IDT QS532807SO

QS532807
3.3V GUARANTEED LOW SKEW CMOS CLOCK DRIVER/BUFFER
INDUSTRIAL TEMPERATURE RANGE
QS532807
GUARANTEED LOW SKEW
CMOS CLOCK
DRIVER/BUFFER
FEATURES:
DESCRIPTION:
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The QS532807 clock driver/buffer circuit can be used for clock
buffering schemes where low skew is a key parameter. The QS532807
offers ten non-inverting outputs. Designed in IDT's proprietary QCMOS
process, these devices provide low propagation delay buffering with onchip skew of 0.35ns for same-transition, same bank signals. The
QS532807 has on-chip series termination resistors for lower noise clock
signals. The QS532807 series resistor version is recommended for
driving unterminated lines with capacitive loading and other noise
sensitive clock distribution circuits. These clock buffer products are
designed for use in high-performance workstations, embedded and
personal computing systems. Several devices can be used in parallel
or scattered throughout a system for guaranteed low skew, system-wide
clock distribution networks.
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JEDEC compatible LVTTL level
10 low skew clock outputs
Clock input is 5V tolerant
Pinout and function compatible with QS5807
25Ω on-chip resistors available for low noise
Input hysteresis for better noise margin
Guaranteed low skew:
• 0.35ns output skew (same bank)
• 0.6ns output skew (different bank)
• 0.75ns part-to-part skew
Available in QSOP and SOIC packages
FUNCTIONAL BLOCK DIAGRAM
O1
O2
O3
O4
O5
IN
O6
O7
O8
O9
O 10
INDUSTRIAL TEMPERATURE RANGE
SEPTEMBER 2000
1
c
1999
Integrated Device Technology, Inc.
DSC - 5848
QS532807
3.3V GUARANTEED LOW SKEW CMOS CLOCK DRIVER/BUFFER
INDUSTRIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS
PIN CONFIGURATION
Symbol
VTERM(2)
(1)
Description
Supply Voltage to Ground
Max.
– 0.5 to +4.6
Unit
V
DC Output Voltage VOUT
– 0.5 to VCC+0.5
V
IN
1
20
VCC
G ND
2
19
O 10
VTERM(3)
DC Input Voltage VIN
– 0.5 to +7
V
O1
3
18
O9
VAC
AC Input Voltage (pulse width ≤20ns)
-3
V
V CC
4
17
G ND
IOUT
DC Output Current VIN < 0
-20
mA
O2
5
O8
G ND
6
SO 20-2 16
SO 20-8 15
O3
7
14
O7
V CC
8
13
G ND
O4
9
12
O6
G ND
10
11
O5
DC Output Current Max. Sink Current/Pin
VCC
120
mA
TSTG
Storage Temperature
– 65 to +150
°C
TJ
Junction Temperature
150
°C
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a
stress rating only and functional operation of the device at these or
any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum
rating conditions for extended periods may affect reliability.
2. Vcc Terminals.
3. All terminals except Vcc.
QSOP/ SOIC
TOP VIEW
CAPACITANCE
(TA = +25OC, f = 1.0MHz, VIN = 0V)
QSOP
Pins
CIN
SOIC
Max. (1)
Typ.
3
6
Max. (1)
7
Typ.
5
NOTE:
1. This parameter is guaranteed but not production tested.
PIN DESCRIPTION
2
Pin Names
IN
I/O
I
Clock Input
Description
Ox
O
Clock Outputs
Unit
pF
QS532807
3.3V GUARANTEED LOW SKEW CMOS CLOCK DRIVER/BUFFER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = -40°C to +85°C, VCC = 3.3V ± 0.3V
Symbol
VIH
Parameter
Input HIGH Voltage
VIL
VIC
VOH
Typ.(1)
1.7
Test Conditions
Guaranteed Logic HIGH for All Inputs
Min.
2
Max.
5.5
Input LOW Voltage
Guaranteed Logic LOW for All Inputs
–0.5
—
0.8
V
Clamp Diode Voltage (3)
Vcc = Min., IIN = -18mA
—
–0.7
–1.2
V
Output HIGH Voltage
Vcc = Min., IOH = -100µA
Vcc - 0.2
—
—
V
Vcc = Min., IOH = -8mA
2.4
—
—
Vcc = Min., IOL = 100µA
—
—
0.2
Vcc = Min., IOL = 6mA
—
—
0.4
Unit
V
VOL
Output LOW Voltage
Vcc = Min., IOL = 8mA
—
—
0.5
IIN
Input Leakage Current
Vcc = Max., VIN = VCC or GND
—
—
±1
µA
IOFF
Input Power Off Leakage
Vcc = 0V, VIN = VCC or GND
—
—
±1
µA
–60
–50
–195
–80
—
mA
IOS
Short Circuit Current
(2,3)
Vcc = Max., VOUT = GND
V
IODH
Output HIGH Current
Vcc = 3.3V,
–200
mA
IODL
Output LOW Current
Vcc = 3.3V, VIN = VIH or VIL, VO = 1.5V
50
112
200
mA
∆VT
Input Hysteresis
VTLH - VTHL for All Inputs
—
0.2
—
V
Vcc = Min., IOL = 12mA
—
28
—
Ω
ROUT
Output
Resistance (4)
VIN
= VIH
or VIL,
VO
= 1.5V
NOTES:
1. Typical values are at VCC = 3.3V, TA = 25°C.
2. Not more than one output should be used to test this high power condition. Duration is less than one second.
3. Guaranteed by design but not tested.
4. Output resistance represents the total output impedance of the logic device and includes added series termination resistance.
POWER SUPPLY CHARACTERISTICS
Symbol
ICC
Parameter
Quiescent Power Supply Current
Test Conditions
VCC = Max., VIN = GND or Vcc
∆ICC
Supply Current per Input HIGH
ICCD
Dynamic Power Supply Current per Output (1)
VCC = Max., VIN = 3V
Input toggling at 50% duty cycle
VCC = Max., outputs Enabled
IC
Total Power Supply Current Examples
(1,3)
VCC = Max.,
Input at 50% duty cycle
fI = 10MHz
VCC = Max.,
Input at 50% duty cycle
fI = 2.5MHz
NOTES:
1. Guaranteed by design but not tested. CL = 0pF.
2. Typical values are for reference only. Conditions are VCC = 3.3V, TA = 25°C.
3. IC = ICC + (∆ICC)(DH)(NT) + ICCD (fO)(NO)
where:
DH = Input Duty Cycle
NT = Number of TTL HIGH inputs at DH (one)
fO = Output Frequency
NO = Number of outputs at fO (ten)
3
Typ. (2)
0.01
Max.
100
Unit
µA
0.1
30
µA
60
90
µA/MHz
VIN = GND or Vcc
6
10
mA
VIN = GND or Vcc
1.5
3
QS532807
3.3V GUARANTEED LOW SKEW CMOS CLOCK DRIVER/BUFFER
INDUSTRIAL TEMPERATURE RANGE
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
TA = -40°C to +85°C, VCC = 3.3V ± 0.3V
CLOAD = 50pF (no resistor)
Symbol
tSK(01)
Parameter (1)
Skew between all outputs, same transition
Min.
Max.
Unit
—
ns
tSK(P)
Pulse Skew; skew between opposite transitions of the same output (tPHL - tPLH)
—
0.5
0.5
tSK(T)
tPLH
tPHL
tR
tF
Part-to-part skew (2)
—
1
ns
1.5
5.2
ns
—
—
2
2
ns
Propagation Delay (3)
IN to Ox
Output Rise Time, 0.8V to 2V
Output Fall Time, 2V to 0.8V
ns
ns
NOTES:
1. Skew parameters are guaranteed across temperature range, but not tested.
2. tSK(T) only applies to devices of the same transition, part type, temperature, power supply voltage, loading, and package.
3. The propagation delay range indicated by Min. and Max. specifications results from process and environmental variables. These propagation delays
do not imply limit skew.
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QS532807
3.3V GUARANTEED LOW SKEW CMOS CLOCK DRIVER/BUFFER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
V CC
V IN
V O UT
Pulse
Generator
DU T
50pF
50 Ω
Pulse generator for all puls es: f ≤ 1.0M Hz; t F ≤ 2.5ns; tR ≤ 2.5ns
PULSE SKEW — tSK(P)
PROPAGATION DELAY
3V
3V
1.5V
INPUT
INPU T
1.5V
0V
tP LH
0V
t PH L
tP H L
t P LH
VOH
VOH
OUTPUT
2V
OUTPUT
1.5V
1.5V
0.8V
VOL
tR
VOL
tSK(p) = t PHL - t PLHL
tF
OUTPUT SKEW — tSK(O1)
PART-TO-PART SKEW — tSK(T)
3V
3V
1.5V
INPUT
1.5V
INPU T
0V
tP HL1
tP LH 1
0V
t P HL1
tP LH 1
VOH
VOH
PART 1 O UTPUT
1.5V
1.5V
OUTPUT 1
VOL
VOL
tSK (01)
tSK(t)
tSK(t)
VOH
t SK(0 1)
VOH
OUTPUT 2
PART 2 O UTPUT
1.5V
1.5V
VOL
tP LH 2
VOL
tP LH 2
tP HL2
tP HL2
t SK(01) = t PLH2 - t PLH1 or t PHL 2 - t PHL1
t SK(t) = t PLH2 - t PLH1 or t PHL 2 - t PHL1
5
QS532807
3.3V GUARANTEED LOW SKEW CMOS CLOCK DRIVER/BUFFER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
QS
XXXX
Device Type
X
Package
SO
Q
Small Outline IC (300 mil) (SO20-2)
Quarter-size Small Outline Package (SO20-8)
532807
Guaranteed Low Skew CMOS Clock Driver/Buffer
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