MICROCIRCUIT DATA SHEET Original Creation Date: 07/10/95 Last Update Date: 02/24/03 Last Major Revision Date: 07/10/95 MNLM129A-X REV 0CL PRECISION REFERENCE General Description The LM129 is a precision multi-current temperature-compensated 6.9V zener reference with dynamic impedances a factor of 10 to 100 less than discrete diodes. Constructed in a single silicon chip, the LM129 uses active circuitry to buffer the internal zener allowing the device to operate over a 0.5 mA to 15 mA range with virtually no change in performance. The LM129 is available with selected temperature coefficients of 0.001, 0.002, 0.005 and 0.01%/ C. These new references also have excellent long term stability and low noise. A new subsurface breakdown zener used in the LM129 gives lower noise and better long-term stability than coventional IC zeners. Further the zener and temperature compensating transistor are made by a planar process so they are immune to problems that plague ordinary zeners. For example, there is virtually no voltage shift in zener voltage due to temperature cycling and the device is insenstive to stress on the leads. The LM129 can be used in place of conventional zeners with improved performance. The low dynamic impedance simplifies biasing and the wide operating current allows the replacement of may zener types. The LM129 is packaged in a 2-lead T0-46 package and is rated for operation over a -55 C to +125 C temperature range. Industry Part Number NS Part Numbers LM129 LM129AH-SMD* LM129AH/883 Prime Die LM129 Controlling Document 5962-8992101XA* Processing Subgrp Description 1 2 3 4 5 6 7 8A 8B 9 10 11 MIL-STD-883, Method 5004 Quality Conformance Inspection MIL-STD-883, Method 5005 1 Static tests at Static tests at Static tests at Dynamic tests at Dynamic tests at Dynamic tests at Functional tests at Functional tests at Functional tests at Switching tests at Switching tests at Switching tests at Temp ( oC) +25 +125 -55 +25 +125 -55 +25 +125 -55 +25 +125 -55 MICROCIRCUIT DATA SHEET MNLM129A-X REV 0CL (Absolute Maximum Ratings) Reverse Breakdown Current mA Forward Current 2 mA Operating Temperature Range LM129 Storage Temperature Range -55 C to +125 C -55 C to +125 C Soldering Information T0-92 Package 10 Sec. T0-46 Package 10 Sec. ESD Tolerance (Note 1) 260 C 300 C 3500V Note 1: Human body model, 1.5k Ohms in series with 100pF 2 MICROCIRCUIT DATA SHEET MNLM129A-X REV 0CL Electrical Characteristics DC PARAMETERS SYMBOL PARAMETER CONDITIONS NOTES Vr Reverse Breakdown Voltage 0.6mA < Ir < 15 mA Vr (I) Reverse Breakdown Change w/Current 0.6mA < Ir < 15 mA Rr Reverse Dynamic Impedance Ir = 1mA Vn RMS Noise 10Hz < F < 10KHz Iq Quiescent Current Vnpk Zener Peak Noise 10Hz < FREQ < 10KHz Vf Forward Voltage Ir = 1mA Tc(1) Temperature Coefficient Ir = 1.9mA, -55 C < TA < 125 C Temperature Coefficient Ir = 1.9mA, -55 C < TA < 125 C Tc(2) Note 1: Note 2: PINNAME MIN 6.7 1 -1 1, 2 1, 2 Parameter tested go-no-go only. Tested on the National Drift Oven, use program DRFT129XEE. 3 -12.4 MAX UNIT SUBGROUPS 7.2 V 1 14 mV 1 1 Ohm 1 20 uV 1 0.6 mA 1 80 uV 1 -0.2 V 1 10 ppm/ 1 12.4 C mV 1 MICROCIRCUIT DATA SHEET MNLM129A-X REV 0CL Revision History Rev ECN # 0CL M0004110 02/24/03 Rel Date Originator Changes Rose Malone Update MDS: MNLM129A-X, Rev. 0BL to MNLM129A-X, Rev. 0CL. Added ESD Level in Absolute Maximum Ratings Section. 4