HN1D03FU TOSHIBA Diode Silicon Epitaxial Planar Type HN1D03FU Unit: mm Ultra High Speed Switching Application z Built in anode common and cathode common. Unit 1 z Low forward voltage Q1, Q2: VF (3) = 0.90V (typ.) z Fast reverse recovery time Q1, Q2: trr = 1.6ns (typ.) z Small total capacitance Q1, Q2: CT = 0.9pF (typ.) Unit 2 z Low forward voltage Q3, Q4: VF (3) = 0.92V (typ.) z Fast reverse recovery time Q3, Q4: trr = 1.6ns (typ.) z Small total capacitance Q3, Q4: CT = 2.2pF (typ.) Unit 1, Unit 2 Common Absolute Maximum Ratings (Ta = 25°C) Characteristic Symbol Rating Unit VRM 85 V Reverse voltage VR 80 V Maximum (peak) forward current IFM 300* mA Maximum (peak) reverse voltage Average forward current IO 80* mA IFSM 2* A Power dissipation P 200 mW Junction temperature Tj 125 °C Storage temperature Tstg −55~125 °C Surge current (10ms) JEDEC EIAJ TOSHIBA Weight: 6.2mg ― ― 1-2T1D Note: Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). *: This is the Absolute Maximum Ratings of single diode (Q1 or Q2 or Q3 or Q4). In the case of using Unit 1 and Unit 2 independently or simultaneously, the Absolute Maximum Ratings per diode is 75% of the single diode one. Marking Pin Assignment (Top View) 1 2007-11-01 HN1D03FU Fig.1 Reverse Recovery Time (trr) Test Circuit Unit 1 Electrical Characteristics (Q1, Q2, Common) (Ta = 25°C) Characteristic Symbol Test Circuit VF (1) ― VF (2) Min Typ. Max IF = 1mA ― 0.60 ― ― IF = 10mA ― 0.72 ― VF (3) ― IF = 100mA ― 0.90 1.20 IR (1) ― VR = 30V ― ― 0.10 IR (2) ― VR = 80V ― ― 0.50 Total capacitance CT ― VR = 0, f = 1MHz ― 0.9 3.0 pF Reverse recovery time trr ― IF =10mA (fig.1) ― 1.6 4.0 ns Min Typ. Max Unit Forward voltage Reverse current Test Condition Unit V μA Unit 2 Electrical Characteristics (Q3, Q4, Common) (Ta = 25°C) Symbol Test Circuit VF (1) ― IF = 1mA ― 0.61 ― VF (2) ― IF = 10mA ― 0.74 ― VF (3) ― IF = 100mA ― 0.92 1.20 IR (1) ― VR = 30V ― ― 0.10 IR (2) ― VR = 80V ― ― 0.50 Total capacitance CT ― VR = 0, f = 1MHz ― 2.20 4.0 pF Reverse recovery time trr ― IF =10mA (fig.1) ― 1.60 4.0 ns Characteristic Forward voltage Reverse current Test Condition 2 V μA 2007-11-01 HN1D03FU 3 2007-11-01 HN1D03FU 4 2007-11-01 HN1D03FU RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 5 2007-11-01