Semtech EDGE649 Octal pin electronics driver/receiver Datasheet

Edge649
Octal Pin Electronics
Driver/Receiver
TEST AND MEASUREMENT PRODUCTS
Description
Featur es
The Edge649 is an octal pin electronics driver and
receiver combination fabricated in a high- performance
CMOS process. It is designed for automatic test
equipment and instrumentation where cost, functional
density, and power are all at a premium.
•
•
•
•
•
•
•
•
The Edge649 incorporates eight channels of
programmable drivers and receivers into one package.
Each channel has per pin driver levels, receiver threshold,
and tristate control.
50 MHz Operation
11 V DUT I/O Range
Programmable Output Levels
Programmable Input Thresholds
Per Pin Flexibility
High Integration Levels
615 mW Quiescent Power Dissipation
Edge648 Compatible
The 11V driver output and receiver input range allows
the Edge649 to interface directly between TTL, ECL,
CMOS (3V, 5V, and 8V), and custom level circuitry.
The Edge649 is pin and functionally compatible with the
EDGE648, with the following performance differences:
• reduced driver preshoot
• faster driver propagation delay
• superior driver pulse width distortion
• higher driver Fmax operation
• slightly slower driver output slew rates
• higher comparator Fmax operation
• lower comparator propagation delay
• superior comparator pulse width
distortion.
Functional Block Diagram
VHIGH
VLOW
8
8
8
DATA IN
Applications
8
8
DUT
DVR EN*
•
•
•
•
•
•
•
Burn-In ATE
Functional Board Testers
In-Circuit Board Testers
Combinational Board Testers
Low Cost Chip Testers
ASIC Verifiers
VXI-Based Test Equipment
Revision 5 / October 21, 2002
8
+
DATA OUT
–
1
8
THRESHOLD
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Edge649
TEST AND MEASUREMENT PRODUCTS
PIN Description
Pin Name
Pin Number
DATA IN (0:7)
64, 65, 66, 67,
3, 4, 5, 6
TTL compatible inputs that determine the high/low status of the DUT
drivers.
DATA OUT (0:7)
56, 57, 58, 59,
11, 12, 13, 14
CMOS level outputs that indicate the status of the DUT receivers.
DUT (0:7)
46, 43, 40, 37,
33, 30, 27, 24
Pin electronic inputs/outputs that receive/drive the device under test.
DVR EN (0:7)
60, 61, 62, 63,
7, 8, 9, 10
TTL compatible inputs that control the high impedance state of the
DUT drivers.
VHIGH (0:7)
45, 44, 39, 38,
32, 31, 26, 25
Unbuffered analog inputs that set the voltage level of a logical 1 of the
DUT drivers.
VLOW (0:7)
47, 42, 41, 36,
34, 29, 28, 23
Unbuffered analog inputs that set the voltage level of a logical 0 of the
DUT drivers.
THRESHOLD (0:7)
50, 51, 52, 53,
17, 18, 19, 20
Buffered analog input voltage that sets the threshold for the DUT
comparators.
VCC
21, 49
Analog positive power supply.
VEE
22, 48
Analog negative power supply.
VDD
1, 15, 55
GND
2, 16, 54, 68
Device ground.
N/C
35
No connection.
Revision 5 / October 21, 2002
Description
Digital power supply.
2
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Edge649
DVR EN*0
DATA OUT3
DATA OUT2
DATA OUT1
DATA OUT0
VDD
GND
THRESHOLD3
THRESHOLD2
THRESHOLD1
THRESHOLD0
VCC
VEE
VLOW0
DUT0
VHIGH0
VHIGH1
60
59
58
57
56
55
54
53
52
51
50
49
48
47
46
45
44
TEST AND MEASUREMENT PRODUCTS
PIN Description (continued)
3
33
DUT4
DATA IN5
4
32
VHIGH4
DATA IN6
5
31
VHIGH5
DATA IN7
6
30
DUT5
DVR EN*4
7
29
VLOW5
DVR EN*5
8
28
VLOW6
DVR EN*6
9
27
DUT6
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26
DATA IN4
VHIGH6
VLOW4
25
34
DUT7
NC
2
VHIGH7
VDD
GND
24
VLOW3
35
VLOW7
36
1
23
68
22
GND
VEE
DUT3
21
37
VCC
67
20
DATA IN3
THRESHOLD7
VHIGH3
19
38
THRESHOLD6
66
THRESHOLD5
DATA IN2
18
VHIGH2
17
39
THRESHOLD4
65
16
DUT2
DATA IN1
GND
DATA IN0
15
VLOW2
40
VDD
41
64
14
63
DATA OUT7
DVR EN*3
13
VLOW1
DATA OUT6
42
DATA OUT5
62
12
DVR EN*2
11
DUT1
DATA OUT4
43
10
61
DVR EN*7
DVR EN*1
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Edge649
TEST AND MEASUREMENT PRODUCTS
Circuit Description
VHIGH and VLOW
Driver Description
VHIGH
VLOW
VHIGH and VLOW define the logical “1” and “0” levels of
the DUT driver and can be adjusted anywhere over the
range determined by VCC and VEE. Table 1 documents
the relationship between the analog power to supplies
(VCC and VEE), the driver range (VHIGH and VLOW), and
the comparator threshold range (VTHRESHOLD).
DATA IN
DUT
DVR EN*
The VHIGH and VLOW inputs are unbuffered in that they
also provide the driver output current (see Figure 3), so
the source of VHIGH and VLOW must have ample current
drive capability.
Figure 1. Driver Diagram
As shown in Figure 1, Edge649 supports programmable
high and low levels and tristate per channel. There are
no shared lines between any drivers. The DVR EN* and
DATA IN signals are TTL compatible inputs that control
the driver (see Figure 2).
VHIGH
With DVR EN* high, the DUT driver goes into a high
impedance state. With DVR EN* low, DATA IN high forces
the driver into a high state (DUT = VHIGH), and DATA IN
low forces the driver low (DUT = VLOW).
DUT
DVR EN*
VLOW
DATA IN
VHIGH
DUT
Figure 3.
Simplified Model of the
Unbuffered Output Stage
VLOW
Figure 2. Driver Functionality
Drive/Receive
Common Mode Range
Threshold
Range
Power Supply
Conditions
0V <= DUT <= +6.5V
0.1V <= THRESHOLD <= 3.0V
VCC = +6.5V
VEE = 0V
0V <= DUT <= +8V
0.1V <= THRESHOLD <= 4.5V
VCC = +8V
VEE = 0V
0V <= DUT <= +11V
0.1V <= THRESHOLD <= 7.5V
VCC + 11V
VEE = 0V
-3V <= DUT <= +8V
-2.9V <= THRESHOLD <= 4.5V
VCC = +8V
VEE = -3V
Table 1. Power Supply Requirement
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Edge649
TEST AND MEASUREMENT PRODUCTS
Circuit Description (continued)
Driver Output Protection
In a functional testing environment, where a resistor is
added in series with the driver output, the Edge649 can
withstand a short to any legal DUT voltage for an indefinite
amount of time.
In a low impedance application with no additional output
series resistance, care must be exercised and systems
should be designed to check for this condition and tristate
the driver if a short is detected.
Receiver Functionality
Edge649 supports programmable thresholds per
channel. There are no shared lines between comparators.
THRESHOLD is a high input impedance analog input
which defines a logical “1” and “0” at the DUT (see
Figure 4). If the DUT voltage is more positive than
THRESHOLD, DATA OUT will be high. With DUT lower
than THRESHOLD, DATA OUT will be low.
DATA OUT
+
DUT
–
THRESHOLD
THRESHOLD
DUT
DATA OUT
Tpd
Figure 4. Receiver Functionality
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Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation
Power Supplies
The Edge649 uses three power supplies: VDD, VCC and
VEE. VDD is the digital supply for all of the data inputs
and outputs. VCC and VEE are the analog power supplies
for the Edge649 drivers and comparators. In order to
protect the Edge649 and avoid damaging it, the following
power supply requirements must be satisifed at all times:
Also,
VEE ≤ GND ≤ VDD ≤ VCC
VEE ≤ All Inputs ≤ VCC at all times
VCC and VEE, which power the DUT drivers and receivers,
should also be decoupled to GND with a .1 µF chip
capacitor in parallel with a .001 µF chip capacitor. A
VCC and VEE plane, or at least a solid power bus, is
recommended for optimal performance.
VHIGH and VLOW Decoupling
The three-diode configuration shown in Figure 5, used
on a once-per-board basis, insures power supply
sequence and fault tolerance.
As the VHIGH and VLOW inputs are unbuffered and must
supply the driver output current, decoupling capacitors
for these inputs are recommended in proportion to the
amount of output current the application requires
VCC
Expanding the Common Mode Range
Although the Edge649 can drive and receive 11V swings,
these 11 V signals can be adjusted over an 14V range.
By using programmable regulators V1 and V2 for the
VCC and VEE supplies (feasible because these two
analog power supplies do not supply driver output
current), the Edge649 I/O range can be optimized for a
variety of applications (see Figure 6).
VDD
1N5820 or
Equivalent
VEE
V1
Figure 5. Power Supply Protection Scheme
VCC
The sequence below can be used as a guideline with the
Edge649:
Power-On Sequencing
1. VCC (substrate)
2. VEE
3. VDD
4. Inputs
Edge 649
Power-Off Sequencing
1. Inputs
2. VDD
3. VEE
4. VCC
VDD
V2
Power Supplies Decoupling
Figure 6.
VDD, which provides the digital power, should be
decoupled to GND with a .1 µF chip capacitor in parallel
with a .001 µF chip capacitor. The bypass capacitors
should be as close to the device as possible. Power and
ground planes are recommended to provide a low
inductance return path.
Revision 5 / October 21, 2002
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There are three rules which govern the supplies V1 and
V2:
1)
2)
3)
VDD + 1.5V ≤ V1 ≤ +11V
–3V ≤ V2 ≤ 0V
(V1 – V2) ≤ 11V
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Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation (continued)
Window Comparator
Trinary Driver
Certain applications require a dual threshold window
comparator to distinguish between the DUT being high,
low, or floating. To support this application, two Edge649
channels can be combined to create one channel with a
window comparator (see Figure 7). Notice that
connecting two DUT pins ties together the positive inputs
of both receivers. The result is a difference in polarity
between the digital outputs reporting the high and low
status of the DUT.
At times, there is a need for a three-level driver. Typically,
two levels are required for the standard digital “1” and
“0” pattern generation. The third level provides a higher
voltage to place the device under test (DUT) into a
programming or test mode. By controlling the DATA IN
and DVR EN* inputs, a trinary driver with tristate is
realizable (see Figure 8).
Driver with Pull Up/Pull Down
–
DUT HIGH
High Threshold
+
DUT
+
DUT LOW*
–
Low Threshold
Figure 7. Edge649 as a
Window Comparator
Once two receivers are connected as window
comparators, the two drivers also get connected in
parallel. This dual driver configuration supports a
multitude of applications that have traditionally been
difficult to accommodate.
VHIGH A
As the drivers are unbuffered, paralleling two drivers for
one DUT node provides a means for adding pull up or
pull down capability. By connecting the VHIGH and VLOW
inputs of one driver through a resistor to a voltage,
additional functionality that would normally require an
external relay on the DUT transmission line to engage
and disengage these functions is realizable.
One common application for the pull up feature is testing
open collector devices. The pull down satisfies open
emitter DUTs (typically ECL). Either the pull up or down
could be used to establish a default high impedance
voltage on a bidirectional bus. Notice that in all
applications, the resistors can be switched dynamically
or statically.
VLOW A
DATA IN A
DVR EN*A
VHIGH B
VHIGH B
VHIGH A
VLOW A
DUT
DATA IN B
DVR EN*B
Figure 8. Trinary Driver
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Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation (continued)
Also, either the pull up or pull down resistor could be
used to terminate the transmission from the DUT to the
pin electronics in an effort to minimize any reflections.
VHIGH A
VLOW A
DATA IN A
DUT
Two Logic Family Driver
Many test systems support exactly two families of driver
and receiver levels and select between family A and family
B settings on a per-pin basis, typically using an analog
multiplexer, (See Figure 11.) Common examples of these
families are:
DVR EN*A
Family A = TTL
Family B = CMOS
or
Family A = TTL
Family B = ECL
VHIGH B
VPULL UP
DATA IN B
VPULL DOWN
DVR EN*B
VLOW B
Figure 9. Driver with Pull Up/Pull Down
The Edge649 supports this system architecture with
minimal hardware and the elimination of the per-pin
analog multiplexer. The drive and receive levels need to
be generated once per system, then distributed and
buffered suitably.
Trinary Driver with Termination
Other combinations are also possible. For example, two
parallel drivers can be configured to implement one
trinary driver with a pull down (or pull up) dynamic
termination (see Figure 10).
VHIGH A
Two drivers in parallel also offer the possibility of
connecting force and sense parametric circuitry to the
DUT without adding additional circuitry to the controlled
impedance DUT line. For example, Figure 12 shows the
second driver being utilized to force a current and
measure a voltage.
VLOW A
DATA IN A
DVR EN*A
DUT
VHIGH B
Parametric Functions
VTERMINATION
DATA IN B
Notice that the VHIGH and VLOW pins are used from
different drivers to allow the force and sense functions
to be active simultaneously.
DVR EN*B
Figure 10. Trinary Driver with Termination
CHANNEL 1
CHANNEL n
VHIGH A
VHIGH B
DVR EN*A
DVR EN*A
DVR DATA
DVR DATA
DUT0
DUT0
DVR EN*B
DVR EN*B
VLOW B
VLOW A
Figure 11. Family A/B Using Two Drivers Per Pin
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Edge649
TEST AND MEASUREMENT PRODUCTS
Application Infor mation (continued)
Optional Output Configuration
Certain functional applications require a series output
resistor yet also demand that the comparator be
connected directly to the DUT, not via the backmatch
resistor. To create this configuration, two distinct
termination resistors may be connected to the VHIGH
and VLOW input pins (see Figure 13).
VHIGH
PROGRAMMABLE
CURRENT
SOURCE
VHIGH
DUT
DATA IN A
VLOW
DATA EN* A
VLOW
DUT
VOLTAGE
MEASUREMENT
UNIT
DATA IN B
DATA EN* B
Figure 13. Functional Application with
the Comparator Connected Directly to the DUT
Figure 12. Edge649 Supporting Parametric Testing
Thermal Information
Parameter
Symbol
Min
Typ
Max
Units
T hermal R esist anc e
Junc t ion t o C ase
θJC
9.8
oC / W
Junc t ion t o A ir
St ill A ir
50 LF P M
400 LF P M
θJA
θJA
θJA
34
26
19
oC / W
oC / W
Revision 5 / October 21, 2002
9
oC / W
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Edge649
TEST AND MEASUREMENT PRODUCTS
Package Infor mation
68 Pin PLCC Package
θJA = 42 to 48˚C / W
0.990 SQ
[25.146]
PIN Descriptions
0.953 SQ
[24.206]
0.045 SQ
[1.143]
0.048
[1.219]
0.800 REF
[20.32]
0.175
[4.445]
0.016
[0.406]
0.029
[0.736]
0.016
[0.406]
See Detail A
0.910
[23.114]
0.113
[2.87]
0.029
[0.736]
;
;
;
0.020
[0.508]
MIN
0.065
[1.651]
0.030
[0.762]
Notes: (unless otherwise specified)
1. Dimensions are in inches [millimeters].
2. Tolerances are: .XXX ± 0.005 [0.127].
3. PLCC packages are intended for surface mounting on solder lands on 0.050 [1.27] centers.
Revision 5 / October 21, 2002
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Edge649
TEST AND MEASUREMENT PRODUCTS
Recommended Operating Conditions
Parameter
Symbol
Min
Typ
Max
Units
Digital Power Supply
VDD
4.5
5
5. 5
V
Analog Positive Power Supply
VCC
VDD + 2.0
11
V
Analog Negative Power Supply
VEE
-3
0
V
VCC - VEE
7.0
11
V
TA
TJ
0
0
+70
+125
oC
Symbol
Min
Max
Units
13
V
Total Analog Power Supply
Ambient Operating Temperature
oC
Absolute Maximum Ratings
Parameter
T ot al A nalog P ow er Supply
V C C - V EE
Typ
P osit iv e A nalog P ow er Supply
VCC
+5.0
13
V
Neg at iv e A nalog P ow er Supply
V EE
-4.0
0.5
V
Driv er Hig h Out put V olt ag e
VH I G H
V EE - .5
V C C + .5
V
Driv er Low Out put V olt ag e
VLO W
V EE - .5
V C C + .5
V
Driv er Out put Sw ing
VH I G H - VLO W
-5
12
V
R ec eiv er T hreshold V olt ag e
T HR ESHOLD
V EE - .5
V C C + .5
V
DA T A I N
DV R EN*
GND - .5
V DD + .5
V
V DD
0
6.5
V
A mbient Operat ing T emperat ure
TA
-55
+125
oC
St orag e T emperat ure
TS
-65
+150
oC
Junc t ion T emperat ure
TJ
+150
oC
Soldering T emperat ure
T SOL
260
oC
Dig it al I nput s
Dig it al P ow er Supply
Stresses above those listed under "Absolute Maximum Ratings" may cause permanent damage to the
device. This is a stress rating only, and functional operation of the device at these, or any other conditions
beyond those listed, is not implied. Exposure to absolute maximum conditions for extended periods may
affect device reliability.
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Edge649
TEST AND MEASUREMENT PRODUCTS
DC Characteristics
Parameter
Symbol
Min
Typ
Max
Units
VEE + 3
VEE + 7
VCC
VCC
V
V
VEE
VEE
VCC – 3
VCC – 7
V
V
– 125
+125
mA
40
17
Ω
Ω
Driver/Receiver Characteristics
Driver High Voltage Level
@ ± 1 mA
@ ± 125 mA
VHIGH
Driver Low Voltage Level
@ ±1 mA
@ ±125 mA
VLOW
DC Driver Output Current (Note 1)
IOUT
Driver Output Impedance
@ ± 1 mA
@ ± 125 mA
ROUT
DUT Pin Capacitance
COUT
8
20
pF
DUT Output voltage
DUT<0:7>
VEE
VCC
V
Receiver Threshold Level
VTHRESHOLD
VEE + 0.1
VCC – 3.5
V
Threshold Bias Current
IBIAS
0
1.0
µA
DUT Leakage Input Current
ILEAK
.002
1.0
µA
Receiver Offset Voltage
VOS
45
200
mV
Quiescent Power Supply Current
Positive Power Supply
Negative Power Supply
Digital Power Supply
ICC
IEE
IDD
25
25
20
40
40
35
mA
mA
mA
– 200
Digital Inputs
DATA IN (0:7), DVR EN* (0:7)
2.0
V
Input High Voltage
VIHMIN
Input Low Voltage
VILMAX
0.8
V
Input Current
IIN
1.0
µA
Input Capacitance
CIN
5
pF
Digital Outputs
DATA OUT (0:7)
Output Voltage High (Note 2)
VOH
Output Voltage Low (Note 3)
VOL
DC Output current
IOUT
Note 1 :
Note 2:
Note 3:
VDD – .4
–4
V
GND + .4
V
4
mA
Output current specification is per individual driver.
Output current of 4 mA.
Output current of –4 mA.
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Edge649
TEST AND MEASUREMENT PRODUCTS
AC Characteristics
Parameter
Symbol
Min
Typ
Max
Units
T1
T2
T3
T4
12
8
17
12
20
15
25
20
33
27
38
33
ns
ns
ns
ns
Propagation Delay
DATA IN <0:7> to DUT <0:7> (Note 2)
DUT <0:7> to DATA OUT <0:7> (Note 3)
Active to HiZ (Note 4)
HiZ to Active (Note 4)
DUT Output Rise/Fall Times (Note 1)
1V Swing (20% - 80%)
3V Swing (10% - 90%)
5V Swing (10% - 90%)
8V Swing (10% - 90%)
10V Swing (10% - 90%)
Digital Outputs (DATA OUT <0:7>)
DATA OUT Rise Time (10% - 90%)
DATA OUT Fall Time (10% - 90%)
TR
TF
Minimum Pulse Width
Driver Output
Comparator Output
Maximum Operating Frequency
Fmax
3.0
3.5
4.0
4.5
5.0
ns
ns
ns
ns
ns
2
2
ns
ns
20
10
ns
ns
50
MHz
AC Test Conditions: VCC = 8V, VEE = –3V, VDD = 5V.
Note 1:
Note 2:
Note 3:
Note 4:
Into 18 inches of 50Ω transmission line terminated with 1KΩ and 5 pF with the proper series
termination resistor.
Measured at 2.5V with a 10 mA load under the following conditions: VHIGH = +5.0V,
VLOW = 0V, VCC = +8V, VEE = -3V, and VDD = +5V.
Measured at 2.5V with a 4 mA load.
Load = 10 mA and measured when a 500 mV change at the output is detected.
T1
T2
DATA IN
DUT
DATA OUT
DVR EN*
HiZ
DUT
T3
Revision 5 / October 21, 2002
T4
13
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Edge649
TEST AND MEASUREMENT PRODUCTS
Ordering Infor mation
Model Number
Package
E649APJ
68-Pin PLCC
EVM649APJ
Edge649 Evaluation Module
Contact Infor mation
Semtech Corporation
Test and Measurement Division
10021 Willow Creek Rd., San Diego, CA 92131
Phone: (858)695-1808 FAX (858)695-2633
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Edge649
TEST AND MEASUREMENT PRODUCTS
Revision History
Current Revision Date: October 21, 2002
Previous Revision Date: June 11, 2002
Page #
Section Name
6
Power Supplies
Previous Revision
Current Revision
Para 1 rewritten.
Para 2 deleted.
Power On & Off Sequencing added
Current Revision Date: June 11, 2002
Previous Revision Date: December 6, 2001
Page #
Section Name
Previous Revision
Current Revision
2
Pin Descriptions
VLOW
Change Pin #44 to Pin #47
14
Ordering Information
E649BPJ
EVM649EVM
E649APJ
EVM649APJ
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Edge649
TEST AND MEASUREMENT PRODUCTS
Revision History
Current Revision Date: December 6, 2001
Previous Revision Date: October 28, 1996
Page #
Section Name
Previous Revision
Current Revision
4
Circuit Description
Table 1
Update Threshold Ranges
11
Recommended
Operating Conditions
Delete:
Driver High Output Voltage
Driver Low Output Voltage
Total Driver Output Swing
Receiver Threshold Voltage
Analog Positive Power Supply, Min: VDD + 1.5
Total Analog Power Supply, Min: 6.5
12
Analog Positive Power Supply, Min: VDD + 2.0
Total Analog Power Supply, Min: 7.0
Add: Driver High Voltage
Driver Low Voltage
Driver Output Impedance
DC Characteristics
Delete: Driver Headroom
Delete: Output Voltage Swing
13
Driver High Voltage
@ ±1 mA, Min: VEE
@ ± 125 mA, VEE + 6
Driver High Voltage Level
@ ±1 mA, Min: VEE + 3
@ ± 125 mA, VEE + 7
Driver Low Voltqge
@ ±1 mA, Max: VCC
@ ± 125 mA, Max: VCC – 6
Driver Low Voltqge Level
@ ±1 mA, Max: VCC – 3
@ ± 125 mA, Max: VCC – 7
Driver Output Impedance
@ ± 1 mA, Max: TBD
@ ±125 mA, Max: 12
Driver Output Impedance
@ ± 1 mA, Max: 40
@ ±125 mA, Max: 17
Receiver Threshold Level, Max: VCC – 1.5
Receiver Threshold Level, Max: VCC – 3.5
Receiver Offset Voltage, Min: –100, Typ: +25,
Max: 100
Receiver Offset Voltage, Min: –200, Typ: 45,
Max: 200
AC Characteristics
Revision 5 / October 21, 2002
Add: AC Test Conditions
16
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