LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only SUPER BRIGHT RECTANGLE TYPE LED LAMPS L8SRF25030 DATA SHEET DOC. NO : QW0905-:L8SRF25030 REV. : A DATE : 24 - May - 2007 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 1/4 PART NO. L8SRF25030 Package Dimensions 5.6 LIGHTED AREA 3.64 3.18 6.16 REFERENCE MARK S E 6.65 0.38 □0.5 TYP 26.4MIN 1.0MIN. 2.54TYP - + Note : 1.All dimension are in millimeter tolerance is ±0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation 0° -30° 30° -60° 100% 75% 50% 60° 25% 0 25% 50% 75% 100% LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 2/4 PART NO. L8SRF25030 Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT 8SRF Forward Current IF 25 mA Peak Forward Current Duty 1/10@10KHz IFP 75 mA Power Dissipation PD 65 mW Ir 10 μA Electrostatic Discharge( * ) ESD 2000 V Operating Temperature Topr -40 ~ +85 ℃ Storage Temperature Tstg -40 ~ +100 ℃ Reverse Current @5V Static Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic * glove is recommended when handing these LED. All devices, equipment and machinery must be properly grounded. Typical Electrical & Optical Characteristics (Ta=25 ℃) COLOR PART NO MATERIAL Emitted L8SRF25030 AlGaInP Red Dominant wave length λDnm Spectral halfwidth △λnm Lens Red Diffused Luminous Forward Viewing intensity voltage angle @20mA(V) @20mA(mcd) 2θ 1/2 (deg) Min. Max. Min. 630 20 1.5 2.4 Note : 1.The forward voltage data did not including ± 0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. 50 Typ. 90 120 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. L8SRF25030 Page 3/4 Typical Electro-Optical Characteristics Curve 8SRF CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 2.0 50 Relative Intensity Normalize @20mA Forward Current(mA) 60 40 30 20 10 0 1.0 0.0 0 1.0 0.5 2.0 1.5 3.0 2.5 1.0 10 1.2 1.1 1.0 0.9 0.8 20 40 60 80 Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0.0 550 600 650 Wavelength (nm) 2.5 2.0 1.5 1.0 0.5 0.0 -20 0 20 40 60 Ambient Temperature( ℃) Ambient Temperature( ℃) Relative Intensity@20mA Fig.4 Relative Intensity vs. Temperature Relative Intensity@20mA Normalize @25℃ Forward Voltage@20mA Normalize @25℃ Fig.3 Forward Voltage vs. Temperature 0 1000 Forward Current(mA) Forward Voltage(V) -20 100 700 80 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. L8SRF25030 Page 4/4 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resistance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5℃ 2.RH=90 %~95 % 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hours. 1.Ta=105 ℃±5 ℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11