ICX418AKB
Diagonal 8mm (Type 1/2) CCD Image Sensor for NTSC Color Video Cameras
Description
The ICX418AKB is an interline CCD solid-state
image sensor suitable for NTSC color video cameras
with a diagonal 8mm (Type 1/2) system. Compared
with the current product ICX038DNB, basic
characteristics such as sensitivity, smear, dynamic
range and S/N are improved drastically.
This chip features a field period readout system and
an electronic shutter with variable charge-storage
time. Also, this outline is miniaturized by using
original package. This chip is compatible with the
pins of the ICX038DNB and has the same drive
conditions.
16 pin DIP (Ceramic)
Pin 1
2
V
Features
• High sensitivity (+6.0dB compared with the ICX038DNB)
3
• Low smear (–5.0dB compared with the ICX038DNB)
40
H
Pin 9
• High D range (+2.0dB compared with the ICX038DNB)
• High S/N
Optical black position
• High resolution and low dark current
(Top View)
• Excellent antiblooming characteristics
• Ye, Cy, Mg, and G complementary color mosaic filters on chip
• Continuous variable-speed shutter
• Substrate bias:
Adjustment free (external adjustment also possible with 6 to 14V)
• Reset gate pulse:
5Vp-p adjustment free (drive also possible with 0 to 9V)
• Horizontal register:
5V drive
• Maximum package dimensions: φ13.2mm
12
Device Structure
• Interline CCD image sensor
• Optical size:
Diagonal 8mm (Type 1/2)
• Number of effective pixels: 768 (H) × 494 (V) approx. 380K pixels
• Total number of pixels:
811 (H) × 508 (V) approx. 410K pixels
• Chip size:
7.40mm (H) × 5.95mm (V)
• Unit cell size:
8.4µm (H) × 9.8µm (V)
• Optical black:
Horizontal (H) direction: Front 3 pixels, rear 40 pixels
Vertical (V) direction:
Front 12 pixels, rear 2 pixels
• Number of dummy bits:
Horizontal 22
Vertical 1 (even fields only)
• Substrate material:
Silicon
Sony reserves the right to change products and specifications without prior notice. This information does not convey any license by
any implication or otherwise under any patents or other right. Application circuits shown, if any, are typical examples illustrating the
operation of the devices. Sony cannot assume responsibility for any problems arising out of the use of these circuits.
–1–
E01907
ICX418AKB
VDD
VL
Vφ1
φSUB
Vφ2
Vφ3
Vφ4
8
7
6
5
4
3
2
1
Vertical Register
VOUT
Block Diagram and Pin Configuration
(Top View)
Cy
Ye
Cy
Ye
Mg
G
Mg
G
Cy
Ye
Cy
Ye
Mg
G
Mg
G
Cy
Ye
Cy
Ye
Mg
G
Mg
G
Note)
Horizontal Register
14
15
16
Hφ1
Hφ2
13
VDSUB
12
φRG
NC
11
RD
10
GND
9
NC
Note)
: Photo sensor
Pin Description
Pin No. Symbol
Description
Pin No. Symbol
Description
1
Vφ4
Vertical register transfer clock
9
NC
2
Vφ3
Vertical register transfer clock
10
NC
3
Vφ2
Vertical register transfer clock
11
GND
GND
4
φSUB
Substrate clock
12
RD
Reset drain bias
5
Vφ1
Vertical register transfer clock
13
φRG
Reset gate clock
6
VL
Protective transistor bias
14
VDSUB
Substrate bias circuit supply voltage
7
VDD
Output circuit supply voltage
15
Hφ1
Horizontal register transfer clock
8
VOUT
Signal output
16
Hφ2
Horizontal register transfer clock
–2–
ICX418AKB
Absolute Maximum Ratings
Item
Ratings
Unit
–0.3 to +50
V
VDD, VRD, VDSUB, VOUT – GND
–0.3 to +18
V
VDD, VRD, VDSUB, VOUT – φSUB
–55 to +10
V
Vφ1, Vφ2, Vφ3, Vφ4 – GND
–15 to +20
V
Vφ1, Vφ2, Vφ3, Vφ4 – φSUB
to +10
V
Voltage difference between vertical clock input pins
to +15
V
Voltage difference between horizontal clock input pins
to +17
V
Hφ1, Hφ2 – Vφ4
–17 to +17
V
φRG – GND
–10 to +15
V
φRG – φSUB
–55 to +10
V
VL – φSUB
–65 to +0.3
V
Pins other than GND and φSUB – VL
–0.3 to +30
V
Storage temperature
–30 to +80
°C
Operating temperature
–10 to +60
°C
Substrate clock φSUB – GND
Supply voltage
Clock input voltage
∗1 +27V (Max.) when clock width < 10µs, clock duty factor < 0.1%.
–3–
Remarks
∗1
ICX418AKB
Bias Conditions 1 [when used in substrate bias internal generation mode]
Item
Symbol
Min.
Typ.
Max.
Unit
Output circuit supply voltage
VDD
14.55
15.0
15.45
V
Reset drain voltage
VRD
14.55
15.0
15.45
V
Protective transistor bias
VL
Substrate bias circuit supply voltage
VDSUB
15.45
V
Substrate clock
φSUB
Remarks
VRD = VDD
∗1
14.55
15.0
∗2
∗1 VL setting is the VVL voltage of the vertical transfer clock waveform, or the same supply voltage as the VL
power supply for the V driver should be used. (When CXD1267AN is used.)
∗2 Do not apply a DC bias to the substrate clock pin, because a DC bias is generated within the CCD.
Bias Conditions 2 [when used in substrate bias external adjustment mode]
Item
Symbol
Min.
Typ.
Max.
Unit
Remarks
Output circuit supply voltage
VDD
14.55
15.0
15.45
V
Reset drain voltage
VRD
14.55
15.0
15.45
V
VRD = VDD
Protective transistor bias
VL
∗3
Substrate bias circuit supply voltage
VDSUB
∗4
Substrate voltage adjustment range
VSUB
6.0
14.0
V
∗5
Substrate voltage adjustment precision
∆VSUB
–3
+3
%
∗5
∗3 VL setting is the VVL voltage of the vertical transfer clock waveform, or the same supply voltage as the VL
power supply for the V driver should be used. (When CXD1267AN is used.)
∗4 Connect to GND or leave open.
∗5 The setting value of the substrate voltage (VSUB) is indicated on the back of the image sensor by a
special code. When adjusting the substrate voltage externally, adjust the substrate voltage to the indicated
voltage. The adjustment precision is ±3%. However, this setting value has not significance when used in
substrate bias internal generation mode.
VSUB code — one character indication
Code and optimal setting correspond to each other as follows.
VSUB code
E
Optimal setting 6.0
f
G
h
J
K
L
m
6.5
7.0
7.5
8.0
8.5
9.0
N
P
Q
R
S
T
DC Characteristics
Output circuit supply current
Symbol
V
W
9.5 10.0 10.5 11.0 11.5 12.0 12.5 13.0 13.5 14.0
<Example> "L" → VSUB = 9.0V
Item
U
Min.
IDD
–4–
Typ.
Max.
Unit
5.0
10.0
mA
Remarks
ICX418AKB
Clock Voltage Conditions
Item
Readout clock voltage
Vertical transfer clock
voltage
Horizontal transfer
clock voltage
Symbol
Min.
Waveform
diagram
Remarks
VVT
14.55 15.0 15.45
V
1
VVH1, VVH2
–0.05
0
0.05
V
2
VVH3, VVH4
–0.2
0
0.05
V
2
VVL1, VVL2,
VVL3, VVL4
–9.6 –9.0 –8.5
V
2
VVL = (VVL3 + VVL4)/2
VφV
8.3
9.65 Vp-p
2
VφV = VVHn – VVLn (n = 1 to 4)
0.1
V
2
9.0
| VVH1 – VVH2 |
VVH = (VVH1 + VVH2)/2
VVH3 – VVH
–0.25
0.1
V
2
VVH4 – VVH
–0.25
0.1
V
2
VVHH
0.5
V
2
High-level coupling
VVHL
0.5
V
2
High-level coupling
VVLH
0.5
V
2
Low-level coupling
VVLL
0.5
V
2
Low-level coupling
VφH
4.75
5.0
VHL
–0.05
0
VφRG
4.5
5.0
VRGLH – VRGLL
Substrate clock voltage VφSUB
5.25 Vp-p
3
0.05
V
3
V
4
∗1
VRGL
Reset gate clock
voltage∗1
Typ. Max. Unit
5.5 Vp-p
4
0.8
4
V
23.0 24.0 25.0 Vp-p
Low-level coupling
5
∗1 Input the reset gate clock without applying a DC bias. In addition, the reset gate clock can also be driven
with the following specifications.
Item
Reset gate clock
voltage
Symbol
Min.
Typ. Max. Unit
VRGL
–0.2
0
VφRG
8.5
9.0
0.2
V
9.5 Vp-p
–5–
Waveform
diagram
4
4
Remarks
ICX418AKB
Clock Equivalent Circuit Constant
Symbol
Item
Typ.
Min.
Max.
Unit
CφV1, CφV3
2700
pF
CφV2, CφV4
2700
pF
CφV12, CφV34
820
pF
CφV23, CφV41
330
pF
Capacitance between horizontal transfer clock CφH1
and GND
CφH2
100
pF
91
pF
Capacitance between horizontal transfer clocks
CφHH
47
pF
Capacitance between reset gate clock and GND
CφRG
11
pF
Capacitance between substrate clock and GND
CφSUB
680
pF
R1, R3
91
Ω
R2, R4
100
Ω
RGND
68
Ω
Capacitance between vertical transfer clock
and GND
Capacitance between vertical transfer clocks
Vertical transfer clock series resistor
Vertical transfer clock ground resistor
Vφ2
Vφ1
CφV12
R1
R2
Hφ1
CφV1
CφV23
CφV4
Vφ4
Hφ2
CφHH
CφV2
CφV41
R4
Remarks
RGND
CφV34
CφH1
CφH2
CφV3
R3
Vφ3
Vertical transfer clock equivalent circuit
Horizontal transfer clock equivalent circuit
–6–
ICX418AKB
Drive Clock Waveform Conditions
(1) Readout clock waveform
100%
90%
VVT
φM
φM
2
10%
0%
tr
twh
0V
tf
(2) Vertical transfer clock waveform
Vφ1
Vφ3
VVH1
VVHH
VVH
VVHH
VVHL
VVHL
VVHL
VVL1
VVHH
VVHH
VVH3
VVH
VVHL
VVL3
VVLH
VVLH
VVLL
VVLL
VVL
VVL
Vφ2
Vφ4
VVHH
VVHH
VVH
VVH
VVHH
VVHH
VVHL
VVHL
VVH2 VVHL
VVH4
VVLH
VVL2VVLH
VVLL
VVLL
VVL4
VVL
VVH = (VVH1 + VVH2)/2
VVL = (VVL3 + VVL4)/2
VφV = VVHn – VVLn (n = 1 to 4)
VVHL
–7–
VVL
ICX418AKB
(3) Horizontal transfer clock waveform
tr
twh
tf
90%
VφH
twl
10%
VHL
tr
(4) Reset gate clock waveform
twh
tf
VRGH
twl
VφRG
Point A
RG waveform
VRGL + 0.5V
VRGLH
VRGL
VRGLL
VRGLm
Hφ1 waveform
+2.5V
VRGLH is the maximum value and VRGLL is the minimum value of the coupling waveform during the period from
Point A in the above diagram until the rising edge of RG. In addition, VRGL is the average value of VRGLH and
VRGLL.
VRGL = (VRGLH + VRGLL)/2
Assuming VRGH is the minimum value during the period twh, then:
VφRG = VRGH – VRGL
Negative overshoot level during the falling edge of RG is VRGLm.
(5) Substrate clock waveform
100%
90%
φM
VφSUB
φM
2
10%
VSUB
0%
tr
twh
–8–
tf
ICX418AKB
Clock Switching Characteristics
Item
Symbol
VT
Vertical transfer
clock
Vφ1, Vφ2,
Vφ3, Vφ4
Horizontal
transfer clock
Readout clock
During
imaging
twh
2.3 2.5
φSUB
tf
0.5
0.5
20
20
15
5.38
19
Remarks
Unit
µs During readout
250 ns ∗1
15
During
Hφ1
parallel-serial
Hφ2
conversion
Substrate clock
tr
Min. Typ. Max. Min. Typ. Max. Min. Typ. Max. Min. Typ. Max.
Hφ
Reset gate clock φRG
twl
15
0.01
0.01
5.38
0.01
0.01
51
3
3
19
ns
∗2
µs
11
13
1.5 1.8
0.5
ns
0.5 µs
∗1 When vertical transfer clock driver CXD1267AN is used.
∗2 tf ≥ tr – 2ns.
Item
Symbol
Horizontal transfer clock
Hφ1, Hφ2
two
Min.
Typ.
16
20
Max.
Unit Remarks
ns
∗3
∗3 The overlap period for twh and twl of horizontal transfer clocks Hφ1 and Hφ2 is two.
–9–
During drain
charge
ICX418AKB
Image Sensor Characteristics
(Ta = 25°C)
Unit
Measurement
method
mV
1
mV
2
–105
dB
3
20
%
4
Zone 0 and I
25
%
4
Zone 0 to II'
∆Sr
10
%
5
∆Sb
10
%
5
Dark signal
Ydt
2
mV
6
Ta = 60°C
Dark signal shading
∆Ydt
1
mV
7
Ta = 60°C
Flicker Y
Fy
2
%
8
Flicker R-Y
Fcr
5
%
8
Flicker B-Y
Fcb
5
%
8
Line crawl R
Lcr
3
%
9
Line crawl G
Lcg
3
%
9
Line crawl B
Lcb
3
%
9
Line crawl W
Lcw
3
%
9
Lag
Lag
0.5
%
10
Item
Symbol
Min.
Typ.
Sensitivity
S
1040
1300
Saturation signal
Ysat
1000
Smear
Sm
Video signal shading
SHy
Uniformity between
video signal channels
–115
Max.
Remarks
Ta = 60°C
Zone Definition of Video Signal Shading
768 (H)
14
14
12
H
8
V
10
H
8
Zone 0, I
494 (V)
10
Zone II, II'
V
10
Ignored region
Effective pixel region
Measurement System
[∗A]
CCD signal output
LPF1
[∗Y]
Y signal output
(3dB down 6.3MHz)
CCD
C.D.S
AMP
[∗C]
S/H
LPF2
S/H
Chroma signal output
(3dB down 1MHz)
Note) Adjust the amplifier gain so that the gain between [∗A] and [∗Y], and between [∗A] and [∗C] equals 1.
– 10 –
ICX418AKB
Image Sensor Characteristics Measurement Method
Measurement conditions
1) In the following measurements, the device drive conditions are at the typical values of the bias and clock
voltage conditions. (when used with substrate bias external adjustment, set the substrate voltage to the
value indicated on the device.)
2) In the following measurements, spot blemishes are excluded and, unless otherwise specified, the optical
black level (OB) is used as the reference for the signal output, which is taken as the value of Y signal output
or chroma signal output of the measurement system.
Color coding of this image sensor & Composition of luminance (Y) and chroma (color difference) signals
Cy
Ye
Cy
Ye
A1
G
Mg
G
Mg
Cy
Ye
Cy
Ye
Mg
G
Mg
G
B
A2
As shown in the left figure, fields are read out. The charge is
mixed by pairs such as A1 and A2 in the A field. (pairs such
as B in the B field)
As a result, the sequence of charges output as signals from
the horizontal shift register (Hreg) is, for line A1, (G + Cy),
(Mg + Ye), (G + Cy), and (Mg + Ye).
Hreg
Color Coding Diagram
These signals are processed to form the Y signal and chroma (color difference) signal. The Y signal is formed
by adding adjacent signals, and the chroma signal is formed by subtracting adjacent signals. In other words,
the approximation:
Y = {(G + Cy) + (Mg + Ye)} × 1/2
= 1/2 {2B + 3G + 2R}
is used for the Y signal, and the approximation:
R – Y = {(Mg + Ye) – (G + Cy)}
= {2R – G}
is used for the chroma (color difference) signal. For line A2, the signals output from Hreg in sequence are
(Mg + Cy), (G + Ye), (Mg + Cy), (G + Ye).
The Y signal is formed from these signals as follows:
Y = {(G + Ye) + (Mg + Cy)} × 1/2
= 1/2 {2B + 3G + 2R}
This is balanced since it is formed in the same way as for line A1.
In a like manner, the chroma (color difference) signal is approximated as follows:
– (B – Y) = {(G + Ye) – (Mg + Cy)}
= – {2B – G}
In other words, the chroma signal can be retrieved according to the sequence of lines from R – Y and – (B – Y)
in alternation. This is also true for the B field.
– 11 –
ICX418AKB
Definition of standard imaging conditions
1) Standard imaging condition I:
Use a pattern box (luminance 706cd/m2, color temperature of 3200K halogen source) as a subject. (Pattern
for evaluation is not applicable.) Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter and
image at F5.6. The luminous intensity to the sensor receiving surface at this point is defined as the standard
sensitivity testing luminous intensity.
2) Standard imaging condition II:
Image a light source (color temperature of 3200K) with a uniformity of brightness within 2% at all angles.
Use a testing standard lens with CM500S (t = 1.0mm) as an IR cut filter. The luminous intensity is adjusted
to the value indicated in each testing item by the lens diaphragm.
1. Sensitivity
Set to standard imaging condition I. After selecting the electronic shutter mode with a shutter speed of
1/250s, measure the Y signal (Ys) at the center of the screen and substitute the value into the following
formula.
S = Ys ×
250
[mV]
60
2. Saturation signal
Set to standard imaging condition II. After adjusting the luminous intensity to 10 times the intensity with
average value of the Y signal output, 200mV, measure the minimum value of the Y signal.
3. Smear
Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity to
500 times the intensity with average value of the Y signal output, 200mV. When the readout clock is
stopped and the charge drain is executed by the electronic shutter at the respective H blankings, measure
the maximum value YSm [mV] of the Y signal output and substitute the value into the following formula.
Sm = 20 × log
YSm × 1 ×
500
200
1
10
[dB] (1/10V method conversion value)
4. Video signal shading
Set to standard imaging condition II. With the lens diaphragm at F5.6 to F8, adjust the luminous intensity so
that the average value of the Y signal output is 200mV. Then measure the maximum (Ymax [mV]) and
minimum (Ymin [mV]) values of the Y signal and substitute the values into the following formula.
SHy = (Ymax – Ymin)/200 × 100 [%]
5. Uniformity between video signal channels
Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal
output is 200mV, and then measure the maximum (Crmax, Cbmax [mV]) and minimum (Crmin, Cbmin
[mV]) values of the R – Y and B – Y channels of the chroma signal and substitute the values into the
following formula.
∆Sr = | (Crmax – Crmin)/200 | × 100 [%]
∆Sb = | (Cbmax – Cbmin)/200 | × 100 [%]
6. Dark signal
Measure the average value of the Y signal output (Ydt [mV]) with the device ambient temperature 60°C and
the device in the light-obstructed state, using the horizontal idle transfer level as a reference.
– 12 –
ICX418AKB
7. Dark signal shading
After measuring 6, measure the maximum (Ydmax [mV]) and minimum (Ydmin [mV]) values of the dark
signal output and substitute the values into the following formula.
∆Ydt = Ydmax – Ydmin [mV]
8. Flicker
1) Fy
Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal
output is 200mV, and then measure the difference in the signal level between fields (∆Yf [mV]). Then
substitute the value into the following formula.
Fy = (∆Yf/200) × 100 [%]
2) Fcr, Fcb
Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal
output is 200mV, insert an R or B filter, and then measure both the difference in the signal level between
fields of the chroma signal (∆Cr, ∆Cb) as well as the average value of the chroma signal output (CAr, CAb).
Substitute the values into the following formula.
Fci = (∆Ci/CAi) × 100 [%] (i = r, b)
9. Line crawls
Set to standard imaging condition II. Adjust the luminous intensity so that the average value of the Y signal
output is 200mV, and then insert a white subject and R, G, and B filters and measure the difference
between Y signal lines for the same field (∆Ylw, ∆Ylr, ∆Ylg, ∆Ylb [mV]). Substitute the values into the
following formula.
Lci = (∆Yli/200) × 100 [%] (i = w, r, g, b)
10. Lag
Adjust the Y signal output value generated by strobe light to 200mV. After setting the strobe light so that it
strobes with the following timing, measure the residual signal (Ylag). Substitute the value into the following
formula.
Lag = (Ylag/200) × 100 [%]
FLD
V1
Light
Strobe light
timing
Y signal output 200mV
Output
– 13 –
Ylag (lag)
Drive Circuit 1 (substrate bias internal generation mode)
15V
1
20
2
19
3
18
XSUB
4
17
XV2
5
100k
1
1/35V
–9V
16
CXD1267AN
XV1
6
XSG1
7
14
XV3
8
13
XSG2
9
12
XV4
10
11
3.3/16V
15
22/16V
1M
0.01
VOUT
15
14
13
12
11
10
9
VL
16
Vφ1
NC
φSUB
8
VDD
Vφ2
7
NC
Vφ3
6
GND
Vφ4
5
RD
4
φRG
3
VDSUB
2
Hφ1
1
Hφ2
– 14 –
22/20V
3.3/20V
ICX418
(BOTTOM VIEW)
Hφ1
0.01
Hφ2
100
3.9k
ICX418AKB
0.01
RG
[∗A]
CCD OUT
Drive Circuit 2 (substrate bias external adjustment mode)
15V
270k
0.1
1
20
2
19
3
18
XSUB
4
17
XV2
5
15k
47k
56k
1/35V
1/35V
100k 27k
39k
0.1
15k
0.1
1/35V
–9V
16
CXD1267AN
XV1
6
XSG1
7
14
XV3
8
13
XSG2
9
12
XV4
10
11
3.3/16V
15
22/16V
1M
– 15 –
22/20V
VDD
VOUT
NC
15
14
13
12
11
10
9
VL
16
Vφ1
NC
8
GND
φSUB
7
RD
Vφ2
6
φRG
Vφ3
5
VDSUB
4
Hφ1
3
Hφ2
2
Vφ4
3.3/20V
1
0.01
ICX418
(BOTTOM VIEW)
Hφ1
0.01
Hφ2
100
3.9k
ICX418AKB
0.01
RG
[∗A]
CCD OUT
ICX418AKB
Spectral Sensitivity Characteristics (Excludes lens characteristics and light source characteristics)
1.0
Cy
Ye
0.8
Relative Response
G
0.6
0.4
Mg
0.2
0
400
450
500
550
Wave Length [nm]
600
650
700
Sensor Readout Clock Timing Chart
V1
2.5
V2
Odd Field
V3
V4
33.5
1.6
2.5 2.5 2.5
0.2
V1
V2
Even Field
V3
V4
Unit: µs
– 16 –
Drive Timing Chart (Vertical Sync)
FLD
VD
BLK
280
275
270
265
260
20
15
10
525
1
2
3
4
5
520
HD
– 17 –
V1
V2
V3
V4
CCD
OUT
493
494
2 4 6
1 3 5
2 4 6
1 3 5
494
493
1 3 5
2 4 6
1 3 5
2 4 6
ICX418AKB
Drive Timing Chart (Horizontal Sync)
HD
BLK
H1
20
10
20
22
1
2
3
1
2
3
10
1
2
3
5
40
30
20
10
768
1
2
3
5
760
H2
– 18 –
RG
V1
V2
V3
V4
SUB
ICX418AKB
ICX418AKB
Notes on Handling
1) Static charge prevention
CCD image sensors are easily damaged by static discharge. Before handling be sure to take the following
protective measures.
a) Either handle bare handed or use non-chargeable gloves, clothes or material.
Also use conductive shoes.
b) When handling directly use an earth band.
c) Install a conductive mat on the floor or working table to prevent the generation of static electricity.
d) Ionized air is recommended for discharge when handling CCD image sensor.
e) For the shipment of mounted substrates, use boxes treated for the prevention of static charges.
2) Soldering
a) Make sure the package temperature does not exceed 80°C.
b) Solder dipping in a mounting furnace causes damage to the glass and other defects. Use a ground 30W
soldering iron and solder each pin in less than 2 seconds. For repairs and remount, cool sufficiently.
c) To dismount an image sensor, do not use a solder suction equipment. When using an electric desoldering
tool, use a thermal controller of the zero cross On/Off type and connect it to ground.
3) Dust and dirt protection
Image sensors are packed and delivered by taking care of protecting its glass plates from harmful dust and
dirt. Clean glass plates with the following operations as required, and use them.
a) Perform all assembly operations in a clean room (class 1000 or less).
b) Do not either touch glass plates by hand or have any object come in contact with glass surfaces. Should
dirt stick to a glass surface, blow it off with an air blower. (For dirt stuck through static electricity ionized
air is recommended.)
c) Clean with a cotton bud and ethyl alcohol if grease stained. Be careful not to scratch the glass.
d) Keep in a case to protect from dust and dirt. To prevent dew condensation, preheat or precool when
moving to a room with great temperature differences.
e) When a protective tape is applied before shipping, just before use remove the tape applied for electrostatic
protection. Do not reuse the tape.
4) Do not expose to strong light (sun rays) for long periods. For continuous using under cruel condition exceeding
the normal using condition, consult our company.
5) Exposure to high temperature or humidity will affect the characteristics. Accordingly avoid storage or usage in
such conditions.
6) CCD image sensors are precise optical equipment that should not be subject to too much mechanical shocks.
– 19 –
Package Outline
Unit: mm
16 pin DIP (300mil)
3.29 ± 0.3
A
1.84
C
2.54
4.0
H
6.175
1st. pin Index
12.0 ± 0.15
– 20 –
4.0 ± 0.2
~
1.5
1.0
1.84
~
4.0
1
2. The point “B” of the package is the horizontal reference.
The point “B'” of the package is the vertical reference.
B'
0.7
8
1. “A” is the center of the effective image area.
12.35 ± 0.3
1.5
~
7.62
12.35 ± 0.3
8
0.25
1
12.0 ± 0.15
6.175
1.5
V
16
9
9
~
16
~
φ1
3.
2
±
0.
3
B
3. The bottom “C” of the package is the height reference.
4. The center of the effective image area relative to the center of the package (∗)
is (H, V) = (0, 0) ± 0.15mm.
5. The rotation angle of the effective image area relative to H and V is ± 1˚.
6. The height from the bottom “C” to the effective image area is 1.41 ± 0.15mm.
0.6
1.27
7. The tilt of the effective image area relative to the bottom “C” is less than 60µm.
0.3
8. The thickness of the cover glass is 0.75mm, and the refractive index is 1.5.
PACKAGE STRUCTURE
0.3
Ceramic
LEAD TREATMENT
GOLD PLATING
LEAD MATERIAL
42 ALLOY
PACKAGE MASS
0.90g
DRAWING NUMBER
AS-B4-01(E)
M
∗ Center of the package : The center is halfway between two pairs of opposite sides,
as measured from “B”, “B'”.
ICX418AKB
Sony Corporation
PACKAGE MATERIAL