16Mx72 bits Unbuffered DDR SO-DIMM HYMD216M726(L)6-K/H/L DESCRIPTION Hynix HYMD216M726(L)6-K/H/L series is unbuffered 200-pin double data rate Synchronous DRAM Small Outline Dual In-Line Memory Modules (SO-DIMMs) which are organized as 16Mx72 high-speed memory arrays. Hynix HYMD216M726(L)6-K/H/L series consists of five 16Mx16 DDR SDRAM in 400mil TSOP II packages on a 200pin glassepoxy substrate. Hynix HYMD216M726(L)6-K/H/L series provide a high performance 8-byte interface in 67.60mmX 31.75mm form factor of industry standard. It is suitable for easy interchange and addition. Hynix HYMD216M726(L)6-K/H/L series is designed for high speed of up to 133MHz and offers fully synchronous operations referenced to both rising and falling edges of differential clock inputs. While all addresses and control inputs are latched on the rising edges of the clock, Data, Data strobes and Write data masks inputs are sampled on both rising and falling edges of it. The data paths are internally pipelined and 2-bit prefetched to achieve very high bandwidth. All input and output voltage levels are compatible with SSTL_2. High speed frequencies, programmable latencies and burst lengths allow variety of device operation in high performance memory system. Hynix HYMD216M726(L)6-K/H/L series incorporates SPD(serial presence detect). Serial presence detect function is implemented via a serial 2,048-bit EEPROM. The first 128 bytes of serial PD data are programmed by Hynix to identify DIMM type, capacity and other the information of DIMM and the last 128 bytes are available to the customer. FEATURES • 128MB (16M x72) Unbuffered DDR SO-DIMM ECCbased on 16Mx16 DDR SDRAM • Data inputs on DQS centers when write (centered DQ) • JEDEC Standard 200-pin small outline dual in-line memory module (SO-DIMM) • Data strobes synchronized with output data for read and input data for write • 2.5V +/- 0.2V VDD and VDDQ Power supply • Programmable CAS Latency 2 / 2.5 supported • All inputs and outputs are compatible with SSTL_2 interface • Programmable Burst Length 2 / 4 / 8 with both sequential and interleave mode • Fully differential clock operations (CK & /CK) with 100MHz/125MHz/133MHz • tRAS Lock-out function supported • Internal four bank operations with single pulsed RAS • All addresses and control inputs except Data, Data strobes and Data masks latched on the rising edges of the clock • Auto refresh and self refresh supported • 8192 refresh cycles / 64ms • Data(DQ), Data strobes and Write masks latched on both rising and falling edges of the clock ORDERING INFORMATION Part No. Power Supply HYMD216M726(L)6-K HYMD216M726(L)6-H HYMD216M726(L)6-L Clock Frequency Interface Form Factor SSTL_2 200pin Unbuffered SO-DIMM 67.6mm x 31.75mm x 1mm 133MHz(*DDR266A) VDD=2.5V VDDQ =2.5V 133MHz(*DDR266B) 100MHz(*DDR200) * JEDEC Defined Specifications compliant This document is a general product description and is subject to change without notice. Hynix Semiconductor does not assume any responsibility for use of circuits described. No patent licenses are implied. Rev. 0.5/May. 02 1 HYMD216M726(L)6-K/H/L PIN DESCRIPTION Pin Pin Description Pin Pin Description CK0, /CK0, CK1, /CK1 Differential Clock Inputs VDDQ DQs Power Supply CS0 Chip Select Input VSS Ground CKE0 Clock Enable Input VREF Reference Power Supply /RAS, /CAS, /WE Commend Sets Inputs VDDSPD Power Supply for SPD A0 ~ A12 Address SA0~SA2 E2PROM Address Inputs BA0, BA1 Bank Address SCL E2PROM Clock DQ0~DQ63 Data Inputs/Outputs SDA E2PROM Data I/O DQS0~DQS8 Data Strobe Inputs/Outputs VDDID VDD Identification Flag DM0~DM8 Data-in Mask DU Do not Use VDD Power Supply NC No Connection PIN ASSIGNMENT Pin Name Pin Name Pin Name Pin Name Pin Name Pin Name Pin Name Pin Name 1 VREF 2 VREF 51 VSS 52 VSS 101 A9 102 A8 151 DQ42 152 DQ46 3 VSS 4 VSS 53 DQ19 54 DQ23 103 VSS 104 VSS 153 DQ43 154 DQ47 5 DQ0 6 DQ4 55 DQ24 56 DQ28 105 A7 106 A6 155 VDD 156 VDD 7 DQ1 8 DQ5 57 VDD 58 VDD 107 A5 108 A4 157 VDD 158 /CK1 9 VDD 10 VDD 59 DQ25 60 DQ29 109 A3 110 A2 159 VSS 160 CK1 11 DQS0 12 DM0 61 DQS3 62 DM3 111 A1 112 A0 161 VSS 162 VSS 13 DQ2 14 DQ6 63 VSS 64 VSS 113 VDD 114 VDD 163 DQ48 164 DQ52 15 VSS 16 VSS 65 DQ26 66 DQ30 115 A10/AP 116 BA1 165 DQ49 166 DQ53 17 DQ3 18 DQ7 67 DQ27 68 DQ31 117 BA0 118 /RAS 167 VDD 168 VDD 19 DQ8 20 DQ12 69 VDD 70 VDD 119 /WE 120 /CAS 169 DQS6 170 DM6 21 VDD 22 VDD 71 CB0 72 CB4 121 /CS0 122 NC 171 DQ50 172 DQ54 23 DQ9 24 DQ13 73 CB1 74 CB5 123 DU 124 DU 173 VSS 174 VSS 25 DQS1 26 DM1 75 VSS 76 VSS 125 VSS 126 VSS 175 DQ51 176 DQ55 27 VSS 28 VSS 77 DQS8 78 DM8 127 DQ32 128 DQ36 177 DQ56 178 DQ60 29 DQ10 30 DQ14 79 CB2 80 CB6 129 DQ33 130 DQ37 179 VDD 180 VDD 31 DQ11 32 DQ15 81 VDD 82 VDD 131 VDD 132 VDD 181 DQ57 182 DQ61 DM7 33 VDD 34 VDD 83 CB3 84 CB7 133 DQS4 134 DM4 183 DQS7 184 35 CK0 36 VDD 85 DU 86 DU 135 DQ34 136 DQ38 185 VSS 186 VSS 37 /CK0 38 VSS 87 VSS 88 VSS 137 VSS 138 VSS 187 DQ58 188 DQ62 39 VSS 40 VSS 89 NC 90 VSS 139 DQ35 140 DQ39 189 DQ59 190 DQ63 41 DQ16 42 DQ20 91 NC 92 VDD 141 DQ40 142 DQ44 191 VDD 192 VDD 43 DQ17 44 DQ21 93 VDD 94 VDD 143 VDD 144 VDD 193 SDA 194 SA0 45 VDD 46 VDD 95 NC 96 CKE0 145 DQ41 146 DQ45 195 SCL 196 SA1 47 DQS2 48 DM2 97 NC 98 DU 147 DQS5 148 DM5 197 VDDSPD 198 SA2 49 DQ18 50 DQ22 99 A12 100 A11 149 VSS 150 VSS 199 DU Rev. 0.5/May. 02 VDDID 200 2 HYMD216M726(L)6-K/H/L FUNCTIONAL BLOCK DIAGRAM /CS0 /CS DQS1 DM1 DQS0 DM0 DQ8 DQ9 DQ10 DQ11 DQ12 DQ13 DQ14 DQ15 DQ0 DQ1 DQ2 DQ3 DQ4 DQ5 DQ6 DQ7 LDQS LDM I/O 6 I/O 4 I/O 1 I/O 3 I/O 2 I/O 0 I/O 5 I/O 7 UDQS UDM I/O 8 I/O 10 I/O 15 I/O 13 I/O 12 I/O 14 I/O 11 I/O 9 /CS DQS5 DM5 D0 DQS4 DM4 DQ40 DQ41 DQ42 DQ43 DQ44 DQ45 DQ46 DQ47 DQ32 DQ33 DQ34 DQ35 DQ36 DQ37 DQ38 DQ39 LDQS LDM I/O 6 I/O 4 I/O 1 I/O 3 I/O 2 I/O 0 I/O 5 I/O 7 UDQS UDM I/O 8 I/O 10 I/O 15 I/O 13 I/O 12 I/O 14 I/O 11 I/O 9 /CS DQS3 DM3 DQS2 DM2 DQ24 DQ25 DQ26 DQ27 DQ28 DQ29 DQ30 DQ31 DQ16 DQ17 DQ18 DQ19 DQ20 DQ21 DQ22 DQ23 LDQS LDM I/O 6 I/O 4 I/O 1 I/O 3 I/O 2 I/O 0 I/O 5 I/O 7 UDQS UDM I/O 8 I/O 10 I/O 15 I/O 13 I/O 12 I/O 14 I/O 11 I/O 9 /CS D2 DQS8 DM8 CB0 CB1 CB2 CB3 CB4 CB5 CB6 CB7 D4 /CS DQS7 DM7 D1 DQS6 DM6 DQ56 DQ57 DQ58 DQ59 DQ60 DQ61 DQ62 DQ63 DQ48 DQ49 DQ50 DQ51 DQ52 DQ53 DQ54 DQ55 LDQS LDM I/O 6 I/O 4 I/O 1 I/O 3 I/O 2 I/O 0 I/O 5 I/O 7 UDQS UDM I/O 8 I/O 10 I/O 15 I/O 13 I/O 12 I/O 14 I/O 11 I/O 9 D3 Serial PD VDDSPD SCL VDD/VDDQ SDA WP A0 A1 A2 SA0 SA1 SA2 VREF VSS BA0-BA1 BA0-BA1 : SDRAMs D0 – D4 A0 - A12 A0 - A12 : SDRAMs D0 – D4 /RAS /RAS : SDRAMs D0 – D4 /CAS /CAS : SDRAMs D0 – D4 CKE0 CKE : SDRAMs D0 – D4 /WE /WE : SDRAMs D0 – D4 Rev. 0.5/May. 02 LDQS LDM I/O 6 I/O 4 I/O 1 I/O 3 I/O 2 I/O 0 I/O 5 I/O 7 UDQS UDM I/O 8 I/O 10 I/O 15 I/O 13 I/O 12 I/O 14 I/O 11 I/O 9 VDDQ VDDID . . == . . . . =. .. SPD D0 – D4 D0 – D4 D0 – D4 Strap:see Note 4 Notes: DQ wiring may differ from that described in this drawing; however DQ/DM/DQS relationships are maintained as shown. VDDID strap connections (for memory device VDD, VDDQ) : Strap out :(open) : VDD=VDDQ Strap In (Vss) : VDD = VDDQ 3 HYMD216M726(L)6-K/H/L ABSOLUTE MAXIMUM RATINGS Parameter Symbol Rating Unit Ambient Temperature TA 0 ~ 70 o C Storage Temperature TSTG -55 ~ 125 o C Voltage on Any Pin relative to VSS VIN, VOUT -0.5 ~ 3.6 V Voltage on VDD relative to VSS VDD -0.5 ~ 3.6 V Voltage on VDDQ relative to VSS VDDQ -0.5 ~ 3.6 V Output Short Circuit Current IOS 50 mA Power Dissipation PD 8 W Soldering Temperature ⋅ Time TSOLDER 260 / 10 o C / Sec Note : Operation at above absolute maximum rating can adversely affect device reliability DC OPERATING CONDITIONS (TA=0 to 70 oC, Voltage referenced to VSS= 0V) Parameter Symbol Min Typ. Max Unit Power Supply Voltage VDD 2.3 2.5 2.7 V Power Supply Voltage VDDQ 2.3 2.5 2.7 V Input High Voltage VIH VREF + 0.15 - VDDQ + 0.3 V Input Low Voltage VIL -0.3 - VREF - 0.15 V Termination Voltage VTT VREF - 0.04 VREF VREF + 0.04 V Reference Voltage VREF 1.15 1.25 1.35 V Note 1 2 3 Note : 1. VDDQ must not exceed the level of VDD. 2. VIL (min) is acceptable -1.5V AC pulse width with < 5ns of duration. 3. The value of VREF is approximately equal to 0.5V DDQ. AC OPERATING CONDITIONS (TA=0 to 70 oC, Voltage referenced to VSS = 0V) Parameter Symbol Min Input High (Logic 1) Voltage, DQ, DQS and DM signals VIH(AC) VREF + 0.31 Input Low (Logic 0) Voltage, DQ, DQS and DM signals VIL(AC) Input Differential Voltage, CK and /CK inputs VID(AC) Input Crossing Point Voltage, CK and /CK inputs VIX(AC) Max Unit Note V VREF - 0.31 V 0.7 VDDQ + 0.6 V 1 0.5*V DDQ-0.2 0.5*VDDQ+0.2 V 2 Note : 1. VID is the magnitude of the difference between the input level on CK and the input on /CK. 2. The value of V IX is expected to equal 0.5*V DDQ of the transmitting device and must track variations in the DC level of the same. Rev. 0.5/May. 02 4 HYMD216M726(L)6-K/H/L AC OPERATING TEST CONDITIONS (TA=0 to 70oC, Voltage referenced to VSS = 0V) Parameter Value Unit Reference Voltage VDDQ x 0.5 V Termination Voltage VDDQ x 0.5 V AC Input High Level Voltage (VIH, min) VREF + 0.31 V AC Input Low Level Voltage (VIL, max) VREF - 0.31 V VREF V Output Timing Measurement Reference Level Voltage VTT V Input Signal maximum peak swing 1.5 V 1 V/ns Termination Resistor (RT) 50 Ω Series Resistor (RS) 25 Ω Output Load Capacitance for Access Time Measurement (CL) 30 pF Input Timing Measurement Reference Level Voltage Input minimum Signal Slew Rate Rev. 0.5/May. 02 5 HYMD216M726(L)6-K/H/L CAPACITANCE (TA=25oC, f=100MHz ) Parameter Pin Symbol Min Max Unit Input Capacitance A0 ~ A12, BA0, BA1 CIN1 32 43 pF Input Capacitance /RAS, /CAS, /WE CIN2 32 43 pF Input Capacitance CKE0, CKE1 CIN3 32 43 pF Input Capacitance /CS0, /CS1 CIN4 32 43 pF Input Capacitance CK0, /CK0, CK1, /CK1 CIN5 17 21 pF Input Capacitance DM0 ~ DM8 CIN6 7 9 pF Data Input / Output Capacitance DQ0 ~ DQ63, DQS0 ~ DQS8 CIO1 7 9 pF Note : 1. VDD = min. to max., VDDQ = 2.3V to 2.7V, VODC = VDDQ/2, VOpeak-to-peak = 0.2V 2. Pins not under test are tied to GND. 3. These values are guaranteed by design and are tested on a sample basis only. OUTPUT LOAD CIRCUIT VTT RT=50Ω Output Zo=50Ω VREF CL=30pF Rev. 0.5/May. 02 6 HYMD216M726(L)6-K/H/L DC CHARACTERISTICS I (TA=0 to 70oC, Voltage referenced to VSS = 0V) Parameter Symbol Add, CMD, /CS, /CKE Input Leakage Current CK0, /CK0, CK1, /CK1 ILI CK2, /CK2 Min. Max -10 10 -8 8 0 0 Unit Note uA 1 Output Leakage Current ILO -5 5 uA 2 Output High Voltage VOH VTT + 0.76 - V IOH = -15.2mA Output Low Voltage VOL - VTT - 0.76 V IOL = +15.2mA Note : 1. VIN = 0 to 3.6V, All other pins are not tested under VIN =0V 2. DOUT is disabled, VOUT=0 to 2.7V 3. These values are device characteristics. Rev. 0.5/May. 02 7 HYMD216M726(L)6-K/H/L DC CHARACTERISTICS II (TA=0 to 70oC, Voltage referenced to VSS = 0V) Parameter Symbol Speed Test Condition -K -H -L Unit Note Operating Current IDD0 One bank; Active - Precharge; tRC=tRC(min); tCK=tCK(min); DQ,DM and DQS inputs changing twice per clock cycle; address and control inputs changing once per clock cycle 475 475 450 mA Operating Current IDD1 One bank; Active - Read - Precharge; Burst Length=2; tRC=tRC(min); tCK=tCK(min); address and control inputs changing once per clock cycle 600 600 550 mA Precharge Power Down Standby Current IDD2P All banks idle; Power down mode; CKE=Low, tCK=tCK(min) 100 100 75 mA Idle Standby Current IDD2F /CS=High, All banks idle; tCK=tCK(min); CKE= High; address and control inputs changing once per clock cycle. VIN=VREF for DQ, DQS and DM Active Power Down Standby Current IDD3P One bank active; Power down mode; CKE=Low, tCK=tCK(min) Active Standby Current IDD3N /CS=HIGH; CKE=HIGH; One bank; ActivePrecharge; tRC=tRAS(max); tCK=tCK(min); DQ, DM and DQS inputs changing twice per clock cycle; Address and other control inputs changing once per clock cycle Operating Current IDD4R Burst=2; Reads; Continuous burst; One bank active; Address and control inputs changing once per clock cycle; tCK=tCK(min); IOUT=0mA 1125 1125 950 Operating Current IDD4W Burst=2; Writes; Continuous burst; One bank active; Address and control inputs changing once per clock cycle; tCK=tCK(min); DQ, DM and DQS inputs changing twice per clock cycle 1150 1150 950 1050 1050 975 Auto Refresh Current IDD5 tRC=tRFC(min) - 8*tCK for DDR200 at 100Mhz, 10*tCK for DDR266A & DDR266B at 133Mhz; distributed refresh Self Refresh Current IDD6 CKE=<0.2V; External clock on; tCK =tCK(min) Operating Current - Four Bank Operation IDD7 Four bank interleaving with BL=4 Refer to the following page for detailed test condition Rev. 0.5/May. 02 200 125 125 mA 100 250 mA mA mA Normal 15 mA Low Power 7.5 mA 1625 1625 1450 mA 8 HYMD216M726(L)6-K/H/L AC CHARACTERISTICS (AC operating conditions unless otherwise noted) Parameter Symbol -K(DDR266A) -H(DDR266B) -L(DDR200) Min Max Min Max Min Max Unit Row Cycle Time tRC 65 - 65 - 70 - ns Auto Refresh Row Cycle Time tRFC 75 - 75 - 80 - ns Row Active Time tRAS 45 120K 45 120K 50 120k ns Active to Read with Auto Precharge Delay tRAP 20 - 20 - 20 - ns Row Address to Column Address Delay tRCD 20 - 20 - 20 - ns Row Active to Row Active Delay tRRD 15 - 15 - 15 - ns Column Address to Column Address Delay tCCD 1 - 1 - 1 - CK Row Precharge Time tRP 20 - 20 - 20 - ns Write Recovery Time tWR 15 - 15 - 15 - ns Write to Read Command Delay tWTR 1 - 1 - 1 - CK Auto Precharge Write Recovery + Precharge Time tDAL (tWR/tCK) + (tRP/tCK) - (tWR/tCK) + (tRP/tCK) - (tWR/tCK) + (tRP/tCK) - CK 7.5 12 7.5 12 8.0 12 ns 7.5 12 10 12 10 12 ns System Clock Cycle Time CL = 2.5 CL = 2 tCK Note 16 15 Clock High Level Width tCH 0.45 0.55 0.45 0.55 0.45 0.55 CK Clock Low Level Width tCL 0.45 0.55 0.45 0.55 0.45 0.55 CK Data-Out edge to Clock edge Skew tAC -0.75 0.75 -0.75 0.75 -0.8 0.8 ns DQS-Out edge to Clock edge Skew tDQSCK -0.75 0.75 -0.75 0.75 -0.8 0.8 ns DQS-Out edge to Data-Out edge Skew tDQSQ - 0.5 - 0.5 - 0.6 ns Data-Out hold time from DQS tQH tHP -tQHS - tHP -tQHS - tHP -tQHS - ns 1, 10 Clock Half Period tHP min (tCL,tCH) - min (tCL,tCH) - min (tCL,tCH) - ns 1,9 Data Hold Skew Factor tQHS - 0.75 - 0.75 - 0.75 ns 10 Valid Data Output Window tDV tQH-tDQSQ Data-out high-impedance window from CK, /CK tHZ -0.75 0.75 -0.75 0.75 -0.8 0.8 ns 17 Data-out low-impedance window from CK, /CK tLZ -0.75 0.75 -0.75 0.75 -0.8 0.8 ns 17 Input Setup Time (fast slew rate) tIS 0.9 - 0.9 - 1.1 - ns 2,3,5,6 Input Hold Time (fast slew rate) tIH 0.9 - 0.9 - 1.1 - ns 2,3,5,6 Input Setup Time (slow slew rate) tIS 1.0 - 1.0 - 1.1 - ns 2,4,5,6 Input Hold Time (slow slew rate) tIH 1.0 - 1.0 - 1.1 - ns 2,4,5,6 tIPW 2.2 2.5 - ns 6 Input Pulse Width Rev. 0.5/May. 02 tQH-tDQSQ 2.2 tQH-tDQSQ ns 9 HYMD216M726(L)6-K/H/L AC CHARACTERISTICS - continued - (AC operating conditions unless otherwise noted) Parameter Symbol -K(DDR266A) -H(DDR266B) -L(DDR200) Min Max Min Max Min Max Unit Write DQS High Level Width tDQSH 0.35 - 0.35 - 0.35 - CK Write DQS Low Level Width tDQSL 0.35 - 0.35 - 0.35 - CK Clock to First Rising edge of DQS-In tDQSS 0.75 1.25 0.75 1.25 0.75 1.25 CK Data-In Setup Time to DQS-In (DQ & DM) tDS 0.5 - 0.5 - 0.6 - ns Data-in Hold Time to DQS-In (DQ & DM) tDH 0.5 - 0.5 - 0.6 - ns DQ & DM Input Pulse Width tDIPW 1.75 - 1.75 - 2 - ns Read DQS Preamble Time tRPRE 0.9 1.1 0.9 1.1 0.9 1.1 CK Read DQS Postamble Time tRPST 0.4 0.6 0.4 0.6 0.4 0.6 CK Write DQS Preamble Setup Time tWPRES 0 - 0 - 0 - CK Write DQS Preamble Hold Time tWPREH 0.25 - 0.25 - 0.25 - CK Write DQS Postamble Time tWPST 0.4 0.6 0.4 0.6 0.4 0.6 CK Mode Register Set Delay tMRD 2 - 2 - 2 - CK Exit Self Refresh to Any Execute Command tXSC 200 - 200 - 200 - CK Average Periodic Refresh Interval tREFI - 15.6 - 15.6 - 15.6 us Note 6,7, 11~13 8 Note : 1. This calculation accounts for tDQSQ(max), the pulse width distortion of on-chip circuit and jitter. 2. Data sampled at the rising edges of the clock : A0~A12, BA0~BA1, CKE, /CS, /RAS, /CAS, /WE. 3. For command/address input slew rate >=1.0V/ns 4. For command/address input slew rate >=0.5V/ns and <1.0V/ns This derating table is used to increase tIS/tIH in case where the input slew-rate is below 0.5V/ns. Input Setup / Hold Slew-rate Derating Table. Input Setup / Hold Slew-rate Delta tIS Delta tIH V/ns ps ps 0.5 0 0 0.4 +50 0 0.3 +100 0 5. CK, /CK slew rates are >=1.0V/ns 6. These parameters guarantee device timing, but they are not necessarily tested on each device, and they may be guaranteed by design or tester correlation 7. Data latched at both rising and falling edges of Data Strobes(LDQS/UDQS) : DQ, LDM/UDM. 8. Minimum of 200 cycles of stable input clocks after Self Refresh Exit command, where CKE is held high, is required to complete Self Refresh Exit and lock the internal DLL circuit of DDR SDRAM. 9. Min (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the device (i.e. this value can be greater than the minimum specification limits for tCL and tCH). 10. tHP = minimum half clock period for any given cycle and is defined by clock high or clock low (tCH, tCL). tQHS consists of tDQSQmax, the pulse width distortion of on-chip clock circuits, data pin to pin skew and output pattern effects and p-channel to n-channel variation of the output drivers. Rev. 0.5/May. 02 10 HYMD216M726(L)6-K/H/L 11.This derating table is used to increase tDS/tDH in case where the input slew-rate is below 0.5V/ns. Input Setup / Hold Slew-rate Derating Table. Input Setup / Hold Slew-rate Delta tDS Delta tDH V/ns ps ps 0.5 0 0 0.4 +75 +75 0.3 +150 +150 12. I/O Setup/Hold Plateau Derating. This derating table is used to increase tDS/tDH in case where the input level is flat below VREF +/-310mV for a duration of up to 2ns. I/O Input Level Delta tDS Delta tDH mV ps ps +280 +50 +50 13. I/O Setup/Hold Delta Inverse Slew Rate Derating. This derating table is used to increase tDS/tDH in case where the DQ and DQS slew rates differ. The Delta Inverse Slew Rate is calculated as (1/SlewRate1)-(1/SlewRate2). For example, if slew rate 1 = 0.5V/ ns and Slew Rate2 = 0.4V/n then the Delta Inverse Slew Rate = -0.5ns/V. (1/SlewRate1)-(1/SlewRate2) Delta tDS Delta tDH ns/V ps ps 0 0 0 +/-0.25 +50 +50 +/- 0.5 +100 +100 14. DQS, DM and DQ input slew rate is specified to prevent double clocking of data and preserve setup and hold times. Signal transi tions through the DC region must be monotonic. 15. tDAL = (tDPL / tCK ) + (tRP / tCK ). For each of the terms above, if not already an integer, round to the next highest integer. tCK is equal to the actual system clock cycle time. Example: For DDR266B at CL=2.5 and tCK = 7.5 ns, tDAL = (15 ns / 7.5 ns) + (20 ns / 7.5 ns) = (2.00) + (2.67) Round up each non-integer to the next highest integer: = (2) + (3), tDAL = 5 clock 16. For the parts which do not has internal RAS lockout circuit, Active to Read with Auto precharge delay should be tRAS - BL/2 x tCK. 17. tHZ and tLZ transitions occur in the same access time windows as valid data trasitions. These parameters are not referenced to a specific voltage level but specify when the device output is no longer driving (HZ), or begins driving (LZ). Rev. 0.5/May. 02 11 HYMD216M726(L)6-K/H/L SIMPLIFIED COMMAND TRUTH TABLE A10/ AP Command CKEn-1 CKEn /CS /RAS /CAS /WE Extended Mode Register Set H X L L L L OP code 1,2 Mode Register Set H X L L L L OP code 1,2 H X X X H X X 1 L H H H Device Deselect No Operation Bank Active H X L L H H H X L H L H ADDR RA Read BA V L CA Read with Autoprecharge 1 1,3 L H X L H L L CA Write with Autoprecharge 1 V H Precharge All Banks H X L L H L Precharge selected Bank 1 V H Write Note 1,4 H X 1,5 L V 1 X Read Burst Stop H X L H H L X 1 Auto Refresh H H L L L H X 1 Entry H L L L L H H X X X Exit L H L H H H H X X X L H H H Self Refresh Entry H X 1 1 L Precharge Power Down Mode 1 X Exit Active Power Down Mode (Clock Suspend) 1 Entry Exit L H L H X X X 1 L H H H 1 H X X X 1 L V V V H L H X X 1 1 ( H=Logic High Level, L=Logic Low Level, X=Don’t Care, V=Valid Data Input, OP Code=Operand Code, NOP=No Operation ) Note : 1. LDM/UDM states are Don’t Care. Refer to below Write Mask Truth Table. 2. OP Code(Operand Code) consists of A 0~A12 and BA0~BA1 used for Mode Registering duing Extended MRS or MRS. Before entering Mode Register Set mode, all banks must be in a precharge state and MRS command can be issued after tRP period from Prechagre command. 3. If a Read with Autoprecharge command is detected by memory component in CK(n), then there will be no command presented to activated bank until CK(n+BL/2+tRP). 4. If a Write with Autoprecharge command is detected by memory compoment in CK(n), then there will be no command presented to activated bank until CK(n+BL/2+1+tDPL+tRP). Last Data-In to Prechage delay(tDPL) which is also called Write Recovery Time (tWR) is needed to guarantee that the last data has been completely written. 5. If A10/AP is High when Row Precharge command being issued, BA0/BA1 are ignored and all banks are selected to be precharged. Rev. 0.5/May. 02 12 HYMD216M726(L)6-K/H/L PACKAGE DIMENSIONS Front Back 67.60 mm nom. 31.75 mm 20.00 mm 1 39 41 199 Side Voltage Key 1.9mm MAX. 1.8 mm 2.7 mm 4.0 mm 1.0 mm 0.66mm Left key position: VDD =VDDQ=2.5V Rev. 0.5/May. 02 (Front) Right key position: Reserved 13 SERIAL PRESENCE DETECT SPD SPECIFICATION (16Mx72 Unbuffered DDR SO-DIMM) Rev. 0.5/May. 02 14 HYMD216M726(L)6-K/H/L SERIAL PRESENCE DETECT Bin Sort : K(DDR266A@CL=2), H(DDR266B@CL=2.5), L(DDR200@CL=2) Function Supported Byte# Hexa Value Function Description Note K H L K H 0 Number of Bytes written into serial memory at module manufacturer 128 Bytes 80h 1 Total number of Bytes in SPD device 256 Bytes 08h 2 Fundamental memory type 3 L DDR SDRAM 07h Number of row address on this assembly 13 0Dh 1 4 Number of column address on this assembly 9 09h 1 5 Number of physical banks on DIMM 1Bank 01h 6 Module data width 72 Bits 48h 7 Module data width (continued) - 00h 8 Module voltage Interface levels(VDDQ) 9 DDR SDRAM cycle time at CAS Latency=2.5(tCK) 10 DDR SDRAM access time from clock at CL=2.5 (tAC) 11 Module configuration type 12 Refresh rate and type 13 Primary DDR SDRAM width 14 Error checking DDR SDRAM data width 15 Minimum clock delay for back-to-back random column address(tCCD) 16 Burst lengths supported 17 Number of banks on each DDR SDRAM 18 CAS latency supported 19 20 21 DDR SDRAM module attributes SSTL 2.5V 04h 7.5ns 7.5ns 8ns 75h 75h 80h 2 +/-0.75ns +/-0.75ns +/-0.8ns 75h 75h 80h 2 ECC 02h 7.8us & Self refresh 82h x16 10h x8 08h 1 CLK 01h 2,4,8 0Eh 4 Banks 04h 2, 2.5 0Ch CS latency 0 01h WE latency 1 02h Differential Clock Input 20h +/-0.2Voltage tolerance, Concurrent Auto Precharge tRAS Lock Out C0h 22 DDR SDRAM device attributes : General 23 DDR SDRAM cycle time at CL=2.0(tCK) 24 DDR SDRAM access time from clock at CL=2.0(tAC) 25 DDR SDRAM cycle time at CL=1.5(tCK) 26 DDR SDRAM access time from clock at CL=1.5(tAC) 27 Minimum row precharge time(tRP) 20ns 20ns 20ns 50h 50h 50h 28 Minimum row activate to row active delay(tRRD) 15ns 15ns 15ns 3Ch 3Ch 3Ch 29 Minimum RAS to CAS delay(tRCD) 20ns 20ns 20ns 50h 50h 50h 30 Minimum active to precharge time(tRAS) 45ns 45ns 50ns 2Dh 2Dh 32h 31 Module row density 32 Command and address signal input setup time(tIS) 0.9ns 0.9ns 1.1ns 90h 90h B0h 33 Command and address signal input hold time(tIH) 0.9ns 0.9ns 1.1ns 90h 90h B0h 34 Data signal input setup time(tDS) 0.5ns 0.5ns 0.6ns 50h 50h 60h 35 Data signal input hold time(tDH) 0.5ns 0.5ns 0.6ns 50h 50h 60h 7.5ns 10ns 10ns 75h A0h A0h +/-0.75ns +/-0.75ns +/-0.8ns 75h 75h 80h - 00h - 00h 128MB 36~40 Reserved for VCSDRAM 20h Undefined 00h 41 Minimum active / auto-refresh Time (tRC) 65ns 65ns 70ns 41h 41h 46h 42 Minimum auto-refresh to active / auto-refresh command period (tRFC) 75ns 75ns 80ns 4Bh 4Bh 50h 43 Maximum cycle time (tCK max) 12ns 12ns 12ns 30h 30h 30h 44 Maximum DQS-DQ skew time (tDQSQ) 0.5ns 0.5ns 0.6ns 32h 32h 3Ch 45 Maximum read data hold skew factor (tQHS) 0.75ns 0.75ns 0.75ns 75h 75h 75h 46~61 Superset Information(may be used in future) 62 SPD Revision code 63 Checksum for Bytes 0~62 Rev. 0.5/May. 02 Undefined 00h Initial release - 00h B0h DBh 75h 15 HYMD216M726(L)6-K/H/L SERIAL PRESENCE DETECT(continued) Function Supported Byte # Hexa Value Function Description Note K 64 Manufacturer JEDEC ID Code 65~71 H L K H Hynix JEDEC ID ADh - 00h Hynix(Korea Area) HSA(United States Area) HSE(Europe Area) HSJ(Japan Area) Singapore Asia Area 0*h 1*h 2*h 3*h 4*h 5*h 48h --------- Manufacturer JEDEC ID Code 72 Manufacturing location 73 Manufacture part number(Hynix Memory Module) H 74 -------- Manufacture part number(Hynix Memory Module) Y 59h 75 -------- Manufacture part number(Hynix Memory Module) M 4Dh 76 Manufacture part number (DDR SDRAM) D 44h 77 Manufacture part number(Memory density) 2 32h 78 Manufacture part number(Module Depth) 1 31h 79 ------- Manufacture part number(Module Depth) 6 36h 80 Manufacture part number(Module type) M 4Dh 81 Manufacture part number(Data width) 7 37h 82 -------Manufacture part number(Data width) 2 32h 83 Manufacture part number(Refresh, # of Bank.) 84 Manufacture part number(Component configuration) 85 Manufacture part number(Hyphen) 86 Manufacture part number(Minimum cycle time) 87~90 6(8K refresh,4Bank) 36h 6 36h -‘ ’ K L 6 2Dh H L 4Bh 48h 4Ch Manufacture part number(T.B.D) - - 91 Manufacture revision code(for Component) - - 92 Manufacture revision code (for PCB) - - 93 Manufacturing date(Year) - - 3 94 Manufacturing date(Week) - - 3 Module serial number - - 4 95~98 99~127 Manufacturer specific data (may be used in future) Undefined 00h 5 128~255 Open for customer use Undefined 00h 5 Note : 1. The bank address is excluded 2. These value is based on the component specification 3. These bytes are programmed by code of date week & date year 4. These bytes apply to Hynix’s own Module Serial Number system 5. These bytes undefined and coded as ‘00h’ 6. Refer to Hynix web site Byte 84~85, Low power part Byte# Function Description 84 85 Manufacture part number(Low power part) Manufacture part number(Component Configuration) Rev. 0.5/May. 02 Function Supported K H L 6 L Hexa Value K H L Note 4Ch 36h 16