LIGITEK LH2040-PF

LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
ROUND TYPE LED LAMPS
Pb
Lead-Free Parts
LH2040-PF
DATA SHEET
DOC. NO :
QW0905- LH2040-PF
REV.
:
A
DATE
:
08 - Aug. - 2005
發行
立碁電子
DCC
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page 1/5
PART NO. LH2040-PF
Package Dimensions
3.0
4.2
4.0
5.2
1.5MAX
25.0MIN
□0.5
TYP
1.0MIN
2.54TYP
+
Note : 1.All dimension are in millimeter tolerance is ± 0.25mm unless otherwise noted.
2.Specifications are subject to change without notice.
Directivity Radiation
0°
-30°
30°
-60°
100% 75% 50%
60°
25%
0
25% 50% 75% 100%
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LH2040-PF
Page 2/5
Absolute Maximum Ratings at Ta=25 ℃
Ratings
Symbol
Parameter
UNIT
H
Forward Current
IF
15
mA
Peak Forward Current
Duty 1/10@10KHz
IFP
60
mA
Power Dissipation
PD
40
mW
Reverse Current @5V
Ir
10
μA
Operating Temperature
Topr
-40 ~ +85
℃
Storage Temperature
Tstg
-40 ~ +100
℃
Soldering Temperature
Tsol
Max 260 ℃ for 5 sec Max
(2mm from body)
Typical Electrical & Optical Characteristics (Ta=25 ℃)
PART NO
COLOR
MATERIAL
Emitted
LH2040-PF
GaP
Red
Luminous
Forward
Peak Spectral
Viewing
intensity
voltage
angle
wave halfwidth
length △λ nm @20mA(V) @10mA(mcd) 2θ 1/2
(deg)
λPnm
Lens
Red Diffused
697
90
Min. Max. Min.
Typ.
1.7
4.5
Note : 1.The forward voltage data did not including ±0.1V testing tolerance.
2. The luminous intensity data did not including ±15% testing tolerance.
2.6
3.0
36
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page3/5
PART NO. LH2040-PF
Typical Electro-Optical Characteristics Curve
H CHIP
Fig.1 Forward current vs. Forward Voltage
Fig.2 Relative Intensity vs. Forward Current
3.0
Relative Intensity
Normalize @20mA
Forward Current(mA)
1000
100
10
1.0
0.1
2.5
2.0
1.5
1.0
0.5
0.0
1.0
2.0
3.0
4.0
5.0
1.0
10
1.2
1.1
1.0
0.9
0.8
0
20
40
60
80
100
Relative Intensity@20mA
Fig.5 Relative Intensity vs. Wavelength
1.0
0.5
0.0
700
800
900
Wavelength (nm)
3.0
2.5
2.0
1.5
1.0
0.5
0.0
-40
-20
0
20
40
60
Ambient Temperature( ℃)
Ambient Temperature( ℃)
600
Fig.4 Relative Intensity vs. Temperature
Relative Intensity@20mA
Normalize @25 ℃
Forward Voltage@20mA
Normalize @25 ℃
Fig.3 Forward Voltage vs. Temperature
-20
1000
Forward Current(mA)
Forward Voltage(V)
-40
100
1000
80
100
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LH2040-PF
Page 4/5
Soldering Condition(Pb-Free)
1.Iron:
Soldering Iron:30W Max
Temperature 350 ° C Max
Soldering Time:3 Seconds Max(One Time)
Distance:2mm Min(From solder joint to case)
2.Wave Soldering Profile
Dip Soldering
Preheat: 120°C Max
Preheat time: 60seconds Max
Ramp-up
3° C/sec(max)
Ramp-Down:-5° C/sec(max)
Solder Bath:260°C Max
Dipping Time:3 seconds Max
Distance:2mm Min(From solder joint to case)
Temp(°C)
260° C3sec Max
260°
5° /sec
max
120°
25°
3°/sec
max
Preheat
60 Seconds Max
Time(sec)
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LH2040-PF
Page 5/5
Reliability Test:
Test Item
Test Condition
Description
Reference
Standard
Operating Life Test
1.Under Room Temperature
2.If=20mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resisance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
High Temperature
Storage Test
1.Ta=105 ℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under ondition
of high temperature for hours.
MIL-STD-883:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40 ℃±5 ℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
High Temperature
High Humidity Test
1.Ta=65 ℃±5 ℃
2.RH=90 %~95%
3.t=240hrs ±2hrs
The purpose of this test is the resistance
of the device under tropical for hous.
1.Ta=105 ℃±5℃&-40 ℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
Solder Resistance
Test
1.T.Sol=260 ℃±5 ℃
2.Dwell time= 10 ±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
Solderability Test
1.T.Sol=230 ℃±5 ℃
2.Dwell time=5 ±1sec
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
Thermal Shock Test
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11
PACKING SPECIFICATION
1.1000 PCS / BAG
2. 8 BAG / INNER BOX
SIZE : L X W X H 33.5cm X 19cm X 7.5cm
L
W
H
3. 12 INNER BOXES / CARTON
SIZE : L X W X H 58.5cm X 34cm X 34cm
L
W
C/NO:
MADE IN CHINA
.
NO
M
IT E Y :
Q'T ,:
W :
N,
,
W
G,
S
PC
s
kg
s
kg
H
Test Report
No. CANEC0904450201
Date: 27 Aug 2009
GUANGZHOU PANYU LAPLING ELECTRONICS CO LTD
NO.1 GUANGYI RD WESTEN INDUSTRIAL AREA NANSHA ETDZ PANYU GUANGZHOU
CHINA
The following sample(s) was/were submitted and identified on behalf of the clients as :
LAMP LED
SGS Job No.
Date of Sample Received
Testing Period
:
:
:
12132628 - GZ
22 Jan 2009
22 Jan 2009 - 03 Feb 2009
Test Requested
:
Selected test(s) as requested by client.
Test Method
:
Please refer to next page(s).
Test Results
:
Please refer to next page(s).
Signed for and on behalf of
SGS-CSTC Ltd.
Sunny Huang
Lab Sr. Supervisor
Page 1 of 7
Test Report
No. CANEC0904450201
Date: 27 Aug 2009
Page 2 of 7
Test Results:
ID for specimen 1
Description for specimen 1
: CAN09-044502.001
: Transparent body (mixed)
Heavy metal(s)
Test Item(s)
Cadmium (Cd)
Lead (Pb)
Mercury (Hg)
Hexavalent Chromium (CrVI) by
alkaline extraction
Unit
mg/kg
mg/kg
mg/kg
mg/kg
Test Method (Reference)
IEC 62321:2008, ICP-OES
IEC 62321:2008, ICP-OES
IEC 62321:2008, ICP-OES
IEC 62321:2008, UV-Vis
Result
N.D.
N.D.
N.D.
N.D.
MDL
2
2
2
2
Test Item(s)
Unit
Test Method (Reference)
Result
MDL
Fluorine (F)
Chlorine (Cl)
Bromine (Br)
Iodine (l)
mg/kg
mg/kg
mg/kg
mg/kg
BS EN 14582:2007, IC
BS EN 14582:2007, IC
BS EN 14582:2007, IC
BS EN 14582:2007, IC
N.D.
650
N.D.
N.D.
50
50
50
50
Unit
Test Method (Reference)
Result
MDL
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
5
5
5
5
5
5
Note:
1. mg/kg = ppm
2. N.D. = Not Detected (< MDL)
3. MDL = Method Detection Limit
Halogen
Note:
1. mg/kg = ppm
2. N.D. = Not Detected (< MDL)
3. MDL = Method Detection Limit
Flame Retardants
Test Item(s)
Sum of PBBs
Monobromobiphenyl
Dibromobiphenyl
Tribromobiphenyl
Tetrabromobiphenyl
Pentabromobiphenyl
Hexabromobiphenyl
Test Report
Test Item(s)
Heptabromobiphenyl
Octabromobiphenyl
Nonabromobiphenyl
Decabromobiphenyl
Sum of PBDEs
Monobromodiphenyl ether
Dibromodiphenyl ether
Tribromodiphenyl ether
Tetrabromodiphenyl ether
Pentabromodiphenyl ether
Hexabromodiphenyl ether
Heptabromodiphenyl ether
Octabromodiphenyl ether
Nonabromodiphenyl ether
Decabromodiphenyl ether ##
No. CANEC0904450201
Date: 27 Aug 2009
Page 3 of 7
Unit
Test Method (Reference)
Result
MDL
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
mg/kg
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
IEC 62321:2008, GC-MS
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
N.D.
5
5
5
5
5
5
5
5
5
5
5
5
5
5
Note:
1. mg/kg = ppm
2. N.D. = Not Detected (< MDL)
3. MDL = Method Detection Limit
4. "-" = Not regulated
5. ## = The exemption of DecaBDE in polymeric application according 2005/717/EC was overruled by the
European Court of Justice by its decision of 01.04.2008. Subsequently DecaBDE is included in the sum of PBDE
after 01.07.2008
PFOA & PFOS (Perfluorooctanoic acid & Perfluorooctane sulfonates)
Test Item(s)
Perfluorooctanoic acid (PFOA)
Perfluorooctane sulfonates
(PFOS)
PFOS Acid
PFOS Metal Salt
PFOS Amide
Note:
1. mg/kg = ppm
2. N.D. = Not Detected (< MDL)
3. MDL = Method Detection Limit
Unit
Test Method (Reference)
Result
MDL
mg/kg
mg/kg
EPA 3540C: 1996, LC-MS
EPA 3540C: 1996, LC-MS
N.D.
N.D.
10
10
Test Report
No. CANEC0904450201
Date: 27 Aug 2009
Page 4 of 7
Reference Information: Directive 2006/122/EC
(1) May not be placed on the market or used as a substance or constituent of preparations in a concentration
equal to or higher than 0.005 % by mass.
(2) May not be placed on the market in semi-finished products or articles, or parts thereof, if the concentration of
PFOS is equal to or higher than 0.1 % by mass calculated with reference to the mass of structurally or
microstructurally distinct parts that contain PFOS or, for textiles or other coated materials, if the amount of PFOS
is equal to or higher than 1μg /m2 of the coated material.
Remark1 : As requested by client, the test was conducted as whole / part sample, for the sample can’t be
disjointed.
Remark2: Results and photo(s) of this report refer to test report CANEC0900283301.
Test Report
No. CANEC0904450201
Date: 27 Aug 2009
Page 5 of 7
Test Report
No. CANEC0904450201
Date: 27 Aug 2009
Page 6 of 7
Test Report
No. CANEC0904450201
Date: 27 Aug 2009
Sample photo:
CANEC0904450201
CAN09-044502.001
SGS authenticate the photo on original report only
*** End of Report ***
Page 7 of 7