TC74VCX00FT/FK TOSHIBA CMOS Digital Integrated Circuit Silicon Monolithic TC74VCX00FT,TC74VCX00FK Low-Voltage Quad 2-Input NAND Gate with 3.6-V Tolerant Inputs and Outputs The TC74VCX00FT/FK is a high-performance CMOS 2-input NAND gate which is guaranteed to operate from 1.2-V to 3.6-V. Designed for use in 1.5V, 1.8V, 2.5V or 3.3V systems, it achieves high-speed operation while maintaining the CMOS low power dissipation. It is also designed with overvoltage tolerant inputs and outputs up to 3.6 V. All inputs are equipped with protection circuits against static discharge. TC74VCX00FT TC74VCX00FK Features (Note) • Low-voltage operation: VCC = 1.2~3.6 V • High-speed operation : tpd = 2.8 ns (max) (VCC = 3.0~3.6 V) : tpd = 3.7 ns (max) (VCC = 2.3~2.7 V) : tpd = 7.4 ns (max) (VCC = 1.65~1.95 V) : tpd = 14.8 ns (max) (VCC = 1.4~1.6 V) : tpd = 37.0 ns (max) (VCC = 1.2 V) • Output current: IOH/IOL = ±24 mA (min) (VCC = 3.0 V) : IOH/IOL = ±18 mA (min) (VCC = 2.3 V) : IOH/IOL = ±6 mA (min) (VCC = 1.65 V) Weight TSSOP14-P-0044-0.65A VSSOP14-P-0030-0.50 : 0.06 g (typ.) : 0.02 g (typ.) : IOH/IOL = ±2 mA (min) (VCC = 1.4 V) • Latch-up performance: −300 mA • ESD performance: Machine model ≥ ±200 V Human body model ≥ ±2000 V • Package: TSSOP and VSSOP (US) • Power-down protection provided on all inputs and outputs Note: Electrical Characteristics of Vcc=1.5±0.1V and 1.2V apply only to products whose Lot Code is over "3 12" . 1 2007-10-19 TC74VCX00FT/FK Pin Assignment (top view) IEC Logic Symbol 1A 1 14 VCC 1B 2 13 4B 1Y 3 12 4A 2A 4 11 1A 1B 2A 2B 3A 3B 4Y 2B 5 10 3B 2Y 6 9 3A GND 7 8 3Y 4A 4B 1 & 2 4 3 6 5 9 8 10 12 11 13 1Y 2Y 3Y 4Y Truth Table Inputs Outputs A B Y L L H L H H H L H H H L Absolute Maximum Ratings (Note 1) Characteristics Symbol Rating Unit Power supply voltage VCC −0.5~4.6 V DC input voltage VIN −0.5~4.6 V −0.5~4.6 (Note 2) DC output voltage VOUT Input diode current IIK −50 Output diode current IOK ±50 DC output current IOUT ±50 mA Power dissipation PD 180 mW ICC/IGND ±100 mA Tstg −65~150 °C DC VCC/ground current Storage temperature −0.5~VCC + 0.5 (Note 3) V mA (Note 4) mA Note 1: Exceeding any of the absolute maximum ratings, even briefly, lead to deterioration in IC performance or even destruction. Using continuously under heavy loads (e.g. the application of high temperature/current/voltage and the significant change in temperature, etc.) may cause this product to decrease in the reliability significantly even if the operating conditions (i.e. operating temperature/current/voltage, etc.) are within the absolute maximum ratings and the operating ranges. Please design the appropriate reliability upon reviewing the Toshiba Semiconductor Reliability Handbook (“Handling Precautions”/“Derating Concept and Methods”) and individual reliability data (i.e. reliability test report and estimated failure rate, etc). Note 2: VCC = 0 V Note 3: High or low state. IOUT absolute maximum rating must be observed. Note 4: VOUT < GND, VOUT > VCC 2 2007-10-19 TC74VCX00FT/FK Operating Ranges (Note 1) Characteristics Symbol Rating Unit Power supply voltage VCC 1.2~3.6 V Input voltage VIN −0.3~3.6 V Output voltage VOUT Output current 0~3.6 (Note 2) 0~VCC (Note 3) ±24 (Note 4) ±18 (Note 5) ±6 (Note 6) ±2 (Note 7) IOH/IOL Operating temperature Topr −40~85 Input rise and fall time dt/dv 0~10 V mA °C (Note 8) ns/V Note 1: The operating ranges must be maintained to ensure the normal operation of the device. Unused inputs must be tied to either VCC or GND. Note 2: VCC = 0 V Note 3: High or low state Note 4: VCC = 3.0~3.6 V Note 5: VCC = 2.3~2.7 V Note 6: VCC = 1.65~1.95 V Note 7: VCC = 1.4~1.6 V Note 8: VIN = 0.8~2.0 V, VCC = 3.0 V Electrical Characteristics DC Characteristics (Ta = −40 to 85°C, 2.7 V < VCC =< 3.6 V) Characteristics Input voltage Min Max 2.7~3.6 2.0 ⎯ 2.7~3.6 ⎯ 0.8 IOH = −100 μA 2.7~3.6 VCC − 0.2 ⎯ IOH = −12 mA 2.7 2.2 ⎯ IOH = −18 mA 3.0 2.4 ⎯ IOH = −24 mA 3.0 2.2 ⎯ IOL = 100 μA 2.7~3.6 ⎯ 0.2 IOL = 12 mA 2.7 ⎯ 0.4 IOL = 18 mA 3.0 ⎯ 0.4 IOL = 24 mA 3.0 ⎯ 0.55 2.7~3.6 ⎯ ±5.0 μA 0 ⎯ 10.0 μA VIN = VCC or GND 2.7~3.6 ⎯ 20.0 VCC < = VIN < = 3.6 V 2.7~3.6 ⎯ ±20.0 VIH = VCC − 0.6 V 2.7~3.6 ⎯ 750 Symbol Test Condition H-level VIH ⎯ L-level VIL ⎯ H-level VOH VIN = VIH or VIL Output voltage L-level Input leakage current VOL IIN Power-off leakage current IOFF Quiescent supply current ICC Increase in ICC per input ΔICC VIN = VIH VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V 3 VCC (V) Unit V V μA 2007-10-19 TC74VCX00FT/FK DC Characteristics (Ta = −40 to 85°C, 2.3 V =< VCC =< 2.7 V) Characteristics Input voltage Min Max 2.3~2.7 1.6 ⎯ 2.3~2.7 ⎯ 0.7 2.3~2.7 VCC − 0.2 ⎯ IOH = −6 mA 2.3 2.0 ⎯ IOH = −12 mA 2.3 1.8 ⎯ IOH = −18 mA 2.3 1.7 ⎯ IOL = 100 μA 2.3~2.7 ⎯ 0.2 IOL = 12 mA 2.3 ⎯ 0.4 IOL = 18 mA 2.3 ⎯ 0.6 2.3~2.7 ⎯ ±5.0 μA 0 ⎯ 10.0 μA VIN = VCC or GND 2.3~2.7 ⎯ 20.0 VCC < = VIN < = 3.6 V 2.3~2.7 ⎯ ±20.0 Min Max Symbol Test Condition H-level VIH ⎯ L-level VIL ⎯ IOH = −100 μA H-level VOH VIN = VIH or VIL Output voltage L-level Input leakage current VOL IIN Power-off leakage current IOFF Quiescent supply current ICC VIN = VIH VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V VCC (V) Unit V V μA DC Characteristics (Ta = −40 to 85°C, 1.65 V =< VCC < 2.3 V) Characteristics Unit Symbol Test Condition H-level VIH ⎯ 1.65~2.3 0.65 × VCC ⎯ L-level VIL ⎯ 1.65~2.3 ⎯ 0.2 × VCC H-level VOH IOH = −100 μA 1.65 VCC − 0.2 ⎯ IOH = −6 mA 1.65 1.25 ⎯ IOL = 100 μA 1.65 ⎯ 0.2 IOL = 6 mA 1.65 ⎯ 0.3 1.65~2.3 ⎯ ±5.0 μA 0 ⎯ 10.0 μA VIN = VCC or GND 1.65~2.3 ⎯ 20.0 VCC < = VIN < = 3.6 V 1.65~2.3 ⎯ ±20.0 VCC (V) Input voltage VIN = VIH or VIL Output voltage L-level Input leakage current VOL IIN Power-off leakage current IOFF Quiescent supply current ICC VIN = VIH VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V 4 V V μA 2007-10-19 TC74VCX00FT/FK DC Characteristics (Ta = −40 to 85°C, 1.4 V =< VCC < 1.65 V) Characteristics Min Max 1.4~1.65 0.65 × VCC ⎯ 1.4~1.65 ⎯ 0.05 × VCC 1.4~1.65 VCC − 0.2 ⎯ IOH = −2 mA 1.4 1.05 ⎯ IOL = 100 μA 1.4~1.65 ⎯ 0.05 1.4 ⎯ 0.35 1.4~1.65 ⎯ ±5.0 μA 0 ⎯ 10.0 μA VIN = VCC or GND 1.4~1.65 ⎯ 20.0 VCC < = VIN < = 3.6 V 1.4~1.65 ⎯ ±20.0 Min Max 0.8 × VCC ⎯ 1.2~1.4 ⎯ 0.05 × VCC Symbol Test Condition H-level VIH ⎯ L-level VIL ⎯ H-level VOH VCC (V) Input voltage IOH = −100 μA VIN = VIH or VIL Output voltage L-level Input leakage current VOL IIN Power-off leakage current IOFF Quiescent supply current ICC VIN = VIH IOL = 2 mA VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V Unit V V μA DC Characteristics (Ta = −40 to 85°C, 1.2 V =< VCC < 1.4 V) Characteristics H-level Symbol Test Condition VIH ⎯ VCC (V) 1.2~1.4 Input voltage Output voltage ⎯ Unit V L-level VIL H-level VOH VIN = VIH or VIL IOH = −100 μA 1.2 VCC − 0.1 ⎯ L-level VOL VIN = VIH IOL = 100 μA 1.2 ⎯ 0.05 1.2 ⎯ ±5.0 μA 0 ⎯ 10.0 μA VIN = VCC or GND 1.2 ⎯ 20.0 VCC < = VIN < = 3.6 V 1.2 ⎯ ±20.0 Input leakage current IIN Power-off leakage current IOFF Quiescent supply current ICC VIN = 0 to 3.6 V VIN, VOUT = 0 to 3.6 V 5 V μA 2007-10-19 TC74VCX00FT/FK AC Characteristics (Ta = −40 to 85°C, input: tr = tf = 2.0 ns) (Note 1) Characteristics Symbol Test Condition CL = 15 pF, RL = 2 kΩ Propagation delay time tpLH tpHL Figure 1, Figure 2 CL = 30 pF, RL = 500 Ω CL = 15 pF, RL = 2 kΩ Output to output skew tosLH (Note 2) tosHL Min Max 1.2 1.5 37.0 1.5 ± 0.1 1.0 14.8 1.8 ± 0.15 1.5 7.4 2.5 ± 0.2 0.8 3.7 3.3 ± 0.3 0.6 2.8 1.2 ⎯ 1.5 1.5 ± 0.1 ⎯ 1.5 1.8 ± 0.15 ⎯ 0.5 2.5 ± 0.2 ⎯ 0.5 3.3 ± 0.3 ⎯ 0.5 VCC (V) CL = 30 pF, RL = 500 Ω Unit ns ns Note 1: For CL = 50 pF, add approximately 300 ps to the AC maximum specification. Note 2: Parameter guaranteed by design. (tosLH = |tpLHm − tpLHn|, tosHL = |tpHLm − tpHLn|) Dynamic Switching Characteristics (Ta = 25°C, input: tr = tf = 2.0 ns, CL = 30 pF) Characteristics Quiet output maximum dynamic VOL Quiet output minimum dynamic VOL Quiet output minimum dynamic VOH Note: Symbol VOLP VOLV VOHV Test Condition VCC (V) Typ. VIH = 1.8 V, VIL = 0 V (Note) 1.8 0.25 VIH = 2.5 V, VIL = 0 V (Note) 2.5 0.6 VIH = 3.3 V, VIL = 0 V (Note) 3.3 0.8 VIH = 1.8 V, VIL = 0 V (Note) 1.8 −0.25 VIH = 2.5 V, VIL = 0 V (Note) 2.5 −0.6 VIH = 3.3 V, VIL = 0 V (Note) 3.3 −0.8 VIH = 1.8 V, VIL = 0 V (Note) 1.8 1.5 VIH = 2.5 V, VIL = 0 (Note) 2.5 1.9 VIH = 3.3 V, VIL = 0 V (Note) 3.3 2.2 Unit V V V Parameter guaranteed by design. Capacitive Characteristics (Ta = 25°C) Characteristics Symbol Test Condition Input capacitance CIN ⎯ Power dissipation capacitance CPD Note: fIN = 10 MHz Typ. Unit 1.8, 2.5, 3.3 6 pF 1.8, 2.5, 3.3 20 pF VCC (V) (Note) CPD is defined as the value of the internal equivalent capacitance which is calculated from the operating current consumption without load. Average operating current can be obtained by the equation: ICC (opr) = CPD・VCC・fIN + ICC/4 (per gate) 6 2007-10-19 TC74VCX00FT/FK AC Test Circuit Output RL CL Measure VCC Symbol 3.3 ± 0.3 V 2.5 ± 0.2 V 1.8 ± 0.15 V 1.5 ± 0.1 V 1.2V RL 500 Ω 2 kΩ CL 30 pF 15 pF Figure 1 AC Waveform tf 2.0 ns tr 2.0 ns Input (A) 10% VOH Output (Y) VM VOL tpHL tpLH Symbol VIH 90% VM VCC 3.3 ± 0.3 V 2.5 ± 0.2 V 1.8 ± 0.15 V 1.5 ± 0.1 V 1.2 V VIH 2.7 V VCC VCC VCC VCC VM 1.5 V VCC/2 VCC/2 VCC/2 VCC/2 Figure 2 tpLH, tpHL 7 2007-10-19 TC74VCX00FT/FK Package Dimensions Weight: 0.06 g (typ.) 8 2007-10-19 TC74VCX00FT/FK Package Dimensions Weight: 0.02 g (typ.) 9 2007-10-19 TC74VCX00FT/FK RESTRICTIONS ON PRODUCT USE 20070701-EN GENERAL • The information contained herein is subject to change without notice. • TOSHIBA is continually working to improve the quality and reliability of its products. Nevertheless, semiconductor devices in general can malfunction or fail due to their inherent electrical sensitivity and vulnerability to physical stress. It is the responsibility of the buyer, when utilizing TOSHIBA products, to comply with the standards of safety in making a safe design for the entire system, and to avoid situations in which a malfunction or failure of such TOSHIBA products could cause loss of human life, bodily injury or damage to property. In developing your designs, please ensure that TOSHIBA products are used within specified operating ranges as set forth in the most recent TOSHIBA products specifications. Also, please keep in mind the precautions and conditions set forth in the “Handling Guide for Semiconductor Devices,” or “TOSHIBA Semiconductor Reliability Handbook” etc. • The TOSHIBA products listed in this document are intended for usage in general electronics applications (computer, personal equipment, office equipment, measuring equipment, industrial robotics, domestic appliances, etc.).These TOSHIBA products are neither intended nor warranted for usage in equipment that requires extraordinarily high quality and/or reliability or a malfunction or failure of which may cause loss of human life or bodily injury (“Unintended Usage”). Unintended Usage include atomic energy control instruments, airplane or spaceship instruments, transportation instruments, traffic signal instruments, combustion control instruments, medical instruments, all types of safety devices, etc.. Unintended Usage of TOSHIBA products listed in his document shall be made at the customer’s own risk. • The products described in this document shall not be used or embedded to any downstream products of which manufacture, use and/or sale are prohibited under any applicable laws and regulations. • The information contained herein is presented only as a guide for the applications of our products. No responsibility is assumed by TOSHIBA for any infringements of patents or other rights of the third parties which may result from its use. No license is granted by implication or otherwise under any patents or other rights of TOSHIBA or the third parties. • Please contact your sales representative for product-by-product details in this document regarding RoHS compatibility. Please use these products in this document in compliance with all applicable laws and regulations that regulate the inclusion or use of controlled substances. Toshiba assumes no liability for damage or losses occurring as a result of noncompliance with applicable laws and regulations. 10 2007-10-19