LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only ROUND TYPE LED LAMPS LSBI3330/S150 DATA SHEET DOC. NO : QW0905-LSBI3330/S150 REV : A DATE : 18 - Nov. - 2005 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LSBI3330/S150 Page 1/4 Package Dimensions 5.0 5.9 7.6 8.6 1.5MAX □0.5 TYP 25.0MIN 1.0MIN 2.54TYP + - Note : 1.All dimension are in millimeter tolerance is ± 0.25mm unless otherwise noted. 2.Specifications are subject to change without notice. Directivity Radiation 0° -30° 30° -60° 100% 75% 50% 60° 25% 0 25% 50% 75% 100% LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only Page 2/4 PART NO. LSBI3330/S150 Absolute Maximum Ratings at Ta=25 ℃ Ratings Symbol Parameter UNIT SBI Forward Current IF 30 mA Peak Forward Current Duty 1/10@10KHz IFP 70 mA Power Dissipation PD 120 mW Ir 50 μA Electrostatic Discharge( * ) ESD 500 V Operating Temperature Topr -20 ~ +80 ℃ Storage Temperature Tstg -30 ~ +100 ℃ Soldering Temperature Tsol Reverse Current @5V Max 260 ℃ for 5 sec Max (2mm from body) Electricity or power surge will damage the LED. Use of a conductive wrist band or anti-electrosatic * Static glove is recommended when handing these LED. All devices, equipment and machinery must be properly grounded. Typical Electrical & Optical Characteristics (Ta=25 ℃) COLOR PART NO MATERIAL Emitted LSBI3330/S150 InGaN/SiC Blue Forward Peak Dominant Spectral voltage wave wave halfwidth length length △λnm @20mA(V) λPnm λDnm @20mA(mcd) Viewing angle 2θ 1/2 (deg) Typ. Max. Min. Typ. Lens Sky Blue Diffused Luminous intensity 430 465 65 3.8 Note : 1.The forward voltage data did not including ± 0.1V testing tolerance. 2. The luminous intensity data did not including ±15% testing tolerance. 4.7 65 108 20 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LSBI3330/S150 Page 3/4 Typical Electro-Optical Characteristics Curve SBI CHIP Fig.2 Relative Intensity vs. Wavelength 30 1.0 Relative Intensity(%) Forward Current(mA DC) Fig.1 Forward current vs. Forward Voltage 25 20 15 10 5 0 1 2 3 4 0.5 0 380 5 Forward Voltage(V) 580 630 680 10 100 Relative Intensity Relative Intensity(%) 530 Fig.4 Relative Intensity vs. Lead Temperature 125 75 50 25 0 5 10 15 20 25 30 35 40 45 Fig.5 Forward Current vs. Ambient Temperature 40 30 20 10 0 0 25 50 75 Ambient Temperature ( ℃) 1 0 0 25 50 75 Lead Temperature ( ℃) Forward Current (mA DC) Forward Current (mA DC) 480 Wavelength (nm) Fig.3 Relative Intensity vs. Forward Current 0 430 100 100 LIGITEK ELECTRONICS CO.,LTD. Property of Ligitek Only PART NO. LSBI3330/S150 Page 4/4 Reliability Test: Test Item Test Condition Description Reference Standard Operating Life Test 1.Under Room Temperature 2.If=20mA 3.t=1000 hrs (-24hrs, +72hrs) This test is conducted for the purpose of detemining the resisance of a part in electrical and themal stressed. MIL-STD-750: 1026 MIL-STD-883: 1005 JIS C 7021: B-1 High Temperature Storage Test 1.Ta=105 ℃±5℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under ondition of high temperature for hours. MIL-STD-883:1008 JIS C 7021: B-10 Low Temperature Storage Test 1.Ta=-40 ℃±5 ℃ 2.t=1000 hrs (-24hrs, +72hrs) The purpose of this is the resistance of the device which is laid under condition of low temperature for hours. High Temperature High Humidity Test 1.Ta=65 ℃±5 ℃ 2.RH=90 %~95% 3.t=240hrs ±2hrs The purpose of this test is the resistance of the device under tropical for hous. 1.Ta=105 ℃±5℃&-40 ℃±5℃ (10min) (10min) 2.total 10 cycles The purpose of this is the resistance of the device to sudden extreme changes in high and low temperature. MIL-STD-202: 107D MIL-STD-750: 1051 MIL-STD-883: 1011 Solder Resistance Test 1.T.Sol=260 ℃±5 ℃ 2.Dwell time= 10 ±1sec. This test intended to determine the thermal characteristic resistance of the device to sudden exposures at extreme changes in temperature when soldering the lead wire. MIL-STD-202: 210A MIL-STD-750: 2031 JIS C 7021: A-1 Solderability Test 1.T.Sol=230 ℃±5 ℃ 2.Dwell time=5 ±1sec This test intended to see soldering well performed or not. MIL-STD-202: 208D MIL-STD-750: 2026 MIL-STD-883: 2003 JIS C 7021: A-2 Thermal Shock Test JIS C 7021: B-12 MIL-STD-202:103B JIS C 7021: B-11