Semtech E4257ALPT Dual channel per-pin parametric measurement unit Datasheet

E4237/E4257/E4287
Dual Channel Per-Pin
Parametric Measurement Unit
TEST AND MEASUREMENT PRODUCTS
Description
The E42X7 is designed to be a low power, low cost, small
footprint solution to allow high pin count testers to support
a PMU per-pin.
E42X7 is a family of Dual Channel Parametric Measurement Units (PMU) designed for automated test equipment and instrumentation. Manufactured in a wide voltage Bi-CMOS process, it is a monolithic solution for a
per-pin PMU.
Features
The E42X7 family consists of three products:
• Four Quadrant Operation (FV/MI, FV/MV, FI/MV, FI/MI)
• 4 Current Ranges (± 40 µA, ± 400 µA, ± 4 mA,
± 40 mA) (E4287, E4257)
• 2 Current Ranges (± 40 µA and ± 4 mA) (E4237)
• Wide Output Voltage Range
– –3.25V to +13V @ RF pin across all ranges
– –3.25V to ± 13V @ FORCE Pin (Ranges A, B, C)
– –1.25V to +11V @ FORCE (Range D)
• Low Power Dissipation
• FV Linearity to ± 0.025% FSVR
• Extremely Fast Settling Times offer reduced test
times/increased tester thru-put.
• Central PMU Switches for External PMU,
–4.75 V to +14.5V, ± 40 mA Ranges
• Switches for Pin Driver Super Voltages
• Driven Guard Output (E4287)
• Test Head Ground Reference
• Stable with up to 300 pF Capacitive Loading with no
external compensation capacitors
• Switchable Compensation allows stability with up to
10 nF Capacitive Loading
• 14x14 mm, 80 Pin MQFP Package (E4287)
• Small, 9x9 mm, 64-Pad LPCC Package (E4237,
E4257)
E4287
• 16.25V I/O range
• 4 current ranges up to ± 40 mA
• Analog mux for providing a FLASHTM
programming level
• Driven guard pin
E4257
• 16.25V I/O range
• 4 Current ranges up to ± 40 mA
• Small 9mm x 9mm footprint
E4237
• 16.25VI/O range
• 2 current ranges up to ± 4 mA
• Low capacitance for use in relayless tester
architectures
Every member of the E42X7 family can drive capacitive
loads of up to 300 pF with no external compensation
components. A user selectable FORCE amplifier
compensation switch allows users to add compensation
components for stability with larger capacitive loads.
Integrated voltage clamp circuitry provides a method for
clamping DUT (Device Under Test) compliance voltage and
protecting the DUT from damage.
Applications
Each channel of the E42X7 also features an on-board
window comparator that can be used to determine if a
measurement value is within a user defined range for go/
no-go testing.
• Automated Test Equipment
– Memory Testers
– Logic Testers
– Mixed Signal Testers
– SOC Testers
• Instrumentation
Also included with the E42X7 are a number of integrated
switches that allow the connection of a central “system”
PMU to the E42X7 FORCE and SENSE pins and allow the
E42X7 to provide “pull-up” or “pull-down” resistors and
termination voltages for DUTs with open element outputs.
Revision 5 / November 30, 2005
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Functional Block Diagram
VA
1K
Channel 0
VAOUT
E4287
1K
700
SELC
VC
1K
VBOUT
VB
1K
700
HiZ
HLV
LLV
SELCOMP
LIMIT
VINP
REXT (1 OF 4)
(1 OF 2)
RF
E4287, 4257
E4237
FORCE
DUT
SENSE
GUARD
IVMAX
IVMIN
E4287
DUTNH
COMPARE
DUTNL
EPMUF
IVMON
DUT GND
EPMUS
Channel 1
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4287 PIN Description
[0] refers to Channel 0, [1] refers to Channel 1
Pin Name
Pin #
Description
VINP[0:1]
50, 11
Analog voltage input which programs the output voltage or current of the PMU.
FORCE[0:1]
SENSE[0:1]
GUARD[0:1]
59, 2
58, 3
52, 9
Analog output pin which forces current or voltage.
Analog input pin which senses voltage.
Driven guard output.
DUTGND
66
FV/FI*[0:1],
MI/MV*[0:1]
37, 24
36, 25
RS0, RS1[0:1]
45, 16, 46, 15
RF, RA, RB,
RC, RD[0:1]
57, 4, 53, 8, 54,
7, 55, 6, 56, 5
IVMIN[0:1]
IVMAX[0:1]
63, 78
62, 79
Analog input voltages which establish the lower and upper threshold level for the
measurement comparator.
DUTNH[0:1]
DUTNL[0:1]
42, 19
39, 22
Digital comparator outputs that indicate the DUT measurement is less than the upper
threshold (not high) and greater than the lower threshold (not low).
IVMON
75
Analog voltage output that provides a real time monitor of either the measured voltage
or measured current level for the selected channel.
DISMON[0:1]
35, 26
Digital input which disables IVMON output.
HLV[0:1],
LLV[0:1]
64, 77
65, 76
Analog input voltage that establishes the upper voltage clamp level.
Analog input voltage that establishes the lower voltage clamp level.
HIZ[0:1]
38, 23
Digital input which places the FORCE output into high impedance.
COMP1[0:1],
COMP2[0:1]
51, 10
49, 12
Compensation pins that require an external capacitor connected between COMP1
and COMP2.
SELCOMP[0:1]
34, 27
Digital input selects an internal or external compensation capacitor.
PMU
 2005 Semtech Corp. / Rev. 5, 11/30/05
Device Under Test (DUT) ground reference input to both channels.
Digital inputs which determine whether the PMU is forcing voltage or forcing current,
measuring current or measuring voltage.
Digital inputs which select one of the four current ranges.
Pins to resistors corresponding to ranges A through D. RF common pin to the resistors.
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4287 PIN Description (continued)
[0] refers to Channel 0, [1] refers to Channel 1
Pin Name
Pin #
Description
External PMU
EPMUF
70
External PMU force input to both channels.
EPMUS
71
External PMU sense input to both channels.
SELIPMU[0:1]
44, 17
Digital input that switches internal PMU to FORCE/SENSE.
SELEPMU[0:1]
43, 18
Digital input that switches external PMU to FORCE/SENSE.
VA[0:1]
31, 30
Voltage A switch analog input.
VAOUT[0:1]
69, 72
Voltage A output.
VB[0:1]
32, 29
Voltage B switch analog input.
VBOUT[0:1]
68, 73
Voltage B output.
VC[0:1]
33, 28
Voltage C switch analog input.
SELC[0:1]
47, 14
Digital inputs to select C switches.
VCC[0:1]
60, 61, 1, 80
PMU positive analog power supply.
SVCC
74
VEE[0:1]
40, 41, 20, 21
AGND
67
Analog ground to both channels.
VDD
13
Positive digital power supply to both channels.
DGND
48
Digital ground to both channels.
Analog MUX
Power Supplies
 2005 Semtech Corp. / Rev. 5, 11/30/05
Switch positive analog power supply to both channels.
Negative analog power supply.
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4287 PIN Description (continued)
VCC[1]
IVMAX[1]
IVMIN[1]
HLV[1]
LLV[1]
IVMON
SVCC
VBOUT[1]
VAOUT[1]
EPMUS
EPMUF
VAOUT[0]
VBOUT[0]
AGND
DUTGND
LLV[0]
HLV[0]
IVMIN[0]
IVMAX[0]
VCC[0]
80
79
78
77
76
75
74
73
72
71
70
69
68
67
66
65
64
63
62
61
80 Pin INT_TEP_MQFP Package
(w/Internal Heat Spreader)
14mm x 14mm X 2.0mm
VCC[1]
1
60
VCC[0]
FORCE[1]
2
59
FORCE[0]
SENSE[1]
3
58
SENSE[0]
RF[1]
4
57
RF[0]
RD[1]
5
56
RD[0]
RC[1]
6
55
RC[0]
RB[1]
7
54
RB[0]
RA[1]
8
53
RA[0]
GUARD[1]
9
52
GUARD[0]
COMP1[1]
10
51
COMP1[0]
50
VINP[0]
49
COMP2[0]
E4287AHF
VINP[1]
11
COMP2[1]
12
VDD
13
48
DGND
SELC[1]
14
47
SELC[0]
RS1[1]
15
46
RS1[0]
(Top View)
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34
35
36
37
VB[0]
VC[0]
SELCOMP[0]
DISMON[0]
MI/MV*[0]
FV/FI*[0]
40
32
VA[0]
VEE[0]
31
VA[1]
39
30
HIZ[0]
29
VB[1]
DUTNL[0]
28
VC[1]
5
38
27
SELCOMP[1]
VEE[0]
26
DUTNH[0]
41
MI/MV*[1]
42
20
DISMON[1]
19
VEE[1]
25
DUTNH[1]
24
SELEPMU[0]
FV/FI*[1]
43
23
18
HIZ[1]
SELIPMU[0]
SELEPMU[1]
DUTNL[1]
RS0[0]
44
22
45
17
21
16
VEE[1]
RS0[1]
SELIPMU[1]
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4257 PIN Description
[0] refers to Channel 0, [1] refers to Channel 1
Pad Name
Pad #
Description
VINP[0:1]
9, 40
Analog voltage input which programs the output "FORCE" voltage or current.
FORCE[0:1]
SENSE[0:1]
1, 48
2, 47
Analog output pin which forces current or voltage.
Analog input pin which senses voltage.
DUTGND
59
FV/FI*[0:1]
MI/MV*[0:1]
20, 29
21, 28
Digital inputs which determine whether the PMU is forcing voltage or current.
RS0[0:1]
RS1[0:1]
13, 36
12, 37
Digital inputs that select one of four current ranges.
RA RB, RC,
RD, RF[0:1]
7, 6, 5, 4, 3, 42,
43, 44, 45, 46
IVMIN[0:1]
IVMAX[0:1]
62, 51
63, 50
Analog input voltages which establish the lower and upper threshold level for the
measurement comparator.
DUTNH[0:1]
DUTNL[0:1]
16, 33
18, 31
Digital outputs that indicate the DUT measurement is less than the upper threshold
(not high) and greater than the lower threshold (not low).
IVMON
54
DISMON[0:1]
22, 27
Digital input which disables IVMON output.
HLV[0:1]
LLV[0:1]
61, 52
60, 53
Analog voltage input that establishes the upper voltage clamp level.
Analog voltage input that establishes the lower voltage clamp level.
HIZ[0:1]
19, 30
Digital input which places the FORCE output into high impedance.
COMP1[0:1],
COMP2[0:1]
8, 41
10, 39
Compensation pins that require an external capacitor connected between COMP1
and COMP2.
SELCOMP[0:1]
23, 26
Digital input selects an internal or external compensation capacitor.
Internal PMU
Device Under Test (DUT) ground reference input to both channels.
Pins to resistors corresponding to ranges A through D. RF common pin to the
resistors.
Analog voltage output that provides a real time monitor of either the measured
voltage or measured current level for the selected channel.
External PMU
EPMUF
57
External PMU force input to both channels.
EPMUS
56
External PMU sense input to both channels.
SELIPMU[0:1]
14, 35
Digital input that switches internal PMU to FORCE/SENSE.
SELEPMU[0:1]
15, 34
Digital input that switches external PMU to FORCE/SENSE.
VCC[0:1]
64, 49
PTU positive analog power supply.
SVCC
55
VEE[0:1]
17, 32
AGND
58
Analog ground.
VDD
38
Positive digital power supply.
DGND
11
Digital ground.
24
25
Connected to Cathode of the thermal diode string.
Connected to Anode of the thermal diode string.
Power Supplies
Switch positive analog power supply.
Negative analog power supply.
Thermal Diode
String
VC0
VC1
 2005 Semtech Corp. / Rev. 5, 11/30/05
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4257 PIN Description (continued)
VCC[1]
IVMAX[1]
IVMIN[1]
HLV[1]
LLV[1]
IVMON
SVCC
EPMUS
EPMUF
AGND
DUTGND
LLV[0]
HLV[0]
IVMIN[0]
IVMAX[0]
VCC[0]
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
64-Pad LPCC 9mmx 9mm
FORCE[1]
48
1
FORCE[0]
SENSE[1]
47
2
SENSE[0]
RF[1]
46
3
RF[0]
RD[1]
45
4
RD[0]
RC[1]
44
5
RC[0]
RB[1]
43
6
RB[0]
RA[1]
42
7
RA[0]
COMP1[1]
41
8
COMP1[0]
VINP[1]
40
9
VINP[0]
COMP2[1]
39
10
COMP2[0]
VDD
38
11
DGND
RS1[1]
37
12
RS1[0]
RS0[1]
36
13
RS0[0]
SELIPMU[1]
35
14
SELIPMU[0]
SELEPMU[1]
34
15
SELEPMU[0]
DUTNH[1]
33
16
DUTNH[0]
E4257ALP
Bottom View
SVCC
IVMON
LLV[1]
HLV[1]
IVMIN[1]
IVMAX[1]
VCC[1]
55
54
53
52
51
50
49
VEE[0] 17
EPMUS
56
DUTNL[0] 18
EPMUF
57
HIZ[0] 19
VC0 24
AGND
58
FV/FI*[0] 20
VC1 25
DUTGND
59
MI/MV*[0] 21
DISMON[1] 27
LLV[0]
60
DISMON[0] 22
MI/MV*[1] 28
HLV[0]
61
SELCOMP[0] 23
FV/FI*[1] 29
IVMIN[0]
62
SELCOMP[1] 26
HIZ[1] 30
IVMAX[0]
63
VEE[1] 32
DUTNL[1] 31
VCC[0]
64
EXPOSED THERMAL PAD
(Connect to VEE)
FORCE[0]
1
48
FORCE[1]
SENSE[0]
2
47
SENSE[1]
RF[0]
3
46
RF[1]
RD[0]
4
45
RD[1]
RC[0]
5
44
RC[1]
RB[0]
6
43
RB[1]
RA[0]
7
42
RA[1]
COMP1[0]
8
41
COMP1[1]
VINP[0]
9
40
VINP[1]
COMP2[0]
10
39
COMP2[1]
DGND
11
38
VDD
RS1[0]
12
37
RS1[1]
RS0[0]
13
36
RS0[1]
SELIPMU[0]
14
35
SELIPMU[1]
SELEPMU[0]
15
34
SELEPMU[1]
DUTNH[0]
16
33
DUTNH[1]
 2005 Semtech Corp. / Rev. 5, 11/30/05
E4257ALP
17
18
19
20
21
22
23
24
25
26
27
28
29
30
31
32
VEE[0]
DUTNL[0]
HIZ[0]
FV/FI*[0]
MI/MV*[0]
DISMON[0]
SELCOMP[0]
VC0
VC1
SELCOMP[1]
DISMON[1]
MI/MV*[1]
FV/FI*[1]
HIZ[1]
DUTNL[1]
VEE[1]
Top View
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4237 PIN Description
Pad Name
Pad #
Description
VINP[0:1]
9, 40
Analog voltage input which programs the output "FORCE" voltage or current.
FORCE[0:1]
SENSE[0:1]
1, 48
2, 47
Analog output pin which forces current or voltage.
Analog input pin which senses voltage.
DUTGND
59
FV/FI*[0:1]
MI/MV*[0:1]
20, 29
21, 28
RS[0:1]
13, 36, 12, 37
RA, RC, RF[0:1]
7, 5, 3, 42, 44, 46
IVMIN[0:1]
IVMAX[0:1]
62, 51
63, 50
Analog input voltages which establish the lower and upper threshold level for the
measurement comparator.
DUTNH[0:1]
DUTNL[0:1]
16, 33
18, 31
Digital outputs that indicate the DUT measurement is less than the upper threshold
(not high) and greater than the lower threshold (not low).
IVMON
54
DISMON[0:1]
22, 27
Digital input which disables IVMON output.
HLV[0:1]
LLV[0:1]
61, 52
60, 53
Analog voltage input that establishes the upper voltage clamp level.
Analog voltage input that establishes the lower voltage clamp level.
HIZ[0:1]
19, 30
Digital input which places the FORCE output into high impedance.
COMP1[0:1],
COMP2[0:1]
8, 41
10, 39
Compensation pins that require an external capacitor connected between COMP1
and COMP2.
SELCOMP[0:1]
23, 26
Digital input selects an internal or external compensation capacitor.
Internal PMU
Device Under Test (DUT) ground reference input to both channels.
Digital inputs which determine whether the PMU is forcing voltage or current.
Digital inputs that select one of two current ranges (connect together externally).
Pins to resistors corresponding to ranges A and C. RF common pin to the resistors.
Analog voltage output that provides a real time monitor of either the measured
voltage or measured current level for the selected channel.
External PMU
EPMUF
57
External PMU force input to both channels.
EPMUS
56
External PMU sense input to both channels.
SELIPMU[0:1]
14, 35
Digital input that switches internal PMU to FORCE/SENSE.
SELEPMU[0:1]
15, 34
Digital input that switches external PMU to FORCE/SENSE.
VCC[0:1]
64, 49
PTU positive analog power supply.
SVCC
55
VEE[0:1]
17, 32
AGND
58
Analog ground.
VDD
38
Positive digital power supply.
DGND
11
Digital ground.
VC0
VC1
24
25
Connected to Cathode of the thermal diode string.
Connected to Anode of the thermal diode string.
N/C
4, 6, 43, 45
Power Supplies
Switch positive analog power supply.
Negative analog power supply.
Thermal Diode
String
 2005 Semtech Corp. / Rev. 5, 11/30/05
Not connected.
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4237 PIN Description (continued)
VCC[1]
IVMAX[1]
IVMIN[1]
HLV[1]
LLV[1]
IVMON
SVCC
EPMUS
EPMUF
AGND
DUTGND
LLV[0]
HLV[0]
IVMIN[0]
IVMAX[0]
VCC[0]
49
50
51
52
53
54
55
56
57
58
59
60
61
62
63
64
64-Pad LPCC 9mmx 9mm
FORCE[1]
48
1
FORCE[0]
SENSE[1]
47
2
SENSE[0]
RF[1]
46
3
RF[0]
N/C
45
4
N/C
RC[1]
44
5
RC[0]
N/C
43
6
N/C
RA[1]
42
7
RA[0]
COMP1[1]
41
8
COMP1[0]
VINP[1]
40
9
VINP[0]
COMP2[1]
39
10
COMP2[0]
VDD
38
11
DGND
RS[1]
37
12
RS[0]
RS[1]
36
13
RS[0]
SELIPMU[1]
35
14
SELIPMU[0]
SELEPMU[1]
34
15
SELEPMU[0]
DUTNH[1]
33
16
DUTNH[0]
E4237ALP
Bottom View
IVMAX[1]
VCC[1]
50
49
VEE[0] 17
IVMIN[1]
51
DUTNL[0] 18
HLV[1]
52
HIZ[0] 19
LLV[1]
53
FV/FI*[0] 20
IVMON
54
MI/MV*[0] 21
SVCC
55
DISMON[0] 22
EPMUS
56
SELCOMP[0] 23
EPMUF
57
VC0 24
AGND
58
VC1 25
DUTGND
59
SELCOMP[1] 26
LLV[0]
60
DISMON[1] 27
HLV[0]
61
MI/MV*[1] 28
IVMIN[0]
62
FV/FI*[1] 29
HIZ[1] 30
IVMAX[0]
63
VEE[1] 32
DUTNL[1] 31
VCC[0]
64
EXPOSED THERMAL PAD
(Connect to VEE)
FORCE[0]
1
48
FORCE[1]
SENSE[0]
2
47
SENSE[1]
RF[0]
3
46
RF[1]
N/C
4
45
N/C
RC[0]
5
44
RC[1]
N/C
6
43
N/C
RA[0]
7
42
RA[1]
COMP1[0]
8
41
COMP1[1]
E4237ALP
Top View
 2005 Semtech Corp. / Rev. 5, 11/30/05
28
29
30
31
32
MI/MV*[1]
FV/FI*[1]
HIZ[1]
DUTNL[1]
VEE[1]
DUTNH[1]
27
33
DISMON[1]
16
26
SELEPMU[1]
DUTNH[0]
SELCOMP[1]
34
25
15
VC1
SELIPMU[1]
SELEPMU[0]
24
35
VC0
14
23
RS[1]
SELIPMU[0]
SELCOMP[0]
36
22
13
DISMON[0]
RS[1]
RS[0]
21
37
MI/MV*[0]
12
20
VDD
RS[0]
FV/FI*[0]
38
19
11
HIZ[0]
COMP2[1]
DGND
DUTNL[0]
VINP[1]
39
18
40
17
9
10
VEE[0]
VINP[0]
COMP2[0]
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description
Circuit Overview
E42X7 is a family of dual channel parametric test and
measurement units, each of which can:
• Force Voltage/Measure Current
• Force Current/Measure Voltage
• Force Voltage/Measure Voltage
• Force Current/Measure Current
Each PMU channel can force or measure voltage over a
16.25V range and force or measure current over four
distinct ranges:
E4257, E4287
± 40 µA
± 400 µA
± 4 mA
± 40 mA
E4237
± 40 µA
± 4 mA
Also included with the E42X7 are a number of integrated
switches that allow the device to be configured to:
• Connect a central “system” PMU to the
DUT through the FORCE and SENSE pins
of the E42X7.
• Provide a ~4.5KΩ pull-up resistor to the
programmed force voltage level, which
allows devices with unipolar open-element
outputs (i.e., open drain) to be tested without
providing a designated pull-up or pull-down
on a load board.
PPMU Functionality
The E42X7 also features integrated voltage clamp/overvoltage detection circuitry that provides over-voltage
protection to the DUT (Device Under Test) during normal
operation. Short-circuit protection circuitry protects the
E42X7 by limiting the maximum output current to a
specified value over the full-scale current for a particular
range. The E4287 features an integrated analog MUX
that is intended to be used to toggle the “driver high level”
supplied to a pin electronics driver between normal logic
levels and a super voltage level which is suitable for
programming devices that require a “third-level” such as
FLASHTM.
The E4287 also features a pin (per channel), GUARD,
which can be used to drive the guard traces of a FORCE/
SENSE pair. By surrounding FORCE and SENSE traces
with guard traces which connect to the GUARD pin, an
effective method to achieve minimal leakage can be
achieved.
The E42X7 also includes a test head ground (DUTGND)
referencing features which allow the force voltage function
to be referenced to a separate ground reference other
than the ground (GND) power used for the device.
The trapezoid in Figure 1 describes the V/I functionality of
the E42X7’s internal PMU when a DUT is connected to
the FORCE or RF pins (a functional schematic of the E42X7
can be viewed in Figure 2).
Output Voltage [V]
VCC – 2V
VCC – 4V
Output Current
+100% [% Full-Scale Range]
–100%
VEE + 4V
VEE + 2V
FORCE Pin, Range D (E4257, E4287)
FORCE Pin, Range C (E4237)
RF Pin, All Ranges
FORCE Pin, Ranges A,B,C (E4257, E4287)
Figure 1. PMU Functionality/Range at the
FORCE and RF Pins
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
1K
VA
VAOUT
E4287
1K
700
SELC
1K
VC
VBOUT
VB
1K
700
CCOMP
HLV
COMP1
LLV
COMP2
SELCOMP
HIZ
VOLTAGE OR
CURRENT LIMIT
VINP
FORCEAMP
10KΩ
REXT (1 of 4) (E4257, E4287)
(1 of 2) (E4237)
10KΩ
FI
LI
FV
LV
RF
40Ω for E4257, E4287
400Ω for E4237
FV/FI*
40
3KΩ
FORCE
1.5KΩ
SELEPMU
SELIPMU
MI/MV*
1K
SENSE
1K
1K
MI
1K
DUT
MV
GUARD
DISMON
E4287
1K
IVMAX
DUTNH
DUTNL
IVMIN
EPMUF
IVMON
DUTGND
EPMUS
Signals common to
both PMUs
NOTE: Switch impedance shown for typical values.
Figure 2. PMU Functionality/Range at the FORCE and RF Pins
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Control Inputs
All control inputs are CMOS compatible with characteristics
as defined in the “Digital Inputs” section of the specification
table.
FV/FI* is a digital input which determines whether the
PMU forces current or voltage, and MI/MV* is an Digital
input which determines whether the PMU measures current
or voltage. FV/FI* and MI/MV* are independent for each
channel.
SELCOMP is a digital input pin that is used to switch
external capacitance in parallel with the E42X7’s internal
compensation in order to stabilize the force amplifier (see
Figure 1) in situations where a large capacitive loading
condition exists on the FORCE pin (such as during system
calibration). SELCOMP functionality is illustrated in Table
3.
SELCOMP
Force Amplifier Compensation
0
Internal
1
Internal + CCOMP
HiZ is a digital input that is used to place the PMU’s force
amp into a high impedance state. Table 1 describes the
modes of operation related to these three input pins.
HiZ
FV/FI*
MI/MV*
1
X
X
High Impedance
0
0
0
Force Current, Measure Voltage
0
0
1
Force Current, Measure Current
0
1
0
Force Voltage, Measure Voltage
0
1
1
Force Voltage, Measure Current
Table 3.
Mode of Operation
SELIPMU is a digital input that is used to change the
connectivity of the FORCE/SENSE pair of each channel
such that the force amplifier’s output/feedback is routed
directly to the FORCE/SENSE pins or through an ~4.5KΩ
integrated pull-up resistance path. SELIPMU functionality
is described in Table 4.
Table 1.
RS0 and RS1 are digital inputs to an internal analog MUX
which selects an external resistor corresponding to a
desired current range. The truth table for RS0 and RS1,
along with the associated external resistor values and
current ranges, is shown in Table 2. RS0 and RS1 are
independent for each channel of the E4287 and E4257.
RS0 and RS1 for each channel should be connected
together externally on the E4237.
SELIPMU
Force Amplifier Connectivity
0
Force amplifier output can be connected to the
FORCE pin through ~4.5KΩ pull-up resistance if
FV/FI*=1 and HiZ=0 (see On-Chip Termination
Mode section)
1
FORCE amplifier output connected to the FORCE
pin through ~40Ω resistance (force amplifier
amplifier controls the FORCE/SENSE node)
Table 4. SELIPMU Functionality
RS0
RS1
Range
Current Range
(Max)
0
0
A
±40 µA
RA = 12.4KΩ
0
1
B
±400 µA
RB = 1.24KΩ
1
1
C
±4 mA
RC = 124Ω
1
0
D
±40 mA
RD = 12.4Ω
"Nominal" Ext. R
E4257, E4287
E4257, E4287
SELEPMU is a digital input that is used to connect an
external (system) PMU to FORCE/SENSE pins as may be
done during calibration of the device in a typical ATE
application. SELEPMU functionality is described below in
Table 5.
Table 2.
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
SELEPMU
External PMU Connectivity
DISMON
MI/MV*
[0]
[1]
[0]
[1]
0
0
X
X
High Impedance
1
1
X
X
High Impedance (both channels
cannot use IVMON at the same time)
0
1
1
X
Measured Current, Channel 0
0
1
0
X
Measured Voltage, Channel 0
1
0
X
1
Measured Current, Channel 1
1
0
X
0
Measured Voltage, Channel 1
IVMON
0
EPMUF and EPMUS pins are disconnected from
the FORCE and SENSE pins.
1
EPMUF is connected to FORCE through ~40Ω of
resistance, and EPMUS is connected to SENSE
through ~1KΩ of resistance.
Table 5. SELEPMU Functionality
SELC is a digital input pin that is used to control the analog
mux section of the E4287 and select between the normal
logic level used in an application and the super voltage
level so that the desired pin electronics driver levels are
channeled through the E4287 to the pin driver. SELC
functionality is described in Table 6.
Table 7. IVMON Functionality
FORCE/RF/SENSE
SELC
VAOUT
VBOUT
0
VA
VB
1
VC
VC
Table 6. Analog Mux Functionality (E4287 only)
DISMON is a digital input pin that is used to select the
desired PMU measurement channel that appears at
IVMON, or to place the IVMON pin in a high impedance
state. DISMON functionality is described in Table 7.
IVMON
IVMON is an analog output pin which displays the
measured parameter (i.e. compliance voltage or
compliance current) from the channel selected using
DISMON. The relationship between DISMON, MI/MV*,
and the parameter displayed at IVMON is illustrated in
Table 7.
FORCE is an analog output pin through which a
programmed voltage or current can be applied to the DUT.
SENSE is a high impedance analog input that is also
connected to the DUT and provides feedback for the Force
amplifier (see Figure 1) in “force voltage” mode and
measures DUT compliance voltage measurement in the
“measure voltage” mode.
RF is an analog output pin through which a programmed
voltage or current can be supplied to the DUT. Since there
is no disconnect switch between the FORCE amplified
output and the RF pin, using the RF pin as the PMU output
offers extended output voltage capability and full-scale
current (note that on-chip termination mode only works
when using the FORCE pin).
Force Voltage (FV) Mode
In the FV mode (FV/FI* = 1), the force amplifier (see
Figure 2) is configured as a unity gain buffer.
VINP
+
Force
Amp.
REXT
FORCE/RF
–
+
SENSE
–
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
In FV mode, VINP is a high impedance analog input that
sets the output voltage at the RF and/or FORCE output
pins across their specified ranges as follows:
REXT
Output of
Force Amp
FORCE/RF
Imeasured
–
+
4X
VFORCE/RF = VVINP ± VVINP x specified Gain Error ±
specified Offset Voltage ± specified Linearity Error
Force Current (FI) Mode
In the FI mode (FV/FI* = 0), the negative feedback to the
force amplifier is provided from the output of a 4x gain
instrument amplifier that senses the voltage across REXT.
+
VINP
Force
Amp.
REXT
In the MI mode, the voltage displayed at IVMON relates
to the current measured through REXT as follows:
VIVMON = Imeasured ± Specified Linearity Error x
specified MI Gain ± specified Offset Current
The nominal relationship between the current measured
(Imeasured) and the voltage displayed at IVMON is depicted
in Table 9.
FORCE/RF
–
–
+
Measured current can
be tested with window
comparator or routed to
IVMON
4X
In FI mode, VINP is a high impedance analog input that
sets the output current at the RF and/or FORCE pins across
their specified compliance voltage ranges as follows:
IFORCE/RF = VVINP x specified FI Gain ±
specified Offset Current ± specified Linearity Error
The nominal relationship between VVINP and the current
at the FORCE or RF pins is displayed in Table 8.
VVINP
IFORCE/RF
+2V
0V
– 2V
+ Full-Scale Current
0
– Full-Scale Current
VIVMON
+ Full-Scale Current
0
– Full-Scale Current
+2V
0V
– 2V
Table 9. Nominal VIVMON/Imeasured Relationship
Measure Voltage (MV) Mode
In the MV mode (MI/MV* = 0), DUT compliance voltage
is monitored using the SENSE pin, and the resulting
measurement can be tested using the on-chip window
comparator, or routed to the IVMON pin.
SENSE
Table 8. Nominal Forced Current/VVINP Relationship
Imeasured
+
–
Measured voltage can be
tested with window comparator
or routed to the IVMON pin.
Measure Current (MI) Mode
In the MI mode (MI/MV* = 1), the current through REXT is
sensed using a 4x gain instrument amplifier, and the
resulting measurement can be tested using the on-chip
window comparator or routed to the IVMON pin.
 2005 Semtech Corp. / Rev. 5, 11/30/05
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In the MV mode, the voltage monitored at SENSE maps
1:1 with the voltage measured at IVMON as follows:
VIVMON = VSENSE x specified Gain ± specified Offset
Voltage ± specified Linearity Error
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Window Comparator
IVMAX
The voltage clamp circuitry will constrain the DUT voltage
(Vcompliance) to within a range determined by the HLV and
LLV pins as follows:
+
Vmin ≤ Vcompliance ≤ Vmax
DUTNH
–
To PPMU
measured parameter
where: Vmin = VLLV ± specified Limit Accuracy
Vmax = VHLV ± specified Limit Accuracy
+
DUTNL
IVMIN
–
Each channel of the E42X7 features two comparators
connected in a “window comparator” topology. These
comparators can be used to provide two-bit measurement
range classification for go/no-go testing of devices. IVMAX
and IVMIN are high impedance analog voltage inputs that
establish the upper and lower thresholds for the window
comparator. DUTNH and DUTNL are LVTTL outputs that
indicate where a PPMU measured parameter lies in relation
to the IVMAX and IVMIN thresholds and are also used to
indicate when voltage clamping is taking place during
measurement as shown in Table 10.
Condition
DUTNH
DUTNL
Measurement is within the range
established by IVMAX and IVMIN
1
1
Measurement is above the range
established by IVMAX and IVMIN
0
1
Measurement is below the range
established by IVMAX and IVMIN
1
0
V/I Limiting is engaged and having
an effect on the measurement
0
0
Table 10. Comparator Output Truth Table
As the voltage clamp circuitry uses the FORCE pin to sense
the DUT compliance voltage, applications that connect
the RF pin to the DUT (see Applications Information section)
must connect the FORCE pin to the RF pin for proper
voltage limiting functionality.
In the event of a voltage clamping condition, the DUTNL
and DUTNH comparator outputs are designed to “pulldown” to logic “0” in order to indicate that the E42X7 is
clamping and may be influencing any measurement that
is being made (see Window Comparator section).
Current Limiting
The E42X7 features current limiting circuitry that limits
the amount of current that the device can delivery through
RF or FORCE pins. The amplitude of the short circuit
current is a function of the current range selected. The
maximum short-circuit current through the FORCE pin is
the sum of the force amp current limit and the voltage
clamp current limit if the voltage clamp is enabled and
engaged.
In the event that the voltage clamp is engaged, and the
FORCE pin voltage exceeds the HLV or LLV pin settings by
more than ~1.5V, the E42X7 will open all of the internal
switches connected to the FORCE and SENSE nodes in
order to protect internal PMU circuitry from damage.
Voltage Clamp
The integrated voltage clamp circuitry is controlled using
the HLV and LLV input pins. HLV and LLV are high
impedance analog voltage inputs that establish the “high”
and “low” clamp thresholds.
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
On-Chip “Termination” Mode
When the E42X7 is placed in FV mode and the internal
PMU is not selected (SELIPMU = 0), it can be placed in
“termination” mode by setting the HiZ input to logic “0”.
VINP
+
Force
Amp.
REXT
RF
~4.5KΩ Typ.
FORCE
SENSE pin to protect it from over-voltage. The
internal PMU should be disabled (HiZ=1) in order to
prevent it from initiating pull-up mode.
REXT Selection
The E42X7 is designed for the full-scale voltage drop across
REXT (RA, RB, RC, RD) to be ± 0.5V.
–
When configured in this manner, the E42X7 can be used
to provide an ~4.5KΩ “pull-up” or “pull-down” resistor at
the FORCE pin to the termination voltage programmed by
VVINP for testing devices with unipolar “open-element”
outputs (i.e. open drain).
External PMU
Resistor values can be chosen that will enable the E42X7
to operate with full-scale current ranges other than those
specified provided the voltage swing across REXT does
not exceed ± 0.5V and the full-scale current for each range
does not exceed those specified in this datasheet.
Thermal Diode String
The E42X7 features an internal diode string connected
between the VC[0] and VC[1] pins that can be used to
perform device junction temperature measurements as
shown in the figure below.
The E42X7 features on-chip routing and switches for
connecting an external PMU to the FORCE and SENSE
pins of each channel.
The EPMUF pin is the “External PMU Force” input and is
connected to the FORCE pin through an on-chip 40Ω,
40 mA switch.
The EPMUS pin is the “External PMU Sense” input and is
used to connect the external PMU’s sense line to the
E42X7’s SENSE pin through an on-chip high impedance
switch.
VC[0]
100 µA
External
Current
Source
SELC = 0
Temperature
Coefficient= –4.841mV/˚C
VC[1]
VC[1] – VC[0]
3
0.00162
(0.813 –
Tj[˚C] =
The on-chip switches used for routing the external PMU
are located in a separate on-chip well that can be
sepeartely powered from the core on-chip PMU circuitry
using SVCC. This allows the voltage range of the external
PMU to be greater than that of the core PMU without
increasing core PMU power dissipation.
NOTE: When using SVCC > VCC to extend the range
of the external PMU, care must be taken to ensure
that the RF pin voltage does NOT exceed VCC. This
can be accomplished by setting SELIPMU=0 to
disconnect the RF pin from FORCE, and will also
disconnect the internal sense circuitry from the
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Common Mode Error/Calibration
Power Supplies
In order to attain a high degree of accuracy in a typical
ATE application, offset and gain errors are accounted for
through software calibration. When operating the E42X7
in the Measure Current (MI) or Force Current (FI) modes,
an additional source of error, common mode error, should
be accounted for. Common mode error is a measure of
how the common mode voltage, VCM, at the input of the
current sense amplifier affects the forced or measured
current values (see Figure 3). Since this error is created
by internal resistors in the current sense amplifier, it is
very linear in nature.
The E42X7 requires four external power supply levels to
operate:
Using the common mode error and common mode linearity
specifications, one can see that with a small number of
calibration steps (see Applications note PMU-A1), the
effect of this error can be significantly reduced.
VOS@IVMON
CM Linearity
–
–
–
–
VCC (Positive Analog Supply)
VEE (Negative Analog Supply)
SVCC (Switch Supply)
VDD (Digital Supply)
VCC and VEE provide power to all of the E42X7’s internal
analog circuitry except for the internal CMOS transmission
gates used for the analog mux, external PMU switches,
IVMON switches, and the “termination” mode switches.
Power to these switches is provided by the SVCC supply.
This allows for power savings in that the E42X7 can be
used with rail voltages that are less than those that are
being switched using the analog mux or external PMU
switches. Note that in applications where SVCC > VCC,
care must be taken to ensure that SELIPMU = 0 whenever
the FORCE pin voltage exceeds VCC.
Power Supply Sequencing
CM Error = Slope
2 mV
VCM@FORCE
–3.5V
–2 mV
9.5V
In order to avoid the possibility of latch-up, the following
power-up requirements must be satisfied:
1. VEE ≤ GND ≤ VDD ≤ VCC ≤ SVCC at all times
2. VEE ≤ All Analog Inputs ≤ VCC
3. GND ≤ All Digital Inputs ≤ VDD
(Note: Slope may be negative)
Figure 3. Graphical Representation of
Common Mode Error
The following sequence can be used as a guideline when
powering up the E42X7:
1.
2.
3.
4.
5.
6.
VEE (substrate)
SVCC
VCC
VDD
Digital Inputs
Analog Inputs
The three diode configuration shown in Figure 4 should
be used on a once-per-board basis to prevent damage to
the PMU in the event of a power supply failure and to
ensure that power up requirements are not violated.
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
VCC
VDD
GND
1N5820 or
Equivalent
Schottky
Diodes
VEE
Figure 4. Power Supply Protection Scheme
Warning: It is extremely important that the voltage on any
device pin does not exceed the range of VEE – 0.5 to VCC
+0.5V at any time, either during power up, normal
operation, or during power down. Failure to adhere to this
requirement could result in latchup of the device, which
could be destructive if the system power supplies are
capable of supplying large amounts of current. Even if
the device is not immediately destroyed, the cumulative
damage caused by the stress of repeated latchup may
affect device reliability.
 2005 Semtech Corp. / Rev. 5, 11/30/05
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Application Information
Required External Components Per PMU
CCOMP
(470 pF, Optional)
COMP1
COMP2
12.4 kΩ
RA
1.24 kΩ
RB
E4257, E4287
124 Ω
RC
12.4 Ω
RD
E4257, E4287
RF
VCC
0.1 µF
VDD
VEE
0.1 µF
VCC
VDD
0.1 µF
VEE
Actual decoupling capacitor values
depend on the system environment.
 2005 Semtech Corp. / Rev. 5, 11/30/05
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Application Information (continued)
Per Pin PMU
Connecting the PMU to a DUT Pin
An application of the E42X7 is as a Per-Pin Parametric
Measurement Unit (PPMU) in ATE as shown in the figure
below. IVMON is connected to an external ADC to perform
measurements for either MI or MV. Such measurements
can also be used to calibrate the inputs to the comparator.
A Device Under Test (DUT) may be connected to the PPMU
either ‘locally” or ‘remotely’ to the pin electronics:
Typically, IVMONs from multiple PMUs are connected to a
single ADC where DISMON is used to select a PPMU.
Local Pin Electronics:
PPMU
Pin
Electronics
REXT
RF
FORCE
DCL
Inductors
DUT Pin
F
DUT
Pin
SENSE
S
F
S
SYSTEM
PMU
4287 PPMU
IVMON
DISMON[0:1]
Remote Pin Electronics (via Relays)
Note: FORCE must be connected
to RF in order to ensure voltage
limiting functionality
PPMU
REXT
Pin
Electronics
RF
FORCE
ADC
DUT
Pin
SENSE
GUARD
F
S
SYSTEM
PMU
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Application Information (continued)
Use of Switches for Super Voltage (E4287 ONLY)
An application of the E42X7 switches and switch matrices
is to connect their PMU and an external PMU to a DUT
pin and to switch a pin electronics driver’s levels to a
Super Voltage as shown below.
E4287 ONLY
In many applications, the external PMU’s range may need
to exceed that of a pin’s PMU (a pin’s PMU range may be
restricted in order to save power). For example, VEE =
–5.0V, VCC = +8.25V, SVCC = +14.75V would permit
a PMU range of –3.25V, +6.5V, super voltage of +12V,
and an external PMU range of –4.75V, +14.5V
(SELIPMU = 0).
SYSTEM PMU
E4287
ADC
F
40
SELEPMU
S
1K
F
IVMON
PPMU
40
SELIPMU
S
1K
DVH
1K
1000 pF
SELC
DVHH
1K
PIN'S
DRIVER
1K
DVL
DUT PIN
1000 pF
1K
OUTPUT WAVEFORM:
DVHH (Super Voltage)
DVH
NOTE: Switch impedance is shown for typical value
 2005 Semtech Corp. / Rev. 5, 11/30/05
DVL
21
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4287 Package Information
E42X7 Package: 14 x 14 x 2.0 mm, 80 Pin, Int_TEP_MQFP
(with Internal Heat Spreader)
PIN Descriptions
12
˚
D
D1
N
A
1
e
12˚
–B–
–A–
E1
E
DIMS.
TOL.
A
MAX
A1
2.35
0.25 Max
A2
+.10/–.05
2.00
D
±.25
16.00
D1
±.10
14.00
E
±.25
16.00
E1
±.10
14.00
L
+.15/–.10
.88
e
BASIC
.65
b
±.05
.30
–D–
.20 RAD. TYP.
20 RAD. TYP.
6˚ ± 4˚
STANDOFF
A
A1
θ
A2
SEATING PLANE
.17 MAX
0˚ – 7˚
.25
θ
b
–C–
ddd
MAX
.12
ccc
MAX
.10
LEAD COMPLANARITY
ddd M C A–B S D S
ccc C
L
 2005 Semtech Corp. / Rev. 5, 11/30/05
NOTES:
1)
All dimensions in mm.
2)
Dimensions shown are nominal
with tol. as indicated.
3)
L/F: EFTEC 64T copper or
equivalent, 0.127 mm (.005”) or
0.15 mm (.006”) THICK.
4)
Foot length “L” is measured at
gage plane at 0.25 above the
seating plane.
22
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4237, E4257 Package Information
64-Pad LPCC Package
9mm x 9mm
TOP VIEW
A
D
INDEX AREA
(D/2 x E/2)
D/2
B
E/2
E
2x
aaa C
2x
aaa C
BOTTOM VIEW
D2
NxK
D2/2
(DATUM B)
8
NxL
(DATUM A)
E2/2
E2
DETAIL B
N
N–1
b
e
5
bbb M C A B
PIN 1
(ND–1) x e
6
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
E4237, E4257 Package Information (continued)
Detail B
//
ccc C
8
SEATING
PLANE
A3
A
0.08 C
C
A1
SIDE VIEW
(DATUM A OR B)
Ref.
MIN
NOM
MAX
A
0.80
0.90
1.00
A1
0
0.02
0.05
0.20 Ref.
A3
L
b
0.18
0.25
0.30
D
8.90
9.00
9.10
D2
7.50
7.65
7.80
E
8.90
9.00
9.10
E2
7.50
7.65
7.80
5 L1
NOTE 5
IS OPTIONAL
e/2
e
TERMINAL TIP
5
TERMINAL/SIDE
e
NOTES:
1) Dimensioning and tolerancing conform to
ASME Y14.5M-1994.
2) All dimensions are in millimeters. Angles are in degrees.
3) N is the total number of terminals.
4) The terminal #1 identifier and terminal numbering
convention shall conform to JESD 95-1 SPP-012. Details
of terminal #1 identifier are optional, but must be located
within the zone indicated. The terminal #1 identifier may
be either a mold or marked feature.
5) Dimension b applies to metallized terminal and is
measured between 0.25mm and 0.30mm from terminal
tip. Dimension L1 is the terminal pull back from package
E up to 0.1mm is acceptable. L1 is optional.
6) ND and NE refer to the number of terminals on each
D and E side respectively.
7) Depopulation is possible in a symmetrical fashion.
8) Bilateral coplanarity zone applies to exposed heat slug
(if any) as well as the terminals.
 2005 Semtech Corp. / Rev. 5, 11/30/05
24
0.50 BSC.
k
0.20
–
–
x
b/2
–
–
L
0.35
0.40
0.45
N
64
ND
16
NE
16
TOLERANCES OF FORM AND POSITION
aaa
0.15
bbb
0.10
ccc
0.10
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Units
Positive Analog Power Supply (relative to GND)
VCC
8
10
15
V
Negative Analog Power Supply (relative to GND)
VEE
–5.25
–5
–4.75
V
(S)VCC – VEE
12.75
15
20.25
V
Positive Analog Switch Power Supply
SVCC
VCC
15
V
Digital Power Supply (relative to GND)
VDD
3.0
3.6
V
Tj
25
85
˚C
Total Analog Power Supply
Junction Temperature
Thermal Resistance of Package (Junction to Case)
E4287 Junction to Top of Package
E4237, E4257 Junction to Top of Package
E4237 , E4257 Junction to Exposed Heat Slug
(Bottom, Center)
3.3
θJC
5
12.7
0.4
˚C/W
˚C/W
˚C/W
Absolute Maximum Ratings
Parameter
Symbol
Min
Typ
Max
Units
16
V
Positive Power Supply (relative to GND)
VCC, SVCC
Negative Power Supply (relative to GND)
VEE
–6.5
(S)VCC – VEE
–0.5
22.5
V
VDD
–0.5
4.5
V
Digital Inputs
DI
–0.5
VDD + 0.5
V
Analog Inputs
AI
VEE – .5
VCC + .5
V
|HLV, LLV –
VFORCE|
0
17
V
Storage Temperature
TS
–55
+125
˚C
Junction Temperature
TJ
–65
+125
˚C
Soldering Temperature
TSOL
260
˚C
Total Power Supply
Digital Power Supply (relative to GND)
Upper/Lower Voltage Limit Input to FORCE Pin
Difference
V
Stresses above listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or any other conditions above those “recommended”
in the operational sections of this specification is not implied. Exposure to conditions above those “recommended”
for extended periods may affect device reliability.
 2005 Semtech Corp. / Rev. 5, 11/30/05
25
www.semtech.com
E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics
Power Supplies
Parameter
Symbol
Total Chip Power Supply Consumption (Quiescent,
No-Load)
Positive Supply Current (VCC)
Negative Supply Current (VEE)
Digital Supply Current (VDD)
Positive Switch Supply Current (SVCC)
ICC
IEE
IDD
SICC
Min
Typ
Max
Units
10
–10
25
–25
mA
mA
mA
mA
3.5
1
Power Supply Rejection Ratio (see plot below for
AC PSRR)
FV/MI Mode
FORCE Pin (DC)
IVMON Pin (DC)
FV/MI PSRR
FI/MV Mode
FORCE Pin (DC)
IVMON Pin (DC)
FI/MV PSRR
70
70
dB
dB
70
70
dB
dB
50
Force Pin, FI/MV Mode
PSRR [dB]
40
30
20
Force Pin, FV/MI Mode
10
IVMON Pin, FV/MI and FI/MV Modes
100
500
1000
Noise Frequency [kHz]
 2005 Semtech Corp. / Rev. 5, 11/30/05
26
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Force Voltage
Parameter
Symbol
Min
Input Voltage Range @ VINP
VVINP
VEE + 1.75
Input Leakage Current
IVINP
–200
VRF
Output Forcing Voltage
RF Pin (±Full-Scale Current)
FORCE Pin (E4257, E4287)
Max
Units
VCC – 1.75
V
+200
nA
VEE + 2
VCC – 2
V
VEE + 2
VCC – 2
V
VEE + 2
VEE + 2
VEE + 4
VCC – 4
VCC – 2
VCC – 2
V
V
V
VEE + 2
VCC – 2
V
VEE + 2
VEE + 2
VEE + 4
VCC – 4
VCC – 2
VCC – 2
V
V
V
±0.5
±0.8
±9
±45
±1.6
±15
±45
±160
mA
mA
mA
mA
FORCE Pin (E4237)
Range A (±Full-Scale Current)
Range C
Sourcing Full-Scale Current
Zero Current
Sinking Full-Scale Current
–50
0.985
–0.01
50
1.015
+0.01
mV
V/V
%FSVR
ISC, ISK
Range A
Range B
Range C
Range D
Voltage Accuracy
Offset
Gain
Linearity
Temperature Dependence (Note 1)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Capacitive Loading Range at FORCE
SELCOMP = 0
SELCOMP = 1, CCOMP = 470 pF
 2005 Semtech Corp. / Rev. 5, 11/30/05
0
VFORCE
Ranges A, B, C (±Full-Scale Current)
Range D
Sourcing Full-Scale Current
Zero Current
Sinking Full-Scale Current
Force Amplifier Short Circuit Current Limit
Typ
Vos
FV Gain
FV INL
∆Vos/∆T
∆FVGain/∆T
µV/˚C
ppm/˚C
17
1
CLOAD
0
0
27
300
10
pF
nF
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Measure Current
Parameter
Current Measurement Range
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
Current Measurement Accuracy
Measure Current Offset
Gain (Note 5)
Linearity
Common Mode Error (Note 2)
Common Mode Linearity
Temperature Dependence (Note 1)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Ranges A, B, C
Range D
 2005 Semtech Corp. / Rev. 5, 11/30/05
Symbol
Min
Typ
Max
Units
–40
–400
–4
–40
40
400
4
40
µA
µA
mA
mA
VOS
MI Gain
MI INL
–100
3.91
–0.05
100
4.15
0.05
mV
V/V
% FSCR
CM Error
–5.5
5.5
mV/V
∆CM Error
–.05
0.05
%FSCR
IMEASURE
∆Vos/∆T
∆MI Gain/∆T
28
60
ppm/˚C
30
360
ppm/˚C
ppm/˚C
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Force Current
Parameter
Input Voltage Range @ VINP
Input Leakage Current
Output Forcing Current
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
Compliance Voltage Range
RF Pin (± Full-Scale Current)
FORCE Pin (E4257, E4287)
Ranges A, B, C (±Full-Scale Current)
Range D
Sourcing Full-Scale Current
Zero Current
Sinking Full-Scale Current
Symbol
Min
VVINP
–2.5
IIVIN
–200
Max
Units
2.5
V
+200
nA
–40
–400
–4
–40
40
400
4
40
µA
µA
mA
mA
VEE + 2
VCC – 2
V
VEE + 2
VCC – 2
V
VEE + 2
VEE + 2
VEE + 4
VCC – 4
VCC – 2
VCC – 2
V
V
V
VEE + 2
VCC – 2
V
VEE + 2
VEE + 2
VEE + 4
VCC – 4
VCC – 2
VCC – 2
V
V
V
–5
5
% FSR
0.241
0.234
0.256
0.256
V/V
V/V
–0.07
–0.05
0.05
0.05
%FSCR
%FSCR
Common Mode Error
CM Error
–0.15
0.15
%FSCR/V
Common Mode Linearity
∆CM Error
–.05
0.05
%FSCR
Temperature Dependence (Note 1)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Ranges A, B, C
Range D
Capacitive Loading Range at FORCE
SELCOMP = 0
SELCOMP = 1, CCOMP = 470 pF
 2005 Semtech Corp. / Rev. 5, 11/30/05
0
IFORCE
VRF
VFORCE
FORCE Pin (E4237)
Range A (±Full-Scale Current)
Range C
Sourcing Full-Scale Current
Zero Current
Sinking Full-Scale Current
Current Accuracy
Offset
Gain (Note 4)
Ranges A, B, C
Range D
Linearity
Range A
Ranges B, C, D (Spec at ±0.05% FSCR)
Typ
Ios
FI Gain
FI INL
∆Ios/∆T
∆FI Gain/∆T
15
ppm/˚C
2
20
ppm/˚C
ppm/˚C
CLOAD
0
0
29
300
10
pF
nF
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Measure Voltage
Parameter
Symbol
Min
Voltage Measurement Range
VSENSE
Voltage Measurement Accuracy
Measure Voltage Offset
Gain
Linearity
Vos
MV Gain
MV INL
Temperature Dependence (Note 1)
Temperature Coefficient of Offset
Temperature Coefficient of Gain
Max
Units
VEE + 2
VCC – 2
V
–50
.985
–0.01
50
1.015
+0.01
mV
V/V
%FSVR
∆Vos/∆T
∆MV Gain/∆T
Typ
µV/˚C
ppm/˚C
10
1
Digital Inputs (FV/FI, MI/MV, RS0, RS1, SELIPMU, SELEPMU, SELC, SELCOMP, HiZ, DISMON)
Parameter
Symbol
Min
Input Low Level
VIL
Input High Level
VIH
2.4
Input Leakage Current
IIN
–200
 2005 Semtech Corp. / Rev. 5, 11/30/05
30
Typ
Max
Units
0.8
V
V
+200
nA
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Force & Sense Switches
Parameter
Internal Force Switches
On-Resistance
E4257, E4287
E4237
External Force Switches
Usable Input Voltage Range @ EPMUF
Usable Input Current Range @ EPMUF
On-resistance
Leakage Current @ EPMUF
Switch Open (SELEPMU = 0)
Switch Closed (SELEPMU = 1)
Input Capacitance SELEPMU = 1)
External Sense Switches
Usable Input Voltage Range @ EPMUS
Usable Input Current Range @ EPMUS
On-resistance
Leakage Current
Switch Open (SELEPMU = 0)
Switch Closed (SELEPMU = 1)
HiZ (Switches Open) Leakage Current (Note 3)
@ FORCE = VEE + 2V to VCC – 2V
@ RF = VEE + 2V to VCC – 2V
@ SENSE = VEE + 2V to VCC –2V
Symbol
Min
Typ
Max
Units
40
400
50
500
Ω
40
SVCC
40
50
10
10
V
mA
Ω
SVCC
4
1.8
V
mA
kΩ
RONRF_FORCE
VEPMUF
IEPMUF
RONEPMUF
VEE
–40
Ileak
Ileak
EPMUF
–10
–10
VEPMUS
IEPMUS
RONEPMUS
VEE
–4
Ileak
Ileak
–10
–10
10
10
nA
nA
–10
–10
–10
10
10
10
nA
nA
nA
110
20
110
110
pF
pF
pF
pF
120
1
nA
nA
pF
Ileak
FORCE Pin Capacitance (Note 3)
SELIPMU = SELEPMU = 0 (E4257, E4287)
SELIPMU = SELEPMU = 0 (E4237)
SELIPMU = 1, SELEPMU = 0 (E4257, E4287)
SELIPMU = 1, SELEPMU = 0 (E4237)
CFORCE
SENSE Pin Capacitance (Note 3)
CSENSE
0
3
pF
Internal Pull-Up Current Capability
IRPU
–6
6
mA
Internal Pull-Up Resistance (Switch & Resistor)
RPU
2.5
6
kΩ
 2005 Semtech Corp. / Rev. 5, 11/30/05
0
0
0
0
31
35
13
4.5
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Voltage Clamp
Parameter
Symbol
Min
Upper Voltage Limit Input Range
HLV
Lower Voltage Limit Input Range (Note 6)
Upper/Lower Voltage Limit Input to FORCE
Typ
Max
Units
LLV + 1.0
VCC – 1.675
V
LLV
VEE + 1.675
VCC – 6
V
|HLV, LLV –
VFORCE|
0
16.5
V
IHLV, ILLV
–200
+200
nA
Voltage Limiting Accuracy
Upper Voltage Limit (HLV)
VLIMIT+
HLV – 0.325
HLV + 0.325
V
Lower Voltage Limit (LLV)
VLIMIT–
LLV – 0.325
LLV + 0.325
V
Voltage clamp Current Limiting
|ICLAMP|
42
150
mA
HLV + 0.5
LLV – 2.5
HLV + 2.5
LLV – 0.5
V
V
Max
Units
Pin Difference
Upper/Lower Voltage Limit Input Current
FORCE Pin Short Circuit Protection Threshold
HLV
LLV
Vprotect
Analog MUX (E4287 ONLY)
Parameter
Usable Input Voltage Range (VA, VB, VC)
MUX ""Super Voltage"" Input Channel 0 to Channel
1 Difference
Switch On-Resistance @ 500 µA
Symbol
Min
Vin
VEE
SVCC
V
VVC[0] – VVC[1]
–1.5
SVCC
V
2000
Ω
RON_MUX
Typ
1300
On-Resistance Variability (Across full VEE to SVCC
Range)
∆RON_MUX
500
Ω
Leakage Current
ILEAK–MUX
100
nA
Max
Units
IVMON
Parameter
Symbol
Min
ILEAK_IVMON
–20
+20
nA
IVMON Output Switch Impedance
RIVMONSW
0.3
1.2
kΩ
IVMON Output Current Capability
IIVMON
–4
4
mA
IVMON Output Capacitance (both IVMON switches
open)
CIVMON
0
5
pF
Leakage (both IVMON switches open)
 2005 Semtech Corp. / Rev. 5, 11/30/05
32
Typ
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
DC Characteristics (continued)
Comparator
Parameter
Symbol
Min
IVMAX Voltage Range
IVMAX
IVMIN Voltage Range
Typ
Max
Units
VEE + 1.75
VCC – 1.75
V
IVMIN
VEE + 1.75
VCC – 1.75
V
Comparator Offset (IVMIN, IVMAX)
Vos
–100
+100
mV
Input Bias Current at IVMIN, IVMAX
Ibias
–200
+200
nA
Symbol
Min
Max
Units
400
mV
DUTNL, DUTNH
Parameter
Output Low Level (DUTNH (L))
@ |IOL| = 1.6 mA
VOL
Output High Level (DUTNH (L))
@ | IOH| = 400 µA
VOH
2.4
Parameter
Symbol
Min
DUTGND Voltage Range (referenced to GND)
DUTGND
Typ
V
Test Head Remote Ground
DUTGND Leakage Current
Typ
Max
Units
–250
250
mV
Ileak
–200
+200
nA
Symbol
Min
Max
Units
VDIFF
-100
100
mV
Driven Guard (E4287 ONLY)
Parameter
GUARD - SENSE
@ DUTGND = 0V, VSENSE = 5V
Typ
DC Characteristic specifications are guaranteed over full Recommended Operating Condition ranges unless otherwise noted.
Note 1:
Note 2:
Note 3:
Note 4:
Temperature coefficients are valid over a 25˚C to 85˚C junction temperature range unless otherwise noted.
The mV/V units shown are derived as follows: (∆offset current * range resistance) / ∆output force voltage.
SELIPMU = SELEPMU = FV/FI = 0.
Unit Definitions:
FI Gain =(∆IFORCE x REXT)
∆VVINP
FSVR = Full-Scale Voltage Range
Note 5:
MI Gain =
Note 6:
VCC – 6V is the maximum LLV voltage that will clamp
full-scale current on Range D. LLV will clamp
full-scale current for ranges A, B, and C all the way
up to HLV – 1V.
∆VIVMON
(∆IFORCE x REXT)
 2005 Semtech Corp. / Rev. 5, 11/30/05
FORCE Pin: FSVR = 16.25V (max supplies) @ Zero Current
FSVR = 12.25V (max supplies) @ Full-Scale Current
RF Pin: FSVR = 16.25V (max supplies) Across Entire Current Range
FSCR = Full-Scale Current Range
Range A:
Range B:
Range C:
Range D:
33
80 µA
800 µA
8 mA
80 mA
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
AC Characteristics
Force Voltage/Measure Current
Parameter
Symbol
Force Output Voltage Settling Time (Note 2)
CFORCE/SENSE = 100 pF, SELCOMP = 0
To ±0.025% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
FVtsettle
To ±0.1% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF
To ±0.025% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
To ±0.1% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
Measure Current Settling Time (Note 4)
CFORCE/SENSE = 100 pF, SELCOMP = 0
To ±0.05% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
Typ
Max
Units
25
25
25
15
105
95
85
75
µs
µs
µs
µs
17
17
17
10
95
85
75
65
µs
µs
µs
µs
115
35
30
30
200
120
110
100
µs
µs
µs
µs
75
25
20
20
130
110
100
90
µs
µs
µs
µs
105
40
30
40
550
195
150
100
µs
µs
µs
µs
75
35
25
30
200
125
100
75
µs
µs
µs
µs
230
50
40
45
420
200
175
150
µs
µs
µs
µs
200
40
30
40
270
150
125
100
µs
µs
µs
µs
MItsettle
To ±0.1% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF
To ±0.05% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
To ±0.1% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
 2005 Semtech Corp. / Rev. 5, 11/30/05
Min
34
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
AC Characteristics (continued)
Force Voltage/Measure Current (continued)
Parameter
Force Amplifier Slew Rate
I/V Monitor (Note 3)
DISABLE True to VMON Disable Time
DISABLE False to IVMON Enable Time
Slew Rate
Voltage Clamp
Activation Time (Note 5)
Recovery Time (Note 5)
Overshoot
Force Amp
HiZ True to FORCE Disable Time (Note 3)
HiZ False to FORCE Enable Time (Note 3)
 2005 Semtech Corp. / Rev. 5, 11/30/05
Symbol
Min
Typ
SR
0.9
1
tz
toe
∆V/∆t
Max
Units
V/µs
750
1.5
6.7
ns
µs
V/µs
tA
tR
Vovershoot
6
6
0.5
µs
µs
V
tz
toe
10
45
µs
µs
35
5
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
AC Characteristics (continued)
Force Current/Measure Voltage
Parameter
Symbol
Force Output Current Settling Time (Note 2)
CFORCE/SENSE = 100 pF, SELCOMP = 0
To ±0.05% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
FItsettle
To ±0.1% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF
To ±0.05% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
To ±0.1% FSCR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
Measure Voltage Settling Time (Note 4)
CFORCE/SENSE = 100 pF, SELCOMP = 0
To ±0.025% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
To ±0.1% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
Typ
Max
Units
320
45
30
30
575
185
135
85
µs
µs
µs
µs
270
35
25
20
450
175
125
75
µs
µs
µs
µs
540
70
30
40
700
250
200
150
µs
µs
µs
µs
490
60
25
30
650
200
150
95
µs
µs
µs
µs
270
40
22
20
425
175
70
60
µs
µs
µs
µs
205
25
15
10
350
100
60
50
µs
µs
µs
µs
490
60
25
30
620
195
80
70
µs
µs
µs
µs
400
45
15
20
510
175
70
60
µs
µs
µs
µs
MVtsettle
CFORCE/SENSE = 1,000 pF, SELCOMP = 1, CCOMP = 470 pF
To ±0.025% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
To ±0.1% FSVR
Range A
Range B (E4257, E4287)
Range C
Range D (E4257, E4287)
 2005 Semtech Corp. / Rev. 5, 11/30/05
Min
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
AC Characteristics (continued)
Force Current/Measure Voltage (continued)
Parameter
Force Amplifier Slew Rate
I/V Monitor (Note 3)
DISABLE True to VMON Disable Time
DISABLE False to IVMON Enable Time
Slew Rate
Voltage Clamp
Activation Time (Note 5)
Recovery Time (Note 5)
Overshoot
Force Amp
HiZ True to FORCE Disable Time (Note 3)
HiZ False to FORCE Enable Time (Note 3)
Symbol
Min
Typ
SR
0.9
1
tz
toe
∆V/∆t
Max
Units
V/µs
750
1.5
6.7
ns
µs
V/µs
tA
tR
Vovershoot
6
6
0.5
µs
µs
V
tz
toe
10
45
µs
µs
Max
Units
2
µs
166
kHz
5
Comparator
Parameter
Propagation Delay (Note 6)
>3V Swing
Minimum Pulse Width
(3V swing, IVMAX/IVMIN set to 50%)
Maximum Toggle Rate
 2005 Semtech Corp. / Rev. 5, 11/30/05
Symbol
tpd(+), (-)
37
Min
Typ
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
AC Characteristics (continued)
Note 1:
Note 2:
Note 3:
Settling times are not production tested. Guaranteed by characterization.
Measured from full-scale step at VINP to FORCE output.
Test Conditions:
1. 15 pF load on output
2. input signal has 5 ns rise/fall time
3. tpd is defined as the difference between the time when the input crosses 1.5V to when the output
changes 10% (of the total change) from the initial voltage level. (see timing diagram below).
100%
10%
Output
10%
100%
tpd1
tpd2
2V
Input
1.5V
1.5V
0.8V
Note 4:
Note 5:
Note 6:
Measured from full-scale step at VINP to IVMON output.
Clamp activation/recovery time indicates the delay between when the clamps are actually engaged
or disengaged and when clamping is indicated with the comparator outputs.
Comparator Propagation Delay Measurements.
HiZ=1, MI/MV*=0, SELIPMU=1, input signal applied to FORCE/SENSE.
VFORCE/SENSE
SR = 1V/µs
100%
50%
IVMIN, IVMAX
0%
Tpd(+)
Tpd(–)
DUTNH
DUTNL
Unit Definitions:
FSVR = Full-Scale Voltage Range
FORCE Pin: FSVR = 16.25V (max supplies) @ Zero Current
FSVR = 12.25V (max supplies) @ Full-Scale Current
RF Pin: FSVR = 16.25V (max supplies) Across Entire Current Range
FSCR = Full-Scale Current Range
Range A:
Range B:
Range C:
Range D:
 2005 Semtech Corp. / Rev. 5, 11/30/05
80 µA
800 µA
8 mA
80 mA
38
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E4237/E4257/E4287
TEST AND MEASUREMENT PRODUCTS
Ordering Information
Model Number
Package
E4287AHFT
14 x 14 x 2.0 mm, 80 Pin, Int_TEP_MQFP
(with Internal Heat Spreader)
EVM4287AHFT
Edge4287 Evaluation Module
Model Number
Package
E4237ALPT
9mm x 9mm, 64-Pad, LPCC
E4237ALPT-T
9mm x 9mm 64-Pad, LPCC (Tape & Reel)
EVM4237ALPT
Edge4237 Evaluation Module
Model Number
Package
E4257ALPT
9mm x 9mm, 64-Pad, LPCC
E4257ALPT-T
9mm x 9mm 64-Pad, LPCC (Tape & Reel)
EVM4257ALPT
Edge4257 Evaluation Module
Pb
This product is lead-free.
Contact Infor mation
Semtech Corporation
Test and Measurement Division
10021 Willow Creek Rd., San Diego, CA 92131
Phone: (858)695-1808 FAX (858)695-2633
 2005 Semtech Corp. / Rev. 5, 11/30/05
39
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