IDT54/74FCT3827A/B 3.3V CMOS 10-BIT BUFFERS Integrated Device Technology, Inc. FEATURES: DESCRIPTION: • 0.5 MICRON CMOS Technology • ESD > 2000V per MIL-STD-883, Method 3015; > 200V using machine model (C = 200pF, R = 0) • 25 mil Center SSOP Packages • Extended commercial range of -40°C to +85°C • VCC = 3.3V ±0.3V, Normal Range or VCC = 2.7V to 3.6V, Extended Range • CMOS power levels (0.4µW typ. static) • Rail-to-Rail output swing for increased noise margin • Military product compliant to MIL-STD-883, Class B The FCT3827A/B 10-bit bus drivers are built using an advanced dual metal CMOS technology. These high speed, low power buffers are ideal for high-performance bus interface buffering for wide data/address paths or buses carrying parity. The 10-bit buffers have NAND-ed output enables for maximum control flexibility. All of the FCT3827 high performance interface components are designed for high-capacitance load drive capability, while providing low-capacitance bus loading at both inputs and outputs. FUNCTIONAL BLOCK DIAGRAM Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Y8 Y9 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 OE1 OE2 3092 drw 01 The IDT logo is a registered trademark of Integrated Device Technology, Inc. MILITARY AND COMMERCIAL TEMPERATURE RANGES 1995 Integrated Device Technology, Inc. 8.15 AUGUST 1995 DSC-4651/- 1 IDT54/74FCT3827A/B 3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES PIN CONFIGURATIONS OE1 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 GND 1 2 3 4 P24-1 5 D24-1 6 SO24-2 7 SO24-7 & 8 9 SO24-8 10 11 12 PIN DESCRIPTION 24 23 22 21 20 19 18 17 16 15 14 13 VCC Y0 Y1 Y2 Y3 Y4 Y5 Y6 Y7 Y8 Y9 OE2 DI I Description When both are LOW the outputs are enabled. When either one or both are HIGH the outputs are High Z. 10-bit data input. YI O 10-bit data output. Inputs Output OE1 OE2 DI YI Function L L H X L L X H L H X X L H Z Z Transparent Three-State 3092 tbl 02 NOTE: 1. H = HIGH Voltage Level X = Don’t Care L = LOW Voltage Level Z = High Impedance ABSOLUTE MAXIMUM RATINGS(1) Symbol Rating Commercial Military VTERM(2) Terminal Voltage –0.5 to +4.6 –0.5 to +4.6 with Respect to GND (3) VTERM Terminal Voltage –0.5 to +7.0 –0.5 to +7.0 with Respect to GND (4) –0.5 to VTERM Terminal Voltage –0.5 to with Respect to VCC + 0.5 VCC + 0.5 GND TA Operating –40 to +85 –55 to +125 Temperature TBIAS Temperature –55 to +125 –65 to +135 Under Bias TSTG Storage –55 to +125 –65 to +150 Temperature PT Power Dissipation 1.0 1.0 Unit V I OUT mA –60 to +60 I FUNCTION TABLE(1) 3092 drw 02 –60 to +60 I/O OEI 3092 tbl 01 DIP/SOIC/SSOP/QSOP TOP VIEW DC Output Current Names V V °C °C °C CAPACITANCE (TA = +25°C, f = 1.0MHz) Symbol Parameter(1) CIN Input Capacitance COUT Output Capacitance W 3092 lnk 03 NOTES: 1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the device. This is a stress rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum rating conditions for extended periods may affect reliability. 2. Vcc terminals. 3. Input terminals. 4. Output and I/O terminals. Conditions VIN = 0V Typ. 3.5 VOUT = 0V 4.0 Max. Unit 6.0 pF 8.0 pF 3092 lnk 04 NOTE: 1. This parameter is measured at characterization but not tested. 8.15 2 IDT54/74FCT3827A/B 3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE Following Conditions Apply Unless Otherwise Specified: Commercial: TA = –40°C to +85°C, VCC = 2.7V to 3.6V; Military: TA = –55°C to +125°C, VCC = 2.7V to 3.6V Symbol VIH Parameter Input HIGH Level (Input pins) Test Conditions(1) Guaranteed Logic HIGH Level Min. 2.0 Typ.(2) — Max. 5.5 Guaranteed Logic LOW Level 2.0 — VCC+0.5 –0.5 — 0.8 V VI = 5.5V — — ±1 µA VI = VCC — — ±1 VI = GND — — ±1 VI = GND — — ±1 VO = V CC — — ±1 VO = GND — — ±1 Input HIGH Level (I/O pins) VIL Input LOW Level Unit V (Input and I/O pins) II H Input HIGH Current (Input pins)(6) VCC = Max. Input HIGH Current (I/O pins)(6) II L Input LOW Current (Input pins)(6) Input LOW Current (I/O pins)(6) I OZH High Impedance Output Current VCC = Max. pins) (6) µA I OZL (3-State Output VIK Clamp Diode Voltage VCC = Min., IIN = –18mA — –0.7 –1.2 V I ODH Output HIGH Current VCC = 3.3V, V IN = V IH or VIL, VO = 1.5V(3) –36 –60 –110 mA I ODL Output LOW Current VCC = 3.3V, V IN = V IH or VIL, VO = 1.5V(3) 50 90 200 mA VOH Output HIGH Voltage VCC– 0.2 — — V 2.4 3.0 — 2.4 (5) 3.0 — — — 0.2 VOL Output LOW Voltage I OS Short Circuit Current(4) VH Input Hysteresis I CCL I CCH I CCZ Quiescent Power Supply Current VCC = Min. I OH = –0.1mA VIN = VIH or V IL I OH = –3mA VCC = 3.0V VIN = VIH or V IL VCC = Min. I OH = –6mA MIL. I OH = –8mA COM'L. I OL = 0.1mA VIN = VIH or V IL I OL = 16mA — 0.2 0.4 I OL = 24mA — 0.3 0.55 VCC = 3.0V I OL = 24mA VIN = VIH or V IL VCC = Max., VO = GND(3) — 0.3 0.50 –60 –135 –240 mA — 150 — mV COM'L. — 0.1 10 µA MIL. — 0.1 100 — VCC = Max., VIN = GND or VCC NOTES: 1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at Vcc = 3.3V, +25°C ambient. 3. Not more than one output should be tested at one time. Duration of the test should not exceed one second. 4. This parameter is guaranteed but not tested. 5. VOH = VCC –0.6V at rated current. 6. The test limits for this parameter is ± 5µA at TA = –55°C. 8.15 V 3092 lnk 05 3 IDT54/74FCT3827A/B 3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES POWER SUPPLY CHARACTERISTICS Test Conditions(1) VIN = VCC –0.6V(3) Symbol ∆ICC Parameter Quiescent Power Supply Current ICCD Dynamic Power Supply Current (4) VCC = Max. Outputs Open OE1 = OE2 = GND One Input Toggling 50% Duty Cycle IC Total Power Supply Current (6) VCC = Max. Outputs Open fi = 10MHz 50% Duty Cycle OE1 = OE2 = GND One Bit Toggling VCC = Max. VCC = Max. Outputs Open fi = 2.5MHz 50% Duty Cycle OE1 = OE2 = GND Ten Bits Toggling Min. — Typ.(2) 2.0 Max. 30 Unit µA VIN = VCC VIN = GND — 60 85 µA/ MHz VIN = VCC VIN = GND — 0.6 0.9 mA VIN = VCC –0.6V VIN = GND — 0.6 0.9 VIN = VCC VIN = GND — 1.5 2.1 (5) VIN = VCC –0.6V VIN = GND — 1.5 2.3 (5) NOTES: 1. For conditions shown as max. or min., use appropriate value specified under Electrical Characteristics for the applicable device type. 2. Typical values are at VCC = 3.3V, +25°C ambient. 3. Per TTL driven input; all other inputs at VCC or GND. 4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations. 5. Values for these conditions are examples of the ICC formula. These limits are guaranteed but not tested. 6. IC = IQUIESCENT + IINPUTS + IDYNAMIC IC = ICC + ∆ICC DHNT + ICCD (fCPNCP/2 + fiNi) ICC = Quiescent Current (ICCL, ICCH and ICCZ) ∆ICC = Power Supply Current for a TTL High Input DH = Duty Cycle for TTL Inputs High NT = Number of TTL Inputs at DH ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL) fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices) NCP = Number of Clock Inputs at fCP fi = Input Frequency Ni = Number of Inputs at fi 8.15 3092 tbl 06 4 IDT54/74FCT3827A/B 3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES SWITCHING CHARACTERISTICS OVER OPERATING RANGE(3) FCT3827A Com'l. Symbol tPLH tPHL tPZH tPZL tPHZ tPLZ Parameter Propagation Delay DI to YI Output Enable Time OEI to YI Output Disable Time OEI to YI FCT3827B Mil. Com'l. Mil. Condition(1) Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Unit CL = 50pF RL = 500Ω CL = 300pF(3) RL = 500Ω CL = 50pF RL = 500Ω CL = 300pF(3) RL = 500Ω CL = 5pF(3) RL = 500Ω CL = 50pF RL = 500Ω 1.5 8.0 1.5 9.0 1.5 5.0 1.5 6.5 ns 1.5 15.0 1.5 17.0 1.5 13.0 1.5 14.0 1.5 12.0 1.5 13.0 1.5 8.0 1.5 9.0 1.5 23.0 1.5 25.0 1.5 15.0 1.5 16.0 1.5 9.0 1.5 9.0 1.5 6.0 1.5 7.0 1.5 10.0 1.5 10.0 1.5 7.0 1.5 8.0 ns ns 3092 tbl 07 NOTES: 1. See test circuit and waveforms. 2. Minimum limits are guaranteed but not tested on Propagation Delays. 3. Propagation Delays and Enable/Disable times are with VCC = 3.3V ±0.3V, Normal Range. For VCC = 2.7V to 3.6V, Extended Range, all Propagation Delays and Enable/Disable times should be degraded by 20%. 8.15 5 IDT54/74FCT3827A/B 3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES TEST CIRCUITS AND WAVEFORMS SWITCH POSITION TEST CIRCUITS FOR ALL OUTPUTS Test Open Drain Disable Low Enable Low Disable High Enable High All Other tests 6V ← V CC 500Ω V V IN Pulse Generator Open GND OUT D.U.T. 50pF R T C Switch 6V GND Open 3092 lnk 08 DEFINITIONS: CL= Load capacitance: includes jig and probe capacitance. RT = Termination resistance: should be equal to ZOUT of the Pulse Generator. 500Ω L 3092 drw 03 SET-UP, HOLD AND RELEASE TIMES DATA INPUT TIMING INPUT ASYNCHRONOUS CONTROL PRESET CLEAR ETC. SYNCHRONOUS CONTROL PRESET CLEAR CLOCK ENABLE ETC. tH tSU tREM tSU PULSE WIDTH 3V 1.5V 0V 3V 1.5V 0V LOW-HIGH-LOW PULSE 1.5V tW 3V 1.5V 0V HIGH-LOW-HIGH PULSE 1.5V 3V 1.5V 0V tH 3092 drw 05 3092 drw 04 PROPAGATION DELAY ENABLE AND DISABLE TIMES ENABLE SAME PHASE INPUT TRANSITION tPLH tPHL OUTPUT tPLH OPPOSITE PHASE INPUT TRANSITION tPHL 3V 1.5V 0V VOH 1.5V VOL DISABLE 3V 1.5V CONTROL INPUT OUTPUT NORMALLY LOW 3V 1.5V 0V SWITCH 6V 3V 1.5V tPZH OUTPUT NORMALLY HIGH 3092 drw 06 SWITCH GND 0V tPLZ tPZL 3V 0.3V VOL tPHZ 0.3V 1.5V 0V VOH 0V 3092 drw 07 NOTES: 1. Diagram shown for input Control Enable-LOW and input Control DisableHIGH. 2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns. 3. If VCC is below 3V, input voltage swings should be adjusted not to exceed VCC. 8.15 6 IDT54/74FCT3827A/B 3.3V CMOS OCTAL BUFFERS MILITARY AND COMMERCIAL TEMPERATURE RANGES ORDERING INFORMATION IDT XX Temp. Range FCT X Family XX Device Type X Package X Process Blank B Commercial MIL-STD-883, Class B P D SO PY Q Plastic DIP (P24-1) CERDIP (D24-1) Small Outline IC (SO24-2) Shrink Small Outline Package (SO24-7) Quarter-size Small Outline Package (SO24-8) 827A 827B Non-Inverting 10-Bit Buffer Inverting 10-Bit Buffer 3 3.3 Volt 54 74 –55°C to +125°C –40°C to +85°C 3092 drw 08 8.15 7