUM RATINGS
RATING
VALUE
Ambient Operating Temperature
0oC to 70oC
Storage Temperature
-65oC to 125oC
Applied Input Voltage
-0.5V to 7.0V
Applied Output Voltage
-0.5V to 7.0V
VCC to Ground Potential
-0.5V to 7.0V
A9 & VPP & RP
-0.5V to 13.5V
NOTICE:
Specifications contained within the following tables are subject to change.
SWITCHING VCC VOLTAGES
VCC SUPPLY SWITCHING TIMING
SYMBOL
PARAMETER
MIN.
T5VPH
VCC at 4.5V (minimum) to RP High
3
MAX.
UNIT
ms
NOTICE:
The T5VPH time must be strictly followed to guarantee all
other read and write specifications.
VCC SUPPLY SWITCHING WAVEFORM
VCC
5.0V
GND
RP
t5VPH
VIH
VIL
CAPACITANCE TA = 25oC, f = 1.0 MHz
SYMBOL
PARAMETER
CIN
COUT
MIN.
TYP
MAX.
UNIT
CONDITIONS
Input Capacitance
8
pF
VIN = 0V
Output Capacitance
12
pF
VOUT = 0V
REV. 1.5, MAR. 24, 1998
P/N: PM0382
12
MX28F2100B
READ OPERATION
DC CHARACTERISTICS TA = 0oC TO 70oC, VCC = 5V ± 10%, VPP = GND to VCC
SYMBOL
ILI
PARAMETER
Input Leakage Current
ILO
Output Leakage Current
IPP1
VPP Current
ISB1
Standby VCC current
MIN.
TYP
1
ISB2
ICC1
1
Operating VCC current
ICC2
MAX.
1
UNIT
uA
CONDITIONS
VIN = GND to VCC
10
uA
VOUT = GND to VCC
100
uA
VPP = 5.5V
1
mA
CE = VIH
100
uA
CE = VCC + 0.3V
50
mA
IOUT = 0mA, f=1MHz
70
mA
IOUT = 0mA, f=10MHz
VIL
Input Low Voltage
-0.3(NOTE 1)
0.8
V
VIH
Input High Voltage
2.0
VCC + 0.3
V
VOL
Output Low Voltage
0.45
V
IOL = 2.1mA
VOH
Output High Voltage
V
IOH = -400uA
2.4
NOTES:
1. VIL min. = -1.0V for pulse width < 50 ns.
VIL min. = -2.0V for pulse width < 20 ns.
2. VIH max. = VCC + 1.5V for pulse width < 20 ns
If VIH is over the specified maximum value, read operation
cannot be guaranteed.
AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 5V ± 10%, VPP = GND to VCC
28F2100B-70
28F2100B-90
28F2100B-12
MIN.
MIN.
MIN.
SYMBOL
PARAMETER
MAX.
tACC
Address to Output Delay
70
tCE
CE to Output Delay
tOE
OE to Output Delay
tDF
OE High to Output Float (Note1)
0
MAX. UNIT
CONDITIONS
90
120
ns
CE=OE=VIL
70
90
120
ns
OE=VIL
30
40
50
ns
CE=VIL
30
ns
CE=VIL
tOH
Address to Output hold
0
ns
CE=OE=VIL
20
0
0
MAX.
30
0
0
TEST CONDITIONS:
NOTE:
• Input pulse levels: 0.45V/2.4V
1. tDF is defined as the time at which the output achieves the
• Input rise and fall times: < 10ns
open circuit condition and data is no longer driven.
• Output load: 1 TTL gate + 35pF (Including scope and jig)
• Reference levels for measuring timing: 0.8V, 2.0V
REV. 1.5, MAR. 24, 1998
P/N: PM0382
13
MX28F2100B
BYTE READ TIMING WAVEFORMS
A-1~16
VIH
ADD Valid
VIL
RP
tCE
CE
VIH
VIL
WE
VIH
VIL
OE
tDF
tOE
VIH
tACC
VIL
BYTE
tOH
VIH
VIL
DATA
Q0~7
VOH
DATA
Q8~14
VOH
HIGH Z
DATA Valid
HIGH Z
VOL
HIGH Z
HIGH Z
VOL
WORD READ TIMING WAVEFORMS
A0-16
VIH
ADD VALID
VIL
RP
tCE
CE
VIH
STANDBY MODE
STANDBY MODE
ACTIVE MODE
VIL
tDF
WE
VIH
VIL
OE
tOE
VIH
tACC
VIL
tOH
BYTE
VIH
VIL
DATA
Q0-15
VOH
HIGH Z
DATA VALID
HIGH Z
VOL
REV. 1.5, MAR. 24, 1998
P/N: PM0382
14
MX28F2100B
COMMAND PROGRAMMING/DATA PROGRAMMING/ERASE OPERATION
DC CHARACTERISTICS TA = 0oC to 70oC, VCC = 5V ± 10%, VPP = 12V ± 7%
SYMBOL
PARAMETER
ILI
MIN.
TYP
MAX.
UNIT
CONDITIONS
Input Leakage Current
1
uA
VIN=GND to VCC
ILO
Output Leakage Current
10
uA
VOUT=GND to VCC
ISB1
Standby VCC current
1
mA
CE=VIH
100
uA
CE=VCC ± 0.3V
50
mA
IOUT=0mA, f=1MHz
ICC2
70
mA
IOUT=0mA, F=10MHz
ICC3 (Program)
50
mA
In Programming
ICC4 (Erase)
50
mA
In Erase
mA
CE=VIH, Erase Suspended
200
uA
VPP=12.8V
IPP2 (Program)
50
mA
In Programming
IPP3 (Erase)
50
mA
In Erase
-0.3 (Note 5)
0.8
V
2.0
VCC+0.3V V
ISB2
ICC1 (Read)
1
Operating VCC Current
ICCES
VCC Erase Suspend Current
IPP1 (Read)
VPP Current
VIL
Input Voltage
VIH
10
(Note 6)
VOL
Output Voltage
VOH
0.45
2.4
VPPLK
VPP Lockout Voltage
0.0
VPPH
VPP for Program/Erase Operation 11.16
V
IOL=2.1mA
V
IOH=-400uA
6
V
12.84
V
12V ± 7%
NOTES:
1. VCC must be applied before VPP and remove after VPP.
5. VIL min. = -0.6V for pulse width < 20ns.
2. VPP must not exceed 14V including overshoot.
6. If VIH is over the specified maximum value, programming
3. An influence may be had upon device reliability if the device
operation cannot be guranteed.
is installed or removed while VPP=12V.
7. ICCES is specified with the device de-selected. If the device
4. Do not alter VPP either VIL to 12V or 12V to VIL when
is read during erase suspend mode, current draw is the sum
CE=VIL.
of ICCES and ICC1 or ICC2.
8. All current are in RMS unless otherwisw noted.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
15
MX28F2100B
AC CHARACTERISTICS TA = 0oC to 70oC, VCC = 5V ± 10%, VPP =12V ± 7%
28F2100B-70
SYMBOL
PARAMETER
MIN.
tVPS
VPP setup time
100
28F2100B-90
MAX. MIN.
MAX. MIN.
100
tPHEL
1000
28F2100B-12
MAX. UNIT CONDITIONS
100
1000
ns
1000
ns
tOES
OE setup time
100
100
100
ns
tCWC
Command programming cycle
70
90
120
ns
tCEP
WE programming pulse width
50
50
50
ns
tCEPH1
WE programming pluse width High
20
20
20
ns
tCEPH2
WE programming pluse width High
100
100
100
ns
tAS
Address setup time
0
0
0
ns
tAH
Address hold time
45
50
50
ns
tDS
Data setup time
45
50
50
ns
tDH
Data hold time
10
10
10
ns
tCES
CE setup time
0
0
0
ns
tCESC
CE setup time before command write
100
100
100
ns
tCESV
CE setup time before verify
6
6
6
us
tVPH
VPP hold time
100
100
100
ns
tDF
Output disable time (Note 2)
20
30
30
ns
tVA
Verify access time
70
90
120
ns
tAETC
Total erase time in auto chip erase
5(TYP.)
5(TYP.)
5(TYP.)
s
tAETB
Total erase time in auto block erase
1(TYP.)
1(TYP.)
1(TYP.)
s
tAVT
Total programming time in auto verify
50
tET
Standby time in erase
10
tBALC
Block address load cycle
0.3
tBAL
Block address load time
100
100
100
us
tCH
CE Hold Time
0
0
0
ns
tCS
CE setup to WE going low
0
0
0
ns
1600
50
1600
10
30
0.3
50
1600
10
30
0.3
us
ms
30
us
NOTES:
1. CE and OE must be fixed high during VPP transition from 5V to 12V or from 12V to 5V.
2. tDF defined as the time at which the output achieves the open circuit condition and data is no longer driven.
3. tPHEL: RP high recovery to CE going low: 500ns, Max 1000ns.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
16
MX28F2100B
SWITCHING TEST CIRCUITS
DEVICE UNDER
TEST
1.8K ohm
+5V
CL
6.2K ohm
DIODES=IN3064
OR EQUIVALENT
CL=35pF Including jig capacitance
SWITCHING TEST WAVEFORMS
2.4 V
2.0V
2.0V
TEST POINTS
0.8V
0.8V
0.45 V
OUTPUT
INPUT
AC TESTING: Inputs are driven at 2.4V for a logic "1" and 0.45V for a logic "0".
Input pulse rise and fall times are <20ns.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
17
MX28F2100B
COMMAND WRITE TIMING WAVEFORM-BYTE MODE
VCC
5V
12V
OV
VPP
tVPS
tPHEL
RP
BYTE
VIH
VIL
ADD
A-1 -16
VIH
WE
VIH
ADD Valid
VIL
tAH
tAS
VIL
tOES
tCEPH1
tCEP
tCWC
CE
VIH
VIL
tCS
OE
VIH
VIL
DATA
Q0-7
tCH
tDS
tDH
VIH
DIN
VIL
VIH
DATA
Q8-14
High Z
VIL
NOTE:
BYTE pin is treated as Address pin. All timing specifications for BYTE pin are the same as those for address pin.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
18
MX28F2100B
COMMAND WRITE TIMING WAVEFORM-WORD MODE
VCC
5V
12V
OV
VPP
tVPS
RP
BYTE
tPHEL
VIH
VIL
A0-16
VIH
ADD Valid
VIL
tAH
tAS
WE
VIH
VIL
tOES
tCEPH1
tCEP
tCWC
CE
VIH
VIL
tCS
OE
VIH
VIL
DATA
Q0-15
tCH
tDS
tDH
VIH
DIN
VIL
REV. 1.5, MAR. 24, 1998
P/N: PM0382
19
MX28F2100B
AUTOMATIC PROGRAMMING TIMING WAVEFORM
One byte data is programmed. Verify in fast algorithm
and additional programming by external control are not
required because these operations are excuted automatically by internal control circuit. Programming
completion can be verified by status register after
automatic Program starts.
AUTOMATIC PROGRAMMING TIMING WAVEFORM-BYTE MODE
Vcc 5V
12V
Vpp
0V
RP
BYTE
tVPH
tVPS
tPHEL
VIH
VIL
ADD
A-1~16
CE
VIH
ADD Valid
VIL
tAS
tCWC
VIH
VIL
tCH
tCS
WE
tCH
tCEPH1
tCES
tCEP
tOES tCEP
VIH
VIL
tDH tDS
tDS
DATA
VIH
Q0~Q2
VIL
DATA
Q3~Q7
DATA
Q8~Q14
tCESC
tCESP
VIH
VIL
OE
tCS
Command In
tDF
tDH
DIN
10H/or 40H
VIH
Command In
Valid SRD
DIN
VIL
VIH
High Z
VIL
REV. 1.5, MAR. 24, 1998
P/N: PM0382
20
MX28F2100B
AUTOMATIC PROGRAMMING TIMING WAVEFORM-WORD MODE
Setup Auto Program/
Program command
Vcc 5V
12V
Vpp
0V
BYTE
tVPH
tVPS
VIH
VIL
tVPS
RP
ADD
A0~16
CE
VIH
ADD Valid
VIL
tAS
tAH1
tCWC
VIH
VIL
tCH
tCS
WE
tCH
VIH
tCEPH1
VIL
tCES
tCEP
tOES tCEP
OE
tCESC
tCESP
tCS
VIH
VIL
tDS
DATA
VIH
Q0~Q2
VIL
tDH tDS
tDF
tDH
tDPA
Command In
DIN
Command In
DIN
VIH
DATA
VIL
Q3~Q7
Vaild SRD
10H/or 40H
VIH
DATA
DIN
VIL
Q8~Q15
REV. 1.5, MAR. 24, 1998
P/N: PM0382
21
MX28F2100B
AUTOMATIC PROGRAMMING ALGORITHM FLOWCHART
Program Command Sequence
(Address/Command)
START
Apply VppH
Write Set up Auto Program Command (10H/40H)
Write Auto Program Command(A/D)
Read Status Register
NO
SR.7=1
YES
Status Register Ready
Full Status Check
0
0
SR.4=
SR.3=
Programming
Successfully
1
1
Vpp Range Error
Program Error
REV. 1.5, MAR. 24, 1998
P/N: PM0382
22
MX28F2100B
AUTOMATIC CHIP ERASE TIMING WAVEFORM
All data in chip are erased. External erase verify is not
required because data is erased automatically by internal
control circuit. Erasure completion can be verified by
Status register contents after automatic erase starts.
AUTOMATIC CHIP ERASE TIMING WAVEFORM-BYTE MODE
Setup Auto Chip Erase/
Erase command
Auto Erase
Vcc 5V
12V
Vpp
0V
BYTE
tVPH
tVPS
VIH
VIL
RP
ADD
A-1~16
CE
tPHEL
VIH
VIL
tAETC
tCWC
VIH
VIL
tCH
tCS
WE
tCH
tCEPH1
tCES
tCEP
tOES tCEP
VIH
VIL
tDH tDS
tDS
DATA
Q0~Q2
DATA
Q3~Q7
DATA
Q8~Q14
tCESC
tCESP
VIH
VIL
OE
tCS
VIH
tDF
tDH
tDPA
Command In
Command In
Command In
Command In
30H
30H
VIL
VIH
VIL
VIH
Vaild SRD
High Z
VIL
NOTE:
Erase Suspend and Read Array modes are not included in this waveform.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
23
MX28F2100B
AUTOMATIC CHIP ERASE TIMING WAVEFORM-WORD MODE
Setup Auto Chip Erase/
Erase command
Auto Erase
Vcc 5V
12V
Vpp
0V
BYTE
tVPH
tVPS
VIH
VIL
RP
tPHEL
ADD
A0~16
VIH
CE
VIH
VIL
tCWC
VIL
tCH
tCS
WE
tCH
tCEPH1
tCES
tCEP
tOES tCEP
VIH
VIL
tDH tDS
tDS
DATA
VIH
Q0~Q3
VIL
DATA
Q7
DATA
Q8~Q15
tCESC
tCESP
VIH
VIL
OE
tCS
Command In
tDF
tDH
tDPA
Command In
VIH
Command In
VIL
30H
Command In
Valid SRD
30H
VIH
VIL
NOTE:
Erase Suspend and Read Array modes are not included in this waveform.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
24
MX28F2100B
AUTOMATIC CHIP ERASE ALGORITHM FLOWCHART
START
Apply VppH
Write Set up Auto Chip Erase Command (30H)
Write Auto Chip Erase Command(30H)
Read Status Register
0
To Execute
Suspend Mode
SR.7=
1
NO
YES
Erase Suspend/
Erase Resume Flow
Chip Erase completed
Operation Done.
Device Stays at
Read Status Register Mode
To Check SR3, 4, 5
To See Whether Erase Successfully
REV. 1.5, MAR. 24, 1998
P/N: PM0382
25
MX28F2100B
AUTOMATIC BLOCK ERASE TIMING WAVEFORM
Block data (refer to page 1 for block structure) are erased.
External erase verify is not required because data are
erased automatically by internal control circuit. Erasure
completion can be verified by status register contents
after automatic erase starts.
AUTOMATIC BLOCK ERASE TIMING WAVEFORM-BYTE MODE
Auto block erase & Status register read
Setup auto block erase/erase command
Vcc 5V
12V
Vpp
0V
RP
PBYTE
tVPH
tVPS
tPHEL
VIH
VIL
tAS tAH
A-1~ A16
VIH
Block
address 0
Block
address 1
Block
address #
VIL
CE
VIH
VIL
tCWC
tBALC
tBAL
tCESC
tAETB
VIH
WE
VIL
tOES
tCEPH1
tCEP
tCEP tCEPH2
VIH
OE
VIL
tDS
Q3~Q7
tDH
tDS
tDF
tDH
VIH
Command in
Command in
Command in
Command in
Valid Data
VIL
VIH
Q0~Q2
VIL
Command #20H Command #D0H
REV. 1.5, MAR. 24, 1998
P/N: PM0382
26
MX28F2100B
AUTOMATIC BLOCK ERASE TIMING WAVEFORM-WORD MODE
Auto Block Erase
Setup Auto Block Erase/Erase command
Vcc 5V
12V
Vpp
0V
tVPH
tVPS
tPHEL
RP
BYTE
VIH
VIL
tAS
A0 ~ A16
VIH
tAH
Block
address 0
CE
Block
address #
Block
address 1
VIL
VIH
VIL
tCWC
tBALC
tBAL
tCESC
VIH
WE
VIL
tOES
tCEPH1
tCEP
tCEP tCEPH2
VIH
OE
VIL
tDS
tDH
tDS
tDH
VIH
Q0~Q2
Command in
Command in
Command in
Command in
VIL
VIH
Q3~Q7
Valid SRD
VIL
Command #20H Command #D0H
VIH
Q8~Q15
VIL
REV. 1.5, MAR. 24, 1998
P/N: PM0382
27
MX28F2100B
AUTOMATIC BLOCK ERASE ALGORITHM FLOWCHART
START
Apply VppH
Write Set up auto chip Erase Command (20H)
Write Auto chip Erase Command(D0H)
Load Other Sectors Address If Necessary
(Load Other Sector Address)
Read Status Register
0
SR.7=
1
To Execute
Suspend Mode
NO
YES
Erase Suspend/
Chip Erase completed
Erase Resume Flow
Operation Done.
Device Stays at
Read Status Register Mode
To Check SR3, 4, 5
To See Whether Erase Successfully.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
28
MX28F2100B
ERASE SUSPEND/ERASE RESUME FLOWCHART
START
Write Data B0H
Read Status Register
1
0
SR.6=
SR.7=
0
Erase Completed
Check SR3, 4, 5
To See Whether
Erase Successfully
1
Write Data FFH
Read Array
Write FFH
Reading End
YES
NO
Read Array
Write Data D0H
Continue Erase
REV. 1.5, MAR. 24, 1998
P/N: PM0382
29
MX28F2100B
FAST HIGH-RELIABILITY CHIP ERASE
This device can be applied the Fast High-Reliability Chip
erase algorithm shown in the following flowchart.
FAST HIGH-RELIABILITY CHIP ERASE FLOWCHART
START
ALL BITS
PGM "0"
N=0
CHIP ERASE FLOW
N = N+1
FAIL
NO
N = 1024?
ERSVFY FLOW
YES
ALL BITS VERIFIED
CHIP ERASE FAIL
APPLY
VPP = VCC
END
CHIP ERASE
COMPLETE
CHIP ERASE FLOW
Command Sequence
START
Apply
VPP = VPPH
WRITE SETUP CHIP ERASE COMMAND
( 20H )
WRITE CHIP ERASE COMMAND
( 20H )
WAIT
10 ms
END
REV. 1.5, MAR. 24, 1998
P/N: PM0382
30
MX28F2100B
ERASE VERIFY FLOW
START
APPLY
VPP = VPPH
ADDRESS =
FIRST ADDRESS OF ERASED BLOCKS
OR LAST VERIFY FAILED ADDRESS
WRITE ERASE VERIFY COMMAND
( A0H )
WAIT 6 us
ERSVFY
FFH ?
INCREMENT ADDRESS
NO
YES
NO
LAST ADDRESS ?
YES
ERASE VERIFY
COMPLETE
GO TO ERASE FLOW
AGAIN OR ABORT
REV. 1.5, MAR. 24, 1998
P/N: PM0382
31
MX28F2100B
FAST HIGH-RELIABILITY CHIP ERASE TIMING WAVEFORM
All data in chip are erased. Control verification and
additional erasure externally according to fast high-relia-
bility chip erase flowchart. Successful erasure completion can be verified by status registers.
FAST HIGH-RELIABILITY CHIP ERASE TIMING WAVEFORM-BYTE MODE
Setup Chip Erase/
Chip Erase
Erase command
Erase Verify
Vcc 5V
12V
Vpp
0V
RP
BYTE
tVPS
tVPH
tPHEL
VIH
VIL
VIH
Verify
Address
A-1 ~ A16
VIL
WE
tAS
VIH
tAH
VIL
tCESV
tET
tCWC
VIH
CE
VIL
tOES
tCEP
tCEP tCEPH1 tCEP
tCESC
tCES
VIH
OE
VIL
tDS
Q0~Q7
tDH
tDS
tDH
tDS
tDH
tVA
tDF
VIH
Command in
Command in
Command in
Valid Data
VIL
Command #20H Command #20H
Command #A0H
REV. 1.5, MAR. 24, 1998
P/N: PM0382
32
MX28F2100B
FAST HIGH-RELIABILITY CHIP ERASE TIMING WAVEFORM-WORD MODE
Setup chip erase/
Chip erase
erase command
Erase Verify
Vcc 5V
12V
Vpp
0V
BYTE
tVPH
tVPS
VIH
VIL
tPHEL
RP
VIH
Verify
Address
A0 ~ A16
VIL
WE
tAS tAH
VIH
VIL
tCESV
tET
tCWC
VIH
CE
VIL
tOES
tCEP
tCEP tCEPH1 tCEP
tCESC
tCES
VIH
OE
VIL
tDS
Q0~Q7
tDH
tDS
tDH
tDS
tDH
tVA
tDF
VIH
Command in
Command in
Command in
Valid Data
VIL
Command #20H Command #20H
Q8~Q15
Command #A0H
VIH
Valid Data
VIL
REV. 1.5, MAR. 24, 1998
P/N: PM0382
33
MX28F2100B
FAST HIGH-RELIABILITY BLOCK ERASE
This device can be applied to the fast high-reliability block
erase algorithm shown in the following flowchart.
FAST HIGH-RELIABILITY BLOCK ERASE FLOWCHART
START
For selected block(s),
All bits PGM"0"
N=0
BLOCK ERASE FLOW
N = N+1
FAIL
NO
N = 1024?
ERSVFY FLOW
YES
ALL BITS VERIFIED
BLOCK ERASE FAIL
APPLY
VPP = VCC
END
BLOCK ERASE
COMPLETE
BLOCK ERASE FLOW
Command Sequence
START
Apply
VPP = VPPH
WRITE SETUP BLOCK ERASE COMMAND
( 60H )
WRITE BLOCK ERASE COMMAND
( LOAD FIRST SECTOR ADDRESS , 60H )
LOAD OTHER SECTORS' ADDRESS
IF NECESSARY
( LOAD OTHER SECTOR ADDRESS )
WAIT
10 ms
END
REV. 1.5, MAR. 24, 1998
P/N: PM0382
34
MX28F2100B
ERASE VERIFY FLOW
START
APPLY
VPP = VPPH
ADDRESS =
FIRST ADDRESS OF ERASED BLOCKS
OR LAST VERIFY FAILED ADDRESS
WRITE ERASE VERIFY COMMAND
( A0H )
WAIT 6 us
ERSVFY
FFH ?
INCREMENT ADDRESS
NO
YES
NO
LAST ADDRESS ?
YES
ERASE VERIFY
COMPLETE
GO TO ERASE FLOW
AGAIN OR ABORT
REV. 1.5, MAR. 24, 1998
P/N: PM0382
35
MX28F2100B
FAST HIGH-RELIABILITY BLOCK ERASE TIMING WAVEFORM
Indicated block data are erased. Control verification and
additional erasure externally according to fast high-reliability block erase flowchart.
FAST HIGH-RELIABILITY BLOCK ERASE TIMING WAVEFORM-BYTE MODE
Block Erase
Setup Block Erase/Erase Command
Erase Verify
Vcc 5V
12V
Vpp
0V
RP
BYTE
tVPS
tVPH
tPHEL
VIH
VIL
tAS
VIH
A-1 ~ A16
tAH
Block
address 0
Block
address 1
Verify
address
Block
address #
VIL
WE
tAS tAH
VIH
VIL
tCWC
CE
VIL
OE
tBALC
tBAL
tCESV
tET
VIH
tOES tCEP
tCEPH1
tCEP tCEPH2
tCESC
tCEP
tCES
VIH
VIL
tDS tDH
tDS
tDH
Command in
Command in
tDS
VIH
Q0~Q7
tDH
Command in
tVA
tDF
Valid Data
VIL
Command #60H Command #60H
Command #A0H
REV. 1.5, MAR. 24, 1998
P/N: PM0382
36
MX28F2100B
FAST HIGH-RELIABILITY BLOCK ERASE TIMING WAVEFORM-WORD MODE
Block Erase
Setup Block Erase/Erase Command
Erase Verify
Vcc 5V
12V
Vpp
0V
tVPS
tVPH
tPHEL
RP
VIH
BYTE
VIL
tAS tAH
VIH
A0 ~ A16
Block
address 0
Block
address 1
Verify
address
Block
address #
VIL
WE
VIH
VIL
tCWC
CE
VIL
OE
tBALC
tBAL
tCESV
tET
VIH
tOES tCEP
tCEPH1
tCEP tCEPH2
tCESC
tCEP
tCES
VIH
VIL
tDS tDH
tDS
tDH
Command in
Command in
tDS
VIH
Q0~Q7
tDH
Command in
tVA
tDF
Valid Data
VIL
Command #60H Command #60H
Command #A0H
REV. 1.5, MAR. 24, 1998
P/N: PM0382
37
MX28F2100B
VPP HIGH READ TIMING WAVEFORM-BYTE MODE
Vcc 5V
12V
Vpp
0V
tVPH
tVPS
tPHEL
RP
BYTE
VIH
VIL
ADD
A-1 ~16
VIH
Address Valid
VIL
tACC
tCWC
CE
VIH
tCESC
VIL
WE
tCE
tCH
VIH
tOES
VIL
OE
VIH
tOES
tCS
tCEP
tOE
tDF
VIL
DATA
Q0-7
tOH
tDH
tDS
VIH
DATA valid
Command in
VIL
FFH
DATA
Q8-Q14
HIGH-Z
VIH
VIL
VPP HIGH READ TIMING WAVEFORM-WORD MODE
Vcc 5V
12V
Vpp
0V
tVPH
tVPS
tPHEL
RP
VIH
BYTE
ADD
A0 ~16
VIL
VIH
Address Valid
VIL
tACC
tCWC
CE
VIH
tCESC
VIL
WE
tCE
tCH
VIH
tOES
VIL
tOES
OE
tCS
tCEP
VIH
tOE
tDF
VIL
tDS
DATA
Q0-15
tOH
tDH
VIH
DATA valid
Command in
VIL
XX FFH
REV. 1.5, MAR. 24, 1998
P/N: PM0382
38
MX28F2100B
VPP LOW ID CODE READ TIMING WAVEFORM-BYTE MODE
VCC
5V
RP
VID
VIH
ADD
A9
VIL
VIH
BYTE
VIL
ADD
A0
VIH
VIL
tACC
tACC
VIH
ADD
A-1
ADD
A1-A16
CE
VIL
VIH
VIL
VIH
VIL
WE
tCE
VIH
VIL
OE
tOE
VIH
VIL
tDF
tOH
tOH
VIH
DATA
Q0-Q7
DATA OUT
DATA OUT
VIL
2BH
C2H
DATA
Q8-Q14
HIGH-Z
REV. 1.5, MAR. 24, 1998
P/N: PM0382
39
MX28F2100B
VPP LOW ID CODE READ TIMING WAVEFORM-WORD MODE
VCC
5V
RP
VID
ADD
A9
VIH
VIL
VIH
BYTE
VIL
ADD
VIH
A0
VIL
tACC
tACC
ADD
A1-A16
VIH
CE
VIH
VIL
VIL
WE
VIH
tCE
VIL
OE
VIH
tOE
VIL
tDF
tOH
tOH
VIH
DATA
Q0-Q7
DATA OUT
DATA OUT
DATA OUT
DATA OUT
VIL
VIH
DATA
Q8-Q15
VIL
00C2H
002BH
REV. 1.5, MAR. 24, 1998
P/N: PM0382
40
MX28F2100B
VPP HIGH ID CODE READ TIMING WAVEFORM-BYTE MODE
Vcc 5V
tPHEL
RP
12V
Vpp
0V
BYTE
tVPH
tVPS
VIH
VIL
ADD
A0
VIH
Address Valid 0 or 1
VIL
tACC
VIH
ADD
A-1
VIL
VIH
ADD
A1-A16
VIL
tCWC
CE
VIH
tCESC
VIL
tCS
WE
VIL
OE
tCE
tCH
VIH
tOES
tOES
tCEP
VIH
VIL
tDF
tDH
tDS
tOE
tOH
VIH
DATA
Q0-Q7
DATA OUT
Command in
VIL
C2H or 2BH
DATA
Q8-Q14
VIH
HIGH-Z
VIL
90H
REV. 1.5, MAR. 24, 1998
P/N: PM0382
41
MX28F2100B
VPP HIGH ID CODE READ TIMING WAVEFORM-WORD MODE
Vcc 5V
12V
Vpp
0V
tVPH
tVPS
tPHEL
RP
BYTE
VIH
VIL
ADD
A0
VIH
Address Valid 0 or 1
VIL
tACC
VIH
ADD
A1-A16
VIL
tCWC
CE
VIH
tCESC
VIL
tCS
WE
VIL
OE
tCE
tCH
VIH
tOES
tOES
tCEP
VIH
VIL
tDF
tDH
tDS
tOE
tOH
VIH
DATA
Q0-Q15
DATA OUT
Command in
VIL
00C2H or 002BH
XX90H
NOTE:
BYTE pin is treated as Address pin All timing specifications for BYTE pin are the same as those for address pin.
REV. 1.5, MAR. 24, 1998
P/N: PM0382
42
MX28F2100B
ORDERING INFORMATION
PLASTIC PACKAGE
PART NO.
ACCESS TIME
OPERATING CURRENT
STANDBY CURRENT
PACKAGE
(ns)
MAX.(mA)
MAX.(uA)
MX28F2100BMC-70 70
50
100
44 Pin SOP
MX28F2100BMC-90 90
50
100
44 Pin SOP
MX28F2100BMC-12 120
50
100
44 Pin SOP
MX28F2100BTC-70 70
50
100
48 Pin TSOP
(Normal Type)
MX28F2100BTC-90 90
50
100
48 Pin TSOP
(Normal Type)
MX28F2100BTC-12 120
50
100
48 Pin TSOP
(Normal Type)
Revision History
Rev. #
Description
1.4
Statement cleared for customer's better understanding
Date
10/22/1997
REV. 1.5, MAR. 24, 1998
P/N: PM0382
43
MX28F2100B
PACKAGE INFORMATION
44-PIN PLASTIC SOP(500 mil)
ITEM MILLIMETERS INCHES
A
28.70 max.
1.130max.
B
1.10 [REF]
.043 [REF]
C
1.27 [TP]
.050 [TP]
D
.40 ± .10[Typ.]
.016 ±.004[Typ.]
E
.010 min.
.004 min.
F
3.00 max.
.118 max.
G
2.80 ± .13
.110 ± .005
H
16.04 ± .30
.631 ± .012
I
12.60
.496
J
1.72
.068
K
.15 ± .10 [Typ.] .006 ±.004[Typ.]
L
.80 ± .20
44
23
1
22
H
A
I
G
J
F
K
.031± .008
E
D
C
L
B
NOTE: Each lead certerline is located within
.25mm[.01 inch] of its true position [TP] at a
maximum at maximum material condition.
48-PIN PLASTIC TSOP
ITEM
MILLIMETERS
INCHES
A
20.0 ± .20
.787 ± .008
A
B
18.40 ± .10
.724 ± .004
B
C
12.20 max.
.480 max.
D
0.15 [Typ.]
.006 [Typ.]
E
.80 [Typ.]
.031 [Typ.]
F
.20 ± .10
.008 ± .004
G
.30 ± .10
.012 ± .004
H
.50 [Typ.]
.020 [Typ.]
I
.45 max.
.018 max.
J
0 ~ .20
0 ~ .008
K
1.00 ± .10
.039 ± .004
L
1.27 max.
.050 max.
M
.50
.020
N
0 ~5°
.500
C
N
M
K
L
D
E
NOTE: Each lead certerline is located within
.25mm[.01 inch] of its true position [TP] at a
maximum at maximum material condition.
F
G
H
I
J
REV. 1.5, MAR. 24, 1998
P/N: PM0382
44
MX28F2100B
MACRONIX INTERNATIONAL CO., LTD.
HEADQUARTERS:
TEL:+886-3-578-8888
FAX:+886-3-578-8887
EUROPE OFFICE:
TEL:+32-2-456-8020
FAX:+32-2-456-8021
JAPAN OFFICE:
TEL:+81-44-246-9100
FAX:+81-44-246-9105
SINGAPORE OFFICE:
TEL:+65-747-2309
FAX:+65-748-4090
TAIPEI OFFICE:
TEL:+886-3-509-3300
FAX:+886-3-509-2200
MACRONIX AMERICA, INC.
TEL:+1-408-453-8088
FAX:+1-408-453-8488
CHICAGO OFFICE:
TEL:+1-847-963-1900
FAX:+1-847-963-1909
http : //www.macronix.com
MACRONIX INTERNATIONAL CO., LTD. reserves the rignt to change product and specifications without notice.
45