LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only ROUND TYPE LED LAMPS Pb Lead-Free Parts LH2040-PF DATA SHEET DOC. NO : QW0905- LH2040-PF REV. : A DATE : 08 - Aug. - 2005 發行 立碁電子 DCC LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 1/5 PART NO. LH2040-PF Package Dimensions 3.0 4.2 4.0 5.2 1.5MAX 25.0MIN □0.5 TYP 1.0MIN 2.54TYP + Note : 1.All dimension are in millimeter tolerance is ± 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation 0° -30° 30° -60° 100% 75% 50% 60° 25% 0 25% 50% 75% 100% LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LH2040-PF Page 2/5 Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT H Forward Current IF 15 mA Peak Forward Current Duty 1/10@10KHz IFP 60 mA Power Dissipation PD 40 mW Reverse Current @5V Ir 10 μA Operating Temperature Topr -40 ~ +85 ℃ Storage Temperature Tstg -40 ~ +100 ℃ Soldering Temperature Tsol Max 260 ℃ for 5 sec Max (2mm from body) Typical Electrical & Optical Characteristics (Ta=25 ℃) PART NO COLOR MATERIAL Emitted LH2040-PF GaP Red Luminous Forward Peak Spectral Viewing intensity voltage angle wave halfwidth length △λ nm @20mA(V) @10mA(mcd) 2θ 1/2 (deg) λPnm Lens Red Diffused 697 90 Min. Max. Min. Typ. 1.7 4.5 Note : 1.The forward voltage data did not including ±0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. 2.6 3.0 36 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page3/5 PART NO. LH2040-PF Typical Electro-Optical Characteristics Curve H CHIP Fig.1 Forward current vs. Forward Voltage Fig.2 Relative Intensity vs. Forward Current 3.0 Relative Intensity Normalize @20mA Forward Current(mA) 1000 100 10 1.0 0.1 2.5 2.0 1.5 1.0 0.5 0.0 1.0 2.0 3.0 4.0 5.0 1.0 10 1.2 1.1 1.0 0.9 0.8 0 20 40 60 80 100 Relative Intensity@20mA Fig.5 Relative Intensity vs. Wavelength 1.0 0.5 0.0 700 800 900 Wavelength (nm) 3.0 2.5 2.0 1.5 1.0 0.5 0.0 -40 -20 0 20 40 60 Ambient Temperature( ℃) Ambient Temperature( ℃) 600 Fig.4 Relative Intensity vs. Temperature Relative Intensity@20mA Normalize @25 ℃ Forward Voltage@20mA Normalize @25 ℃ Fig.3 Forward Voltage vs. Temperature -20 1000 Forward Current(mA) Forward Voltage(V) -40 100 1000 80 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LH2040-PF Page 4/5 Soldering Condition(Pb-Free) 1.Iron: Soldering Iron:30W Max Temperature 350 ° C Max Soldering Time:3 Seconds Max(One Time) Distance:2mm Min(From solder joint to case) 2.Wave Soldering Profile Dip Soldering Preheat: 120°C Max Preheat time: 60seconds Max Ramp-up 3° C/sec(max) Ramp-Down:-5° C/sec(max) Solder Bath:260°C Max Dipping Time:3 seconds Max Distance:2mm Min(From solder joint to case) Temp(°C) 260° C3sec Max 260° 5° /sec max 120° 25° 3°/sec max Preheat 60 Seconds Max Time(sec) LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LH2040-PF Page 5/5 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5 ℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hous. 1.Ta=105 ℃±5℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5 ℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5 ℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11 PACKING SPECIFICATION 1.1000 PCS / BAG 2. 8 BAG / INNER BOX SIZE : L X W X H 33.5cm X 19cm X 7.5cm L W H 3. 12 INNER BOXES / CARTON SIZE : L X W X H 58.5cm X 34cm X 34cm L W C/NO: MADE IN CHINA . NO M IT E Y : Q'T ,: W : N, , W G, S PC s kg s kg H Test Report No. CANEC0904450201 Date: 27 Aug 2009 GUANGZHOU PANYU LAPLING ELECTRONICS CO LTD NO.1 GUANGYI RD WESTEN INDUSTRIAL AREA NANSHA ETDZ PANYU GUANGZHOU CHINA The following sample(s) was/were submitted and identified on behalf of the clients as : LAMP LED SGS Job No. Date of Sample Received Testing Period : : : 12132628 - GZ 22 Jan 2009 22 Jan 2009 - 03 Feb 2009 Test Requested : Selected test(s) as requested by client. Test Method : Please refer to next page(s). Test Results : Please refer to next page(s). Signed for and on behalf of SGS-CSTC Ltd. Sunny Huang Lab Sr. Supervisor Page 1 of 7 Test Report No. CANEC0904450201 Date: 27 Aug 2009 Page 2 of 7 Test Results: ID for specimen 1 Description for specimen 1 : CAN09-044502.001 : Transparent body (mixed) Heavy metal(s) Test Item(s) Cadmium (Cd) Lead (Pb) Mercury (Hg) Hexavalent Chromium (CrVI) by alkaline extraction Unit mg/kg mg/kg mg/kg mg/kg Test Method (Reference) IEC 62321:2008, ICP-OES IEC 62321:2008, ICP-OES IEC 62321:2008, ICP-OES IEC 62321:2008, UV-Vis Result N.D. N.D. N.D. N.D. MDL 2 2 2 2 Test Item(s) Unit Test Method (Reference) Result MDL Fluorine (F) Chlorine (Cl) Bromine (Br) Iodine (l) mg/kg mg/kg mg/kg mg/kg BS EN 14582:2007, IC BS EN 14582:2007, IC BS EN 14582:2007, IC BS EN 14582:2007, IC N.D. 650 N.D. N.D. 50 50 50 50 Unit Test Method (Reference) Result MDL mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS N.D. N.D. N.D. N.D. N.D. N.D. N.D. 5 5 5 5 5 5 Note: 1. mg/kg = ppm 2. N.D. = Not Detected (< MDL) 3. MDL = Method Detection Limit Halogen Note: 1. mg/kg = ppm 2. N.D. = Not Detected (< MDL) 3. MDL = Method Detection Limit Flame Retardants Test Item(s) Sum of PBBs Monobromobiphenyl Dibromobiphenyl Tribromobiphenyl Tetrabromobiphenyl Pentabromobiphenyl Hexabromobiphenyl Test Report Test Item(s) Heptabromobiphenyl Octabromobiphenyl Nonabromobiphenyl Decabromobiphenyl Sum of PBDEs Monobromodiphenyl ether Dibromodiphenyl ether Tribromodiphenyl ether Tetrabromodiphenyl ether Pentabromodiphenyl ether Hexabromodiphenyl ether Heptabromodiphenyl ether Octabromodiphenyl ether Nonabromodiphenyl ether Decabromodiphenyl ether ## No. CANEC0904450201 Date: 27 Aug 2009 Page 3 of 7 Unit Test Method (Reference) Result MDL mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg mg/kg IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS IEC 62321:2008, GC-MS N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. N.D. 5 5 5 5 5 5 5 5 5 5 5 5 5 5 Note: 1. mg/kg = ppm 2. N.D. = Not Detected (< MDL) 3. MDL = Method Detection Limit 4. "-" = Not regulated 5. ## = The exemption of DecaBDE in polymeric application according 2005/717/EC was overruled by the European Court of Justice by its decision of 01.04.2008. Subsequently DecaBDE is included in the sum of PBDE after 01.07.2008 PFOA & PFOS （Perfluorooctanoic acid & Perfluorooctane sulfonates） Test Item(s) Perfluorooctanoic acid (PFOA) Perfluorooctane sulfonates (PFOS) PFOS Acid PFOS Metal Salt PFOS Amide Note: 1. mg/kg = ppm 2. N.D. = Not Detected (< MDL) 3. MDL = Method Detection Limit Unit Test Method (Reference) Result MDL mg/kg mg/kg EPA 3540C: 1996, LC-MS EPA 3540C: 1996, LC-MS N.D. N.D. 10 10 Test Report No. CANEC0904450201 Date: 27 Aug 2009 Page 4 of 7 Reference Information: Directive 2006/122/EC (1) May not be placed on the market or used as a substance or constituent of preparations in a concentration equal to or higher than 0.005 % by mass. (2) May not be placed on the market in semi-finished products or articles, or parts thereof, if the concentration of PFOS is equal to or higher than 0.1 % by mass calculated with reference to the mass of structurally or microstructurally distinct parts that contain PFOS or, for textiles or other coated materials, if the amount of PFOS is equal to or higher than 1μg /m2 of the coated material. Remark1 : As requested by client, the test was conducted as whole / part sample, for the sample can’t be disjointed. Remark2: Results and photo(s) of this report refer to test report CANEC0900283301. Test Report No. CANEC0904450201 Date: 27 Aug 2009 Page 5 of 7 Test Report No. CANEC0904450201 Date: 27 Aug 2009 Page 6 of 7 Test Report No. CANEC0904450201 Date: 27 Aug 2009 Sample photo: CANEC0904450201 CAN09-044502.001 SGS authenticate the photo on original report only *** End of Report *** Page 7 of 7