ETC IDTQS74FCT2541ATSO

IDTQS74FCT2541T/AT/CT
HIGH-SPEED CMOS 8-INPUT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
HIGH-SPEED CMOS
8-INPUT BUFFER/LINE
DRIVER
IDTQS74FCT2541T/AT/CT
FEATURES:
DESCRIPTION:
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The IDTQS74FCT2541T is an 8-bit buffer/line driver with 3-state
outputs and a 25Ω resistor output , ideal for driving transmission lines and
reducing system noise. The 2540 series parts can replace the 540 series
to reduce noise in an existing design. All inputs have clamp diodes for
undershoot noise suppression. All outputs have ground bounce suppression. Outputs will not load an active bus when Vcc is removed from the
device.
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CMOS power levels: <7.5mW static
Undershoot clamp diodes on all inputs
True TTL input and output compatibility
Ground bounce controlled outputs
Reduced output swing of 0 to 3.5V
Built-in 25Ω series resistor outputs reduce reflection and other
system noise
Std., A, and C speed grades with 4.1ns tPD for C
IOL = 12mA
Available in SOIC and QSOP packages
FUNCTIONAL BLOCK DIAGRAM
OE1
OE2
A0
A1
A2
A3
2
18
3
17
4
16
5
15
Y0
A4
6
14
Y1
A5
7
13
A6
8
12
Y2
Y3
A7
9
11
INDUSTRIAL TEMPERATURE RANGE
Y4
Y5
Y6
Y7
DECEMBER 2000
1
c
2000 Integrated Device Technology, Inc.
DSC-5250/2
IDTQS74FCT2541T/AT/CT
HIGH-SPEED CMOS 8-INPUT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS
PIN CONFIGURATION
OE1
20
1
VCC
A0
2
19
OE2
A1
3
18
Y0
A2
4
17
Y1
A3
5
16
Y2
A4
6
15
Y3
A5
7
14
Y4
A6
8
13
Y5
A7
9
12
Y6
10
11
Y7
(1)
Symbol
VTERM
Description
Terminal Voltage with Respect to GND
Max.
– 0.5 to +7
Unit
V
TSTG
Storage Temperature
– 65 to +150
°C
IOUT
DC Output Current Max Sink Current/Pin
120
mA
IIK
Input Diode Current, VIN < 0
– 20
mA
IOK
Output Diode Current, VOUT < 0
– 50
mA
FCTL
GND
SO20-2
SO20-8
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
CAPACITANCE (TA = +25OC, f = 1.0MHz)
Symbol
CIN
Parameter(1)
Input Capacitance
Conditions
VIN = 0V
Typ.
4
Max.
—
Unit
pF
COUT
Output Capacitance
VOUT = 0V
8
—
pF
FCT_2
SOIC/ QSOP
TOP VIEW
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names
A0-A7
I/O
I
Data Inputs
Description
Y0-Y7
O
Data Outputs
OE1, OE2
I
3-State Output Enable (Active LOW)
FUNCTION TABLE(1)
OE1
OE2
A Inputs
Y Outputs
H
X
L
L
X
H
L
L
X
X
L
H
Z
Z
L
H
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
X = Don’t Care
Z = High-Impedence
2
Function
Disable Outputs
Enable Outputs
IDTQS74FCT2541T/AT/CT
HIGH-SPEED CMOS 8-INPUT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = -40°C to +85°C, VCC = 5.0V ± 5%
Symbol
VIH
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
Min.
2
Typ.(1)
—
Max.
—
Unit
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
∆VT
Input Hysteresis
VTLH - VTHL for all inputs
—
0.2
—
V
IIH
Input HIGH Current
VCC = Max.
0 ≤ VIN < Vcc
—
—
±5
µA
IIL
Input LOW Current
IOZ
Off-State Output Current (Hi-Z)
VCC = Max.
0 ≤ VIN ≤ Vcc
—
—
±5
µA
Current Drive
VCC = Min., VOUT = 2V(2)
VIC
Input Clamp Voltage
VCC = Min., IIN = –18mA, TA = 25°
VOH
Output HIGH Voltage
VOL
ROUT
IOR
50
—
—
mA
C(2)
—
–0.7
–1.2
V
VCC = Min.
IOH = -15mA
2.4
—
—
V
Output LOW Voltage
VCC = Min.
IOL = 12mA
—
—
0.5
V
Output Resistance
VCC = Min.
IOL = 12mA
20
28
40
Ω
NOTES:
1. Typical values are at VCC = 5.0V, TA = 25°C.
2. This parameter is guaranteed but not tested.
POWER SUPPLY CHARACTERISTICS
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = -40°C to +85°C, VCC = 5.0V ± 5%
Symbol
ICC
Parameter
Quiescent Power Supply Current
∆ICC
Supply Current per Input TTL Inputs HIGH
ICCD
Supply Current per Input per MHz
Test Conditions(1)
VCC = Max.
freq = 0
0V ≤ VIN ≤ 0.2V or
Vcc-0.2V ≤ VIN ≤ Vcc
VCC = Max.
VIN = 3.4V(2)
freq = 0
VCC = Max.
Outputs Open and Enabled
One Bit Toggling
50% Duty Cycle
Other inputs at GND or Vcc(3,4)
Min.
Max.
Unit
—
1.5
mA
—
2
mA
—
0.25
mA/MHz
FCTL
NOTES:
1. For conditions shown as Min. or Max., use the appropriate values specified under DC Electrical Characteristics.
2. Per TLL driven input (VIN = 3.4V).
3. For flip-flops, ICCD is measured by switching one of the data input pins so that the output changes every clock cycle. This is a measurement of
device power consumption only and does not include power to drive load capacitance or tester capacitance.
4. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Output Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
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IDTQS74FCT2541T/AT/CT
HIGH-SPEED CMOS 8-INPUT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE(1)
74FCT2541T
Symbol
tPLH
tPHL
tPZH
tPZL
tPLZ
tPHZ
Parameter(2)
Propagation Delay
Ax to Yx
Output Enable
OE to Yx
Disable Time(3)
74FCT2541AT
74FCT2541CT
Min.
Max.
Min.
Max.
Min.
Max.
Unit
1.5
8
1.5
4.8
1.5
4.1
ns
1.5
10
1.5
6.2
1.5
5.8
ns
1.5
9.5
1.5
5.6
1.5
5.2
ns
NOTES:
1. CLOAD = 50pF, RLOAD = 500Ω unless otherwise noted.
2. Minimums guaranteed but not tested.
3. This parameter is guaranteed by design but not tested.
4
IDTQS74FCT2541T/AT/CT
HIGH-SPEED CMOS 8-INPUT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
TEST CIRCUITS FOR ALL OUTPUTS
V CC
Test
7.0V
Switch
Open Drain
500 Ω
Disable Low
V OUT
V IN
Pulse
Generator
Closed
Enable Low
D.U.T.
All Other Tests
Open
FCTL
50pF
RT
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
500 Ω
CL
FC TL lin k
PULSE WIDTH
SET-UP, HOLD, AND RELEASE TIMES
3V
1.5V
0V
3V
1.5V
0V
DATA
INPUT
tH
t SU
TIM ING
INPUT
ASYNCHRONOUS C ONTROL
PRES ET
CLEAR
ETC.
SYNCHRO NOUS CONTRO L
PRES ET
CLEAR
CLOCK ENABLE
ETC.
t REM
t SU
LO W -HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW -HIGH
PULSE
1.5V
3V
1.5V
0V
tH
FC TL lin k
FC TL lin k
PROPAGATION DELAY
ENABLE AND DISABLE TIMES
ENAB LE
SAM E PHASE
INPUT TRANSITION
t PLH
t PH L
OUTPUT
t PLH
OPPOSITE P HASE
INPUT TRANSITION
t PH L
3V
1.5V
0V
DISA BLE
3V
CO NTROL
INPUT
1.5V
t PZL
V OH
1.5V
V OL
OUTPUT
NO RM A LLY
LO W
3V
1.5V
0V
SW ITCH
CLOSE D
FC TL lin k
SW ITCH
OPEN
3.5V
3.5V
1.5V
0.3V
t PZH
OUTPUT
NO RM A LLY
HIGH
0V
t PLZ
V OL
t PHZ
0.3V
V OH
1.5V
0V
0V
FC TL lin k
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control DisableHIGH
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns
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IDTQS74FCT2541T/AT/CT
HIGH-SPEED CMOS 8-INPUT BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDTQS
XX
XXXX
FCT
Device Type
Temp. Range
XX
Package
SO
Q
Small Outline IC (gull wing) (SO20-2)
Quarter Size Small Outline Package (SO20-8)
2541T High-Speed CMOS 8-Bit Buffer/Line Driver
2541AT
2541CT
74
–40°C to +85°C
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