Single-Axis, High-g, iMEMS® Accelerometers ADXL193 FEATURES GENERAL DESCRIPTION Complete acceleration measurement system on a single monolithic IC Available in ±120 g or ±250 g output full-scale ranges Full differential sensor and circuitry for high resistance to EMI/RFI Environmentally robust packaging Complete mechanical and electrical self-test on digital command Output ratiometric to supply Sensitive axes in the plane of the chip High linearity (0.2% of full scale) Frequency response down to dc Low noise Low power consumption (1.5 mA) Tight sensitivity tolerance and 0 g offset capability Largest available prefilter clipping headroom 400 Hz, 2-pole Bessel filter Single-supply operation Compatible with Sn/Pb and Pb-free solder processes The ADXL193 is a low power, complete single-axis accelerometer with signal conditioned voltage outputs that are all on a single monolithic IC. This product measures acceleration with a full-scale range of ±120 g or ±250 g (minimum). It can also measure both dynamic acceleration (vibration) and static acceleration (gravity). The ADXL193 is a fourth-generation surface micromachined iMEMS® accelerometer from ADI with enhanced performance and lower cost. Designed for use in front and side impact airbag applications, this product also provides a complete costeffective solution useful for a wide variety of other applications. The ADXL193 is temperature stable and accurate over the automotive temperature range, with a self-test feature that fully exercises all the mechanical and electrical elements of the sensor with a digital signal applied to a single pin. The ADXL193 is available in a 5 mm × 5 mm × 2 mm, 8-terminal ceramic LCC package. APPLICATIONS Vibration monitoring and control Vehicle collision sensing Shock detection FUNCTIONAL BLOCK DIAGRAM VS ADXL193 TIMING GENERATOR VDD VDD2 DIFFERENTIAL SENSOR SELF-TEST DEMOD AMP 400Hz BESSEL FILTER XOUT 05366-001 EXC Figure 1. Rev. A Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 www.analog.com Fax: 781.461.3113 ©2005 Analog Devices, Inc. All rights reserved. ADXL193 TABLE OF CONTENTS Specifications..................................................................................... 3 Power Supply Decoupling ............................................................8 Absolute Maximum Ratings............................................................ 4 Self-Test ..........................................................................................8 ESD Caution.................................................................................. 4 Clock Frequency Supply Response .............................................8 Pin Configuration and Function Descriptions............................. 5 Signal Distortion ...........................................................................8 Theory of Operation ........................................................................ 7 Outline Dimensions ..........................................................................9 Applications....................................................................................... 8 Ordering Guide .............................................................................9 REVISION HISTORY 5/05—Rev. 0 to Rev. A Rev. A | Page 2 of 12 ADXL193 SPECIFICATIONS 1 At TA = −40°C to +105°C, 5.0 V dc ± 5%, acceleration = 0 g; unless otherwise noted. Table 1. Parameter SENSOR Output Full-Scale Range Nonlinearity Package Alignment Error Cross-Axis Sensitivity Resonant Frequency Sensitivity, Ratiometric (Over Temperature) OFFSET Zero-g Output Voltage (Over Temperature) 2 NOISE Noise Density Clock Noise FREQUENCY RESPONSE −3 dB Frequency −3 dB Frequency Drift SELF-TEST Output Change (Cube vs. VDD) 3 Logic Input High Logic Input Low Input Resistance OUTPUT AMPLIFIER Output Voltage Swing Capacitive Load Drive PREFILTER HEADROOM CFSR @ 400 kHz POWER SUPPLY (VDD) Functional Range Quiescent Supply Current TEMPERATURE RANGE 1 2 3 Conditions Model No. AD22282 Min Typ Max Model No. AD22283 Min Typ Max IOUT ≤ ±100 μA 120 250 0.2 1 −5 VDD = 5 V, 100 Hz 17.1 VOUT − VDD/2, VDD = 5 V −125 10 Hz − 400 Hz, 5 V 2 +5 24 18 8.4 g % Degree % kHz mV/g +100 mV 5 5 15 mg/√Hz mV p-p 0.2 1 −5 18.9 7.6 +125 −100 Unit 2 +5 24 8 3 5 10 360 400 2 440 360 400 2 440 Hz Hz VDD = 5 V 400 500 600 200 250 300 mV VDD = 5 V VDD = 5 V Pull-down resistor to GND 3.5 1 V V kΩ IOUT = ±400 μA 0.25 1000 Two-pole Bessel 25°C to TMIN or TMAX 3.5 1 30 50 30 VDD − 0.25 0.25 1000 800 2 4.75 3.5 VDD = 5 V 1.5 −40 VDD − 0.25 1400 1.5 5.25 6 2 +125 All minimum and maximum specifications are guaranteed. Typical specifications are not guaranteed. Zero g output is ratiometric. Self-test output at VDD = (Self-Test Output at 5 V) × (VDD/5 V)3. Rev. A | Page 3 of 12 50 4.75 3.5 1.5 −40 5.25 6 2 +125 V pF g V/V V V mA °C ADXL193 ABSOLUTE MAXIMUM RATINGS Table 2. Parameter Acceleration (Any Axis, Unpowered) Acceleration (Any Axis, Powered) VS All Other Pins Output Short-Circuit Duration (Any Pin to Common) Operating Temperature Range Storage Temperature Rating 4,000 g 4,000 g −0.3 V to +7.0 V (COM − 0.3 V) to (VS + 0.3 V) Indefinite Stresses above those listed under Absolute Maximum Ratings may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational section of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect device reliability. −65°C to +150°C −65°C to +150°C ESD CAUTION ESD (electrostatic discharge) sensitive device. Electrostatic charges as high as 4000 V readily accumulate on the human body and test equipment and can discharge without detection. Although this product features proprietary ESD protection circuitry, permanent damage may occur on devices subjected to high energy electrostatic discharges. Therefore, proper ESD precautions are recommended to avoid performance degradation or loss of functionality. Rev. A | Page 4 of 12 ADXL193 PIN CONFIGURATION AND FUNCTION DESCRIPTIONS VDD2 8 NC 1 NC 2 ADXL193 TOP VIEW (Not to Scale) COM 3 7 VDD 6 XOUT 5 NC 05366-002 4 ST NC = NO CONNECT Figure 2. Pin Configuration Table 3. Pin Function Descriptions Pin No. 1 2 3 4 5 6 7 8 Mnemonic NC NC COM ST NC XOUT VDD VDD2 Description Do Not Connect Do Not Connect Common Self-Test Do Not Connect X Channel Output 3.5 V to 6 V 3.5 V to 6 V Rev. A | Page 5 of 12 ADXL193 CRITICAL ZONE TL TO TP tP TP TEMPERATURE RAMP-UP TL tL TSMAX TSMIN tS RAMP-DOWN 05366-003 PREHEAT t25°C TO PEAK TIME Figure 3. Recommended Soldering Profile Table 4. Recommended Soldering Profile Profile Feature AVERAGE RAMP RATE (TL TO TP) PREHEAT Minimum Temperature (TSMIN) Maximum Temperature (TSMAX) TIME (TSMIN TO TSMAX), tS TSMAX TO TL Ramp-Up Rate TIME MAINTAINED ABOVE LIQUIDOUS (TL) Liquidous Temperature (TL) Time (tL) PEAK TEMPERATURE (TP) TIME WITHIN 5°C OF ACTUAL PEAK TEMPERATURE (tP) RAMP-DOWN RATE TIME 25°C TO PEAK TEMPERATURE Sn63/Pb37 3°C/s max Pb-Free 3°C/s max 100°C 150°C 60 s − 120 s 150°C 200°C 60 s − 150 s 3°C/s 3°C/s 183°C 60 s − 150 s 240°C + 0°C/−5°C 10 s − 30 s 6°C/s max 6 min max 217°C 60 s − 150 s 260°C + 0°C/−5°C 20 s − 40 s 6°C/s max 8 min max PIN 8 XXXXX XXXX XOUT = 2.482V 22282 XXXXX XXXX 22282 XOUT = 2.500V 22282 XXXXX XXXX XOUT = 2.518V XOUT = 2.500V EARTH'S SURFACE Figure 4. Output Response vs. Orientation Rev. A | Page 6 of 12 05366-004 XOUT = 2.500V XXXXX XXXX 22282 ADXL193 THEORY OF OPERATION Complementary 400 kHz square waves drive the fixed plates. Electrical feedback adjusts the amplitudes of the square waves such that the ac signal on the moving plates is 0. The feedback signal is linearly proportional to the applied acceleration. This unique feedback technique ensures that there is no net electrostatic force applied to the sensor. The differential feedback control signal is also applied to the input of the filter, where it is filtered and converted to a single-ended signal. Rev. A | Page 7 of 12 MOVABLE FRAME PLATE CAPACITORS UNIT SENSING CELL FIXED PLATES UNIT FORCING CELL MOVING PLATE ANCHOR Figure 5. Simplified View of Sensor Under Acceleration 05366-005 Figure 5 is a simplified view of one of the differential sensor elements. Each sensor includes several differential capacitor unit cells. Each cell is composed of fixed plates attached to the substrate and movable plates attached to the frame. Displacement of the frame changes the differential capacitance, which is measured by the on-chip circuitry. ANCHOR ACCELERATION The ADXL193 provides a fully differential sensor structure and circuit path, resulting in the industry’s highest resistance to EMI/RFI effects. This latest generation uses electrical feedback with zero-force feedback for improved accuracy and stability. The sensor resonant frequency is significantly higher than the signal bandwidth set by the on-chip filter, avoiding the signal analysis problems caused by resonant peaks near the signal bandwidth. ADXL193 APPLICATIONS POWER SUPPLY DECOUPLING For most applications, a single 0.1 μF capacitor, CDC, adequately decouples the accelerometer from noise on the power supply. However, in some cases, particularly where noise is present at the 400 kHz internal clock frequency (or any harmonic thereof), noise on the supply can cause interference on the ADXL193’s output. If additional decoupling is needed, a 50 Ω (or smaller) resistor or ferrite bead can be inserted in the supply line. Additionally, a larger bulk bypass capacitor (in the 1 μF to 4.7 μF range) can be added in parallel to CDC. SELF-TEST The fixed fingers in the forcing cells are normally kept at the same potential as that of the movable frame. When the self-test digital input is activated, the voltage on the fixed fingers on one side of the moving plate in the forcing cells is changed. This creates an attractive electrostatic force, which causes the frame to move toward those fixed fingers. The entire signal channel is active; therefore, the sensor displacement causes a change in VOUT. The ADXL193’s self-test function is a comprehensive method of verifying the operation of the accelerometer. Because electrostatic force is independent of the polarity of the voltage across capacitor plates, a positive voltage is applied in half of the forcing cells, and its complement in the other half of the forcing cells. Activating self-test causes a step function force to be applied to the sensor, while the capacitive coupling term is canceled. The ADXL193 has improved self-test functionality, including excellent transient response and high speed switching capability. Arbitrary force waveforms can be applied to the sensor by modulating the self-test input, such as test signals to measure the system frequency response, or even crash signals to verify algorithms within the limits of the self-test swing. The ST pin should never be exposed to voltages greater than VS + 0.3 V. If this cannot be guaranteed due to the system design (for instance, if there are multiple supply voltages), then a low VF clamping diode between ST and VS is recommended. CLOCK FREQUENCY SUPPLY RESPONSE In any clocked system, power supply noise near the clock frequency may have consequences at other frequencies. An internal clock typically controls the sensor excitation and the signal demodulator for micromachined accelerometers. If the power supply contains high frequency spikes, they may be demodulated and interpreted as an acceleration signal. A signal appears as the difference between the noise frequency and the demodulator frequency. If the power supply spikes are 100 Hz away from the demodulator clock, there is an output term at 100 Hz. If the power supply clock is at exactly the same frequency as the accelerometer clock, the term appears as an offset. If the difference frequency is outside of the signal bandwidth, the filter attenuates it. However, both the power supply clock and the accelerometer clock may vary with time or temperature, which can cause the interference signal to appear in the output filter bandwidth. The ADXL193 addresses this issue in two ways. First, the high clock frequency eases the task of choosing a power supply clock frequency such that the difference between it and the accelerometer clock remains well outside of the filter bandwidth. Second, the ADXL193 is the only micromachined accelerometer to have a fully differential signal path, including differential sensors. The differential sensors eliminate most of the power supply noise before it reaches the demodulator. Good high frequency supply bypassing, such as a ceramic capacitor close to the supply pins, also minimizes the amount of interference. The clock frequency supply response (CFSR) is the ratio of the response at VOUT to the noise on the power supply near the accelerometer clock frequency. A CFSR of 3 means that the signal at VOUT is 3× the amplitude of an excitation signal at VDD near the accelerometer internal clock frequency. This is analogous to the power supply response, except that the stimulus and the response are at different frequencies. The ADXL193’s CFSR is 10× better than a typical single-ended accelerometer system. SIGNAL DISTORTION Signals from crashes and other events may contain high amplitude, high frequency components. These components contain very little useful information and are reduced by the 2-pole Bessel filter at the output of the accelerometer. However, if the signal saturates at any point, the accelerometer output does not look like a filtered version of the acceleration signal. The signal may saturate anywhere before the filter. For example, if the resonant frequency of the sensor is low, the displacement per unit acceleration is high. The sensor may reach the mechanical limit of travel if the applied acceleration is high enough. This can be remedied by locating the accelerometer where it does not see high values of acceleration and by using a higher resonant frequency sensor, such as the ADXL193. Also, the electronics may saturate in an overload condition between the sensor output and the filter input. Ensuring that internal circuit nodes operate linearly to at least several times the full-scale acceleration value can minimize electrical saturation. The ADXL193 circuit is linear to approximately 8× full scale. Rev. A | Page 8 of 12 ADXL193 OUTLINE DIMENSIONS 5.00 SQ 1.27 1.78 1.27 4.50 SQ 7 0.50 DIAMETER 1 1.90 2.50 TOP VIEW 1.27 R 0.38 0.20 5 3 0.64 2.50 0.38 DIAMETER R 0.20 BOTTOM VIEW Figure 6. 8-Terminal Ceramic Leadless Chip Carrier [LCC] (E-8) Dimensions shown in millimeters ADXL193 ORDERING GUIDE Model 1 AD22282-A-R2 AD22282-A AD22283-B-R2 AD22283-B 1 Parts per Reel 250 3000 250 3000 Measurement Range ±120 g ±120 g ±250 g ±250 g Specified Voltage (V) 5 5 5 5 Temperature Range −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C All models are on tape and reel and are Pb-free parts. Rev. A | Page 9 of 12 Package Description 8-Terminal Ceramic Leadless Chip Carrier 8-Terminal Ceramic Leadless Chip Carrier 8-Terminal Ceramic Leadless Chip Carrier 8-Terminal Ceramic Leadless Chip Carrier Package Option E-8 E-8 E-8 E-8 ADXL193 NOTES Rev. A | Page 10 of 12 ADXL193 NOTES Rev. A | Page 11 of 12 ADXL193 NOTES ©2005 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D05366–0–5/05(A) Rev. A | Page 12 of 12