Fairchild MM74HC00MX NL Quad 2-input nand gate Datasheet

Revised January 2005
MM74HC00
Quad 2-Input NAND Gate
General Description
Features
The MM74HC00 NAND gates utilize advanced silicon-gate
CMOS technology to achieve operating speeds similar to
LS-TTL gates with the low power consumption of standard
CMOS integrated circuits. All gates have buffered outputs.
All devices have high noise immunity and the ability to
drive 10 LS-TTL loads. The 74HC logic family is functionally as well as pin-out compatible with the standard 74LS
logic family. All inputs are protected from damage due to
static discharge by internal diode clamps to VCC and
ground.
■ Typical propagation delay: 8 ns
■ Wide power supply range: 2–6V
■ Low quiescent current: 20 µA maximum (74HC Series)
■ Low input current: 1 µA maximum
■ Fanout of 10 LS-TTL loads
Ordering Code:
Order Number
Package
Package Description
Number
MM74HC00M
M14A
MM74HC00MX_NL
M14A
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Pb-Free 14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
MM74HC00SJ
M14D
Pb-Free 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
MM74HC00MTC
MTC14
14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
MM74HC00MTCX_NL
MTC14
Pb-Free 14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm
Wide
MM74HC00N
N14A
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
MM74HC00N_NL
N14A
Pb-Free 14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Devices also available in Tape and Reel. Specify by appending the suffix letter “X” to the ordering code.
Pb-Free package per JEDEC J-STD-020B.
Connection Diagram
Logic Diagram
Pin Assignments for DIP, SOIC, SOP and TSSOP
Top View
© 2005 Fairchild Semiconductor Corporation
DS005292
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MM74HC00 Quad 2-Input NAND Gate
September 1983
MM74HC00
Absolute Maximum Ratings(Note 1)
Recommended Operating
Conditions
(Note 2)
−0.5 to +7.0V
Supply Voltage (VCC)
DC Input Voltage (VIN)
−1.5 to VCC+1.5V
DC Output Voltage (VOUT)
−0.5 to VCC+0.5V
Clamp Diode Current (IIK, IOK)
±20 mA
DC Output Current, per pin (IOUT)
±25 mA
DC VCC or GND Current, per pin (ICC)
±50 mA
Max
Units
2
6
V
DC Input or Output Voltage
0
VCC
V
−40
+85
°C
(VIN, VOUT)
Operating Temperature Range (TA)
Input Rise or Fall Times
−65°C to +150°C
Storage Temperature Range (TSTG)
Min
Supply Voltage (VCC)
(tr, tf) VCC = 2V
Power Dissipation (PD)
(Note 3)
600 mW
S.O. Package only
500 mW
Symbol
VIH
VIL
VOH
Parameter
Conditions
ns
VCC = 6.0V
400
ns
Note 2: Unless otherwise specified all voltages are referenced to ground.
260°C
DC Electrical Characteristics
ns
500
Note 1: Absolute Maximum Ratings are those values beyond which damage to the device may occur.
Lead Temperature (TL)
(Soldering 10 seconds)
1000
VCC = 4.5V
Note 3: Power Dissipation temperature derating — plastic “N” package: −
12 mW/°C from 65°C to 85°C.
(Note 4)
TA = 25°C
VCC
Typ
TA = −40 to 85°C TA = −55 to 125°C
Guaranteed Limits
Units
Minimum HIGH Level
2.0V
1.5
1.5
1.5
V
Input Voltage
4.5V
3.15
3.15
3.15
V
6.0V
4.2
4.2
4.2
V
Maximum LOW Level
2.0V
0.5
0.5
0.5
V
Input Voltage
4.5V
1.35
1.35
1.35
V
6.0V
1.8
1.8
1.8
V
Minimum HIGH Level
VIN = VIH or VIL
Output Voltage
|IOUT| ≤ 20 µA
2.0V
2.0
1.9
1.9
1.9
V
4.5V
4.5
4.4
4.4
4.4
V
6.0V
6.0
5.9
5.9
5.9
V
|IOUT| ≤ 4.0 mA
4.5V
4.2
3.98
3.84
3.7
V
|IOUT| ≤ 5.2 mA
6.0V
5.7
5.48
5.34
5.2
V
VIN = VIH or VIL
VOL
Maximum LOW Level
VIN = VIH
Output Voltage
|IOUT| ≤ 20 µA
2.0V
0
0.1
0.1
0.1
V
4.5V
0
0.1
0.1
0.1
V
6.0V
0
0.1
0.1
0.1
V
V
VIN = VIH
IIN
|IOUT| ≤ 4.0 mA
4.5V
0.2
0.26
0.33
0.4
|IOUT| ≤ 5.2 mA
6.0V
0.2
0.26
0.33
0.4
V
VIN = VCC or GND
6.0V
±0.1
±1.0
±1.0
µA
Maximum Quiescent
VIN = VCC or GND
6.0V
2.0
20
40
µA
Supply Current
IOUT = 0 µA
Maximum Input
Current
ICC
Note 4: For a power supply of 5V ±10% the worst case output voltages (VOH, and VOL) occur for HC at 4.5V. Thus the 4.5V values should be used when
designing with this supply. Worst case VIH and VIL occur at VCC = 5.5V and 4.5V respectively. (The VIH value at 5.5V is 3.85V.) The worst case leakage current (IIN, ICC, and IOZ) occur for CMOS at the higher voltage and so the 6.0V values should be used.
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2
VCC = 5V, TA = 25°C, CL = 15 pF, tr = tf = 6 ns
Symbol
tPHL, tPLH
Parameter
Conditions
Typ
Maximum Propagation
8
Guaranteed
Limit
Units
15
ns
Delay
AC Electrical Characteristics
VCC = 2.0V to 6.0V, CL = 50 pF, tr = tf = 6 ns (unless otherwise specified)
Symbol
Parameter
Conditions
tPHL, tPLH Maximum Propagation
Delay
tTLH, tTHL Maximum Output Rise
and Fall Time
VCC
Power Dissipation
TA = −40 to 85°C TA = −55 to 125°C
Guaranteed Limits
Units
2.0V
45
90
113
134
4.5V
9
18
23
27
ns
6.0V
8
15
19
23
ns
2.0V
30
75
95
110
ns
4.5V
8
15
19
22
ns
7
13
16
19
6.0V
CPD
TA = 25°C
Typ
(per gate)
20
ns
ns
pF
Capacitance (Note 5)
CIN
Maximum Input
5
10
10
10
pF
Capacitance
Note 5: CPD determines the no load dynamic power consumption, PD = CPD VCC2 f + ICC VCC, and the no load dynamic current consumption,
IS = CPD VCC f + ICC.
3
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MM74HC00
AC Electrical Characteristics
MM74HC00
Physical Dimensions inches (millimeters) unless otherwise noted
14-Lead Small Outline Integrated Circuit (SOIC), JEDEC MS-012, 0.150" Narrow
Package Number M14A
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MM74HC00
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
Pb-Free 14-Lead Small Outline Package (SOP), EIAJ TYPE II, 5.3mm Wide
Package Number M14D
5
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MM74HC00
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Thin Shrink Small Outline Package (TSSOP), JEDEC MO-153, 4.4mm Wide
Package Number MTC14
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6
MM74HC00 Quad 2-Input NAND Gate
Physical Dimensions inches (millimeters) unless otherwise noted (Continued)
14-Lead Plastic Dual-In-Line Package (PDIP), JEDEC MS-001, 0.300" Wide
Package Number N14A
Fairchild does not assume any responsibility for use of any circuitry described, no circuit patent licenses are implied and
Fairchild reserves the right at any time without notice to change said circuitry and specifications.
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FAIRCHILD’S PRODUCTS ARE NOT AUTHORIZED FOR USE AS CRITICAL COMPONENTS IN LIFE SUPPORT
DEVICES OR SYSTEMS WITHOUT THE EXPRESS WRITTEN APPROVAL OF THE PRESIDENT OF FAIRCHILD
SEMICONDUCTOR CORPORATION. As used herein:
2. A critical component in any component of a life support
device or system whose failure to perform can be reasonably expected to cause the failure of the life support
device or system, or to affect its safety or effectiveness.
1. Life support devices or systems are devices or systems
which, (a) are intended for surgical implant into the
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to perform when properly used in accordance with
instructions for use provided in the labeling, can be reasonably expected to result in a significant injury to the
user.
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