PD - 97079B IRFP4229PbF PDP SWITCH Features l Advanced Process Technology l Key Parameters Optimized for PDP Sustain, Energy Recovery and Pass Switch Applications l Low E PULSE Rating to Reduce Power Dissipation in PDP Sustain, Energy Recovery and Pass Switch Applications l Low Q G for Fast Response l High Repetitive Peak Current Capability for Reliable Operation l Short Fall & Rise Times for Fast Switching l175°C Operating Junction Temperature for Improved Ruggedness l Repetitive Avalanche Capability for Robustness and Reliability Key Parameters VDS min VDS (Avalanche) typ. RDS(ON) typ. @ 10V IRP max @ TC= 100°C TJ max 250 300 38 87 175 V V m: A °C D D G G S D S TO-247AC G D S Gate Drain Source Description This HEXFET® Power MOSFET is specifically designed for Sustain; Energy Recovery & Pass switch applications in Plasma Display Panels. This MOSFET utilizes the latest processing techniques to achieve low on-resistance per silicon area and low EPULSE rating. Additional features of this MOSFET are 175°C operating junction temperature and high repetitive peak current capability. These features combine to make this MOSFET a highly efficient, robust and reliable device for PDP driving applications. Absolute Maximum Ratings Max. Units Gate-to-Source Voltage ±30 V A Parameter VGS ID @ TC = 25°C Continuous Drain Current, VGS @ 10V 44 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V 31 180 c IDM Pulsed Drain Current IRP @ TC = 100°C Repetitive Peak Current PD @TC = 25°C Power Dissipation 310 PD @TC = 100°C Power Dissipation 150 Linear Derating Factor 2.0 W/°C TJ Operating Junction and -40 to + 175 °C TSTG Storage Temperature Range g 87 Soldering Temperature for 10 seconds Mounting Torque, 6-32 or M3 Screw x 300 W x 10lb in (1.1N m) N Thermal Resistance Parameter RθJC RθCS RθJA Notes through www.irf.com Junction-to-Case f Case-to-Sink, Flat, Greased Surface Junction-to-Ambient f Typ. ––– 0.24 ––– Max. 0.49 ––– 40 Units °C/W are on page 8 1 09/14/07 IRFP4229PbF Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient 250 ––– ––– 210 ––– ––– VGS(th) Static Drain-to-Source On-Resistance Gate Threshold Voltage ––– 3.0 38 ––– 46 5.0 ∆VGS(th)/∆TJ IDSS Gate Threshold Voltage Coefficient Drain-to-Source Leakage Current ––– ––– -14 ––– ––– 20 Gate-to-Source Forward Leakage ––– ––– ––– ––– 1.0 100 Gate-to-Source Reverse Leakage Forward Transconductance ––– 83 ––– ––– -100 ––– Total Gate Charge Gate-to-Drain Charge ––– ––– 72 26 110 ––– Turn-On Delay Time Rise Time ––– ––– 25 27 ––– ––– Turn-Off Delay Time Fall Time ––– ––– 44 19 ––– ––– Shoot Through Blocking Time 100 ––– ––– ––– 790 ––– ––– 1390 ––– Input Capacitance ––– 4560 ––– Output Capacitance Reverse Transfer Capacitance ––– ––– 390 100 ––– ––– Effective Output Capacitance Internal Drain Inductance ––– ––– 290 5.0 ––– ––– BVDSS ∆ΒVDSS/∆TJ RDS(on) IGSS gfs Qg Qgd td(on) tr td(off) tf tst EPULSE Ciss Coss Crss Coss eff. LD Energy per Pulse VGS = 0V, ID = 250µA V mV/°C Reference to 25°C, ID = 1mA mΩ VGS = 10V, ID = 26A e V Internal Source Inductance ––– 13 VDS = VGS, ID = 250µA mV/°C µA VDS = 250V, VGS = 0V mA VDS = 250V, VGS = 0V, TJ = 125°C nA VGS = 20V VGS = -20V S VDS = 25V, ID = 26A VDD = 125V, ID = 26A, VGS = 10V nC e e VDD = 125V, VGS = 10V ns ID = 26A RG = 5.0Ω ns µJ pF See Fig. 22 VDD = 200V, VGS = 15V, RG= 4.7Ω L = 220nH, C= 0.3µF, VGS = 15V VDS = 200V, RG= 4.7Ω, TJ = 25°C L = 220nH, C= 0.3µF, VGS = 15V VDS = 200V, RG= 4.7Ω, TJ = 100°C VGS = 0V VDS = 25V ƒ = 1.0MHz, VGS = 0V, VDS = 0V to 200V Between lead, nH LS Conditions ––– D 6mm (0.25in.) from package and center of die contact G S Avalanche Characteristics Typ. Max. Units Single Pulse Avalanche Energy ––– 300 mJ Repetitive Avalanche Energy Repetitive Avalanche Voltage ––– 300 31 ––– mJ ––– 26 A Parameter EAS EAR VDS(Avalanche) IAS Avalanche Current d d c c V Diode Characteristics Parameter IS @ TC = 25°C Continuous Source Current ISM VSD trr Qrr 2 (Body Diode) Pulsed Source Current c Min. Typ. Max. Units ––– ––– 44 ––– ––– 180 Conditions MOSFET symbol A (Body Diode) Diode Forward Voltage ––– ––– 1.3 V Reverse Recovery Time Reverse Recovery Charge ––– ––– 190 840 290 1260 ns nC showing the integral reverse p-n junction diode. TJ = 25°C, IS = 26A, VGS = 0V TJ = 25°C, IF = 26A, VDD = 50V e di/dt = 100A/µs e www.irf.com IRFP4229PbF 1000 1000 VGS 15V 10V 8.0V 7.0V 6.5V 6.0V 5.5V 100 BOTTOM 10 5.5V 1 0.1 100 5.5V 10 ≤ 60µs PULSE WIDTH Tj = 25°C 1 10 BOTTOM ≤ 60µs PULSE WIDTH Tj = 175°C 1 100 0.1 1 VDS, Drain-to-Source Voltage (V) 100 Fig 2. Typical Output Characteristics 3.5 RDS(on) , Drain-to-Source On Resistance (Normalized) 1000 ID, Drain-to-Source Current(Α) 10 VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics 100 TJ = 175°C 10 1 TJ = 25°C 0.1 VDS = 25V ≤ 60µs PULSE WIDTH 0.01 4.0 5.0 6.0 7.0 ID = 26A VGS = 10V 3.0 2.5 2.0 1.5 1.0 0.5 0.0 8.0 -60 -40 -20 VGS, Gate-to-Source Voltage (V) 0 20 40 60 80 100 120 140 160 180 TJ , Junction Temperature (°C) Fig 3. Typical Transfer Characteristics Fig 4. Normalized On-Resistance vs. Temperature 1600 1400 L = 220nH C = 0.3µF 100°C 25°C 1200 L = 220nH C = Variable 100°C 25°C 1200 Energy per pulse (µJ) Energy per pulse (µJ) VGS 15V 10V 8.0V 7.0V 6.5V 6.0V 5.5V TOP ID, Drain-to-Source Current (A) ID, Drain-to-Source Current (A) TOP 800 400 1000 800 600 400 200 0 0 150 160 170 180 190 200 VDS, Drain-to -Source Voltage (V) Fig 5. Typical EPULSE vs. Drain-to-Source Voltage www.irf.com 100 110 120 130 140 150 160 170 ID, Peak Drain Current (A) Fig 6. Typical EPULSE vs. Drain Current 3 IRFP4229PbF 2000 1000 L = 220nH Energy per pulse (µJ) ISD , Reverse Drain Current (A) C= 0.3µF C= 0.2µF C= 0.1µF 1600 1200 800 400 100 TJ = 175°C 10 1 TJ = 25°C VGS = 0V 0 25 50 75 100 125 0.1 150 0.2 Temperature (°C) Fig 7. Typical EPULSE vs.Temperature 7000 VGS, Gate-to-Source Voltage (V) C, Capacitance (pF) 20 Coss = Cds + Cgd 5000 Ciss 4000 3000 Coss 2000 1000 Crss 1 1.0 1.2 ID= 26A VDS = 160V VDS = 100V 16 VDS = 40V 12 8 4 10 100 0 1000 Fig 9. Typical Capacitance vs.Drain-to-Source Voltage ID, Drain-to-Source Current (A) 1000 30 20 10 0 40 60 80 100 120 Fig 10. Typical Gate Charge vs.Gate-to-Source Voltage 50 40 20 QG Total Gate Charge (nC) VDS , Drain-to-Source Voltage (V) ID, Drain Current (A) 0.8 0 0 OPERATION IN THIS AREA LIMITED BY R DS(on) 1µsec 100 10µsec 100µsec 10 1 Tc = 25°C Tj = 175°C Single Pulse 0.1 25 50 75 100 125 150 175 TJ , Junction Temperature (°C) Fig 11. Maximum Drain Current vs. Case Temperature 4 0.6 Fig 8. Typical Source-Drain Diode Forward Voltage VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, Cds SHORTED Crss = Cgd 6000 0.4 VSD, Source-to-Drain Voltage (V) 1 10 100 1000 VDS , Drain-to-Source Voltage (V) Fig 12. Maximum Safe Operating Area www.irf.com 0.40 EAS, Single Pulse Avalanche Energy (mJ) () RDS (on), Drain-to -Source On Resistance Ω IRFP4229PbF ID = 26A 0.30 0.20 TJ = 125°C 0.10 TJ = 25°C 1200 I D 5.8A 9.7A BOTTOM 26A TOP 1000 800 600 400 200 0.00 0 5 6 7 8 9 10 25 VGS, Gate-to-Source Voltage (V) 100 125 150 175 Fig 14. Maximum Avalanche Energy Vs. Temperature 5.0 140 4.5 120 Repetitive Peak Current (A) VGS(th) Gate threshold Voltage (V) 75 Starting TJ, Junction Temperature (°C) Fig 13. On-Resistance Vs. Gate Voltage 4.0 50 ID = 250µA 3.5 3.0 2.5 ton= 1µs Duty cycle = 0.25 Half Sine Wave Square Pulse 100 80 60 40 20 2.0 0 1.5 -75 -50 -25 0 25 50 75 25 100 125 150 175 50 75 100 125 150 175 Case Temperature (°C) TJ , Temperature ( °C ) Fig 16. Typical Repetitive peak Current vs. Case temperature Fig 15. Threshold Voltage vs. Temperature Thermal Response ( ZthJC ) 1 D = 0.50 0.20 0.1 0.10 0.05 τJ 0.02 0.01 0.01 R1 R1 τJ τ1 R2 R2 R3 R3 Ri (°C/W) τC τ2 τ1 τ2 Ci= τi/Ri Ci= τi/Ri τ3 τ3 τ τι (sec) 0.104678 0.000148 0.222607 0.001836 0.16298 0.01527 Notes: 1. Duty Factor D = t1/t2 2. Peak Tj = P dm x Zthjc + Tc SINGLE PULSE ( THERMAL RESPONSE ) 0.001 1E-006 1E-005 0.0001 0.001 0.01 0.1 t1 , Rectangular Pulse Duration (sec) Fig 17. Maximum Effective Transient Thermal Impedance, Junction-to-Case www.irf.com 5 IRFP4229PbF Driver Gate Drive D.U.T + - - * RG • • • • *** D.U.T. ISD Waveform Reverse Recovery Current + dv/dt controlled by RG Driver same type as D.U.T. I SD controlled by Duty Factor "D" D.U.T. - Device Under Test P.W. Period VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer - D= Period P.W. + V DD ** + - Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage Body Diode VDD Forward Drop Inductor Curent ISD Ripple ≤ 5% * Use P-Channel Driver for P-Channel Measurements ** Reverse Polarity for P-Channel *** VGS = 5V for Logic Level Devices Fig 18. Diode Reverse Recovery Test Circuit for HEXFET® Power MOSFETs V(BR)DSS 15V D.U.T RG VGS 20V DRIVER L VDS tp + V - DD IAS tp A 0.01Ω I AS Fig 19a. Unclamped Inductive Test Circuit Fig 19b. Unclamped Inductive Waveforms Id Vds Vgs L DUT 0 1K VCC Vgs(th) Qgs1 Qgs2 Fig 20a. Gate Charge Test Circuit 6 Qgd Qgodr Fig 20b. Gate Charge Waveform www.irf.com IRFP4229PbF A RG PULSE A C DRIVER L PULSE B VCC B Ipulse RG tST DUT Fig 21b. tst Test Waveforms Fig 21a. tst and EPULSE Test Circuit Fig 21c. EPULSE Test Waveforms VDS V GS RG RD VDS 90% D.U.T. + -V DD V GS Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Fig 22a. Switching Time Test Circuit www.irf.com 10% VGS td(on) tr t d(off) tf Fig 22b. Switching Time Waveforms 7 IRFP4229PbF TO-247AC Package Outline Dimensions are shown in millimeters (inches) TO-247AC Part Marking Information (;$03/( 7+,6,6$1,5)3( :,7+$66(0%/< /27&2'( $66(0%/('21:: ,17+($66(0%/</,1(+ 1RWH3LQDVVHPEO\OLQHSRVLWLRQ LQGLFDWHV/HDG)UHH ,17(51$7,21$/ 5(&7,),(5 /2*2 3$57180%(5 ,5)3( + $66(0%/< /27&2'( '$7(&2'( <($5 :((. /,1(+ TO-247AC package is not recommended for Surface Mount Application. Notes: Repetitive rating; pulse width limited by max. junction temperature. Starting TJ = 25°C, L = 0.85mH, RG = 25Ω, IAS = 26A. Pulse width ≤ 400µs; duty cycle ≤ 2%. Rθ is measured at TJ of approximately 90°C. Half sine wave with duty cycle = 0.25, ton=1µsec. Note: For the most current drawing please refer to IR website at: http://www.irf.com/package/ Data and specifications subject to change without notice. This product has been designed and qualified for the Industrial market. Qualification Standards can be found on IR’s Web site. IR WORLD HEADQUARTERS: 233 Kansas St., El Segundo, California 90245, USA Tel: (310) 252-7105 TAC Fax: (310) 252-7903 Visit us at www.irf.com for sales contact information. 09/2007 8 www.irf.com