OPTEK OP294 Gaalas plastic infrared emitting diode Datasheet

Product Bulletin OP294
June 1996
GaAlAs Plastic Infrared Emitting Diode
Types OP294, OP299
Features
Absolute Maximum Ratings (TA = 25o C unless otherwise noted)
• Characterized at 5mA for battery
Reverse Voltage . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5.0 V
Continuous Forward Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 100 mA
Peak Forward Current . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 750 mA
Storage and Operating Temperature Range . . . . . . . . . . . . . . . . . . -40o C to +100o C
Lead Soldering Temperature [1/16 inch (1.6 mm) from case for 5 sec. with soldering
iron] . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 260o C(1)
Power Dissipation . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 180 mW(2)
operated systems or other low drive
current systems
• Wide irradiance pattern (OP294) or
narrow irradiance pattern (OP299)
• Significantly higher power output than
GaAs at equivalent drive currents
• Wavelength matched to silicon’s peak
response
• T-1 3/4 package
Description
The OP294 and OP299 are gallium
arsenide infrared emitting diodes
designed for low current or power limited
applications (such as battery supplies).
These LEDs are similar in design to the
OP290 and OP295 but use a smaller
chip which increases output
efficiency at low current levels by
increasing current density. Light output
can be maximized with continuous (d.c.)
forward current up to 100mA or with
pulsed forward current operation up to
750 mA. The chip is mounted in an IR
transmissive plastic package and has
been designed and tested for use with
OP593/598 phototransistors or similar
photodetector.
Optek Technology, Inc.
Notes:
(1) RMA flux is recommended. Duration can be extended to 10 sec. max. when flow soldering.
A max. of 20 grams force may be applied to the leads when soldering.
(2) Derate linearly 1.80 mW/o C above 25o C.
(3) Ee(APT) is a measurement of the average apertured radiant energy incident upon a sensing
area 0.250" (6.35 mm) in diameter, perpendicular to and centered on the mechanical axis of
the lens, and 1.429" (36.3 mm) from the measurement surface. Ee(APT) is not necessarily
uniform within the measured area.
(4) Ee(APT) is a measurement of the average apertured radiant energy incident upon a sensing
area 0.250" (6.35 mm) in diameter, perpendicular to and centered on the mechanical axis of
the lens, and .500" (12.7 mm) from the measurement surface. Ee(APT) is not necessarily
uniform within the measured area.
(5) Cathode lead is 0.070" nominal shorter than anode lead.
1215 W. Crosby Road
Carrollton, Texas 75006
2-56
(972) 323-2200
Fax (972) 323-2396
Types OP294, OP299
Electrical Characteristics (TA = 25o C unless otherwise noted)
SYMBOL
Ee(APT)
PARAMETER
Apertured Radiant Incidence
MIN TYP MAX UNITS
OP294
OP299
TEST CONDITIONS
1.50 mW/cm IF = 5 mA(4)
0.45 mW/cm2 IF = 5 mA(3)
2
0.50
0.15
VF
Forward Voltage
1.50
V
IF = 5 mA
IR
Reverse Current
10
µA
VR = 2 V
λp
Wavelength at Peak Emission
890
nm
IF = 10 mA
B
Spectral Bandwidth Between Half Power Points
80
nm
IF = 10 mA
∆λp/∆T
θHP
Spectral Shift with Temperature
Emission Angle at Half Power Points
+0.18
OP294
OP299
o
nm/ C IF = Constant
50
20
Deg.
Deg.
tr
Output Rise Time
500
ns
tf
Output Fall Time
250
ns
IF = 10 mA
IF = 10 mA
IF(PK) = 100 mA,
PW = 10 µs, D.C. = 10%
Optek reserves the right to make changes at any time in order to improve design and to supply the best product possible.
Optek Technology, Inc.
1215 W. Crosby Road
Carrollton, Texas 75006
(972)323-2200
Fax (972)323-2396
2-57
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