ETC IDT74FCT377CTPY

IDT54/74FCT377AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
FAST CMOS OCTAL
D FLIP-FLOP WITH
CLOCK ENABLE
FEATURES:
•
•
•
•
•
•
•
•
•
IDT54/74FCT377AT/CT/DT
DESCRIPTION:
A, C, and D grades
Low input and output leakage ≤1µA (max.)
CMOS power levels
True TTL input and output compatibility:
– VOH = 3.3V (typ.)
– VOL = 0.3V (typ.)
High Drive outputs (-15mA IOH, 48mA IOL)
Meets or exceeds JEDEC standard 18 specifications
Military product compliant to MIL-STD-883, Class B and DESC
listed (dual marked)
Power off disable outputs permit "live insertion"
Available in the following packages:
– Industrial: SOIC, SSOP, QSOP
– Military: CERDIP, LCC, CERPACK
The IDT54/74FCT377T is an octal D flip-flop built using an advanced
dual metal CMOS technology. The IDT54/74FCT377T has eight edgetriggered, D-type flip-flops with individual D inputs and O outputs. The
common buffered Clock (CP) input loads all flip-flops simultaneously when
the Clock Enable (CE) is low. The register is fully edge-triggered. The state
of each D input, one set-up time before the low-to-high clock transition, is
transferred to the corresponding flip-flop’s O output. The CE input must be
stable only one set-up time prior to the low-to-high transition for predictable
operation.
FUNCTIONAL BLOCK DIAGRAM
D0
D1
D2
D
D4
3
D
D6
5
D
7
CE
D
Q
D
CP
Q
D
CP
Q
D
CP
Q
D
CP
Q
D
CP
Q
D
CP
Q
D
CP
Q
CP
CP
O0
O1
O2
O3
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
O4
O5
O6
O7
MAY 2002
1
© 2002 Integrated Device Technology, Inc.
DSC-2630/7
IDT54/74FCT377AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
D0
3
18
D7
D1
4
17
D6
D1
O1
5
16
O6
O1
O2
6
15
O5
D2
7
14
D5
D3
8
13
D4
O3
9
12
O4
10
11
CP
D6
O2
6
16
O6
D2
7
15
O5
D3
8
14
D5
10
11
12
13
LCC
TOP VIEW
PIN DESCRIPTION
Max
Unit
Pin Names
–0.5 to +7
V
D0 – D7
VTERM(3) Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
CE
TSTG
Storage Temperature
–65 to +150
°C
O 0 – O7
IOUT
DC Output Current
–60 to +120
mA
CP
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
Conditions
Typ.
Max.
Unit
CIN
Input Capacitance
VIN = 0V
6
10
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
Description
Data Inputs
Clock Enable (Active LOW)
Data Outputs
Clock Pulse Input
FUNCTION TABLE(1)
Inputs
Operating Mode
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Parameter(1)
19
17
VTERM(2) Terminal Voltage with Respect to GND
Symbol
20
5
9
ABSOLUTE MAXIMUM RATINGS(1)
Description
1
D7
CERDIP/ SOIC/ SSOP/ QSOP/ CERPACK
TOP VIEW
Symbol
2
18
4
O3
GND
3
O7
O7
D4
19
VCC
2
O4
O0
INDEX
CE
VCC
CP
20
O0
1
GND
CE
D0
PIN CONFIGURATION
CP
CE
D
O
Load “1”
↑
l
h
H
Load “0”
↑
l
l
L
Hold
↑
H
h
H
X
X
No Change
No Change
NOTE:
1. H =
h =
L =
l =
X =
↑ =
NOTE:
1. This parameter is measured at characterization but not tested.
2
Outputs
HIGH Voltage Level
HIGH Voltage Level one setup time prior to the LOW-to-HIGH Clock Transition
LOW Voltage Level
LOW Voltage Level one setup time prior to the LOW-to-HIGH Clock Transition
Don't Care
LOW-to-HIGH Clock Transition
IDT54/74FCT377AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial : TA = –40°C to +85°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Symbol
Parameter
VIH
Input HIGH Level
VIL
Input LOW Level
(4)
IIH
Input HIGH Current
IIL
Input LOW Current(4)
(4)
II
Input HIGH Current
VIK
Clamp Diode Voltage
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
Guaranteed Logic HIGH Level
2
—
—
V
Guaranteed Logic LOW Level
—
—
0.8
V
VCC = Max.
VI = 2.7V
—
—
±1
µA
VCC = Max.
VI = 0.5V
—
—
±1
µA
VCC = Max., VI = VCC (Max.)
—
—
±1
µA
VCC = Min., IN = –18mA
—
–0.7
–1.2
V
–60
–120
–225
mA
2.4
3.3
—
V
2
3
—
V
—
0.3
0.5
V
—
—
±1
µA
—
200
—
mV
—
0.01
1
mA
(3)
IOS
Short Circuit Current
VCC = Max. , VO = GND
VOH
Output HIGH Voltage
VCC = Min.
IOH = –6mA MIL.
VIN = VIH or VIL
IOH = –8mA IND.
IOH = –12mA MIL.
IOH = –15mA IND.
VOL
Output LOW Voltage
VCC = Min.
IOL = 32mA MIL.
VIN = VIH or VIL
IOL = 48mA IND.
IOFF
Input/Output Power Off
VCC = 0V, VIN or VO - 4.5V
(5)
Leakage
VH
ICC
Input Hysteresis
—
Quiescent Power
VCC = Max.
Supply Current
VIN = GND or VCC
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. The test limit for this parameter is ±5µA at TA = -55°C.
5. This parameter is guaranted but not tested.
3
IDT54/74FCT377AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS
Symbol
Parameter
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
—
0.5
2
mA
∆ICC
Quiescent Power Supply
Current TTL Inputs HIGH
VCC = Max.
VIN = 3.4V(3)
ICCD
Dynamic Power Supply
Current(4)
VCC = Max., Outputs Open
CE = GND
One Input Toggling
50% Duty Cycle
VIN = VCC
VIN = GND
—
0.15
0.25
mA/
MHz
IC
Total Power Supply
Current(6)
VCC = Max., Outputs Open
fCP = 10MHz
VIN = VCC
VIN = GND
—
1.5
3.5
mA
CE = GND
One Bit Toggling
fi = 5MHz
50% Duty Cycle
VIN = 3.4V
VIN = GND
—
2
5.5
VCC = Max., Outputs Open
fCP = 10MHz, 50% Duty Cycle
VIN = VCC
VIN = GND
—
3.8
7.3(5)
CE = GND
Eight Bits Toggling
fi = 2.5MHz
50% Duty Cycle
VIN = 3.4V
VIN = GND
—
6
16.3(5)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input; (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of ∆ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2+ fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Output Frequency
Ni = Number of Outputs at fi
All currents are in milliamps and all frequencies are in megahertz.
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
Symbol
tPLH
tPHL
tSU
tH
tSU
tH
tW
Parameter
Propagation Delay
CP to Qx
Set-up Time HIGH or LOW
Dx to CP
Hold Time HIGH or LOW
Dx to CP
Set-up Time HIGH or LOW
CE to CP
Hold Time HIGH or LOW
CE to CP
CP Pulse Width HIGH or LOW
Condition(1)
CL = 50pF
RL = 500Ω
FCT377AT
FCT377CT
FCT377DT
Ind.
Mil.
Ind.
Mil.
Ind.
Mil.
Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Unit
2
7.2
2
8.3
2
5.2
2
5.5
2
4.4
—
—
ns
2
—
2
—
2
—
2
—
2
—
—
—
ns
1.5
—
1.5
—
1.5
—
1.5
—
1
—
—
—
ns
3.5
—
3.5
—
3.5
—
3.5
—
3
—
—
—
ns
1.5
—
1.5
—
1.5
—
1.5
—
0
—
—
—
ns
8
—
7
—
6
—
7
—
3
—
—
—
ns
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
4
IDT54/74FCT377AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
V CC
SWITCH POSITION
7.0V
500Ω
V OUT
VIN
Pulse
Generator
D.U.T
.
50pF
RT
500Ω
Test
Switch
Open Drain
Disable Low
Enable Low
Closed
All Other Tests
Open
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
CL
Octal link
Test Circuits for All Outputs
DATA
INPUT
tH
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
3V
1.5V
0V
3V
1.5V
0V
tREM
tSU
LOW-HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
3V
1.5V
0V
tH
1.5V
Octal link
Pulse Width
Octal link
Set-Up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
DISABLE
3V
1.5V
CONTROL
INPUT
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
OUTPUT
NORMALLY
HIGH
Octal link
SWITCH
CLOSED
tPZH
SWITCH
OPEN
0V
tPLZ
tPZL
VOH
1.5V
VOL
3.5V
3.5V
1.5V
0.3V
VOL
tPHZ
0.3V
1.5V
0V
VOH
0V
Octal link
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
5
IDT54/74FCT377AT/CT/DT
FAST CMOS OCTAL D FLIP-FLOP WITH CLOCK ENABLE
MILITARY AND INDUSTRIAL TEMPERATURE RANGES
ORDERING INFORMATION
XXXX
IDT
XX
FCT
Device Type
Temp. Range
XX
Package
X
Process
CORPORATE HEADQUARTERS
2975 Stender Way
Santa Clara, CA 95054
Blank
B
Industrial
MIL-STD-883, Class B
SO
PY
Q
Industrial Options
Small Outline IC
Shrink Small Outline Package
Quarter-size Small Outline Package
D
E
L
Military Options
CERDIP
CERPACK
Leadless Chip Carrier
377AT
377CT
377DT
Fast CMOS Octal D Flip-Flop with Clock Enable
54
74
– 55°C to +125°C
– 40°C to +85°C
for SALES:
800-345-7015 or 408-727-6116
fax: 408-492-8674
www.idt.com
6
for Tech Support:
[email protected]
(408) 654-6459