Toshiba GT20J101 Toshiba insulated gate bipolar transistor silicon n channel igbt Datasheet

GT20J101
TOSHIBA Insulated Gate Bipolar Transistor
Silicon N Channel IGBT
Preliminary
GT20J101
High Power Switching Applications
Unit: mm
•
The 3rd Generation
•
Enhancement-Mode
•
High Speed: tf = 0.30 µs (max)
•
Low Saturation Voltage: VCE (sat) = 2.7 V (max)
Maximum Ratings (Ta = 25°C)
Characteristic
Symbol
Rating
Unit
Collector-emitter voltage
VCES
600
V
Gate-emitter voltage
VGES
±20
V
DC
IC
20
1 ms
ICP
40
PC
130
W
Tj
150
°C
Tstg
−55~150
°C
Collector current
Collector power dissipation
(Tc = 25°C)
Junction temperature
Storage temperature range
A
JEDEC
―
JEITA
―
TOSHIBA
2-16C1C
Weight: 4.6 g
1
2002-01-18
GT20J101
Electrical Characteristics (Ta = 25°C)
Characteristic
Symbol
Test Condition
Min
Typ.
Max
Unit
Gate leakage current
IGES
VGE = ±20 V, VCE = 0


±500
nA
Collector cut-off current
ICES
VCE = 600 V, VGE = 0


1.0
mA
VGE (OFF)
IC = 2 mA, VCE = 5 V
5.0

8.0
V
VCE (sat)
IC = 20 A, VGE = 15 V

2.1
2.7
V
VCE = 20 V, VGE = 0, f = 1 MHz

1450

pF
Inductive Load

0.12

VCC = 300 V, IC = 20 A

0.40

VGG = ±15 V, RG = 56 Ω

0.15
0.30

0.50



0.96
Gate-emitter cut-off voltage
Collector-emitter saturation voltage
Input capacitance
Switching time
Cies
Rise time
tr
Turn-on time
ton
Fall time
tf
Turn-off time
toff
Thermal resistance
(Note1)

Rth (j-c)
µs
°C/W
Note1: Switching time measurement circuit and input/output waveforms
VGE
GT20J301
90%
10%
0
−VGE
IC
L
RG
IC
VCC
90%
90%
VCE
0
VCE
10%
10%
10%
td (on)
td (off)
10%
tr
tf
toff
ton
Note2: Switching loss measurement waveforms
VGE
90%
10%
0
IC
0
10%
VCE
Eoff
Eon
2
2002-01-18
GT20J101
IC – VCE
VCE – VGE
50
20
20
Common emitter
15
13
IC
Collector-emitter voltage VCE
(A)
40
Collector current
30
12
20
10
0
VGE = 10 V
0
1
2
3
4
Collector-emitter voltage VCE
Tc = −40°C
(V)
Common emitter
Tc = 25°C
16
12
8
10
4
4
(V)
8
(V)
Common emitter
16
12
8
10
20
40
IC = 5 A
4
0
4
Tc = 125°C
(V)
Tc = 25°C
Collector-emitter voltage VCE
(V)
VGE
20
20
Common emitter
Collector-emitter voltage VCE
16
VCE – VGE
VCE – VGE
8
12
Gate-emitter voltage
16
VGE
16
12
8
20
4
IC = 5 A
4
8
12
Gate-emitter voltage
(V)
IC – VGE
16
VGE
20
(V)
VCE (sat) – Tc
4
Common emitter
Common emitter
Collector-emitter saturation voltage
VCE (sat) (V)
VCE = 5 V
IC
(A)
40
30
20
25
10
Tc = 125°C
0
0
40
10
0
0
20
50
Collector current
12
Gate-emitter voltage
20
0
40
IC = 5 A
0
0
5
20
4
8
−40
12
Gate-emitter voltage
16
VGE
VGE = 15 V
3
30
2
(V)
20
10
IC = 5 A
1
0
−60
20
40
−20
20
60
Case temperature Tc
3
100
140
(°C)
2002-01-18
GT20J101
Switching time ton, tr – RG
Switching time ton, tr – IC
3
Common emitter
VCC = 300 V
VGG = ±15 V
IC = 20 A
: Tc = 25°C
: Tc = 125°C
Common emitter
VCC = 300 V
VGG = ±15 V
RG = 56 Ω
: Tc = 25°C
: Tc = 125°C
ton, tr
(µs)
ton
0.3
tr
Switching time
(µs)
0.5
Switching time
1
ton, tr
3
0.1
1
0.5
0.3
ton
0.1
0.05
0.03
tr
0.05
0.03
3
10
30
100
300
Gate resistance RG
0.01
1000
0
4
(Ω)
0.1
0.05
100
300
1
10
(mJ)
0.1
Common emitter
VCC = 300 V
VGG = ±15 V
RG = 56 Ω
: Tc = 25°C
: Tc = 125°C
0.05
0.03
4
10
100
8
Switching loss
Eon, Eoff – RG
Gate resistance RG
tf
12
Collector current
3
Eon
1
Eoff
0.3
0.1
toff
0.3
0.01
0
1000
Switching loss
1
(A)
0.5
(Ω)
Common emitter
VCC = 300 V
VGG = ±15 V
IC = 20 A
: Tc = 25°C
: Tc = 125°C
Note2
3
1
(mJ)
30
Switching loss
10
Eon, Eoff
Switching time
tf
Gate resistance RG
Switching loss
(µs)
toff, tf
toff
0.3
10
IC
Switching time toff, tf – IC
0.5
0.03
3
20
16
3
Common emitter
VCC = 300 V
VGG = ±15 V
IC = 20 A
: Tc = 25°C
: Tc = 125°C
Eon, Eoff
(µs)
toff, tf
Switching time
1
12
Collector current
Switching time toff, tf – RG
3
8
(Ω)
20
Eon, Eoff – IC
Common emitter
VCC = 300 V
VGG = ±15 V
RG = 56 Ω
: Tc = 25°C
: Tc = 125°C
Note2
Eon
Eoff
0.1
0.03
0
4
8
Collector current
4
16
(A)
0.3
0.01
1000
IC
12
IC
16
20
(A)
2002-01-18
GT20J101
VCE, VGE – QG
C – VCE
5000
500
3000
100
30
Coes
Common emitter
10
VGE = 0
f = 1 MHz
5
0.5
Cres
Tc = 25°C
1
3
10
30
100
300
Collector-emitter voltage VCE
1000
300
IC max (pulsed)*
4
100
20
(V)
60
QG
0
100
80
(nC)
Reverse bias SOA
50
50 µs*
30
IC max
10 (continuous)
IC
(A)
100 µs*
1 ms*
5
Collector current
(A)
IC
40
Gate charge
10 ms*
30
Collector current
8
100
50
DC
operation
3
200
VCE = 100 V
200
Safe operating area
100
12
300
0
0
3000
16
(V)
RL = 15 Ω
Tc = 25°C
VGE
400
Gate-emitter voltage
(V)
300
C
(pF)
Collector-emitter voltage VCE
Cies
1000
Capacitance
20
Common emitter
1
0.5 *: Single nonrepetitive
pulse Tc = 25°C
0.3 Curves must be derated
linearly with increase in
temperature.
0.1
1
3
10
30
10
5
3
1
0.5
Tj <
= 125°C
0.3
VGE = ±15 V
0.1
100
300
Collector-emitter voltage VCE
1000
3000
RG = 56 Ω
1
3
10
30
100
300
Collector-emitter voltage VCE
(V)
1000
3000
(V)
Rth (t) – tw
Transient thermal impedance
Rth (t) (°C/W)
10
10
10
10
10
10
10
2
1
0
−1
−2
−3
−4
10
Tc = 25°C
−5
10
−4
10
−3
10
−2
Pulse width
10
−1
tw
10
0
10
1
10
2
(s)
5
2002-01-18
GT20J101
RESTRICTIONS ON PRODUCT USE
000707EAA
• TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor
devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical
stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of
safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of
such TOSHIBA products could cause loss of human life, bodily injury or damage to property.
In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as
set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and
conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability
Handbook” etc..
• The TOSHIBA products listed in this document are intended for usage in general electronics applications
(computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances,
etc.). These TOSHIBA products are neither intended nor warranted for usage in equipment that requires
extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or
bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or
spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments,
medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in this
document shall be made at the customer’s own risk.
• The information contained herein is presented only as a guide for the applications of our products. No
responsibility is assumed by TOSHIBA CORPORATION for any infringements of intellectual property or other
rights of the third parties which may result from its use. No license is granted by implication or otherwise under
any intellectual property or other rights of TOSHIBA CORPORATION or others.
• The information contained herein is subject to change without notice.
6
2002-01-18
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