GSI GS880Z36AT-133

GS880Z18/36AT-250/225/200/166/150/133
100-Pin TQFP
Commercial Temp
Industrial Temp
9Mb Pipelined and Flow Through
Synchronous NBT SRAM
250 MHz–133 MHz
2.5 V or 3.3 V VDD
2.5 V or 3.3 V I/O
Features
Functional Description
• NBT (No Bus Turn Around) functionality allows zero wait
read-write-read bus utilization; Fully pin-compatible with
both pipelined and flow through NtRAM™, NoBL™ and
ZBT™ SRAMs
• 2.5 V or 3.3 V +10%/–10% core power supply
• 2.5 V or 3.3 V I/O supply
• User-configurable Pipeline and Flow Through mode
• LBO pin for Linear or Interleave Burst mode
• Pin compatible with 2M, 4M, and 8M devices
• Byte write operation (9-bit Bytes)
• 3 chip enable signals for easy depth expansion
• ZZ Pin for automatic power-down
• JEDEC-standard 100-lead TQFP package
The GS880Z18/36AT is a 9Mbit Synchronous Static SRAM.
GSI's NBT SRAMs, like ZBT, NtRAM, NoBL or other
pipelined read/double late write or flow through read/single
late write SRAMs, allow utilization of all available bus
bandwidth by eliminating the need to insert deselect cycles
when the device is switched from read to write cycles.
Pipeline
3-1-1-1
3.3 V
2.5 V
tKQ
tCycle
Curr (x18)
Curr (x32/x36)
Curr (x18)
Curr (x32/x36)
280
330
275
320
255
300
250
295
230
270
230
265
200
230
195
225
185
215
180
210
165
190
165
185
mA
mA
mA
mA
tKQ
tCycle
5.5
5.5
6.0
6.0
6.5
6.5
7.0
7.0
7.5
7.5
8.5
8.5
ns
ns
Curr (x18)
Curr (x32/x36)
Curr (x18)
Curr (x32/x36)
175
200
175
200
165
190
165
190
160
180
160
180
150
170
150
170
145
165
145
165
135
150
135
150
mA
mA
mA
mA
Flow
Through
2-1-1-1
3.3 V
2.5 V
-250 -225 -200 -166 -150 -133 Unit
2.5 2.7 3.0 3.4 3.8 4.0 ns
4.0 4.4 5.0 6.0 6.7 7.5 ns
Because it is a synchronous device, address, data inputs, and
read/ write control inputs are captured on the rising edge of the
input clock. Burst order control (LBO) must be tied to a power
rail for proper operation. Asynchronous inputs include the
Sleep mode enable (ZZ) and Output Enable. Output Enable can
be used to override the synchronous control of the output
drivers and turn the RAM's output drivers off at any time.
Write cycles are internally self-timed and initiated by the rising
edge of the clock input. This feature eliminates complex offchip write pulse generation required by asynchronous SRAMs
and simplifies input signal timing.
The GS880Z18/36AT may be configured by the user to
operate in Pipeline or Flow Through mode. Operating as a
pipelined synchronous device, meaning that in addition to the
rising edge triggered registers that capture input signals, the
device incorporates a rising-edge-triggered output register. For
read cycles, pipelined SRAM output data is temporarily stored
by the edge triggered output register during the access cycle
and then released to the output drivers at the next rising edge of
clock.
The GS880Z18/36AT is implemented with GSI's high
performance CMOS technology and is available in a JEDECStandard 100-pin TQFP package.
Flow Through and Pipelined NBT SRAM Back-to-Back Read/Write Cycles
Clock
Address
A
B
C
D
E
F
Read/Write
R
W
R
W
R
W
Flow Through
Data I/O
Pipelined
Data I/O
Rev: 1.02 9/2002
QA
DB
QC
DD
QE
QA
DB
QC
DD
1/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
QE
© 2001, Giga Semiconductor, Inc.
NoBL is a trademark of Cypress Semiconductor Corp.. NtRAM is a trademark of Samsung Electronics Co.. ZBT is a trademark of Integrated Device Technology, Inc.
GS880Z18/36AT-250/225/200/166/150/133
A6
A7
E1
E2
NC
NC
BB
BA
E3
VDD
VSS
CK
W
CKE
G
ADV
NC
A17
A8
A9
GS880Z18AT Pinout
NC
NC
NC
VDDQ
A18
NC
NC
VDDQ
VSS
NC
DQA9
DQA8
DQA7
VSS
VDDQ
DQA6
DQA5
VSS
NC
VDD
ZZ
DQA4
DQA3
VDDQ
VSS
DQA2
DQA1
NC
NC
VSS
VDDQ
NC
NC
NC
LBO
A5
A4
A3
A2
A1
A0
NC
NC
VSS
VDD
NC
NC
A10
A11
A12
A13
A14
A15
A16
VSS
NC
NC
DQB1
DQB2
VSS
VDDQ
DQB3
DQB4
FT
VDD
VDD
VSS
DQB5
DQB6
VDDQ
VSS
DQB7
DQB8
DQB9
NC
VSS
VDDQ
NC
NC
NC
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
1
80
2
79
3
78
4
77
5
76
6
75
7
74
8
73
9
72
512K x 18
10
71
11
Top View
70
12
69
13
68
14
67
15
66
16
65
17
64
18
63
19
62
20
61
21
60
22
59
23
58
24
57
25
56
26
55
27
54
28
53
29
52
30
51
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
Rev: 1.02 9/2002
2/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
A6
A7
E1
E2
BD
BC
BB
BA
E3
VDD
VSS
CK
W
CKE
G
ADV
NC
A17
A8
A9
GS880Z36AT Pinout
DQC9
DQC8
DQC7
VDDQ
DQB9
DQB8
DQB7
VDDQ
VSS
DQB6
DQB5
DQB4
DQB3
VSS
VDDQ
DQB2
DQB1
VSS
NC
VDD
ZZ
DQA1
DQA2
VDDQ
VSS
DQA3
DQA4
DQA5
DQA6
VSS
VDDQ
DQA7
DQA8
DQA9
LBO
A5
A4
A3
A2
A1
A0
NC
NC
VSS
VDD
NC
NC
A10
A11
A12
A13
A14
A15
A16
VSS
DQC6
DQC5
DQC4
DQC3
VSS
VDDQ
DQC2
DQC1
FT
VDD
VDD
VSS
DQD1
DQD2
VDDQ
VSS
DQD3
DQD4
DQD5
DQD6
VSS
VDDQ
DQD7
DQD8
DQD9
100 99 98 97 96 95 94 93 92 91 90 89 88 87 86 85 84 83 82 81
1
80
2
79
3
78
4
77
5
76
6
75
7
74
8
73
9
72
256K x 36
10
71
11
Top View
70
12
69
13
68
14
67
15
66
16
65
17
64
18
63
19
62
20
61
21
60
22
59
23
58
24
57
25
56
26
55
27
54
28
53
29
52
30
51
31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50
Rev: 1.02 9/2002
3/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
100-Pin TQFP Pin Descriptions
Symbol
Type
Description
A 0, A 1
In
Burst Address Inputs; Preload the burst counter
A2–A17
In
Address Inputs
A18
In
Address Input (x18 Version Only)
CK
In
Clock Input Signal
BA
In
Byte Write signal for data inputs DQA1–DQA9; active low
BB
In
Byte Write signal for data inputs DQB1–DQB9; active low
BC
In
Byte Write signal for data inputs DQC1–DQC9; active low
BD
In
Byte Write signal for data inputs DQD1–DQD9; active low
W
In
Write Enable; active low
E1
In
Chip Enable; active low
E2
In
Chip Enable; Active High. For self decoded depth expansion
E3
In
Chip Enable; Active Low. For self decoded depth expansion
G
In
Output Enable; active low
ADV
In
Advance/Load; Burst address counter control pin
CKE
In
Clock Input Buffer Enable; active low
NC
—
No Connect
DQA1–DQA9
I/O
Byte A Data Input and Output pins
DQB1–DQB9
I/O
Byte B Data Input and Output pins
DQC1–DQC9
I/O
Byte C Data Input and Output pins
DQD1–DQD9
I/O
Byte D Data Input and Output pins
ZZ
In
Power down control; active high
FT
In
Pipeline/Flow Through Mode Control; active low
LBO
In
Linear Burst Order; active low
VDD
In
Core power supply
VSS
In
Ground
VDDQ
In
Output driver power supply
Rev: 1.02 9/2002
4/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Register 1
Register 2
K
Write Data
Write Data
K
D
Q
K
FT
DQa–DQn
GS880Z18/36A NBT SRAM Functional Block Diagram
Memory
Array
Sense Amps
FT
Register 2
Register 1
Control Logic
5/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
G
CKE
CK
E3
E2
E1
BD
BC
BB
BA
W
LBO
ADV
A0–An
K
K
Data Coherency
Match
Read, Write and
K
Write Address
Write Address
K
K
D
Q
SA1
SA0
Burst
Counter
SA1’
SA0’
Write Drivers
Rev: 1.02 9/2002
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Functional Details
Clocking
Deassertion of the Clock Enable (CKE) input blocks the Clock input from reaching the RAM's internal circuits. It may be used to
suspend RAM operations. Failure to observe Clock Enable set-up or hold requirements will result in erratic operation.
Pipeline Mode Read and Write Operations
All inputs (with the exception of Output Enable, Linear Burst Order and Sleep) are synchronized to rising clock edges. Single cycle
read and write operations must be initiated with the Advance/Load pin (ADV) held low, in order to load the new address. Device
activation is accomplished by asserting all three of the Chip Enable inputs (E1, E2 and E3). Deassertion of any one of the Enable
inputs will deactivate the device.
Function
W
BA
BB
BC
BD
Read
H
X
X
X
X
Write Byte “a”
L
L
H
H
H
Write Byte “b”
L
H
L
H
H
Write Byte “c”
L
H
H
L
H
Write Byte “d”
L
H
H
H
L
Write all Bytes
L
L
L
L
L
Write Abort/NOP
L
H
H
H
H
Read operation is initiated when the following conditions are satisfied at the rising edge of clock: CKE is asserted Low, all three
chip enables (E1, E2, and E3) are active, the write enable input signals W is deasserted high, and ADV is asserted low. The address
presented to the address inputs is latched in to address register and presented to the memory core and control logic. The control
logic determines that a read access is in progress and allows the requested data to propagate to the input of the output register. At
the next rising edge of clock the read data is allowed to propagate through the output register and onto the output pins.
Write operation occurs when the RAM is selected, CKE is active, and the Write input is sampled low at the rising edge of clock.
The Byte Write Enable inputs (BA, BB, BC, & BD) determine which bytes will be written. All or none may be activated. A write
cycle with no Byte Write inputs active is a no-op cycle. The pipelined NBT SRAM provides double late write functionality,
matching the write command versus data pipeline length (2 cycles) to the read command versus data pipeline length (2 cycles). At
the first rising edge of clock, Enable, Write, Byte Write(s), and Address are registered. The Data In associated with that address is
required at the third rising edge of clock.
Flow Through Mode Read and Write Operations
Operation of the RAM in Flow Through mode is very similar to operations in Pipeline mode. Activation of a Read Cycle and the
use of the Burst Address Counter is identical. In Flow Through mode the device may begin driving out new data immediately after
new address are clocked into the RAM, rather than holding new data until the following (second) clock edge. Therefore, in Flow
Through mode the read pipeline is one cycle shorter than in Pipeline mode.
Write operations are initiated in the same way, but differ in that the write pipeline is one cycle shorter as well, preserving the ability
to turn the bus from reads to writes without inserting any dead cycles. While the pipelined NBT RAMs implement a double late
write protocol, in Flow Through mode a single late write protocol mode is observed. Therefore, in Flow Through mode, address
and control are registered on the first rising edge of clock and data in is required at the data input pins at the second rising edge of
clock.
Rev: 1.02 9/2002
6/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Synchronous Truth Table
Operation
Type Address
E1 E2 E3 ZZ ADV W Bx G CKE CK
DQ
Notes
Deselect Cycle, Power Down
D
None
H
X
X
L
L
X
X
X
L
L-H
High-Z
Deselect Cycle, Power Down
D
None
X
X
H
L
L
X
X
X
L
L-H
High-Z
Deselect Cycle, Power Down
D
None
X
L
X
L
L
X
X
X
L
L-H
High-Z
Deselect Cycle, Continue
D
None
X
X
X
L
H
X
X
X
L
L-H
High-Z
Read Cycle, Begin Burst
R
External
L
H
L
L
L
H
X
L
L
L-H
Q
Read Cycle, Continue Burst
B
Next
X
X
X
L
H
X
X
L
L
L-H
Q
1,10
NOP/Read, Begin Burst
R
External
L
H
L
L
L
H
X
H
L
L-H
High-Z
2
Dummy Read, Continue Burst
B
Next
X
X
X
L
H
X
X
H
L
L-H
High-Z
1,2,10
Write Cycle, Begin Burst
W
External
L
H
L
L
L
L
L
X
L
L-H
D
3
Write Cycle, Continue Burst
B
Next
X
X
X
L
H
X
L
X
L
L-H
D
1,3,10
NOP/Write Abort, Begin Burst
W
None
L
H
L
L
L
L
H
X
L
L-H
High-Z
2,3
Write Abort, Continue Burst
B
Next
X
X
X
L
H
X
H
X
L
L-H
High-Z 1,2,3,10
Current
X
X
X
L
X
X
X
X
H
L-H
-
None
X
X
X
H
X
X
X
X
X
X
High-Z
Clock Edge Ignore, Stall
Sleep Mode
1
4
Notes:
1. Continue Burst cycles, whether read or write, use the same control inputs. A Deselect continue cycle can only be entered into if a Deselect cycle is executed first.
2. Dummy Read and Write abort can be considered NOPs because the SRAM performs no operation. A Write abort occurs when the W
pin is sampled low but no Byte Write pins are active so no write operation is performed.
3. G can be wired low to minimize the number of control signals provided to the SRAM. Output drivers will automatically turn off during
write cycles.
4. If CKE High occurs during a pipelined read cycle, the DQ bus will remain active (Low Z). If CKE High occurs during a write cycle, the bus
will remain in High Z.
5. X = Don’t Care; H = Logic High; L = Logic Low; Bx = High = All Byte Write signals are high; Bx = Low = One or more Byte/Write
signals are Low
6. All inputs, except G and ZZ must meet setup and hold times of rising clock edge.
7. Wait states can be inserted by setting CKE high.
8. This device contains circuitry that ensures all outputs are in High Z during power-up.
9. A 2-bit burst counter is incorporated.
10. The address counter is incriminated for all Burst continue cycles.
Rev: 1.02 9/2002
7/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Pipeline and Flow Through Read Write Control State Diagram
D
B
Deselect
W
R
D
R
D
W
New Read
New Write
R
W
B
B
R
B
W
R
Burst Read
W
Burst Write
D
Key
B
D
Notes:
Input Command Code
1. The Hold command (CKE Low) is not
shown because it prevents any state change.
ƒ Transition
Current State (n)
2. W, R, B and D represent input command
codes ,as indicated in the Synchronous Truth Table.
Next State (n+1)
n
n+1
n+2
n+3
Clock (CK)
Command
ƒ
Current State
ƒ
ƒ
ƒ
Next State
Current State and Next State Definition for Pipeline and Flow Through Read/Write Control State Diagram
Rev: 1.02 9/2002
8/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Pipeline Mode Data I/O State Diagram
Intermediate
B W
R B
Intermediate
R
High Z
(Data In)
D
Data Out
(Q Valid)
W
D
Intermediate
Intermediate
W
Intermediate
R
High Z
B
D
Intermediate
Key
Notes:
Input Command Code
1. The Hold command (CKE Low) is not
shown because it prevents any state change.
ƒ Transition
Current State (n)
Transition
Intermediate State (N+1)
n
Next State (n+2)
n+1
2. W, R, B, and D represent input command
codes as indicated in the Truth Tables.
n+2
n+3
Clock (CK)
Command
ƒ
ƒ
ƒ
Current State
Intermediate
State
Next State
ƒ
Current State and Next State Definition for Pipeline Mode Data I/O State Diagram
Rev: 1.02 9/2002
9/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Flow Through Mode Data I/O State Diagram
B W
R B
R
High Z
(Data In)
Data Out
(Q Valid)
W
D
D
W
R
High Z
B
D
Key
Notes
Input Command Code
1. The Hold command (CKE Low) is not
shown because it prevents any state change.
ƒ Transition
Current State (n)
2. W, R, B and D represent input command
codes as indicated in the Truth Tables.
Next State (n+1)
n
n+1
n+2
n+3
Clock (CK)
Command
ƒ
Current State
ƒ
ƒ
ƒ
Next State
Current State and Next State Definition for: Pipeline and Flow Through Read Write Control State Diagram
Rev: 1.02 9/2002
10/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Burst Cycles
Although NBT RAMs are designed to sustain 100% bus bandwidth by eliminating turnaround cycle when there is transition from
read to write, multiple back-to-back reads or writes may also be performed. NBT SRAMs provide an on-chip burst address
generator that can be utilized, if desired, to further simplify burst read or write implementations. The ADV control pin, when
driven high, commands the SRAM to advance the internal address counter and use the counter generated address to read or write
the SRAM. The starting address for the first cycle in a burst cycle series is loaded into the SRAM by driving the ADV pin low, into
Load mode.
Burst Order
The burst address counter wraps around to its initial state after four addresses (the loaded address and three more) have been
accessed. The burst sequence is determined by the state of the Linear Burst Order pin (LBO). When this pin is low, a linear burst
sequence is selected. When the RAM is installed with the LBO pin tied high, Interleaved burst sequence is selected. See the tables
below for details.
Mode Pin Functions
Mode Name
Pin Name State
Burst Order Control
LBO
Power Down Control
ZZ
Function
L
Linear Burst
H
Interleaved Burst
L or NC
Active
H
Standby, IDD = ISB
Note:
There is a pull-up device on the and FT pin and a pull-down device on the ZZ pin, so those input pins can be unconnected and the chip will
operate in the default states as specified in the above tables.
Burst Counter Sequences
Interleaved Burst Sequence
Linear Burst Sequence
A[1:0] A[1:0] A[1:0] A[1:0]
A[1:0] A[1:0] A[1:0] A[1:0]
1st address
00
01
10
11
1st address
00
01
10
11
2nd address
01
10
11
00
2nd address
01
00
11
10
3rd address
10
11
00
01
3rd address
10
11
00
01
4th address
11
00
01
10
4th address
11
10
01
00
Note: The burst counter wraps to initial state on the 5th clock.
Note: The burst counter wraps to initial state on the 5th clock.
BPR 1999.05.18
Rev: 1.02 9/2002
11/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Sleep Mode
During normal operation, ZZ must be pulled low, either by the user or by it’s internal pull down resistor. When ZZ is pulled high,
the SRAM will enter a Power Sleep mode after 2 cycles. At this time, internal state of the SRAM is preserved. When ZZ returns to
low, the SRAM operates normally after ZZ recovery time.
Sleep mode is a low current, power-down mode in which the device is deselected and current is reduced to ISB2. The duration of
Sleep mode is dictated by the length of time the ZZ is in a high state. After entering Sleep mode, all inputs except ZZ become
disabled and all outputs go to High-Z The ZZ pin is an asynchronous, active high input that causes the device to enter Sleep mode.
When the ZZ pin is driven high, ISB2 is guaranteed after the time tZZI is met. Because ZZ is an asynchronous input, pending
operations or operations in progress may not be properly completed if ZZ is asserted. Therefore, Sleep mode must not be initiated
until valid pending operations are completed. Similarly, when exiting Sleep mode during tZZR, only a deselect or read commands
may be applied while the SRAM is recovering from Sleep mode.
~
~ ~
~
CK
~
~ ~
~ ~
~
Sleep Mode Timing Diagram
ZZ
tZZS
Sleep
tZZR
tZZH
Designing for Compatibility
The GSI NBT SRAMs offer users a configurable selection between Flow Through mode and Pipeline mode via the FT signal found
on Pin 14. Not all vendors offer this option, however most mark Pin 14 as VDD or VDDQ on pipelined parts and VSS on flow
through parts. GSI NBT SRAMs are fully compatible with these sockets.
Pin 66, a No Connect (NC) on GSI’s GS880Z18A/36 NBT SRAM, the Parity Error open drain output on GSI’s GS881Z18/36A
NBT SRAM, is often marked as a power pin on other vendor’s NBT compatible SRAMs. Specifically, it is marked VDD or VDDQ
on pipelined parts and VSS on flow through parts. Users of GSI NBT devices who are not actually using the ByteSafe™ parity
feature may want to design the board site for the RAM with Pin 66 tied high through a 1k ohm resistor in Pipeline mode
applications or tied low in Flow Through mode applications in order to keep the option to use non-configurable devices open. By
using the pull-up resistor, rather than tying the pin to one of the power rails, users interested in upgrading to GSI’s ByteSafe NBT
SRAMs (GS881Z18/36A), featuring Parity Error detection and JTAG Boundary Scan, will be ready for connection to the active
low, open drain Parity Error output driver at Pin 66 on GSI’s TQFP ByteSafe RAMs.
Rev: 1.02 9/2002
12/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Absolute Maximum Ratings
(All voltages reference to VSS)
Symbol
Description
Value
Unit
VDD
Voltage on VDD Pins
–0.5 to 4.6
V
VDDQ
Voltage in VDDQ Pins
–0.5 to 4.6
V
VCK
Voltage on Clock Input Pin
–0.5 to 6
V
VI/O
Voltage on I/O Pins
–0.5 to VDDQ +0.5 (≤ 4.6 V max.)
V
VIN
Voltage on Other Input Pins
–0.5 to VDD +0.5 (≤ 4.6 V max.)
V
IIN
Input Current on Any Pin
+/–20
mA
IOUT
Output Current on Any I/O Pin
+/–20
mA
PD
Package Power Dissipation
1.5
W
TSTG
Storage Temperature
–55 to 125
o
TBIAS
Temperature Under Bias
–55 to 125
oC
C
Note:
Permanent damage to the device may occur if the Absolute Maximum Ratings are exceeded. Operation should be restricted to Recommended
Operating Conditions. Exposure to conditions exceeding the Absolute Maximum Ratings, for an extended period of time, may affect reliability of
this component.
Rev: 1.02 9/2002
13/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Power Supply Voltage Ranges
Parameter
Symbol
Min.
Typ.
Max.
Unit
3.3 V Supply Voltage
VDD3
3.0
3.3
3.6
V
2.5 V Supply Voltage
VDD2
2.3
2.5
2.7
V
3.3 V VDDQ I/O Supply Voltage
VDDQ3
3.0
3.3
3.6
V
2.5 V VDDQ I/O Supply Voltage
VDDQ2
2.3
2.5
2.7
V
Notes
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
VDDQ3 Range Logic Levels
Parameter
Symbol
Min.
Typ.
Max.
Unit
Notes
VDD Input High Voltage
VIH
2.0
—
VDD + 0.3
V
1
VDD Input Low Voltage
VIL
–0.3
—
0.8
V
1
VDDQ I/O Input High Voltage
VIHQ
2.0
—
VDDQ + 0.3
V
1,3
VDDQ I/O Input Low Voltage
VILQ
–0.3
—
0.8
V
1,3
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
3. VIHQ (max) is voltage on VDDQ pins plus 0.3 V.
VDDQ2 Range Logic Levels
Parameter
Symbol
Min.
Typ.
Max.
Unit
Notes
VDD Input High Voltage
VIH
0.6*VDD
—
VDD + 0.3
V
1
VDD Input Low Voltage
VIL
–0.3
—
0.3*VDD
V
1
VDDQ I/O Input High Voltage
VIHQ
0.6*VDD
—
VDDQ + 0.3
V
1,3
VDDQ I/O Input Low Voltage
VILQ
–0.3
—
0.3*VDD
V
1,3
Notes:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
3. VIHQ (max) is voltage on VDDQ pins plus 0.3 V.
Rev: 1.02 9/2002
14/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Recommended Operating Temperatures
Parameter
Symbol
Min.
Typ.
Max.
Unit
Notes
Ambient Temperature (Commercial Range Versions)
TA
0
25
70
°C
2
Ambient Temperature (Industrial Range Versions)
TA
–40
25
85
°C
2
Note:
1. The part numbers of Industrial Temperature Range versions end the character “I”. Unless otherwise noted, all performance specifications quoted are
evaluated for worst case in the temperature range marked on the device.
2. Input Under/overshoot voltage must be –2 V > Vi < VDDn+2 V not to exceed 4.6 V maximum, with a pulse width not to exceed 20% tKC.
Undershoot Measurement and Timing
Overshoot Measurement and Timing
VIH
20% tKC
VDD + 2.0 V
VSS
50%
50%
VDD
VSS – 2.0 V
20% tKC
VIL
Capacitance
(TA = 25oC, f = 1 MHZ, VDD = 2.5 V)
Parameter
Symbol
Test conditions
Typ.
Max.
Unit
Input Capacitance
CIN
VIN = 0 V
4
5
pF
Input/Output Capacitance
CI/O
VOUT = 0 V
6
7
pF
Note: These parameters are sample tested.
Package Thermal Characteristics
Rating
Layer Board
Symbol
Max
Unit
Notes
Junction to Ambient (at 200 lfm)
single
RΘJA
40
°C/W
1,2
Junction to Ambient (at 200 lfm)
four
RΘJA
24
°C/W
1,2
Junction to Case (TOP)
—
RΘJC
9
°C/W
3
Notes:
1. Junction temperature is a function of SRAM power dissipation, package thermal resistance, mounting board temperature, ambient. Temperature air flow, board density, and PCB thermal resistance.
2. SCMI G-38-87
3. Average thermal resistance between die and top surface, MIL SPEC-883, Method 1012.1
Rev: 1.02 9/2002
15/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
AC Test Conditions
Parameter
Conditions
Input high level
VDD – 0.2 V
Input low level
0.2 V
Input slew rate
1 V/ns
Input reference level
VDD/2
Output reference level
VDDQ/2
Output load
Fig. 1
Notes:
1. Include scope and jig capacitance.
2. Test conditions as specified with output loading as shown in Fig. 1
unless otherwise noted.
3. Device is deselected as defined by the Truth Table.
Output Load 1
DQ
30pF*
50Ω
VDDQ/2
* Distributed Test Jig Capacitance
DC Electrical Characteristics
Parameter
Symbol
Test Conditions
Min
Max
Input Leakage Current
(except mode pins)
IIL
VIN = 0 to VDD
–1 uA
1 uA
ZZ Input Current
IIN1
VDD ≥ VIN ≥ VIH
0 V ≤ VIN ≤ VIH
–1 uA
–1 uA
1 uA
100 uA
FT Input Current
IIN2
VDD ≥ VIN ≥ VIL
0 V ≤ VIN ≤ VIL
–100 uA
–1 uA
1 uA
1 uA
Output Leakage Current
IOL
Output Disable, VOUT = 0 to VDD
–1 uA
1 uA
Output High Voltage
VOH2
IOH = –8 mA, VDDQ = 2.375 V
1.7 V
—
Output High Voltage
VOH3
IOH = –8 mA, VDDQ = 3.135 V
2.4 V
—
Output Low Voltage
VOL
IOL = 8 mA
—
0.4 V
Rev: 1.02 9/2002
16/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
Rev: 1.02 9/2002
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
17/25
—
Device Deselected;
All other inputs
≥ VIH or ≤ VIL
Deselect
Current
IDD
60
85
IDD
Pipeline
Flow
Through
20
ISB
20
ISB
Pipeline
Flow
Through
165
10
260
15
180
20
290
30
IDDQ
IDD
IDDQ
IDD
IDDQ
IDD
IDDQ
IDD
IDDQ
IDD
Flow
Through
Pipeline
Flow
Through
Pipeline
Flow
Through
165
10
260
20
IDD
IDDQ
180
20
IDD
IDDQ
Flow
Through
Pipeline
290
40
0
to
70°C
IDD
IDDQ
Symbol
Pipeline
Mode
65
90
30
30
175
10
270
15
190
20
300
30
175
10
270
20
190
20
300
40
–40
to
85°C
-250
60
80
20
20
155
10
235
15
170
20
265
30
155
10
235
20
170
20
265
35
65
85
30
30
165
10
245
15
180
20
275
30
165
10
245
20
180
20
275
35
–40
to
85°C
-225
0
to
70°C
Notes:
1. IDD and IDDQ apply to any combination of VDD3, VDD2, VDDQ3, and VDDQ2 operation.
2. All parameters listed are worst case scenario.
—
ZZ ≥ VDD – 0.2 V
(x18)
(x36)
(x18)
(x36)
Standby
Current
2.5 V
Operating
Current
Device Selected;
All other inputs
≥VIH or ≤ VIL
Output open
Device Selected;
All other inputs
≥VIH or ≤ VIL
Output open
Operating
Current
3.3 V
Test Conditions
Parameter
Operating Currents
50
75
20
20
150
10
215
15
165
15
240
25
150
10
215
15
165
15
240
30
0
to
70°C
55
80
30
30
160
10
225
15
175
15
250
25
160
10
225
15
175
15
250
30
–40
to
85°C
-200
50
64
20
20
140
10
185
10
155
15
205
20
140
10
185
15
155
15
205
25
0
to
70°C
55
70
30
30
150
10
195
10
165
15
215
20
150
10
195
15
165
15
215
25
–40
to
85°C
-166
50
60
20
20
135
10
170
10
150
15
190
20
135
10
170
15
150
15
190
25
0
to
70°C
55
65
30
30
145
10
180
10
160
15
200
20
145
10
180
15
160
15
200
25
–40
to
85°C
-150
45
50
20
20
125
10
155
10
140
10
170
15
125
10
155
10
140
10
170
20
0
to
70°C
50
55
30
30
135
10
165
10
150
10
180
15
135
10
165
10
150
10
180
20
–40
to
85°C
-133
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
mA
Unit
GS880Z18/36AT-250/225/200/166/150/133
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
AC Electrical Characteristics
Pipeline
Flow
Through
Parameter
Symbol
Clock Cycle Time
-250
-225
-200
-166
-150
-133
Unit
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
Min
Max
tKC
4.0
—
4.4
—
5.0
—
6.0
—
6.7
—
7.5
—
ns
Clock to Output Valid
tKQ
—
2.5
—
2.7
—
3.0
—
3.4
—
3.8
—
4.0
ns
Clock to Output Invalid
tKQX
1.5
—
1.5
—
1.5
—
1.5
—
1.5
—
1.5
—
ns
Clock to Output in Low-Z
tLZ1
1.5
—
1.5
—
1.5
—
1.5
—
1.5
—
1.5
—
ns
Setup time
tS
1.2
—
1.3
—
1.4
—
1.5
—
1.5
—
1.5
—
ns
Hold time
tH
0.2
—
0.3
—
0.4
—
0.5
—
0.5
—
0.5
—
ns
Clock Cycle Time
tKC
5.5
—
6.0
—
6.5
—
7.0
—
7.5
—
8.5
—
ns
Clock to Output Valid
tKQ
—
5.5
—
6.0
—
6.5
—
7.0
—
7.5
—
8.5
ns
Clock to Output Invalid
tKQX
3.0
—
3.0
—
3.0
—
3.0
—
3.0
—
3.0
—
ns
1
Clock to Output in Low-Z
tLZ
3.0
—
3.0
—
3.0
—
3.0
—
3.0
—
3.0
—
ns
Setup time
tS
1.5
—
1.5
—
1.5
—
1.5
—
1.5
—
1.5
—
ns
Hold time
tH
0.5
—
0.5
—
0.5
—
0.5
—
0.5
—
0.5
—
ns
Clock HIGH Time
tKH
1.3
—
1.3
—
1.3
—
1.3
—
1.5
—
1.7
—
ns
Clock LOW Time
tKL
1.5
—
1.5
—
1.5
—
1.5
—
1.7
—
2
—
ns
Clock to Output in
High-Z
tHZ1
1.5
2.3
1.5
2.5
1.5
3.0
1.5
3.0
1.5
3.0
1.5
3.0
ns
G to Output Valid
tOE
—
2.3
—
2.5
—
3.2
—
3.5
—
3.8
—
4.0
ns
G to output in Low-Z
tOLZ1
0
—
0
—
0
—
0
—
0
—
0
—
ns
G to output in High-Z
tOHZ1
—
2.3
—
2.5
—
3.0
—
3.0
—
3.0
—
3.0
ns
ZZ setup time
tZZS2
5
—
5
—
5
—
5
—
5
—
5
—
ns
ZZ hold time
tZZH2
1
—
1
—
1
—
1
—
1
—
1
—
ns
ZZ recovery
tZZR
20
—
20
—
20
—
20
—
20
—
20
—
ns
Notes:
1. These parameters are sampled and are not 100% tested.
2. ZZ is an asynchronous signal. However, in order to be recognized on any given clock cycle, ZZ must meet the specified setup and hold
times as specified above.
Rev: 1.02 9/2002
18/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Pipeline Mode Read/Write Cycle Timing
1
2
3
4
5
6
7
8
9
A5
A6
A7
10
CK
tS tH
tKH tKL
tKC
CKE
tS tH
E*
tS tH
ADV
tS tH
W
tS tH
Bn
tS tH
A0–An
A1
A2
A3
A4
tKQ
tGLQV
tKQHZ
tKHQZ
tKQLZ
DQA–DQD
D(A1)
tS
D
(A2+1)
D(A2)
tH
Q(A3)
Q(A4)
Q
(A4+1)
D(A5)
Q(A6)
tKQX
tOEHZ
tOELZ
G
COMMAND
Write
D(A1)
Write
D(A2)
BURST Read
Q(A3)
Write
D(A2+1)
Read
Q(A4)
BURST
Read
Q(A4+1)
Write
D(A5)
DON’T CARE
Read
Q(A6)
Write
D(A7)
DESELECT
UNDEFINED
*Note: E = High (False) if E1 = 1 or E2 = 0 or E3 = 1
Rev: 1.02 9/2002
19/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Pipeline Mode No-Op, Stall and Deselect Timing
1
2
3
4
5
A3
A4
6
7
8
10
9
CK
tS tH
CKE
tS tH
E*
tS tH
ADV
tS tH
W
Bn
A0–An
A1
A2
A5
tKHQZ
DQ
D(A1)
Q(A2)
Q(A3)
D(A4)
Q(A5)
tKQHZ
COMMAND
Write
D(A1)
Read
Q(A2)
STALL
Read
Q(A3)
Write
D(A4)
STALL
NOP
DON’T CARE
Read
Q(A5)
DESELECT CONTINUE
DESELECT
UNDEFINED
*Note: E = High (False) if E1 = 1 or E2 = 0 or E3 = 1
Rev: 1.02 9/2002
20/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Flow Through Mode Read/Write Cycle Timing
1
4
3
2
5
6
7
8
9
A5
A6
A7
10
CK
tS tH
tKH tKL
tKC
CKE
tS tH
E*
tS tH
ADV
tS tH
W
tS tH
Bn
tS tH
A0–An
A1
A2
A3
tKQ
A4
tKQHZ
tGLQV
tKHQZ
tKQLZ
DQ
D(A1)
tS
D(A2)
D
(A2+1)
tH
Q(A3)
Q
(A4+1)
Q(A4)
D(A5)
Q(A6)
tKQX
tOEHZ
tOELZ
G
COMMAND
Write
D(A1)
Write
D(A2)
BURST Read
Q(A3)
Write
D(A2+1)
Read
Q(A4)
BURST
Read
Q(A4+1)
Write
D(A5)
Read
Q(A6)
DON’T CARE
Write
D(A7)
DESELECT
UNDEFINED
*Note: E = High (False) if E1 = 1 or E2 = 0 or E3 = 1
Rev: 1.02 9/2002
21/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Flow Through Mode No-Op, Stall and Deselect Timing
1
2
3
4
5
A3
A4
6
7
8
10
9
CK
tS tH
CKE
tS tH
E*
tS tH
ADV
W
Bn
A0–An
A1
A2
A5
tKHQZ
D(A1)
DQ
Q(A2)
Q(A3)
Q(A5)
D(A4)
tKQHZ
COMMAND
Write
D(A1)
Read
Q(A2)
STALL
Read
Q(A3)
Write
D(A4)
STALL
NOP
DON’T CARE
Read
Q(A5)
DESELECT
CONTINUE
DESELECT
UNDEFINED
*Note: E = High (False) if E1 = 1 or E2 = 0 or E3 = 1
Rev: 1.02 9/2002
22/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
TQFP Package Drawing
L
Min. Nom. Max
A1
Standoff
0.05
0.10
0.15
A2
Body Thickness
1.35
1.40
1.45
b
Lead Width
0.20
0.30
0.40
c
Lead Thickness
0.09
—
0.20
D
Terminal Dimension
21.9
22.0
20.1
D1
Package Body
19.9
20.0
20.1
E
Terminal Dimension
15.9
16.0
16.1
E1
Package Body
13.9
14.0
14.1
e
Lead Pitch
—
0.65
—
L
Foot Length
0.45
0.60
0.75
L1
Lead Length
—
1.00
—
Y
Coplanarity
—
—
0.10
θ
Lead Angle
0°
—
7°
L1
c
e
D
D1
Description
Pin 1
Symbol
θ
b
A1
A2
E1
Y
E
Notes:
1. All dimensions are in millimeters (mm).
2. Package width and length do not include mold protrusion.
BPR 1999.05.18
Rev: 1.02 9/2002
23/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
Ordering Information—GSI NBT Synchronous SRAM
Org
Part Number1
Type
Package
Speed2
(MHz/ns)
TA3
512K x 18
GS880Z18AT-250
NBT Pipeline/Flow Through
TQFP
250/5.5
C
512K x 18
GS880Z18AT-225
NBT Pipeline/Flow Through
TQFP
225/6
C
512K x 18
GS880Z18AT-200
NBT Pipeline/Flow Through
TQFP
200/6.5
C
512K x 18
GS880Z18AT-166
NBT Pipeline/Flow Through
TQFP
166/7
C
512K x 18
GS880Z18AT-150
NBT Pipeline/Flow Through
TQFP
150/7.5
C
512K x 18
GS880Z18AT-133
NBT Pipeline/Flow Through
TQFP
133/8.5
C
256K x 36
GS880Z36AT-250
NBT Pipeline/Flow Through
TQFP
250/5.5
C
256K x 36
GS880Z36AT-225
NBT Pipeline/Flow Through
TQFP
225/6
C
256K x 36
GS880Z36AT-200
NBT Pipeline/Flow Through
TQFP
200/6.5
C
256K x 36
GS880Z36AT-166
NBT Pipeline/Flow Through
TQFP
166/7
C
256K x 36
GS880Z36AT-150
NBT Pipeline/Flow Through
TQFP
150/7.5
C
256K x 36
GS880Z36AT-133
NBT Pipeline/Flow Through
TQFP
133/8.5
C
512K x 18
GS880Z18AT-250I
NBT Pipeline/Flow Through
TQFP
250/5.5
I
Not Available
512K x 18
GS880Z18AT-225I
NBT Pipeline/Flow Through
TQFP
225/6
I
Not Available
512K x 18
GS880Z18AT-200I
NBT Pipeline/Flow Through
TQFP
200/6.5
I
Not Available
512K x 18
GS880Z18AT-166I
NBT Pipeline/Flow Through
TQFP
166/7
I
512K x 18
GS880Z18AT-150I
NBT Pipeline/Flow Through
TQFP
150/7.5
I
512K x 18
GS880Z18AT-133I
NBT Pipeline/Flow Through
TQFP
133/8.5
I
256K x 36
GS880Z36AT-250I
NBT Pipeline/Flow Through
TQFP
250/5.5
I
Not Available
256K x 36
GS880Z36AT-225I
NBT Pipeline/Flow Through
TQFP
225/6
I
Not Available
256K x 36
GS880Z36AT-200I
NBT Pipeline/Flow Through
TQFP
200/6.5
I
Not Available
256K x 36
GS880Z36AT-166I
NBT Pipeline/Flow Through
TQFP
166/7
I
256K x 36
GS880Z36AT-150I
NBT Pipeline/Flow Through
TQFP
150/7.5
I
256K x 36
GS880Z36AT-133I
NBT Pipeline/Flow Through
TQFP
133/8.5
I
Status
Notes:
1. Customers requiring delivery in Tape and Reel should add the character “T” to the end of the part number. Example: GS88Z36150IT.
2. The speed column indicates the cycle frequency (MHz) of the device in Pipeline mode and the latency (ns) in Flow Through mode. Each
device is Pipeline/Flow Through mode-selectable by the user.
3. TA = C = Commercial Temperature Range. TA = I = Industrial Temperature Range.
4. GSI offers other versions this type of device in many different configurations and with a variety of different features, only some of which are
covered in this data sheet. See the GSI Technology web site (www.gsitechnology.com) for a complete listing of current offerings
Rev: 1.02 9/2002
24/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.
GS880Z18/36AT-250/225/200/166/150/133
9Mb Sync SRAM Data Sheet Revision History
DS/DateRev. Code: Old;
New
Types of Changes
Format or Content
• Creation of new datasheet
880Z18A_r1
880Z18A_r1; 880Z18A_r1_01
Page;Revisions;Reason
Content
• Updated FT power numbers
• Updated AC Characteristics table
• Changed 8Mb references to 9Mb
• Updated ZZ recovery time diagram
• Updated AC Test Conditions table and removed Output Load
2 diagram
880Z18A_r1_01;
880Z18A_r1_02
Rev: 1.02 9/2002
Content
• Removed Preliminary banner
• Removed pin locations from pin description table
25/25
Specifications cited are subject to change without notice. For latest documentation see http://www.gsitechnology.com.
© 2001, Giga Semiconductor, Inc.