ETC DSA8300

DSA8300 Datasheet
Digital Serial Analyzer Sampling Oscilloscope
Key features
With today’s sampling module portfolio, the DSA8300 supports up to
8 simultaneously acquired signals
A wide variety of optical, electrical, and accessory modules to support
your specific testing requirements
Optical modules
Fully integrated optical modules that support all standard optical
data rates from 155 Mb/s to 100 Gb/s
Certified optical reference receivers support specified requirements
for standards-mandated compliance testing
Optical bandwidths to >80 GHz
High optical sensitivity, low noise, and wide dynamic range of the
optical sampling modules allows accurate testing and
characterization of short-reach to long-haul optical communications
standards
The DSA8300 is a state-of-the-art Equivalent Time Sampling Oscilloscope
that provides the highest fidelity measurement and analysis capabilities for
Communications Signal Analysis, Serial Data Network Analysis, and Serial
Data Link Analysis applications.
Key performance specifications
Very low time base jitter:
425 fs typical on up to 8 simultaneously acquired channels
<100 fs on up to 6 channels with 82A04B phase reference module
Industry’s highest vertical resolution – 16 bit A/D
Electrical resolution: <20 µV LSB (for 1 v full range)
Optical resolution from <20 nW for the 80C07B (1 mW full range) to
<0.6 µW for the 80C10C (30 mW full range)
Optical bandwidths to >80 GHz
Electrical bandwidths to >70 GHz
Fully calibrated clock recovery solutions – no need to manually
calibrate for data pick-off losses
Calibrated extinction ratio measurements ensure repeatability of
extinction ratio measurements to <0.5 dB among systems with
modules with this factory calibration option
Electrical modules
Very low-noise electrical samplers (280 μV at 20 GHz, 450 μV at
60 GHz, typical)
Selectable bandwidths 1 allow the user to trade-off sampler
bandwidth and noise for optimal data acquisition performance
Remote samplers 2 or compact sampling extender module cables
support minimal signal degradation by allowing the sampler to be
located in close proximity to the device under test
World’s highest-performance integrated TDR (10 ps typical step
rise time) supports exceptional impedance discontinuity
characterization and high dynamic range for s-parameter
measurements to 50 GHz
Over 120 automated measurements for NRZ, RZ, and pulse signal
types
Automated mask testing with over 80 industry-standard masks
1
With 80E07B, 80E08B, 80E09B, 80E10B, 80E11, and 80E11X1 modules.
2
80E07B, 80E08B, 80E09B and 80E10B only.
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Datasheet
Analysis
Complete suite of over 120 automated measurements for NRZ, RZ,
and pulse signal types
Automated Mask Testing with over 80 Industry-standard Masks.
New Masks can be Imported into the DSA8300 to support New
Emerging Standards. Users can Define their own Masks for
Automated Mask Testing
Vertical and Horizontal Histograms for Waveform Statistical
Analysis
Vertical, Horizontal, and Waveform Cursors (with measurements)
Jitter, Noise, BER, and Serial Data Link Analysis is provided
through the 80SJNB Basic and Advanced Software Application
Options
Advanced TDR Analysis, S-parameter measurements, simulation
model extraction, and serial link simulation capabilities are
®
provided through the IConnect Software Application options
High test throughput
Optical eye diagram testing
High sample acquisition rate up to 300 kS/s per channel
Efficient programmatic interface (IEEE-488, Ethernet, or local
processor access) enables high test throughput
Applications
Design/Verification of telecom and datacom components and systems
Manufacturing/testing for ITU/ANSI/IEEE/SONET/SDH compliance
High-performance true-differential TDR measurements
Impedance characterization and network analysis for serial data
applications including S-parameters
Advanced jitter, noise, and BER analysis
Channel and eye diagram simulation and measurement-based SPICE
modeling
Passive interconnect test
Superior performance with extraordinary
versatility
The DSA8300 Digital Serial Analyzer is the most versatile tool for
developing and testing communications, computers, and consumer
electronics which use multi-gigabit data transmission. It is used for optical
and electrical transmitter characterization, as well as compliance
verification for devices, modules, and systems used in these products.
In addition, the DSA8300 is well-suited for electrical signal path
characterization, whether for packages, PCBs, or electrical cables. With
exceptional bandwidth, signal fidelity, and the most extensible modular
architecture, the DSA8300 provides the highest-performance TDR and
interconnect analysis, most accurate analysis of signal impairments, and
BER calculations for current and emerging serial data technology.
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Finally, with its exceptional signal fidelity and resolution, the DSA8300 is
the gold standard for electrical and optical applications which require ultrahigh bandwidths, very fine vertical resolution, low jitter, and/or exceptional
time interval accuracy.
The DSA8300 provides unmatched measurement system fidelity with the
lowest native instrument jitter floor (425 fs RMS, typical for serial data
signals at rates >1.25 Gb/s) that ensures the most accurate acquisition of
up to 8 high-bandwidth signals simultaneously. You get additional analysis
benefits from acquisition jitter as low as 100 fs RMS when using the
82A04B Phase Reference module.
The multiprocessor architecture, with dedicated per-slot digital signal
processors (DSPs), provides fast waveform acquisition rates, reducing the
test times necessary for reliable characterization and compliance
verification.
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
The DSA8300’s versatile modular architecture supports a large and
growing family of plug-ins enabling you to configure your measurement
system with a wide variety of electrical, optical, and accessory modules that
best suit your application now and in the future. With 6 module slots, the
DSA8300 can simultaneously accommodate a Clock Recovery module, a
precision Phase Reference module, and multiple acquisition modules
(electrical or optical), so you can match system performance to your
evolving needs. The ability to swap sampling modules without powering
down the DSA8300 (available for scopes with firmware versions 6.1 and
later) provides additional flexibility in configuring your DSA8300 to changing
test needs.
Jitter, noise, BER, and serial data link
analysis
Featuring industry-leading signal fidelity, the family of electrical modules
includes bandwidth performance from 20 GHz to >70 GHz, while the optical
modules support optical testing from 125 Mb/s to 100 Gb/s and beyond with
optical bandwidth exceeding 80 GHz. The DSA8300 supports all of the
legacy 8000 Series electrical and optical sampling modules and
accessories. 3
In addition, specialized modules supporting features such as single-ended
and differential electrical clock recovery, electrostatic protection for
®
electrical samplers, and connectivity to the popular TekConnect probing
system brings you the performance of state-of-the-art Tektronix probes for
high-impedance and differential probing. Low-impedance probes for 50 Ω
probing and for TDR probing are also available.
The raw acquisition performance of the DSA8300 and its sampling modules
and accessories is further augmented by the comprehensive measurement
and analysis capabilities of the DSA8300 and its associated software
®
applications. For example, the IConnect software applications provide
complete TDR, S-parameter, and signal integrity analysis for passive
electrical interconnects (packages, printed circuit boards, backplanes,
cable, etc.) while the 80SJNB applications provide complete jitter, noise,
and bit error rate analysis as well as channel and equalization analysis and
emulation for both optical and electrical serial data links.
Jitter, noise and BER analysis
High-speed serial data link measurements and analysis are supported with
three software solutions: 80SJARB, 80SJNB essentials, and 80SJNB
Advanced. 4
80SJARB (Option JARB) is a basic jitter measurement tool capable of
measuring jitter on any waveform – random or repetitive. The simplicity
of acquisition limits the amount of analysis possible so only the
simplest decomposition can be used; repeatability is pattern dependent
80SJNB Essentials (Option JNB) offers complete analysis of jitter,
noise, and BER, with decomposition of components for clear
understanding of a signal’s problems and margins. The acquisition
methodology requires a repetitive pattern. Both accuracy and
repeatability are improved relative to 80SJARB since the tool has
access to the complete signal pattern
80SJNB Advanced (Option JNB01) adds features to 80SJNB
Essentials for serial data link analysis – de-embedding of fixture,
channel emulation, FFE/DFE equalization, and preemphasis/deemphasis
3
The DSA8300 does not support the 80A06 Pattern Synchronization module, as this capability is superseded by the integrated Advance Trigger option (Option ADVTRIG) for the DSA8300.
4
These software applications can be purchased to install on currently owned DSA8300 oscilloscopes with the DSA83UP upgrade kits.
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Datasheet
Jitter analysis of arbitrary data (80SJARB)
The 80SJARB jitter measurement application software for the DSA8300
Series addresses IEEE 802.3ba applications requiring the J2 and J9 jitter
measurements. It also enables basic jitter measurements for NRZ data
signals including PRBS31, random traffic, and scrambled data. This
provides an entry-level jitter analysis capability with simple Dual Dirac
model jitter analysis and no pattern synchronization requirement.
80SJARB can acquire continuously in Free Run mode, delivering
acquisitions and updates beyond the IEEE minimum requirement of
10,000 data points.
Plots include jitter and eye opening bathtub curves for both measured and
extrapolated data, as well as a histogram of the acquired data.
80SJARB jitter analysis measurements
Measurement
Description
2.5e–3
J2
Total jitter for BER =
J9
Total jitter for BER = 2.5e–10
Tj
Total jitter for BER = 2.5e–12
DJdd
Deterministic jitter (Dual Dirac model)
RJdd
Random jitter (Dual Dirac model)
80SJNB jitter and noise analysis
measurements
80SJNB jitter analysis
Measurement
Description
TJ at BER
Total jitter at specified BER
J2
Total jitter for BER = 2.5e–3
J9
Total jitter for BER = 2.5e–10
RJ
Random jitter
RJ(h)
Horizontal component of random jitter
RJ(v)
Vertical component of random jitter
RJ(d-d)
Random jitter according to the Dual Dirac model
DJ
Deterministic jitter
DDJ
Data-dependent jitter
DDPWS
Data-dependent pulse width shrinkage
DCD
Duty cycle distortion
DJ(d-d)
Deterministic jitter computed in the Dual Dirac model
PJ
Periodic jitter
PJ(h)
Horizontal component of periodic jitter
PJ(v)
Vertical component of periodic jitter
EO at BER
Horizontal eye opening at specified BER
BUJ
Bounded uncorrelated jitter
NPJ
Non-periodic jitter (uncorrelated and bounded)
SSCMagnitude
Magnitude of SSC modulation in ppm
SSCFrequency
Frequency of SSC modulation in ppm
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80SJNB noise analysis
Measurement
Description
RN
Random noise
RN(v)
Vertical component of random noise
RN(h)
Horizontal component of random noise
DN
Deterministic noise
DDN1
Data-dependent noise on logical level 1
DDN0
Data-dependent noise on logical level 0
PN
Periodic noise
PN(v)
Vertical component of periodic noise
PN(h)
Horizontal component of periodic noise
EO at BER
Vertical eye opening at specified BER
BUN
Bounded uncorrelated noise
NPN
Non-periodic noise
80SJNB Advanced (Opt. JNB01) supports:
FFE (Feed Forward Equalization) to 100 Taps
DFE (Decision Feedback Equalization) to 40 Taps
Filter for support of linear filters from fixture de-embed to transmitter
equalization. Channel emulation supported for channels with >30 dB of
loss at 1st harmonic frequency
TDR (Time Domain Reflectometry)
applications
Quickly identify the exact location of faults with the 80E10B sub-millimeter resolution and
IConnect ®True Impedance Profile
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
The DSA8300 is the industry’s highest-performance fully integrated Time
Domain Reflectometry (TDR) measurement system. Offering truedifferential TDR measurements up to 50 GHz bandwidth with 15 ps
reflected rise time and 12 ps incident rise time 5, the DSA8300 enables you
to keep pace with today’s most demanding Serial Data Network Analysis
(SDNA) requirements.
As clock speeds and rise times of digital circuits increase, interconnect
signal integrity dramatically affects digital system performance. Accurate
and efficient Serial Data Network Analysis (SDNA) of the signal path and
interconnects in time and frequency domains is critical to predict signal
losses, jitter, crosstalk, terminations and ringing, digital bit errors, and eye
diagram degradation, ensuring reliable system operation.
The 80E10B and 80E08B TDR modules feature a fully integrated
independent dual-channel 2-meter remote sampler system to minimize
fixturing and assure optimal system fidelity. Independent sampler deskew
ensures fast and easy fixture and probe de-embedding. The user can
characterize differential crosstalk by using TDR steps from a differential
module to drive one line pair while monitoring a second line pair with a
second differential module.
Tektronix offers several true-differential TDR modules, which in
®
combination with IConnect software allow S-parameter measurements
with up to –70 dB of dynamic range. This performance assures accurate,
repeatable measurements in serial data analysis, digital design, signal
integrity, and electrical compliance testing applications.
TDR module performance with IConnect®
The DSA8300 is the industry’s most versatile TDR measurement system,
accommodating up to 4 dual-channel true-differential TDR modules for fast,
accurate multilane impedance and S-parameter characterization.
TDR Module
S-parameter measurement bandwidth performance
80E10B
50 GHz
80E08B
30 GHz
The P80318 True-differential TDR probe and P8018 Single-ended Passive
Handheld TDR probe provide high-performance probing solutions for circuit
board impedance and electrical signal characterization. The P80318, an
18 GHz 100 Ω input-impedance differential TDR hand probe, enables highfidelity impedance measurements of differential transmission lines. The
adjustable probe pitch enables a wide variety of differential line spacing and
impedances. The P8018 is a 20 GHz Single-ended Passive Handheld TDR
probe. Both the P80318 and P8018 can be used as stand-alone probes but
are especially designed to work with the 80A02 EOS/ESD module to
provide EOS/ESD protection.
80E04
20 GHz
Multi-gigabit signal path characterization and
analysis – Serial Data Network Analysis
(SDNA)
®
With the long record length acquisitions, IConnect provides great flexibility
for obtaining the desired frequency range and frequency step when
performing S-parameter measurements. Up to 1,000,000 points can be
acquired.
®
When you use IConnect Signal Integrity TDR and S-parameter software
with the DSA8300 you have an efficient, easy-to-use, and cost-effective
solution for measurement-based performance evaluation of multi-gigabit
interconnect links and devices, including signal integrity analysis,
impedance, S-parameter, and eye-diagram tests, and fault isolation.
®
IConnect can help you complete interconnect analysis tasks in minutes
instead of days, resulting in faster system design time and lower design
®
costs. IConnect also enables impedance, S-parameters, and eye-diagram
compliance testing as required by many serial data standards, as well as
full channel analysis, Touchstone (SnP) file output, and SPICE modeling for
multi-gigabit interconnects.
Serial data network analysis
5
Rise times are 10-90%. Typical reflected rise times for the 80E10B are <10 ps.
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Datasheet
Failure analysis – quickly identify fault
location
The 80E10B, with its 12 ps typical TDR rise time, provides superior
resolution enabling the fastest and most efficient fault isolation in package,
circuit board, and on-chip failure analysis applications.
®
IConnect Signal Integrity TDR and
S-parameter software
Substantially simplify the signal integrity analysis of the interconnect
link, equalization and emphasis component design, and analysis of the
interconnect link with transmitter and receiver
®
IConnect Linear Simulator lets the designer link several interconnect
channels together to evaluate the total time, frequency domain
performance, and eye diagram of the overall channel
®
For more information regarding the IConnect software applications, see
®
the IConnect Signal Integrity, TDR, and S-Parameter SW – 80SICMX •
80SICON • 80SSPAR datasheet.
®
Operating on the DSA8300 TDR platform, IConnect S-parameters is the
most cost-effective and highest throughput approach for S-parameter
measurements in digital design, signal integrity analysis, and interconnect
compliance testing, providing as much as 50% cost savings compared to
similar bandwidth VNAs, and dramatically speeding up measurements.
®
You can also take advantage of the IConnect S-parameters command-line
interface, which automates the S-parameter measurements to the overall
suite of manufacturing tests you perform using your TDR instrument,
significantly reducing test time while increasing measurement repeatability.
The simplicity of S-parameter calibration using a reference (open, short, or
through), and an optional 50 Ω load makes measurements, fixture deembedding, and moving the reference plane a snap. Touchstone file format
output enables easy S-parameter file sharing for further data analysis and
simulations.
Tektronix offers several true-differential TDR modules, which in
®
combination with IConnect offers S-parameter measurements up to
50 GHz with up to –70 dB of dynamic range. This performance exceeds
requirements for serial data analysis, digital design, and signal integrity
applications, resolving down to 1% (–40 dB) accuracy of crosstalk, while
electrical compliance testing masks typically call for measurements in the –
10 to –30 dB range.
®
IConnect software lets you:
Quickly and easily generate SPICE and IBIS models for your PCBs,
flex boards, connectors, cables, packages, sockets, and I/O buffer
inputs directly from TDR/T or VNA S-parameter measurements
Display eye diagram degradation, jitter, loss, crosstalk, reflections, and
ringing in your digital system
Measurement and analysis tools for optical
testing applications
The DSA8300 includes a wide variety of measurement and analysis tools
which specifically address optical testing applications. In addition to the
standard amplitude and timing parametric measurements (such as rise/fall
times, amplitude, RMS jitter, RMS noise, frequency, period, etc.), the
measurement suite for the DSA8300 includes measurements specifically
tailored to measuring optical signals (average optical power, extinction
ratio, eye height, eye width, optical modulation amplitude (OMA), etc.). For
a complete list of measurements, see the Measurement section of this
datasheet.
The DSA8300 also includes standard compliance testing masks for all of
the common optical standards from 155 Mb/s to 100 Gb/s. The DSA8300
mask testing system includes the ability to automatically fit standard and
user masks to data acquired into a waveform database. The mask test
system can also automatically determine the mask margin based either on
the total # of mask violations or the "hit ratio" of mask violation to the
number of samples acquired in the mask test unit interval. Users can also
create their own masks for automated mask testing. Histograms and cursor
measurements are also available to analyze optical signals acquired by the
DSA8300.
Finally, the 80SJNB applications support complete jitter, noise, and BER
analysis for optical signals. The advanced version of this software (Option
JNB01) supports evaluating the emphasis and equalization on impaired
signals.
Sampling modules
High speed optical test solutions
The DSA8300 with its highly configurable mainframe and a wide variety of optical modules provide complete optical test solutions with superior system
fidelity from 125 Mb/s to 100 Gb/s and beyond. The modules cover a range of wavelengths for both single- and multi-mode fibers. Each module can be
optionally configured with several selectable Optical Reference Receiver (ORR) filters and/or a full bandwidth path. Each module also supports fully
calibrated clock recovery solutions (whether integrated into the module or through a data pick-off routed to an external clock recovery module or stand-alone
clock recovery instrument).
See the Optical sampling modules table for a brief description of each available optical sampling module. See the Optical sampling module selection guide
table for key specifications for each module. For more complete information on these modules, see the Optical Sampling Modules – 80C07B • 80C08D •
80C10C • 80C11B • 80C12B• 80C14 • 80C15 datasheet.
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DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Optical sampling modules
Module
Description
80C07B Multirate Datacom and
Telecom
The 80C07B module is a broad-wavelength (700 to 1650 nm) multirate optical sampling module optimized for testing datacom/
telecom signals from 125 Mb/s to 2.5 Gb/s. With its amplified O/E converter design, this module provides excellent signal-to-noise
performance, allowing users to examine low-power optical signals. The 80C07B can be optionally configured with fully calibrated
internal clock recovery that supports 125, 155, 622, 1063, 1250, 2125, 2488, 2500, and 2666 Mb/s rates.
80C08D Multirate, Broad Wavelength, The 80C08D module is a broad-wavelength (700 to 1650 nm) multirate optical sampling module providing datacom rate testing for
High Sensitivity 10 Gb/s
10GbE, 40GbE-R4, 100GbE-SR10 applications at 9.953, 10.3125, 11.0957 Gb/s and 10G Fibre Channel applications at
10.51875 and 11.317 Gb/s. The 80C08D also provides telecom rate testing at 9.953, 10.664, and 10.709 Gb/s. With its amplified O/E
converter design, this module provides excellent signal-to-noise performance and high optical sensitivity, allowing users to examine
low power level optical signals. The 80C08D can be optionally configured with an integrated clock recovery option that supports
acquiring signals at any standard- or user-specified rate from 9.8 to 12.6 Gb/s.
80C10C Multirate Datacom and
Telecom 40 Gb/s and 100 Gb/s
The 80C10C module provides integrated and selectable reference receiver filtering, enabling conformance testing at either 1310 nm
or 1550 nm of all standard 25, 40 and 100 (4 x 25) Gb/s standard rates. There are three configurations for the 80C10C:
Option F1: Provides standard compliant optical reference receivers for the following rates (standards):
25.781 Gb/s (100GBase-LR4 and 100GBase-ER4)
27.952 Gb/s (OTU4)
39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1)
41.25 Gb/s (40GBase-FR)
43.018 Gb/s (G.709 FEC, OTU3 4×10G LAN PHY)
Option F2: Provides standard compliant optical reference receivers for the following rates (standards):
25.781 Gb/s (100GBase-LR4 and 100GBase-ER4)
27.952 Gb/s (OTU4)
Option F3: Provides standard compliant optical reference receivers for the following rates (standards):
39.813 Gb/s (OC-768/STM-256, VSR2000 G.693, 40G NRZ G.959.1)
41.25 Gb/s (40GBase-FR)
43.018 Gb/s (G.709 FEC, OTU3 4×10G LAN PHY)
In addition to the filter rates, the user may also select bandwidths for the 80C10C for optimal noise vs. bandwidth performance for
accurate signal characterization. When equipped with Option CRTP an electrical signal pickoff is provided for clock recovery. Clock
recovery, to 28.6 Gb/s, for the 80C10C is provided using the CR286A clock recovery instrument (sold separately).
When equipped with Option HSPR, a separate high-sensitivity photo receiver is provided with independent electrical outputs that can
be used with external equipment (such as a Tektronix BERTScope) for high accuracy optical measurements.
The 80C10C is also optionally available in a bundled ordering configuration which includes a single-channel 70+ GHz electrical
sampling module.
80C11B Multirate 10 Gb/s Datacom
and Telecom
The 80C11B module is a long-wavelength (1100 to 1650 nm) multirate optical sampling module optimized for testing 10 Gb/s datacom
and telecom standard rates at 9.953, 10.3125, 10.51875, 10.664, 10.709, 11.0957, 11.317, and 14.025 Gb/s. With its high optical
bandwidth of up to 30 GHz (typical) it is well-suited for general-purpose high-performance 10 Gb/s optical component testing. The
80C11B can be optionally configured with clock recovery that can support any standard or user-defined rate in the continuous range
from 9.8 to 12.6 Gb/s.
80C12B Multirate Datacom and
Telecom
The 80C12B module is a broad wavelength (700 to 1650 nm) multirate optical sampling module providing telecom and datacom
testing for standards from 155 Mb/s to 11.4 Gb/s. This highly flexible module can be configured to support a wide variety of 10 Gb/s
applications, lower data rate applications (155 Mb/s to 7.4 Gb/s), or a combination of 10G and lower data rate standards.
The low data rate applications include: Telecom applications from 155 to 2666 Mb/s, 1G, 2G, and 4G Fibre Channel, multilane
standards such as 10GBASE-X4 and 4-Lane 10 Gb/s Fibre Channel, and Infiniband SDR and DDR rates.
The supported 10 Gb/s application includes both datacom and telecom standards. The supported 10 Gb/s datacom applications
include 10GbE, 40GbE-R4, 100GbE-SR10 applications at 9.953, 10.3125, 11.0957 Gb/s, and 10G Fibre Channel applications at
10.51875 Gb/s and 11.317 Gb/s. The 80C12B also provides telecom rate testing at 9.953, 10.664, and 10.709 Gb/s.
With its amplified O/E converter design, this module provides excellent signal-to-noise performance and high optical sensitivity,
allowing users to examine low-power optical signals. Clock recovery for the 80C12B is provided using the 80A05 module or CR125A
clock recovery instrument (sold separately).
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Datasheet
Module
Description
80C14 Multirate Datacom and
Telecom
The 80C14 module is a broad-wavelength (700 to 1650 nm) multirate optical sampling module providing 8G, 10G, and 16G telecom
and datacom testing. The supported 10 Gb/s datacom applications include: 10GbE, 40GbE-R4, 100GbE-SR10 applications at 9.953,
10.3125, and 11.0957 Gb/s. Fibre Channel applications include: 8.500, 10.51875, 11.317, and 14.025 Gb/s. The 80C14 also provides
telecom rate testing at 9.953, 10.664, 10.709, and 12.5 Gb/s.
With its amplified O/E converter design, this module provides excellent signal-to-noise performance and high optical sensitivity,
allowing users to examine low power level optical signals. Clock recovery for the 80C14 is provided by the CR175A or CR286A (sold
separately).
80C15
The 80C15 module provides integrated and selectable reference receiver filtering, enabling conformance testing for single- and multimode optical signals at 850 nm, 1310 nm or 1550 nm of all standard 25-32 Gb/s standard rates. This module provides bandwidth
filters for the following rates (standards):
- 25.781 Gb/s (100GBase-ER4, 100GBase-LR4, 100GBase-SR4, Infiniband EDR)
- 27.952 Gb/s (OTU4)
- 28.050 Gb/s (32G Fibre Channel)
In addition to the filter rates, the user may also select bandwidths for the 80C15 for optimal noise vs. bandwidth performance for
accurate signal characterization.
Optical sampling module selection guide
Characteristic
80C07B 6
80C08D
80C12B 7
Opt. F0-F12
80C12B 7
Opt. 10G/
10GP
80C14
80C11B
80C15
80C10C 8 Opt 80C10C 8 Opt 80C10C 8 Opt
F1
F2
F3
Wavelength
Range (nm)
700-1650
700-1650
700-1650
700-1650
700-1650
1100-1650
700-1650
1290-1330
1520-1620
1290-1330
1520-1620
1290-1330
1520-1620
Unfiltered
Optical
Bandwidth
(GHz)
2.5
12.5
12
12 9
12
30
32
70
55
80
Fiber Input
(μm)
9, 50, 62.5
9, 50, 62.5
9, 50, 62.5
9, 50, 62.5
9, 50, 62.5
9
9, 50, 62.5
9
9
9
Mask Test
Sensitivity
(dBm)
–22
–16
–19
–15
–15
–9
–9
–8
–8 11
–8 11
10
9
Optical reference receivers supported
155 mb/s
■
■
622 mb/s
■
■
1.063 Gb/s
■
■
1.250 Gb/s
■
■
2.125 Gb/s
■
■
2.488 Gb/s
■
■
2.500 Gb/s
■
■
2.66 Gb/s
■
3.125 Gb/s
■
3.188 Gb/s
■
6
There are specific reference receiver groupings supported for the 80C07B. See the 80Cxx Optical Module datasheet for detailed information.
7
There are specific reference receiver groupings supported for the 80C12B. See the 80Cxx Optical Module datasheet for detailed information.
8
The clock recovery trigger pick-off (Option CRTP) for the 80C10C can support trigger pick-off for data rates to >43 Gb/s.
9
The full 12 GHz bandwidth for the 80C12B is only available with Option F0, 10G, or 10GP.
10
Mask test sensitivity of the 80C08D reduced by ~1 dBm with internal clock recovery options.
11
Mask test sensitivity of the 80C10C reduced by ~0.6 dBm with internal clock recovery trigger pick-off (Option CRTP).
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11
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Characteristic
80C07B 6
80C08D
80C12B 7
Opt. F0-F12
80C15
80C10C 8 Opt 80C10C 8 Opt 80C10C 8 Opt
F1
F2
F3
25.78 Gb/s
■
■
■
27.74 Gb/s
■
■
■
28.05 Gb/s
■
4.250 Gb/s
■
5.000 Gb/s
■
6.144 Gb/s
■
7.373 Gb/s
■
8.500 Gb/s
■
80C12B 7
Opt. 10G/
10GP
80C14
80C11B
■
■
■
9.953 Gb/s
■
■
■
■
10.31 Gb/s
■
■
■
■
10.51 Gb/s
■
■
■
■
10.66 Gb/s
■
■
■
■
10.71 Gb/s
■
■
■
■
11.1 Gb/s
■
■
■
■
11.3 Gb/s
■
■
■
■
14.025 Gb/s
■
■
14.063 Gb/s
■
■
39.81 Gb/s
■
■
41.25 Gb/s
■
■
43.02 Gb/s
■
■
Clock recovery for optical testing
In many optical applications, there is no data clock directly available to provide a reference signal for acquiring the signals from the device under test. In
these situations, it is necessary to recover the clock from the data signal. The Tektronix 8000 Series of sampling oscilloscope products provides a complete
complement of clock recovery solutions to meet this need. Each of these solutions is fully calibrated so that users do not need to do any manual calibration
of the system to take into account any losses due to data pick-off being routed to the input of the clock recovery unit.
Shown below is a clock recovery solutions selection guide with the key specifications for each solution to help you select the solution(s) most appropriate for
your application. For more detailed information on these solutions, see the 80Cxx Optical Sampling Modules datasheet (for clock recovery options integrated
into the 80C07B, 80C08D, or 80C11B ) or the appropriate clock recovery datasheets for stand-alone clock recovery modules or instruments.
Note: The stand-alone clock recovery modules/instruments have electrical inputs and can be used to recover clocks from electrical signals as well as from
the electrical data pick-off outputs from the 80CXX Series optical sampling modules.
Note: Clock recovery is integrated into the optical module and controlled from the Trigger Setup menu of the 8000 Series oscilloscope.
6
There are specific reference receiver groupings supported for the 80C07B. See the 80Cxx Optical Module datasheet for detailed information.
7
There are specific reference receiver groupings supported for the 80C12B. See the 80Cxx Optical Module datasheet for detailed information.
8
The clock recovery trigger pick-off (Option CRTP) for the 80C10C can support trigger pick-off for data rates to >43 Gb/s.
www.tektronix.com 9
Datasheet
Integrated clock recovery options
Characteristic
80C07B
80C08D Opt.
CR1
80C08D Opt.
CR2
80C08D Opt.
CR4
80C11B Opt.
CR1
80C11B Opt.
CR2
80C11B Opt.
CR3
80C11B Opt.
CR4
Continuously
Fixed Rates
Variable
Rate Range (Gb/
s)
Fixed Rates
Fixed Rates
9.8 - 12.6
Fixed Rates
Fixed Rates
Fixed Rates
9.8 - 12.6
Clock Recovery
Sensitivity
(dBm) 12
–15
–15
–15
–9
–9
–9
–9
■
■
■
■
■
–22
Standard rates supported
125, 155 Mb/s
■
622 Mb/s
■
1063 Mb/s
■
1250 Mb/s
■
2125 Mb/s
■
2488, 2500 Mb/s ■
9.95 Gb/s
■
10.31 Gb/s
■
10.52 Gb/s
■
■
■
■
■
■
10.66 Gb/s
■
10.71 Gb/s
■
■
■
11.10 Gb/s
■
■
11.30 Gb/s
■
■
■
■
14.025 Gb/s
14.063 Gb/s
25.78 Gb/s
27.74 Gb/s
Stand-alone (electrical) clock recovery modules/instruments
Characteristic
80A05 Std. 13
80A05 Opt. 10G 13
CR125A 14
CR175A 14
CR286A 14
Continuously Variable Rate 50 - 3.188
Range (Gb/s)
4.25
50 - 3.188
3.267 - 4.25
4.900 - 6.375
9.8 - 12.6
0.1 - 12.5
0.1 - 17.5
0.1 - 28.6
Clock Recovery Sensitivity ≤15
(mVp-p) 15
≤15
15
15
15
■
■
■
Adjustable Clock Recovery
Loop Bandwidth and
Peaking 16
Standard rates supported
12
Electrical clock recovery sensitivity is for differential input and varies with the input clock rate. See clock recovery datasheets for more information.
13
The clock recovery module plugs into one of the 8000 Series large module slots and is controlled from the Trigger Setup menu.
14
Stand-alone clock recovery instrument; controllable from the BERTScope clock recovery instrument control application, accessible from the App menu of the 8000 Series oscilloscope.
15
Electrical clock recovery sensitivity is for differential input and varies with the input clock rate. See clock recovery datasheets for more information.
16
For more information on clock recovery loop bandwidth and peaking, see clock recovery datasheets.
10 www.tektronix.com
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Characteristic
80A05 Std. 13
80A05 Opt. 10G 13
CR125A 14
CR175A 14
CR286A 14
125, 155 Mb/s
■
■
■
■
■
622 Mb/s
■
■
■
■
■
1063 Mb/s
■
■
■
■
■
1250 Mb/s
■
■
■
■
■
2125 Mb/s
■
■
■
■
■
2488, 2500 Mb/s
■
■
■
■
■
2.66 Gb/s
■
■
■
■
■
3.125, 3.188 Gb/s
■
■
■
■
■
4.25 Gb/s
■
■
■
■
■
5.00 Gb/s
■
■
■
■
6.14 Gb/s
■
■
■
■
7.37 Gb/s
■
■
■
■
8.5 Gb/s
■
■
■
■
9.95 Gb/s
■
■
■
■
10.31 Gb/s
■
■
■
■
10.52 Gb/s
■
■
■
■
10.66 Gb/s
■
■
■
■
10.71 Gb/s
■
■
■
■
11.10 Gb/s
■
■
■
■
11.30 Gb/s
■
■
■
■
12.50 Gb/s
■
■
■
14.025 Gb/s
■
■
■
14.063 Gb/s
■
■
■
25.78 Gb/s
■
27.74 Gb/s
■
High-performance electrical test solutions
The DSA8300 is also well-suited for a variety of high-performance electrical applications. With the modular system, users can configure their DSA8300 with
a variety of electrical modules that are best suited to their requirements. the following table provides key specifications for the current electrical sampling
modules available for use with the DSA8300, to help you select the electrical module(s) most appropriate for your application. Detailed specifications are
available in the 80E00 Electrical Sampling Modules datasheet.
Electrical sampling module selection guide
Characteristic
80E01
80E03
80E07B
80E09B
80E11, 80E11X1 80E04
(TDR Module)
80E08B
(TDR Module)
80E10B
(TDR Module)
Channels
1
2
2
2
2 (80E11)
1 (80E11X1)
2
2
Bandwidth
50 GHz
20 GHz
20/30 GHz (user
selectable)
30/40/60 GHz
40/60/70 GHz
20 GHz
(user selectable) (user selectable)
20/30 GHz (user
selectable)
30/40/50 GHz
(user selectable)
17.5 ps
11.7 ps
5.8 ps
11.7 ps
7 ps
Step response at 7 ps
full bandwidth
(10-90%)
5.0 ps
2
17.5 ps
13
The clock recovery module plugs into one of the 8000 Series large module slots and is controlled from the Trigger Setup menu.
14
Stand-alone clock recovery instrument; controllable from the BERTScope clock recovery instrument control application, accessible from the App menu of the 8000 Series oscilloscope.
www.tektronix.com 11
Datasheet
Characteristic
80E01
80E03
80E07B
80E09B
80E11, 80E11X1 80E04
(TDR Module)
80E08B
(TDR Module)
80E10B
(TDR Module)
RMS Noise
1.8 mV
600 μV
280 μV at 20 GHz 300 μV at 30 GHz 330 μV at 40 GHz 600 μV
300 μV at 30 GHz 330 μV at 40 GHz 450 μV at 60 GHz
450 μV at 60 GHz 950 μV at 70 GHz
280 μV at 20 GHz 300 μV at 30 GHz
300 μV at 30 GHz 370 μV at 40 GHz
600 μV at 50 GHz
Incident TDR
Step Rise Time
(10-90%)
-
-
-
-
-
23 ps
18 ps
12 ps
Reflected TDR
Step Rise Time
(10-90%)
-
-
-
-
-
28 ps
20 ps
15 ps
Remote Sampling w/ optional 80X01 w/ optional 80X01 Fully integrated Fully integrated w/ optional 80X01 w/ optional 80X01 Fully integrated Fully integrated
Capability
or 80X02
or 80X02
2 m remote cable 2 m remote cable or 80X02
or 80X02
2 m remote cable 2 m remote cable
extender cable
extender cable
extender cable
extender cable
S-parameter performance characteristics (80E10B)
All measurements were performed after proper warm up as specified in the DSA8300 manual
Standard S-parameter dynamic range measurement practices were used to determine the dynamic range of the module
Uncertainty results were derived from a wide range of devices, with 250 averages
Better dynamic range can be achieved by selecting lower bandwidth settings on the 80E10B module due to a lower RMS noise floor
Results apply to single-ended or differential measurements
80E10B dynamic range
12 www.tektronix.com
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
80E10B uncertainty
Test solutions for 100 Gb/s (4 x 25 Gb/s) electrical standards
With the continued increase in high-bandwidth applications, the need to test electrical components, modules and systems at high data rates is proliferating.
An example of such data rates is the CEI 3.0 VSR-28 interface. This interface transfers data over multiple electrical channel at rates up to 28.6 Gb/s. Such
signals place significant performance challenges on the test and measurement equipment used to acquire and analyze the devices under test.
Some of these challenges include:
The need to acquire the signal with excellent signal fidelity - this requirement has several implications for the test instrumentation:
Low instrumentation noise
Low instrumentation jitter
The need to acquire the signal as close to the DUT as possible - thereby reducing signal degradation and potential inter-symbol interference
The need to recover the clock from the data stream to acquire signals under test and to do detailed analysis of these signals.
The DSA8300 with its modular architecture, and its associated modules and accessories, provides all of the components necessary to fully test multi-lane
high bit-rate signals. To simplify configuring a system to test such devices, Tektronix offers the following product bundle:
80B28G - a DSA8300 product bundle for 28 Gb/s applications
This bundle, when used with a DSA8300, provides all of the electrical sampling modules, accessories, and clock recovery capabilities needed to test
applications at rates from 10 Gb/s to 28.6 Gb/s per lane. The bundle includes the following products:
1 ea. 80E09B: dual channel, 70 GHz Remote Electrical Sampling Module
1 ea. 82A04B: Phase Reference Module that supports sub-100 fs instrumentation jitter when used with the 80E09B
1 ea. CR286A: 28.6 GHz clock recovery instrument that supports clock recovery at rates from 150 Mb/s to 28.6 Gb/s
1 ea. 80X01: 1-meter sampling module extender cable used to extend the phase reference module to connect directly to the clock recovery module
1 ea. 80A08 : accessory kit with all of the necessary cables, adapters, DC blocks and other accessories to configure a complete test solution
To extend this solution to test additional lanes in a multi-lane application, simply install additional 80E09B dual channel remote sampling modules.
www.tektronix.com 13
Datasheet
Specifications
Product specifications and descriptions in this document are subject to change without notice.
Vertical system
Rise Time / Bandwidth
Determined by the sampling modules used
Vertical Resolution
16 bits over the sampling modules' dynamic range
Electrical Resolution: <20 μV LSB (for 1 V full range)
Optical resolution depends on the dynamic range of the optical module – ranges from <20 nW for the 80C07B (1 mW full range) to
<0.6 μW for the 80C10C (30 mW full range)
Horizontal system
Main and Magnification View Time
Bases, Horizontal Scale
100 fs/div to 1 ms/div, in 1-2-5 sequence or 100 fs increments
Time Interval Accuracy
Trigger Direct (Front Panel)
Input
Horizontal scale >20 ps/div, right-most point of measurement interval <150 ns; Mean Accuracy: 0.1% of interval, STDEV: ≤1 ps
Clock Input/Prescale Trigger
(Front Panel), Eye or Pattern
Mode
Mean accuracy determined by clock input accuracy STDEV: <0.7 ps (max); <0.1 ps (typical)
Clock Input/Prescale Trigger
(Front Panel), Other Mode
Horizontal scale >20 ps/div, right-most point of measurement interval <150 ns; Mean Accuracy: 0.1% of interval, STDEV: ≤3 ps
TDR Clock Trigger (Lock to
External 10 MHz Clock)
Horizontal scale >20 ps/div, right-most point of measurement interval <150 ns; Mean Accuracy: 0.01% of interval, STDEV: ≤1 ps
(0.1 ps typical)
Random Phase Corrected
Mode (Clock Input to 82A04B)
Maximum timing deviation 0.1% of phase reference signal period, typical, relative to phase reference signal
Triggered Phase Corrected
Mode (Clock Input to 82A04B)
Horizontal scale ≤20 ps/div, right-most point of measurement interval <150 ns; Mean Accuracy: 1 ps + 0.5% of interval
Horizontal scale ≤20 ps/div, right-most point of measurement interval <150 ns; Mean Accuracy: 1 ps + 0.5% of interval
For more information on phase reference modes of operation, see the “Phase Reference Module for the DSA8300 Sampling
Oscilloscope” datasheet.
Maximum timing deviation relative to phase reference signal:
>40 ns after trigger event: 0.2% of phase reference signal period, typical
≤40 ns after trigger event: 0.4% of phase reference signal period, typical
Horizontal Deskew Range
Available
–500 ps to +100 ns on any individual channel in 100 fs increments
DSA8300 Record Length
50, 100, 250, 500, 1000, 2000, 4000, 8000, or 16000 samples (magnification views have maximum record length of 4000 samples)
Longer Records Available
IConnect : 1M samples
Mainframe slot deskew only: the 80E07B, 80E08B, 80E09B, 80E10B, 80E11, and 80E11X1 remote sampling modules include
additional channel deskew range.
®
80SJNB Jitter, Noise, and BER Analysis Software: 10M samples (100k unit intervals, 100 samples per unit interval)
14 www.tektronix.com
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Trigger system
Trigger Sources
Clock Input/Prescale Trigger (front panel)
TDR clock (generated internally)
Clock recovery triggers from Optical Sampling modules and Electrical Clock Recovery modules (internally connected)
Phase Reference (when using the 82A04B Phase Reference module) time base supports acquisitions without a trigger signal in its
Free Run mode
Trigger Direct Input (front panel)
Clock Input / Prescale Trigger
Input
Clock Input Sensitivity
100 mVp-p, 0.15 to 20 GHz (typical)
200 mVp-p, 0.15 to 15 GHz (guaranteed)
Minimum Slew Rate
≥2 V/ns
Clock Input Range
1.0 Vp-p (max) – AC coupled
Pattern Lengths Supported
(for Pattern Triggering with
ADVTRIG Option)
2 to 223 (8,388,608) inclusive
Clock Input Jitter in Clock-eye 0.15 - 0.40 GHz: 900 fs (RMS)
and Clock-pattern Trigger
0.40 - 1.25 GHz: 800 fs
Modes (Typical)
1.25 - 20 GHz: 425 fs
Clock Input Jitter in Clock-eye 0.80 - 1.25 GHz: 900 fs (RMS)
and Clock-pattern Trigger
1.25 - 11.20 GHz: 500 fs
Modes (Max)
11.20 - 15.0 GHz: 600 fs
TDR Trigger
TDR Step Rate
Selectable from 25 to 200 kHz in 1 kHz steps
Actual TDR step rate may vary up to 2% from requested rate
TDR Trigger Jitter
1.3 ps RMS (typical) 1.8 ps RMS (max)
Phase Reference Time Base
Phase Reference Input Range
Standard 82A04B: 8 - 32 GHz (guaranteed), 2 - 32 GHz (typical)
82A04B Option 60G: 8 - 60 GHz (guaranteed), 2 - 70 GHz (typical)
For clock frequencies <8 GHz, it may be necessary to filter the clock input to eliminate harmonics from the clock signal (see
accessories 020-2566-xx, 020-2567-xx, and 020-2568-xx)
Phase Reference Input
Sensitivity
Best jitter performance is with the clock input to the 82A04B in the following range: 0.6 - 1.8 V. The phase reference time base
remains operational to 100 mV (typical) with increased jitter
Jitter
f ≥8 GHz: 100 fs RMS, on a 10 GHz or faster sampling module
2 GHz ≤ f ≤ 8 GHz: 140 fs RMS, typical on a 10 GHz or faster acquisition module
For clock frequencies <8 GHz, it may be necessary to filter the clock input to eliminate harmonics from the clock signal (see
accessories 020-2566-xx, 020-2567-xx, and 020-2568-xx)
Trigger Direct Input
Trigger Sensitivity
50 mV, DC - 4 GHz (typical)
100 mV, DC - 3 GHz (guaranteed)
Trigger Level Range
±1.0 V
Trigger Input Range
±1.5 V
www.tektronix.com 15
Datasheet
Trigger system
Trigger Holdoff
Adjustable 5 μs to 50 ms in 0.5 ns increments
Trigger Direct Input Jitter
1.1 ps RMS + 5 ppm of horizontal position (typical)
1.5 ps RMS + 10 ppm of horizontal position (max)
Acquisition system
Acquisition modes
Sample (Normal), Envelope, and Average
Number of sampling modules
accommodated
Up to 4 dual-channel electrical; up to 2 optical sampling modules.
Number of simultaneously
acquired inputs
8 channels maximum
Maximum acquisition rate
300 kS/s per channel in TDR mode
Population of the CH1/CH2 large slot with any module other than one requiring power only displaces functionality of the CH1/CH2
small slot; population of the CH3/CH4 large slot with any module other than one requiring power only displaces functionality of the
CH3/CH4 small slot.
200 kS/s per channel in all other nonphase reference modes
120 kS/s per channel in phase reference modes
Waveform measurements
System Measurement Rate
The DSA8300 supports up to 8 simultaneous measurements, updated 3 times per second with optional display of permeasurement statistics (min, max, mean, and standard deviation)
Measurement Set
Over 120 automated measurements include RZ, NRZ, and pulse signal types, and the following measurement types:
Amplitude Measurements
High, Low, Amplitude, Peak-to-Peak, Max, Mid, Min, Mean, +Overshoot, –Overshoot, P-P, Average Optical Power (dBm, watts),
Noise, RMS Noise, SNR, Eye Height, Eye Opening Factor, Extinction Ratio (Ratio, %, dB), Suppression Ratio (Ratio, %, dB),
OMA, Q-factor, RMS, AC RMS, Cycle RMS, Cycle Mean, Gain, Crossing %, Crossing Level
Timing Measurements
Rise, Fall, Period, Bit Rate, Bit Time, Frequency, Crossing Time, +Cross, –Cross, Jitter (P-P, RMS), Eye Width, +Width, –Width,
Burst Width, +Duty Cycle, –Duty Cycle, Duty Cycle Distortion, Delay, Phase, Pulse Symmetry
Area Measurements
Area, Cycle Area
Cursors
Dot, vertical bar, and horizontal bar cursors
Waveform Processing
Up to 8 math waveforms can be defined and displayed using the following math functions: Add, Subtract, Multiply, Divide,
Average, Differentiate, Exponential, Integrate, Natural Log, Log, Magnitude, Min, Max, Square Root, and Filter. In addition,
measurement values can be utilized as scalars in math waveform definitions
Mask Testing
For many applications, standard masks are available as predefined, built-in masks. Many of the most commonly used standard
masks are shown in the following supported standards list. Contact your local Tektronix representative to get a list of all available
masks. Unless otherwise noted, file-based masks are used to distribute new, Tektronix factory-created, updated masks as a file
loadable by the firmware. User-defined masks allow the user to create (through UI or PI) user masks
16 www.tektronix.com
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Waveform measurements
Supported standards
Type
Standard
Ethernet
100BASE-LX10 125.0 Mb/s
100BASE-BX10 125.0 Mb/s
Gigabit Ethernet 1.250 Gb/s
1000BASE-KX 1.250 Gb/s
2 GBE 2.500 Gb/s 10GBASE-X4 3.125 Gb/s
10GBASE-W 9.95328 Gb/s
10GBASE-R 10.3125 Gb/s
FEC11.10 11.095728 Gb/s
10GBASE-LRM 10.31250 Gb/s
40GBASE-FR 41.25 Gb/s
40GBASE-LR4 10.3125 Gb/s
40GBASE-SR4 10.3125 Gb/s
100GBASE-ER4 25.71825 Gb/s
100GBASE-LR4 25.71825 Gb/s
100GBASE-SR10 10.3125 Gb/s
100GBASE-SR4 25.7185 Gb/s
SONET/SDH
OC-1/STM-0 51.84 Mb/s
OC-3/STM-1 155.52 Mb/s
OC-12/STM-4 622.08 Mb/s
OC-48/STM-16 2.48832 Gb/s
FEC2.666 2.6660571 Gb/s
OC-192/STM-64 9.95328 Gb/s
FEC10.66 10.6642 Gb/s
FEC10.71 10.709225 Gb/s
OTU4 27.95 Gb/s
OC-768/STM-256 39.81312 Gb/s
FEC42.66 42.6569 Gb/s
FEC43.02 43.018414 Gb/s
Fibre Channel Optical
FC133 132.81 Mb/s
FC266 265.6 Mb/s
FC531 531.2 Mb/s
FC1063 1.0625 Gb/s
FC2125 2.125 Gb/s
FC4250 4.250 Gb/s
8GFC 8.500 Gb/s
10GFC 10.518750 Gb/s
FC11317 11.3170 Gb/s
16GFC MM r6.1 14.025 Gb/s
16GFC SM r6.1 14.025 Gb/s
32GFC 28.05 Gb/s
Fibre Channel Electrical
FC133 132.81 Mb/s
FC266 265.6 Mb/s
FC531 531.2 Mb/s
FC1063 1.0625 Gb/s
FC2125E 2.125 Gb/s: Abs, Beta, Tx/Rx; Abs, Gamma, Tx/Rx
FC4250E 4.250 Gb/s: Abs, Beta, Tx/Rx; Abs, Gamma, Tx/Rx
FC8500E 8.500 Gb/s: Abs, Beta, Tx/Rx; Abs, Gamma, Tx/Rx
SATA
G1 1.500 Gb/s Tx, Rx
G2 3.000 Gb/s Tx, Rx
G3 6.000 Gb/s Tx, Rx
www.tektronix.com 17
Datasheet
Display system
Touch Screen Display
264 mm / 10.4 in. diagonal, color, LCD
Colors
16,777,216 (24 bits)
Video Resolution
1024 horizontal by 768 vertical displayed pixels
Magnification Views
In addition to the main time base, the DSA8300 supports two magnification views. These magnifications are independently
acquired using separate time-base settings which allow same or faster time/div than that of the main time base
Input output ports
Front Panel
USB 2.0 Port(s)
One USB 2.0 connector (instruments shipped after 12/2012 have 3 USB ports on the front panel)
Anti-static Connection
Banana-jack connector, 1 MΩ
Trigger Direct Input
See Trigger System specification
Clock Input / Prescale Trigger
See Trigger System specification
TDR Clock Output
See Trigger System specification
DC Calibration Output
±1.25 V maximum
Rear Panel
USB Ports
4 USB 2.0 connectors
LAN Port
RJ-45 connector, supports 10/100/1000BASE-T
Serial Ports
DB-9 COM1, COM2 ports
GPIB
IEEE488.2 connector
DVI-I Video Port
DVI connector, female
Connect to show the oscilloscope display, including live waveforms on an external monitor or projector. The primary Windows
desktop can also be displayed on an external monitor using these ports.
Alternatively, the DVI-I port can be configured to show the secondary Windows desktop (also called extended desktop or dualmonitor display).
DVI to VGA 15-pin D-sub connector adapter provided
PS2 Serial Ports
Mouse and keyboard inputs
Audio Ports
1/8 in. microphone input and line output
Data storage
Waveform Databases
4 independently accumulated waveform records of up to 4M waveform points each. Variable waveform database mode with true
first-in/first-out of up to 2000 waveforms available on each of 4 waveform databases (2M samples maximum / waveform database)
Hard Disk Drive
Rear-panel, removable hard disk drive, 500 GB capacity
Optical Drive
Front-panel DVD Read Only / CD Read-Write drive with CD-creation software application
Nonvolitile storage
USB 2.0 flash memory
18 www.tektronix.com
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Power source
Line voltage and frequency
90 V to 250 V
50 Hz to 400 Hz
Power Consumption
205 W, typical, mainframe only
330 W, typical, fully loaded
600 W, maximum
Physical characteristics
Dimensions
mm
Inches
Width
475
18.0
Height
343
13.5
Depth
419
16.5
kg
lb
21
46
Weight
EMC, environment and safety
Temperature
Operating
+10 to +40 °C
Nonoperating
–22 to +60 °C
Altitude
Operating
3,048 m (10,000 ft.)
Nonoperating
12,190 m (40,000 ft.)
Relative Humidity
Operating (CD-ROM not
installed)
20% to 80% at or below 40 °C (upper limit de-rates to 45% relative humidity at 40 °C)
Electromagnetic compatibility
2004/108/EC
Safety
UL3111-1, CSA1010.1, EN61010-1, IEC61010-1
www.tektronix.com 19
Datasheet
Ordering information
Models
DSA8300
Digital Serial Analyzer Sampling Oscilloscope
Standard accessories
071-2897-XX
DSA8300 Digital Serial Analyzer Quick Start User Manual
119-7083-00
Keyboard
19-7054-00
Mouse
200-4519-00
Instrument front cover
016-1441-00
Accessory pouch
19-6107-00
Touch screen styluses (2)
006-3415-04
ESD wrist strap with 6 foot coiled cord
020-3082-XX
DSA8300 Product Documentation Kit (CD)
Not orderable
DSA8300 Online Help (part of application software)
Not orderable
DSA8300 Programmer Online Manual (part of application software)
020-3088-XX
DSA8300 TekScope Product Software Install Kit
Type dependent on selection
during order placement
Power cord
013-0347-00
VGA female to DVI male adapter
Instrument options
Options
ADVTRG
Add advanced triggers with pattern sync
CEI-VSR
OIF CEI 3.0 Compliance Solution for DSA8300
ICMX
IConnect® and MeasureXtractor Signal Integrity and Failure Analysis Software
ICON
IConnect® Signal Integrity and Failure Analysis Software
JARB
Add 80SJARB (included with Option JNB or JNB01)
JNB
Add 80SJNB Essentials
JNB01
Add 80SJNB Advanced
SPAR
IConnect® S-parameters Software
20 www.tektronix.com
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Power plug options
Opt. A0
North America power plug (115 V, 60 Hz)
Opt. A1
Universal Euro power plug (220 V, 50 Hz)
Opt. A2
United Kingdom power plug (240 V, 50 Hz)
Opt. A3
Australia power plug (240 V, 50 Hz)
Opt. A4
North America power plug (240 V, 50 Hz)
Opt. A5
Switzerland power plug (220 V, 50 Hz)
Opt. A6
Japan power plug (100 V, 110/120 V, 60 Hz)
Opt. A10
China power plug (50 Hz)
Opt. A11
India power plug (50 Hz)
Opt. A12
Brazil power plug (60 Hz)
Opt. A99
No power cord
Language options
Opt. L0
English manual
Opt. L7
Simplified Chinese manual
Opt. L8
Traditional Chinese manual
Opt. L10
Russian manual
Language options include translated front-panel overlay for the selected language(s).
Service options
Opt. C3
Calibration Service 3 Years
Opt. C5
Calibration Service 5 Years
Opt. CA1
Single Calibration or Functional Verification
Opt. D1
Calibration Data Report
Opt. D3
Calibration Data Report 3 Years (with Opt. C3)
Opt. D5
Calibration Data Report 5 Years (with Opt. C5)
Opt. IF
Upgrade Installation Service
Opt. R3
Repair Service 3 Years (including warranty)
Opt. R5
Repair Service 5 Years (including warranty)
Probes and accessories are not covered by the oscilloscope warranty and Service Offerings. Refer to the datasheet of each probe and accessory model for its unique warranty
and calibration terms.
www.tektronix.com 21
Datasheet
DSA83UP - DSA8300 upgrade kit
ADVTRIG
Add advanced triggers with pattern sync
HDD8
Additional hard disk drive complete with assembled mounting bracket, operating system, and oscilloscope application
JARB
Add 80SJARB (included with Option JNB or JNB01)
JNB
Add 80SJNB Essentials
JNB01
Add 80SJNB Advanced
ADDJNB01
Upgrade 80SJNB Essentials to 80SJNB01 Advanced
CEI-VSR
OIF CEI 3.0 Compliance Solution for DSA8300
DSA8300 Rack Mount
016-1791-02
DSA8300 Rack Mount Kit
Optional Accessories
Optical modules
Optical modules plug directly into large slot of DSA8300 sampling oscilloscope mainframe. See the “Optical Sampling Modules – 80C07B • 80C08D • 80C10C • 80C11B •
80C12B • 80C14 • 80C15” datasheet for more details.
All optical modules have FC/PC connectors installed. Other connector adapters available as options are: ST/PC, D4/PC, Biconic, SMA 2.5, SC/PC, DIN/PC, HP/PC, SMA,
DIAMOND 3.5.
80C07B
2.5 GHz single-mode and multi-mode, amplified (750 to 1650 nm) optical module for multirate datacom and telecom applications
w/ optional integrated clock recovery
80C08D
9 GHz optical channel; single-mode and multi-mode, amplified (750 to 1650 nm) optical module optimized for 8.5 to 12.5 Gb/s
applications with optional integrated clock recovery
80C10C
55/70/80 GHz; single-mode (1290 to 1330 nm and 1520 to 1620 nm) optical module with reference receiver filters for multirate
datacom and telecom 40 Gb/s and 100 Gb/s (4 × 25 Gb/s) applications with optional calibrated trigger pick-off for use with external
clock recovery instruments (such as the CR286A)
80C11B
30 GHz, single-mode (100 to 1650 nm) optical module with reference receiver filters for 8.5 to 14.1 Gb/s telecom and datacom
standards. Optional, integrated clock recovery for 8.5 to 12.6 Gb/s applications
80C12B
12 GHz optical channel; single-mode and multi-mode, amplified (750 to 1650 nm) optical module with optical reference receivers
to support 155 Mb/s to 12.5 Gb/s applications with calibrated trigger pick-off for use with external clock recovery instruments (such
as the 80A05 or CR125A)
80C14
12 GHz optical channel; single-mode and multi-mode, amplified (750 to 1650 nm) optical module optimized for 8.5 to 12.5 Gb/s
applications with calibrated trigger pick-off for use with external clock recovery instruments (such as the CR175A or CR286A)
80C15
32 GHz, single-mode and multi-mode optical module with bandwidth filters for multirate datacom and telecom 25 and 100 (4x25)
Gb/s applications.
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DSA8300 Digital Serial Analyzer Sampling Oscilloscope
Electrical modules
Electrical modules plug directly into one of four small slots of the DSA8300 sampling oscilloscope mainframe. See the “Electrical Sampling Modules – 80E11 • 80E11X1 •
80E10B • 80E09B • 80E08B • 80E07B • 80E04 • 80E03 • 80E01” datasheet for more details.
80E11
70/60/40
80E11X1
70/60/40 17 GHz electrical sampler, single channel
80E10B
Remote 18 Sampling Module – 50/40/30 17 GHz electrical, dual-channel with true-differential TDR capabilities
80E09B
Remote 18 Sampling Module – 60/40/30 17 GHz electrical, dual-channel
80E08B
Remote 18 Sampling Module – 30/20 17 GHz electrical, dual-channel with true-differential TDR capabilities
80E07B
Remote 18 Sampling Module – 30/20 17 GHz electrical, dual-channel
80E04
20 GHz electrical sampler, dual-channel with true-differential TDR capabilities. For remote sampling use the 80X01 or 80X02
Electrical Sampling Module Extender Cables
80E03
20 GHz electrical sampler, dual-channel. For remote sampling use the 80X01 or 80X02 Electrical Sampling Module Extender
Cables
80E01
50 GHz, single-channel electrical sampler. For remote sampling use the 80X01 or 80X02 Electrical Sampling Module Extender
Cables
17
GHz electrical sampler, dual channel
Phase reference module
The 82A04B Phase Reference module, when installed in the DSA8300 and provided with a clock synchronous with the data to be acquired, provides a very low-jitter time base
for acquiring signals from the device under test. It can accommodate clocks from 2 GHz 19 to >60 GHz.
82A04B
Phase Reference Module – Standard module supports clocks up to 32 GHz. With Option 60G it supports clocks to >60 GHz
Clock recovery module/instrument
80A05
Electrical Clock Recovery module. Applicable to electrical signals and for the 80C12B.
The standard version of 80A05 supports signals in the following ranges:
50 Mb/s - 2.700 Gb/s
2.700 Gb/s - 3.188 Gb/s
4.250 Gb/s (4 Gigabit Fibre Channel)
Option 10G adds the ranges of:
3.267 Gb/s - 4.250 Gb/s
4.900 Gb/s - 6.375 Gb/s
9.800 Gb/s - 12.60 Gb/s
CR125A
Electrical Clock Recovery instrument. CR125A recovers clocks from serial data streams for all of the most common electrical
standards in the continuous 100 Mb/s to 12.5 Gb/s range. Applicable to electrical signals and for 80C12B
CR175A
Electrical Clock Recovery instrument. CR175A recovers clocks from serial data streams for all of the most common electrical
standards in the continuous 100 Mb/s to 17.5 Gb/s range. Applicable to electrical signals and for 80C12B and 80C14
CR286A
Electrical Clock Recovery instrument. CR286A recovers clocks from serial data streams for all of the most common electrical
standards in the continuous 100 Mb/s to 28.6 Gb/s range. Applicable to electrical signals and for 80C12B, 80C14, and 80C10B/
80C10C (for rates up to 28.6 Gb/s)
17
18
User-selectable bandwidth.
Each remote sampler/TDR generator is on a separate 2-meter remote cable for easy co-location with the device under test and best acquired signal fidelity.
19
For clock frequencies <8 GHz, it may be necessary to filter the clock input to eliminate harmonics from the clock signal (see Other Accessories 020-2566-xx, 020-2567-xx, and 020-2568-xx).
www.tektronix.com 23
Datasheet
Product bundle for 10-28 Gb/s applications
80B28G
Product bundle which includes one each of the following products: 80E09B Electrical Sampling Module; 82A04B Phase Reference
Module; CR286A 28.6 GHz Clock Recovery instrument; 80X01: 1-meter sampling module extender cable; and 80A08 28 Gb/s
Measurements Accessory Kit.
Recommended Accessories
80A02
EOS/ESD protection module for electrical static isolation of electrical sampling modules
80A03
TEKConnect probe interface module
80A08
Accessory kit for electrical measurements up to 28 Gb/s
80X01
1-meter electrical sampling module extender cable
80X02
2-meter electrical sampling module extender cable
Interconnect cables (3rd party)
Tektronix recommends using quality high-performance interconnect cables with these high-bandwidth products to minimize measurement degradation and variations. The W.L.
Gore and Associates' cable assemblies in teh following table are compatible with the 2.92 mm, 2.4 mm, and 1.85 mm connector interface of the 80E00 modules.
Assemblies can be ordered by contacting Gore by phone at (800) 356-4622, or on the Web at www.gore.com/tektronix
Frequency
Connectors
Length
TEK40PF18PP
40 GHz
2.92 mm male
18.0 in.
TEK50PF18PP
50 GHz
2.4 mm male
18.0 in.
TEK65PF18PP
65 GHz
1.85 mm male
18.0 in.
Cable
Bench top test cable assemblies
High-frequency interconnect cables for electrical sampling modules
TEK40HF06PP
40 GHz
2.92 mm male
6.0 in.
TEK40HF06PS
40 GHz
2.92 mm male
2.92 mm female
6.0 in.
TEK50HF06PP
50 GHz
2.4 mm male
6.0 in.
TEK50HF06PS
50 GHz
2.4 mm male
2.4 mm female
6.0 in.
TEK65HF06PP
65 GHz
1.85 mm male
6.0 in.
TEK65HF06PS
65 GHz
1.85 mm male
1.85 mm female
6.0 in.
Calibration kits and accessories (3rd party)
For best S-parameter measurement results with the 80E10B, 80E08B, and 80E04 electrical TDR modules and IConnect® software, we recommend precision calibration kits,
adapter kits, connector savers, airlines, torque wrenches, and connector gauges from Maury Microwave.
These components are compatible with the 2.92 mm, 2.4 mm, and 1.85 mm connectors of the 80E00 modules. Contact Maury Microwave (www.maurymw.com/tektronix.htm)
to order calibration kits and other components.
Tektronix is registered to ISO 9001 and ISO 14001 by SRI Quality System Registrar.
24 www.tektronix.com
DSA8300 Digital Serial Analyzer Sampling Oscilloscope
www.tektronix.com 25
Datasheet
ASEAN / Australasia (65) 6356 3900
Belgium 00800 2255 4835*
Central East Europe and the Baltics +41 52 675 3777
Finland +41 52 675 3777
Hong Kong 400 820 5835
Japan 81 (3) 6714 3010
Middle East, Asia, and North Africa +41 52 675 3777
People's Republic of China 400 820 5835
Republic of Korea 001 800 8255 2835
Spain 00800 2255 4835*
Taiwan 886 (2) 2722 9622
* European toll-free number. If not accessible, call: +41 52 675 3777
Austria 00800 2255 4835*
Brazil +55 (11) 3759 7627
Central Europe & Greece +41 52 675 3777
France 00800 2255 4835*
India 000 800 650 1835
Luxembourg +41 52 675 3777
The Netherlands 00800 2255 4835*
Poland +41 52 675 3777
Russia & CIS +7 (495) 6647564
Sweden 00800 2255 4835*
United Kingdom & Ireland 00800 2255 4835*
Balkans, Israel, South Africa and other ISE Countries +41 52 675 3777
Canada 1 800 833 9200
Denmark +45 80 88 1401
Germany 00800 2255 4835*
Italy 00800 2255 4835*
Mexico, Central/South America & Caribbean 52 (55) 56 04 50 90
Norway 800 16098
Portugal 80 08 12370
South Africa +41 52 675 3777
Switzerland 00800 2255 4835*
USA 1 800 833 9200
Updated 10 April 2013
For Further Information. Tektronix maintains a comprehensive, constantly expanding collection of application notes, technical briefs and other resources to help engineers working on the cutting edge of technology. Please visit www.tektronix.com.
Copyright © Tektronix, Inc. All rights reserved. Tektronix products are covered by U.S. and foreign patents, issued and pending. Information in this publication supersedes that in all previously published material. Specification and
price change privileges reserved. TEKTRONIX and TEK are registered trademarks of Tektronix, Inc. All other trade names referenced are the service marks, trademarks, or registered trademarks of their respective companies.
11 Nov 2013
www.tektronix.com
85W-26988-10