STMicroelectronics L6316 4-channel low power preamplifier Datasheet

L6316
4-CHANNEL LOW POWER PREAMPLIFIER
DATA BRIEF
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FEATURES
Dual Power Supplies of +5V, 10% and -3v, 6%
Low Power consumption; 980 mW @ 800Mb/s
(Single Head 100% Write mode duty cycle,
Random pattern, Iw = 40mA, Max Ovs).
Flip Chip package.L6316
Differential Voltage Bias / Voltage Sense
architecture. Current Bias available
Programmable read input differential
impedance.
Selectable read path bandwidth from 200 to
>600 MHz (Rmr=40Ω). (Parameter dependent
on interconnect)
Selectable LF corner (1, 2.5, 3.5 or 5.5 MHz with
RMR=40Ω).
Noise Figure of merit; 2.2 dB (Rmr=40Ω)
MR bias voltage programmable from 70 to 225
mV nom. (5 bits) (7.2mA max).
MR bias current programmable from 0.65 to
7.2 mA nom. (5 bits) (225mV max).
Read input stage optimized for MR resistance
from 20 to 70 Ohm.
Programmable read voltage gain of 37, 40, 43,
46 dB Rmr = 40Ω, Rload = 100Ω
Fully Differential write driver: Programmable
overshoot amplitude (3bits) and duration (2bits).
Write current rise/fall time with custom head and
interconnect model 140 pS at 40 mA (10% to
90%) (Steady state to steady state)
Write current amplitude programmable (5 bits) 0
to 62 mA (0-pk).
Bi-directional 16-bit serial interface 2.5V and
3.3V CMOS compatible.
2-pin (RXW and TFI), 2 bits mode selection
(WAKE, ENTFI).
All control signals are 2.5 & 3.3V CMOS
compatible.
Analog buffered head voltage ABHV (gain of 5)
Automatic digital MR resistance measurement
(7 bits).
Read head open detection, Read head shorted
detection.
Write head open or shorted to ground, Writer to
Reader short, write data frequency too low
detection.
SAFEDETECT method for write fault detection.
Figure 1. Package
Flip Chip
Table 1. Order Codes
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Part Number
Package
L6316
Flip Chip
Low VCC or VEE supply & die over temperature
detect, Analog Temperature Measurement.
Fast write-to-read recovery 150nS (max) (same
head).
Head-to-head switch in read mode 1.5us (nom).
Zero MR bias, very low power (43mW) idle mode
with fast recovery to read mode 1.5us (nom).
MR bias switching without overshoot for head
protection.
Read-to-Write switching 50nS (max) (same
head).
ESD diodes for MR head protection
DESCRIPTION
The L6316 is a BICMOS Silicon Germanium integrated circuit differential preamplifier. It is designed for use with four-terminal MR read and inductive write heads. In read mode, the device
consists of a fully differential amplifier, offering;
voltage or current bias, voltage-sense input, programmable input impedance, low noise and high
bandwidth. In write mode, it includes fast current
switching differential write drivers, which support
data rates up to 1200 Mb/s.
This preamplifier provides programmable read
voltage or current bias and write current (5 bit
DACs for the read bias and for the write current),
fault detection circuitry and servo track writing features. Read amplifier gain, low corner frequency,
and write current wave shape are adjustable. The
amplitude and duration of the overshoot are separately programmable through a 16-bit bi-directional serial interface (SEN, SDATA, and SCLK). The
device operates from +5V and -3V supplies.
September 2004
This is preliminary information on a new product now in development. Details are subject to change without notice.
Rev. 1
1/6
L6316
Figure 2. Preamplifier Block Diagram
VCC (+5V)
VGND (0V)
VEE (-3V)
HW0X
WDX
HW0Y
PREDRIVER
HW1X
WDY
WRITE
DRIVERS
FAULT PROCESSOR
HW1Y
HW2X
Low supply detection,
Open/short heads,
Low write frequency,
High temperature
FLT
HW2Y
HW3X
WRITE
DAC
SERIAL INTERFACE
CONTROL
SCLK
SEN
Overshoot
HW3Y
SDATA
RW enable
head select
3v
RXW
3v
HEAD SELECTION
&
MODE CONTROL
ABHV,
MR meas,
TEMP meas
READ
BIAS
DAC
Current/volt
age bias
Vmr, Iw
HR0X
TFI
HR0Y
Temperature
monitoring
MR
READ
INPUT
STAGES
RDX
RDY
HR1Y
HR2X
HR2Y
Gain boost
Low pass filter
High pass
filter
L6316
2/6
HR1X
VREF
HR3X
Rin DAC
HR3Y
L6316
Figure 3. Flip Chip Pinout Diagram - BUMPS DOWN
Note: Minimum pad pitch = 204 um and pad opening (octagonal) = 70 um
Bump Sequence (see next table for coordinates)
TF
VEE GND VCC
SDEN
HR3Y
HR3X
HW3Y
WDY
HW3X
WDX
HR2X
HW2X
SCLK
RDX
0,0
HW2Y
HR2Y
HW1Y
HR1Y
RDY
SDATA
HW1X
RXW
HW0X
FLT
HW0Y
VEE GND VREF VCC
HR1X
HR0Y
HR0X
Die dimensions:
X = 2192 ±20 um
Y = 2686 ±20 um
Minimum distance between pads opening center to center:
204um
Wafer thickness:
500 ±20 um
Bump height:
90
Bump diameter:
120 ±15 um
Die center misalignment w.r.t original die center after cut:
38 um
Bump material if eutectic:
63% Tin, 37% Lead
Bump material if lead free:
96% Tin, 3.5% Silver, 0.5% Copper
±15 um
Note: VREF PAD can be left floating or grounded. DO NOT CONNECT IT ANYWHERE ELSE.
3/6
L6316
Table 2. Bump Coordinates (bumps down, from center of die, dimensions in microns).
Pin name
X-coord (um)
Y-coord (um)
Pin name
X-coord (um)
Y-coord (um)
HR3Y
471
1140
VREF
-278
-1140
HR3X
775
1140
GND
-482
-1140
HW3Y
141.1
813.7
VEE
-686
-1140
HW3X
141.1
566.7
FLT
-890
-816
HW2X
141.1
362.7
RXW
-890
-612
HW2Y
141.1
115.7
SDATA
-890
-408
HR2Y
686
102
RDY
-890
-204
HR2X
890
252
RDX
-890
0
HR1X
890
-252
SCLK
-890
204
HR1Y
686
-102
WDX
-890
408
HW1Y
141.1
-115.7
WDY
-890
612
HW1X
141.1
-362.7
SDEN
-890
816
HW0X
141.1
-566.7
TFI
-686
1140
HW0Y
141.1
-813.7
VEE
-482
1140
HR0X
775
-1140
GND
-278
1140
HR0Y
471
-1140
VCC
-74
1140
VCC
-74
-1140
-
-
-
Note: VREF PAD can be left floating or grounded. DO NOT CONNECT IT ANYWHERE ELSE.
4/6
L6316
Table 3. Revision History
Date
Revision
September 2004
1
Description of Changes
First Issue in EDOCS dms.
5/6
L6316
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of use of such information nor for any infringement of patents or other rights of third parties which may result from its use. No license is granted
by implication or otherwise under any patent or patent rights of STMicroelectronics. Specifications mentioned in this publication are subject
to change without notice. This publication supersedes and replaces all information previously supplied. STMicroelectronics products are not
authorized for use as critical components in life support devices or systems without express written approval of STMicroelectronics.
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