IDT IDTQS742827BTQ High-speed cmos bus interface 10-bit buffer Datasheet

IDTQS74FCT2827ATBT//CT
HIGH-SPEED CMOS BUS INTERFACE 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
HIGH-SPEED CMOS
BUS INTERFACE
10-BIT BUFFER
IDTQS74FCT2827AT/BT/CT
DESCRIPTION:
FEATURES:
The IDTQS74FCT2827T is a 10-bit buffer with 3-state outputs and a
25Ω resistor, useful for driving transmission lines and reducing system
noise. The 2827T series parts can replace the 827T series to reduce noise
in an existing design. All inputs have clamp diodes for undershoot noise
suppression. All outputs have ground bounce suppression. Outputs will not
load an active bus when Vcc is removed from the device.
•
•
•
•
•
•
CMOS power levels: <7.5mW static
Undershoot clamp diodes on all outputs
True TTL input and output compatibility
Ground bounce controlled outputs
Reduced output swing of 0 to 3.5V
Ω series resistor outputs reduce reflection and other
Built-in 25Ω
system noise
• A,B, and C speed grades with 4.4ns tPD for C
• IOL = 12mA
• Available in SOIC and QSOP packages
FUNCTIONAL BLOCK DIAGRAM
Yx
Dx
25Ω
OE1
OE2
INDUSTRIAL TEMPERATURE RANGE
MARCH 2002
1
c
2002 Integrated Device Technology, Inc.
DSC-5258/4
IDTQS74FCT2827AT/BT/CT
HIGH-SPEED CMOS BUS INTERFACE 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS(1)
PIN CONFIGURATION
Symbol
OE1
1
24
VCC
D0
2
23
Y0
D1
3
22
Y1
D2
4
21
Y2
D3
5
20
Y3
D4
6
19
Y4
D5
7
18
Y5
D6
8
17
Y6
D7
9
16
Y7
D8
10
15
Y8
D9
11
14
Y9
12
13
OE2
GND
Description
Max
Unit
VTERM
Terminal Voltage with Respect to GND
–0.5 to +7
V
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current Max Sink Current/Pin
120
mA
IIK
Input Diode Current, VIN < 0
–20
mA
IOK
Output Diode Current, VOUT < 0
–50
mA
NOTE:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability.
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Parameter(1)
Symbol
Conditions
Typ.
Max.
Unit
CIN
Input Capacitance
VIN = 0V
8
—
pF
COUT
Output Capacitance
VOUT = 0V
8
—
pF
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
SOIC/ QSOP
TOP VIEW
Pin Names
I/O
OEx
I
Description
When both are LOW, the outputs are enabled.
When either one or both are HIGH, the outputs
are HIGH Z.
Dx
I
10-Bit Data Inputs
Yx
O
10-Bit Data Outputs
FUNCTION TABLE(1)
Inputs
OE1
OE2
Dx
Yx
Function
L
L
L
L
Transparent
L
L
H
H
Transparent
H
X
X
Z
High-Z
X
H
X
Z
High-Z
NOTE:
1. H = HIGH
L = LOW
X = Don't Care
Z = High-Impedance
2
Outputs
IDTQS74FCT2827ATBT//CT
HIGH-SPEED CMOS BUS INTERFACE 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ± 5%
Symbol
Parameter
Test Conditions
Min.
Typ.(1)
Max.
Unit
—
—
V
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
∆VT
Input Hysteresis
VTLH - VTHL for all inputs
—
0.2
—
V
IIH
Input HIGH Current
VCC = Max.
0 ≤ VIN ≤ VCC
—
—
±5
µA
IIL
Input LOW Current
IOZ
Off-State Output Current (Hi-Z)
0 ≤ VIN ≤ VCC
—
—
±5
µA
VCC = Max
2.0V(2)
IOR
VIC
Current Drive
Input Clamp Voltage
VCC = Max., VOUT =
VCC = Min, IIN = -18mA , TA = 25°C(2)
50
—
—
–0.7
—
–1.2
mA
V
VOH
VOL
ROUT(3)
Output HIGH Voltage
Output LOW Voltage
Output Resistance
VCC = Min.
VCC = Min.
VCC = Min.
2.4
—
18
—
—
25
—
0.5
40
V
V
Ω
IOH = -15mA
IOL = 12mA
IOH = 12mA
NOTES:
1. Typical values are at VCC = 5.0V, TA = 25°C.
2. This parameter is measured at characterization but not tested.
3. ROUT changed on March 8, 2002. See rear page for more information.
POWER SUPPLY CHARACTERISTICS
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ± 5%
Symbol
ICC
Parameter
Quiescent Power Supply Current
∆ICC
Supply Current per Input TTL Inputs HIGH
ICCD
Supply Current per Input per MHz
Test Conditions(1)
VCC = Max.
freq = 0
0V ≤ VIN ≤ 0.2V or
VCC - 0.2V ≤ VIN ≤ Vcc
VCC = Max.
VIN = 3.4V(2)
freq = 0
VCC = Max.
Outputs Open and Enabled
One Bit Toggling
50% Duty Cycle
Other inputs at GND or Vcc(3,4)
Min.
—
Max.
1.5
Unit
mA
—
2
mA
—
0.25
mA/MHz
NOTES:
1. For conditions shown as Min. or Max., use the appropriate values specified under DC Electrical Characteristics.
2. Per TLL driven input (VIN = 3.4V).
3. For flip-flops, ICCD is measured by switching one of the data input pins so that the output changes every clock cycle. This is a measurement of device power consumption
only and does not include power to drive load capacitance or tester capacitance.
4. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Output Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
3
IDTQS74FCT2827AT/BT/CT
HIGH-SPEED CMOS BUS INTERFACE 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE(1)
Symbol
tPLH
tPHL
tPLH
tPHL
tPZH
tPZL
tPZH
tPZL
tPHZ
tPLZ
tPHZ
tPLZ
Parameter(2)
Propagation Delay
Dx to Yx
Propagation Delay
Dx to Yx(2,3)
Output Enable Time
OEx to Yx
Output Enable Time
OEx to Yx(2,3)
Output Disable Time
OEx to Yx(2,4)
Output Disable Time
OEx to Yx(2)
FCT2827AT
Min.
Max.
—
8
FCT2827BT
Min.
Max.
—
5
FCT2827CT
Min.
Max.
—
4.4
Unit
ns
—
17
—
—
—
—
ns
—
12
—
8
—
7
ns
—
23
—
—
—
—
ns
—
9
—
6
—
5.7
ns
—
10
—
7
—
6
ns
NOTES:
1. CLOAD = 50pF, RLOAD = 500Ω unless otherwise noted.
2. This parameter is guaranteed by design but not tested.
3. CLOAD = 300pF.
4. CLOAD = 5pF.
4
IDTQS74FCT2827ATBT//CT
HIGH-SPEED CMOS BUS INTERFACE 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
VCC
7.0V
SWITCH POSITION
500W
Pulse
Generator
VOUT
VIN
D.U.T.
50pF
RT
500W
CL
Test
Switch
Open Drain
Disable Low
Enable Low
Closed
All Other Tests
Open
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
FCTL link
Test Circuits for All Outputs
DATA
INPUT
tH
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
3V
1.5V
0V
3V
1.5V
0V
tREM
tSU
LOW-HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
3V
1.5V
0V
tH
FCTL link
Pulse Width
FCTL link
Set-Up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
VOH
1.5V
VOL
DISABLE
3V
1.5V
0V
CONTROL
INPUT
tPZL
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
OUTPUT
NORMALLY
HIGH
FCTL link
SWITCH
CLOSED
tPZH
SWITCH
OPEN
tPLZ
3.5V
3.5V
1.5V
0.3V
VOL
tPHZ
0.3V
1.5V
0V
VOH
0V
FCTL link
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
5
IDTQS74FCT2827AT/BT/CT
HIGH-SPEED CMOS BUS INTERFACE 10-BIT BUFFER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDTQS
XX
XXXX
FCT
Device Type
Temp. Range
XX
Package
SO
Q
Small Outline IC (gull wing)
Quarter Size Small Outline Package
2827AT High-Speed CMOS Bus Interface 10-Bit Buffer
2827BT
2827CT
74
–40°C to +85°C
As per PCN L0201-02, the Output Resistance (ROUT) specifications have changed as of March 8, 2002. The original specifications were:
Parameter
ROUT
Description
Min.
Typ.
Max.
Unit
VCC = Min, IOL = -15mA
20
28
40
Ω
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www.idt.com
6
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[email protected]
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