Altera EP2C50A35T324I6ES Cyclone ii device family Datasheet

Section I. Cyclone II
Device Family Data Sheet
This section provides information for board layout designers to
successfully layout their boards for Cyclone® II devices. It contains the
required PCB layout guidelines, device pin tables, and package
specifications.
This section includes the following chapters:
Revision History
Altera Corporation
■
Chapter 1. Introduction
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Chapter 2. Cyclone II Architecture
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Chapter 3. Configuration & Testing
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Chapter 4. Hot Socketing & Power-On Reset
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Chapter 5. DC Characteristics and Timing Specifications
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Chapter 6. Reference & Ordering Information
Refer to each chapter for its own specific revision history. For information
on when each chapter was updated, refer to the Chapter Revision Dates
section, which appears in the complete handbook.
Section I–1
Preliminary
Revision History
Section I–2
Preliminary
Cyclone II Device Handbook, Volume 1
Altera Corporation
1. Introduction
CII51001-3.2
Introduction
Following the immensely successful first-generation Cyclone® device
family, Altera® Cyclone II FPGAs extend the low-cost FPGA density
range to 68,416 logic elements (LEs) and provide up to 622 usable I/O
pins and up to 1.1 Mbits of embedded memory. Cyclone II FPGAs are
manufactured on 300-mm wafers using TSMC's 90-nm low-k dielectric
process to ensure rapid availability and low cost. By minimizing silicon
area, Cyclone II devices can support complex digital systems on a single
chip at a cost that rivals that of ASICs. Unlike other FPGA vendors who
compromise power consumption and performance for low-cost, Altera’s
latest generation of low-cost FPGAs—Cyclone II FPGAs, offer 60% higher
performance and half the power consumption of competing 90-nm
FPGAs. The low cost and optimized feature set of Cyclone II FPGAs make
them ideal solutions for a wide array of automotive, consumer,
communications, video processing, test and measurement, and other
end-market solutions. Reference designs, system diagrams, and IP, found
at www.altera.com, are available to help you rapidly develop complete
end-market solutions using Cyclone II FPGAs.
Low-Cost Embedded Processing Solutions
Cyclone II devices support the Nios II embedded processor which allows
you to implement custom-fit embedded processing solutions. Cyclone II
devices can also expand the peripheral set, memory, I/O, or performance
of embedded processors. Single or multiple Nios II embedded processors
can be designed into a Cyclone II device to provide additional
co-processing power or even replace existing embedded processors in
your system. Using Cyclone II and Nios II together allow for low-cost,
high-performance embedded processing solutions, which allow you to
extend your product's life cycle and improve time to market over
standard product solutions.
Low-Cost DSP Solutions
Use Cyclone II FPGAs alone or as DSP co-processors to improve
price-to-performance ratios for digital signal processing (DSP)
applications. You can implement high-performance yet low-cost DSP
systems with the following Cyclone II features and design support:
■
■
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Altera Corporation
February 2008
Up to 150 18 × 18 multipliers
Up to 1.1 Mbit of on-chip embedded memory
High-speed interfaces to external memory
1–1
Features
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DSP intellectual property (IP) cores
DSP Builder interface to The Mathworks Simulink and Matlab
design environment
DSP Development Kit, Cyclone II Edition
Cyclone II devices include a powerful FPGA feature set optimized for
low-cost applications including a wide range of density, memory,
embedded multiplier, and packaging options. Cyclone II devices support
a wide range of common external memory interfaces and I/O protocols
required in low-cost applications. Parameterizable IP cores from Altera
and partners make using Cyclone II interfaces and protocols fast and easy.
Features
The Cyclone II device family offers the following features:
■
High-density architecture with 4,608 to 68,416 LEs
●
M4K embedded memory blocks
●
Up to 1.1 Mbits of RAM available without reducing available
logic
●
4,096 memory bits per block (4,608 bits per block including 512
parity bits)
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Variable port configurations of ×1, ×2, ×4, ×8, ×9, ×16, ×18, ×32,
and ×36
●
True dual-port (one read and one write, two reads, or two
writes) operation for ×1, ×2, ×4, ×8, ×9, ×16, and ×18 modes
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Byte enables for data input masking during writes
●
Up to 260-MHz operation
■
Embedded multipliers
●
Up to 150 18- × 18-bit multipliers are each configurable as two
independent 9- × 9-bit multipliers with up to 250-MHz
performance
●
Optional input and output registers
■
Advanced I/O support
●
High-speed differential I/O standard support, including LVDS,
RSDS, mini-LVDS, LVPECL, differential HSTL, and differential
SSTL
●
Single-ended I/O standard support, including 2.5-V and 1.8-V,
SSTL class I and II, 1.8-V and 1.5-V HSTL class I and II, 3.3-V PCI
and PCI-X 1.0, 3.3-, 2.5-, 1.8-, and 1.5-V LVCMOS, and 3.3-, 2.5-,
and 1.8-V LVTTL
●
Peripheral Component Interconnect Special Interest Group (PCI
SIG) PCI Local Bus Specification, Revision 3.0 compliance for 3.3-V
operation at 33 or 66 MHz for 32- or 64-bit interfaces
●
PCI Express with an external TI PHY and an Altera PCI Express
×1 Megacore® function
1–2
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
Introduction
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Altera Corporation
February 2008
133-MHz PCI-X 1.0 specification compatibility
High-speed external memory support, including DDR, DDR2,
and SDR SDRAM, and QDRII SRAM supported by drop in
Altera IP MegaCore functions for ease of use
Three dedicated registers per I/O element (IOE): one input
register, one output register, and one output-enable register
Programmable bus-hold feature
Programmable output drive strength feature
Programmable delays from the pin to the IOE or logic array
I/O bank grouping for unique VCCIO and/or VREF bank
settings
MultiVolt™ I/O standard support for 1.5-, 1.8-, 2.5-, and
3.3-interfaces
Hot-socketing operation support
Tri-state with weak pull-up on I/O pins before and during
configuration
Programmable open-drain outputs
Series on-chip termination support
■
Flexible clock management circuitry
●
Hierarchical clock network for up to 402.5-MHz performance
●
Up to four PLLs per device provide clock multiplication and
division, phase shifting, programmable duty cycle, and external
clock outputs, allowing system-level clock management and
skew control
●
Up to 16 global clock lines in the global clock network that drive
throughout the entire device
■
Device configuration
●
Fast serial configuration allows configuration times less than
100 ms
●
Decompression feature allows for smaller programming file
storage and faster configuration times
●
Supports multiple configuration modes: active serial, passive
serial, and JTAG-based configuration
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Supports configuration through low-cost serial configuration
devices
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Device configuration supports multiple voltages (either 3.3, 2.5,
or 1.8 V)
■
Intellectual property
●
Altera megafunction and Altera MegaCore function support,
and Altera Megafunctions Partners Program (AMPPSM)
megafunction support, for a wide range of embedded
processors, on-chip and off-chip interfaces, peripheral
functions, DSP functions, and communications functions and
1–3
Cyclone II Device Handbook, Volume 1
Features
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protocols. Visit the Altera IPMegaStore at www.altera.com to
download IP MegaCore functions.
Nios II Embedded Processor support
The Cyclone II family offers devices with the Fast-On feature, which
offers a faster power-on-reset (POR) time. Devices that support the
Fast-On feature are designated with an “A” in the device ordering code.
For example, EP2C5A, EP2C8A, EP2C15A, and EP2C20A. The EP2C5A is
only available in the automotive speed grade. The EP2C8A and EP2C20A
are only available in the industrial speed grade. The EP2C15A is only
available with the Fast-On feature and is available in both commercial
and industrial grades. The Cyclone II “A” devices are identical in feature
set and functionality to the non-A devices except for support of the faster
POR time.
f
Cyclone II A devices are offered in automotive speed grade. For more
information, refer to the Cyclone II section in the Automotive-Grade Device
Handbook.
f
For more information on POR time specifications for Cyclone II A and
non-A devices, refer to the Hot Socketing & Power-On Reset chapter in the
Cyclone II Device Handbook.
Table 1–1 lists the Cyclone II device family features. Table 1–2 lists the
Cyclone II device package offerings and maximum user I/O pins.
Table 1–1. Cyclone II FPGA Family Features (Part 1 of 2)
Feature
EP2C5 (2)
EP2C8 (2)
EP2C15 (1)
EP2C20 (2)
EP2C35
EP2C50
EP2C70
4,608
8,256
14,448
18,752
33,216
50,528
68,416
26
36
52
52
105
129
250
119,808
165,888
239,616
239,616
483,840
594,432
1,152,00
0
Embedded
multipliers (3)
13
18
26
26
35
86
150
PLLs
2
2
4
4
4
4
4
LEs
M4K RAM blocks (4
Kbits plus
512 parity bits
Total RAM bits
1–4
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
Introduction
Table 1–1. Cyclone II FPGA Family Features (Part 2 of 2)
Feature
Maximum user
I/O pins
EP2C5 (2)
EP2C8 (2)
EP2C15 (1)
EP2C20 (2)
EP2C35
EP2C50
EP2C70
158
182
315
315
475
450
622
Notes to Table 1–1:
(1)
(2)
(3)
The EP2C15A is only available with the Fast On feature, which offers a faster POR time. This device is available in
both commercial and industrial grade.
The EP2C5, EP2C8, and EP2C20 optionally support the Fast On feature, which is designated with an “A” in the
device ordering code. The EP2C5A is only available in the automotive speed grade. The EP2C8A and EP2C20A
devices are only available in industrial grade.
This is the total number of 18 × 18 multipliers. For the total number of 9 × 9 multipliers per device, multiply the
total number of 18 × 18 multipliers by 2.
Altera Corporation
February 2008
1–5
Cyclone II Device Handbook, Volume 1
Features
Table 1–2. Cyclone II Package Options & Maximum User I/O Pins
Device
144-Pin
TQFP (3)
208-Pin 240-Pin
PQFP (4) PQFP
256-Pin
FineLine
BGA
Notes (1) (2)
484-Pin
FineLine
BGA
484-Pin
672-Pin 896-Pin
Ultra
FineLine FineLine
FineLine
BGA
BGA
BGA
EP2C5 (6) (8)
89
142
—
158 (5)
—
—
—
—
EP2C8 (6)
85
138
—
182
—
—
—
—
EP2C8A (6), (7)
—
—
—
182
—
—
—
—
EP2C15A (6), (7)
—
—
—
152
315
—
—
—
EP2C20 (6)
—
—
142
152
315
—
—
—
EP2C20A (6), (7)
—
—
—
152
315
—
—
—
EP2C35 (6)
—
—
—
—
322
322
475
—
EP2C50 (6)
—
—
—
—
294
294
450
—
EP2C70 (6)
—
—
—
—
—
—
422
622
Notes to Table 1–2:
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
Cyclone II devices support vertical migration within the same package (for example, you can migrate between the
EP2C20 device in the 484-pin FineLine BGA package and the EP2C35 and EP2C50 devices in the same package).
The Quartus® II software I/O pin counts include four additional pins, TDI, TDO, TMS, and TCK, which are not
available as general purpose I/O pins.
TQFP: thin quad flat pack.
PQFP: plastic quad flat pack.
Vertical migration is supported between the EP2C5F256 and the EP2C8F256 devices. However, not all of the DQ
and DQS groups are supported. Vertical migration between the EP2C5 and the EP2C15 in the F256 package is not
supported.
The I/O pin counts for the EP2C5, EP2C8, and EP2C15A devices include 8 dedicated clock pins that can be used
for data inputs. The I/O counts for the EP2C20, EP2C35, EP2C50, and EP2C70 devices include 16 dedicated clock
pins that can be used for data inputs.
EP2C8A, EP2C15A, and EP2C20A have a Fast On feature that has a faster POR time. The EP2C15A is only available
with the Fast On option.
The EP2C5 optionally support the Fast On feature, which is designated with an “A” in the device ordering code.
The EP2C5A is only available in the automotive speed grade. Refer to the Cyclone II section in the Automotive-Grade
Device Handbook.
Cyclone II devices support vertical migration within the same package
(for example, you can migrate between the EP2C35, EPC50, and EP2C70
devices in the 672-pin FineLine BGA package). The exception to vertical
migration support within the Cyclone II family is noted in Table 1–3.
1–6
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
Introduction
Vertical migration means that you can migrate to devices whose
dedicated pins, configuration pins, and power pins are the same for a
given package across device densities.
Table 1–3. Total Number of Non-Migratable I/O Pins for Cyclone II Vertical Migration Paths
Vertical
144-Pin TQFP
Migration Path
208-Pin
PQFP
256-Pin
484-Pin
672-Pin
484-Pin Ultra
FineLine BGA FineLine BGA
FineLine BGA
FineLine BGA
(1)
(2)
(3)
EP2C5 to
EP2C8
4
4
1 (4)
—
—
—
EP2C8 to
EP2C15
—
—
30
—
—
—
EP2C15 to
EP2C20
—
—
0
0
—
—
—
—
16
—
—
EP2C20 to
EP2C35
EP2C35 to
EP2C50
—
—
—
28
28 (5)
28
EP2C50 to
EP2C70
—
—
—
—
28
28
Notes to Table 1–3:
(1)
(2)
(3)
(4)
(5)
Vertical migration between the EP2C5F256 to the EP2C15AF256 and the EP2C5F256 to the EP2C20F256 devices is
not supported.
When migrating from the EP2C20F484 device to the EP2C50F484 device, a total of 39 I/O pins are non-migratable.
When migrating from the EP2C35F672 device to the EP2C70F672 device, a total of 56 I/O pins are non-migratable.
In addition to the one non-migratable I/O pin, there are 34 DQ pins that are non-migratable.
The pinouts of 484 FBGA and 484 UBGA are the same.
1
When moving from one density to a larger density, I/O pins are
often lost because of the greater number of power and ground
pins required to support the additional logic within the larger
device. For I/O pin migration across densities, you must cross
reference the available I/O pins using the device pin-outs for all
planned densities of a given package type to identify which I/O
pins are migratable.
To ensure that your board layout supports migratable densities within
one package offering, enable the applicable vertical migration path
within the Quartus II software (go to Assignments menu, then Device,
then click the Migration Devices button). After compilation, check the
information messages for a full list of I/O, DQ, LVDS, and other pins that
are not available because of the selected migration path. Table 1–3 lists the
Cyclone II device package offerings and shows the total number of
non-migratable I/O pins when migrating from one density device to a
larger density device.
Altera Corporation
February 2008
1–7
Cyclone II Device Handbook, Volume 1
Features
Cyclone II devices are available in up to three speed grades: –6, –7, and
–8, with –6 being the fastest. Table 1–4 shows the Cyclone II device
speed-grade offerings.
Table 1–4. Cyclone II Device Speed Grades
144-Pin
TQFP
208-Pin
PQFP
240-Pin
PQFP
256-Pin
FineLine
BGA
484-Pin
FineLine
BGA
484-Pin
Ultra
FineLine
BGA
672-Pin
FineLine
BGA
896-Pin
FineLine
BGA
EP2C5 (1)
–6, –7, –8
–7, –8
—
–6, –7, –8
—
—
—
—
EP2C8
–6, –7, –8
–7, –8
—
–6, –7, –8
—
—
—
—
—
—
—
–8
—
—
—
—
Device
EP2C8A (2)
EP2C15A
—
—
—
–6, –7, –8 –6, –7, –8
—
—
—
EP2C20
—
—
–8
–6, –7, –8 –6, –7, –8
—
—
—
EP2C20A (2)
—
—
—
–8
—
—
—
EP2C35
—
—
—
—
–6, –7, –8 –6, –7, –8 –6, –7, –8
—
EP2C50
—
—
—
—
–6, –7, –8 –6, –7, –8 –6, –7, –8
—
EP2C70
—
—
—
—
–8
—
—
–6, –7, –8 –6, –7, –8
Notes to Table 1–4:
(1)
(2)
The EP2C5 optionally support the Fast On feature, which is designated with an “A” in the device ordering code.
The EP2C5A is only available in the automotive speed grade. Refer to the Cyclone II section in the Automotive-Grade
Device Handbook for detailed information.
EP2C8A and EP2C20A are only available in industrial grade.
1–8
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
Introduction
Referenced
Documents
This chapter references the following documents:
Document
Revision History
Table 1–5 shows the revision history for this document.
■
■
Hot Socketing & Power-On Reset chapter in Cyclone II Device Handbook
Automotive-Grade Device Handbook
Table 1–5. Document Revision History
Date &
Document
Version
February 2008
v3.2
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February 2007
v3.1
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November 2005
v2.1
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July 2005 v2.0
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Changes Made
Summary of Changes
Added “Referenced Documents”.
Updated “Features” section and Table 1–1, Table 1–2,
and Table 1–4 with information about EP2C5A.
—
Added document revision history.
Added new Note (2) to Table 1–2.
Note to explain difference
between I/O pin count
information provided in
Table 1–2 and in the Quartus II
software documentation.
Updated Introduction and Features.
Updated Table 1–3.
—
Updated technical content throughout.
Updated Table 1–2.
Added Tables 1–3 and 1–4.
—
Updated Table 1–2.
Updated bullet list in the “Features” section.
—
November 2004
v1.1
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June 2004 v1.0
Added document to the Cyclone II Device Handbook.
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Altera Corporation
February 2008
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1–9
Cyclone II Device Handbook, Volume 1
Document Revision History
1–10
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
2. Cyclone II Architecture
CII51002-3.1
Functional
Description
Cyclone® II devices contain a two-dimensional row- and column-based
architecture to implement custom logic. Column and row interconnects
of varying speeds provide signal interconnects between logic array
blocks (LABs), embedded memory blocks, and embedded multipliers.
The logic array consists of LABs, with 16 logic elements (LEs) in each
LAB. An LE is a small unit of logic providing efficient implementation of
user logic functions. LABs are grouped into rows and columns across the
device. Cyclone II devices range in density from 4,608 to 68,416 LEs.
Cyclone II devices provide a global clock network and up to four
phase-locked loops (PLLs). The global clock network consists of up to 16
global clock lines that drive throughout the entire device. The global clock
network can provide clocks for all resources within the device, such as
input/output elements (IOEs), LEs, embedded multipliers, and
embedded memory blocks. The global clock lines can also be used for
other high fan-out signals. Cyclone II PLLs provide general-purpose
clocking with clock synthesis and phase shifting as well as external
outputs for high-speed differential I/O support.
M4K memory blocks are true dual-port memory blocks with 4K bits of
memory plus parity (4,608 bits). These blocks provide dedicated true
dual-port, simple dual-port, or single-port memory up to 36-bits wide at
up to 260 MHz. These blocks are arranged in columns across the device
in between certain LABs. Cyclone II devices offer between 119 to
1,152 Kbits of embedded memory.
Each embedded multiplier block can implement up to either two 9 × 9-bit
multipliers, or one 18 × 18-bit multiplier with up to 250-MHz
performance. Embedded multipliers are arranged in columns across the
device.
Each Cyclone II device I/O pin is fed by an IOE located at the ends of LAB
rows and columns around the periphery of the device. I/O pins support
various single-ended and differential I/O standards, such as the 66- and
33-MHz, 64- and 32-bit PCI standard, PCI-X, and the LVDS I/O standard
at a maximum data rate of 805 megabits per second (Mbps) for inputs and
640 Mbps for outputs. Each IOE contains a bidirectional I/O buffer and
three registers for registering input, output, and output-enable signals.
Dual-purpose DQS, DQ, and DM pins along with delay chains (used to
Altera Corporation
February 2007
2–1
Logic Elements
phase-align double data rate (DDR) signals) provide interface support for
external memory devices such as DDR, DDR2, and single data rate (SDR)
SDRAM, and QDRII SRAM devices at up to 167 MHz.
Figure 2–1 shows a diagram of the Cyclone II EP2C20 device.
Figure 2–1. Cyclone II EP2C20 Device Block Diagram
PLL
IOEs
PLL
Embedded
Multipliers
IOEs
Logic
Array
Logic
Array
Logic
Array
Logic
Array
IOEs
M4K Blocks
M4K Blocks
PLL
IOEs
PLL
The number of M4K memory blocks, embedded multiplier blocks, PLLs,
rows, and columns vary per device.
Logic Elements
The smallest unit of logic in the Cyclone II architecture, the LE, is compact
and provides advanced features with efficient logic utilization. Each LE
features:
■
■
■
■
■
■
■
A four-input look-up table (LUT), which is a function generator that
can implement any function of four variables
A programmable register
A carry chain connection
A register chain connection
The ability to drive all types of interconnects: local, row, column,
register chain, and direct link interconnects
Support for register packing
Support for register feedback
2–2
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–2 shows a Cyclone II LE.
Figure 2–2. Cyclone II LE
Register Chain
Routing From
Previous LE
LAB-Wide
Register Bypass
Synchronous
Load
LAB-Wide
Packed
Synchronous
Register Select
Clear
LAB Carry-In
data1
data2
data3
Look-Up
Table
(LUT)
Carry
Chain
Synchronous
Load and
Clear Logic
D
Q
Programmable
Register
Row, Column,
And Direct Link
Routing
data4
ENA
CLRN
labclr1
labclr2
Chip-Wide
Reset
(DEV_CLRn)
Asynchronous
Clear Logic
Row, Column,
And Direct Link
Routing
Local Routing
Clock &
Clock Enable
Select
Register
Feedback
Register Chain
Output
labclk1
labclk2
labclkena1
labclkena2
LAB Carry-Out
Each LE’s programmable register can be configured for D, T, JK, or SR
operation. Each register has data, clock, clock enable, and clear inputs.
Signals that use the global clock network, general-purpose I/O pins, or
any internal logic can drive the register’s clock and clear control signals.
Either general-purpose I/O pins or internal logic can drive the clock
enable. For combinational functions, the LUT output bypasses the
register and drives directly to the LE outputs.
Each LE has three outputs that drive the local, row, and column routing
resources. The LUT or register output can drive these three outputs
independently. Two LE outputs drive column or row and direct link
routing connections and one drives local interconnect resources, allowing
the LUT to drive one output while the register drives another output. This
feature, register packing, improves device utilization because the device
can use the register and the LUT for unrelated functions. When using
register packing, the LAB-wide synchronous load control signal is not
available. See “LAB Control Signals” on page 2–8 for more information.
Altera Corporation
February 2007
2–3
Cyclone II Device Handbook, Volume 1
Logic Elements
Another special packing mode allows the register output to feed back into
the LUT of the same LE so that the register is packed with its own fan-out
LUT, providing another mechanism for improved fitting. The LE can also
drive out registered and unregistered versions of the LUT output.
In addition to the three general routing outputs, the LEs within an LAB
have register chain outputs. Register chain outputs allow registers within
the same LAB to cascade together. The register chain output allows an
LAB to use LUTs for a single combinational function and the registers to
be used for an unrelated shift register implementation. These resources
speed up connections between LABs while saving local interconnect
resources. See “MultiTrack Interconnect” on page 2–10 for more
information on register chain connections.
LE Operating Modes
The Cyclone II LE operates in one of the following modes:
■
■
Normal mode
Arithmetic mode
Each mode uses LE resources differently. In each mode, six available
inputs to the LE—the four data inputs from the LAB local interconnect,
the LAB carry-in from the previous carry-chain LAB, and the register
chain connection—are directed to different destinations to implement the
desired logic function. LAB-wide signals provide clock, asynchronous
clear, synchronous clear, synchronous load, and clock enable control for
the register. These LAB-wide signals are available in all LE modes.
The Quartus® II software, in conjunction with parameterized functions
such as library of parameterized modules (LPM) functions, automatically
chooses the appropriate mode for common functions such as counters,
adders, subtractors, and arithmetic functions. If required, you can also
create special-purpose functions that specify which LE operating mode to
use for optimal performance.
Normal Mode
The normal mode is suitable for general logic applications and
combinational functions. In normal mode, four data inputs from the LAB
local interconnect are inputs to a four-input LUT (see Figure 2–3). The
Quartus II Compiler automatically selects the carry-in or the data3
signal as one of the inputs to the LUT. LEs in normal mode support
packed registers and register feedback.
2–4
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–3. LE in Normal Mode
sload
sclear
(LAB Wide) (LAB Wide)
Packed Register Input
Register chain
connection
D
Row, Column, and
Direct Link Routing
ENA
CLRN
Row, Column, and
Direct Link Routing
Q
data1
data2
data3
cin (from cout
of previous LE)
Four-Input
LUT
clock (LAB Wide)
ena (LAB Wide)
data4
Local routing
aclr (LAB Wide)
Register Feedback
Register
chain output
Arithmetic Mode
The arithmetic mode is ideal for implementing adders, counters,
accumulators, and comparators. An LE in arithmetic mode implements a
2-bit full adder and basic carry chain (see Figure 2–4). LEs in arithmetic
mode can drive out registered and unregistered versions of the LUT
output. Register feedback and register packing are supported when LEs
are used in arithmetic mode.
Altera Corporation
February 2007
2–5
Cyclone II Device Handbook, Volume 1
Logic Elements
Figure 2–4. LE in Arithmetic Mode
sload
sclear
(LAB Wide) (LAB Wide)
Register chain
connection
data1
data2
cin (from cout
of previous LE)
Three-Input
LUT
Three-Input
LUT
D
Row, column, and
direct link routing
ENA
CLRN
Row, column, and
direct link routing
Q
clock (LAB Wide)
ena (LAB Wide)
Local routing
aclr (LAB Wide)
cout
Register
chain output
Register Feedback
The Quartus II Compiler automatically creates carry chain logic during
design processing, or you can create it manually during design entry.
Parameterized functions such as LPM functions automatically take
advantage of carry chains for the appropriate functions.
The Quartus II Compiler creates carry chains longer than 16 LEs by
automatically linking LABs in the same column. For enhanced fitting, a
long carry chain runs vertically, which allows fast horizontal connections
to M4K memory blocks or embedded multipliers through direct link
interconnects. For example, if a design has a long carry chain in a LAB
column next to a column of M4K memory blocks, any LE output can feed
an adjacent M4K memory block through the direct link interconnect.
Whereas if the carry chains ran horizontally, any LAB not next to the
column of M4K memory blocks would use other row or column
interconnects to drive a M4K memory block. A carry chain continues as
far as a full column.
2–6
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Logic Array
Blocks
Each LAB consists of the following:
■
■
■
■
■
16 LEs
LAB control signals
LE carry chains
Register chains
Local interconnect
The local interconnect transfers signals between LEs in the same LAB.
Register chain connections transfer the output of one LE’s register to the
adjacent LE’s register within an LAB. The Quartus II Compiler places
associated logic within an LAB or adjacent LABs, allowing the use of
local, and register chain connections for performance and area efficiency.
Figure 2–5 shows the Cyclone II LAB.
Figure 2–5. Cyclone II LAB Structure
Row Interconnect
Column
Interconnect
Direct link
interconnect
from adjacent
block
Direct link
interconnect
from adjacent
block
Direct link
interconnect
to adjacent
block
Direct link
interconnect
to adjacent
block
LAB
Altera Corporation
February 2007
Local Interconnect
2–7
Cyclone II Device Handbook, Volume 1
Logic Array Blocks
LAB Interconnects
The LAB local interconnect can drive LEs within the same LAB. The LAB
local interconnect is driven by column and row interconnects and LE
outputs within the same LAB. Neighboring LABs, PLLs, M4K RAM
blocks, and embedded multipliers from the left and right can also drive
an LAB’s local interconnect through the direct link connection. The direct
link connection feature minimizes the use of row and column
interconnects, providing higher performance and flexibility. Each LE can
drive 48 LEs through fast local and direct link interconnects. Figure 2–6
shows the direct link connection.
Figure 2–6. Direct Link Connection
Direct link interconnect from
right LAB, M4K memory
block, embedded multiplier,
PLL, or IOE output
Direct link interconnect from
left LAB, M4K memory
block, embedded multiplier,
PLL, or IOE output
Direct link
interconnect
to right
Direct link
interconnect
to left
Local
Interconnect
LAB
LAB Control Signals
Each LAB contains dedicated logic for driving control signals to its LEs.
The control signals include:
■
■
■
■
■
Two clocks
Two clock enables
Two asynchronous clears
One synchronous clear
One synchronous load
2–8
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
This gives a maximum of seven control signals at a time. When using the
LAB-wide synchronous load, the clkena of labclk1 is not available.
Additionally, register packing and synchronous load cannot be used
simultaneously.
Each LAB can have up to four non-global control signals. Additional LAB
control signals can be used as long as they are global signals.
Synchronous clear and load signals are useful for implementing counters
and other functions. The synchronous clear and synchronous load signals
are LAB-wide signals that affect all registers in the LAB.
Each LAB can use two clocks and two clock enable signals. Each LAB’s
clock and clock enable signals are linked. For example, any LE in a
particular LAB using the labclk1 signal also uses labclkena1. If the
LAB uses both the rising and falling edges of a clock, it also uses both
LAB-wide clock signals. De-asserting the clock enable signal turns off the
LAB-wide clock.
The LAB row clocks [5..0] and LAB local interconnect generate the LABwide control signals. The MultiTrack™ interconnect’s inherent low skew
allows clock and control signal distribution in addition to data. Figure 2–7
shows the LAB control signal generation circuit.
Figure 2–7. LAB-Wide Control Signals
Dedicated
LAB Row
Clocks
6
Local
Interconnect
Local
Interconnect
Local
Interconnect
Local
Interconnect
labclkena2
labclkena1
labclk1
labclk2
synclr
labclr1
syncload
labclr2
LAB-wide signals control the logic for the register’s clear signal. The LE
directly supports an asynchronous clear function. Each LAB supports up
to two asynchronous clear signals (labclr1 and labclr2).
Altera Corporation
February 2007
2–9
Cyclone II Device Handbook, Volume 1
MultiTrack Interconnect
A LAB-wide asynchronous load signal to control the logic for the
register’s preset signal is not available. The register preset is achieved by
using a NOT gate push-back technique. Cyclone II devices can only
support either a preset or asynchronous clear signal.
In addition to the clear port, Cyclone II devices provide a chip-wide reset
pin (DEV_CLRn) that resets all registers in the device. An option set before
compilation in the Quartus II software controls this pin. This chip-wide
reset overrides all other control signals.
MultiTrack
Interconnect
In the Cyclone II architecture, connections between LEs, M4K memory
blocks, embedded multipliers, and device I/O pins are provided by the
MultiTrack interconnect structure with DirectDrive™ technology. The
MultiTrack interconnect consists of continuous, performance-optimized
routing lines of different speeds used for inter- and intra-design block
connectivity. The Quartus II Compiler automatically places critical paths
on faster interconnects to improve design performance.
DirectDrive technology is a deterministic routing technology that ensures
identical routing resource usage for any function regardless of placement
within the device. The MultiTrack interconnect and DirectDrive
technology simplify the integration stage of block-based designing by
eliminating the re-optimization cycles that typically follow design
changes and additions.
The MultiTrack interconnect consists of row (direct link, R4, and R24) and
column (register chain, C4, and C16) interconnects that span fixed
distances. A routing structure with fixed-length resources for all devices
allows predictable and repeatable performance when migrating through
different device densities.
Row Interconnects
Dedicated row interconnects route signals to and from LABs, PLLs, M4K
memory blocks, and embedded multipliers within the same row. These
row resources include:
■
■
■
Direct link interconnects between LABs and adjacent blocks
R4 interconnects traversing four blocks to the right or left
R24 interconnects for high-speed access across the length of the
device
2–10
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
The direct link interconnect allows an LAB, M4K memory block, or
embedded multiplier block to drive into the local interconnect of its left
and right neighbors. Only one side of a PLL block interfaces with direct
link and row interconnects. The direct link interconnect provides fast
communication between adjacent LABs and/or blocks without using
row interconnect resources.
The R4 interconnects span four LABs, three LABs and one M4K memory
block, or three LABs and one embedded multiplier to the right or left of a
source LAB. These resources are used for fast row connections in a fourLAB region. Every LAB has its own set of R4 interconnects to drive either
left or right. Figure 2–8 shows R4 interconnect connections from an LAB.
R4 interconnects can drive and be driven by LABs, M4K memory blocks,
embedded multipliers, PLLs, and row IOEs. For LAB interfacing, a
primary LAB or LAB neighbor (see Figure 2–8) can drive a given R4
interconnect. For R4 interconnects that drive to the right, the primary
LAB and right neighbor can drive on to the interconnect. For R4
interconnects that drive to the left, the primary LAB and its left neighbor
can drive on to the interconnect. R4 interconnects can drive other R4
interconnects to extend the range of LABs they can drive. Additionally,
R4 interconnects can drive R24 interconnects, C4, and C16 interconnects
for connections from one row to another.
Figure 2–8. R4 Interconnect Connections
Adjacent LAB can
Drive onto Another
LAB's R4 Interconnect
C4 Column Interconnects (1)
R4 Interconnect
Driving Right
R4 Interconnect
Driving Left
LAB
Neighbor
Primary
LAB (2)
LAB
Neighbor
Notes to Figure 2–8:
(1)
(2)
C4 interconnects can drive R4 interconnects.
This pattern is repeated for every LAB in the LAB row.
Altera Corporation
February 2007
2–11
Cyclone II Device Handbook, Volume 1
MultiTrack Interconnect
R24 row interconnects span 24 LABs and provide the fastest resource for
long row connections between non-adjacent LABs, M4K memory blocks,
dedicated multipliers, and row IOEs. R24 row interconnects drive to
other row or column interconnects at every fourth LAB. R24 row
interconnects drive LAB local interconnects via R4 and C4 interconnects
and do not drive directly to LAB local interconnects. R24 interconnects
can drive R24, R4, C16, and C4 interconnects.
Column Interconnects
The column interconnect operates similar to the row interconnect. Each
column of LABs is served by a dedicated column interconnect, which
vertically routes signals to and from LABs, M4K memory blocks,
embedded multipliers, and row and column IOEs. These column
resources include:
■
■
■
Register chain interconnects within an LAB
C4 interconnects traversing a distance of four blocks in an up and
down direction
C16 interconnects for high-speed vertical routing through the device
Cyclone II devices include an enhanced interconnect structure within
LABs for routing LE output to LE input connections faster using register
chain connections. The register chain connection allows the register
output of one LE to connect directly to the register input of the next LE in
the LAB for fast shift registers. The Quartus II Compiler automatically
takes advantage of these resources to improve utilization and
performance. Figure 2–9 shows the register chain interconnects.
2–12
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–9. Register Chain Interconnects
Local Interconnect
Routing Among LEs
in the LAB
Carry Chain
Routing to
Adjacent LE
LE 1
Local
Interconnect
LE 3
LE 2
Register Chain
Routing to Adjacent
LE's Register Input
LE 4
LE 5
LE 6
LE 7
LE 8
LE 9
LE 10
LE 11
LE 12
LE13
LE 14
LE 15
LE 16
The C4 interconnects span four LABs, M4K blocks, or embedded
multipliers up or down from a source LAB. Every LAB has its own set of
C4 interconnects to drive either up or down. Figure 2–10 shows the C4
interconnect connections from an LAB in a column. The C4 interconnects
can drive and be driven by all types of architecture blocks, including
PLLs, M4K memory blocks, embedded multiplier blocks, and column
and row IOEs. For LAB interconnection, a primary LAB or its LAB
neighbor (see Figure 2–10) can drive a given C4 interconnect. C4
interconnects can drive each other to extend their range as well as drive
row interconnects for column-to-column connections.
Altera Corporation
February 2007
2–13
Cyclone II Device Handbook, Volume 1
MultiTrack Interconnect
Figure 2–10. C4 Interconnect Connections
Note (1)
C4 Interconnect
Drives Local and R4
Interconnects
Up to Four Rows
C4 Interconnect
Driving Up
LAB
Row
Interconnect
Adjacent LAB can
drive onto neighboring
LAB's C4 interconnect
Local
Interconnect
Primary
LAB
LAB
Neighbor
C4 Interconnect
Driving Down
Note to Figure 2–10:
(1)
Each C4 interconnect can drive either up or down four rows.
2–14
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
C16 column interconnects span a length of 16 LABs and provide the
fastest resource for long column connections between LABs, M4K
memory blocks, embedded multipliers, and IOEs. C16 column
interconnects drive to other row and column interconnects at every
fourth LAB. C16 column interconnects drive LAB local interconnects via
C4 and R4 interconnects and do not drive LAB local interconnects
directly. C16 interconnects can drive R24, R4, C16, and C4 interconnects.
Device Routing
All embedded blocks communicate with the logic array similar to
LAB-to-LAB interfaces. Each block (for example, M4K memory,
embedded multiplier, or PLL) connects to row and column interconnects
and has local interconnect regions driven by row and column
interconnects. These blocks also have direct link interconnects for fast
connections to and from a neighboring LAB.
Table 2–1 shows the Cyclone II device’s routing scheme.
Table 2–1. Cyclone II Device Routing Scheme (Part 1 of 2)
Direct Link
Interconnect
v
R4
Interconnect
v
R24
Interconnect
C4
Interconnect
C16
Interconnect
Altera Corporation
February 2007
v
v
v
v
v
v
v
v
v
v
v
v
v
v
v
v
v
Row IOE
v
Column IOE
Local
Interconnect
PLL
v
Embedded Multiplier
Register
Chain
M4K RAM Block
LE
C16 Interconnect
C4 Interconnect
R24 Interconnect
R4 Interconnect
Direct Link Interconnect
Local Interconnect
Source
Register Chain
Destination
v
v
v
v
v
2–15
Cyclone II Device Handbook, Volume 1
Global Clock Network & Phase-Locked Loops
Table 2–1. Cyclone II Device Routing Scheme (Part 2 of 2)
v
v
v
v
v
v
v
v
PLL
v
Column IOE
Row IOE
Global Clock
Network &
Phase-Locked
Loops
v
Row IOE
v
Column IOE
Embedded
Multipliers
PLL
v
Embedded Multiplier
v
v
M4K RAM Block
v
v
LE
R4 Interconnect
v
v
C16 Interconnect
Direct Link Interconnect
v
LE
C4 Interconnect
Local Interconnect
v
M4K memory
Block
Source
R24 Interconnect
Register Chain
Destination
v
v
Cyclone II devices provide global clock networks and up to four PLLs for
a complete clock management solution. Cyclone II clock network features
include:
■
■
■
■
Up to 16 global clock networks
Up to four PLLs
Global clock network dynamic clock source selection
Global clock network dynamic enable and disable
2–16
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Each global clock network has a clock control block to select from a
number of input clock sources (PLL clock outputs, CLK[] pins, DPCLK[]
pins, and internal logic) to drive onto the global clock network. Table 2–2
lists how many PLLs, CLK[] pins, DPCLK[] pins, and global clock
networks are available in each Cyclone II device. CLK[] pins are
dedicated clock pins and DPCLK[] pins are dual-purpose clock pins.
Table 2–2. Cyclone II Device Clock Resources
Number of
PLLs
Number of
CLK Pins
Number of
DPCLK Pins
Number of
Global Clock
Networks
EP2C5
2
8
8
8
EP2C8
2
8
8
8
EP2C15
4
16
20
16
EP2C20
4
16
20
16
EP2C35
4
16
20
16
EP2C50
4
16
20
16
EP2C70
4
16
20
16
Device
Figures 2–11 and 2–12 show the location of the Cyclone II PLLs, CLK[]
inputs, DPCLK[] pins, and clock control blocks.
Altera Corporation
February 2007
2–17
Cyclone II Device Handbook, Volume 1
Global Clock Network & Phase-Locked Loops
Figure 2–11. EP2C5 & EP2C8 PLL, CLK[], DPCLK[] & Clock Control Block Locations
DPCLK10
DPCLK8
PLL 2
Clock Control
Block (1)
4
GCLK[7..0]
DPCLK0
DPCLK7
8
8
8
CLK[3..0]
4
4
CLK[7..4]
8
DPCLK1
DPCLK6
GCLK[7..0]
4
Clock Control
Block (1)
PLL 1
DPCLK2
DPCLK4
Note to Figure 2–11:
(1)
There are four clock control blocks on each side.
2–18
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–12. EP2C15 & Larger PLL, CLK[], DPCLK[] & Clock Control Block Locations
DPCLK[11..10]
CDPCLK7
DPCLK[9..8]
CLK[11..8]
CDPCLK6
2
2
4
4
PLL 3
PLL 2
3
CDPCLK5
CDPCLK0
(2)
(2)
4
Clock Control
Block (1)
GCLK[15..0]
3
DPCLK0
DPCLK7
16
16
16
CLK[3..0]
4
4
CLK[7..4]
16
DPCLK1
DPCLK6
4
Clock Control
Block (1)
3
GCLK[15..0]
(2)
(2)
CDPCLK4
CDPCLK1
3
PLL 1
PLL 4
4
4
2
CDPCLK2
2
CLK[15..12]
DPCLK[3..2]
CDPCLK3
DPCLK[5..4]
Notes to Figure 2–12:
(1)
(2)
There are four clock control blocks on each side.
Only one of the corner CDPCLK pins in each corner can feed the clock control block at a time. The other CDPCLK pins
can be used as general-purpose I/O pins.
Altera Corporation
February 2007
2–19
Cyclone II Device Handbook, Volume 1
Global Clock Network & Phase-Locked Loops
Dedicated Clock Pins
Larger Cyclone II devices (EP2C15 and larger devices) have 16 dedicated
clock pins (CLK[15..0], four pins on each side of the device). Smaller
Cyclone II devices (EP2C5 and EP2C8 devices) have eight dedicated clock
pins (CLK[7..0], four pins on left and right sides of the device). These
CLK pins drive the global clock network (GCLK), as shown in
Figures 2–11 and 2–12.
If the dedicated clock pins are not used to feed the global clock networks,
they can be used as general-purpose input pins to feed the logic array
using the MultiTrack interconnect. However, if they are used as generalpurpose input pins, they do not have support for an I/O register and
must use LE-based registers in place of an I/O register.
Dual-Purpose Clock Pins
Cyclone II devices have either 20 dual-purpose clock pins,
DPCLK[19..0] or 8 dual-purpose clock pins, DPCLK[7..0]. In the
larger Cyclone II devices (EP2C15 devices and higher), there are
20 DPCLK pins; four on the left and right sides and six on the top and
bottom of the device. The corner CDPCLK pins are first multiplexed before
they drive into the clock control block. Since the signals pass through a
multiplexer before feeding the clock control block, these signals incur
more delay to the clock control block than other DPCLK pins that directly
feed the clock control block. In the smaller Cyclone II devices (EP2C5 and
EP2C8 devices), there are eight DPCLK pins; two on each side of the device
(see Figures 2–11 and 2–12).
A programmable delay chain is available from the DPCLK pin to its fanout destinations. To set the propagation delay from the DPCLK pin to its
fan-out destinations, use the Input Delay from Dual-Purpose Clock Pin
to Fan-Out Destinations assignment in the Quartus II software.
These dual-purpose pins can connect to the global clock network for
high-fanout control signals such as clocks, asynchronous clears, presets,
and clock enables, or protocol control signals such as TRDY and IRDY for
PCI, or DQS signals for external memory interfaces.
2–20
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Global Clock Network
The 16 or 8 global clock networks drive throughout the entire device.
Dedicated clock pins (CLK[]), PLL outputs, the logic array, and
dual-purpose clock (DPCLK[]) pins can also drive the global clock
network.
The global clock network can provide clocks for all resources within the
device, such as IOEs, LEs, memory blocks, and embedded multipliers.
The global clock lines can also be used for control signals, such as clock
enables and synchronous or asynchronous clears fed from the external
pin, or DQS signals for DDR SDRAM or QDRII SRAM interfaces. Internal
logic can also drive the global clock network for internally generated
global clocks and asynchronous clears, clock enables, or other control
signals with large fan-out.
Clock Control Block
There is a clock control block for each global clock network available in
Cyclone II devices. The clock control blocks are arranged on the device
periphery and there are a maximum of 16 clock control blocks available
per Cyclone II device. The larger Cyclone II devices (EP2C15 devices and
larger) have 16 clock control blocks, four on each side of the device. The
smaller Cyclone II devices (EP2C5 and EP2C8 devices) have eight clock
control blocks, four on the left and right sides of the device.
The control block has these functions:
■
■
Dynamic global clock network clock source selection
Dynamic enable/disable of the global clock network
In Cyclone II devices, the dedicated CLK[] pins, PLL counter outputs,
DPCLK[] pins, and internal logic can all feed the clock control block. The
output from the clock control block in turn feeds the corresponding
global clock network.
The following sources can be inputs to a given clock control block:
■
■
■
■
Altera Corporation
February 2007
Four clock pins on the same side as the clock control block
Three PLL clock outputs from a PLL
Four DPCLK pins (including CDPCLK pins) on the same side as the
clock control block
Four internally-generated signals
2–21
Cyclone II Device Handbook, Volume 1
Global Clock Network & Phase-Locked Loops
Of the sources listed, only two clock pins, two PLL clock outputs, one
DPCLK pin, and one internally-generated signal are chosen to drive into a
clock control block. Figure 2–13 shows a more detailed diagram of the
clock control block. Out of these six inputs, the two clock input pins and
two PLL outputs can be dynamic selected to feed a global clock network.
The clock control block supports static selection of DPCLK and the signal
from internal logic.
Figure 2–13. Clock Control Block
Clock Control Block
Internal Logic
Static Clock Select (3)
DPCLK or
CDPCLK
(3)
CLK[n + 3]
CLK[n + 2]
CLK[n + 1]
CLK[n]
inclk1
inclk0
fIN
CLKSWITCH (1)
PLL
Enable/
Disable
Global
Clock
Static Clock
Select (3)
C0
C1
C2
CLKSELECT[1..0] (2)
CLKENA (4)
Notes to Figure 2–13:
(1)
(2)
(3)
(4)
The CLKSWITCH signal can either be set through the configuration file or it can be dynamically set when using the
manual PLL switchover feature. The output of the multiplexer is the input reference clock (fIN) for the PLL.
The CLKSELECT[1..0] signals are fed by internal logic and can be used to dynamically select the clock source for
the global clock network when the device is in user mode.
The static clock select signals are set in the configuration file and cannot be dynamically controlled when the device
is in user mode.
Internal logic can be used to enabled or disabled the global clock network in user mode.
2–22
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Global Clock Network Distribution
Cyclone II devices contains 16 global clock networks. The device uses
multiplexers with these clocks to form six-bit buses to drive column IOE
clocks, LAB row clocks, or row IOE clocks (see Figure 2–14). Another
multiplexer at the LAB level selects two of the six LAB row clocks to feed
the LE registers within the LAB.
Figure 2–14. Global Clock Network Multiplexers
Column I/O Region
IO_CLK [5..0]
Global Clock
Network
Clock [15 or 7..0]
LAB Row Clock
LABCLK[5..0]
Row I/O Region
IO_CLK [5..0]
LAB row clocks can feed LEs, M4K memory blocks, and embedded
multipliers. The LAB row clocks also extend to the row I/O clock regions.
IOE clocks are associated with row or column block regions. Only six
global clock resources feed to these row and column regions. Figure 2–15
shows the I/O clock regions.
Altera Corporation
February 2007
2–23
Cyclone II Device Handbook, Volume 1
Global Clock Network & Phase-Locked Loops
Figure 2–15. LAB & I/O Clock Regions
Column I/O Clock Region
IO_CLK[5..0]
6
I/O Clock Regions
Cyclone Logic Array
LAB Row Clocks
labclk[5..0]
LAB Row Clocks
labclk[5..0]
6
6
6
LAB Row Clocks
labclk[5..0]
6
6
6
LAB Row Clocks
labclk[5..0]
6
Global Clock
Network
6
Row I/O Clock
Region
IO_CLK[5..0]
8 or 16
LAB Row Clocks
labclk[5..0]
LAB Row Clocks
labclk[5..0]
6
6
6
6
I/O Clock Regions
6
Column I/O Clock Region
IO_CLK[5..0]
f
For more information on the global clock network and the clock control
block, see the PLLs in Cyclone II Devices chapter in Volume 1 of the
Cyclone II Device Handbook.
2–24
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
PLLs
Cyclone II PLLs provide general-purpose clocking as well as support for
the following features:
■
■
■
■
■
■
■
■
■
■
Clock multiplication and division
Phase shifting
Programmable duty cycle
Up to three internal clock outputs
One dedicated external clock output
Clock outputs for differential I/O support
Manual clock switchover
Gated lock signal
Three different clock feedback modes
Control signals
Cyclone II devices contain either two or four PLLs. Table 2–3 shows the
PLLs available for each Cyclone II device.
Table 2–3. Cyclone II Device PLL Availability
Device
Altera Corporation
February 2007
PLL1
PLL2
PLL3
PLL4
EP2C5
v
v
EP2C8
v
v
EP2C15
v
EP2C20
v
v
v
v
v
v
v
EP2C35
EP2C50
v
v
v
v
v
v
v
v
EP2C70
v
v
v
v
2–25
Cyclone II Device Handbook, Volume 1
Global Clock Network & Phase-Locked Loops
Table 2–4 describes the PLL features in Cyclone II devices.
Table 2–4. Cyclone II PLL Features
Feature
Description
Clock multiplication and division
m / (n × post-scale counter)
m and post-scale counter values (C0 to C2) range from 1 to 32. n ranges
from 1 to 4.
Phase shift
Cyclone II PLLs have an advanced clock shift capability that enables
programmable phase shifts in increments of at least 45°. The finest
resolution of phase shifting is determined by the voltage control oscillator
(VCO) period divided by 8 (for example, 1/1000 MHz/8 = down to 125-ps
increments).
Programmable duty cycle
The programmable duty cycle allows PLLs to generate clock outputs with
a variable duty cycle. This feature is supported on each PLL post-scale
counter (C0-C2).
Number of internal clock outputs
The Cyclone II PLL has three outputs which can drive the global clock
network. One of these outputs (C2) can also drive a dedicated
PLL<#>_OUT pin (single ended or differential).
Number of external clock outputs
The C2 output drives a dedicated PLL<#>_OUT pin. If the C2 output is not
used to drive an external clock output, it can be used to drive the internal
global clock network. The C2 output can concurrently drive the external
clock output and internal global clock network.
Manual clock switchover
The Cyclone II PLLs support manual switchover of the reference clock
through internal logic. This enables you to switch between two reference
input clocks during user mode for applications that may require clock
redundancy or support for clocks with two different frequencies.
Gated lock signal
The lock output indicates that there is a stable clock output signal in phase
with the reference clock. Cyclone II PLLs include a programmable counter
that holds the lock signal low for a user-selected number of input clock
transitions, allowing the PLL to lock before enabling the locked signal.
Either a gated locked signal or an ungated locked signal from the locked
port can drive internal logic or an output pin.
Clock feedback modes
In zero delay buffer mode, the external clock output pin is phase-aligned
with the clock input pin for zero delay.
In normal mode, the PLL compensates for the internal global clock network
delay from the input clock pin to the clock port of the IOE output registers
or registers in the logic array.
In no compensation mode, the PLL does not compensate for any clock
networks.
Control signals
The pllenable signal enables and disables the PLLs.
The areset signal resets/resynchronizes the inputs for each PLL.
The pfdena signal controls the phase frequency detector (PFD) output
with a programmable gate.
2–26
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–16 shows a block diagram of the Cyclone II PLL.
Figure 2–16. Cyclone II PLL
Note (1)
VCO Phase Selection
Selectable at Each
PLL Output Port
Post-Scale
Counters
Manual Clock
Switchover
Select Signal
8
Reference
Input Clock
fREF = fIN /n
÷c0
Global
Clock
÷c1
Global
Clock
÷c2
(2)
Global
Clock
fVCO
CLK0 (1)
up
CLK1
inclk0
CLK2 (1)
inclk1
fIN
÷n
Charge
Pump
PFD
Loop
Filter
down
8
VCO
÷k
(3)
CLK3
8
fFB
÷m
Lock Detect
& Filter
PLL<#>_OUT
To I/O or
general routing
Notes to Figure 2–16:
(1)
(2)
This input can be single-ended or differential. If you are using a differential I/O standard, then two CLK pins are
used. LVDS input is supported via the secondary function of the dedicated CLK pins. For example, the CLK0 pin’s
secondary function is LVDSCLK1p and the CLK1 pin’s secondary function is LVDSCLK1n. If a differential I/O
standard is assigned to the PLL clock input pin, the corresponding CLK(n) pin is also completely used. The
Figure 2–16 shows the possible clock input connections (CLK0/CLK1) to PLL1.
This counter output is shared between a dedicated external clock output I/O and the global clock network.
f
Embedded
Memory
Altera Corporation
February 2007
For more information on Cyclone II PLLs, see the PLLs in the Cyclone II
Devices chapter in Volume 1 of the Cyclone II Device Handbook.
The Cyclone II embedded memory consists of columns of M4K memory
blocks. The M4K memory blocks include input registers that synchronize
writes and output registers to pipeline designs and improve system
performance. The output registers can be bypassed, but input registers
cannot.
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Cyclone II Device Handbook, Volume 1
Embedded Memory
Each M4K block can implement various types of memory with or without
parity, including true dual-port, simple dual-port, and single-port RAM,
ROM, and first-in first-out (FIFO) buffers. The M4K blocks support the
following features:
■
■
■
■
■
■
■
■
■
■
■
■
4,608 RAM bits
250-MHz performance
True dual-port memory
Simple dual-port memory
Single-port memory
Byte enable
Parity bits
Shift register
FIFO buffer
ROM
Various clock modes
Address clock enable
1
Violating the setup or hold time on the memory block address
registers could corrupt memory contents. This applies to both
read and write operations.
Table 2–5 shows the capacity and distribution of the M4K memory blocks
in each Cyclone II device.
Table 2–5. M4K Memory Capacity & Distribution in Cyclone II Devices
Device
M4K Columns
M4K Blocks
Total RAM Bits
EP2C5
2
26
119,808
EP2C8
2
36
165,888
EP2C15
2
52
239,616
EP2C20
2
52
239,616
EP2C35
3
105
483,840
EP2C50
3
129
594,432
EP2C70
5
250
1,152,000
2–28
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Table 2–6 summarizes the features supported by the M4K memory.
Table 2–6. M4K Memory Features
Feature
Description
Maximum performance (1)
250 MHz
Total RAM bits per M4K block (including parity bits)
4,608
Configurations supported
4K × 1
2K × 2
1K × 4
512 × 8
512 × 9
256 × 16
256 × 18
128 × 32 (not available in true dual-port mode)
128 × 36 (not available in true dual-port mode)
Parity bits
One parity bit for each byte. The parity bit, along with
internal user logic, can implement parity checking for
error detection to ensure data integrity.
Byte enable
M4K blocks support byte writes when the write port has
a data width of 1, 2, 4, 8, 9, 16, 18, 32, or 36 bits. The
byte enables allow the input data to be masked so the
device can write to specific bytes. The unwritten bytes
retain the previous written value.
Packed mode
Two single-port memory blocks can be packed into a
single M4K block if each of the two independent block
sizes are equal to or less than half of the M4K block
size, and each of the single-port memory blocks is
configured in single-clock mode.
Address clock enable
M4K blocks support address clock enable, which is
used to hold the previous address value for as long as
the signal is enabled. This feature is useful in handling
misses in cache applications.
Memory initialization file (.mif)
When configured as RAM or ROM, you can use an
initialization file to pre-load the memory contents.
Power-up condition
Outputs cleared
Register clears
Output registers only
Same-port read-during-write
New data available at positive clock edge
Mixed-port read-during-write
Old data available at positive clock edge
Note to Table 2–6:
(1)
Maximum performance information is preliminary until device characterization.
Altera Corporation
February 2007
2–29
Cyclone II Device Handbook, Volume 1
Embedded Memory
Memory Modes
Table 2–7 summarizes the different memory modes supported by the
M4K memory blocks.
Table 2–7. M4K Memory Modes
Memory Mode
Description
Single-port memory
M4K blocks support single-port mode, used when
simultaneous reads and writes are not required.
Single-port memory supports non-simultaneous
reads and writes.
Simple dual-port memory
Simple dual-port memory supports a
simultaneous read and write.
Simple dual-port with mixed
width
Simple dual-port memory mode with different
read and write port widths.
True dual-port memory
True dual-port mode supports any combination of
two-port operations: two reads, two writes, or one
read and one write at two different clock
frequencies.
True dual-port with mixed
width
True dual-port mode with different read and write
port widths.
Embedded shift register
M4K memory blocks are used to implement shift
registers. Data is written into each address
location at the falling edge of the clock and read
from the address at the rising edge of the clock.
ROM
The M4K memory blocks support ROM mode. A
MIF initializes the ROM contents of these blocks.
FIFO buffers
A single clock or dual clock FIFO may be
implemented in the M4K blocks. Simultaneous
read and write from an empty FIFO buffer is not
supported.
1
Embedded Memory can be inferred in your HDL code or
directly instantiated in the Quartus II software using the
MegaWizard® Plug-in Manager Memory Compiler feature.
2–30
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Clock Modes
Table 2–8 summarizes the different clock modes supported by the M4K
memory.
Table 2–8. M4K Clock Modes
Clock Mode
Description
Independent
In this mode, a separate clock is available for each port (ports A
and B). Clock A controls all registers on the port A side, while
clock B controls all registers on the port B side.
Input/output
On each of the two ports, A or B, one clock controls all registers
for inputs into the memory block: data input, wren, and address.
The other clock controls the block’s data output registers.
Read/write
Up to two clocks are available in this mode. The write clock
controls the block’s data inputs, wraddress, and wren. The
read clock controls the data output, rdaddress, and rden.
Single
In this mode, a single clock, together with clock enable, is used to
control all registers of the memory block. Asynchronous clear
signals for the registers are not supported.
Table 2–9 shows which clock modes are supported by all M4K blocks
when configured in the different memory modes.
Table 2–9. Cyclone II M4K Memory Clock Modes
Clocking Modes
True Dual-Port
Mode
Simple Dual-Port
Single-Port Mode
Mode
Independent
v
Input/output
v
v
v
v
v
Read/write
Single clock
v
v
M4K Routing Interface
The R4, C4, and direct link interconnects from adjacent LABs drive the
M4K block local interconnect. The M4K blocks can communicate with
LABs on either the left or right side through these row resources or with
LAB columns on either the right or left with the column resources. Up to
16 direct link input connections to the M4K block are possible from the
left adjacent LAB and another 16 possible from the right adjacent LAB.
M4K block outputs can also connect to left and right LABs through each
16 direct link interconnects. Figure 2–17 shows the M4K block to logic
array interface.
Altera Corporation
February 2007
2–31
Cyclone II Device Handbook, Volume 1
Embedded Multipliers
Figure 2–17. M4K RAM Block LAB Row Interface
C4 Interconnects
Direct link
interconnect
to adjacent LAB
R4 Interconnects
16
Direct link
interconnect
to adjacent LAB
dataout
Direct link
interconnect
from adjacent LAB
M4K RAM
Block
16
16
Byte enable
Direct link
interconnect
from adjacent LAB
Control
Signals
Clocks
address
datain
6
M4K RAM Block Local
Interconnect Region
f
Embedded
Multipliers
LAB Row Clocks
For more information on Cyclone II embedded memory, see the
Cyclone II Memory Blocks chapter in Volume 1 of the Cyclone II Device
Handbook.
Cyclone II devices have embedded multiplier blocks optimized for
multiplier-intensive digital signal processing (DSP) functions, such as
finite impulse response (FIR) filters, fast Fourier transform (FFT)
functions, and discrete cosine transform (DCT) functions. You can use the
embedded multiplier in one of two basic operational modes, depending
on the application needs:
■
■
One 18-bit multiplier
Up to two independent 9-bit multipliers
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Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Embedded multipliers can operate at up to 250 MHz (for the fastest speed
grade) for 18 × 18 and 9 × 9 multiplications when using both input and
output registers.
Each Cyclone II device has one to three columns of embedded multipliers
that efficiently implement multiplication functions. An embedded
multiplier spans the height of one LAB row. Table 2–10 shows the number
of embedded multipliers in each Cyclone II device and the multipliers
that can be implemented.
Table 2–10. Number of Embedded Multipliers in Cyclone II Devices
Device
Note (1)
Embedded
Multiplier Columns
Embedded
Multipliers
9 × 9 Multipliers
18 × 18 Multipliers
1
13
26
13
EP2C5
EP2C8
1
18
36
18
EP2C15
1
26
52
26
EP2C20
1
26
52
26
EP2C35
1
35
70
35
EP2C50
2
86
172
86
EP2C70
3
150
300
150
Note to Table 2–10:
(1)
Each device has either the number of 9 × 9-, or 18 × 18-bit multipliers shown. The total number of multipliers for
each device is not the sum of all the multipliers.
The embedded multiplier consists of the following elements:
■
■
■
Multiplier block
Input and output registers
Input and output interfaces
Figure 2–18 shows the multiplier block architecture.
Altera Corporation
February 2007
2–33
Cyclone II Device Handbook, Volume 1
Embedded Multipliers
Figure 2–18. Multiplier Block Architecture
signa (1)
signb (1)
aclr
clock
ena
Data A
D
Q
ENA
Data Out
D
Q
ENA
CLRN
CLRN
Data B
D
Q
ENA
CLRN
Output
Register
Input
Register
Embedded Multiplier Block
Note to Figure 2–18:
(1)
If necessary, these signals can be registered once to match the data signal path.
Each multiplier operand can be a unique signed or unsigned number.
Two signals, signa and signb, control the representation of each
operand respectively. A logic 1 value on the signa signal indicates that
data A is a signed number while a logic 0 value indicates an unsigned
number. Table 2–11 shows the sign of the multiplication result for the
various operand sign representations. The result of the multiplication is
signed if any one of the operands is a signed value.
Table 2–11. Multiplier Sign Representation
Data A (signa Value)
Data B (signb Value)
Result
Unsigned
Unsigned
Unsigned
Unsigned
Signed
Signed
Signed
Unsigned
Signed
Signed
Signed
Signed
2–34
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
There is only one signa and one signb signal for each dedicated
multiplier. Therefore, all of the data A inputs feeding the same dedicated
multiplier must have the same sign representation. Similarly, all of the
data B inputs feeding the same dedicated multiplier must have the same
sign representation. The signa and signb signals can be changed
dynamically to modify the sign representation of the input operands at
run time. The multiplier offers full precision regardless of the sign
representation and can be registered using dedicated registers located at
the input register stage.
Multiplier Modes
Table 2–12 summarizes the different modes that the embedded
multipliers can operate in.
Table 2–12. Embedded Multiplier Modes
Multiplier Mode
Altera Corporation
February 2007
Description
18-bit Multiplier
An embedded multiplier can be configured to support a
single 18 × 18 multiplier for operand widths up to 18 bits.
All 18-bit multiplier inputs and results can be registered
independently. The multiplier operands can accept
signed integers, unsigned integers, or a combination of
both.
9-bit Multiplier
An embedded multiplier can be configured to support
two 9 × 9 independent multipliers for operand widths up
to 9-bits. Both 9-bit multiplier inputs and results can be
registered independently. The multiplier operands can
accept signed integers, unsigned integers or a
combination of both.
There is only one signa signal to control the sign
representation of both data A inputs and one signb
signal to control the sign representation of both data B
inputs of the 9-bit multipliers within the same dedicated
multiplier.
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Cyclone II Device Handbook, Volume 1
Embedded Multipliers
Embedded Multiplier Routing Interface
The R4, C4, and direct link interconnects from adjacent LABs drive the
embedded multiplier row interface interconnect. The embedded
multipliers can communicate with LABs on either the left or right side
through these row resources or with LAB columns on either the right or
left with the column resources. Up to 16 direct link input connections to
the embedded multiplier are possible from the left adjacent LABs and
another 16 possible from the right adjacent LAB. Embedded multiplier
outputs can also connect to left and right LABs through 18 direct link
interconnects each. Figure 2–19 shows the embedded multiplier to logic
array interface.
Figure 2–19. Embedded Multiplier LAB Row Interface
C4 Interconnects
Direct Link Interconnect
from Adjacent LAB
R4 Interconnects
18 Direct Link Outputs
to Adjacent LABs
Direct Link Interconnect
from Adjacent LAB
36
Embedded Multiplier
LAB
LAB
18
18
16
16
5
Control
36
[35..0]
18
[35..0]
18
Row Interface
Block
LAB Block
Interconect Region
Embedded Multiplier
to LAB Row Interface
Block Interconnect Region
2–36
Cyclone II Device Handbook, Volume 1
36 Inputs per Row
36 Outputs per Row
LAB Block
Interconect Region
C4 Interconnects
Altera Corporation
February 2007
Cyclone II Architecture
There are five dynamic control input signals that feed the embedded
multiplier: signa, signb, clk, clkena, and aclr. signa and signb
can be registered to match the data signal input path. The same clk,
clkena, and aclr signals feed all registers within a single embedded
multiplier.
f
I/O Structure &
Features
For more information on Cyclone II embedded multipliers, see the
Embedded Multipliers in Cyclone II Devices chapter.
IOEs support many features, including:
■
■
■
■
■
■
■
■
■
■
■
■
Differential and single-ended I/O standards
3.3-V, 64- and 32-bit, 66- and 33-MHz PCI compliance
Joint Test Action Group (JTAG) boundary-scan test (BST) support
Output drive strength control
Weak pull-up resistors during configuration
Tri-state buffers
Bus-hold circuitry
Programmable pull-up resistors in user mode
Programmable input and output delays
Open-drain outputs
DQ and DQS I/O pins
VREF pins
Cyclone II device IOEs contain a bidirectional I/O buffer and three
registers for complete embedded bidirectional single data rate transfer.
Figure 2–20 shows the Cyclone II IOE structure. The IOE contains one
input register, one output register, and one output enable register. You can
use the input registers for fast setup times and output registers for fast
clock-to-output times. Additionally, you can use the output enable (OE)
register for fast clock-to-output enable timing. The Quartus II software
automatically duplicates a single OE register that controls multiple
output or bidirectional pins. You can use IOEs as input, output, or
bidirectional pins.
Altera Corporation
February 2007
2–37
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Figure 2–20. Cyclone II IOE Structure
Logic Array
OE Register
OE
Output Register
Output
Input (1)
Input Register
Note to Figure 2–20:
(1)
There are two paths available for combinational or registered inputs to the logic
array. Each path contains a unique programmable delay chain.
The IOEs are located in I/O blocks around the periphery of the Cyclone II
device. There are up to five IOEs per row I/O block and up to four IOEs
per column I/O block (column I/O blocks span two columns). The row
I/O blocks drive row, column (only C4 interconnects), or direct link
interconnects. The column I/O blocks drive column interconnects.
Figure 2–21 shows how a row I/O block connects to the logic array.
Figure 2–22 shows how a column I/O block connects to the logic array.
2–38
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–21. Row I/O Block Connection to the Interconnect
R4 & R24 Interconnects
C4 Interconnects
I/O Block Local
Interconnect
35 Data and
Control Signals
from Logic Array (1)
35
LAB
Row
I/O Block
io_datain0[4..0]
io_datain1[4..0] (2)
Direct Link
Interconnect
to Adjacent LAB
Direct Link
Interconnect
from Adjacent LAB
io_clk[5..0]
LAB Local
Interconnect
Row I/O Block
Contains up to
Five IOEs
Notes to Figure 2–21:
(1)
(2)
The 35 data and control signals consist of five data out lines, io_dataout[4..0], five output enables,
io_coe[4..0], five input clock enables, io_cce_in[4..0], five output clock enables, io_cce_out[4..0],
five clocks, io_cclk[4..0], five asynchronous clear signals, io_caclr[4..0], and five synchronous clear
signals, io_csclr[4..0].
Each of the five IOEs in the row I/O block can have two io_datain (combinational or registered) inputs.
Altera Corporation
February 2007
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Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Figure 2–22. Column I/O Block Connection to the Interconnect
Column I/O
Block Contains
up to Four IOEs
Column I/O Block
28 Data &
Control Signals
from Logic Array (1)
28
io_datain0[3..0]
io_datain1[3..0] (2)
io_clk[5..0]
I/O Block
Local Interconnect
R4 & R24 Interconnects
LAB
LAB Local
Interconnect
LAB
LAB
C4 & C24 Interconnects
Notes to Figure 2–22:
(1)
(2)
The 28 data and control signals consist of four data out lines, io_dataout[3..0], four output enables,
io_coe[3..0], four input clock enables, io_cce_in[3..0], four output clock enables, io_cce_out[3..0],
four clocks, io_cclk[3..0], four asynchronous clear signals, io_caclr[3..0], and four synchronous clear
signals, io_csclr[3..0].
Each of the four IOEs in the column I/O block can have two io_datain (combinational or registered) inputs.
2–40
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
The pin’s datain signals can drive the logic array. The logic array drives
the control and data signals, providing a flexible routing resource. The
row or column IOE clocks, io_clk[5..0], provide a dedicated routing
resource for low-skew, high-speed clocks. The global clock network
generates the IOE clocks that feed the row or column I/O regions (see
“Global Clock Network & Phase-Locked Loops” on page 2–16).
Figure 2–23 illustrates the signal paths through the I/O block.
Figure 2–23. Signal Path Through the I/O Block
Row or Column
io_clk[5..0]
To Logic
Array
To Other
IOEs
io_datain0
io_datain1
oe
ce_in
io_csclr
ce_out
io_coe
io_cce_in
From Logic
Array
io_cce_out
Data and
Control
Signal
Selection
aclr/preset
IOE
sclr/preset
clk_in
io_caclr
clk_out
io_cclk
io_dataout
dataout
Each IOE contains its own control signal selection for the following
control signals: oe, ce_in, ce_out, aclr/preset, sclr/preset,
clk_in, and clk_out. Figure 2–24 illustrates the control signal
selection.
Altera Corporation
February 2007
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Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Figure 2–24. Control Signal Selection per IOE
Dedicated I/O
Clock [5..0]
Local
Interconnect
io_coe
Local
Interconnect
io_csclr
Local
Interconnect
io_caclr
Local
Interconnect
io_cce_out
Local
Interconnect
io_cce_in
Local
Interconnect
io_cclk
ce_out
clk_out
clk_in
ce_in
sclr/preset
aclr/preset
oe
In normal bidirectional operation, you can use the input register for input
data requiring fast setup times. The input register can have its own clock
input and clock enable separate from the OE and output registers. You can
use the output register for data requiring fast clock-to-output
performance. The OE register is available for fast clock-to-output enable
timing. The OE and output register share the same clock source and the
same clock enable source from the local interconnect in the associated
LAB, dedicated I/O clocks, or the column and row interconnects. All
registers share sclr and aclr, but each register can individually disable
sclr and aclr. Figure 2–25 shows the IOE in bidirectional
configuration.
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Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–25. Cyclone II IOE in Bidirectional I/O Configuration
io_clk[5..0]
Column
or Row
Interconect
OE
OE Register
clkout
D
PRN
Q
VCCIO
ENA
Optional
PCI Clamp
CLRN
ce_out
VCCIO
Programmable
Pull-Up
Resistor
aclr/prn
Chip-Wide Reset
Output Register
D
PRN
Q
Output
Pin Delay
ENA
sclr/preset
Open-Drain Output
CLRN
data_in1
Bus Hold
data_in0
Input Register
D
clkin
ce_in
PRN
Q
Input Pin to
Input Register Delay
or Input Pin to
Logic Array Delay
ENA
CLRN
The Cyclone II device IOE includes programmable delays to ensure zero
hold times, minimize setup times, or increase clock to output times.
A path in which a pin directly drives a register may require a
programmable delay to ensure zero hold time, whereas a path in which a
pin drives a register through combinational logic may not require the
delay. Programmable delays decrease input-pin-to-logic-array and IOE
input register delays. The Quartus II Compiler can program these delays
to automatically minimize setup time while providing a zero hold time.
Altera Corporation
February 2007
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Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Programmable delays can increase the register-to-pin delays for output
registers. Table 2–13 shows the programmable delays for Cyclone II
devices.
Table 2–13. Cyclone II Programmable Delay Chain
Programmable Delays
Quartus II Logic Option
Input pin to logic array delay
Input delay from pin to internal cells
Input pin to input register delay
Input delay from pin to input register
Output pin delay
Delay from output register to output pin
There are two paths in the IOE for an input to reach the logic array. Each
of the two paths can have a different delay. This allows you to adjust
delays from the pin to internal LE registers that reside in two different
areas of the device. You set the two combinational input delays by
selecting different delays for two different paths under the Input delay
from pin to internal cells logic option in the Quartus II software.
However, if the pin uses the input register, one of delays is disregarded
because the IOE only has two paths to internal logic. If the input register
is used, the IOE uses one input path. The other input path is then
available for the combinational path, and only one input delay
assignment is applied.
The IOE registers in each I/O block share the same source for clear or
preset. You can program preset or clear for each individual IOE, but both
features cannot be used simultaneously. You can also program the
registers to power up high or low after configuration is complete. If
programmed to power up low, an asynchronous clear can control the
registers. If programmed to power up high, an asynchronous preset can
control the registers. This feature prevents the inadvertent activation of
another device’s active-low input upon power up. If one register in an
IOE uses a preset or clear signal then all registers in the IOE must use that
same signal if they require preset or clear. Additionally a synchronous
reset signal is available for the IOE registers.
External Memory Interfacing
Cyclone II devices support a broad range of external memory interfaces
such as SDR SDRAM, DDR SDRAM, DDR2 SDRAM, and QDRII SRAM
external memories. Cyclone II devices feature dedicated high-speed
interfaces that transfer data between external memory devices at up to
167 MHz/333 Mbps for DDR and DDR2 SDRAM devices and
167 MHz/667 Mbps for QDRII SRAM devices. The programmable DQS
delay chain allows you to fine tune the phase shift for the input clocks or
strobes to properly align clock edges as needed to capture data.
2–44
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
In Cyclone II devices, all the I/O banks support SDR and DDR SDRAM
memory up to 167 MHz/333 Mbps. All I/O banks support DQS signals
with the DQ bus modes of ×8/×9, or ×16/×18. Table 2–14 shows the
external memory interfaces supported in Cyclone II devices.
Table 2–14. External Memory Support in Cyclone II Devices
Memory Standard
SDR SDRAM
DDR SDRAM
DDR2 SDRAM
QDRII SRAM (4)
Note (1)
Maximum Bus
Width
Maximum Clock
Rate Supported
(MHz)
Maximum Data
Rate Supported
(Mbps)
LVTTL (2)
72
167
167
SSTL-2 class I (2)
72
167
333 (1)
SSTL-2 class II (2)
72
133
267 (1)
I/O Standard
SSTL-18 class I (2)
72
167
333 (1)
SSTL-18 class II (3)
72
125
250 (1)
1.8-V HSTL class I
(2)
36
167
668 (1)
1.8-V HSTL class II
(3)
36
100
400 (1)
Notes to Table 2–14:
(1)
(2)
(3)
(4)
The data rate is for designs using the Clock Delay Control circuitry.
The I/O standards are supported on all the I/O banks of the Cyclone II device.
The I/O standards are supported only on the I/O banks on the top and bottom of the Cyclone II device.
For maximum performance, Altera recommends using the 1.8-V HSTL I/O standard because of higher I/O drive
strength. QDRII SRAM devices also support the 1.5-V HSTL I/O standard.
Cyclone II devices use data (DQ), data strobe (DQS), and clock pins to
interface with external memory. Figure 2–26 shows the DQ and DQS pins
in the ×8/×9 mode.
Altera Corporation
February 2007
2–45
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Figure 2–26. Cyclone II Device DQ & DQS Groups in ×8/×9 Mode
Notes (1), (2)
DQS Pin (2)
DQ Pins
DQ Pins
DM Pin
Notes to Figure 2–26:
(1)
(2)
Each DQ group consists of a DQS pin, DM pin, and up to nine DQ pins.
This is an idealized pin layout. For actual pin layout, refer to the pin table.
Cyclone II devices support the data strobe or read clock signal (DQS)
used in DDR and DDR2 SDRAM. Cyclone II devices can use either
bidirectional data strobes or unidirectional read clocks. The dedicated
external memory interface in Cyclone II devices also includes
programmable delay circuitry that can shift the incoming DQS signals to
center align the DQS signals within the data window.
The DQS signal is usually associated with a group of data (DQ) pins. The
phase-shifted DQS signals drive the global clock network, which is used
to clock the DQ signals on internal LE registers.
Table 2–15 shows the number of DQ pin groups per device.
Table 2–15. Cyclone II DQS & DQ Bus Mode Support (Part 1 of 2)
Device
EP2C5
Package
144-pin TQFP (2)
208-pin PQFP
EP2C8
EP2C15
EP2C20
144-pin TQFP (2)
Number of ×8
Groups
Note (1)
Number of ×9 Number of ×16 Number of ×18
Groups (5), (6)
Groups
Groups (5), (6)
3
3
0
0
7 (3)
4
3
3
3
3
0
0
208-pin PQFP
7 (3)
4
3
3
256-pin FineLine BGA®
8 (3)
4
4
4
256-pin FineLine BGA
8
4
4
4
484-pin FineLine BGA
16 (4)
8
8
8
256-pin FineLine BGA
8
4
4
4
484-pin FineLine BGA
16 (4)
8
8
8
2–46
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Table 2–15. Cyclone II DQS & DQ Bus Mode Support (Part 2 of 2)
Note (1)
Package
Number of ×8
Groups
EP2C35
484-pin FineLine BGA
16 (4)
8
8
8
672-pin FineLine BGA
20 (4)
8
8
8
EP2C50
484-pin FineLine BGA
16 (4)
8
8
8
672-pin FineLine BGA
20 (4)
8
8
8
EP2C70
672-pin FineLine BGA
20 (4)
8
8
8
896-pin FineLine BGA
20 (4)
8
8
8
Device
Number of ×9 Number of ×16 Number of ×18
Groups (5), (6)
Groups
Groups (5), (6)
Notes to Table 2–15:
(1)
(2)
(3)
(4)
(5)
(6)
Numbers are preliminary.
EP2C5 and EP2C8 devices in the 144-pin TQFP package do not have any DQ pin groups in I/O bank 1.
Because of available clock resources, only a total of 6 DQ/DQS groups can be implemented.
Because of available clock resources, only a total of 14 DQ/DQS groups can be implemented.
The ×9 DQS/DQ groups are also used as ×8 DQS/DQ groups. The ×18 DQS/DQ groups are also used as ×16
DQS/DQ groups.
For QDRI implementation, if you connect the D ports (write data) to the Cyclone II DQ pins, the total available ×9
DQS /DQ and ×18 DQS/DQ groups are half of that shown in Table 2–15.
You can use any of the DQ pins for the parity pins in Cyclone II devices.
The Cyclone II device family supports parity in the ×8/×9, and ×16/×18
mode. There is one parity bit available per eight bits of data pins.
The data mask, DM, pins are required when writing to DDR SDRAM and
DDR2 SDRAM devices. A low signal on the DM pin indicates that the
write is valid. If the DM signal is high, the memory masks the DQ signals.
In Cyclone II devices, the DM pins are assigned and are the preferred
pins. Each group of DQS and DQ signals requires a DM pin.
When using the Cyclone II I/O banks to interface with the DDR memory,
at least one PLL with two clock outputs is needed to generate the system
and write clock. The system clock is used to clock the DQS write signals,
commands, and addresses. The write clock is shifted by –90° from the
system clock and is used to clock the DQ signals during writes.
Figure 2–27 illustrates DDR SDRAM interfacing from the I/O through
the dedicated circuitry to the logic array.
Altera Corporation
February 2007
2–47
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Figure 2–27. DDR SDRAM Interfacing
DQS
OE
DQ
OE
LE
Register
LE
Register
t
Adjacent LAB LEs
LE
Register
LE
Register
VCC
LE
Register
DataA
LE
Register
LE
Register
GND
LE
Register
DataB
LE
Register
LE
Register
clk
PLL
LE
Register
LE
Register
Clock Delay
Control Circuitry
en/dis
-90˚ Shifted clk
Clock Control
Block
ENOUT
f
LE
Register
Global Clock
Resynchronizing
to System Clock
Dynamic Enable/Disable
Circuitry
ena_register_mode
For more information on Cyclone II external memory interfaces, see the
External Memory Interfaces chapter in Volume 1 of the Cyclone II Device
Handbook.
2–48
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Programmable Drive Strength
The output buffer for each Cyclone II device I/O pin has a programmable
drive strength control for certain I/O standards. The LVTTL, LVCMOS,
SSTL-2 class I and II, SSTL-18 class I and II, HSTL-18 class I and II, and
HSTL-1.5 class I and II standards have several levels of drive strength that
you can control. Using minimum settings provides signal slew rate
control to reduce system noise and signal overshoot. Table 2–16 shows
the possible settings for the I/O standards with drive strength control.
Table 2–16. Programmable Drive Strength (Part 1 of 2)
I/O Standard
IOH/IOL Current Strength Setting (mA)
Top & Bottom I/O Pins
LVTTL (3.3 V)
LVCMOS (3.3 V)
Note (1)
Side I/O Pins
4
4
8
8
12
12
16
16
20
20
24
24
4
4
8
8
12
12
16
20
24
LVTTL/LVCMOS (2.5 V)
4
4
8
8
12
16
LVTTL/LVCMOS (1.8 V)
Altera Corporation
February 2007
2
2
4
4
6
6
8
8
10
10
12
12
2–49
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Table 2–16. Programmable Drive Strength (Part 2 of 2)
I/O Standard
LVCMOS (1.5 V)
Note (1)
IOH/IOL Current Strength Setting (mA)
Top & Bottom I/O Pins
Side I/O Pins
2
2
4
4
6
6
8
SSTL-2 class I
8
8
12
12
SSTL-2 class II
16
16
20
24
SSTL-18 class I
6
6
8
8
10
10
12
SSTL-18 class II
16
18
HSTL-18 class I
HSTL-18 class II
8
8
10
10
12
12
16
18
20
HSTL-15 class I
8
8
10
12
HSTL-15 class II
16
Note to Table 2–16:
(1)
The default current in the Quartus II software is the maximum setting for each
I/O standard.
Open-Drain Output
Cyclone II devices provide an optional open-drain (equivalent to an
open-collector) output for each I/O pin. This open-drain output enables
the device to provide system-level control signals (that is, interrupt and
write-enable signals) that can be asserted by any of several devices.
2–50
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Slew Rate Control
Slew rate control is performed by using programmable output drive
strength.
Bus Hold
Each Cyclone II device user I/O pin provides an optional bus-hold
feature. The bus-hold circuitry can hold the signal on an I/O pin at its
last-driven state. Since the bus-hold feature holds the last-driven state of
the pin until the next input signal is present, an external pull-up or
pull-down resistor is not necessary to hold a signal level when the bus is
tri-stated.
The bus-hold circuitry also pulls undriven pins away from the input
threshold voltage where noise can cause unintended high-frequency
switching. You can select this feature individually for each I/O pin. The
bus-hold output drives no higher than VCCIO to prevent overdriving
signals.
1
If the bus-hold feature is enabled, the device cannot use the
programmable pull-up option. Disable the bus-hold feature
when the I/O pin is configured for differential signals. Bus hold
circuitry is not available on the dedicated clock pins.
The bus-hold circuitry is only active after configuration. When going into
user mode, the bus-hold circuit captures the value on the pin present at
the end of configuration.
The bus-hold circuitry uses a resistor with a nominal resistance (RBH) of
approximately 7 kΩ to pull the signal level to the last-driven state. Refer
to the DC Characteristics & Timing Specifications chapter in Volume 1 of the
Cyclone II Device Handbook for the specific sustaining current for each
VCCIO voltage level driven through the resistor and overdrive current
used to identify the next driven input level.
Programmable Pull-Up Resistor
Each Cyclone II device I/O pin provides an optional programmable
pull-up resistor during user mode. If you enable this feature for an I/O
pin, the pull-up resistor (typically 25 kΩ) holds the output to the VCCIO
level of the output pin’s bank.
1
Altera Corporation
February 2007
If the programmable pull-up is enabled, the device cannot use
the bus-hold feature. The programmable pull-up resistors are
not supported on the dedicated configuration, JTAG, and
dedicated clock pins.
2–51
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Advanced I/O Standard Support
Table 2–17 shows the I/O standards supported by Cyclone II devices and
which I/O pins support them.
Table 2–17. Cyclone II Supported I/O Standards & Constraints (Part 1 of 2)
VCCIO Level
I/O Standard
Top & Bottom
I/O Pins
Side I/O Pins
Type
Input Output
CLK, User I/O CLK,
PLL_OUT
DQS
Pins
DQS
User I/O
Pins
3.3-V LVTTL and LVCMOS
(1)
Single ended
3.3 V/
2.5 V
3.3 V
v
v
v
v
v
2.5-V LVTTL and LVCMOS
Single ended
3.3 V/
2.5 V
2.5 V
v
v
v
v
v
1.8-V LVTTL and LVCMOS
Single ended
1.8 V/
1.5 V
1.8 V
v
v
v
v
v
1.5-V LVCMOS
Single ended
1.8 V/
1.5 V
1.5 V
v
v
v
v
v
SSTL-2 class I
Voltage
referenced
2.5 V
2.5 V
v
v
v
v
v
SSTL-2 class II
Voltage
referenced
2.5 V
2.5 V
v
v
v
v
v
SSTL-18 class I
Voltage
referenced
1.8 V
1.8 V
v
v
v
v
v
SSTL-18 class II
Voltage
referenced
1.8 V
1.8 V
v
v
(2)
(2)
(2)
HSTL-18 class I
Voltage
referenced
1.8 V
1.8 V
v
v
v
v
v
HSTL-18 class II
Voltage
referenced
1.8 V
1.8 V
v
v
(2)
(2)
(2)
HSTL-15 class I
Voltage
referenced
1.5 V
1.5 V
v
v
v
v
v
HSTL-15 class II
Voltage
referenced
1.5 V
1.5 V
v
v
(2)
(2)
(2)
PCI and PCI-X (1) (3)
Single ended
3.3 V
3.3 V
v
v
(5)
2.5 V
2.5 V
(5)
Differential SSTL-2 class I or Pseudo
class II
differential (4)
Differential SSTL-18 class I
or class II
Pseudo
differential (4)
2–52
Cyclone II Device Handbook, Volume 1
(5)
1.8 V
1.8 V
(5)
v
v
v
v
(6)
(6)
v (7)
v
v
(6)
(6)
Altera Corporation
February 2007
Cyclone II Architecture
Table 2–17. Cyclone II Supported I/O Standards & Constraints (Part 2 of 2)
VCCIO Level
I/O Standard
Differential HSTL-18 class I
or class II
Side I/O Pins
Type
Input Output
Differential HSTL-15 class I
or class II
Top & Bottom
I/O Pins
Pseudo
differential (4)
Pseudo
differential (4)
(5)
1.5 V
1.5 V
(5)
(5)
1.8 V
CLK, User I/O CLK,
PLL_OUT
DQS
Pins
DQS
v (7)
v
v
(6)
(6)
v (7)
1.8 V
(5)
LVDS
Differential
2.5 V
2.5 V
RSDS and mini-LVDS (8)
Differential
(5)
2.5 V
LVPECL (9)
Differential
3.3 V/
2.5 V/
1.8 V/
1.5 V
User I/O
Pins
v
v
(6)
(6)
v
v
v
v
v
v
v
v
(5)
v
v
Notes to Table 2–17:
(1)
(2)
(3)
(4)
(5)
(6)
(7)
(8)
(9)
To drive inputs higher than VC C I O but less than 4.0 V, disable the PCI clamping diode and turn on the Allow
LVTTL and LVCMOS input levels to overdrive input buffer option in the Quartus II software.
These pins support SSTL-18 class II and 1.8- and 1.5-V HSTL class II inputs.
PCI-X does not meet the IV curve requirement at the linear region. PCI-clamp diode is not available on top and
bottom I/O pins.
Pseudo-differential HSTL and SSTL outputs use two single-ended outputs with the second output programmed
as inverted. Pseudo-differential HSTL and SSTL inputs treat differential inputs as two single-ended HSTL and
SSTL inputs and only decode one of them.
This I/O standard is not supported on these I/O pins.
This I/O standard is only supported on the dedicated clock pins.
PLL_OUT does not support differential SSTL-18 class II and differential 1.8 and 1.5-V HSTL class II.
mini-LVDS and RSDS are only supported on output pins.
LVPECL is only supported on clock inputs.
f
For more information on Cyclone II supported I/O standards, see the
Selectable I/O Standards in Cyclone II Devices chapter in Volume 1 of the
Cyclone II Device Handbook.
High-Speed Differential Interfaces
Cyclone II devices can transmit and receive data through LVDS signals at
a data rate of up to 640 Mbps and 805 Mbps, respectively. For the LVDS
transmitter and receiver, the Cyclone II device’s input and output pins
support serialization and deserialization through internal logic.
Altera Corporation
February 2007
2–53
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
The reduced swing differential signaling (RSDS) and mini-LVDS
standards are derivatives of the LVDS standard. The RSDS and
mini-LVDS I/O standards are similar in electrical characteristics to
LVDS, but have a smaller voltage swing and therefore provide increased
power benefits and reduced electromagnetic interference (EMI).
Cyclone II devices support the RSDS and mini-LVDS I/O standards at
data rates up to 311 Mbps at the transmitter.
A subset of pins in each I/O bank (on both rows and columns) support
the high-speed I/O interface. The dual-purpose LVDS pins require an
external-resistor network at the transmitter channels in addition to 100-Ω
termination resistors on receiver channels. These pins do not contain
dedicated serialization or deserialization circuitry. Therefore, internal
logic performs serialization and deserialization functions.
Cyclone II pin tables list the pins that support the high-speed I/O
interface. The number of LVDS channels supported in each device family
member is listed in Table 2–18.
Table 2–18. Cyclone II Device LVDS Channels (Part 1 of 2)
Device
EP2C5
EP2C8
Pin Count
Number of LVDS
Channels (1)
144
31 (35)
208
56 (60)
256
61 (65)
144
29 (33)
208
53 (57)
256
75 (79)
EP2C15
256
52 (60)
484
128 (136)
EP2C20
240
45 (53)
EP2C35
EP2C50
2–54
Cyclone II Device Handbook, Volume 1
256
52 (60)
484
128 (136)
484
131 (139)
672
201 (209)
484
119 (127)
672
189 (197)
Altera Corporation
February 2007
Cyclone II Architecture
Table 2–18. Cyclone II Device LVDS Channels (Part 2 of 2)
Device
EP2C70
Pin Count
Number of LVDS
Channels (1)
672
160 (168)
896
257 (265)
Note to Table 2–18:
(1)
The first number represents the number of bidirectional I/O pins which can be
used as inputs or outputs. The number in parenthesis includes dedicated clock
input pin pairs which can only be used as inputs.
You can use I/O pins and internal logic to implement a high-speed I/O
receiver and transmitter in Cyclone II devices. Cyclone II devices do not
contain dedicated serialization or deserialization circuitry. Therefore,
shift registers, internal PLLs, and IOEs are used to perform
serial-to-parallel conversions on incoming data and parallel-to-serial
conversion on outgoing data.
The maximum internal clock frequency for a receiver and for a
transmitter is 402.5 MHz. The maximum input data rate of 805 Mbps and
the maximum output data rate of 640 Mbps is only achieved when DDIO
registers are used. The LVDS standard does not require an input
reference voltage, but it does require a 100-Ω termination resistor
between the two signals at the input buffer. An external resistor network
is required on the transmitter side.
f
For more information on Cyclone II differential I/O interfaces, see the
High-Speed Differential Interfaces in Cyclone II Devices chapter in Volume 1
of the Cyclone II Device Handbook.
Series On-Chip Termination
On-chip termination helps to prevent reflections and maintain signal
integrity. This also minimizes the need for external resistors in high pin
count ball grid array (BGA) packages. Cyclone II devices provide I/O
driver on-chip impedance matching and on-chip series termination for
single-ended outputs and bidirectional pins.
Altera Corporation
February 2007
2–55
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Cyclone II devices support driver impedance matching to the impedance
of the transmission line, typically 25 or 50 Ω. When used with the output
drivers, on-chip termination sets the output driver impedance to 25 or
50 Ω. Cyclone II devices also support I/O driver series termination
(RS = 50 Ω) for SSTL-2 and SSTL-18. Table 2–19 lists the I/O standards that
support impedance matching and series termination.
Table 2–19. I/O Standards Supporting Series Termination
Note (1)
Target RS (Ω)
VCCIO (V)
3.3-V LVTTL and LVCMOS
25 (2)
3.3
2.5-V LVTTL and LVCMOS
50 (2)
2.5
1.8-V LVTTL and LVCMOS
50 (2)
1.8
SSTL-2 class I
50 (2)
2.5
SSTL-18 class I
50 (2)
1.8
I/O Standards
Notes to Table 2–19:
(1)
(2)
1
Supported conditions are VCCIO = VCCIO ±50 mV.
These RS values are nominal values. Actual impedance varies across process,
voltage, and temperature conditions.
The recommended frequency range of operation is pending
silicon characterization.
On-chip series termination can be supported on any I/O bank. VCCIO and
VREF must be compatible for all I/O pins in order to enable on-chip series
termination in a given I/O bank. I/O standards that support different RS
values can reside in the same I/O bank as long as their VCCIO and VREF are
not conflicting.
1
When using on-chip series termination, programmable drive
strength is not available.
Impedance matching is implemented using the capabilities of the output
driver and is subject to a certain degree of variation, depending on the
process, voltage and temperature. The actual tolerance is pending silicon
characterization.
2–56
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
I/O Banks
The I/O pins on Cyclone II devices are grouped together into I/O banks
and each bank has a separate power bus. EP2C5 and EP2C8 devices have
four I/O banks (see Figure 2–28), while EP2C15, EP2C20, EP2C35,
EP2C50, and EP2C70 devices have eight I/O banks (see Figure 2–29).
Each device I/O pin is associated with one I/O bank. To accommodate
voltage-referenced I/O standards, each Cyclone II I/O bank has a VREF
bus. Each bank in EP2C5, EP2C8, EP2C15, EP2C20, EP2C35, and EP2C50
devices supports two VREF pins and each bank of EP2C70 supports four
VREF pins. When using the VREF pins, each VREF pin must be properly
connected to the appropriate voltage level. In the event these pins are not
used as VREF pins, they may be used as regular I/O pins.
The top and bottom I/O banks (banks 2 and 4 in EP2C5 and EP2C8
devices and banks 3, 4, 7, and 8 in EP2C15, EP2C20, EP2C35, EP2C50, and
EP2C70 devices) support all I/O standards listed in Table 2–17, except the
PCI/PCI-X I/O standards. The left and right side I/O banks (banks 1 and
3 in EP2C5 and EP2C8 devices and banks 1, 2, 5, and 6 in EP2C15, EP2C20,
EP2C35, EP2C50, and EP2C70 devices) support I/O standards listed in
Table 2–17, except SSTL-18 class II, HSTL-18 class II, and HSTL-15 class II
I/O standards. See Table 2–17 for a complete list of supported I/O
standards.
The top and bottom I/O banks (banks 2 and 4 in EP2C5 and EP2C8
devices and banks 3, 4, 7, and 8 in EP2C15, EP2C20, EP2C35, EP2C50, and
EP2C70 devices) support DDR2 memory up to 167 MHz/333 Mbps and
QDR memory up to 167 MHz/668 Mbps. The left and right side I/O
banks (1 and 3 of EP2C5 and EP2C8 devices and 1, 2, 5, and 6 of EP2C15,
EP2C20, EP2C35, EP2C50, and EP2C70 devices) only support SDR and
DDR SDRAM interfaces. All the I/O banks of the Cyclone II devices
support SDR memory up to 167 MHz/167 Mbps and DDR memory up to
167 MHz/333 Mbps.
1
Altera Corporation
February 2007
DDR2 and QDRII interfaces may be implemented in Cyclone II
side banks if the use of class I I/O standard is acceptable.
2–57
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
Figure 2–28. EP2C5 & EP2C8 I/O Banks
Notes (1), (2)
I/O Bank 2 Also Supports
the SSTL-18 Class II,
HSTL-18 Class II, & HSTL-15
Class II I/O Standards
I/O Bank 2
I/O Bank 1
Also Supports the
3.3-V PCI & PCI-X
I/O Standards
I/O Bank 1
All I/O Banks Support
■ 3.3-V LVTTL/LVCMOS
■ 2.5-V LVTTL/LVCMOS
■ 1.8-V LVTTL/LVCMOS
■ 1.5-V LVCMOS
■ LVDS
■ RSDS
■ mini-LVDS
■ LVPECL (3)
■ SSTL-2 Class I and II
■ SSTL-18 Class I
■ HSTL-18 Class I
■ HSTL-15 Class I
■ Differential SSTL-2 (4)
■ Differential SSTL-18 (4)
■ Differential HSTL-18 (5)
■ Differential HSTL-15 (5)
I/O Bank 3
Also Supports the
3.3-V PCI & PCI-X
I/O Standards
I/O Bank 3
Individual
Power Bus
I/O Bank 4
I/O Bank 4 Also Supports
the SSTL-18 Class II,
HSTL-18 Class II, & HSTL-15
Class II I/O Standards
Notes to Figure 2–28:
(1)
(2)
(3)
(4)
(5)
This is a top view of the silicon die.
This is a graphic representation only. Refer to the pin list and the Quartus II software for exact pin locations.
The LVPECL I/O standard is only supported on clock input pins. This I/O standard is not supported on output
pins.
The differential SSTL-18 and SSTL-2 I/O standards are only supported on clock input pins and PLL output clock
pins.
The differential 1.8-V and 1.5-V HSTL I/O standards are only supported on clock input pins and PLL output clock
pins.
2–58
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Cyclone II Architecture
Figure 2–29. EP2C15, EP2C20, EP2C35, EP2C50 & EP2C70 I/O Banks
Notes (1), (2)
I/O Banks 3 & 4 Also Support
the SSTL-18 Class II,
HSTL-18 Class II, & HSTL-15
Class II I/O Standards
I/O Bank 3
I/O Bank 4
Individual
Power Bus
I/O Bank 2
I/O Banks 1 & 2 Also
Support the 3.3-V PCI
& PCI-X I/O Standards
I/O Bank 1
All I/O Banks Support
■ 3.3-V LVTTL/LVCMOS
■ 2.5-V LVTTL/LVCMOS
■ 1.8-V LVTTL/LVCMOS
■ 1.5-V LVCMOS
■ LVDS
■ RSDS
■ mini-LVDS
■ LVPECL (3)
■ SSTL-2 Class I and II
■ SSTL-18 Class I
■ HSTL-18 Class I
■ HSTL-15 Class I
■ Differential SSTL-2 (4)
■ Differential SSTL-18 (4)
■ Differential HSTL-18 (5)
■ Differential HSTL-15 (5)
Regular I/O Block
Bank 8
I/O Bank 5
I/O Banks 5 & 6 Also
Support the 3.3-V PCI
& PCI-X I/O Standards
I/O Bank 6
Regular I/O Block
Bank 7
I/O Banks 7 & 8 Also Support
the SSTL-18 Class II,
HSTL-18 Class II, & HSTL-15
Class II I/O Standards
Notes to Figure 2–29:
(1)
(2)
(3)
(4)
(5)
This is a top view of the silicon die.
This is a graphic representation only. Refer to the pin list and the Quartus II software for exact pin locations.
The LVPECL I/O standard is only supported on clock input pins. This I/O standard is not supported on output
pins.
The differential SSTL-18 and SSTL-2 I/O standards are only supported on clock input pins and PLL output clock
pins.
The differential 1.8-V and 1.5-V HSTL I/O standards are only supported on clock input pins and PLL output clock
pins.
Each I/O bank has its own VCCIO pins. A single device can support
1.5-V, 1.8-V, 2.5-V, and 3.3-V interfaces; each individual bank can support
a different standard with different I/O voltages. Each bank also has
dual-purpose VREF pins to support any one of the voltage-referenced
Altera Corporation
February 2007
2–59
Cyclone II Device Handbook, Volume 1
I/O Structure & Features
standards (e.g., SSTL-2) independently. If an I/O bank does not use
voltage-referenced standards, the VREF pins are available as user I/O
pins.
Each I/O bank can support multiple standards with the same VCCIO for
input and output pins. For example, when VCCIO is 3.3-V, a bank can
support LVTTL, LVCMOS, and 3.3-V PCI for inputs and outputs.
Voltage-referenced standards can be supported in an I/O bank using any
number of single-ended or differential standards as long as they use the
same VREF and a compatible VCCIO value.
MultiVolt I/O Interface
The Cyclone II architecture supports the MultiVolt I/O interface feature,
which allows Cyclone II devices in all packages to interface with systems
of different supply voltages. Cyclone II devices have one set of VCC pins
(VCCINT) that power the internal device logic array and input buffers that
use the LVPECL, LVDS, HSTL, or SSTL I/O standards. Cyclone II devices
also have four or eight sets of VCC pins (VCCIO) that power the I/O
output drivers and input buffers that use the LVTTL, LVCMOS, or PCI
I/O standards.
The Cyclone II VCCINT pins must always be connected to a 1.2-V power
supply. If the VCCINT level is 1.2 V, then input pins are 1.5-V, 1.8-V, 2.5-V,
and 3.3-V tolerant. The VCCIO pins can be connected to either a 1.5-V,
1.8-V, 2.5-V, or 3.3-V power supply, depending on the output
requirements. The output levels are compatible with systems of the same
voltage as the power supply (i.e., when VCCIO pins are connected to a
1.5-V power supply, the output levels are compatible with 1.5-V systems).
When VCCIO pins are connected to a 3.3-V power supply, the output high
is 3.3-V and is compatible with 3.3-V systems. Table 2–20 summarizes
Cyclone II MultiVolt I/O support.
Table 2–20. Cyclone II MultiVolt I/O Support (Part 1 of 2)
Note (1)
Input Signal
VCCIO (V)
Output Signal
1.5 V
1.8 V
2.5 V
3.3 V
1.5 V
1.5
v
v
v (2)
v (2)
v
1.8
v (4)
v
v (2)
v (2)
v (3)
v
v
v
v (5)
v (5)
2.5
2–60
Cyclone II Device Handbook, Volume 1
1.8 V
2.5 V
3.3 V
v
Altera Corporation
February 2007
Cyclone II Architecture
Table 2–20. Cyclone II MultiVolt I/O Support (Part 2 of 2)
Note (1)
Input Signal
VCCIO (V)
1.5 V
3.3
1.8 V
Output Signal
2.5 V
3.3 V
1.5 V
1.8 V
2.5 V
3.3 V
v (4)
v
v (6)
v (6)
v (6)
v
Notes to Table 2–20:
(1)
(2)
(3)
(4)
(5)
(6)
The PCI clamping diode must be disabled to drive an input with voltages higher than VCCIO.
These input values overdrive the input buffer, so the pin leakage current is slightly higher than the default value.
To drive inputs higher than VCCIO but less than 4.0 V, disable the PCI clamping diode and turn on Allow voltage
overdrive for LVTTL/LVCMOS input pins option in Device setting option in the Quartus II software.
When VCCIO = 1.8-V, a Cyclone II device can drive a 1.5-V device with 1.8-V tolerant inputs.
When VCCIO = 3.3-V and a 2.5-V input signal feeds an input pin or when VC C I O = 1.8-V and a 1.5-V input signal
feeds an input pin, the VCCIO supply current will be slightly larger than expected. The reason for this increase is
that the input signal level does not drive to the VCCIO rail, which causes the input buffer to not completely shut off.
When VCCIO = 2.5-V, a Cyclone II device can drive a 1.5-V or 1.8-V device with 2.5-V tolerant inputs.
When VCCIO = 3.3-V, a Cyclone II device can drive a 1.5-V, 1.8-V, or 2.5-V device with 3.3-V tolerant inputs.
Altera Corporation
February 2007
2–61
Cyclone II Device Handbook, Volume 1
Document Revision History
Document
Revision History
Table 2–21 shows the revision history for this document.
Table 2–21. Document Revision History
Date &
Document
Version
February 2007
v3.1
Changes Made
●
●
●
●
●
●
November 2005
v2.1
●
●
●
●
●
●
July 2005 v2.0
●
●
February 2005
v1.2
Added document revision history.
Removed Table 2-1.
Updated Figure 2–25.
Added new Note (1) to Table 2–17.
Added handpara note in “I/O Banks” section.
Updated Note (2) to Table 2–20.
Summary of Changes
●
●
Removed Drive Strength
Control from Figure 2–25.
Elaboration of DDR2 and
QDRII interfaces supported
by I/O bank included.
Updated Table 2–7.
Updated Figures 2–11 and 2–12.
Updated Programmable Drive Strength table.
Updated Table 2–16.
Updated Table 2–18.
Updated Table 2–19.
Updated technical content throughout.
Updated Table 2–16.
Updated figure 2-12.
November 2004 Updated Table 2–19.
v1.1
June 2004 v1.0
Added document to the Cyclone II Device Handbook.
2–62
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
3. Configuration & Testing
CII51003-2.2
IEEE Std. 1149.1
(JTAG) Boundary
Scan Support
All Cyclone® II devices provide JTAG BST circuitry that complies with
the IEEE Std. 1149.1. JTAG boundary-scan testing can be performed
either before or after, but not during configuration. Cyclone II devices can
also use the JTAG port for configuration with the Quartus® II software or
hardware using either Jam Files (.jam) or Jam Byte-Code Files (.jbc).
Cyclone II devices support IOE I/O standard reconfiguration through the
JTAG BST chain. The JTAG chain can update the I/O standard for all
input and output pins any time before or during user mode through the
CONFIG_IO instruction. You can use this capability for JTAG testing
before configuration when some of the Cyclone II pins drive or receive
from other devices on the board using voltage-referenced standards.
Since the Cyclone II device might not be configured before JTAG testing,
the I/O pins may not be configured for appropriate electrical standards
for chip-to-chip communication. Programming the I/O standards via
JTAG allows you to fully test I/O connections to other devices.
f
For information on I/O reconfiguration, refer to the MorphIO: An I/O
Reconfiguration Solution for Altera Devices White Paper.
A device operating in JTAG mode uses four required pins: TDI, TDO, TMS,
and TCK. The TCK pin has an internal weak pull-down resister, while the
TDI and TMS pins have weak internal pull-up resistors. The TDO output
pin and all JTAG input pin voltage is determined by the VCCIO of the bank
where it resides. The bank VCCIO selects whether the JTAG inputs are 1.5-,
1.8-, 2.5-, or 3.3-V compatible.
1
Altera Corporation
February 2007
Stratix® II, Stratix, Cyclone II and Cyclone devices must be
within the first 8 devices in a JTAG chain. All of these devices
have the same JTAG controller. If any of the Stratix II, Stratix,
Cyclone II or Cyclone devices are in the 9th of further position,
they fail configuration. This does not affect Signal Tap II.
3–1
IEEE Std. 1149.1 (JTAG) Boundary Scan Support
Cyclone II devices also use the JTAG port to monitor the logic operation
of the device with the SignalTap® II embedded logic analyzer. Cyclone II
devices support the JTAG instructions shown in Table 3–1.
Table 3–1. Cyclone II JTAG Instructions (Part 1 of 2)
JTAG Instruction
Instruction Code
Description
SAMPLE/PRELOAD
00 0000 0101
Allows a snapshot of signals at the device pins to be captured and
examined during normal device operation, and permits an initial
data pattern to be output at the device pins. Also used by the
SignalTap II embedded logic analyzer.
EXTEST (1)
00 0000 1111
Allows the external circuitry and board-level interconnects to be
tested by forcing a test pattern at the output pins and capturing test
results at the input pins.
BYPASS
11 1111 1111
Places the 1-bit bypass register between the TDI and TDO pins,
which allows the BST data to pass synchronously through selected
devices to adjacent devices during normal device operation.
USERCODE
00 0000 0111
Selects the 32-bit USERCODE register and places it between the
TDI and TDO pins, allowing the USERCODE to be serially shifted
out of TDO.
IDCODE
00 0000 0110
Selects the IDCODE register and places it between TDI and TDO,
allowing the IDCODE to be serially shifted out of TDO.
HIGHZ (1)
00 0000 1011
Places the 1-bit bypass register between the TDI and TDO pins,
which allows the BST data to pass synchronously through selected
devices to adjacent devices during normal device operation, while
tri-stating all of the I/O pins.
CLAMP (1)
00 0000 1010
Places the 1-bit bypass register between the TDI and TDO pins,
which allows the BST data to pass synchronously through selected
devices to adjacent devices during normal device operation while
holding I/O pins to a state defined by the data in the boundary-scan
register.
ICR
instructions
PULSE_NCONFIG
Used when configuring a Cyclone II device via the JTAG port with
a USB Blaster™, ByteBlaster™ II, MasterBlaster™ or
ByteBlasterMV™ download cable, or when using a Jam File or JBC
File via an embedded processor.
00 0000 0001
3–2
Cyclone II Device Handbook, Volume 1
Emulates pulsing the nCONFIG pin low to trigger reconfiguration
even though the physical pin is unaffected.
Altera Corporation
February 2007
Configuration & Testing
Table 3–1. Cyclone II JTAG Instructions (Part 2 of 2)
JTAG Instruction
CONFIG_IO
SignalTap II
instructions
Instruction Code
00 0000 1101
Description
Allows configuration of I/O standards through the JTAG chain for
JTAG testing. Can be executed before, after, or during
configuration. Stops configuration if executed during configuration.
Once issued, the CONFIG_IO instruction holds nSTATUS low to
reset the configuration device. nSTATUS is held low until the
device is reconfigured.
Monitors internal device operation with the SignalTap II embedded
logic analyzer.
Note to Table 3–1:
(1)
Bus hold and weak pull-up resistor features override the high-impedance state of HIGHZ, CLAMP, and EXTEST.
The Quartus II software has an Auto Usercode feature where you can
choose to use the checksum value of a programming file as the JTAG user
code. If selected, the checksum is automatically loaded to the USERCODE
register. In the Settings dialog box in the Assignments menu, click Device
& Pin Options, then General, and then turn on the Auto Usercode
option.
Altera Corporation
February 2007
3–3
Cyclone II Device Handbook, Volume 1
IEEE Std. 1149.1 (JTAG) Boundary Scan Support
The Cyclone II device instruction register length is 10 bits and the
USERCODE register length is 32 bits. Tables 3–2 and 3–3 show the
boundary-scan register length and device IDCODE information for
Cyclone II devices.
Table 3–2. Cyclone II Boundary-Scan Register Length
Device
Boundary-Scan Register Length
EP2C5
498
EP2C8
597
EP2C15
969
EP2C20
969
EP2C35
1,449
EP2C50
1,374
EP2C70
1,890
Table 3–3. 32-Bit Cyclone II Device IDCODE
IDCODE (32 Bits) (1)
Device
Version (4 Bits)
Part Number (16 Bits)
Manufacturer Identity (11 Bits)
LSB (1 Bit) (2)
EP2C5
0000
0010 0000 1011 0001
000 0110 1110
1
EP2C8
0000
0010 0000 1011 0010
000 0110 1110
1
EP2C15
0000
0010 0000 1011 0011
000 0110 1110
1
EP2C20
0000
0010 0000 1011 0011
000 0110 1110
1
EP2C35
0000
0010 0000 1011 0100
000 0110 1110
1
EP2C50
0000
0010 0000 1011 0101
000 0110 1110
1
EP2C70
0000
0010 0000 1011 0110
000 0110 1110
1
Notes to Table 3–3:
(1)
(2)
The most significant bit (MSB) is on the left.
The IDCODE’s least significant bit (LSB) is always 1.
For more information on the Cyclone II JTAG specifications, refer to the
DC Characteristics & Timing Specifications chapter in the Cyclone II Device
Handbook, Volume 1.
3–4
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Configuration & Testing
SignalTap II
Embedded Logic
Analyzer
f
Configuration
Cyclone II devices support the SignalTap II embedded logic analyzer,
which monitors design operation over a period of time through the IEEE
Std. 1149.1 (JTAG) circuitry. You can analyze internal logic at speed
without bringing internal signals to the I/O pins. This feature is
particularly important for advanced packages, such as FineLine BGA®
packages, because it can be difficult to add a connection to a pin during
the debugging process after a board is designed and manufactured.
For more information on the SignalTap II, see the Signal Tap chapter of
the Quartus II Handbook, Volume 3.
The logic, circuitry, and interconnects in the Cyclone II architecture are
configured with CMOS SRAM elements. Altera FPGA devices are
reconfigurable and every device is tested with a high coverage
production test program so you do not have to perform fault testing and
can instead focus on simulation and design verification.
Cyclone II devices are configured at system power-up with data stored in
an Altera configuration device or provided by a system controller. The
Cyclone II device’s optimized interface allows the device to act as
controller in an active serial configuration scheme with EPCS serial
configuration devices. The serial configuration device can be
programmed via SRunner, the ByteBlaster II or USB Blaster download
cable, the Altera Programming Unit (APU), or third-party programmers.
In addition to EPCS serial configuration devices, Altera offers in-system
programmability (ISP)-capable configuration devices that can configure
Cyclone II devices via a serial data stream using the Passive serial (PS)
configuration mode. The PS interface also enables microprocessors to
treat Cyclone II devices as memory and configure them by writing to a
virtual memory location, simplifying reconfiguration. After a Cyclone II
device has been configured, it can be reconfigured in-circuit by resetting
the device and loading new configuration data. Real-time changes can be
made during system operation, enabling innovative reconfigurable
applications.
Operating
Modes
Altera Corporation
February 2007
The Cyclone II architecture uses SRAM configuration elements that
require configuration data to be loaded each time the circuit powers up.
The process of physically loading the SRAM data into the device is called
configuration. During initialization, which occurs immediately after
configuration, the device resets registers, enables I/O pins, and begins to
operate as a logic device. You can use the 10MHz internal oscillator or the
optional CLKUSR pin during the initialization. The 10 MHz internal
oscillator is disabled in user mode. Together, the configuration and
initialization processes are called command mode. Normal device
operation is called user mode.
3–5
Cyclone II Device Handbook, Volume 1
Configuration Schemes
SRAM configuration elements allow Cyclone II devices to be
reconfigured in-circuit by loading new configuration data into the device.
With real-time reconfiguration, the device is forced into command mode
with the nCONFIG pin. The configuration process loads different
configuration data, reinitializes the device, and resumes user-mode
operation. You can perform in-field upgrades by distributing new
configuration files within the system or remotely.
A built-in weak pull-up resistor pulls all user I/O pins to VCCIO before
and during device configuration.
The configuration pins support 1.5-V/1.8-V or 2.5-V/3.3-V I/O
standards. The voltage level of the configuration output pins is
determined by the VCCIO of the bank where the pins reside. The bank
VCCIO selects whether the configuration inputs are 1.5-V, 1.8-V, 2.5-V, or
3.3-V compatible.
Configuration
Schemes
You can load the configuration data for a Cyclone II device with one of
three configuration schemes (see Table 3–4), chosen on the basis of the
target application. You can use a configuration device, intelligent
controller, or the JTAG port to configure a Cyclone II device. A low-cost
configuration device can automatically configure a Cyclone II device at
system power-up.
Multiple Cyclone II devices can be configured in any of the three
configuration schemes by connecting the configuration enable (nCE) and
configuration enable output (nCEO) pins on each device.
Table 3–4. Data Sources for Configuration
Configuration
Scheme
Data Source
Active serial (AS)
Low-cost serial configuration device
Passive serial (PS) Enhanced or EPC2 configuration device, MasterBlaster, ByteBlasterMV, ByteBlaster II or
USB Blaster download cable, or serial data source
JTAG
MasterBlaster, ByteBlasterMV, ByteBlaster II or USB Blaster download cable or a
microprocessor with a Jam or JBC file
f
For more information on configuration, see the Configuring Cyclone II
Devices chapter of the Cyclone II Handbook, Volume 2.
3–6
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Configuration & Testing
Cyclone II
Automated
Single Event
Upset Detection
Cyclone II devices offer on-chip circuitry for automated checking of
single event upset (SEU) detection. Some applications that require the
device to operate error free at high elevations or in close proximity to
earth’s North or South Pole require periodic checks to ensure continued
data integrity. The error detection cyclic redundancy code (CRC) feature
controlled by the Device & Pin Options dialog box in the Quartus II
software uses a 32-bit CRC circuit to ensure data reliability and is one of
the best options for mitigating SEU.
You can implement the error detection CRC feature with existing circuitry
in Cyclone II devices, eliminating the need for external logic. For
Cyclone II devices, the CRC is pre-computed by Quartus II software and
then sent to the device as part of the POF file header. The CRC_ERROR pin
reports a soft error when configuration SRAM data is corrupted,
indicating to the user to preform a device reconfiguration.
Custom-Built Circuitry
Dedicated circuitry in the Cyclone II devices performs error detection
automatically. This error detection circuitry in Cyclone II devices
constantly checks for errors in the configuration SRAM cells while the
device is in user mode. You can monitor one external pin for the error and
use it to trigger a re-configuration cycle. You can select the desired time
between checks by adjusting a built-in clock divider.
Software Interface
In the Quartus II software version 4.1 and later, you can turn on the
automated error detection CRC feature in the Device & Pin Options
dialog box. This dialog box allows you to enable the feature and set the
internal frequency of the CRC checker between 400 kHz to 80 MHz. This
controls the rate that the CRC circuitry verifies the internal configuration
SRAM bits in the FPGA device.
f
Altera Corporation
February 2007
For more information on CRC, refer to AN: 357 Error Detection Using CRC
in Altera FPGAs.
3–7
Cyclone II Device Handbook, Volume 1
Document Revision History
Document
Revision History
Table 3–5 shows the revision history for this document.
Table 3–5. Document Revision History
Date &
Document
Version
February 2007
v2.2
Changes Made
●
●
●
Added document revision history.
Added new handpara nore in “IEEE Std. 1149.1 (JTAG)
Boundary Scan Support” section.
Updated “Cyclone II Automated Single Event Upset
Detection” section.
July 2005 v2.0
Updated technical content.
February 2005
v1.2
Updated information on JTAG chain limitations.
Summary of Changes
●
●
Added information about
limitation of cascading
multi devices in the same
JTAG chain.
Corrected information on
CRC calculation.
November 2004 Updated Table 3–4.
v1.1
June 2004 v1.0
Added document to the Cyclone II Device Handbook.
3–8
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
4. Hot Socketing & Power-On
Reset
CII51004-3.1
Introduction
Cyclone® II devices offer hot socketing (also known as hot plug-in, hot
insertion, or hot swap) and power sequencing support without the use of
any external devices. You can insert or remove a Cyclone II board in a
system during system operation without causing undesirable effects to
the board or to the running system bus.
The hot-socketing feature lessens the board design difficulty when using
Cyclone II devices on printed circuit boards (PCBs) that also contain a
mixture of 3.3-, 2.5-, 1.8-, and 1.5-V devices. With the Cyclone II
hot-socketing feature, you no longer need to ensure a proper power-up
sequence for each device on the board.
The Cyclone II hot-socketing feature provides:
■
■
■
Board or device insertion and removal without external components
or board manipulation
Support for any power-up sequence
Non-intrusive I/O buffers to system buses during hot insertion
This chapter also discusses the power-on reset (POR) circuitry in
Cyclone II devices. The POR circuitry keeps the devices in the reset state
until the VCC is within operating range.
Cyclone II
Hot-Socketing
Specifications
Cyclone II devices offer hot-socketing capability with all three features
listed above without any external components or special design
requirements. The hot-socketing feature in Cyclone II devices offers the
following:
■
■
Altera Corporation
February 2007
The device can be driven before power-up without any damage to
the device itself.
I/O pins remain tri-stated during power-up. The device does not
drive out before or during power-up, thereby affecting other buses
in operation.
4–1
Cyclone II Hot-Socketing Specifications
Devices Can Be Driven before Power-Up
You can drive signals into the I/O pins, dedicated input pins, and
dedicated clock pins of Cyclone II devices before or during power-up or
power-down without damaging the device. Cyclone II devices support
any power-up or power-down sequence (VCCIO and VCCINT) to simplify
system level design.
I/O Pins Remain Tri-Stated during Power-Up
A device that does not support hot socketing may interrupt system
operation or cause contention by driving out before or during power-up.
In a hot-socketing situation, the Cyclone II device’s output buffers are
turned off during system power-up or power-down. The Cyclone II
device also does not drive out until the device is configured and has
attained proper operating conditions. The I/O pins are tri-stated until the
device enters user mode with a weak pull-up resistor (R) to 3.3V. Refer to
Figure 4–1 for more information.
1
■
■
You can power up or power down the VCCIO and VCCINT pins in
any sequence. The VCCIO and VCCINT must have monotonic rise
to their steady state levels. (Refer to Figure 4–3 for more
information.) The power supply ramp rates can range from
100 µs to 100 ms for non “A” devices. Both VCC supplies must
power down within 100 ms of each other to prevent I/O pins
from driving out. During hot socketing, the I/O pin capacitance
is less than 15 pF and the clock pin capacitance is less than 20 pF.
Cyclone II devices meet the following hot-socketing
specification.
The hot-socketing DC specification is | IIOPIN | < 300 µA.
The hot-socketing AC specification is | IIOPIN | < 8 mA for 10 ns or
less.
This specification takes into account the pin capacitance but not board
trace and external loading capacitance. You must consider additional
capacitance for trace, connector, and loading separately.
IIOPIN is the current at any user I/O pin on the device. The DC
specification applies when all VCC supplies to the device are stable in the
powered-up or powered-down conditions. For the AC specification, the
peak current duration due to power-up transients is 10 ns or less.
A possible concern for semiconductor devices in general regarding hot
socketing is the potential for latch-up. Latch-up can occur when electrical
subsystems are hot socketed into an active system. During hot socketing,
the signal pins may be connected and driven by the active system before
4–2
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Hot Socketing & Power-On Reset
the power supply can provide current to the device’s VCC and ground
planes. This condition can lead to latch-up and cause a low-impedance
path from VCC to ground within the device. As a result, the device extends
a large amount of current, possibly causing electrical damage.
Altera has ensured by design of the I/O buffers and hot-socketing
circuitry, that Cyclone II devices are immune to latch-up during hot
socketing.
Hot-Socketing
Feature
Implementation
in Cyclone II
Devices
The hot-socketing feature turns off the output buffer during power up
(either VCCINT or VCCIO supplies) or power down. The hot-socket circuit
generates an internal HOTSCKT signal when either VCCINT or VCCIO is
below the threshold voltage. Designs cannot use the HOTSCKT signal for
other purposes. The HOTSCKT signal cuts off the output buffer to ensure
that no DC current (except for weak pull-up leakage current) leaks
through the pin. When VCC ramps up slowly, VCC is still relatively low
even after the internal POR signal (not available to the FPGA fabric used
by customer designs) is released and the configuration is finished. The
CONF_DONE, nCEO, and nSTATUS pins fail to respond, as the output
buffer cannot drive out because the hot-socketing circuitry keeps the I/O
pins tristated at this low VCC voltage. Therefore, the hot-socketing circuit
has been removed on these configuration output or bidirectional pins to
ensure that they are able to operate during configuration. These pins are
expected to drive out during power-up and power-down sequences.
Each I/O pin has the circuitry shown in Figure 4–1.
Altera Corporation
February 2007
4–3
Cyclone II Device Handbook, Volume 1
Hot-Socketing Feature Implementation in Cyclone II Devices
Figure 4–1. Hot-Socketing Circuit Block Diagram for Cyclone II Devices
Power-On
Reset
Monitor
Output
Weak
Pull-Up
Resistor
R
Output Enable
Voltage
Tolerance
Control
PAD
Hot Socket
Output
Pre-Driver
Input Buffer
to Logic Array
The POR circuit monitors VCCINT voltage level and keeps I/O pins
tri-stated until the device is in user mode. The weak pull-up resistor (R)
from the I/O pin to VCCIO keeps the I/O pins from floating. The voltage
tolerance control circuit permits the I/O pins to be driven by 3.3 V before
VCCIO and/or VCCINT are powered, and it prevents the I/O pins from
driving out when the device is not in user mode.
f
For more information, see the DC Characteristics & Timing Specifications
chapter in Volume 1 of the Cyclone II Device Handbook for the value of the
internal weak pull-up resistors.
Figure 4–2 shows a transistor level cross section of the Cyclone II device
I/O buffers. This design ensures that the output buffers do not drive
when VCCIO is powered before VCCINT or if the I/O pad voltage is higher
than VCCIO. This also applies for sudden voltage spikes during hot
socketing. The VPAD leakage current charges the voltage tolerance control
circuit capacitance.
4–4
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Hot Socketing & Power-On Reset
Figure 4–2. Transistor Level Diagram of FPGA Device I/O Buffers
VPAD
Logic Array
Signal
(1)
(2)
VCCIO
n+
n+
p+
p+
n+
n-well
p-well
p-substrate
Notes to Figure 4–2:
(1)
(2)
Power-On Reset
Circuitry
This is the logic array signal or the larger of either the VCCIO or VPAD signal.
This is the larger of either the VCCIO or VPAD signal.
Cyclone II devices contain POR circuitry to keep the device in a reset state
until the power supply voltage levels have stabilized during power-up.
The POR circuit monitors the VCCINT voltage levels and tri-states all user
I/O pins until the VCC reaches the recommended operating levels. In
addition, the POR circuitry also monitors the VCCIO level of the two I/O
banks that contains configuration pins (I/O banks 1 and 3 for EP2C5 and
EP2C8, I/O banks 2 and 6 for EP2C15A, EP2C20, EP2C35, EP2C50, and
EP2C70) and tri-states all user I/O pins until the VCC reaches the
recommended operating levels.
After the Cyclone II device enters user mode, the POR circuit continues to
monitor the VCCINT voltage level so that a brown-out condition during
user mode can be detected. If the VCCINT voltage sags below the POR trip
point during user mode, the POR circuit resets the device. If the VCCIO
voltage sags during user mode, the POR circuit does not reset the device.
"Wake-up" Time for Cyclone II Devices
In some applications, it may be necessary for a device to wake up very
quickly in order to begin operation. The Cyclone II device family offers
the Fast-On feature to support fast wake-up time applications. Devices
that support the Fast-On feature are designated with an “A” in the
ordering code and have stricter power up requirements compared to nonA devices.
Altera Corporation
February 2007
4–5
Cyclone II Device Handbook, Volume 1
Power-On Reset Circuitry
For Cyclone II devices, wake-up time consists of power-up, POR,
configuration, and initialization. The device must properly go through all
four stages to configure correctly and begin operation. You can calculate
wake-up time using the following equation:
Wake-Up Time = VCC Ramp Time + POR Time + Configuration Time + Initialization Time
Figure 4–3 illustrates the components of wake up time.
Figure 4–3. Cyclone II Wake-Up Time
Voltage
VCC Minimum
Time
VCC Ramp
Time
POR Time
Configuration Time
Initialization
Time
User
Mode
Note to Figure 4–3:
(1)
VCC ramp must be monotonic.
The VCC ramp time and POR time will depend on the device
characteristics and the power supply used in your system. The fast-on
devices require a maximum VCC ramp time of 2 ms and have a maximum
POR time of 12 ms.
Configuration time will depend on the configuration mode chosen and
the configuration file size. You can calculate configuration time by
multiplying the number of bits in the configuration file with the period of
the configuration clock. For fast configuration times, you should use
Passive Serial (PS) configuration mode with maximum DCLK frequency
of 100 MHz. In addition, you can use compression to reduce the
configuration file size and speed up the configuration time. The tCD2UM
or tCD2UMC parameters will determine the initialization time.
1
For more information on the tCD2UM or tCD2UMC parameters, refer
to the Configuring Cyclone II Devices chapter in the Cyclone II
Device Handbook.
4–6
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
Hot Socketing & Power-On Reset
If you cannot meet the maximum VCC ramp time requirement, you must
use an external component to hold nCONFIG low until the power supplies
have reached their minimum recommend operating levels. Otherwise,
the device may not properly configure and enter user mode.
Conclusion
Cyclone II devices are hot socketable and support all power-up and
power-down sequences with the one requirement that VCCIO and VCCINT
be powered up and down within 100 ms of each other to keep the I/O
pins from driving out. Cyclone II devices do not require any external
devices for hot socketing and power sequencing.
Document
Revision History
Table 4–1 shows the revision history for this document.
Table 4–1. Document Revision History
Date &
Document
Version
February 2007
v3.1
Changes Made
●
●
●
●
Summary of Changes
Added document revision history.
Updated “I/O Pins Remain Tri-Stated during Power-Up”
section.
Updated “Power-On Reset Circuitry” section.
Added footnote to Figure 4–3.
●
●
●
July 2005 v2.0
Updated technical content throughout.
February 2005
v1.1
Removed ESD section.
June 2004 v1.0
Added document to the Cyclone II Device Handbook.
Altera Corporation
February 2007
Specified VCCIO and VCCINT
supplies must be GND
when "not powered".
Added clarification about
input-tristate behavior.
Added infomation on VCC
monotonic ramp.
4–7
Cyclone II Device Handbook, Volume 1
Document Revision History
4–8
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
5. DC Characteristics and
Timing Specifications
CII51005-4.0
Operating
Conditions
Cyclone® II devices are offered in commercial, industrial, automotive,
and extended temperature grades. Commercial devices are offered in –6
(fastest), –7, and –8 speed grades.
All parameter limits are representative of worst-case supply voltage and
junction temperature conditions. Unless otherwise noted, the parameter
values in this chapter apply to all Cyclone II devices. AC and DC
characteristics are specified using the same numbers for commercial,
industrial, and automotive grades. All parameters representing voltages
are measured with respect to ground.
Tables 5–1 through 5–4 provide information on absolute maximum
ratings.
Table 5–1. Cyclone II Device Absolute Maximum Ratings
Symbol
Parameter
VCCINT
Supply voltage
VCCIO
Output supply voltage
Notes (1), (2)
Conditions
With respect to ground
VCCA_PLL [1..4] PLL supply voltage
VIN
DC input voltage (3)
—
IOUT
DC output current, per pin
TSTG
Storage temperature
No bias
TJ
Junction temperature
BGA packages under bias
—
Minimum Maximum
Unit
–0.5
1.8
V
–0.5
4.6
V
–0.5
1.8
V
–0.5
4.6
V
–25
40
mA
–65
150
°C
—
125
°C
Notes to Table 5–1:
(1)
(2)
(3)
Conditions beyond those listed in this table cause permanent damage to a device. These are stress ratings only.
Functional operation at these levels or any other conditions beyond those specified in this chapter is not implied.
Additionally, device operation at the absolute maximum ratings for extended periods of time may have adverse
effect on the device reliability.
Refer to the Operating Requirements for Altera Devices Data Sheet for more information.
During transitions, the inputs may overshoot to the voltage shown in Table 5–4 based upon the input duty cycle.
The DC case is equivalent to 100% duty cycle. During transition, the inputs may undershoot to –2.0 V for input
currents less than 100 mA and periods shorter than 20 ns.
Altera Corporation
February 2008
5–1
Operating Conditions
Table 5–2 specifies the recommended operating conditions for Cyclone II
devices. It shows the allowed voltage ranges for VCCINT, VCCIO, and the
operating junction temperature (TJ). The LVTTL and LVCMOS inputs are
powered by VCCIO only. The LVDS and LVPECL input buffers on
dedicated clock pins are powered by VCCINT. The SSTL, HSTL, LVDS
input buffers are powered by both VCCINT and VCCIO.
Table 5–2. Recommended Operating Conditions
Conditions
Minimum
Maximum
Unit
VCCINT
Symbol
Supply voltage for internal
logic and input buffers
(1)
1.15
1.25
V
VCCIO (2)
Supply voltage for output
buffers, 3.3-V operation
(1)
3.135 (3.00)
3.465 (3.60)
(3)
V
Supply voltage for output
buffers, 2.5-V operation
(1)
2.375
2.625
V
Supply voltage for output
buffers, 1.8-V operation
(1)
1.71
1.89
V
Supply voltage for output
buffers, 1.5-V operation
(1)
1.425
1.575
V
TJ
Parameter
Operating junction
temperature
For commercial use
0
85
°C
For industrial use
–40
100
°C
For extended
temperature use
–40
125
°C
For automotive use
–40
125
°C
Notes to Table 5–2:
(1)
(2)
(3)
The VCC must rise monotonically. The maximum VCC (both VCCIO and VCCINT) rise time is 100 ms for non-A devices
and 2 ms for A devices.
The VCCIO range given here spans the lowest and highest operating voltages of all supported I/O standards. The
recommended VCCIO range specific to each of the single-ended I/O standards is given in Table 5–6, and those
specific to the differential standards is given in Table 5–8.
The minimum and maximum values of 3.0 V and 3.6 V, respectively, for VCCIO only applies to the PCI and PCI-X
I/O standards. Refer to Table 5–6 for the voltage range of other I/O standards.
5–2
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–3. DC Characteristics for User I/O, Dual-Purpose, and Dedicated Pins (Part 1 of 2)
Symbol
Parameter
Conditions
(1), (2)
VIN
Input voltage
Ii
Input pin leakage
current
VOUT
Output voltage
IOZ
Tri-stated I/O pin
leakage current
VOUT = VCCIOmax to 0 V (3)
IC C I N T 0
VCCINT supply
current (standby)
VIN = ground,
no load, no
toggling inputs
TJ = 25° C
Nominal
VC C I N T
IC C I O 0
Altera Corporation
February 2008
–0.5
—
4.0
V
–10
—
10
μA
0
—
VC C I O
V
–10
—
10
μA
EP2C5/A
—
0.010
(4)
A
EP2C8/A
—
0.017
(4)
A
VIN = VCCIOmax to 0 V (3)
—
VCCIO supply current VIN = ground,
(standby)
no load, no
toggling inputs
TJ = 25° C
VC C I O = 2.5 V
Minimum Typical Maximum Unit
EP2C15A
—
0.037
(4)
A
EP2C20/A
—
0.037
(4)
A
EP2C35
—
0.066
(4)
A
EP2C50
—
0.101
(4)
A
EP2C70
—
0.141
(4)
A
EP2C5/A
—
0.7
(4)
mA
EP2C8/A
—
0.8
(4)
mA
EP2C15A
—
0.9
(4)
mA
EP2C20/A
—
0.9
(4)
mA
EP2C35
—
1.3
(4)
mA
EP2C50
—
1.3
(4)
mA
EP2C70
—
1.7
(4)
mA
5–3
Cyclone II Device Handbook, Volume 1
Operating Conditions
Table 5–3. DC Characteristics for User I/O, Dual-Purpose, and Dedicated Pins (Part 2 of 2)
Symbol
RCONF (5) (6)
Parameter
Conditions
Value of I/O pin
pull-up resistor
before and during
configuration
Minimum Typical Maximum Unit
VIN = 0 V; VCCIO = 3.3 V
10
25
50
kΩ
VIN = 0 V; VCCIO = 2.5 V
15
35
70
kΩ
VIN = 0 V; VCCIO = 1.8 V
30
50
100
kΩ
VIN = 0 V; VCCIO = 1.5 V
40
75
150
kΩ
VIN = 0 V; VCCIO = 1.2 V
50
90
170
kΩ
—
1
2
kΩ
(7)
Recommended
value of I/O pin
external pull-down
resistor before and
during configuration
Notes to Table 5–3:
(1)
(2)
(3)
(4)
(5)
(6)
(7)
All pins, including dedicated inputs, clock, I/O, and JTAG pins, may be driven before VCCINT and VCCIO are
powered.
The minimum DC input is –0.5 V. During transitions, the inputs may undershoot to –2.0 V or overshoot to the
voltages shown in Table 5–4, based on input duty cycle for input currents less than 100 mA. The overshoot is
dependent upon duty cycle of the signal. The DC case is equivalent to 100% duty cycle.
This value is specified for normal device operation. The value may vary during power-up. This applies for all VCCIO
settings (3.3, 2.5, 1.8, and 1.5 V).
Maximum values depend on the actual TJ and design utilization. See the Excel-based PowerPlay Early Power
Estimator (www.altera.com) or the Quartus II PowerPlay Power Analyzer feature for maximum values. Refer to
“Power Consumption” on page 5–13 for more information.
RCONF values are based on characterization. RCONF = VCCIO/IRCONF. RCONF values may be different if VIN value is
not 0 V. Pin pull-up resistance values will be lower if an external source drives the pin higher than VCCIO.
Minimum condition at –40°C and high VCC, typical condition at 25°C and nominal VCC and maximum condition at
125°C and low VCC for RCONF values.
These values apply to all VCCIO settings.
Table 5–4 shows the maximum VIN overshoot voltage and the
dependency on the duty cycle of the input signal. Refer to Table 5–3 for
more information.
Table 5–4. VIN Overshoot Voltage for All Input Buffers
5–4
Cyclone II Device Handbook, Volume 1
Maximum VIN (V)
Input Signal Duty Cycle
4.0
100% (DC)
4.1
90%
4.2
50%
4.3
30%
4.4
17%
4.5
10%
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Single-Ended I/O Standards
Tables 5–6 and 5–7 provide operating condition information when using
single-ended I/O standards with Cyclone II devices. Table 5–5 provides
descriptions for the voltage and current symbols used in Tables 5–6 and
5–7.
Table 5–5. Voltage and Current Symbol Definitions
Symbol
Definition
VC C I O
Supply voltage for single-ended inputs and for output drivers
VR E F
Reference voltage for setting the input switching threshold
VI L
Input voltage that indicates a low logic level
VI H
Input voltage that indicates a high logic level
VO L
Output voltage that indicates a low logic level
VO H
Output voltage that indicates a high logic level
IO L
Output current condition under which VO L is tested
IO H
Output current condition under which VO H is tested
VT T
Voltage applied to a resistor termination as specified by
HSTL and SSTL standards
Table 5–6. Recommended Operating Conditions for User I/O Pins Using Single-Ended I/O Standards
Note (1) (Part 1 of 2)
VCCIO (V)
I/O Standard
VREF (V)
VIL (V)
VIH (V)
Min
Typ
Max
Min
Typ
Max
Max
Min
3.3-V LVTTL and
LVCMOS
3.135
3.3
3.465
—
—
—
0.8
1.7
2.5-V LVTTL and
LVCMOS
2.375
2.5
2.625
—
—
—
0.7
1.7
1.8-V LVTTL and
LVCMOS
1.710
1.8
1.890
—
—
—
0.35 × VC C I O
0.65 × VC C I O
1.5-V LVCMOS
1.425
1.5
1.575
—
—
—
0.35 × VC C I O
0.65 × VC C I O
PCI and PCI-X
3.000
3.3
3.600
—
—
—
0.3 × VC C I O
0.5 × VC C I O
SSTL-2 class I
2.375
2.5
2.625
1.19
1.25
1.31
VR E F – 0.18 (DC)
VR E F – 0.35 (AC)
VR E F + 0.18 (DC)
VR E F + 0.35 (AC)
SSTL-2 class II
2.375
2.5
2.625
1.19
1.25
1.31
VR E F – 0.18 (DC)
VR E F – 0.35 (AC)
VR E F + 0.18 (DC)
VR E F + 0.35 (AC)
SSTL-18 class I
1.7
1.8
1.9
0.833
0.9
0.969
VR E F – 0.125 (DC) VR E F + 0.125 (DC)
VR E F – 0.25 (AC) VR E F + 0.25 (AC)
Altera Corporation
February 2008
5–5
Cyclone II Device Handbook, Volume 1
Operating Conditions
Table 5–6. Recommended Operating Conditions for User I/O Pins Using Single-Ended I/O Standards
Note (1) (Part 2 of 2)
VCCIO (V)
I/O Standard
VREF (V)
VIL (V)
VIH (V)
Max
Min
Min
Typ
Max
Min
Typ
Max
SSTL-18 class II
1.7
1.8
1.9
0.833
0.9
0.969
1.8-V HSTL
class I
1.71
1.8
1.89
0.85
0.9
0.95
VR E F – 0.1 (DC)
VR E F – 0.2 (AC)
VR E F + 0.1 (DC)
VR E F + 0.2 (AC)
1.8-V HSTL
class II
1.71
1.8
1.89
0.85
0.9
0.95
VR E F – 0.1 (DC)
VR E F – 0.2 (AC)
VR E F + 0.1 (DC)
VR E F + 0.2 (AC)
1.5-V HSTL
class I
1.425
1.5
1.575
0.71
0.75
0.79
VR E F – 0.1 (DC)
VR E F – 0.2 (AC)
VR E F + 0.1 (DC)
VR E F + 0.2 (AC)
1.5-V HSTL
class II
1.425
1.5
1.575
0.71
0.75
0.79
VR E F – 0.1 (DC)
VR E F – 0.2 (AC)
VR E F + 0.1 (DC)
VR E F + 0.2 (AC)
VR E F – 0.125 (DC) VR E F + 0.125 (DC)
VR E F – 0.25 (AC) VR E F + 0.25 (AC)
Note to Table 5–6:
(1)
Nominal values (Nom) are for TA = 25° C, VCCINT = 1.2 V, and VCCIO = 1.5, 1.8, 2.5, and 3.3 V.
Table 5–7. DC Characteristics of User I/O Pins Using Single-Ended Standards Notes (1), (2) (Part 1 of 2)
Test Conditions
Voltage Thresholds
I/O Standard
IOL (mA)
3.3-V LVTTL
IOH (mA)
Maximum VOL (V)
Minimum VOH (V)
4
–4
0.45
2.4
0.1
–0.1
0.2
VC C I O – 0.2
2.5-V LVTTL and
LVCMOS
1
–1
0.4
2.0
1.8-V LVTTL and
LVCMOS
2
–2
0.45
VC C I O – 0.45
1.5-V LVTTL and
LVCMOS
2
–2
0.25 × VC C I O
0.75 × VC C I O
1.5
–0.5
0.1 × VC C I O
0.9 × VC C I O
3.3-V LVCMOS
PCI and PCI-X
SSTL-2 class I
8.1
–8.1
VTT – 0.57
VTT + 0.57
SSTL-2 class II
16.4
–16.4
VTT – 0.76
VTT + 0.76
SSTL-18 class I
6.7
–6.7
VTT – 0.475
VTT + 0.475
SSTL-18 class II
13.4
–13.4
0.28
VC C I O – 0.28
1.8-V HSTL class I
8
–8
0.4
VC C I O – 0.4
1.8-V HSTL class II
16
–16
0.4
VC C I O – 0.4
5–6
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–7. DC Characteristics of User I/O Pins Using Single-Ended Standards Notes (1), (2) (Part 2 of 2)
Test Conditions
Voltage Thresholds
I/O Standard
IOL (mA)
IOH (mA)
Maximum VOL (V)
Minimum VOH (V)
1.5-V HSTL class I
8
–8
0.4
VC C I O – 0.4
1.5V HSTL class II
16
–16
0.4
VC C I O – 0.4
Notes to Table 5–7:
(1)
(2)
The values in this table are based on the conditions listed in Tables 5–2 and 5–6.
This specification is supported across all the programmable drive settings available as shown in the Cyclone II
Architecture chapter of the Cyclone II Device Handbook.
Differential I/O Standards
The RSDS and mini-LVDS I/O standards are only supported on output
pins. The LVDS I/O standard is supported on both receiver input pins
and transmitter output pins.
1
For more information on how these differential I/O standards
are implemented, refer to the High-Speed Differential Interfaces in
Cyclone II Devices chapter of the Cyclone II Device Handbook.
Figure 5–1 shows the receiver input waveforms for all differential I/O
standards (LVDS, LVPECL, differential 1.5-V HSTL class I and II,
differential 1.8-V HSTL class I and II, differential SSTL-2 class I and II, and
differential SSTL-18 class I and II).
Altera Corporation
February 2008
5–7
Cyclone II Device Handbook, Volume 1
Operating Conditions
Figure 5–1. Receiver Input Waveforms for Differential I/O Standards
Single-Ended Waveform
Positive Channel (p) = VIH
VID (1)
Negative Channel (n) = VIL
VICM (2)
Ground
Differential Waveform (Mathematical Function of Positive and Negative Channel)
VID (1)
0V
VID (1)
p − n (3)
Notes to Figure 5–1:
(1)
(2)
(3)
VID is the differential input voltage. VID = |p – n|.
VICM is the input common mode voltage. VICM = (p + n)/2.
The p – n waveform is a function of the positive channel (p) and the negative channel (n).
5–8
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–8 shows the recommended operating conditions for user I/O
pins with differential I/O standards.
Table 5–8. Recommended Operating Conditions for User I/O Pins Using Differential Signal I/O Standards
I/O
Standard
VCCIO (V)
VID (V) (1)
VICM (V)
VIL (V)
VIH (V)
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
Min
Max
Min
Max
LVDS
2.375
2.5
2.625
0.1
—
0.65
0.1
—
2.0
—
—
—
—
Mini-LVDS
(2)
2.375
2.5
2.625
—
—
—
—
—
—
—
—
—
—
RSDS (2)
2.375
2.5
2.625
—
—
—
—
—
—
—
—
—
—
LVPECL
(3) (6)
3.135
3.3
3.465
0.1
0.6
0.95
—
—
—
0
2.2
2.1
2.88
Differential 1.425
1.5-V HSTL
class I
and II (4)
1.5
1.575
0.2
—
VC C I O
+ 0.6
0.68
—
0.9
—
VR E F VR E F
– 0.20 + 0.20
—
Differential
1.8-V HSTL
class I
and II (4)
1.71
1.8
1.89
—
—
—
—
—
—
—
VR E F VR E F
– 0.20 + 0.20
—
Differential
SSTL-2
class I
and II (5)
2.375
2.5
2.625 0.36
Differential
SSTL-18
class I
and II (5)
1.7
1.8
1.9
0.25
—
VC C I O 0.5 × 0.5 ×
+ 0.6 VC C I O VC C I O
– 0.2
0.5 ×
VC C I O
+ 0.2
—
VR E F VR E F
– 0.35 + 0.35
—
—
VC C I O 0.5 × 0.5 ×
+ 0.6 VC C I O VC C I O
– 0.2
0.5 ×
VC C I O
+ 0.2
—
VR E F VR E F
– 0.25 + 0.25
—
Notes to Table 5–8:
(1)
(2)
(3)
(4)
(5)
(6)
Refer to the High-Speed Differential Interfaces in Cyclone II Devices chapter of the Cyclone II Device Handbook for
measurement conditions on VID.
The RSDS and mini-LVDS I/O standards are only supported on output pins.
The LVPECL I/O standard is only supported on clock input pins. This I/O standard is not supported on output
pins.
The differential 1.8-V and 1.5-V HSTL I/O standards are only supported on clock input pins and PLL output clock
pins.
The differential SSTL-18 and SSTL-2 I/O standards are only supported on clock input pins and PLL output clock
pins.
The LVPECL clock inputs are powered by VCCINT and support all VCCIO settings. However, it is recommended to
connect VCCIO to typical value of 3.3V.
Altera Corporation
February 2008
5–9
Cyclone II Device Handbook, Volume 1
Operating Conditions
Figure 5–2 shows the transmitter output waveforms for all supported
differential output standards (LVDS, mini-LVDS, RSDS, differential 1.5-V
HSTL class I and II, differential 1.8-V HSTL class I and II, differential
SSTL-2 class I and II, and differential SSTL-18 class I and II).
Figure 5–2. Transmitter Output Waveforms for Differential I/O Standards
Single-Ended Waveform
Positive Channel (p) = VOH
VOD (1)
Negative Channel (n) = VOL
VOCM (2)
Ground
Differential Waveform (Mathematical Function of Positive and Negative Channel)
VOD (1)
0V
VOD (1)
p − n (3)
Notes to Figure 5–2:
(1)
(2)
(3)
VOD is the output differential voltage. VOD = |p – n|.
VOCM is the output common mode voltage. VOCM = (p + n)/2.
The p – n waveform is a function of the positive channel (p) and the negative channel (n).
Table 5–9 shows the DC characteristics for user I/O pins with differential
I/O standards.
Table 5–9. DC Characteristics for User I/O Pins Using Differential I/O Standards Note (1) (Part 1 of 2)
ΔVOD (mV)
VOD (mV)
I/O Standard
Min
Typ
Max
LVDS
250
—
600
—
mini-LVDS (2)
300
—
600
RSDS (2)
100
—
600
—
—
—
Differential 1.5-V
HSTL class I
and II (3)
5–10
Cyclone II Device Handbook, Volume 1
Min Max
VOCM (V)
VOH (V)
VOL (V)
Min
Typ
Max
Min
Max
Min
Max
50
1.125
1.25
1.375
—
—
—
—
—
50
1.125
1.25
1.375
—
—
—
—
—
—
1.125
1.25
1.375
—
—
—
—
—
—
—
—
—
VC C I O
– 0.4
—
—
0.4
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–9. DC Characteristics for User I/O Pins Using Differential I/O Standards Note (1) (Part 2 of 2)
ΔVOD (mV)
VOD (mV)
I/O Standard
Min
Typ
Max
Min Max
Differential 1.8-V
HSTL class I
and II (3)
—
—
—
—
Differential
SSTL-2 class I
(4)
—
—
—
Differential
SSTL-2 class II
(4)
—
—
Differential
SSTL-18 class I
(4)
—
Differential
SSTL-18 class II
(4)
—
VOCM (V)
VOH (V)
VOL (V)
Min
Typ
Max
Min
Max
Min
Max
—
—
—
—
VC C I O
– 0.4
—
—
0.4
—
—
—
—
—
VT T +
0.57
—
—
VT T –
0.57
—
—
—
—
—
—
VT T +
0.76
—
—
VT T –
0.76
—
—
—
—
0.5 ×
VC C I O
–
0.125
0.5 ×
VC C I O
0.5 ×
VC C I O
+
0.125
VT T +
0.475
—
—
VT T –
0.475
—
—
—
—
0.5 ×
VC C I O
–
0.125
0.5 ×
VC C I O
0.5 ×
VC C I O
+
0.125
VC C I O
– 0.28
—
—
0.28
Notes to Table 5–9:
(1)
(2)
(3)
(4)
The LVPECL I/O standard is only supported on clock input pins. This I/O standard is not supported on output
pins.
The RSDS and mini-LVDS I/O standards are only supported on output pins.
The differential 1.8-V HSTL and differential 1.5-V HSTL I/O standards are only supported on clock input pins and
PLL output clock pins.
The differential SSTL-18 and SSTL-2 I/O standards are only supported on clock input pins and PLL output clock
pins.
DC
Characteristics
for Different Pin
Types
Altera Corporation
February 2008
Table 5–10 shows the types of pins that support bus hold circuitry.
Table 5–10. Bus Hold Support
Pin Type
Bus Hold
I/O pins using single-ended I/O standards
Yes
I/O pins using differential I/O standards
No
Dedicated clock pins
No
JTAG
No
Configuration pins
No
5–11
Cyclone II Device Handbook, Volume 1
DC Characteristics for Different Pin Types
Table 5–11 specifies the bus hold parameters for general I/O pins.
Table 5–11. Bus Hold Parameters
Note (1)
VCCIO Level
Parameter
Conditions
1.8 V
2.5 V
Unit
3.3 V
Min
Max
Min
Max
Min
Max
Bus-hold low, sustaining
current
VI N >
VI L (maximum)
30
—
50
—
70
—
μA
Bus-hold high, sustaining
current
VI N <
VI L (minimum)
–30
—
–50
—
–70
—
μA
Bus-hold low, overdrive
current
0 V < VI N < V C C I O
—
200
—
300
—
500
μA
Bus-hold high, overdrive
current
0 V < VI N < V C C I O
—
–200
—
–300
—
–500
μA
—
0.68
1.07
0.7
1.7
0.8
2.0
V
Bus-hold trip point (2)
Notes to Table 5–11:
(1)
(2)
There is no specification for bus-hold at VCCIO = 1.5 V for the HSTL I/O standard.
The bus-hold trip points are based on calculated input voltages from the JEDEC standard.
On-Chip Termination Specifications
Table 5–12 defines the specifications for internal termination resistance
tolerance when using series or differential on-chip termination.
Table 5–12. Series On-Chip Termination Specifications
Resistance Tolerance
Symbol
Description
Conditions
Extended/
Commercial Industrial
Automotive
Max
Max
Temp Max
Unit
25-Ω RS
Internal series termination without VC C I O = 3.3V
calibration (25-Ω setting)
±30
±30
±40
%
50-Ω RS
Internal series termination without VC C I O = 2.5V
calibration (50-Ω setting)
±30
±30
±40
%
50-Ω RS
Internal series termination without VC C I O = 1.8V
calibration (50-Ω setting)
±30 (1)
±40
±50
%
Note to Table 5–12:
(1)
For commercial –8 devices, the tolerance is ±40%.
5–12
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–13 shows the Cyclone II device pin capacitance for different I/O
pin types.
Table 5–13. Device Capacitance Note (1)
Symbol
Parameter
Typical
Unit
CI O
Input capacitance for user I/O pin.
6
pF
CL V D S
Input capacitance for dual-purpose
LVDS/user I/O pin.
6
pF
CV R E F
Input capacitance for dual-purpose VREF
pin when used as VREF or user I/O pin.
21
pF
CC L K
Input capacitance for clock pin.
5
pF
Note to Table 5–13:
(1)
Power
Consumption
Capacitance is sample-tested only. Capacitance is measured using time-domain
reflectometry (TDR). Measurement accuracy is within ±0.5 pF.
You can calculate the power usage for your design using the PowerPlay
Early Power Estimator and the PowerPlay Power Analyzer feature in the
Quartus® II software.
The interactive PowerPlay Early Power Estimator is typically used
during the early stages of FPGA design, prior to finalizing the project, to
get a magnitude estimate of the device power. The Quartus II software
PowerPlay Power Analyzer feature is typically used during the later
stages of FPGA design. The PowerPlay Power Analyzer also allows you
to apply test vectors against your design for more accurate power
consumption modeling.
In both cases, only use these calculations as an estimation of power, not
as a specification. For more information on PowerPlay tools, refer to the
PowerPlay Early Power Estimator User Guide and the Power Estimation and
Analysis section in volume 3 of the Quartus II Handbook.
1
You can obtain the Excel-based PowerPlay Early Power
Estimator at www.altera.com. Refer to Table 5–3 on page 5–3 for
typical ICC standby specifications.
The power-up current required by Cyclone II devices does not exceed the
maximum static current. The rate at which the current increases is a
function of the system power supply. The exact amount of current
consumed varies according to the process, temperature, and power ramp
rate. The duration of the ICCINT power-up requirement depends on the
VCCINT voltage supply rise time.
Altera Corporation
February 2008
5–13
Cyclone II Device Handbook, Volume 1
Timing Specifications
You should select power supplies and regulators that can supply the
amount of current required when designing with Cyclone II devices.
Altera recommends using the Cyclone II PowerPlay Early Power
Estimator to estimate the user-mode ICCINT consumption and then select
power supplies or regulators based on the values obtained.
Timing
Specifications
The DirectDrive™ technology and MultiTrack™ interconnect ensure
predictable performance, accurate simulation, and accurate timing
analysis across all Cyclone II device densities and speed grades. This
section describes and specifies the performance, internal, external,
high-speed I/O, JTAG, and PLL timing specifications.
This section shows the timing models for Cyclone II devices. Commercial
devices meet this timing over the commercial temperature range.
Industrial devices meet this timing over the industrial temperature range.
Automotive devices meet this timing over the automotive temperature
range. Extended devices meet this timing over the extended temperature
range. All specifications are representative of worst-case supply voltage
and junction temperature conditions.
Preliminary and Final Timing Specifications
Timing models can have either preliminary or final status. The Quartus II
software issues an informational message during the design compilation
if the timing models are preliminary. Table 5–14 shows the status of the
Cyclone II device timing models.
Preliminary status means the timing model is subject to change. Initially,
timing numbers are created using simulation results, process data, and
other known parameters. These tests are used to make the preliminary
numbers as close to the actual timing parameters as possible.
5–14
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Final timing numbers are based on actual device operation and testing.
These numbers reflect the actual performance of the device under
worst-case voltage and junction temperature conditions.
Table 5–14. Cyclone II Device Timing Model Status
Device
Speed Grade
Preliminary
Final
Commercial/Industrial
—
v
Automotive
v
—
Commercial/Industrial
—
v
Automotive
v
—
Commercial/Industrial
—
v
Automotive
v
—
Commercial/Industrial
—
v
Automotive
v
—
EP2C35
Commercial/Industrial
—
v
EP2C50
Commercial/Industrial
—
v
EP2C70
Commercial/Industrial
—
v
EP2C5/A
EP2C8/A
EP2C15A
EP2C20/A
Performance
Table 5–15 shows Cyclone II performance for some common designs. All
performance values were obtained with Quartus II software compilation
of LPM, or MegaCore functions for the FIR and FFT designs.
Table 5–15. Cyclone II Performance (Part 1 of 4)
Resources Used
Applications
LEs
LE
Performance (MHz)
M4K
DSP
Memory
Blocks
Blocks
–6
Speed
Grade
–7
Speed
Grade
(6)
–7
Speed
Grade
(7)
–8
Speed
Grade
16-to-1 multiplexer (1)
21
0
0
385.35
313.97
270.85
286.04
32-to-1 multiplexer (1)
38
0
0
294.2
260.75
228.78
191.02
16-bit counter
16
0
0
401.6
349.4
310.65
310.65
64-bit counter
64
0
0
157.15
137.98
126.08
126.27
Altera Corporation
February 2008
5–15
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–15. Cyclone II Performance (Part 2 of 4)
Resources Used
Applications
LEs
Memory Simple dual-port RAM 128 × 36 bit
(3), (5)
M4K
block
True dual-port RAM 128 × 18 bit
(3), (5)
DSP
block
M4K
DSP
Memory
Blocks
Blocks
Performance (MHz)
–6
Speed
Grade
–7
Speed
Grade
(6)
–7
Speed
Grade
(7)
–8
Speed
Grade
0
1
0
235.29
194.93
163.13
163.13
0
1
0
235.29
194.93
163.13
163.13
FIFO 128 × 16 bit
(5)
32
1
0
235.29
194.93
163.13
163.13
Simple dual-port RAM 128 × 36 bit
(4),(5)
0
1
0
210.08
195.0
163.02
163.02
True dual-port RAM 128x18 bit
(4),(5)
0
1
0
163.02
163.02
163.02
163.02
9 × 9-bit multiplier (2)
0
0
1
260.01
216.73
180.57
180.57
18 × 18-bit multiplier (2)
0
0
1
260.01
216.73
180.57
180.57
18-bit, 4 tap FIR filter
113
0
8
182.74
147.47
127.74
122.98
Larger
8-bit, 16 tap parallel FIR filter
Designs
8-bit, 1024 pt, Streaming,
3 Mults/5 Adders FFT function
52
0
4
153.56
131.25
110.44
110.57
3191
22
9
235.07
195.0
147.51
163.02
8-bit, 1024 pt, Streaming,
4 Mults/2 Adders FFT function
3041
22
12
235.07
195.0
146.3
163.02
8-bit, 1024 pt, Single Output,
1 Parallel FFT Engine, Burst,
3 Mults/5 Adders FFT function
1056
5
3
235.07
195.0
147.84
163.02
8-bit, 1024 pt, Single Output,
1 Parallel FFT Engine, Burst,
4 Mults/2 Adders FFT function
1006
5
4
235.07
195.0
149.99
163.02
8-bit, 1024 pt, Single Output,
2 Parallel FFT Engines, Burst,
3 Mults/5 Adders FFT function
1857
10
6
200.0
195.0
149.61
163.02
8-bit, 1024 pt, Single Output,
2 Parallel FFT Engines, Burst,
4 Mults/2 Adders FFT function
1757
10
8
200.0
195.0
149.34
163.02
8-bit, 1024 pt, Quad Output,
1 Parallel FFT Engine, Burst,
3 Mults/5 Adders FFT function
2550
10
9
235.07
195.0
148.21
163.02
5–16
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–15. Cyclone II Performance (Part 3 of 4)
Resources Used
Applications
LEs
Performance (MHz)
M4K
DSP
Memory
Blocks
Blocks
–6
Speed
Grade
–7
Speed
Grade
(6)
–7
Speed
Grade
(7)
–8
Speed
Grade
Larger
8-bit, 1024 pt, Quad Output,
Designs 1 Parallel FFT Engine, Burst,
4 Mults/2 Adders FFT function
2400
10
12
235.07
195.0
140.11
163.02
8-bit, 1024 pt, Quad Output,
2 Parallel FFT Engines, Burst,
3 Mults/5 Adders FFT function
4343
14
18
200.0
195.0
152.67
163.02
8-bit, 1024 pt, Quad Output,
2 Parallel FFT Engines, Burst,
4 Mults/2 Adders FFT function
4043
14
24
200.0
195.0
149.72
163.02
8-bit, 1024 pt, Quad Output,
4 Parallel FFT Engines, Burst,
3 Mults/5 Adders FFT function
7496
28
36
200.0
195.0
150.01
163.02
8-bit, 1024 pt, Quad Output,
4 Parallel FFT Engines, Burst,
4 Mults/2 Adders FFT function
6896
28
48
200.0
195.0
151.33
163.02
8-bit, 1024 pt, Quad Output,
1 Parallel FFT Engine, Buffered
Burst,
3 Mults/5 Adders FFT function
2934
18
9
235.07
195.0
148.89
163.02
8-bit, 1024 pt, Quad Output,
1 Parallel FFT Engine, Buffered
Burst,
4 Mults/2 Adders FFT function
2784
18
12
235.07
195.0
151.51
163.02
8-bit, 1024 pt, Quad Output,
2 Parallel FFT Engines, Buffered
Burst,
3 Mults/5 Adders FFT function
4720
30
18
200.0
195.0
149.76
163.02
8-bit, 1024 pt, Quad Output,
2 Parallel FFT Engines, Buffered
Burst,
4 Mults/2 Adders FFT function
4420
30
24
200.0
195.0
151.08
163.02
Altera Corporation
February 2008
5–17
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–15. Cyclone II Performance (Part 4 of 4)
Resources Used
M4K
DSP
Memory
Blocks
Blocks
Applications
LEs
Performance (MHz)
–6
Speed
Grade
–7
Speed
Grade
(6)
–7
Speed
Grade
(7)
–8
Speed
Grade
Larger
8-bit, 1024 pt, Quad Output,
Designs 4 Parallel FFT Engines, Buffered
Burst, 3 Mults/5 Adders FFT
function
8053
60
36
200.0
195.0
149.23
163.02
8-bit, 1024 pt, Quad Output,
4 Parallel FFT Engines, Buffered
Burst, 4 Mults/2 Adders FFT
function
7453
60
48
200.0
195.0
151.28
163.02
Notes to Table 5–15 :
(1)
(2)
(3)
(4)
(5)
This application uses registered inputs and outputs.
This application uses registered multiplier input and output stages within the DSP block.
This application uses the same clock source for both A and B ports.
This application uses independent clock sources for A and B ports.
This application uses PLL clock outputs that are globally routed to connect and drive M4K clock ports. Use of
non-PLL clock sources or local routing to drive M4K clock ports may result in lower performance numbers than
shown here. Refer to the Quartus II timing report for actual performance numbers.
These numbers are for commercial devices.
These numbers are for automotive devices.
(6)
(7)
Internal Timing
Refer to Tables 5–16 through 5–19 for the internal timing parameters.
Table 5–16. LE_FF Internal Timing Microparameters (Part 1 of 2)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
Unit
Min
Max
Min
Max
Min
Max
TSU
–36
—
–40
—
–40
—
ps
—
—
–38
—
–40
—
ps
TH
266
—
306
—
306
—
ps
—
—
286
—
306
—
ps
TCO
141
250
135
277
135
304
ps
—
—
141
—
141
—
ps
TCLR
191
—
244
—
244
—
ps
—
—
217
—
244
—
ps
5–18
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–16. LE_FF Internal Timing Microparameters (Part 2 of 2)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
Unit
Min
TPRE
TCLKL
TCLKH
tLUT
Max
Min
Max
Min
Max
191
—
244
—
244
—
ps
—
—
217
—
244
—
ps
1000
—
1242
—
1242
—
ps
—
—
1111
—
1242
—
ps
1000
—
1242
—
1242
—
ps
—
—
1111
—
1242
—
ps
180
438
172
545
172
651
ps
—
—
180
—
180
—
ps
Notes to Table 5–16:
(1)
(2)
(3)
For the –6 speed grades, the minimum timing is for the commercial temperature grade. The –7 speed grade devices
offer the automotive temperature grade. The –8 speed grade devices offer the industrial temperature grade.
For each parameter of the –7 speed grade columns, the value in the first row represents the minimum timing
parameter for automotive devices. The second row represents the minimum timing parameter for commercial
devices.
For each parameter of the –8 speed grade columns, the value in the first row represents the minimum timing
parameter for industrial devices. The second row represents the minimum timing parameter for commercial
devices.
Table 5–17. IOE Internal Timing Microparameters (Part 1 of 2)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
TSU
TH
TCO
TPIN2COMBOUT_R
TPIN2COMBOUT_C
TCOMBIN2PIN_R
Altera Corporation
February 2008
Unit
Min
Max
Min
Max
Min
Max
76
—
101
—
101
—
ps
—
—
89
—
101
—
ps
88
—
106
—
106
—
ps
—
—
97
—
106
—
ps
99
155
95
171
95
187
ps
—
—
99
—
99
—
ps
384
762
366
784
366
855
ps
—
—
384
—
384
—
ps
385
760
367
783
367
854
ps
—
—
385
—
385
—
ps
1344
2490
1280
2689
1280
2887
ps
—
—
1344
—
1344
—
ps
5–19
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–17. IOE Internal Timing Microparameters (Part 2 of 2)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
TCOMBIN2PIN_C
TCLR
TPRE
TCLKL
TCLKH
Unit
Min
Max
Min
Max
Min
Max
1418
2622
1352
2831
1352
3041
ps
—
—
1418
—
1418
—
ps
137
—
165
—
165
—
ps
—
—
151
—
165
—
ps
192
—
233
—
233
—
ps
—
—
212
—
233
—
ps
1000
—
1242
—
1242
—
ps
—
—
1111
—
1242
—
ps
1000
—
1242
—
1242
—
ps
—
—
1111
—
1242
—
ps
Notes to Table 5–17:
(1)
(2)
(3)
For the –6 speed grades, the minimum timing is for the commercial temperature grade. The –7 speed grade devices
offer the automotive temperature grade. The –8 speed grade devices offer the industrial temperature grade.
For each parameter of the –7 speed grade columns, the value in the first row represents the minimum timing
parameter for automotive devices. The second row represents the minimum timing parameter for commercial
devices.
For each parameter of the –8 speed grade columns, the value in the first row represents the minimum timing
parameter for industrial devices. The second row represents the minimum timing parameter for commercial
devices.
Table 5–18. DSP Block Internal Timing Microparameters (Part 1 of 2)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
Unit
Min
TSU
TH
TCO
TINREG2PIPE9
TINREG2PIPE18
Max
Min
Max
Min
Max
47
—
62
—
62
—
ps
—
—
54
—
62
—
ps
110
—
113
—
113
—
ps
—
—
111
—
113
—
ps
0
0
0
0
0
0
ps
—
—
0
—
0
—
ps
652
1379
621
1872
621
2441
ps
—
—
652
—
652
—
ps
652
1379
621
1872
621
2441
ps
—
—
652
—
652
—
ps
5–20
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–18. DSP Block Internal Timing Microparameters (Part 2 of 2)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
TPIPE2OUTREG
TPD9
TPD18
TCLR
TCLKL
TCLKH
Unit
Min
Max
Min
Max
Min
Max
47
104
45
142
45
185
ps
—
—
47
—
47
—
ps
529
2470
505
3353
505
4370
ps
—
—
529
—
529
—
ps
425
2903
406
3941
406
5136
ps
—
—
425
—
425
—
ps
2686
—
3572
—
3572
—
ps
—
—
3129
—
3572
—
ps
1923
—
2769
—
2769
—
ps
—
—
2307
—
2769
—
ps
1923
—
2769
—
2769
—
ps
—
—
2307
—
2769
—
ps
Notes to Table 5–18:
(1)
(2)
(3)
For the –6 speed grades, the minimum timing is for the commercial temperature grade. The –7 speed grade devices
offer the automotive temperature grade. The –8 speed grade devices offer the industrial temperature grade.
For each parameter of the –7 speed grade columns, the value in the first row represents the minimum timing
parameter for automotive devices. The second row represents the minimum timing parameter for commercial
devices.
For each parameter of the –8 speed grade columns, the value in the first row represents the minimum timing
parameter for industrial devices. The second row represents the minimum timing parameter for commercial
devices.
Table 5–19. M4K Block Internal Timing Microparameters (Part 1 of 3)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
TM4KRC
TM4KWERESU
TM4KWEREH
TM4KBESU
Altera Corporation
February 2008
Unit
Min
Max
Min
Max
Min
Max
2387
3764
2275
4248
2275
4736
ps
—
—
2387
—
2387
—
ps
35
—
46
—
46
—
ps
—
—
40
—
46
—
ps
234
—
267
—
267
—
ps
—
—
250
—
267
—
ps
35
—
46
—
46
—
ps
—
—
40
—
46
—
ps
5–21
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–19. M4K Block Internal Timing Microparameters (Part 2 of 3)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
TM4KBEH
TM4KDATAASU
TM4KDATAAH
TM4KADDRASU
TM4KADDRAH
TM4KDATABSU
TM4KDATABH
TM4KRADDRBSU
TM4KRADDRBH
TM4KDATACO1
TM4KDATACO2
TM4KCLKH
TM4KCLKL
Unit
Min
Max
Min
Max
Min
Max
234
—
267
—
267
—
ps
—
—
250
—
267
—
ps
35
—
46
—
46
—
ps
—
—
40
—
46
—
ps
234
—
267
—
267
—
ps
—
—
250
—
267
—
ps
35
—
46
—
46
—
ps
—
—
40
—
46
—
ps
234
—
267
—
267
—
ps
—
—
250
—
267
—
ps
35
—
46
—
46
—
ps
—
—
40
—
46
—
ps
234
—
267
—
267
—
ps
—
—
250
—
267
—
ps
35
—
46
—
46
—
ps
—
—
40
—
46
—
ps
234
—
267
—
267
—
ps
—
—
250
—
267
—
ps
466
724
445
826
445
930
ps
—
—
466
—
466
—
ps
2345
3680
2234
4157
2234
4636
ps
—
—
2345
—
2345
—
ps
1923
—
2769
—
2769
—
ps
—
—
2307
—
2769
—
ps
1923
—
2769
—
2769
—
ps
—
—
2307
—
2769
—
ps
5–22
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–19. M4K Block Internal Timing Microparameters (Part 3 of 3)
–6 Speed Grade (1)
–7 Speed Grade (2)
–8 Speed Grade (3)
Parameter
Unit
TM4KCLR
Min
Max
Min
Max
Min
Max
191
—
244
—
244
—
ps
—
—
217
—
244
—
ps
Notes to Table 5–19:
(1)
For the –6 speed grades, the minimum timing is for the commercial temperature grade. The –7 speed grade devices
offer the automotive temperature grade. The –8 speed grade devices offer the industrial temperature grade.
For each parameter of the –7 speed grade columns, the value in the first row represents the minimum timing
parameter for automotive devices. The second row represents the minimum timing parameter for commercial
devices.
For each parameter of the –8 speed grade columns, the value in the first row represents the minimum timing
parameter for industrial devices. The second row represents the minimum timing parameter for commercial
devices.
(2)
(3)
Cyclone II Clock Timing Parameters
Refer to Tables 5–20 through 5–34 for Cyclone II clock timing parameters.
Table 5–20. Cyclone II Clock Timing Parameters
Symbol
Parameter
tC I N
Delay from clock pad to I/O input register
tC O U T
Delay from clock pad to I/O output register
tP L L C I N
Delay from PLL inclk pad to I/O input register
tP L L C O U T
Delay from PLL inclk pad to I/O output register
EP2C5/A Clock Timing Parameters
Tables 5–21 and 5–22 show the clock timing parameters for EP2C5/A
devices.
Table 5–21. EP2C5/A Column Pins Global Clock Timing Parameters (Part 1 of 2)
Fast Corner
Parameter
Industrial/
Commercial
Automotive
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
tC I N
1.283
1.343
2.329
2.484
2.688
2.688
ns
tC O U T
1.297
1.358
2.363
2.516
2.717
2.717
ns
tP L L C I N
–0.188
–0.201
0.076
0.038
0.042
0.052
ns
Altera Corporation
February 2008
5–23
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–21. EP2C5/A Column Pins Global Clock Timing Parameters (Part 2 of 2)
Fast Corner
Parameter
Industrial/
Commercial
Automotive
tP L L C O U T
–0.174
–0.186
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
0.11
0.07
0.071
0.081
ns
Notes to Table 5–21:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
Table 5–22. EP2C5/A Row Pins Global Clock Timing Parameters
Fast Corner
Parameter
Industrial/
Commercial
Automotive
tC I N
1.212
1.267
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
2.210
2.351
2.54
2.540
ns
tC O U T
1.214
1.269
2.226
2.364
2.548
2.548
ns
tP L L C I N
–0.259
–0.277
–0.043
–0.095
–0.106
–0.096
ns
tP L L C O U T
–0.257
–0.275
–0.027
–0.082
–0.098
–0.088
ns
Notes to Table 5–22:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
EP2C8/A Clock Timing Parameters
Tables 5–23 and 5–24 show the clock timing parameters for EP2C8/A
devices.
Table 5–23. EP2C8/A Column Pins Global Clock Timing Parameters (Part 1 of 2)
Fast Corner
Parameter
Industrial/
Commercial
Automotive
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
tC I N
1.339
1.404
2.405
2.565
2.764
2.774
ns
tC O U T
1.353
1.419
2.439
2.597
2.793
2.803
ns
tP L L C I N
–0.193
–0.204
0.055
0.015
0.016
0.026
ns
5–24
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–23. EP2C8/A Column Pins Global Clock Timing Parameters (Part 2 of 2)
Fast Corner
Parameter
Industrial/
Commercial
Automotive
tP L L C O U T
–0.179
–0.189
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
0.089
0.047
0.045
0.055
ns
Notes to Table 5–23:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
Table 5–24. EP2C8/A Row Pins Global Clock Timing Parameters
Fast Corner
Parameter
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
1.314
2.270
2.416
2.596
2.606
ns
Industrial/
Commercial
Automotive
tC I N
1.256
tC O U T
1.258
1.316
2.286
2.429
2.604
2.614
ns
tP L L C I N
–0.276
–0.294
–0.08
–0.134
–0.152
–0.142
ns
tP L L C O U T
–0.274
–0.292
–0.064
–0.121
–0.144
–0.134
ns
Notes to Table 5–24:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
EP2C15A Clock Timing Parameters
Tables 5–25 and 5–26 show the clock timing parameters for EP2C15A
devices.
Table 5–25. EP2C15A Column Pins Global Clock Timing Parameters
Fast Corner
Parameter
Industrial/
Commercial
Automotive
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
tC I N
1.621
1.698
2.590
2.766
3.009
2.989
ns
tC O U T
1.635
1.713
2.624
2.798
3.038
3.018
ns
tP L L C I N
–0.351
–0.372
0.045
0.008
0.046
0.016
ns
Altera Corporation
February 2008
5–25
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–25. EP2C15A Column Pins Global Clock Timing Parameters
Fast Corner
Parameter
Industrial/
Commercial
Automotive
tP L L C O U T
–0.337
–0.357
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
0.079
0.04
0.075
0.045
ns
Notes to Table 5–25:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
Table 5–26. EP2C15A Row Pins Global Clock Timing Parameters
Fast Corner
Parameter
Industrial/
Commercial
Automotive
tC I N
1.542
1.615
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
2.490
2.651
2.886
2.866
ns
tC O U T
1.544
1.617
2.506
2.664
2.894
2.874
ns
tP L L C I N
–0.424
–0.448
–0.057
–0.107
–0.077
–0.107
ns
tP L L C O U T
–0.422
–0.446
–0.041
–0.094
–0.069
–0.099
ns
Notes to Table 5–26:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
EP2C20/A Clock Timing Parameters
Tables 5–27 and 5–28 show the clock timing parameters for EP2C20/A
devices.
Table 5–27. EP2C20/A Column Pins Global Clock Timing Parameters (Part 1 of 2)
Fast Corner
Parameter
Industrial/
Commercial
Automotive
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
tC I N
1.621
1.698
2.590
2.766
3.009
2.989
ns
tC O U T
1.635
1.713
2.624
2.798
3.038
3.018
ns
tP L L C I N
–0.351
–0.372
0.045
0.008
0.046
0.016
ns
5–26
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–27. EP2C20/A Column Pins Global Clock Timing Parameters (Part 2 of 2)
Fast Corner
Parameter
Industrial/
Commercial
Automotive
tP L L C O U T
–0.337
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
0.079
0.04
0.075
0.045
ns
–0.357
Notes to Table 5–27:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
Table 5–28. EP2C20/A Row Pins Global Clock Timing Parameters
Fast Corner
Parameter
Industrial/
Commercial
Automotive
tC I N
1.542
–6 Speed
Grade
–7 Speed
Grade
(1)
–7 Speed
Grade
(2)
–8 Speed
Grade
Unit
2.490
2.651
2.886
2.866
ns
1.615
tC O U T
1.544
1.617
2.506
2.664
2.894
2.874
ns
tP L L C I N
–0.424
–0.448
–0.057
–0.107
–0.077
–0.107
ns
tP L L C O U T
–0.422
–0.446
–0.041
–0.094
–0.069
–0.099
ns
Notes to Table 5–28:
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
EP2C35 Clock Timing Parameters
Tables 5–29 and 5–30 show the clock timing parameters for EP2C35
devices.
Table 5–29. EP2C35 Column Pins Global Clock Timing Parameters
Fast Corner
Industrial
Commercial
–6 Speed
Grade
tC I N
1.499
1.569
2.652
2.878
3.155
ns
tC O U T
1.513
1.584
2.686
2.910
3.184
ns
tP L L C I N
–0.026
–0.032
0.272
0.316
0.41
ns
tP L L C O U T
–0.012
–0.017
0.306
0.348
0.439
ns
Parameter
Altera Corporation
February 2008
–7 Speed
Grade
–8 Speed
Grade
Unit
5–27
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–30. EP2C35 Row Pins Global Clock Timing Parameters
Fast Corner
Industrial
Commercial
–6 Speed
Grade
1.410
1.476
2.514
2.724
2.986
ns
Parameter
tC I N
–7 Speed
Grade
–8 Speed
Grade
Unit
tC O U T
1.412
1.478
2.530
2.737
2.994
ns
tP L L C I N
–0.117
–0.127
0.134
0.162
0.241
ns
tP L L C O U T
–0.115
–0.125
0.15
0.175
0.249
ns
EP2C50 Clock Timing Parameters
Tables 5–31 and 5–32 show the clock timing parameters for EP2C50
devices.
Table 5–31. EP2C50 Column Pins Global Clock Timing Parameters
Fast Corner
Industrial
Commercial
–6 Speed
Grade
Parameter
–7 Speed
Grade
–8 Speed
Grade
Unit
tC I N
1.575
1.651
2.759
2.940
3.174
ns
tC O U T
1.589
1.666
2.793
2.972
3.203
ns
tP L L C I N
–0.149
–0.158
0.113
0.075
0.089
ns
tP L L C O U T
–0.135
–0.143
0.147
0.107
0.118
ns
Table 5–32. EP2C50 Row Pins Global Clock Timing Parameters
Fast Corner
Industrial
Commercial
–6 Speed
Grade
tC I N
1.463
1.533
2.624
2.791
3.010
ns
tC O U T
1.465
1.535
2.640
2.804
3.018
ns
tP L L C I N
–0.261
–0.276
–0.022
–0.074
–0.075
ns
tP L L C O U T
–0.259
–0.274
–0.006
–0.061
–0.067
ns
Parameter
5–28
Cyclone II Device Handbook, Volume 1
–7 Speed
Grade
–8 Speed
Grade
Unit
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
EP2C70 Clock Timing Parameters
Tables 5–33 and 5–34 show the clock timing parameters for EP2C70
devices.
Table 5–33. EP2C70 Column Pins Global Clock Timing Parameters
Fast Corner
Industrial
Commercial
–6 Speed
Grade
tC I N
1.575
1.651
2.914
3.105
3.174
ns
tC O U T
1.589
1.666
2.948
3.137
3.203
ns
tP L L C I N
–0.149
–0.158
0.27
0.268
0.089
ns
tP L L C O U T
–0.135
–0.143
0.304
0.3
0.118
ns
Parameter
–7 Speed
Grade
–8 Speed
Grade
Unit
Table 5–34. EP2C70 Row Pins Global Clock Timing Parameters
Fast Corner
Commercial
–6 Speed
Grade
–7 Speed
Grade
–8 Speed
Grade
Unit
Industrial
tC I N
1.463
1.533
2.753
2.927
3.010
ns
tC O U T
1.465
1.535
2.769
2.940
3.018
ns
tP L L C I N
–0.261
–0.276
0.109
0.09
–0.075
ns
tP L L C O U T
–0.259
–0.274
0.125
0.103
–0.067
ns
Parameter
Clock Network Skew Adders
Table 5–35 shows the clock network specifications.
Table 5–35. Clock Network Specifications
Name
Description
Max
Unit
Clock skew adder
EP2C5/A, EP2C8/A (1)
Inter-clock network, same bank
±88
ps
Inter-clock network, same side and
entire chip
±88
ps
Clock skew adder
EP2C15A, EP2C20/A,
EP2C35, EP2C50,
EP2C70 (1)
Inter-clock network, same bank
±118
ps
Inter-clock network, same side and
entire chip
±138
ps
Note to Table 5–35:
(1)
Altera Corporation
February 2008
This is in addition to intra-clock network skew, which is modeled in the
Quartus II software.
5–29
Cyclone II Device Handbook, Volume 1
Timing Specifications
IOE Programmable Delay
Refer to Table 5–36 and 5–37 for IOE programmable delay.
Table 5–36. Cyclone II IOE Programmable Delay on Column Pins Notes (1), (2)
Number
Parameter Paths Affected
of
Settings
Input Delay Pad -> I/O
from Pin to dataout to core
Internal
Cells
7
Input Delay Pad -> I/O
from Pin to input register
Input
Register
8
Delay from
Output
Register to
Output Pin
I/O output
register -> Pad
2
Fast Corner
(3)
–7 Speed
Grade
(4)
–6 Speed
Grade
–8 Speed
Grade
Unit
Min Max Min Max Min
Max
Min
Max
Offset Offset Offset Offset Offset Offset Offset Offset
0
2233
0
3827
0
4232
0
4349
ps
0
2344
—
—
0
4088
—
—
ps
0
2656
0
4555
0
4914
0
4940
ps
0
2788
—
—
0
4748
—
—
ps
0
303
0
563
0
638
0
670
ps
0
318
—
—
0
617
—
—
ps
Notes to Table 5–36:
(1)
(2)
(3)
(4)
The incremental values for the settings are generally linear. For exact values of each setting, use the latest version
of the Quartus II software.
The minimum and maximum offset timing numbers are in reference to setting “0” as available in the Quartus II
software.
The value in the first row for each parameter represents the fast corner timing parameter for industrial and
automotive devices. The second row represents the fast corner timing parameter for commercial devices.
The value in the first row is for automotive devices. The second row is for commercial devices.
Table 5–37. Cyclone II IOE Programmable Delay on Row Pins Notes (1), (2) (Part 1 of 2)
Paths
Parameter
Affected
Input Delay
from Pin to
Internal
Cells
Pad ->
I/O
dataout
to core
Number Fast Corner (3)
of
Max
Settings Min
Offset Offset
7
–6 Speed
Grade
–7 Speed
Grade (4)
–8 Speed Grade
Unit
Min
Offset
Max
Offset
Min
Offset
Max
Offset
Min
Offset
Max
Offset
0
2240
0
3776
0
4174
0
4290
ps
0
2352
—
—
0
4033
—
—
ps
5–30
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–37. Cyclone II IOE Programmable Delay on Row Pins Notes (1), (2) (Part 2 of 2)
Paths
Parameter
Affected
Number Fast Corner (3)
of
Max
Settings Min
Offset Offset
Input Delay Pad ->
from Pin to I/O input
register
Input
Register
8
I/O
output
register > Pad
2
Delay from
Output
Register to
Output Pin
–6 Speed
Grade
–7 Speed
Grade (4)
–8 Speed Grade
Unit
Min
Offset
Max
Offset
Min
Offset
Max
Offset
Min
Offset
Max
Offset
0
2669
0
4482
0
4834
0
4859
ps
0
2802
—
—
0
4671
—
—
ps
0
308
0
572
0
648
0
682
ps
0
324
—
—
0
626
—
—
ps
Notes to Table 5–37 :
(1)
(2)
(3)
(4)
The incremental values for the settings are generally linear. For exact values of each setting, use the latest version
of the Quartus II software.
The minimum and maximum offset timing numbers are in reference to setting “0” as available in the Quartus II
software.
The value in the first row represents the fast corner timing parameter for industrial and automotive devices. The
second row represents the fast corner timing parameter for commercial devices.
The value in the first row is for automotive devices. The second row is for commercial devices.
Default Capacitive Loading of Different I/O Standards
Refer to Table 5–38 for default capacitive loading of different I/O
standards.
Table 5–38. Default Loading of Different I/O Standards for Cyclone II Device
(Part 1 of 2)
I/O Standard
Altera Corporation
February 2008
Capacitive Load
Unit
LVTTL
0
pF
LVCMOS
0
pF
2.5V
0
pF
1.8V
0
pF
1.5V
0
pF
PCI
10
pF
PCI-X
10
pF
SSTL_2_CLASS_I
0
pF
SSTL_2_CLASS_II
0
pF
SSTL_18_CLASS_I
0
pF
5–31
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–38. Default Loading of Different I/O Standards for Cyclone II Device
(Part 2 of 2)
I/O Standard
SSTL_18_CLASS_II
Capacitive Load
Unit
0
pF
1.5V_HSTL_CLASS_I
0
pF
1.5V_HSTL_CLASS_II
0
pF
1.8V_HSTL_CLASS_I
0
pF
1.8V_HSTL_CLASS_II
0
pF
DIFFERENTIAL_SSTL_2_CLASS_I
0
pF
DIFFERENTIAL_SSTL_2_CLASS_II
0
pF
DIFFERENTIAL_SSTL_18_CLASS_I
0
pF
DIFFERENTIAL_SSTL_18_CLASS_II
0
pF
1.5V_DIFFERENTIAL_HSTL_CLASS_I
0
pF
1.5V_DIFFERENTIAL_HSTL_CLASS_II
0
pF
1.8V_DIFFERENTIAL_HSTL_CLASS_I
0
pF
1.8V_DIFFERENTIAL_HSTL_CLASS_II
0
pF
LVDS
0
pF
1.2V_HSTL
0
pF
1.2V_DIFFERENTIAL_HSTL
0
pF
5–32
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
I/O Delays
Refer to Tables 5–39 through 5–43 for I/O delays.
Table 5–39. I/O Delay Parameters
Symbol
Parameter
tD I P
Delay from I/O datain to output pad
tO P
Delay from I/O output register to output pad
tP C O U T
Delay from input pad to I/O dataout to core
tP I
Delay from input pad to I/O input register
Table 5–40. Cyclone II I/O Input Delay for Column Pins (Part 1 of 3)
Fast Corner
I/O Standard
LVTTL
2.5V
1.8V
–7
–7
–6
–8
Speed Speed
Parameter Industrial/ Commer Speed
Speed Unit
Grade Grade
Grade
Grade
Automotive
-cial
(1)
(2)
tP I
581
609
1222
1228
tP C O U T
367
385
760
783
tP I
624
654
1192
1238
tP C O U T
410
430
730
793
1282
1282
ps
854
854
ps
1283
1283
ps
855
855
ps
tP I
725
760
1372
1428
1484
1484
ps
tP C O U T
511
536
910
983
1056
1056
ps
tP I
790
828
1439
1497
1556
1556
ps
tP C O U T
576
604
977
1052
1128
1128
ps
tP I
581
609
1222
1228
1282
1282
ps
tP C O U T
367
385
760
783
854
854
ps
SSTL_2_CLASS_I
tP I
533
558
990
1015
1040
1040
ps
tP C O U T
319
334
528
570
612
612
ps
SSTL_2_CLASS_II
tP I
533
558
990
1015
1040
1040
ps
tP C O U T
319
334
528
570
612
612
ps
1.5V
LVCMOS
SSTL_18_CLASS_I
SSTL_18_CLASS_II
Altera Corporation
February 2008
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
5–33
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–40. Cyclone II I/O Input Delay for Column Pins (Part 2 of 3)
Fast Corner
I/O Standard
1.5V_HSTL_CLASS_I
1.5V_HSTL_CLASS_II
1.8V_HSTL_CLASS_I
1.8V_HSTL_CLASS_II
DIFFERENTIAL_SSTL_2_
CLASS_I
DIFFERENTIAL_SSTL_2_
CLASS_II
DIFFERENTIAL_SSTL_18_
CLASS_I
DIFFERENTIAL_SSTL_18_
CLASS_II
1.8V_DIFFERENTIAL_HSTL_
CLASS_I
1.8V_DIFFERENTIAL_HSTL_
CLASS_II
1.5V_DIFFERENTIAL_HSTL_
CLASS_I
1.5V_DIFFERENTIAL_HSTL_
CLASS_II
LVDS
1.2V_HSTL
–7
–7
–6
–8
Speed Speed
Parameter Industrial/ Commer Speed
Speed Unit
Grade Grade
Grade
Grade
Automotive
-cial
(1)
(2)
tP I
589
617
1145
1176
1208
1208
ps
tP C O U T
375
393
683
731
780
780
ps
tP I
589
617
1145
1176
1208
1208
ps
tP C O U T
375
393
683
731
780
780
ps
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
tP I
533
558
990
1015
1040
1040
ps
tP C O U T
319
334
528
570
612
612
ps
tP I
533
558
990
1015
1040
1040
ps
tP C O U T
319
334
528
570
612
612
ps
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
tP I
577
605
1027
1035
1045
1045
ps
tP C O U T
363
381
565
590
617
617
ps
tP I
589
617
1145
1176
1208
1208
ps
tP C O U T
375
393
683
731
780
780
ps
tP I
589
617
1145
1176
1208
1208
ps
tP C O U T
375
393
683
731
780
780
ps
tP I
623
653
1072
1075
1078
1078
ps
tP C O U T
409
429
610
630
650
650
ps
tP I
570
597
1263
1324
1385
1385
ps
tP C O U T
356
373
801
879
957
957
ps
5–34
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–40. Cyclone II I/O Input Delay for Column Pins (Part 3 of 3)
Fast Corner
I/O Standard
1.2V_DIFFERENTIAL_HSTL
–7
–7
–6
–8
Speed Speed
Parameter Industrial/ Commer Speed
Speed Unit
Grade Grade
Grade
Grade
Automotive
-cial
(1)
(2)
tP I
570
597
1263
1324
1385
1385
ps
tP C O U T
356
373
801
879
957
957
ps
Notes to Table 5–40 :
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
Table 5–41. Cyclone II I/O Input Delay for Row Pins (Part 1 of 2)
Fast Corner
I/O Standard
LVTTL
2.5V
1.8V
1.5V
LVCMOS
SSTL_2_CLASS_I
SSTL_2_CLASS_II
SSTL_18_CLASS_I
SSTL_18_CLASS_II
1.5V_HSTL_CLASS_I
Altera Corporation
February 2008
–7
–7
–6
–8
Speed Speed
Parameter Industrial/ Commer Speed
Speed Unit
Grade Grade
Grade
Grade
Automotive
-cial
(1)
(2)
tP I
583
611
1129
1160
1240
1240
ps
tP C O U T
366
384
762
784
855
855
ps
tP I
629
659
1099
1171
1244
1244
ps
tP C O U T
412
432
732
795
859
859
ps
tP I
729
764
1278
1360
1443
1443
ps
tP C O U T
512
537
911
984
1058
1058
ps
tP I
794
832
1345
1429
1513
1513
ps
tP C O U T
577
605
978
1053
1128
1128
ps
tP I
583
611
1129
1160
1240
1240
ps
tP C O U T
366
384
762
784
855
855
ps
tP I
536
561
896
947
998
998
ps
tP C O U T
319
334
529
571
613
613
ps
tP I
536
561
896
947
998
998
ps
tP C O U T
319
334
529
571
613
613
ps
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
tP I
593
621
1051
1109
1167
1167
ps
tP C O U T
376
394
684
733
782
782
ps
5–35
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–41. Cyclone II I/O Input Delay for Row Pins (Part 2 of 2)
Fast Corner
I/O Standard
1.5V_HSTL_CLASS_II
–7
–7
–6
–8
Speed Speed
Parameter Industrial/ Commer Speed
Speed Unit
Grade Grade
Grade
Grade
Automotive
-cial
(1)
(2)
tP I
593
621
1051
1109
1167
1167
ps
tP C O U T
376
394
684
733
782
782
ps
1.8V_HSTL_CLASS_I
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
1.8V_HSTL_CLASS_II
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
DIFFERENTIAL_SSTL_2_
CLASS_I
DIFFERENTIAL_SSTL_2_
CLASS_II
DIFFERENTIAL_SSTL_18_
CLASS_I
DIFFERENTIAL_SSTL_18_
CLASS_II
1.8V_DIFFERENTIAL_HSTL_
CLASS_I
1.8V_DIFFERENTIAL_HSTL_
CLASS_II
1.5V_DIFFERENTIAL_HSTL_
CLASS_I
1.5V_DIFFERENTIAL_HSTL_
CLASS_II
LVDS
PCI
PCI-X
tP I
536
561
896
947
998
998
ps
tP C O U T
319
334
529
571
613
613
ps
tP I
536
561
896
947
998
998
ps
tP C O U T
319
334
529
571
613
613
ps
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
tP I
581
609
933
967
1004
1004
ps
tP C O U T
364
382
566
591
619
619
ps
tP I
593
621
1051
1109
1167
1167
ps
tP C O U T
376
394
684
733
782
782
ps
tP I
593
621
1051
1109
1167
1167
ps
tP C O U T
376
394
684
733
782
782
ps
tP I
651
682
1036
1075
1113
1113
ps
tP C O U T
434
455
669
699
728
728
ps
tP I
595
623
1113
1156
1232
1232
ps
tP C O U T
378
396
746
780
847
847
ps
tP I
595
623
1113
1156
1232
1232
ps
tP C O U T
378
396
746
780
847
847
ps
Notes to Table 5–41 :
(1)
(2)
These numbers are for commercial devices.
These numbers are for automotive devices.
5–36
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–42. Cyclone II I/O Output Delay for Column Pins (Part 1 of 6)
Fast Corner
I/O Standard
LVTTL
Drive
Parameter
Strength
4 mA
8 mA
12 mA
16 mA
1524
1599
2903
3125
3341
3348
ps
tD I P
1656
1738
3073
3319
3567
3567
ps
tO P
1343
1409
2670
2866
3054
3061
ps
tD I P
1475
1548
2840
3060
3280
3280
ps
tO P
1287
1350
2547
2735
2917
2924
ps
tD I P
1419
1489
2717
2929
3143
3143
ps
tO P
1239
1299
2478
2665
2844
2851
ps
1371
1438
2648
2859
3070
3070
ps
tO P
1228
1288
2456
2641
2820
2827
ps
tD I P
1360
1427
2626
2835
3046
3046
ps
24 mA
(1)
tO P
1220
1279
2452
2637
2815
2822
ps
tD I P
1352
1418
2622
2831
3041
3041
ps
4 mA
tO P
1346
1412
2509
2695
2873
2880
ps
tD I P
1478
1551
2679
2889
3099
3099
ps
8 mA
tO P
1240
1300
2473
2660
2840
2847
ps
tD I P
1372
1439
2643
2854
3066
3066
ps
12 mA
16 mA
20 mA
24 mA
(1)
Altera Corporation
February 2008
tO P
tD I P
20 mA
LVCMOS
–7
–7
–6
–8
Speed Speed
Industrial/ Commer Speed Grade Grade Speed Unit
Grade
Grade
Automotive
-cial
(2)
(3)
tO P
1221
1280
2428
2613
2790
2797
ps
tD I P
1353
1419
2598
2807
3016
3016
ps
tO P
1203
1262
2403
2587
2765
2772
ps
tD I P
1335
1401
2573
2781
2991
2991
ps
tO P
1194
1252
2378
2562
2738
2745
ps
tD I P
1326
1391
2548
2756
2964
2964
ps
tO P
1192
1250
2382
2566
2742
2749
ps
tD I P
1324
1389
2552
2760
2968
2968
ps
5–37
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–42. Cyclone II I/O Output Delay for Column Pins (Part 2 of 6)
Fast Corner
I/O Standard
2.5V
Drive
Parameter
Strength
4 mA
tO P
1208
1267
2478
2614
2743
2750
ps
tD I P
1340
1406
2648
2808
2969
2969
ps
tO P
1190
1248
2307
2434
2554
2561
ps
tD I P
1322
1387
2477
2628
2780
2780
ps
tO P
1154
1210
2192
2314
2430
2437
ps
tD I P
1286
1349
2362
2508
2656
2656
ps
16 mA
(1)
tO P
1140
1195
2152
2263
2375
2382
ps
tD I P
1272
1334
2322
2457
2601
2601
ps
2 mA
tO P
1682
1765
3988
4279
4563
4570
ps
tD I P
1814
1904
4158
4473
4789
4789
ps
tO P
1567
1644
3301
3538
3768
3775
ps
tD I P
1699
1783
3471
3732
3994
3994
ps
6 mA
tO P
1475
1547
2993
3195
3391
3398
ps
tD I P
1607
1686
3163
3389
3617
3617
ps
8 mA
tO P
1451
1522
2882
3074
3259
3266
ps
tD I P
1583
1661
3052
3268
3485
3485
ps
8 mA
12 mA
1.8V
4 mA
10 mA
12 mA
(1)
1.5V
–7
–7
–6
–8
Speed Speed
Industrial/ Commer Speed Grade Grade Speed Unit
Grade
Grade
Automotive
-cial
(2)
(3)
2 mA
tO P
1438
1508
2853
3041
3223
3230
ps
tD I P
1570
1647
3023
3235
3449
3449
ps
tO P
1438
1508
2853
3041
3223
3230
ps
tD I P
1570
1647
3023
3235
3449
3449
ps
tO P
2083
2186
4477
4870
5256
5263
ps
tD I P
2215
2325
4647
5064
5482
5482
ps
4 mA
tO P
1793
1881
3649
3965
4274
4281
ps
tD I P
1925
2020
3819
4159
4500
4500
ps
6 mA
tO P
1770
1857
3527
3823
4112
4119
ps
tD I P
1902
1996
3697
4017
4338
4338
ps
tO P
1703
1787
3537
3827
4111
4118
ps
tD I P
1835
1926
3707
4021
4337
4337
ps
8 mA
(1)
5–38
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–42. Cyclone II I/O Output Delay for Column Pins (Part 3 of 6)
Fast Corner
I/O Standard
SSTL_2_
CLASS_I
SSTL_2_
CLASS_II
Drive
Parameter
Strength
8 mA
tO P
1196
1254
2388
2516
2638
2645
ps
tD I P
1328
1393
2558
2710
2864
2864
ps
12 mA
(1)
tO P
1174
1231
2277
2401
2518
2525
ps
tD I P
1306
1370
2447
2595
2744
2744
ps
16 mA
tO P
1158
1214
2245
2365
2479
2486
ps
tD I P
1290
1353
2415
2559
2705
2705
ps
20 mA
SSTL_18_
CLASS_I
tO P
1152
1208
2231
2351
2464
2471
ps
tD I P
1284
1347
2401
2545
2690
2690
ps
24 mA
(1)
tO P
1152
1208
2225
2345
2458
2465
ps
tD I P
1284
1347
2395
2539
2684
2684
ps
6 mA
tO P
1472
1544
3140
3345
3542
3549
ps
tD I P
1604
1683
3310
3539
3768
3768
ps
tO P
1469
1541
3086
3287
3482
3489
ps
tD I P
1601
1680
3256
3481
3708
3708
ps
tO P
1466
1538
2980
3171
3354
3361
ps
tD I P
1598
1677
3150
3365
3580
3580
ps
12 mA
(1)
tO P
1466
1538
2980
3171
3354
3361
ps
tD I P
1598
1677
3150
3365
3580
3580
ps
16 mA
tO P
1454
1525
2905
3088
3263
3270
ps
tD I P
1586
1664
3075
3282
3489
3489
ps
18 mA
(1)
tO P
1453
1524
2900
3082
3257
3264
ps
tD I P
1585
1663
3070
3276
3483
3483
ps
8 mA
tO P
1460
1531
3222
3424
3618
3625
ps
tD I P
1592
1670
3392
3618
3844
3844
ps
tO P
1462
1534
3090
3279
3462
3469
ps
tD I P
1594
1673
3260
3473
3688
3688
ps
tO P
1462
1534
3090
3279
3462
3469
ps
tD I P
1594
1673
3260
3473
3688
3688
ps
8 mA
10 mA
SSTL_18_
CLASS_II
1.8V_HSTL_
CLASS_I
10 mA
12 mA
(1)
Altera Corporation
February 2008
–7
–7
–6
–8
Speed Speed
Industrial/ Commer Speed Grade Grade Speed Unit
Grade
Grade
Automotive
-cial
(2)
(3)
5–39
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–42. Cyclone II I/O Output Delay for Column Pins (Part 4 of 6)
Fast Corner
I/O Standard
1.8V_HSTL_
CLASS_II
Drive
Parameter
Strength
tO P
1449
1520
2936
3107
3271
3278
ps
tD I P
1581
1659
3106
3301
3497
3497
ps
18 mA
tO P
1450
1521
2924
3101
3272
3279
ps
tD I P
1582
1660
3094
3295
3498
3498
ps
20 mA
(1)
tO P
1452
1523
2926
3096
3259
3266
ps
tD I P
1584
1662
3096
3290
3485
3485
ps
8 mA
tO P
1779
1866
4292
4637
4974
4981
ps
tD I P
1911
2005
4462
4831
5200
5200
ps
tO P
1784
1872
4031
4355
4673
4680
ps
tD I P
1916
2011
4201
4549
4899
4899
ps
12 mA
(1)
tO P
1784
1872
4031
4355
4673
4680
ps
tD I P
1916
2011
4201
4549
4899
4899
ps
1.5V_HSTL_
CLASS_II
16 mA
(1)
tO P
1750
1836
3844
4125
4399
4406
ps
tD I P
1882
1975
4014
4319
4625
4625
ps
DIFFERENTIAL_
SSTL_2_CLASS_I
8 mA
tO P
1196
1254
2388
2516
2638
2645
ps
tD I P
1328
1393
2558
2710
2864
2864
ps
12 mA
(1)
tO P
1174
1231
2277
2401
2518
2525
ps
tD I P
1306
1370
2447
2595
2744
2744
ps
16 mA
tO P
1158
1214
2245
2365
2479
2486
ps
tD I P
1290
1353
2415
2559
2705
2705
ps
1.5V_HSTL_
CLASS_I
16 mA
–7
–7
–6
–8
Speed Speed
Industrial/ Commer Speed Grade Grade Speed Unit
Grade
Grade
Automotive
-cial
(2)
(3)
10 mA
DIFFERENTIAL_
SSTL_2_CLASS_II
20 mA
24 mA
(1)
tO P
1152
1208
2231
2351
2464
2471
ps
tD I P
1284
1347
2401
2545
2690
2690
ps
tO P
1152
1208
2225
2345
2458
2465
ps
tD I P
1284
1347
2395
2539
2684
2684
ps
5–40
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–42. Cyclone II I/O Output Delay for Column Pins (Part 5 of 6)
Fast Corner
I/O Standard
DIFFERENTIAL_
SSTL_18_CLASS_I
Drive
Parameter
Strength
6 mA
–7
–7
–6
–8
Speed Speed
Industrial/ Commer Speed Grade Grade Speed Unit
Grade
Grade
Automotive
-cial
(2)
(3)
tO P
1472
1544
3140
3345
3542
3549
ps
tD I P
1604
1683
3310
3539
3768
3768
ps
tO P
1469
1541
3086
3287
3482
3489
ps
tD I P
1601
1680
3256
3481
3708
3708
ps
tO P
1466
1538
2980
3171
3354
3361
ps
tD I P
1598
1677
3150
3365
3580
3580
ps
12 mA
(1)
tO P
1466
1538
2980
3171
3354
3361
ps
tD I P
1598
1677
3150
3365
3580
3580
ps
16 mA
tO P
1454
1525
2905
3088
3263
3270
ps
tD I P
1586
1664
3075
3282
3489
3489
ps
tO P
1453
1524
2900
3082
3257
3264
ps
tD I P
1585
1663
3070
3276
3483
3483
ps
tO P
1460
1531
3222
3424
3618
3625
ps
tD I P
1592
1670
3392
3618
3844
3844
ps
tO P
1462
1534
3090
3279
3462
3469
ps
tD I P
1594
1673
3260
3473
3688
3688
ps
12 mA
(1)
tO P
1462
1534
3090
3279
3462
3469
ps
tD I P
1594
1673
3260
3473
3688
3688
ps
1.8V_DIFFERENTIAL 16 mA
_HSTL_CLASS_II
tO P
1449
1520
2936
3107
3271
3278
ps
tD I P
1581
1659
3106
3301
3497
3497
ps
8 mA
10 mA
DIFFERENTIAL_
SSTL_18_CLASS_II
18 mA
(1)
1.8V_DIFFERENTIAL 8 mA
_HSTL_CLASS_I
10 mA
18 mA
20 mA
(1)
1.5V_DIFFERENTIAL 8 mA
_HSTL_CLASS_I
10 mA
12 mA
(1)
Altera Corporation
February 2008
tO P
1450
1521
2924
3101
3272
3279
ps
tD I P
1582
1660
3094
3295
3498
3498
ps
tO P
1452
1523
2926
3096
3259
3266
ps
tD I P
1584
1662
3096
3290
3485
3485
ps
tO P
1779
1866
4292
4637
4974
4981
ps
tD I P
1911
2005
4462
4831
5200
5200
ps
tO P
1784
1872
4031
4355
4673
4680
ps
tD I P
1916
2011
4201
4549
4899
4899
ps
tO P
1784
1872
4031
4355
4673
4680
ps
tD I P
1916
2011
4201
4549
4899
4899
ps
5–41
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–42. Cyclone II I/O Output Delay for Column Pins (Part 6 of 6)
Fast Corner
I/O Standard
Drive
Parameter
Strength
1.5V_DIFFERENTIAL 16 mA
_HSTL_CLASS_II
(1)
–7
–7
–6
–8
Speed Speed
Industrial/ Commer Speed Grade Grade Speed Unit
Grade
Grade
Automotive
-cial
(2)
(3)
tO P
1750
1836
3844
4125
4399
4406
ps
tD I P
1882
1975
4014
4319
4625
4625
ps
LVDS
—
tO P
1258
1319
2243
2344
2438
2445
ps
tD I P
1390
1458
2413
2538
2664
2664
ps
RSDS
—
tO P
1258
1319
2243
2344
2438
2445
ps
tD I P
1390
1458
2413
2538
2664
2664
ps
MINI_LVDS
SIMPLE_RSDS
1.2V_HSTL
1.2V_DIFFERENTIAL
_HSTL
—
—
—
—
tO P
1258
1319
2243
2344
2438
2445
ps
tD I P
1390
1458
2413
2538
2664
2664
ps
tO P
1221
1280
2258
2435
2605
2612
ps
tD I P
1353
1419
2428
2629
2831
2831
ps
tO P
2403
2522
4635
5344
6046
6053
ps
tD I P
2535
2661
4805
5538
6272
6272
ps
tO P
2403
2522
4635
5344
6046
6053
ps
tD I P
2535
2661
4805
5538
6272
6272
ps
Notes to Table 5–42:
(1)
(2)
(3)
This is the default setting in the Quartus II software.
These numbers are for commercial devices.
These numbers are for automotive devices.
5–42
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–43. Cyclone II I/O Output Delay for Row Pins (Part 1 of 4)
Fast Corner
I/O Standard
LVTTL
Drive
Parameter Industrial
Strength
/Automotive
4 mA
8 mA
12 mA
16 mA
20 mA
24 mA
(1)
LVCMOS
4 mA
–7
Speed
Grade
(3)
–8
Speed
Grade
Unit
tO P
1343
1408
2539
2694
2885
2891
ps
tD I P
1467
1540
2747
2931
3158
3158
ps
tO P
1198
1256
2411
2587
2756
2762
ps
tD I P
1322
1388
2619
2824
3029
3029
ps
tO P
1156
1212
2282
2452
2614
2620
ps
tD I P
1280
1344
2490
2689
2887
2887
ps
tO P
1124
1178
2286
2455
2618
2624
ps
tD I P
1248
1310
2494
2692
2891
2891
ps
tO P
1112
1165
2245
2413
2574
2580
ps
tD I P
1236
1297
2453
2650
2847
2847
ps
tO P
1105
1158
2253
2422
2583
2589
ps
tD I P
1229
1290
2461
2659
2856
2856
ps
tO P
1200
1258
2231
2396
2555
2561
ps
1324
1390
2439
2633
2828
2828
ps
tO P
1125
1179
2260
2429
2591
2597
ps
tD I P
1249
1311
2468
2666
2864
2864
ps
12 mA
(1)
tO P
1106
1159
2217
2383
2543
2549
ps
tD I P
1230
1291
2425
2620
2816
2816
ps
4 mA
tO P
1126
1180
2350
2477
2598
2604
ps
tD I P
1250
1312
2558
2714
2871
2871
ps
tO P
1105
1158
2177
2296
2409
2415
ps
tD I P
1229
1290
2385
2533
2682
2682
ps
8 mA
(1)
Altera Corporation
February 2008
–7
Speed
Grade
(2)
tD I P
8 mA
2.5V
Commercial
–6
Speed
Grade
5–43
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–43. Cyclone II I/O Output Delay for Row Pins (Part 2 of 4)
Fast Corner
I/O Standard
1.8V
Drive
Parameter Industrial
Strength
/Automotive
2 mA
4 mA
6 mA
8 mA
10 mA
12 mA
(1)
1.5V
2 mA
–7
Speed
Grade
(2)
–7
Speed
Grade
(3)
–8
Speed
Grade
Unit
tO P
1503
1576
3657
3927
4190
4196
ps
tD I P
1627
1708
3865
4164
4463
4463
ps
tO P
1400
1468
3010
3226
3434
3440
ps
tD I P
1524
1600
3218
3463
3707
3707
ps
tO P
1388
1455
2857
3050
3236
3242
ps
tD I P
1512
1587
3065
3287
3509
3509
ps
tO P
1347
1412
2714
2897
3072
3078
ps
tD I P
1471
1544
2922
3134
3345
3345
ps
tO P
1347
1412
2714
2897
3072
3078
ps
tD I P
1471
1544
2922
3134
3345
3345
ps
tO P
1332
1396
2678
2856
3028
3034
ps
tD I P
1456
1528
2886
3093
3301
3301
ps
tO P
1853
1943
4127
4492
4849
4855
ps
tD I P
1977
2075
4335
4729
5122
5122
ps
tO P
1694
1776
3452
3747
4036
4042
ps
tD I P
1818
1908
3660
3984
4309
4309
ps
6 mA (1) tO P
1694
1776
3452
3747
4036
4042
ps
tD I P
1818
1908
3660
3984
4309
4309
ps
tO P
1090
1142
2152
2268
2376
2382
ps
4 mA
SSTL_2_
CLASS_I
Commercial
–6
Speed
Grade
8 mA
tD I P
1214
1274
2360
2505
2649
2649
ps
12 mA
(1)
tO P
1097
1150
2131
2246
2354
2360
ps
tD I P
1221
1282
2339
2483
2627
2627
ps
SSTL_2_
CLASS_II
16 mA
(1)
tO P
1068
1119
2067
2177
2281
2287
ps
tD I P
1192
1251
2275
2414
2554
2554
ps
SSTL_18_
CLASS_I
6 mA
tO P
1371
1437
2828
3018
3200
3206
ps
tD I P
1495
1569
3036
3255
3473
3473
ps
tO P
1365
1431
2832
3024
3209
3215
ps
tD I P
1489
1563
3040
3261
3482
3482
ps
tO P
1374
1440
2806
2990
3167
3173
ps
tD I P
1498
1572
3014
3227
3440
3440
ps
8 mA
10 mA
(1)
5–44
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–43. Cyclone II I/O Output Delay for Row Pins (Part 3 of 4)
Fast Corner
I/O Standard
1.8V_HSTL_
CLASS_I
Drive
Parameter Industrial
Strength
/Automotive
8 mA
10 mA
Commercial
–6
Speed
Grade
–7
Speed
Grade
(2)
–7
Speed
Grade
(3)
–8
Speed
Grade
Unit
tO P
1364
1430
2853
3017
3178
3184
ps
tD I P
1488
1562
3061
3254
3451
3451
ps
tO P
1332
1396
2842
3011
3173
3179
ps
tD I P
1456
1528
3050
3248
3446
3446
ps
12 mA
(1)
tO P
1332
1396
2842
3011
3173
3179
ps
tD I P
1456
1528
3050
3248
3446
3446
ps
8 mA
(1)
tO P
1657
1738
3642
3917
4185
4191
ps
tD I P
1781
1870
3850
4154
4458
4458
ps
DIFFERENTIAL_ 8 mA
SSTL_2_
CLASS_I
12 mA
(1)
tO P
1090
1142
2152
2268
2376
2382
ps
tD I P
1214
1274
2360
2505
2649
2649
ps
tO P
1097
1150
2131
2246
2354
2360
ps
tD I P
1221
1282
2339
2483
2627
2627
ps
DIFFERENTIAL_ 16 mA
(1)
SSTL_2_
CLASS_II
tO P
1068
1119
2067
2177
2281
2287
ps
tD I P
1192
1251
2275
2414
2554
2554
ps
DIFFERENTIAL_ 6 mA
SSTL_18_
CLASS_I
8 mA
tO P
1371
1437
2828
3018
3200
3206
ps
tD I P
1495
1569
3036
3255
3473
3473
ps
tO P
1365
1431
2832
3024
3209
3215
ps
tD I P
1489
1563
3040
3261
3482
3482
ps
10 mA
(1)
tO P
1374
1440
2806
2990
3167
3173
ps
tD I P
1498
1572
3014
3227
3440
3440
ps
8 mA
1.8V_
DIFFERENTIAL_
HSTL_
10 mA
CLASS_I
tO P
1364
1430
2853
3017
3178
3184
ps
tD I P
1488
1562
3061
3254
3451
3451
ps
tO P
1332
1396
2842
3011
3173
3179
ps
tD I P
1456
1528
3050
3248
3446
3446
ps
tO P
1332
1396
2842
3011
3173
3179
ps
tD I P
1456
1528
3050
3248
3446
3446
ps
tO P
1657
1738
3642
3917
4185
4191
ps
tD I P
1781
1870
3850
4154
4458
4458
ps
1.5V_HSTL_
CLASS_I
12 mA
(1)
8 mA
1.5V_
DIFFERENTIAL_ (1)
HSTL_
CLASS_I
Altera Corporation
February 2008
5–45
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–43. Cyclone II I/O Output Delay for Row Pins (Part 4 of 4)
Fast Corner
I/O Standard
Drive
Parameter Industrial
Strength
/Automotive
LVDS
RSDS
MINI_LVDS
PCI
—
—
—
—
PCI-X
—
Commercial
–6
Speed
Grade
–7
Speed
Grade
(2)
–7
Speed
Grade
(3)
–8
Speed
Grade
Unit
tO P
1216
1275
2089
2184
2272
2278
ps
tD I P
1340
1407
2297
2421
2545
2545
ps
tO P
1216
1275
2089
2184
2272
2278
ps
tD I P
1340
1407
2297
2421
2545
2545
ps
tO P
1216
1275
2089
2184
2272
2278
ps
tD I P
1340
1407
2297
2421
2545
2545
ps
tO P
989
1036
2070
2214
2352
2358
ps
tD I P
1113
1168
2278
2451
2625
2625
ps
tO P
989
1036
2070
2214
2352
2358
ps
tD I P
1113
1168
2278
2451
2625
2625
ps
Notes to Table 5–43:
(1)
(2)
(3)
This is the default setting in the Quartus II software.
These numbers are for commercial devices.
These numbers are for automotive devices.
Maximum Input and Output Clock Rate
Maximum clock toggle rate is defined as the maximum frequency
achievable for a clock type signal at an I/O pin. The I/O pin can be a
regular I/O pin or a dedicated clock I/O pin.
The maximum clock toggle rate is different from the maximum data bit
rate. If the maximum clock toggle rate on a regular I/O pin is 300 MHz,
the maximum data bit rate for dual data rate (DDR) could be potentially
as high as 600 Mbps on the same I/O pin.
Table 5–44 specifies the maximum input clock toggle rates. Table 5–45
specifies the maximum output clock toggle rates at default load.
Table 5–46 specifies the derating factors for the output clock toggle rate
for non-default load.
To calculate the output toggle rate for a non-default load, use this
formula:
The toggle rate for a non-default load
5–46
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
= 1000 / (1000/toggle rate at default load + derating factor * load
value in pF/1000)
For example, the output toggle rate at 0 pF (default) load for SSTL-18
Class II 18mA I/O standard is 270 MHz on a –6 device column I/O pin.
The derating factor is 29 ps/pF. For a 10pF load, the toggle rate is
calculated as:
1000 / (1000/270 + 29 × 10/1000) = 250 (MHz)
Tables 5–44 through 5–46 show the I/O toggle rates for Cyclone II
devices.
Table 5–44. Maximum Input Clock Toggle Rate on Cyclone II Devices (Part 1 of 2)
Maximum Input Clock Toggle Rate on Cyclone II Devices (MHz)
Column I/O Pins
Row I/O Pins
I/O Standard
Dedicated Clock
Inputs
–7
–8
–6
–6
–7
–8
–8
–6
–7
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
LVTTL
450
405
360
450
405
360
420
380
340
2.5V
450
405
360
450
405
360
450
405
360
1.8V
450
405
360
450
405
360
450
405
360
1.5V
300
270
240
300
270
240
300
270
240
LVCMOS
450
405
360
450
405
360
420
380
340
SSTL_2_CLASS_I
500
500
500
500
500
500
500
500
500
SSTL_2_CLASS_II
500
500
500
500
500
500
500
500
500
SSTL_18_CLASS_I
500
500
500
500
500
500
500
500
500
SSTL_18_CLASS_II
500
500
500
500
500
500
500
500
500
1.5V_HSTL_CLASS_I
500
500
500
500
500
500
500
500
500
1.5V_HSTL_CLASS_II
500
500
500
500
500
500
500
500
500
1.8V_HSTL_CLASS_I
500
500
500
500
500
500
500
500
500
1.8V_HSTL_CLASS_II
500
500
500
500
500
500
500
500
500
PCI
—
—
—
350
315
280
350
315
280
PCI-X
—
—
—
350
315
280
350
315
280
DIFFERENTIAL_SSTL_2_
CLASS_I
500
500
500
500
500
500
500
500
500
DIFFERENTIAL_SSTL_2_
CLASS_II
500
500
500
500
500
500
500
500
500
Altera Corporation
February 2008
5–47
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–44. Maximum Input Clock Toggle Rate on Cyclone II Devices (Part 2 of 2)
Maximum Input Clock Toggle Rate on Cyclone II Devices (MHz)
Column I/O Pins
Dedicated Clock
Inputs
Row I/O Pins
I/O Standard
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
DIFFERENTIAL_SSTL_18_
CLASS_I
500
500
500
500
500
500
500
500
500
DIFFERENTIAL_SSTL_18_
CLASS_II
500
500
500
500
500
500
500
500
500
1.8V_DIFFERENTIAL_HSTL_
CLASS_I
500
500
500
500
500
500
500
500
500
1.8V_DIFFERENTIAL_HSTL_
CLASS_II
500
500
500
500
500
500
500
500
500
1.5V_DIFFERENTIAL_HSTL_
CLASS_I
500
500
500
500
500
500
500
500
500
1.5V_DIFFERENTIAL_HSTL_
CLASS_II
500
500
500
500
500
500
500
500
500
LVPECL
—
—
—
—
—
—
402
402
402
LVDS
402
402
402
402
402
402
402
402
402
1.2V_HSTL
110
90
80
—
—
—
110
90
80
1.2V_DIFFERENTIAL_HSTL
110
90
80
—
—
—
110
90
80
Table 5–45. Maximum Output Clock Toggle Rate on Cyclone II Devices (Part 1 of 4)
Maximum Output Clock Toggle Rate on Cyclone II Devices (MHz)
I/O Standard
LVTTL
Drive
Strength
Column I/O Pins (1)
Row I/O Pins (1)
Dedicated Clock
Outputs
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
4 mA
120
100
80
120
100
80
120
100
80
8 mA
200
170
140
200
170
140
200
170
140
12 mA
280
230
190
280
230
190
280
230
190
16 mA
290
240
200
290
240
200
290
240
200
20 mA
330
280
230
330
280
230
330
280
230
24 mA
360
300
250
360
300
250
360
300
250
5–48
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–45. Maximum Output Clock Toggle Rate on Cyclone II Devices (Part 2 of 4)
Maximum Output Clock Toggle Rate on Cyclone II Devices (MHz)
I/O Standard
LVCMOS
2.5V
1.8V
1.5V
SSTL_2_CLASS_I
SSTL_2_CLASS_II
SSTL_18_
CLASS_I
Altera Corporation
February 2008
Drive
Strength
Column I/O Pins (1)
Row I/O Pins (1)
Dedicated Clock
Outputs
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
4 mA
250
210
170
250
210
170
250
210
170
8 mA
280
230
190
280
230
190
280
230
190
12 mA
310
260
210
310
260
210
310
260
210
16 mA
320
270
220
—
—
—
—
—
—
20 mA
350
290
240
—
—
—
—
—
—
24 mA
370
310
250
—
—
—
—
—
—
4 mA
180
150
120
180
150
120
180
150
120
8 mA
280
230
190
280
230
190
280
230
190
12 mA
440
370
300
—
—
—
—
—
—
16 mA
450
405
350
—
—
—
—
—
—
2 mA
120
100
80
120
100
80
120
100
80
4 mA
180
150
120
180
150
120
180
150
120
6 mA
220
180
150
220
180
150
220
180
150
8 mA
240
200
160
240
200
160
240
200
160
10 mA
300
250
210
300
250
210
300
250
210
12 mA
350
290
240
350
290
240
350
290
240
2 mA
80
60
50
80
60
50
80
60
50
4 mA
130
110
90
130
110
90
130
110
90
6 mA
180
150
120
180
150
120
180
150
120
8 mA
230
190
160
—
—
—
—
—
—
8 mA
400
340
280
400
340
280
400
340
280
12 mA
400
340
280
400
340
280
400
340
280
16 mA
350
290
240
350
290
240
350
290
240
20 mA
400
340
280
—
—
—
—
—
—
24 mA
400
340
280
—
—
—
—
—
—
6 mA
260
220
180
260
220
180
260
220
180
8 mA
260
220
180
260
220
180
260
220
180
10 mA
270
220
180
270
220
180
270
220
180
12 mA
280
230
190
—
—
—
—
—
—
5–49
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–45. Maximum Output Clock Toggle Rate on Cyclone II Devices (Part 3 of 4)
Maximum Output Clock Toggle Rate on Cyclone II Devices (MHz)
I/O Standard
SSTL_18_ CLASS_II
1.8V_HSTL_ CLASS_I
Drive
Strength
Column I/O Pins (1)
Row I/O Pins (1)
Dedicated Clock
Outputs
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
16 mA
260
220
180
—
—
—
—
—
—
18 mA
270
220
180
—
—
—
—
—
—
8 mA
260
220
180
260
220
180
260
220
180
10 mA
300
250
210
300
250
210
300
250
210
12 mA
320
270
220
320
270
220
320
270
220
1.8V_HSTL_ CLASS_II 16 mA
230
190
160
—
—
—
—
—
—
18 mA
240
200
160
—
—
—
—
—
—
20 mA
250
210
170
—
—
—
—
—
—
8 mA
210
170
140
210
170
140
210
170
140
10 mA
220
180
150
—
—
—
—
—
—
1.5V_HSTL_ CLASS_I
12 mA
230
190
160
—
—
—
—
—
—
1.5V_HSTL_ CLASS_II 16 mA
210
170
140
—
—
—
—
—
—
DIFFERENTIAL_
SSTL_2_CLASS_I
8 mA
400
340
280
400
340
280
400
340
280
12 mA
400
340
280
400
340
280
400
340
280
DIFFERENTIAL_
SSTL_2_CLASS_II
16 mA
350
290
240
350
290
240
350
290
240
20 mA
400
340
280
—
—
—
—
—
—
DIFFERENTIAL_
SSTL_18_CLASS_I
24 mA
400
340
280
—
—
—
—
—
—
6 mA
260
220
180
260
220
180
260
220
180
8 mA
260
220
180
260
220
180
260
220
180
10 mA
270
220
180
270
220
180
270
220
180
12 mA
280
230
190
—
—
—
—
—
—
DIFFERENTIAL_SSTL 16 mA
_18_CLASS_II
18 mA
260
220
180
—
—
—
—
—
—
270
220
180
—
—
—
—
—
—
8 mA
1.8V_
DIFFERENTIAL_HSTL
10 mA
_CLASS_I
12 mA
260
220
180
260
220
180
260
220
180
300
250
210
300
250
210
300
250
210
320
270
220
320
270
220
320
270
220
16 mA
1.8V_
DIFFERENTIAL_HSTL
18 mA
_CLASS_II
20 mA
230
190
160
—
—
—
—
—
—
240
200
160
—
—
—
—
—
—
250
210
170
—
—
—
—
—
—
5–50
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–45. Maximum Output Clock Toggle Rate on Cyclone II Devices (Part 4 of 4)
Maximum Output Clock Toggle Rate on Cyclone II Devices (MHz)
I/O Standard
Drive
Strength
Column I/O Pins (1)
Row I/O Pins (1)
Dedicated Clock
Outputs
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
8 mA
1.5V_
DIFFERENTIAL_HSTL
10 mA
_CLASS_I
12 mA
210
170
140
210
170
140
210
170
140
220
180
150
—
—
—
—
—
—
230
190
160
—
—
—
—
—
—
16 mA
1.5V_
DIFFERENTIAL_HSTL
_CLASS_II
210
170
140
—
—
—
—
—
—
LVDS
—
400
340
280
400
340
280
400
340
280
RSDS
—
400
340
280
400
340
280
400
340
280
MINI_LVDS
—
400
340
280
400
340
280
400
340
280
SIMPLE_RSDS
—
380
320
260
380
320
260
380
320
260
1.2V_HSTL
—
80
80
80
—
—
—
—
—
—
1.2V_
DIFFERENTIAL_HSTL
—
80
80
80
—
—
—
—
—
—
PCI
—
—
—
—
350
315
280
350
315
280
PCI-X
—
—
—
350
315
280
350
315
280
LVTTL
OCT_25_
OHMS
—
360
300
250
360
300
250
360
300
250
LVCMOS
OCT_25_
OHMS
360
300
250
360
300
250
360
300
250
2.5V
OCT_50_
OHMS
240
200
160
240
200
160
240
200
160
1.8V
OCT_50_
OHMS
290
240
200
290
240
200
290
240
200
SSTL_2_CLASS_I
OCT_50_
OHMS
240
200
160
240
200
160
—
—
—
SSTL_18_CLASS_I
OCT_50_
OHMS
290
240
200
290
240
200
—
—
—
Note to Table 5–45:
(1)
This is based on single data rate I/Os.
Altera Corporation
February 2008
5–51
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–46. Maximum Output Clock Toggle Rate Derating Factors (Part 1 of 4)
Maximum Output Clock Toggle Rate Derating Factors (ps/pF)
I/O Standard
LVTTL
LVCMOS
2.5V
1.8V
1.5V
SSTL_2_CLASS_I
Drive
Strength
Column I/O Pins
Dedicated Clock
Outputs
Row I/O Pins
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
4 mA
438
439
439
338
362
387
338
362
387
8 mA
306
321
336
267
283
299
267
283
299
12 mA
139
179
220
193
198
202
193
198
202
16 mA
145
158
172
139
147
156
139
147
156
20 mA
65
77
90
74
79
84
74
79
84
24 mA
19
20
21
14
18
22
14
18
22
4 mA
298
305
313
197
205
214
197
205
214
8 mA
190
205
219
112
118
125
112
118
125
12 mA
43
72
101
27
31
35
27
31
35
16 mA
87
99
110
—
—
—
—
—
—
20 mA
36
46
56
—
—
—
—
—
—
24 mA
24
25
27
—
—
—
—
—
—
4 mA
228
233
237
270
306
343
270
306
343
8 mA
173
177
180
191
199
208
191
199
208
12 mA
119
121
123
—
—
—
—
—
—
16 mA
64
65
66
—
—
—
—
—
—
2 mA
452
457
461
332
367
403
332
367
403
4 mA
321
347
373
244
291
337
244
291
337
6 mA
227
255
283
178
222
266
178
222
266
8 mA
37
118
199
58
133
207
58
133
207
10 mA
41
72
103
46
85
123
46
85
123
12 mA
7
8
10
13
28
44
13
28
44
2 mA
738
764
789
540
604
669
540
604
669
4 mA
499
518
536
300
354
408
300
354
408
6 mA
261
271
282
60
103
146
60
103
146
8 mA
22
25
29
—
—
—
—
—
—
8 mA
46
47
49
25
40
56
25
40
56
12 mA
67
69
70
23
42
60
23
42
60
5–52
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–46. Maximum Output Clock Toggle Rate Derating Factors (Part 2 of 4)
Maximum Output Clock Toggle Rate Derating Factors (ps/pF)
I/O Standard
SSTL_2_CLASS_II
SSTL_18_
CLASS_I
SSTL_18_ CLASS_II
1.8V_HSTL_ CLASS_I
1.8V_HSTL_ CLASS_II
1.5V_HSTL_ CLASS_I
Drive
Strength
Column I/O Pins
Dedicated Clock
Outputs
Row I/O Pins
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
16 mA
42
43
45
15
29
42
15
29
42
20 mA
41
42
44
—
—
—
—
—
—
24 mA
40
42
43
—
—
—
—
—
—
6 mA
20
22
24
46
47
49
46
47
49
8 mA
20
22
24
47
49
51
47
49
51
10 mA
20
22
25
23
25
27
23
25
27
12 mA
19
23
26
—
—
—
—
—
—
16 mA
30
33
36
—
—
—
—
—
—
18 mA
29
29
29
—
—
—
—
—
—
8 mA
26
28
29
59
61
63
59
61
63
10 mA
46
47
48
65
66
68
65
66
68
12 mA
67
67
67
71
71
72
71
71
72
16 mA
62
65
68
—
—
—
—
—
—
18 mA
59
62
65
—
—
—
—
—
—
20 mA
57
59
62
—
—
—
—
—
—
8 mA
40
40
41
28
32
36
28
32
36
10 mA
41
42
42
—
—
—
—
—
—
12 mA
43
43
43
—
—
—
—
—
—
16 mA
18
20
21
—
—
—
—
—
—
DIFFERENTIAL_SSTL_2 8 mA
_CLASS_I
12 mA
46
47
49
25
40
56
25
40
56
67
69
70
23
42
60
23
42
60
DIFFERENTIAL_SSTL_2 16 mA
_CLASS_II
20 mA
42
43
45
15
29
42
15
29
42
41
42
44
—
—
—
—
—
—
1.5V_HSTL_ CLASS_II
DIFFERENTIAL_SSTL_
18_CLASS_I
Altera Corporation
February 2008
24 mA
40
42
43
—
—
—
—
—
—
6 mA
20
22
24
46
47
49
46
47
49
8 mA
20
22
24
47
49
51
47
49
51
10 mA
20
22
25
23
25
27
23
25
27
12 mA
19
23
26
—
—
—
—
—
—
5–53
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–46. Maximum Output Clock Toggle Rate Derating Factors (Part 3 of 4)
Maximum Output Clock Toggle Rate Derating Factors (ps/pF)
I/O Standard
Drive
Strength
Column I/O Pins
Dedicated Clock
Outputs
Row I/O Pins
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
DIFFERENTIAL_SSTL_
18_CLASS_II
16 mA
30
33
36
—
—
—
—
—
—
18 mA
29
29
29
—
—
—
—
—
—
1.8V_
DIFFERENTIAL_HSTL_
CLASS_I
8 mA
26
28
29
59
61
63
59
61
63
10 mA
46
47
48
65
66
68
65
66
68
12 mA
67
67
67
71
71
72
71
71
72
16 mA
62
65
68
—
—
—
—
—
—
18 mA
59
62
65
—
—
—
—
—
—
20 mA
57
59
62
—
—
—
—
—
—
8 mA
40
40
41
28
32
36
28
32
36
10 mA
41
42
42
—
—
—
—
—
—
12 mA
43
43
43
—
—
—
—
—
—
16 mA
18
20
21
—
—
—
—
—
—
1.8V_
DIFFERENTIAL_HSTL_
CLASS_II
1.5V_
DIFFERENTIAL_HSTL_
CLASS_I
1.5V_
DIFFERENTIAL_HSTL_
CLASS_II
LVDS
—
11
13
16
11
13
15
11
13
15
RSDS
—
11
13
16
11
13
15
11
13
15
MINI_LVDS
—
11
13
16
11
13
15
11
13
15
SIMPLE_RSDS
—
15
19
23
15
19
23
15
19
23
1.2V_HSTL
—
130
132
133
—
—
—
—
—
—
1.2V_
DIFFERENTIAL_HSTL
—
130
132
133
—
—
—
—
—
—
PCI
—
—
—
—
99
120
142
99
120
142
PCI-X
—
—
—
—
99
121
143
99
121
143
LVTTL
OCT_25
_OHMS
13
14
14
21
27
33
21
27
33
LVCMOS
OCT_25
_OHMS
13
14
14
21
27
33
21
27
33
2.5V
OCT_50
_OHMS
346
369
392
324
326
327
324
326
327
1.8V
OCT_50
_OHMS
198
203
209
202
203
204
202
203
204
5–54
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–46. Maximum Output Clock Toggle Rate Derating Factors (Part 4 of 4)
Maximum Output Clock Toggle Rate Derating Factors (ps/pF)
I/O Standard
Drive
Strength
Column I/O Pins
Dedicated Clock
Outputs
Row I/O Pins
–6
–7
–8
–6
–7
–8
–6
–7
–8
Speed Speed Speed Speed Speed Speed Speed Speed Speed
Grade Grade Grade Grade Grade Grade Grade Grade Grade
SSTL_2_CLASS_I
OCT_50
_OHMS
67
69
70
25
42
60
25
42
60
SSTL_18_CLASS_I
OCT_50
_OHMS
30
33
36
47
49
51
47
49
51
High Speed I/O Timing Specifications
The timing analysis for LVDS, mini-LVDS, and RSDS is different
compared to other I/O standards because the data communication is
source-synchronous.
You should also consider board skew, cable skew, and clock jitter in your
calculation. This section provides details on the timing parameters for
high-speed I/O standards in Cyclone II devices.
Table 5–47 defines the parameters of the timing diagram shown in
Figure 5–3.
Table 5–47. High-Speed I/O Timing Definitions (Part 1 of 2)
Parameter
Symbol
Description
High-speed clock
fH S C K L K
High-speed receiver and transmitter input and output clock frequency.
Duty cycle
tD U T Y
Duty cycle on high-speed transmitter output clock.
High-speed I/O data rate
HSIODR
High-speed receiver and transmitter input and output data rate.
Time unit interval
TUI
TUI = 1/HSIODR.
Channel-to-channel skew
TCCS
The timing difference between the fastest and slowest output edges,
including tCO variation and clock skew. The clock is included in the
TCCS measurement.
TCCS = TUI – SW – (2 × RSKM)
Altera Corporation
February 2008
5–55
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–47. High-Speed I/O Timing Definitions (Part 2 of 2)
Parameter
Symbol
Description
Sampling window
SW
The period of time during which the data must be valid in order for you
to capture it correctly. Sampling window is the sum of the setup time,
hold time, and jitter. The window of tSU + tH is expected to be centered
in the sampling window.
SW = TUI – TCCS – (2 × RSKM)
Receiver input skew
margin
RSKM
RSKM is defined by the total margin left after accounting for the
sampling window and TCCS.
RSKM = (TUI – SW – TCCS) / 2
Input jitter (peak to peak)
—
Peak-to-peak input jitter on high-speed PLLs.
Output jitter (peak to peak)
—
Peak-to-peak output jitter on high-speed PLLs.
Signal rise time
tR I S E
Low-to-high transmission time.
Signal fall time
tFA L L
High-to-low transmission time.
Lock time
tL O C K
Lock time for high-speed transmitter and receiver PLLs.
Figure 5–3. High-Speed I/O Timing Diagram
External
Input Clock
Time Unit Interval (TUI)
Internal Clock
Receiver
Input Data
TCCS
RSKM
RSKM
TCCS
Sampling Window (SW)
Figure 5–4 shows the high-speed I/O timing budget.
5–56
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Figure 5–4. High-Speed I/O Timing Budget
Note (1)
Internal Clock Period
0.5 × TCCS RSKM
SW
RSKM
0.5 × TCCS
Note to Figure 5–4:
(1)
The equation for the high-speed I/O timing budget is:
period = TCCS + RSKM + SW + RSKM.
Table 5–48 shows the RSDS timing budget for Cyclone II devices at
311 Mbps. RSDS is supported for transmitting from Cyclone II devices.
Cyclone II devices cannot receive RSDS data because the devices are
intended for applications where they will be driving display drivers.
Cyclone II devices support a maximum RSDS data rate of 311 Mbps using
DDIO registers. Cyclone II devices support RSDS only in the commercial
temperature range.
Table 5–48. RSDS Transmitter Timing Specification (Part 1 of 2)
–6 Speed Grade
Symbol
fH S C L K
(input
clock
frequency)
Device
operation
in Mbps
tD U T Y
–7 Speed Grade
–8 Speed Grade
Conditions
Unit
Min
Typ
Max(1)
Min
Typ
Max(1)
Min
Typ
Max(1)
×10
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×8
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×7
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×4
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×2
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×1
10
—
311
10
—
311
10
—
311
MHz
×10
100
—
311
100
—
311
100
—
311
Mbps
×8
80
—
311
80
—
311
80
—
311
Mbps
×7
70
—
311
70
—
311
70
—
311
Mbps
×4
40
—
311
40
—
311
40
—
311
Mbps
×2
20
—
311
20
—
311
20
—
311
Mbps
×1
10
—
311
10
—
311
10
—
311
Mbps
—
45
—
55
45
—
55
45
—
55
%
Altera Corporation
February 2008
5–57
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–48. RSDS Transmitter Timing Specification (Part 2 of 2)
–6 Speed Grade
Symbol
–7 Speed Grade
–8 Speed Grade
Conditions
Unit
Min
Typ
Max(1)
Min
Typ
Max(1)
Min
Typ
Max(1)
TCCS
—
—
—
200
—
—
200
—
—
200
ps
Output
jitter (peak
to peak)
—
—
—
500
—
—
500
—
—
500
ps
tR I S E
20–80%,
CL O A D = 5 pF
—
500
—
—
500
—
—
500
—
ps
tF A L L
80–20%,
CL O A D = 5 pF
—
500
—
—
500
—
—
500
—
ps
tL O C K
—
—
100
—
100
—
—
100
μs
Note to Table 5–48:
(1)
These specifications are for a three-resistor RSDS implementation. For single-resistor RSDS in ×10 through ×2
modes, the maximum data rate is 170 Mbps and the corresponding maximum input clock frequency is 85 MHz.
For single-resistor RSDS in ×1 mode, the maximum data rate is 170 Mbps, and the maximum input clock frequency
is 170 MHz. For more information about the different RSDS implementations, refer to the High-Speed Differential
Interfaces in Cyclone II Devices chapter of the Cyclone II Device Handbook.
In order to determine the transmitter timing requirements, RSDS receiver
timing requirements on the other end of the link must be taken into
consideration. RSDS receiver timing parameters are typically defined as
tSU and tH requirements. Therefore, the transmitter timing parameter
specifications are tCO (minimum) and tCO (maximum). Refer to Figure 5–4
for the timing budget.
The AC timing requirements for RSDS are shown in Figure 5–5.
5–58
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Figure 5–5. RSDS Transmitter Clock to Data Relationship
Transmitter
Clock (5.88 ns)
Channel-to-Channel
Skew (1.68 ns)
At transmitter
tx_data[11..0]
Transmitter
Valid
Data
Transmitter
Valid
Data
At receiver
rx_data[11..0]
Valid
Data
Valid
Data
Total
Skew
tSU (2 ns)
tH (2 ns)
Table 5–49 shows the mini-LVDS transmitter timing budget for Cyclone II
devices at 311 Mbps. Cyclone II devices cannot receive mini-LVDS data
because the devices are intended for applications where they will be
driving display drivers. A maximum mini-LVDS data rate of 311 Mbps is
supported for Cyclone II devices using DDIO registers. Cyclone II
devices support mini-LVDS only in the commercial temperature range.
Table 5–49. Mini-LVDS Transmitter Timing Specification (Part 1 of 2)
–6 Speed Grade
Symbol
–8 Speed Grade
Unit
Min
fH S C L K
(input
clock
frequency)
–7 Speed Grade
Conditions
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×8
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×7
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×4
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×2
10
—
155.5
10
—
155.5
10
—
155.5
MHz
×1
10
—
311
10
—
311
10
—
311
MHz
Altera Corporation
February 2008
5–59
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–49. Mini-LVDS Transmitter Timing Specification (Part 2 of 2)
–6 Speed Grade
Symbol
tD U T Y
–8 Speed Grade
Unit
Min
Device
operation
in Mbps
–7 Speed Grade
Conditions
Typ
Max
Min
Typ
Max
Min
Typ
Max
×10
100
—
311
100
—
311
100
—
311
Mbps
×8
80
—
311
80
—
311
80
—
311
Mbps
×7
70
—
311
70
—
311
70
—
311
Mbps
×4
40
—
311
40
—
311
40
—
311
Mbps
×2
20
—
311
20
—
311
20
—
311
Mbps
×1
10
—
311
10
—
311
10
—
311
Mbps
—
45
—
55
45
—
55
45
—
55
%
TCCS
—
—
—
200
—
—
200
—
—
200
ps
Output
jitter (peak
to peak)
—
—
—
500
—
—
500
—
—
500
ps
tR I S E
20–80%
—
—
500
—
—
500
—
—
500
ps
tF A L L
80–20%
—
—
500
—
—
500
—
—
500
ps
—
—
100
—
—
100
—
—
100
μs
tL O C K
In order to determine the transmitter timing requirements, mini-LVDS
receiver timing requirements on the other end of the link must be taken
into consideration. The mini-LVDS receiver timing parameters are
typically defined as tSU and tH requirements. Therefore, the transmitter
timing parameter specifications are tCO (minimum) and tCO (maximum).
Refer to Figure 5–4 for the timing budget.
The AC timing requirements for mini-LVDS are shown in Figure 5–6.
Figure 5–6. mini-LVDS Transmitter AC Timing Specification
TUI
LVDSCLK[]n
LVDSCLK[]p
tSU (1)
tH (2)
tSU (1)
tH (2)
LVDS[]p
LVDS[]n
Notes to Figure 5–6:
(1)
(2)
The data setup time, tSU, is 0.225 × TUI.
The data hold time, tH, is 0.225 × TUI.
5–60
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Tables 5–50 and 5–51 show the LVDS timing budget for Cyclone II
devices. Cyclone II devices support LVDS receivers at data rates up to
805 Mbps, and LVDS transmitters at data rates up to 640 Mbps.
Table 5–50. LVDS Transmitter Timing Specification (Part 1 of 2)
–6 Speed Grade
Symbol
Conditions
–7 Speed Grade
–8 Speed Grade
Max
(1)
(2)
—
155.5
(4)
320
(6)
MHz
10
—
155.5
(4)
320
(6)
MHz
320
10
—
155.5
(4)
320
(6)
MHz
275
320
10
—
155.5
(4)
320
(6)
MHz
—
275
320
10
—
155.5
(4)
320
(6)
MHz
10
—
402.5
402.5
10
—
402.5
(8)
402.5
(8)
MHz
640
100
—
550
640
100
—
311
(5)
550
(7)
Mbps
640
640
80
—
550
640
80
—
311
(5)
550
(7)
Mbps
—
640
640
70
—
550
640
70
—
311
(5)
550
(7)
Mbps
40
—
640
640
40
—
550
640
40
—
311
(5)
550
(7)
Mbps
×2
20
—
640
640
20
—
550
640
20
—
311
(5)
550
(7)
Mbps
×1
10
—
402.5
402.5
10
—
402.5
402.5
10
—
402.5
(9)
402.5
(9)
Mbps
—
45
—
55
—
45
—
55
—
45
—
55
—
%
—
—
—
—
160
—
312.5
—
TCCS
(3)
—
—
Output
jitter
(peak to
peak)
—
20–80%
HSIODR
tD U T Y
tR I S E
Max
(1)
(2)
—
275
10
—
320
10
320
320
—
320
10
—
×10
100
×8
Unit
Max
fH S C L K
(input
clock
frequency)
Max
Max
Max
(1)
(2)
—
320
10
—
×7
10
×4
Min
Typ
Min
Typ
320
10
320
10
320
320
275
320
—
320
—
275
10
—
10
—
×2
10
320
10
×1
402.5
402.5
—
640
80
—
×7
70
×4
Min
Typ
×10
10
×8
Altera Corporation
February 2008
—
—
—
200
—
—
—
200
—
—
—
—
500
—
—
500
150
200
250
150
200
250
363.6
ps
—
200
ps
—
—
550 (10)
ps
150
200
250 (11)
ps
5–61
Cyclone II Device Handbook, Volume 1
Timing Specifications
Table 5–50. LVDS Transmitter Timing Specification (Part 2 of 2)
–6 Speed Grade
Symbol
Conditions
Min
Typ
–7 Speed Grade
Max
Max
(1)
(2)
Min
Typ
–8 Speed Grade
Max
Max
(1)
(2)
Min
Typ
Max
Max
(1)
(2)
Unit
tF A L L
80–20%
150
200
250
150
200
250
150
200
250 (11)
ps
tL O C K
—
—
—
100
—
—
100
—
—
100 (12)
μs
Notes to Table 5–50:
(1)
(2)
The maximum data rate that complies with duty cycle distortion of 45–55%.
The maximum data rate when taking duty cycle in absolute ps into consideration that may not comply with 45–55%
duty cycle distortion. If the downstream receiver can handle duty cycle distortion beyond the 45–55% range, you
may use the higher data rate values from this column. You can calculate the duty cycle distortion as a percentage
using the absolute ps value. For example, for a data rate of 640 Mbps (UI = 1562.5 ps) and a tD U T Y of 250 ps, the
duty cycle distortion is ± tD U T Y /(UI*2) *100% = ± 250 ps/(1562.5 *2) * 100% = ± 8%, which gives you a duty cycle
distortion of 42–58%.
(3) The TCCS specification applies to the entire bank of LVDS, as long as the SERDES logic is placed within the LAB
adjacent to the output pins.
(4) For extended temperature devices, the maximum input clock frequency for ×10 through ×2 modes is 137.5 MHz.
(5) For extended temperature devices, the maximum data rate for ×10 through ×2 modes is 275 Mbps.
(6) For extended temperature devices, the maximum input clock frequency for ×10 through ×2 modes is 200 MHz.
(7) For extended temperature devices, the maximum data rate for ×10 through ×2 modes is 400 Mbps.
(8) For extended temperature devices, the maximum input clock frequency for ×1 mode is 340 MHz.
(9) For extended temperature devices, the maximum data rate for ×1 mode is 340 Mbps.
(10) For extended temperature devices, the maximum output jitter (peak to peak) is 600 ps.
(11) For extended temperature devices, the maximum tR I S E and tFA L L are 300 ps.
(12) For extended temperature devices, the maximum lock time is 500 us.
5–62
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–51. LVDS Receiver Timing Specification
–6 Speed Grade
Symbol
fH S C L K
(input clock
frequency)
–7 Speed Grade
–8 Speed Grade
Conditions
×10
Unit
Min
Typ
Max
Min
Typ
Max
Min
Typ
Max
10
—
402.5
10
—
320
10
—
320 (1)
MHz
×8
10
—
402.5
10
—
320
10
—
320 (1)
MHz
×7
10
—
402.5
10
—
320
10
—
320 (1)
MHz
×4
10
—
402.5
10
—
320
10
—
320 (1)
MHz
×2
10
—
402.5
10
—
320
10
—
320 (1)
MHz
×1
10
—
402.5
10
—
402.5
10
—
402.5 (3)
MHz
×10
100
—
805
100
—
640
100
—
640 (2)
Mbps
×8
80
—
805
80
—
640
80
—
640 (2)
Mbps
×7
70
—
805
70
—
640
70
—
640 (2)
Mbps
×4
40
—
805
40
—
640
40
—
640 (2)
Mbps
×2
20
—
805
20
—
640
20
—
640 (2)
Mbps
×1
10
—
402.5
10
—
402.5
10
—
402.5 (4)
Mbps
SW
—
—
—
300
—
—
400
—
—
400
ps
Input jitter
tolerance
—
—
—
500
—
—
500
—
—
550
ps
tL O C K
—
—
—
100
—
—
100
—
—
100 (5)
ps
HSIODR
Notes to Table 5–51:
(1)
(2)
(3)
(4)
(5)
For extended temperature devices, the maximum input clock frequency for x10 through x2 modes is 275 MHz.
For extended temperature devices, the maximum data rate for x10 through x2 modes is 550 Mbps.
For extended temperature devices, the maximum input clock frequency for x1 mode is 340 MHz.
For extended temperature devices, the maximum data rate for x1 mode is 340 Mbps.
For extended temperature devices, the maximum lock time is 500 us.
External Memory Interface Specifications
Table 5–52 shows the DQS bus clock skew adder specifications.
Table 5–52. DQS Bus Clock Skew Adder Specifications
Mode
DQS Clock Skew Adder
Unit
×9
155
ps
×18
190
ps
Note to Table 5–52:
(1)
Altera Corporation
February 2008
This skew specification is the absolute maximum and minimum skew. For
example, skew on a ×9 DQ group is 155 ps or ±77.5 ps.
5–63
Cyclone II Device Handbook, Volume 1
Timing Specifications
JTAG Timing Specifications
Figure 5–7 shows the timing requirements for the JTAG signals.
Figure 5–7. Cyclone II JTAG Waveform
TMS
TDI
t JCP
t JCH
t JCL
t JPSU
t JPH
TCK
tJPZX
t JPXZ
t JPCO
TDO
tJSSU
Signal
to be
Captured
Signal
to be
Driven
5–64
Cyclone II Device Handbook, Volume 1
tJSZX
tJSH
tJSCO
tJSXZ
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–53 shows the JTAG timing parameters and values for Cyclone II
devices.
Table 5–53. Cyclone II JTAG Timing Parameters and Values
Symbol
Parameter
Min
Max
Unit
tJ C P
TCK clock period
40
—
ns
tJ C H
TCK clock high time
20
—
ns
tJ C L
TCK clock low time
20
—
ns
tJ P S U
JTAG port setup time (2)
5
—
ns
tJ P H
JTAG port hold time
10
—
ns
tJ P C O
JTAG port clock to output (2)
—
13
ns
tJ P Z X
JTAG port high impedance to valid output (2)
—
13
ns
tJ P X Z
JTAG port valid output to high impedance (2)
—
13
ns
tJ S S U
Capture register setup time (2)
5
—
ns
tJ S H
Capture register hold time
10
—
ns
tJ S C O
Update register clock to output
—
25
ns
tJ S Z X
Update register high impedance to valid output
—
25
ns
tJ S X Z
Update register valid output to high impedance
—
25
ns
Notes to Table 5–53:
(1)
(2)
This information is preliminary.
This specification is shown for 3.3-V LVTTL/LVCMOS and 2.5-V LVTTL/LVCMOS operation of the JTAG pins. For
1.8-V LVTTL/LVCMOS and 1.5-V LVCMOS, the JTAG port and capture register clock setup time is 3 ns and port
clock to output time is 15 ns.
1
f
Altera Corporation
February 2008
Cyclone II devices must be within the first 17 devices in a JTAG
chain. All of these devices have the same JTAG controller. If any
of the Cyclone II devices are in the 18th position or after they will
fail configuration. This does not affect the SignalTap® II logic
analyzer.
For more information on JTAG, refer to the IEEE 1149.1 (JTAG)
Boundary-Scan Testing for Cyclone II Devices chapter in the Cyclone II
Handbook.
5–65
Cyclone II Device Handbook, Volume 1
Timing Specifications
PLL Timing Specifications
Table 5–54 describes the Cyclone II PLL specifications when operating in
the commercial junction temperature range (0° to 85° C), the industrial
junction temperature range (–40° to 100° C), the automotive junction
temperature range (–40° to 125° C), and the extended temperature range
(–40° to 125° C). Follow the PLL specifications for –8 speed grade devices
when operating in the industrial, automotive, or extended temperature
range.
Table 5–54. PLL Specifications Note (1) (Part 1 of 2)
Symbol
fI N
fI N P F D
fI N D U T Y
Parameter
Min
Typ
Max
Unit
Input clock frequency (–6 speed grade)
10
—
(4)
MHz
Input clock frequency (–7 speed grade)
10
—
(4)
MHz
Input clock frequency (–8 speed grade)
10
—
(4)
MHz
PFD input frequency (–6 speed grade)
10
—
402.5
MHz
PFD input frequency (–7 speed grade)
10
—
402.5
MHz
PFD input frequency (–8 speed grade)
10
—
402.5
MHz
Input clock duty cycle
40
—
60
%
tI N J I T T E R (5)
Input clock period jitter
—
200
—
ps
fO U T _ E X T (external
clock output)
PLL output frequency (–6 speed grade)
10
—
(4)
MHz
fO U T (to global clock)
PLL output frequency (–7 speed grade)
10
—
(4)
MHz
PLL output frequency (–8 speed grade)
10
—
(4)
MHz
PLL output frequency (–6 speed grade)
10
—
500
MHz
PLL output frequency (–7 speed grade)
10
—
450
MHz
PLL output frequency (–8 speed grade)
10
—
402.5
MHz
tO U T D U T Y
Duty cycle for external clock output (when
set to 50%)
45
—
55
%
tJ I T T E R (p-p) (2)
Period jitter for external clock output
fO U T _ E X T > 100 MHz
—
—
300
ps
fO U T _ E X T ≤100 MHz
—
—
30
mUI
tL O C K
Time required to lock from end of device
configuration
—
—
100 (6)
μs
tPLL_PSERR
Accuracy of PLL phase shift
—
—
±60
ps
5–66
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–54. PLL Specifications Note (1) (Part 2 of 2)
Symbol
Parameter
Min
Typ
Max
Unit
fV C O (3)
PLL internal VCO operating range
300
—
1,000
MHz
tA R E S E T
Minimum pulse width on areset signal.
10
—
—
ns
Notes to Table 5–54:
(1)
(2)
(3)
(4)
(5)
(6)
These numbers are preliminary and pending silicon characterization.
The tJITTER specification for the PLL[4..1]_OUT pins are dependent on the I/O pins in its VCCIO bank, how many
of them are switching outputs, how much they toggle, and whether or not they use programmable current strength.
If the VCO post-scale counter = 2, a 300- to 500-MHz internal VCO frequency is available.
This parameter is limited in the Quartus II software by the I/O maximum frequency. The maximum I/O frequency
is different for each I/O standard.
Cyclone II PLLs can track a spread-spectrum input clock that has an input jitter within ±200 ps.
For extended temperature devices, the maximum lock time is 500 us.
Duty Cycle
Distortion
Duty cycle distortion (DCD) describes how much the falling edge of a
clock is off from its ideal position. The ideal position is when both the
clock high time (CLKH) and the clock low time (CLKL) equal half of the
clock period (T), as shown in Figure 5–8. DCD is the deviation of the
non-ideal falling edge from the ideal falling edge, such as D1 for the
falling edge A and D2 for the falling edge B (Figure 5–8). The maximum
DCD for a clock is the larger value of D1 and D2.
Figure 5–8. Duty Cycle Distortion
Ideal Falling Edge
CLKH = T/2
CLKL = T/2
D1
Falling Edge A
D2
Falling Edge B
Clock Period (T)
DCD expressed in absolution derivation, for example, D1 or D2 in
Figure 5–8, is clock-period independent. DCD can also be expressed as a
percentage, and the percentage number is clock-period dependent. DCD
as a percentage is defined as:
Altera Corporation
February 2008
5–67
Cyclone II Device Handbook, Volume 1
Duty Cycle Distortion
(T/2 – D1) / T (the low percentage boundary)
(T/2 + D2) / T (the high percentage boundary)
DCD Measurement Techniques
DCD is measured at an FPGA output pin driven by registers inside the
corresponding I/O element (IOE) block. When the output is a single data
rate signal (non-DDIO), only one edge of the register input clock (positive
or negative) triggers output transitions (Figure 5–9). Therefore, any DCD
present on the input clock signal, or caused by the clock input buffer, or
different input I/O standard, does not transfer to the output signal.
Figure 5–9. DCD Measurement Technique for Non-DDIO (Single-Data Rate) Outputs
IOE
DFF
D
Q
output
clk
However, when the output is a double data rate input/output (DDIO)
signal, both edges of the input clock signal (positive and negative) trigger
output transitions (Figure 5–10). Therefore, any distortion on the input
clock and the input clock buffer affect the output DCD.
5–68
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Figure 5–10. DCD Measurement Technique for DDIO (Double-Data Rate) Outputs
DFF
PRN
clk
D
INPUT
VCC
GND
Q
CLRN
1
0
output
VCC DFF
PRN
D
Q
CLRN
When an FPGA PLL generates the internal clock, the PLL output clocks
the IOE block. As the PLL only monitors the positive edge of the reference
clock input and internally re-creates the output clock signal, any DCD
present on the reference clock is filtered out. Therefore, the DCD for a
DDIO output with PLL in the clock path is better than the DCD for a
DDIO output without PLL in the clock path.
Tables 5–55 through 5–58 give the maximum DCD in absolution
derivation for different I/O standards on Cyclone II devices. Examples
are also provided that show how to calculate DCD as a percentage.
Table 5–55. Maximum DCD for Single Data Outputs (SDR) on Row I/O
Pins Notes (1), (2) (Part 1 of 2)
Row I/O Output Standard
Altera Corporation
February 2008
C6
C7
C8
Unit
LVCMOS
165
230
230
ps
LVTTL
195
255
255
ps
2.5-V
120
120
135
ps
1.8-V
115
115
175
ps
1.5-V
130
130
135
ps
SSTL-2 Class I
60
90
90
ps
SSTL-2 Class II
65
75
75
ps
SSTL-18 Class I
90
165
165
ps
HSTL-15 Class I
145
145
205
ps
HSTL-18 Class I
85
155
155
ps
5–69
Cyclone II Device Handbook, Volume 1
Duty Cycle Distortion
Table 5–55. Maximum DCD for Single Data Outputs (SDR) on Row I/O
Pins Notes (1), (2) (Part 2 of 2)
Row I/O Output Standard
Differential SSTL-2 Class I
C6
C7
C8
Unit
60
90
90
ps
Differential SSTL-2 Class II
65
75
75
ps
Differential SSTL-18 Class I
90
165
165
ps
Differential HSTL-18 Class I
85
155
155
ps
Differential HSTL-15 Class I
145
145
205
ps
LVDS
60
60
60
ps
Simple RSDS
60
60
60
ps
Mini LVDS
60
60
60
ps
PCI
195
255
255
ps
PCI-X
195
255
255
ps
Notes to Table 5–55:
(1)
(2)
The DCD specification is characterized using the maximum drive strength
available for each I/O standard.
Numbers are applicable for commercial, industrial, and automotive devices.
Here is an example for calculating the DCD as a percentage for an SDR
output on a row I/O on a –6 device:
If the SDR output I/O standard is SSTL-2 Class II, the maximum DCD is
65 ps (refer to Table 5–55). If the clock frequency is 167 MHz, the clock
period T is:
T = 1/ f = 1 / 167 MHz = 6 ns = 6000 ps
To calculate the DCD as a percentage:
(T/2 – DCD) / T = (6000 ps/2 – 65 ps) / 6000 ps = 48.91% (for low
boundary)
(T/2 + DCD) / T = (6000 ps/2 + 65 ps) / 6000ps = 51.08% (for high
boundary
Table 5–56. Maximum DCD for SDR Output on Column I/O Notes (1), (2)
(Part 1 of 2)
Column I/O Output Standard
C6
C7
C8
Unit
LVCMOS
195
285
285
ps
LVTTL
210
305
305
ps
5–70
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
Table 5–56. Maximum DCD for SDR Output on Column I/O Notes (1), (2)
(Part 2 of 2)
Column I/O Output Standard
C6
C7
C8
Unit
2.5-V
140
140
155
ps
1.8-V
115
115
165
ps
1.5-V
745
745
770
ps
SSTL-2 Class I
60
60
75
ps
SSTL-2 Class II
60
60
80
ps
SSTL-18 Class I
60
130
130
ps
SSTL-18 Class II
60
135
135
ps
HSTL-18 Class I
60
115
115
ps
HSTL-18 Class II
75
75
100
ps
HSTL-15 Class I
150
150
150
ps
HSTL-15 Class II
135
135
155
ps
Differential SSTL-2 Class I
60
60
75
ps
Differential SSTL-2 Class II
60
60
80
ps
Differential SSTL-18 Class I
60
130
130
ps
Differential SSTL-18 Class II
60
135
135
ps
Differential HSTL-18 Class I
60
115
115
ps
Differential HSTL-18 Class II
75
75
100
ps
Differential HSTL-15 Class I
150
150
150
ps
Differential HSTL-15 Class II
135
135
155
ps
LVDS
60
60
60
ps
Simple RSDS
60
70
70
ps
Mini-LVDS
60
60
60
ps
Notes to Table 5–56:
(1)
(2)
The DCD specification is characterized using the maximum drive strength
available for each I/O standard.
Numbers are applicable for commercial, industrial, and automotive devices.
Table 5–57. Maximum for DDIO Output on Row Pins with PLL in the Clock
Path Notes (1), (2) (Part 1 of 2)
Row Pins with PLL in the Clock Path
Altera Corporation
February 2008
C6
C7
C8
Unit
LVCMOS
270
310
310
ps
LVTTL
285
305
335
ps
2.5-V
180
180
220
ps
1.8-V
165
175
205
ps
5–71
Cyclone II Device Handbook, Volume 1
Duty Cycle Distortion
Table 5–57. Maximum for DDIO Output on Row Pins with PLL in the Clock
Path Notes (1), (2) (Part 2 of 2)
Row Pins with PLL in the Clock Path
C6
C7
C8
Unit
1.5-V
280
280
280
ps
SSTL-2 Class I
150
190
230
ps
SSTL-2 Class II
155
200
230
ps
SSTL-18 Class I
180
240
260
ps
HSTL-18 Class I
180
235
235
ps
HSTL-15 Class I
205
220
220
ps
Differential SSTL-2 Class I
150
190
230
ps
Differential SSTL-2 Class II
155
200
230
ps
Differential SSTL-18 Class I
180
240
260
ps
Differential HSTL-18 Class I
180
235
235
ps
Differential HSTL-15 Class I
205
220
220
ps
LVDS
95
110
120
ps
Simple RSDS
100
155
155
ps
Mini LVDS
95
110
120
ps
PCI
285
305
335
ps
PCI-X
285
305
335
ps
Notes to Table 5–57:
(1)
(2)
The DCD specification is characterized using the maximum drive strength
available for each I/O standard.
Numbers are applicable for commercial, industrial, and automotive devices.
For DDIO outputs, you can calculate actual half period from the
following equation:
Actual half period = ideal half period – maximum DCD
For example, if the DDR output I/O standard is SSTL-2 Class II, the
maximum DCD for a –5 device is 155 ps (refer to Table 5–57). If the clock
frequency is 167 MHz, the half-clock period T/2 is:
T/2 = 1/(2* f )= 1 /(2*167 MHz) = 3 ns = 3000 ps
5–72
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
The actual half period is then = 3000 ps – 155 ps = 2845 ps
Table 5–58. Maximum DCD for DDIO Output on Column I/O Pins with PLL in
the Clock Path Notes (1), (2)
Column I/O Pins in the Clock Path
C6
C7
C8
Unit
LVCMOS
285
400
445
ps
LVTTL
305
405
460
ps
2.5-V
175
195
285
ps
1.8-V
190
205
260
ps
1.5-V
605
645
645
ps
SSTL-2 Class I
125
210
245
ps
SSTL-2 Class II
195
195
195
ps
SSTL-18 Class I
130
240
245
ps
SSTL-18 Class II
135
270
330
ps
HSTL-18 Class I
135
240
240
ps
HSTL-18 Class II
165
240
285
ps
HSTL-15 Class I
220
335
335
ps
HSTL-15 Class II
190
210
375
ps
Differential SSTL-2 Class I
125
210
245
ps
Differential SSTL-2 Class II
195
195
195
ps
Differential SSTL-18 Class I
130
240
245
ps
Differential SSTL-18 Class II
132
270
330
ps
Differential HSTL-18 Class I
135
240
240
ps
Differential HSTL-18 Class II
165
240
285
ps
Differential HSTL-15 Class I
220
335
335
ps
Differential HSTL-15 Class II
190
210
375
ps
LVDS
110
120
125
ps
Simple RSDS
125
125
275
ps
Mini-LVDS
110
120
125
ps
Notes to Table 5–58:
(1)
(2)
Altera Corporation
February 2008
The DCD specification is characterized using the maximum drive strength
available for each I/O standard.
Numbers are applicable for commercial, industrial, and automotive devices.
5–73
Cyclone II Device Handbook, Volume 1
Referenced Documents
Referenced
Documents
This chapter references the following documents:
■
■
■
■
■
■
Document
Revision History
Cyclone II Architecture chapter in Cyclone II Device Handbook
High-Speed Differential Interfaces in Cyclone II Devices chapter of the
Cyclone II Device Handbook
IEEE 1149.1 (JTAG) Boundary-Scan Testing for Cyclone II Devices
chapter in the Cyclone II Handbook
Operating Requirements for Altera Devices Data Sheet
PowerPlay Early Power Estimator User Guide
PowerPlay Power Analysis chapters in volume 3 of the Quartus II
Handbook
Table 5–59 shows the revision history for this document.
Table 5–59. Document Revision History
Date and
Document
Version
February 2008
v4.0
April 2007
v3.2
Changes Made
Summary of Changes
Added I/O timing numbers for
automotive-grade devices.
●
Updated the following tables with I/O timing
numbers for automotive-grade devices:
Tables 5–2, 5–12, 5–13, 5–15, 5–16, 5–17, 5–18,
5–19, 5–21, 5–22, 5–23, 5–25, 5–26, 5–27, 5–28,
5–36, 5–37, 5–40, 5–41, 5–42, 5–43, 5–55, 5–56,
5–57, and 5–58.
Added “Referenced Documents”.
●
Updated Table 5–3.
Updated RCONF typical and maximum
values in Table 5–3.
●
5–74
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
DC Characteristics and Timing Specifications
February 2007
v3.1
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
●
Added document revision history.
Added VCCA minimum and maximum limitations in
Table 5–1.
Updated Note (1) in Table 5–2.
Updated the maximum VCC rise time for Cyclone II
“A” devices in Table 5–2.
Updated RCONF information in Table 5–3.
Changed VI to Ii in Table 5–3.
Updated LVPECL clock inputs in Note (6) to
Table 5–8.
Updated Note (1) to Table 5–12.
Updated CV R E F capacitance description in
Table 5–13.
Updated “Timing Specifications” section.
Updated Table 5–45.
Added Table 5–46 with information on toggle rate
derating factors.
Corrected calculation of the period based on a
640 Mbps data rate as 1562.5 ps in Note (2) to
Table 5–50.
Updated “PLL Timing Specifications” section.
Updated VCO range of 300–500 MHz in Note (3) to
Table 5–54.
Updated chapter with extended temperature
information.
—
December 2005 Updated PLL Timing Specifications
v2.2
—
November 2005 Updated technical content throughout.
v2.1
—
July 2005
v2.0
—
Updated technical content throughout.
November 2004 Updated the “Differential I/O Standards” section.
v1.1
Updated Table 5–54.
—
June 2004
v1.0
—
Added document to the Cyclone II Device Handbook.
Altera Corporation
February 2008
5–75
Cyclone II Device Handbook, Volume 1
Document Revision History
5–76
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2008
6. Reference & Ordering
Information
CII51006-1.4
Software
Cyclone® II devices are supported by the Altera® Quartus® II design
software, which provides a comprehensive environment for
system-on-a-programmable-chip (SOPC) design. The Quartus II software
includes HDL and schematic design entry, compilation and logic
synthesis, full simulation and advanced timing analysis, SignalTap® II
logic analyzer, and device configuration. See the Quartus II Handbook for
more information on the Quartus II software features.
The free Quartus II Web Edition software, available at www.Altera.com,
supports Microsoft Windows XP and Windows 2000. The full version of
Quartus II software is available through the Altera subscription program.
The full version of Quartus II software supports all Altera devices, is
available for Windows XP, Windows 2000, Sun Solaris, and Red Hat
Linux operating systems, and includes a free suite of popular IP
MegaCore® functions for DSP applications and interfacing to external
memory devices. Quartus II software and Quartus II Web Edition
software support seamless integration with your favorite third party
EDA tools.
Device Pin-Outs
Device pin-outs for Cyclone II devices are available on the Altera web site
(www.altera.com). For more information contact Altera Applications.
Ordering
Information
Figure 6–1 describes the ordering codes for Cyclone II devices. For more
information on a specific package, contact Altera Applications.
Altera Corporation
February 2007
6–1
Document Revision History
Figure 6–1. Cyclone II Device Packaging Ordering Information
EP2C
70
A
F
324
C
7
ES
Family Signature
Optional Suffix
Indicates specific device options or
shipment method.
ES: Engineering sample
N: Lead-free devices
EP2C: Cyclone II
Device Type
5
8
15
20
35
50
70
Speed Grade
6, 7, or 8, with 6 being the fastest
Fast-On
Indicates devices with fast
POR (Power on Reset) time.
Operating Temperature
C: Commercial temperature (tJ = 0° C to 85° C)
I: Industrial temperature (tJ = -40° C to 100° C)
Package Type
T:
Q:
F:
U:
Pin Count
Thin quad flat pack (TQFP)
Plastic quad flat pack (PQFP)
FineLine BGA
Ultra FineLine BGA
Document
Revision History
Number of pins for a particular package
Table 6–1 shows the revision history for this document.
Table 6–1. Document Revision History
Date &
Document
Version
February 2007
v1.5
Changes Made
●
●
Added document revision history.
Updated Figure 6–1.
Summary of Changes
●
Added Ultra FineLine BGA
detail in UBGA Package
information in Figure 6–1.
November 2005 Updated software introduction.
v1.2
November 2004 Updated Figure 6–1.
v1.1
June 2004 v1.0
Added document to the Cyclone II Device Handbook.
6–2
Cyclone II Device Handbook, Volume 1
Altera Corporation
February 2007
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