ISSI IS61C25616AL 256k x 16 high-speed cmos static ram Datasheet

IS61C25616AL IS61C25616AS
IS64C25616AL IS64C25616AS
256K x 16 HIGH-SPEED CMOS STATIC RAM
MARCH 2008
FEATURES
HIGH SPEED: (IS61/64C25616AL)
• High-speed access time: 10ns, 12 ns
• Low Active Power: 150 mW (typical)
• Low Standby Power: 10 mW (typical)
CMOS standby
LOW POWER: (IS61/64C25616AS)
• High-speed access time: 25 ns
• Low Active Power: 75 mW (typical)
• Low Standby Power: 1 mW (typical)
CMOS standby
• TTL compatible interface levels
• Single 5V ± 10% power supply
• Fully static operation: no clock or refresh
required
• Available in 44-pin SOJ package and
44-pin TSOP (Type II)
• Commercial, Industrial and Automotive temperature ranges available
• Lead-free available
DESCRIPTION
The ISSI IS61C25616AL/AS and IS64C25616AL/AS are
high-speed, 4,194,304-bit static RAMs organized as 262,144
words by 16 bits. They are fabricated using ISSI's highperformance CMOS technology. This highly reliable process
coupled with innovative circuit design techniques, yields
access times as fast as 12 ns with low power consumption.
When CE is HIGH (deselected), the device assumes a
standby mode at which the power dissipation can be reduced
down with CMOS input levels.
Easy memory expansion is provided by using Chip Enable
and Output Enable inputs, CE and OE. The active LOW Write
Enable (WE) controls both writing and reading of the memory.
A data byte allows Upper Byte (UB) and Lower Byte (LB)
access.
The IS61C25616AL/AS and IS64C25616AL/AS are packaged in the JEDEC standard 44-pin 400-mil SOJ and 44-pin
TSOP (Type II).
FUNCTIONAL BLOCK DIAGRAM
A0-A17
DECODER
256K x 16
MEMORY ARRAY
I/O
DATA
CIRCUIT
COLUMN I/O
VDD
GND
I/O0-I/O7
Lower Byte
I/O8-I/O15
Upper Byte
CE
OE
WE
UB
CONTROL
CIRCUIT
LB
Copyright © 2006 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability
arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any
published information and before placing orders for products.
Integrated Silicon Solution, Inc. — www.issi.com
Rev. C
03/21/2008
1
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
PIN CONFIGURATIONS
44-Pin SOJ
A15
1
44
A0
A14
2
43
A1
A13
3
42
A2
A12
4
41
OE
A11
5
40
UB
CE
6
39
LB
I/O0
7
38
I/O15
I/O1
8
37
I/O14
I/O2
9
36
I/O13
I/O3
10
35
I/O12
VDD
11
34
GND
GND
12
33
VDD
I/O4
13
32
I/O11
I/O5
14
31
I/O10
I/O6
15
30
I/O9
I/O7
16
29
I/O8
WE
17
28
NC
A10
18
27
A3
A9
19
26
A4
A8
20
25
A5
A7
21
24
A6
A16
22
23
A17
44-Pin TSOP (Type II)
A15
A14
A13
A12
A11
CE
I/O0
I/O1
I/O2
I/O3
VDD
GND
I/O4
I/O5
I/O6
I/O7
WE
A10
A9
A8
A7
A16
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
A0
A1
A2
OE
UB
LB
I/O15
I/O14
I/O13
I/O12
GND
VDD
I/O11
I/O10
I/O9
I/O8
NC
A3
A4
A5
A6
A17
PIN DESCRIPTIONS
2
A0-A17
Address Inputs
LB
Lower-byte Control (I/O0-I/O7)
I/O0-I/O15
Data Inputs/Outputs
UB
Upper-byte Control (I/O8-I/O15)
CE
Chip Enable Input
NC
No Connection
OE
Output Enable Input
VDD
Power
WE
Write Enable Input
GND
Ground
Integrated Silicon Solution, Inc. — www.issi.com
Rev. C
03/21/2008
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
TRUTH TABLE
Mode
Not Selected
Output Disabled
Read
Write
I/O PIN
I/O0-I/O7
I/O8-I/O15
WE
CE
OE
LB
UB
X
H
X
H
H
H
L
L
L
H
L
L
L
L
L
L
L
L
X
H
X
L
L
L
X
X
X
X
X
H
L
H
L
L
H
L
X
X
H
H
L
L
H
L
L
High-Z
High-Z
High-Z
DOUT
High-Z
DOUT
DIN
High-Z
DIN
Value
–0.5 to +7.0
–65 to +150
1.5
20
Unit
V
°C
W
mA
High-Z
High-Z
High-Z
High-Z
DOUT
DOUT
High-Z
DIN
DIN
VDD Current
ISB1, ISB2
ICC1, ICC2
ICC1, ICC2
ICC1, ICC2
ABSOLUTE MAXIMUM RATINGS(1)
Symbol
VTERM
TSTG
PT
IOUT
Parameter
Terminal Voltage with Respect to GND
Storage Temperature
Power Dissipation
DC Output Current (LOW)
Notes:
1. Stress greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause permanent damage to the
device. This is a stress rating only and functional operation of the device at these or any other conditions above
those indicated in the operational sections of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
CAPACITANCE(1,2)
Symbol
Parameter
CIN
Input Capacitance
COUT
Output Capacitance
Conditions
Max.
Unit
VIN = 0V
5
pF
VOUT = 0V
7
pF
Notes:
1. Tested initially and after any design or process changes that may affect these parameters.
2. Test conditions: TA = 25°C, f = 1 MHz, VDD = 5.0V.
DC ELECTRICAL CHARACTERISTICS (Over Operating Range)
Symbol Parameter
Test Conditions
Min.
Max.
Unit
VOH
Output HIGH Voltage
VDD = Min., IOH = –4.0 mA
2.4
—
V
VOL
Output LOW Voltage
VDD = Min., IOL = 8.0 mA
—
0.4
V
VIH
Input HIGH Voltage
2.2
VDD + 0.5
V
VIL
Input LOW Voltage(1)
–0.3
0.8
V
ILI
Input Leakage
GND ≤ VIN ≤ VDD
Com.
Ind.
Auto.
–1
–2
–5
1
2
5
µA
ILO
Output Leakage
GND ≤ VOUT ≤ VDD
Outputs Disabled
Com.
Ind.
Auto.
–1
–2
–5
1
2
5
µA
Note: 1. VIL = –3.0V for pulse width less than 10 ns.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. C
03/21/2008
3
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
OPERATING RANGE: HIGH SPEED OPTION (IS61/64C25616AL)
Range
Commercial
Ambient Temperature
0°C to +70°C
VDD
5V ± 10%
Speed (ns)
10
Industrial
-40°C to +85°C
5V ± 10%
10
Automotive
-40°C to +125°C
5V ± 10%
12
OPERATING RANGE: LOW POWER OPTION (IS61/64C25616AS)
4
Range
Commercial
Ambient Temperature
0°C to +70°C
VDD
5V ± 10%
Speed (ns)
25
Industrial
-40°C to +85°C
5V ± 10%
25
Automotive
-40°C to +125°C
5V ± 10%
25
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Rev. C
03/21/2008
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
HIGH SPEED OPTION (IS61/64C25616AL)
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
-10 ns
Min. Max.
-12 ns
Min. Max.
Symbol Parameter
Test Conditions
ICC1
VDD Operating
Supply Current
VDD = VDD MAX., CE = VIL
IOUT = 0 mA, f = 0
Com.
Ind.
Auto.
—
—
—
45
50
55
—
—
—
45
50
55
mA
ICC2
VDD Dynamic Operating
Supply Current
VDD = VDD MAX., CE = VIL
IOUT = 0 mA, f = fMAX
Com.
Ind.
Auto.
typ.(2)
—
—
—
50
55
70
—
—
—
45
50
60
mA
30
Unit
25
ISB1
TTL Standby Current
(TTL Inputs)
VDD = VDD MAX.,
VIN = VIH or VIL
CE ≥ VIH, f = 0
Com.
Ind.
Auto.
—
—
—
15
20
30
—
—
—
15
20
30
mA
ISB2
CMOS Standby
Current (CMOS Inputs)
VDD = VDD MAX.,
CE ≤ VDD – 0.2V,
VIN ≥ VDD – 0.2V, or
VIN ≤ 0.2V, f = 0
Com.
Ind.
Auto.
typ.(2)
—
—
—
8
12
20
—
—
—
8
12
20
mA
2
Note:
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical values are measured at VDD = 5V, TA = 25oC and not 100% tested.
LOW POWER OPTION (IS61/64C25616AS)
POWER SUPPLY CHARACTERISTICS(1) (Over Operating Range)
-25 ns
Min. Max.
Symbol Parameter
Test Conditions
Unit
ICC
Average operating
Current
CE = VIL,
VDD = Max.,
I OUT= 0 mA, f = 0
Com.
Ind.
Auto.
—
—
—
10
15
20
mA
ICC1
VDD Dynamic Operating
Supply Current
VDD = Max., CE = VIL
IOUT = 0 mA, f = fMAX
VIN = VIH or VIL
Com.
Ind.
Auto.
typ.(2)
—
—
—
25
30
40
mA
15
ISB1
TTL Standby Current
(TTL Inputs)
VDD = Max.,
VIN = VIH or VIL, CE ≥ VIH,
f=0
Com.
Ind.
Auto.
—
—
—
1
1.5
2
mA
ISB2
CMOS Standby
Current (CMOS Inputs)
VDD = Max.,
CE ≥ VDD – 0.2V,
VIN ≥ VDD – 0.2V,
or VIN ≤ VSS + 0.2V, f = 0
Com.
Ind.
Auto.
typ.(2)
—
—
—
0.8
0.9
2
mA
0.2
Note:
1. At f = fMAX, address and data inputs are cycling at the maximum frequency, f = 0 means no input lines change.
2. Typical values are measured at VDD = 5V, TA = 25oC and not 100% tested.
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Rev. C
03/21/2008
5
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
READ CYCLE SWITCHING CHARACTERISTICS(1) (Over Operating Range)
Symbol
tRC
tAA
tOHA
tACE
tDOE
tHZOE(2)
tLZOE(2)
tHZCE(2)
tLZCE(2)
tBA
tHZB
tLZB
Parameter
Read Cycle Time
-10
Min. Max.
10
—
-12
Min. Max.
12
—
-25
Min. Max.
25
—
Unit
ns
Address Access Time
—
10
—
12
—
25
ns
Output Hold Time
3
—
3
—
3
—
ns
CE Access Time
—
10
—
12
—
25
ns
OE Access Time
—
5
—
6
—
15
ns
OE to High-Z Output
0
5
0
6
0
8
ns
OE to Low-Z Output
0
—
0
—
2
—
ns
CE to High-Z Output
0
5
0
6
0
8
ns
CE to Low-Z Output
2
—
2
—
2
—
ns
LB, UB Access Time
—
5
—
6
—
25
ns
LB, UB to High-Z Output
0
5
0
6
0
8
ns
LB, UB to Low-Z Output
0
—
0
—
0
—
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0
to 3.0V and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. Not 100% tested.
AC TEST CONDITIONS
Parameter
Input Pulse Level
Input Rise and Fall Times
Input and Output Timing
and Reference Level
Output Load
Unit
0V to 3.0V
3 ns
1.5V
See Figures 1 and 2
AC TEST LOADS
480 Ω
480 Ω
5V
5V
OUTPUT
OUTPUT
30 pF
Including
jig and
scope
Figure 1
6
255 Ω
5 pF
Including
jig and
scope
255 Ω
Figure 2
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Rev. C
03/21/2008
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
AC WAVEFORMS
READ CYCLE NO. 1(1,2) (Address Controlled) (CE = OE = VIL, UB or LB = VIL)
t RC
ADDRESS
t AA
t OHA
t OHA
DOUT
DATA VALID
PREVIOUS DATA VALID
READ1.eps
READ CYCLE NO. 2(1,3)
t RC
ADDRESS
t AA
t OHA
OE
t HZOE
t DOE
CE
t LZOE
t ACE
t HZCE
t LZCE
LB, UB
DOUT
HIGH-Z
t LZB
t BA
t HZB
DATA VALID
UB_CEDR2.eps
Notes:
1. WE is HIGH for a Read Cycle.
2. The device is continuously selected. OE, CE, UB, or LB = VIL.
3. Address is valid prior to or coincident with CE LOW transition.
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Rev. C
03/21/2008
7
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
WRITE CYCLE SWITCHING CHARACTERISTICS(1,3) (Over Operating Range)
Symbol Parameter
-10
Min. Max.
-12
Min. Max.
-25
Min. Max.
Unit
tWC
Write Cycle Time
10
—
12
—
25
—
ns
tSCE
CE to Write End
7
—
9
—
18
—
ns
tAW
Address Setup Time
to Write End
7
—
9
—
18
—
ns
tHA
Address Hold from Write End
0
—
0
—
0
—
ns
tSA
Address Setup Time
0
—
0
—
0
—
ns
tPWB
LB, UB Valid to End of Write
7
—
9
—
18
—
ns
tPWE1
WE Pulse Width (OE =High)
7
—
9
—
15
—
ns
tPWE2
WE Pulse Width (OE=Low)
7
—
9
—
17
—
ns
tSD
Data Setup to Write End
6
—
6
—
15
—
ns
tHD
Data Hold from Write End
0
—
0
—
0
—
ns
tHZWE(2) WE LOW to High-Z Output
—
6
—
6
—
15
ns
tLZWE(2) WE HIGH to Low-Z Output
3
—
3
—
5
—
ns
Notes:
1. Test conditions assume signal transition times of 3 ns or less, timing reference levels of 1.5V, input pulse levels of 0 to 3.0V
and output loading specified in Figure 1.
2. Tested with the load in Figure 2. Transition is measured ±500 mV from steady-state voltage. Not 100% tested.
3. The internal write time is defined by the overlap of CE LOW and UB or LB, and WE LOW. All signals must be in valid states to
initiate a Write, but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the
rising or falling edge of the signal that terminates the write.
8
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Rev. C
03/21/2008
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
AC WAVEFORMS
WE Controlled)(1,2)
WRITE CYCLE NO. 1 (WE
t WC
VALID ADDRESS
ADDRESS
t SA
t SCE
t HA
CE
t AW
t PWE1
t PWE2
WE
t PBW
UB, LB
t HZWE
DOUT
DATA UNDEFINED
t LZWE
HIGH-Z
t SD
DIN
t HD
DATAIN VALID
UB_CEWR1.eps
Notes:
1. WRITE is an internally generated signal asserted during an overlap of the LOW states on the CE and WE inputs and at least
one of the LB and UB inputs being in the LOW state.
2. WRITE = (CE) [ (LB) = (UB) ] (WE).
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Rev. C
03/21/2008
9
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
WRITE CYCLE NO. 2 (OE is HIGH During Write Cycle) (1,2)
t WC
ADDRESS
VALID ADDRESS
t HA
OE
CE
LOW
t AW
t PWE1
WE
t SA
t PBW
UB, LB
t HZWE
DOUT
t LZWE
HIGH-Z
DATA UNDEFINED
t SD
t HD
DATAIN VALID
DIN
UB_CEWR2.eps
WRITE CYCLE NO. 3 (OE is LOW During Write Cycle) (1)
t WC
ADDRESS
VALID ADDRESS
OE
LOW
CE
LOW
t HA
t AW
t PWE2
WE
t SA
t PBW
UB, LB
t HZWE
DOUT
DATA UNDEFINED
t LZWE
HIGH-Z
t SD
DIN
t HD
DATAIN VALID
UB_CEWR3.eps
Notes:
1. The internal write time is defined by the overlap of CE LOW and WE LOW. All signals must be in valid states to initiate a Write,
but any one can go inactive to terminate the Write. The Data Input Setup and Hold timing are referenced to the rising or falling
edge of the signal that terminates the Write.
2. I/O will assume the High-Z state if OE ≥ VIH.
10
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Rev. C
03/21/2008
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
WRITE CYCLE NO. 4 (UB/LB Back to Back Write)
t WC
ADDRESS
t WC
ADDRESS 1
ADDRESS 2
OE
t SA
CE
LOW
t HA
t SA
WE
UB, LB
t HA
t PBW
t PBW
WORD 1
WORD 2
t HZWE
DOUT
t LZWE
HIGH-Z
DATA UNDEFINED
t HD
t SD
DIN
t HD
t SD
DATAIN
VALID
DATAIN
VALID
UB_CEWR4.eps
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Rev. C
03/21/2008
11
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
DATA RETENTION SWITCHING CHARACTERISTICS (HIGH SPEED) (IS61/64C25616AL)
Symbol
Parameter
Test Condition
Min.
Max.
Unit
VDR
VDD for Data Retention
See Data Retention Waveform
2.9
5.5
V
IDR
Data Retention Current
VDD = 2.9V, CE ≥ VDD – 0.2V
VIN ≥ VDD – 0.2V, or VIN ≤ VSS + 0.2V
—
—
—
8
10
15
mA
Com.
Ind.
Auto.
typ. (1)
1
tSDR
Data Retention Setup Time
See Data Retention Waveform
0
—
ns
tRDR
Recovery Time
See Data Retention Waveform
tRC
—
ns
Note:
1. Typical Values are measured at VDD = 5V, TA = 25oC and not 100% tested.
CE Controlled)
DATA RETENTION WAVEFORM (CE
tSDR
Data Retention Mode
tRDR
VDD
4.5V
VDR
CE
GND
12
CE ≥ VDD - 0.2V
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Rev. C
03/21/2008
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
DATA RETENTION SWITCHING CHARACTERISTICS (LOW POWER) (IS61/64C25616AS)
Symbol
Parameter
Test Condition
Min.
Max.
Unit
VDR
VDD for Data Retention
See Data Retention Waveform
2.9
5.5
V
IDR
Data Retention Current
VDD = 2.9V, CE ≥ VDD – 0.2V
VIN ≥ VDD – 0.2V, or VIN ≤ VSS + 0.2V
—
—
—
0.8
0.9
2
mA
Com.
Ind.
Auto.
typ. (1)
0.2
tSDR
Data Retention Setup Time
See Data Retention Waveform
0
—
ns
tRDR
Recovery Time
See Data Retention Waveform
tRC
—
ns
Note:
1. Typical Values are measured at VDD = 5V, TA = 25oC and not 100% tested.
DATA RETENTION WAVEFORM (CE
CE Controlled)
tSDR
Data Retention Mode
tRDR
VDD
4.5V
VDR
CE
GND
CE ≥ VDD - 0.2V
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Rev. C
03/21/2008
13
IS61C25616AL
IS64C25616AL
IS61C25616AS
IS64C25616AS
HIGH SPEED
ORDERING INFORMATION: IS61/64C25616AL
Commercial Range: 0°C to +70°C
Speed (ns)
10
Order Part No.
Package
IS61C25616AL-10TL
44-pin TSOP-II, Lead-free
Industrial Range: –40°C to +85°C
Speed (ns)
10
Order Part No.
Package
IS61C25616AL-10KI
IS61C25616AL-10KLI
IS61C25616AL-10TI
IS61C25616AL-10TLI
400-mil Plastic SOJ
400-mil Plastic SOJ, Lead-free
44-pin TSOP-II
44-pin TSOP-II, Lead-free
Automotive Range: –40°C to +125°C
Speed (ns)
12
Order Part No.
Package
IS64C25616AL-12KA3
IS64C25616AL-12TA3
IS64C25616AL-12CTLA3
400-mil Plastic SOJ
44-pin TSOP-II
44-pin TSOP-II, Lead-free,
Copper Leadframe
LOW POWER
ORDERING INFORMATION: IS61C25616AS
Industrial Range: –40°C to +85°C
Speed (ns)
25
Order Part No.
Package
IS61C25616AS-25KI
IS61C25616AS-25KLI
IS61C25616AS-25TI
IS61C25616AS-25TLI
400-mil Plastic SOJ
400-mil Plastic SOJ, Lead-free
44-pin TSOP-II
44-pin TSOP-II, Lead-free
Automotive Range: –40°C to +125°C
Speed (ns)
25
14
Order Part No.
Package
IS64C25616AS-25TLA3
44-pin TSOP-II, Lead-free
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Rev. C
03/21/2008
PACKAGING INFORMATION
400-mil Plastic SOJ
Package Code: K
N
Notes:
1. Controlling dimension:
millimeters.
2. BSC = Basic lead spacing
between centers.
3. Dimensions D and E1 do not
include mold flash protrusions
and should be measured from
the bottom of the package.
4. Reference document: JEDEC
MS-027.
N/2+1
E1
1
E
N/2
SEATING PLANE
D
b
A
C
A2
e
Symbol
No. Leads
A
A1
A2
B
b
C
D
E
E1
E2
e
B
Millimeters
Inches
Min Max
Min
Max
(N)
28
3.25 3.75
0.128 0.148
0.64 —
0.025
—
2.08 —
0.082
—
0.38 0.51
0.015 0.020
0.66 0.81
0.026 0.032
0.18 0.33
0.007 0.013
18.29 18.54
0.720 0.730
11.05 11.30
0.435 0.445
10.03 10.29
0.395 0.405
9.40 BSC
0.370 BSC
1.27 BSC
0.050 BSC
A1
E2
Millimeters
Min Max
Inches
Min Max
Millimeters
Min Max
32
3.25 3.75
0.64 —
2.08 —
0.38 0.51
0.66 0.81
0.18 0.33
20.82 21.08
11.05 11.30
10.03 10.29
9.40 BSC
1.27 BSC
0.128 0.148
0.025
—
0.082
—
0.015 0.020
0.026 0.032
0.007 0.013
0.820 0.830
0.435 0.445
0.395 0.405
0.370 BSC
0.050 BSC
3.25 3.75
0.64 —
2.08 —
0.38 0.51
0.66 0.81
0.18 0.33
23.37 23.62
11.05 11.30
10.03 10.29
9.40 BSC
1.27 BSC
Inches
Min Max
36
0.128 0.148
0.025
—
0.082
—
0.015 0.020
0.026 0.032
0.007 0.013
0.920 0.930
0.435 0.445
0.395 0.405
0.370 BSC
0.050 BSC
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. F
10/29/03
PACKAGING INFORMATION
Millimeters
Inches
Symbol Min Max
Min
Max
No. Leads (N)
40
A
3.25 3.75
0.128 0.148
A1
0.64 —
0.025
—
A2
2.08 —
0.082
—
B
0.38 0.51
0.015 0.020
b
0.66 0.81
0.026 0.032
C
0.18 0.33
0.007 0.013
D
25.91 26.16
1.020 1.030
E
11.05 11.30
0.435 0.445
E1
10.03 10.29
0.395 0.405
E2
9.40 BSC
0.370 BSC
e
1.27 BSC
0.050 BSC
Millimeters
Min Max
Inches
Min Max
Millimeters
Min
Max
42
3.25 3.75
0.64 —
2.08 —
0.38 0.51
0.66 0.81
0.18 0.33
27.18 27.43
11.05 11.30
10.03 10.29
9.40 BSC
1.27 BSC
0.128 0.148
0.025
—
0.082
—
0.015 0.020
0.026 0.032
0.007 0.013
1.070 1.080
0.435 0.445
0.395 0.405
0.370 BSC
0.050 BSC
3.25 3.75
0.64 —
2.08 —
0.38 0.51
0.66 0.81
0.18 0.33
28.45 28.70
11.05 11.30
10.03 10.29
9.40 BSC
1.27 BSC
Inches
Min
Max
44
0.128 0.148
0.025
—
0.082
—
0.015 0.020
0.026 0.032
0.007 0.013
1.120 1.130
0.435 0.445
0.395 0.405
0.370 BSC
0.050 BSC
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
2
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. F
10/29/03
PACKAGING INFORMATION
Plastic TSOP
Package Code: T (Type II)
N
N/2+1
E1
1
Notes:
1. Controlling dimension: millimieters,
unless otherwise specified.
2. BSC = Basic lead spacing
between centers.
3. Dimensions D and E1 do not
include mold flash protrusions and
should be measured from the
bottom of the package.
4. Formed leads shall be planar with
respect to one another within
0.004 inches at the seating plane.
E
N/2
D
SEATING PLANE
A
ZD
.
b
e
Symbol
Ref. Std.
No. Leads
A
A1
b
C
D
E1
E
e
L
ZD
α
Millimeters
Min
Max
Inches
Min
Max
(N)
32
—
1.20
—
0.047
0.05 0.15
0.002 0.006
0.30 0.52
0.012 0.020
0.12 0.21
0.005 0.008
20.82 21.08
0.820 0.830
10.03 10.29
0.391 0.400
11.56 11.96
0.451 0.466
1.27 BSC
0.050 BSC
0.40 0.60
0.016 0.024
0.95 REF
0.037 REF
0°
5°
0°
5°
L
α
A1
Plastic TSOP (T - Type II)
Millimeters
Inches
Min
Max
Min Max
44
—
1.20
—
0.047
0.05 0.15
0.002 0.006
0.30 0.45
0.012 0.018
0.12 0.21
0.005 0.008
18.31 18.52
0.721 0.729
10.03 10.29
0.395 0.405
11.56 11.96
0.455 0.471
0.80 BSC
0.032 BSC
0.41 0.60
0.016 0.024
0.81 REF
0.032 REF
0°
5°
0°
5°
Millimeters
Min
Max
C
Inches
Min
Max
50
—
1.20
0.05 0.15
0.30 0.45
0.12 0.21
20.82 21.08
10.03 10.29
11.56 11.96
0.80 BSC
0.40 0.60
0.88 REF
0°
5°
—
0.047
0.002 0.006
0.012 0.018
0.005 0.008
0.820 0.830
0.395 0.405
0.455 0.471
0.031 BSC
0.016 0.024
0.035 REF
0°
5°
Copyright © 2003 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time
without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to
obtain the latest version of this device specification before relying on any published information and before placing orders for products.
Integrated Silicon Solution, Inc. — www.issi.com — 1-800-379-4774
Rev. F
06/18/03
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