LIGITEK LMD8811-2JHR-XX-PF

LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
DOT MATRIX DIGIT LED DISPLAY (1.84Inch)
Pb
Lead-Free Parts
LMD8811/2JHR-XX-PF
DATA SHEET
DOC. NO
:
QW0905- LMD8811/2JHR-XX-PF
REV.
:
B
DATE
: 18 - Mar. - 2009
發行
立碁電子
DCC
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
Page 1/9
PART NO. LMD8811/2JHR-XX-PF
Package Dimensions
PIN 14
PIN 26
6.0*7=
47.8
42.0(1.65") (1.88")
36.0
(1.42")
Ø 0.51
TYP
PIN 13
PIN 1
Ø 4.80(0.19")
47.8(1.88")
LMD8811/2JHR-XX-PF
LIGITEK
9.00(0.35")
5.50±0.50
2.54*12=30.48(1.20")
PIN NO.1
Note : 1.All dimension are in millimeters and (lnch) tolerance is ±0.25mm unless otherwise noted.
2.Specifications are subject to change without notice.
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page 2/9
Internal Circuit Diagram
LMD8811JHR-XX-PF
COLUMN
ROW PIN
1
2
3
4
5
6
7
8
24
2
21
5
18
8
15
11
1 23
2
1
3 20
4
4
5 17
6
7
7 14
8 10
3,6,9,12,13,16,19,22,25,26 NO CONNECT
LMD8812JHR-XX-PF
COLUMN
ROW PIN
1
24
2
2
3
21
4
5
5
18
6
7
8
8
15
11
1 23
2
1
3 20
4
4
5 17
6
7
7 14
8 10
3,6,9,12,13,16,19,22,25,26 NO CONNECT
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page 3/9
Electrical Connection
PIN NO.
LMD8811JHR-XX-PF
PIN NO.
LMD8811JHR-XX-PF
1
Anode ROW 2
14
Anode ROW 7
2
Cathode Column 2
15
Cathode Column 7
3
NO CONNECT
16
NO CONNECT
4
Anode ROW 4
17
Anode ROW 5
5
Cathode Column 4
18
Cathode Column 5
6
NO CONNECT
19
NO CONNECT
7
Anode ROW 6
20
Anode ROW 3
8
Cathode Column 6
21
Cathode Column 3
9
NO CONNECT
22
NO CONNECT
10
Anode ROW 8
23
Anode ROW 1
11
Cathode Column 8
24
Cathode Column 1
12
NO CONNECT
25
NO CONNECT
13
NO CONNECT
26
NO CONNECT
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page 4/9
Electrical Connection
PIN NO.
LMD8812JHR-XX-PF
PIN NO.
LMD8812JHR-XX-PF
1
Cathode ROW 2
14
Cathode ROW 7
2
Anode Column 2
15
Anode Column 7
3
NO CONNECT
16
NO CONNECT
4
Cathode ROW 4
17
Cathode ROW 5
5
Anode Column 4
18
Anode Column 5
6
NO CONNECT
19
NO CONNECT
7
Cathode ROW 6
20
Cathode ROW 3
8
Anode Column 6
21
Anode Column 3
9
NO CONNECT
22
NO CONNECT
10
Cathode ROW 8
23
Cathode ROW 1
11
Anode Column 8
24
Anode Column 1
12
NO CONNECT
25
NO CONNECT
13
NO CONNECT
26
NO CONNECT
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page 5/9
Absolute Maximum Ratings at Ta=25 ℃
Ratings
Symbol
Parameter
UNIT
HR
Forward Current
IF
30
mA
Peak Forward Current
Duty 1/10@10KHz
IFP
100
mA
Power Dissipation
PD
100
mW
Reverse Current @5V
Ir
10
μA
Operating Temperature
Topr
-25 ~ +85
℃
Storage Temperature
Tstg
-25 ~ +85
℃
Part Selection And Application Information(Ratings at 25℃)
Electrical
common
λP △λ
Vf(v)
Iv(mcd)
IV-M
cathode
(nm) (nm)
Material Emitted or anode
Min. Typ. Max. Min. Typ.
CHIP
PART NO
LMD8811JHR-XX-PF
GaAlAs
Red
Common
Cathode
Red
Common
Anode
660
20
1.5
1.8
2.4 15.25
26
2:1
LMD8812JHR-XX-PF
GaAlAs
660
20
1.5
1.8
Note : 1.The forward voltage data did not including ± 0.1V testing tolerance.
2. The luminous intensity data did not including ±15% testing tolerance.
2.4 15.25
26
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page 6/9
Test Condition For Each Parameter
Symbol
Unit
Test Condition
Forward Voltage Per Chip
Vf
volt
If=20mA
Luminous Intensity Per Chip
Iv
mcd
If=10mA
Peak Wavelength
λP
nm
If=20mA
Spectral Line Half-Width
△λ
nm
If=20mA
Ir
μA
Vr=5V
Parameter
Reverse Current Any Chip
Luminous Intensity Matching Ratio
IV-M
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page7/9
Typical Electro-Optical Characteristics Curve
HR CHIP
Fig.1 Forward current vs. Forward Voltage
3.0
Relative Intensity@20mA
1000
Forward Current(mA)
Fig.2 Relative Intensity vs. Forward Current
100
10
1.0
0.1
1.0
2.0
3.0
4.0
2.5
2.0
1.5
1.0
0.5
0
5.0
1.0
10
Fig.4 Relative Intensity vs. Temperature
1.2
Relative Intensity@20mA
Forward Voltage@20mA
Fig.3 Forward Voltage vs. Temperature
1.1
1.0
0.9
0.8
-20
-0
20
40
60
80
100
Relative Intensity@20mA
Fig.5 Relative Intensity vs. Wavelength
1.0
0.5
0
650
700
Wavelength (nm)
3.0
2.5
2.0
1.5
1.0
0.5
0
-40
-20
-0
20
40
60
80
Ambient Temperature( ℃)
Ambient Temperature( ℃)
600
1000
Forward Current(mA)
Forward Voltage(V)
-40
100
750
100
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page 8/9
Soldering Condition(Pb-Free)
1.Iron:
Soldering Iron:30W Max
Temperature 350° C Max
Soldering Time:3 Seconds Max(One time only)
Distance:Solder Temperature 1/16 Inch Below Seating
Plane For 3 Seconds At 260°C
2.Wave Soldering Profile
Dip Soldering
Preheat: 120°C Max
Preheat time: 60seconds Max
Ramp-up
2° C/sec(max)
Ramp-Down:-5° C/sec(max)
Solder Bath:260°C Max
Dipping Time:3 seconds Max
Distance:Solder Temperature 1/16 Inch Below Seating
Plane For 3 Seconds At 260° C
Temp(°C)
260° C3sec Max
260°
5° /sec
max
120°
25°
0°
2° /sec
max
0
Preheat
60 Seconds Max
50
100
Note: 1.Wave solder should not be made more than one time.
2.You can just only select one of the soldering conditions as above.
150
Time(sec)
LIGITEK ELECTRONICS CO.,LTD.
Property of Ligitek Only
PART NO. LMD8811/2JHR-XX-PF
Page 9/9
Reliability Test:
Test Item
Test Condition
Description
Reference
Standard
Operating Life Test
1.Under Room Temperature
2.If=10mA
3.t=1000 hrs (-24hrs, +72hrs)
This test is conducted for the purpose
of detemining the resistance of a part
in electrical and themal stressed.
MIL-STD-750: 1026
MIL-STD-883: 1005
JIS C 7021: B-1
High Temperature
Storage Test
1.Ta=105 ℃±5℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance of
the device which is laid under condition
of high temperature for hours.
MIL-STD-883:1008
JIS C 7021: B-10
Low Temperature
Storage Test
1.Ta=-40 ℃±5 ℃
2.t=1000 hrs (-24hrs, +72hrs)
The purpose of this is the resistance
of the device which is laid under
condition of low temperature for hours.
High Temperature
High Humidity Test
1.Ta=65 ℃±5 ℃
2.RH=90 %~95%
3.t=240hrs ±2hrs
The purpose of this test is the resistance
of the device under tropical for hours.
1.Ta=105 ℃±5℃&-40 ℃±5℃
(10min) (10min)
2.total 10 cycles
The purpose of this is the resistance of
the device to sudden extreme changes
in high and low temperature.
MIL-STD-202: 107D
MIL-STD-750: 1051
MIL-STD-883: 1011
Solder Resistance
Test
1.T.Sol=260 ℃±5 ℃
2.Dwell time= 10 ±1sec.
This test intended to determine the
thermal characteristic resistance
of the device to sudden exposures
at extreme changes in temperature
when soldering the lead wire.
MIL-STD-202: 210A
MIL-STD-750: 2031
JIS C 7021: A-1
Solderability Test
1.T.Sol=230 ℃±5 ℃
2.Dwell time=5 ±1sec
This test intended to see soldering well
performed or not.
MIL-STD-202: 208D
MIL-STD-750: 2026
MIL-STD-883: 2003
JIS C 7021: A-2
Thermal Shock Test
JIS C 7021: B-12
MIL-STD-202:103B
JIS C 7021: B-11