INTERSIL HI5628

HI5628
®
Data Sheet
September 2000
8-Bit, 125/60MSPS, Dual High Speed
CMOS D/A Converter
Features
• Throughput Rate . . . . . . . . . . . . . . . . . . . . . . . 125MSPS
The HI5628 is an 8-bit, dual 125MSPS D/A converter which
is implemented in an advanced CMOS process. Operating
from a single +5V to +3V supply, the converter provides
20.48mA of full scale output current and includes an input
data register. Low glitch energy and excellent frequency
domain performance are achieved using a segmented
architecture. The single DAC version is the HI5660 while
10-bit versions exist in the HI5760 and HI5728.
• Low Power . . . . . . . . . . . . . 330mW at 5V, 170mW at 3V
• Integral Linearity Error . . . . . . . . . . . . . . . . . . . ±0.25 LSB
• Differential Linearity . . . . . . . . . . . . . . . . . . . . . ±0.25 LSB
• Channel Isolation (Typ) . . . . . . . . . . . . . . . . . . . . . . 80dB
• SFDR to Nyquist at 10MHz Output . . . . . . . . . . . . 60dBc
• Internal 1.2V Bandgap Voltage Reference
Ordering Information
PACKAGE
PKG. NO.
MAX
CLOCK
SPEED
HI5628IN
-40 to 85 48 Ld LQFP
Q48.7x7A 125MHz
HI5628/6IN
-40 to 85 48 Ld LQFP
Q48.7x7A 60MHz
Evaluation Platform
Applications
• Direct Digital Frequency Synthesis
125MHz
• Wireless Communications
• Signal Reconstruction
• Arbitrary Waveform Generators
• Test Equipment
• High Resolution Imaging Systems
Pinout
1
QD5
DVDD
QD7 (MSB)
QD6
QCLK
DGND
ICLK
ID7 (MSB)
DVDD
DGND
REFIO
QD4
QD3
QD2
QD1
QD0 (LSB)
DGND
DGND
DVDD
DGND
NC
AVDD
AGND
QCOMP1
QOUTA
FSADJ
AGND
QOUTB
AGND
IOUTB
SLEEP
DVDD
DGND
NC
AVDD
48 47 46 45 44 43 42 41 40 39 38 37
36
35
2
34
3
33
4
32
5
31
6
30
7
29
8
28
9
27
10
26
11
25
12
13 14 15 16 17 18 19 20 21 22 23 24
1
IOUTA
ID4
ID3
ID2
ID1
ID0 (LSB)
DGND
DGND
ID6
HI5628 (LQFP)
TOP VIEW
ID5
25
• Excellent Spurious Free Dynamic Range
AGND
HI5628EVAL1
• CMOS Compatible Inputs
REFLO
TEMP.
RANGE
(oC)
• Single Power Supply from +5V to +3V
ICOMP1
PART
NUMBER
FN4520.5
CAUTION: These devices are sensitive to electrostatic discharge; follow proper IC Handling Procedures.
1-888-INTERSIL or 321-724-7143 | Intersil (and design) is a registered trademark of Intersil Americas Inc.
Copyright © Intersil Americas Inc. 2004. All Rights Reserved
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HI5628
Typical Applications Circuit
ICLK/QCLK
ANALOG GROUND
PLANE
50Ω
DVDD
0.1µF
0.1µF
ID5
ID6
ID7 (MSB)
QD7 (MSB)
QD6
QD5
DVDD
DIGITAL GROUND
PLANE
48 47 46 45 44 43 42 41 40 39 38 37
36
1
35
2
34
3
33
4
32
5
DGND 31
6 DGND
DGND 30
7 DGND
DVDD 29
8
DGND 28
9 DVDD
27
NC (GND)
10 DGND
AVDD 26
11 NC (GROUND)
25
12
13 14 15 16 17 18 19 20 21 22 23 24
ID4
ID3
ID2
ID1
ID0 (LSB)
SLEEP
DVDD
PLANE
AGND
DVDD
QD4
QD3
QD2
QD1
QD0 (LSB)
0.1µF
0.1µF
AVDD
0.1µF
AGND
AVDD
0.1µF
AGND
QCOMP1
REFIO
ICOMP1
RSET
1.91kΩ
AVDD
0.1µF
50Ω 50Ω
AVDD
0.1µF
0.1µF
50Ω 50Ω
NOTE: ICOMP1 AND QCOMP1 PINS (24, 14)
MUST BE TIED TOGETHER EXTERNALLY
IOUTA
FERRITE
BEAD
+5V TO +3V
POWER SUPPLY
QOUTB
DVDD
10µH
10µF
IOUTB
0.1µF
(POWER PLANE)
QOUTA
AVDD
(POWER PLANE)
FERRITE
BEAD
10µH
0.1µF
+5V TO +3V (SUPPLY)
+
10µF
NOTE: Recommended separate analog and digital ground planes, connected at a single point near the device. See AN9827.
2
HI5628
Functional Block Diagram
IOUTA
IOUTB
(LSB) ID0
CASCODE
CURRENT
SOURCE
ID1
34
34
ID2
ID3
LATCH
LATCH
ID4
UPPER
5-BIT
ID5
3 LSBs
+
31 MSB
SEGMENTS
SWITCH
MATRIX
31
DECODER
ID6
(MSB) ID7
ICLK
ICOMP1
INT/EXT
VOLTAGE
REFERENCE
INT/EXT
REFERENCE
SELECT
BIAS
GENERATION
REFLO
REFIO
FSADJ
SLEEP
QCOMP1
(LSB) QD0
QD1
34
34
QD2
QD3
LATCH
LATCH
QD4
UPPER
5-BIT
QD5
SWITCH
MATRIX
31
DECODER
QD6
(MSB) QD7
QCLK
AVDD
AGND
DVDD
3
DGND
QOUTA QOUTB
CASCODE
CURRENT
SOURCE
3 LSBs
+
31 MSB
SEGMENTS
HI5628
Absolute Maximum Ratings
Thermal Information
Digital Supply Voltage DVDD to DCOM . . . . . . . . . . . . . . . . . . +5.5V
Analog Supply Voltage AVDD to ACOM . . . . . . . . . . . . . . . . . . +5.5V
Grounds, ACOM TO DCOM . . . . . . . . . . . . . . . . . . . -0.3V to +0.3V
Digital Input Voltages (D7-D0, CLK, SLEEP). . . . . . . . DVDD + 0.3V
Internal Reference Output Current. . . . . . . . . . . . . . . . . . . . . ±50µA
Reference Input Voltage Range . . . . . . . . . . . . . . . . . . AVDD + 0.3V
Analog Output Current (IOUT) . . . . . . . . . . . . . . . . . . . . . . . . . 24mA
Thermal Resistance (Typical, Note 1)
θJA(oC/W)
LQFP Package . . . . . . . . . . . . . . . . . . . . . . . . . . . . .
75
Maximum Junction Temperature . . . . . . . . . . . . . . . . . . . . . . .150oC
Maximum Storage Temperature Range . . . . . . . . . . -65oC to 150oC
Maximum Lead Temperature (Soldering 10s) . . . . . . . . . . . . .300oC
Operating Conditions
Temperature Range . . . . . . . . . . . . . . . . . . . . . . . . . . -40oC to 85oC
CAUTION: Stresses above those listed in “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress only rating and operation of the
device at these or any other conditions above those indicated in the operational sections of this specification is not implied.
NOTE:
1. θJA is measured with the component mounted on an evaluation PC board in free air.
AVDD = +5V, DVDD = +5V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25oC for All Typical Values. Data given
is per channel except for ‘Power Supply Characteristics.’
Electrical Specifications
HI5628IN
TA = -40oC TO 85oC
PARAMETER
TEST CONDITIONS
MIN
TYP
MAX
UNITS
8
-
-
Bits
SYSTEM PERFORMANCE (Per Channel)
Resolution
Integral Linearity Error, INL
“Best Fit” Straight Line (Note 7)
-0.5
±0.25
+0.5
LSB
Differential Linearity Error, DNL
(Note 7)
-0.5
±0.25
+0.5
LSB
Offset Error, IOS
(Note 7)
-0.025
-
+0.025
% FSR
Offset Drift Coefficient
(Note 7)
-
0.1
-
ppm
FSR/oC
Full Scale Gain Error, FSE
With External Reference (Notes 2, 7)
-10
±2
+10
% FSR
With Internal Reference (Notes 2, 7)
Full Scale Gain Drifta
-10
±1
+10
% FSR
With External Reference (Note 7)
-
±50
-
ppm
FSR/oC
With Internal Reference (Note 7)
-
±100
-
ppm
FSR/oC
-0.5
0.1
0.5
dB
Gain Matching Between Channels
I/Q Channel Isolation
FOUT = 10MHz
Output Voltage Compliance Range
(Note 3)
Full Scale Output Current, IFS
-
80
-
dB
-0.3
-
1.25
V
2
-
20
mA
125
-
-
MHz
DYNAMIC CHARACTERISTICS (Per Channel)
Clock Rate, fCLK
(Note 3, 9)
Output Settling Time, (tSETT)
0.8% (±1 LSB, equivalent to 7 Bits) (Note 7)
-
5
-
ns
0.4% (±1/2 LSB, equivalent to 8 Bits) (Note 7)
-
15
-
ns
Singlet Glitch Area (Peak Glitch)
RL = 25Ω (Note 7)
-
5
-
pV•s
Output Rise Time
Full Scale Step
-
1.5
-
ns
Output Fall Time
Full Scale Step
-
1.5
-
ns
Output Capacitance
Output Noise
4
-
10
-
pF
IOUTFS = 20mA
-
50
-
pA/ √Hz
IOUTFS = 2mA
-
30
-
pA/ √Hz
HI5628
AVDD = +5V, DVDD = +5V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25oC for All Typical Values. Data given
is per channel except for ‘Power Supply Characteristics.’ (Continued)
Electrical Specifications
HI5628IN
TA = -40oC TO 85oC
MIN
TYP
MAX
UNITS
fCLK = 125MSPS, fOUT = 32.9MHz, 10MHz Span (Notes 4, 7)
-
70
-
dBc
fCLK = 100MSPS, fOUT = 5.04MHz, 4MHz Span (Notes 4, 7)
PARAMETER
TEST CONDITIONS
AC CHARACTERISTICS - HI5628IN - 125MHz (Per Channel)
Spurious Free Dynamic Range,
SFDR Within a Window
-
73
-
dBc
Total Harmonic Distortion (THD) to Nyquist fCLK = 100MSPS, fOUT = 2.00MHz (Notes 4, 7)
-
67
-
dBc
Spurious Free Dynamic Range,
SFDR to Nyquist
fCLK = 125MSPS, fOUT = 32.9MHz, 62.5MHz Span (Notes 4, 7)
-
51
-
dBc
fCLK = 125MSPS, fOUT = 10.1MHz, 62.5MHz Span (Notes 4, 7)
-
61
-
dBc
fCLK = 100MSPS, fOUT = 40.4MHz, 50MHz Span (Notes 4, 7)
-
48
-
dBc
fCLK = 100MSPS, fOUT = 20.2MHz, 50MHz Span (Notes 4, 7)
-
56
-
dBc
fCLK = 100MSPS, fOUT = 5.04MHz, 50MHz Span (Notes 4, 7)
-
68
-
dBc
fCLK = 100MSPS, fOUT = 2.51MHz, 50MHz Span (Notes 4, 7)
-
68
-
dBc
fCLK = 60MSPS, fOUT = 10.1MHz, 10MHz Span (Notes 4, 7)
-
70
-
dBc
fCLK = 50MSPS, fOUT = 5.02MHz, 2MHz Span (Notes 4, 7)
-
73
-
dBc
fCLK = 50MSPS, fOUT = 1.00MHz, 2MHz Span (Notes 4, 7)
AC CHARACTERISTICS - HI5628/6IN - 60MHz (Per Channel)
Spurious Free Dynamic Range,
SFDR Within a Window
-
74
-
dBc
Total Harmonic Distortion (THD) to Nyquist fCLK = 50MSPS, fOUT = 2.00MHz (Notes 4, 7)
-
67
-
dBc
fCLK = 50MSPS, fOUT = 1.00MHz (Notes 4, 7)
-
68
-
dBc
fCLK = 60MSPS, fOUT = 20.2MHz, 30MHz Span (Notes 4, 7)
-
54
-
dBc
fCLK = 60MSPS, fOUT = 10.1MHz, 30MHz Span (Notes 4, 7)
-
60
-
dBc
fCLK = 50MSPS, fOUT = 20.2MHz, 25MHz Span (Notes 4, 7)
-
53
-
dBc
fCLK = 50MSPS, fOUT = 5.02MHz, 25MHz Span (Notes 4, 7)
-
67
-
dBc
fCLK = 50MSPS, fOUT = 2.51MHz, 25MHz Span (Notes 4, 7)
-
68
-
dBc
fCLK = 50MSPS, fOUT = 1.00MHz, 25MHz Span (Notes 4, 7)
-
68
-
dBc
fCLK = 25MSPS, fOUT = 5.02MHz, 25MHz Span (Notes 4, 7)
-
71
-
dBc
1.04
1.16
1.28
V
Internal Reference Voltage Drift
-
±60
-
ppm/oC
Internal Reference Output Current
Sink/Source Capability
-
0.1
-
µA
-
1
-
MΩ
-
1.4
-
MHz
Spurious Free Dynamic Range,
SFDR to Nyquist
VOLTAGE REFERENCE
Internal Reference Voltage, VFSADJ
Voltage at Pin 22 with Internal Reference
Reference Input Impedance
Reference Input Multiplying Bandwidth
DIGITAL INPUTS
(Note 7)
D7-D0, CLK (Per Channel)
Input Logic High Voltage with
5V Supply, VIH
(Note 3)
3.5
5
-
V
Input Logic High Voltage with
3V Supply, VIH
(Note 3)
2.1
3
-
V
Input Logic Low Voltage with
5V Supply, VIL
(Note 3)
-
0
1.3
V
Input Logic Low Voltage with
3V Supply, VIL
(Note 3)
-
0
0.9
V
Input Logic Current, IIH
-10
-
+10
µA
Input Logic Current, IIL
-10
-
+10
µA
-
5
-
pF
Digital Input Capacitance, CIN
TIMING CHARACTERISTICS (Per Channel)
5
HI5628
AVDD = +5V, DVDD = +5V, VREF = Internal 1.2V, IOUTFS = 20mA, TA = 25oC for All Typical Values. Data given
is per channel except for ‘Power Supply Characteristics.’ (Continued)
Electrical Specifications
HI5628IN
TA = -40oC TO 85oC
MIN
TYP
MAX
UNITS
Data Setup Time, tSU
See Figure 3 (Note 3)
3
-
-
ns
Data Hold Time, tHLD
See Figure 3 (Note 3)
3
-
-
ns
Propagation Delay Time, tPD
See Figure 3
-
1
-
ns
CLK Pulse Width, tPW1 , tPW2
See Figure 3 (Note 3)
4
-
-
ns
PARAMETER
TEST CONDITIONS
POWER SUPPLY CHARACTERISTICS
AVDD Power Supply
(Note 8, 9)
2.7
5.0
5.5
V
DVDD Power Supply
(Note 8, 9)
2.7
5.0
5.5
V
Analog Supply Current (IAVDD)
5V or 3V, IOUTFS = 20mA
-
46
60
mA
5V or 3V, IOUTFS = 2mA
-
8
-
mA
5V, IOUTFS = Don’t Care (Note 5)
-
6
10
mA
Digital Supply Current (IDVDD)
3V, IOUTFS = Don’t Care (Note 5)
-
3
-
mA
Supply Current (IAVDD) Sleep Mode
5V or 3V, IOUTFS = Don’t Care)
-
3.2
6
mA
Power Dissipation (Both Channels)
5V, IOUTFS = 20mA (Note 6)
-
330
-
mW
5V, IOUTFS = 2mA (Notes 6)
-
140
-
mW
3V, IOUTFS = 20mA (Note 6)
-
170
-
mW
3V, IOUTFS = 2mA (Note 6)
-
54
-
mW
5V, IOUTFS = 20mA (Note 10)
-
300
-
mW
3.3V, IOUTFS = 20mA (Note 10)
-
150
-
mW
-
135
-
mW
-0.2
-
+0.2
%
FSR/V
3V, IOUTFS = 20mA (Note 10)
Power Supply Rejection
Single Supply (Note 7)
NOTES:
2. Gain Error measured as the error in the ratio between the full scale output current and the current through RSET (typically 625µA). Ideally the
ratio should be 32.
3. Parameter guaranteed by design or characterization and not production tested.
4. Spectral measurements made with differential transformer coupled output and no filtering.
5. Measured with the clock at 50MSPS and the output frequency at 1MHz, both channels.
6. Measured with the clock at 100MSPS and the output frequency at 40MHz, both channels.
7. See ‘Definition of Specifications’.
8. For operation below 3V, it is recommended that the output current be reduced to 12mA or less to maintain optimum performance. DVDD and
AVDD do not have to be equal.
9. For operation above 125MHz, it is recommended that the power supply be 3.3V or greater. The part is functional with the clock above 125MSPS
and the power supply below 3.3V, but performance is degraded.
10. Measured with the clock at 60MSPS and the output frequency at 10MHz, both channels.
6
HI5628
Timing Diagrams
50%
CLK
D7-D0
1/ LSB ERROR BAND
2
GLITCH AREA = 1/2 (H x W)
V
HEIGHT (H)
IOUT
tSETT
t(ps)
WIDTH (W)
tPD
FIGURE 1. OUTPUT SETTLING TIME DIAGRAM
tPW1
FIGURE 2. PEAK GLITCH AREA (SINGLET) MEASUREMENT
METHOD
tPW2
50%
CLK
tSU
tSU
tHLD
tSU
tHLD
tHLD
D7-D0
tPD
tSETT
IOUT
tPD
tSETT
tPD
tSETT
FIGURE 3. PROPAGATION DELAY, SETUP TIME, HOLD TIME AND MINIMUM PULSE WIDTH DIAGRAM
7
HI5628
Definition of Specifications
Integral Linearity Error, INL, is the measure of the worst
case point that deviates from a best fit straight line of data
values along the transfer curve.
Differential Linearity Error, DNL, is the measure of the
step size output deviation from code to code. Ideally the step
size should be 1 LSB. A DNL specification of 1 LSB or less
guarantees monotonicity.
Output Settling Time, is the time required for the output
voltage to settle to within a specified error band measured
from the beginning of the output transition. The
measurement was done by switching from code 0 to 64, or
quarter scale. Termination impedance was 25Ω due to the
parallel resistance of the output 50Ω and the oscilloscope’s
50Ω input. This also aids the ability to resolve the specified
error band without overdriving the oscilloscope.
Singlet Glitch Area, is the switching transient appearing on
the output during a code transition. It is measured as the
area under the overshoot portion of the curve and is
expressed as a Volt-Time specification.
Full Scale Gain Error , is the error from an ideal ratio of 32
between the output current and the full scale adjust current
(through RSET).
Full Scale Gain Drift, is measured by setting the data inputs
to all ones and measuring the output voltage through a
known resistance as the temperature is varied from TMIN to
TMAX . It is defined as the maximum deviation from the value
measured at room temperature to the value measured at
either TMIN or TMAX . The units are ppm of FSR (Full Scale
Range) per degree C.
Total Harmonic Distortion, THD, is the ratio of the DAC output
fundamental to the RMS sum of the first five harmonics.
Spurious Free Dynamic Range, SFDR, is the amplitude
difference from the fundamental to the largest harmonically
or non-harmonically related spur within the specified
window.
Output Voltage Compliance Range, is the voltage limit
imposed on the output. The output impedance load should
be chosen such that the voltage developed does not violate
the compliance range.
Offset Error, is measured by setting the data inputs to all
zeros and measuring the output voltage through a known
resistance. Offset error is defined as the maximum deviation
of the output current from a value of 0mA.
Offset Drift, is measured by setting the data inputs to all
zeros and measuring the output voltage through a known
resistance as the temperature is varied from TMIN to TMAX .
It is defined as the maximum deviation from the value
measured at room temperature to the value measured at
8
either TMIN or TMAX . The units are ppm of FSR (Full Scale
Range) per degree C.
Power Supply Rejection, is measured using a single power
supply. Its nominal +5V is varied ±10% and the change in the
DAC full scale output is noted.
Reference Input Multiplying Bandwidth, is defined as the
3dB bandwidth of the voltage reference input. It is measured
by using a sinusoidal waveform as the external reference
with the digital inputs set to all 1s. The frequency is
increased until the amplitude of the output waveform is
0.707 of its original value.
Internal Reference Voltage Drift, is defined as the
maximum deviation from the value measured at room
temperature to the value measured at either TMIN or TMAX .
The units are ppm per degree C.
Detailed Description
The HI5628 is a dual, 8-bit, current out, CMOS, digital to
analog converter. Its maximum update rate is 125MSPS and
can be powered by either single or dual power supplies in
the recommended range of +3V to +5V. It consumes less
than 330mW of power when using a +5V supply with the
data switching at 100MSPS. The architecture is based on a
segmented current source arrangement that reduces glitch
by reducing the amount of current switching at any one time.
The five MSBs are represented by 31 major current sources
of equivalent current. The three LSBs are comprised of
binary weighted current sources. Consider an input pattern
to the converter which ramps through all the codes from 0 to
255. The three LSB current sources would begin to count up.
When they reached the all high state (decimal value of 7)
and needed to count to the next code, they would all turn off
and the first major current source would turn on. To continue
counting upward, the 3 LSBs would count up another 7
codes, and then the next major current source would turn on
and the three LSBs would all turn off. The process of the
single, equivalent, major current source turning on and the
three LSBs turning off each time the converter reaches
another 7 codes greatly reduces the glitch at any one
switching point. In previous architectures that contained all
binary weighted current sources or a binary weighted
resistor ladder, the converter might have a substantially
larger amount of current turning on and off at certain, worstcase transition points such as midscale and quarter scale
transitions. By greatly reducing the amount of current
switching at certain ‘major’ transitions, the overall glitch of
the converter is dramatically reduced, improving settling
times and transient problems.
HI5628
Digital Inputs and Termination
The HI5628 digital inputs are guaranteed to CMOS levels.
However, TTL compatibility can be achieved by lowering the
supply voltage to 3V due to the digital threshold of the input
buffer being approximately half of the supply voltage. The
internal register is updated on the rising edge of the clock. To
minimize reflections, proper termination should be
implemented. If the lines driving the clock and the digital
inputs are 50Ω lines, then 50Ω termination resistors should be
placed as close to the converter inputs as possible, connected
to the digital ground plane (if separate grounds are used).
Ground Plane(s)
If separate digital and analog ground planes are used, then all
of the digital functions of the device and their corresponding
components should be over the digital ground plane and
terminated to the digital ground plane. The same is true for the
analog components and the analog ground plane. The
converter will function properly with a single ground plane, as
the Evaluation Board is configured in this matter.
Noise Reduction
To minimize power supply noise, 0.1µF capacitors should be
placed as close as possible to the converter’s power supply
pins, AVDD and DVDD . Also, should the layout be designed
using separate digital and analog ground planes, these
capacitors should be terminated to the digital ground for
DVDD and to the analog ground for AVDD . Additional filtering
of the power supplies on the board is recommended.
Voltage Reference
The internal voltage reference of the device has a nominal
value of +1.2V with a ± 60 ppm / oC drift coefficient over the full
temperature range of the converter. It is recommended that a
0.1µF capacitor be placed as close as possible to the REFIO
pin, connected to the analog ground. The REFLO pin (15)
selects the reference. The internal reference can be selected if
pin 15 is tied low (ground). If an external reference is desired,
then pin 15 should be tied high (to the analog supply voltage)
and the external reference driven into REFIO, pin 23. The full
scale output current of the converter is a function of the voltage
reference used and the value of RSET. IOUT should be within
the 2mA to 20mA range, through operation below 2mA is
possible, with performance degradation.
If the internal reference is used, VFSADJ will equal
approximately 1.16V (pin 22). If an external reference is used,
VFSADJ will equal the external reference. The calculation for
IOUT (Full Scale) is:
IOUT (Full Scale) = (VFSADJ/RSET) x 32.
If the full scale output current is set to 20mA by using the
internal voltage reference (1.16V) and a 1.86kΩ RSET
resistor, then the input coding to output current will resemble
the following:
9
TABLE 1. INPUT CODING vs OUTPUT CURRENT
INPUT CODE (D7-D0)
IOUTA (mA)
IOUTB (mA)
1111 1111
20
0
1000 0000
10
10
0000 0000
0
20
Outputs
IOUTA and IOUTB (or QOUTA and QOUTB) are
complementary current outputs. The sum of the two currents
is always equal to the full scale output current minus one
LSB. If single ended use is desired, a load resistor can be
used to convert the output current to a voltage. It is
recommended that the unused output be either grounded or
equally terminated. The voltage developed at the output
must not violate the output voltage compliance range of
-0.3V to 1.25V. RLOAD should be chosen so that the desired
output voltage is produced in conjunction with the output full
scale current, which is described above in the ‘Reference’
section. If a known line impedance is to be driven, then the
output load resistor should be chosen to match this
impedance. The output voltage equation is:
VOUT = IOUT X RLOAD .
These outputs can be used in a differential-to-single-ended
arrangement to achieve better harmonic rejection. The
SFDR measurements in this data sheet were performed with
a 1:1 transformer on the output of the DAC (see Figure 1).
With the center tap grounded, the output swing of pins 16
and 17 will be biased at zero volts. It is important to note
here that the negative voltage output compliance range limit
is -300mV, imposing a maximum of 600mVP-P amplitude
with this configuration. The loading as shown in Figure 1 will
result in a 500mV signal at the output of the transformer if
the full scale output current of the DAC is set to 20mA.
50Ω
PIN 17 (20)
100Ω
PIN 16 (21)
VOUT = (2 x IOUT x REQ)V
IOUTB (QOUTB)
50Ω
IOUTA (QOUTA)
50Ω
FIGURE 4.
VOUT = 2 x IOUT x REQ ,where REQ is ~12.5Ω.
Allowing the center tap to float will result in identical
transformer output, however the output pins of the DAC will
have positive DC offset. The 50Ω load on the output of the
transformer represents the spectrum analyzer’s input
impedance.
HI5628
Pin Descriptions
PIN NO.
39-32
PIN NAME
PIN DESCRIPTION
QD7 (MSB) Through Digital Data Bit 7, the Most Significant Bit through Digital Data Bit 0, the Least Significant Bit, of the Q
QD0 (LSB)
channel.
1-5, 48-46
ID7 (MSB) Through
ID0 (LSB)
Digital Data Bit 7, the Most Significant Bit through Digital Data Bit 0, the Least Significant Bit, of the I
channel.
8
SLEEP
Control Pin for Power-Down Mode. Sleep Mode is active high; connect to ground for Normal Mode. Sleep
pin has internal 20µA active pulldown current.
15
REFLO
Connect to analog ground to enable internal 1.2V reference or connect to AVDD to disable.
23
REFIO
Reference voltage input if internal reference is disabled and reference voltage output if internal reference is
enabled. Use 0.1µF cap to ground when internal reference is enabled.
22
FSADJ
Full Scale Current Adjust. Use a resistor to ground to adjust full scale output current. Full Scale Output
Current Per Channel = 32 x IFSADJ .
14, 24
ICOMP1, QCOMP1
Reduces noise. Connect each to AVDD with 0.1µF capacitor. The ICOMP1 and QCOMP1 pins MUST be
tied together externally.
13, 18, 19, 25
AGND
Analog Ground Connections.
17
IOUTB
The complementary current output of the I channel. Bits set to all 0s gives full scale current.
16
IOUTA
Current output of the I channel. Bits set to all 1s gives full scale current.
20
QOUTB
The complementary current output of the Q channel. Bits set to all 0s gives full scale current.
21
QOUTA
Current output of the Q channel. Bits set to all 1s gives full scale current.
11, 27
NC
12, 26
AVDD
Analog Supply (+2.7V to +5.5V).
6, 7, 10, 28, 30,
31, 41, 44
DGND
Digital Ground.
9, 29, 40, 45
DVDD
Supply voltage for digital circuitry (+2.7V to +5.5V).
43
ICLK
Clock input for I channel. Positive edge of clock latches data.
42
QCLK
Clock input for Q channel. Positive edge of clock latches data.
No Connect. Recommended: Connect to ground.
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