LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only FOUR DIGIT LED DISPLAY (0.39 Inch) Pb Lead-Free Parts LFD435/6A-XX/RP39-PF DATA SHEET DOC. NO : QW0905- LFD435/6A-XX/RP39-PF REV. : DATE : 05 - Sep. - 2005 A LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 1/8 PART NO. LFD435/6A-XX/RP39-PF Package Dimensions 7.0 (0.276") 40.18(1.582") DIG.1 10.0 (0.39") DIG.2 L1 DIG.3 L3 L2 DIG.4 12.8 (0.504") 10.16 (0.4") DP A F LFD435/6A-XX/RP39-PF LIGITEK Ø 0.45 TYP G E B C D DP 3.9±0.5 2.54X7=17.78 (0.7") PIN NO.1 Note : 1.All dimension are in millimeters and (lnch) tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 2/8 PART NO. LFD435/6A-XX/RP39-PF Internal Circuit Diagram LFD435A-XX/RP39-PF 14 16 13 3 5 11 15 7 A B C D E F G DP A B C D E F G DP DIG. 1 1 DIG. 2 2 4 DIG. 3 6 DP A B C D E F G DP 14 16 13 3 5 11 15 7 A B C D E F G DP A B C D E F G DIG. 1 1 DIG. 2 2 DP L1 L2 L3 A B C D E F G LFD436A-XX/RP39-PF L1 L2 L3 A B C D E F G 4 DIG. 3 6 DP DIG. 4 8 A B C D E F G DP DIG. 4 8 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LFD435/6A-XX/RP39-PF Page 3/8 Electrical Connection PIN NO. LFD435A-XX/RP39-PF PIN NO. LFD436A-XX/RP39-PF 1 Common Cathode Dig.1 1 Common Anode Dig.1 2 Common Cathode Dig.2 2 Common Anode Dig.2 3 Anode D 3 Cathode D 4 Common Cathode L1,L2,L3 4 Common Anode L1,L2,L3 5 Anode E 5 Cathode E 6 Common Cathode Dig.3 6 Common Anode Dig.3 7 Anode DP 7 Cathode DP 8 Common Cathode Dig.4 8 Common Anode Dig.4 9 NC 9 NC 10 NO PIN 10 NO PIN 11 Anode F 11 Cathode F 12 NO PIN 12 NO PIN 13 Anode C,L3 13 Cathode C,L3 14 Anode A,L1 14 Cathode A,L1 15 Anode G 15 Cathode G 16 Anode B,L2 16 Cathode B,L2 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 4/8 PART NO. LFD435/6A-XX/RP39-PF Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT 9UG Forward Current Per Chip IF 30 mA Peak Forward Current Per Chip (Duty 1/10,0.1ms Pulse Width) IFP 60 mA Power Dissipation Per Chip PD 75 mW Ir 10 μA Electrostatic Discharge ESD 2000 V Operating Temperature Topr -25 ~ +85 ℃ Storage Temperature Tstg -25 ~ +85 ℃ Reverse Current Per Any Chip Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260 ℃ Part Selection And Application Information(Ratings at 25℃) Electrical Common λD △λ Vf(v) Iv(mcd) IV-M Cathode (nm) (nm) Min. Typ. Max. Min. Typ. Material Emitted or Anode CHIP PART NO Common Cathode LFD435A-XX/RP39-PF AlGaInP LFD436A-XX/RP39-PF 574 Green 20 1.7 2.1 2.6 Common Anode Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ± 15% testing tolerance. 4.0 7.2 2:1 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 5/8 PART NO. LFD435/6A-XX/RP39-PF Test Condition For Each Parameter Symbol Unit Test Condition Forward Voltage Per Chip Vf volt If=20mA Luminous Intensity Per Chip Iv mcd If=10mA Dominant Wavelength λD nm If=20mA △λ nm If=20mA Ir μA Vr=5V Parameter Spectral Line Half-Width Reverse Current Any Chip Luminous Intensity Matching Ratio IV-M LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 6/8 PART NO. LFD435/6A-XX/RP39-PF Typical Electro-Optical Characteristics Curve 9UG CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0 Relative Intensity Normalize @20mA Forward Current(mA) 1000 100 10 1.0 0.1 2.5 2.0 1.5 1.0 0.5 0 1.0 2.0 3.0 4.0 1.0 5.0 10 Fig.4 Relative Intensity vs. Temperature 1.2 Relative Intensity @20mA Normalize @25℃ Forward Voltage@20mA Normaliz @25℃ Fig.3 Forward Voltage vs. Temperature 1.1 1.0 0.9 0.8 -20 0 20 40 60 80 100 Relative Intensity @20mA Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0 550 600 Wavelength (nm) 3.0 2.5 2.0 1.5 1.0 0.5 0 -40 -20 0 20 40 60 80 Ambient Temperature( ℃) Ambient Temperature( ℃) 500 1000 Forward Current(mA) Forward Voltage(V) -40 100 650 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LFD435/6A-XX/RP39-PF Page 7/8 Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350°C Max Soldering Time:3 Seconds Max(One Time) Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260° C 2.Wave Soldering Profile Dip Soldering Preheat: 120° C Max Preheat time: 60seconds Max Ramp-up 3°C/sec(max) Ramp-Down:-5°C/sec(max) Solder Bath:260° C Max Dipping Time:3 seconds Max Distance:Solder Temperature 1/16 Inch Below Seating Plane For 3 Seconds At 260°C Temp(° C) 260° C3sec Max 260° 5° /sec max 120° 25° 3° /sec max Preheat 60 Seconds Max Time(sec) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LFD435/6A-XX/RP39-PF Page 8/8 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=10mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5 ℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hous. 1.Ta=105 ℃±5℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5 ℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5 ℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11 PACKING SPECIFICATION 1. 12 PCS / TUBE 2. 90 TUBES / INNER BOX SIZE : L X W X H 55cm X 22.5cm X 10cm L W H 3. 4 INNER BOXES / CARTON SIZE : L X W X H 56.5cm X 47.5cm X 24cm L W H C/NO: MADE IN CHINA