PD - 97687A AUTOMOTIVE GRADE AUIRFR3504 Features l l l l l l l l HEXFET® Power MOSFET Advanced Planar Technology Low On-Resistance 175°C Operating Temperature Fast Switching Fully Avalanche Rated Repetitive Avalanche Allowed up to Tjmax Lead-Free, RoHS Compliant Automotive Qualified* V(BR)DSS D G S 40V RDS(on) typ. max ID (Silicon Limited) 7.8mΩ 9.2mΩ 87A ID (Package Limited) 56A j D Description Specifically designed for Automotive applications, this Stripe Planar design of HEXFET® Power MOSFETs utilizes the latest processing techniques to achieve low on-resistance per silicon area. This benefit combined with the fast switching speed and ruggedized device design that HEXFET power MOSFETs are well known for, provides the designer with an extremely efficient and reliable device for use in Automotive and a wide variety of other applications. S G D-Pak AUIRFR3504 G D S Gate Drain Source Absolute Maximum Ratings Stresses beyond those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. These are stress ratings only; and functional operation of the device at these or any other condition beyond those indicated in the specifications is not implied. Exposure to absolute-maximum-rated conditions for extended periods may affect device reliability. The thermal resistance and power dissipation ratings are measured under board mounted and still air conditions. Ambient temperature (T A) is 25°C, unless otherwise specified. Max. Parameter Units j 61j ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Silicon Limited) 87 ID @ TC = 100°C Continuous Drain Current, VGS @ 10V (Silicon Limited) ID @ TC = 25°C Continuous Drain Current, VGS @ 10V (Package Limited) A 56 c 350 PD @TC = 25°C Power Dissipation Linear Derating Factor Gate-to-Source Voltage VGS 140 0.92 ± 20 W W/°C V mJ IDM Pulsed Drain Current d EAS Single Pulse Avalanche Energy (Thermally Limited) 240 EAS (tested ) Single Pulse Avalanche Energy Tested Value 480 IAR Avalanche Current EAR Repetitive Avalanche Energy TJ Operating Junction and TSTG Storage Temperature Range Soldering Temperature, for 10 seconds (1.6mm from case ) c i See Fig. 12a, 12b, 15, 16 c A mJ -55 to + 175 °C 300 Thermal Resistance Typ. Max. ––– 1.09 Junction-to-Ambient (PCB Mount) ––– 50 Junction-to-Ambient ––– 110 RθJC Junction-to-Case RθJA RθJA l Parameter k Units °C/W HEXFET® is a registered trademark of International Rectifier. *Qualification standards can be found at http://www.irf.com/ www.irf.com 1 08/30/11 AUIRFR3504 Static Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter V(BR)DSS ΔV(BR)DSS/ΔTJ RDS(on) VGS(th) gfs IDSS IGSS Min. Typ. Max. Units Drain-to-Source Breakdown Voltage Breakdown Voltage Temp. Coefficient Static Drain-to-Source On-Resistance Gate Threshold Voltage Forward Transconductance Drain-to-Source Leakage Current Gate-to-Source Forward Leakage Gate-to-Source Reverse Leakage 40 ––– ––– 2.0 40 ––– ––– ––– ––– ––– 0.041 7.8 ––– ––– ––– ––– ––– ––– ––– ––– 9.2 4.0 ––– 20 250 200 -200 Conditions V VGS = 0V, ID = 250μA V/°C Reference to 25°C, ID = 1mA mΩ VGS = 10V, ID = 30A ** V VDS = VGS, ID = 250μA S VDS = 10V, ID = 30A ** μA VDS = 40V, VGS = 0V VDS = 40V, VGS = 0V, TJ = 125°C nA VGS = 20V VGS = -20V f f Dynamic Electrical Characteristics @ TJ = 25°C (unless otherwise specified) Parameter Min. Typ. Max. Units Conditions Qg Qgs Qgd td(on) tr td(off) tf LD Total Gate Charge Gate-to-Source Charge Gate-to-Drain ("Miller") Charge Turn-On Delay Time Rise Time Turn-Off Delay Time Fall Time Internal Drain Inductance ––– ––– ––– ––– ––– ––– ––– ––– 48 12 13 11 53 36 22 4.5 71 18 20 ––– ––– ––– ––– ––– LS Internal Source Inductance ––– 7.5 ––– 6mm (0.25in.) from package Ciss Coss Crss Coss Coss Coss eff. Input Capacitance Output Capacitance Reverse Transfer Capacitance Output Capacitance Output Capacitance Effective Output Capacitance ––– ––– ––– ––– ––– ––– 2150 580 46 2830 510 870 ––– ––– ––– ––– ––– ––– S and center of die contact VGS = 0V VDS = 25V ƒ = 1.0MHz, See Fig. 5 VGS = 0V, VDS = 1.0V, ƒ = 1.0MHz VGS = 0V, VDS = 32V, ƒ = 1.0MHz VGS = 0V, VDS = 0V to 32V nC ns nH g pF ID = 30A ** VDS = 32V VGS = 10V VDD = 20V ID = 30A ** RG = 6.8Ω VGS = 10V Between lead, f f D G Diode Characteristics Parameter Min. Typ. Max. Units j Conditions IS Continuous Source Current ––– ––– 87 ISM (Body Diode) Pulsed Source Current ––– ––– 350 showing the integral reverse VSD trr Qrr ton (Body Diode) Diode Forward Voltage Reverse Recovery Time Reverse Recovery Charge Forward Turn-On Time 1.3 80 130 S p-n junction diode. TJ = 25°C, IS = 30A**, VGS = 0V TJ = 25°C, IF = 30A**, VDD = 20V di/dt = 100A/μs c Notes: Repetitive rating; pulse width limited by max. junction temperature. (See fig. 11). Limited by TJmax, starting TJ = 25°C, L = 0.52mH, RG = 25Ω, IAS = 30A, VGS =10V. Part not recommended for use above this value. ISD ≤ 30A, di/dt ≤ 170A/μs, VDD ≤ V(BR)DSS, TJ ≤ 175°C. Pulse width ≤ 1.0ms; duty cycle ≤ 2%. Coss eff. is a fixed capacitance that gives the same charging time as Coss while VDS is rising from 0 to 80% VDSS . 2 MOSFET symbol A ––– ––– ––– ––– 53 86 V ns nC D G f f Intrinsic turn-on time is negligible (turn-on is dominated by LS+LD) Limited by TJmax , see Fig.12a, 12b, 15, 16 for typical repetitive avalanche performance. This value determined from sample failure population. 100% tested to this value in production. Calculated continuous current based on maximum allowable junction temperature. Package limitation current is 56A. When mounted on 1" square PCB ( FR-4 or G-10 Material ). For recommended footprint and soldering techniques refer to application note #AN-994. Rθ is measured at TJ of approximately 90°C. ** All AC and DC test conditions based on former package limited current of 30A. www.irf.com AUIRFR3504 Qualification Information† Automotive (per AEC-Q101) Qualification Level Moisture Sensitivity Level Machine Model ESD Human Body Model Charged Device Model RoHS Compliant †† Comments: This part number(s) passed Automotive qualification. IR’s Industrial and Consumer qualification level is granted by extension of the higher Automotive level. D-Pak MSL1 Class M4 (+/- 500V)††† AEC-Q101-002 Class H1C (+/- 1500V)††† AEC-Q101-001 Class C5 (+/- 2000V)††† AEC-Q101-005 Yes Qualification standards can be found at International Rectifiers web site: http//www.irf.com/ Exceptions (if any) to AEC-Q101 requirements are noted in the qualification report. Highest passing voltage. www.irf.com 3 AUIRFR3504 1000 1000 ID, Drain-to-Source Current (A) 100 10 BOTTOM 1 4.0V 0.1 0.01 TOP ID, Drain-to-Source Current (A) TOP VGS 15V 10V 7.0V 6.0V 5.5V 5.0V 4.5V 4.0V 20μs PULSE WIDTH Tj = 25°C 0.001 0.1 1 10 100 100 BOTTOM 10 4.0V 1 20μs PULSE WIDTH Tj = 175°C 0.1 1000 0.1 1 VDS, Drain-to-Source Voltage (V) 100 1000 Fig 2. Typical Output Characteristics 1000.00 80 G fs , Forward Transconductance (S) ID, Drain-to-Source Current (Α) 10 VDS, Drain-to-Source Voltage (V) Fig 1. Typical Output Characteristics T J = 175°C 100.00 10.00 TJ = 25°C 1.00 VDS = 25V 20μs PULSE WIDTH 2.0 4.0 6.0 8.0 10.0 12.0 14.0 VGS, Gate-to-Source Voltage (V) Fig 3. Typical Transfer Characteristics 70 T J = 25°C 60 50 TJ = 175°C 40 30 20 VDS = 25V 10 0.10 4 VGS 15V 10V 7.0V 6.0V 5.5V 5.0V 4.5V 4.0V 16.0 20μs PULSE WIDTH 0 0 20 40 60 80 100 120 ID,Drain-to-Source Current (A) Fig 4. Typical Forward Transconductance Vs. Drain Current www.irf.com AUIRFR3504 100000 VGS , Gate-to-Source Voltage (V) Ciss 1000 Coss 100 Crss I D = 30A 8 6 4 2 10 0 1 10 0 100 1000 ID, Drain-to-Source Current (A) 1000 100 °C TJ = 25 °C 1 V GS = 0 V 0.1 0.5 1.0 1.5 2.0 2.5 V SD,Source-to-Drain Voltage (V) Fig 7. Typical Source-Drain Diode Forward Voltage www.irf.com 30 40 50 OPERATION IN THIS AREA LIMITED BY R DS (on) 100 10 0.0 20 Fig 6. Typical Gate Charge Vs. Gate-to-Source Voltage Fig 5. Typical Capacitance Vs. Drain-to-Source Voltage TJ = 175 10 QG, Total Gate Charge (nC) VDS, Drain-to-Source Voltage (V) I SD , Reverse Drain Current (A) VDS = 32V VDS = 20V VDS = 8V 10 Coss = Cds + Cgd 10000 C, Capacitance(pF) 12 VGS = 0V, f = 1 MHZ Ciss = Cgs + Cgd, C ds SHORTED Crss = Cgd 100μsec 10 1msec Tc = 25°C Tj = 175°C Single Pulse 10msec 1 3.0 1 10 100 1000 VDS, Drain-to-Source Voltage (V) Fig 8. Maximum Safe Operating Area 5 AUIRFR3504 90 2.5 80 Limited By Package 2.0 60 50 40 30 20 10 0 25 50 75 100 125 150 175 (Normalized) RDS(on) , Drain-to-Source On Resistance 70 ID, Drain Current (A) I D = 87A 1.5 1.0 0.5 V GS = 10V 0.0 -60 -40 -20 0 20 40 60 80 100 120 140 160 180 ( ° C) TJ , Junction Temperature T C , Case Temperature (°C) Fig 10. Normalized On-Resistance Vs. Temperature Fig 9. Maximum Drain Current Vs. Case Temperature (Z thJC ) 10 1 Thermal Response D = 0.50 0.20 P DM 0.10 0.1 0.05 0.02 0.01 t1 SINGLE PULSE (THERMAL RESPONSE) t2 Notes: 1. Duty factor D = 2. Peak T 0.01 0.00001 0.0001 0.001 0.01 t1 / t 2 J = P DM x Z thJC +TC 0.1 1 t1, Rectangular Pulse Duration (sec) Fig 11. Maximum Effective Transient Thermal Impedance, Junction-to-Case 6 www.irf.com AUIRFR3504 15V 500 D.U.T + V - DD IAS VGS 20V EAS , Single Pulse Avalanche Energy (mJ) 400 RG A 0.01Ω tp ID 12A 21A BOTTOM 30A DRIVER L VDS TOP Fig 12a. Unclamped Inductive Test Circuit V(BR)DSS tp 300 200 100 0 25 50 75 100 Starting Tj, Junction Temperature 125 150 175 ( ° C) I AS Fig 12c. Maximum Avalanche Energy Vs. Drain Current Fig 12b. Unclamped Inductive Waveforms QG 10 V QGS QGD 4.0 Charge Fig 13a. Basic Gate Charge Waveform Current Regulator Same Type as D.U.T. 50KΩ 12V .2μF .3μF D.U.T. + V - DS VGS(th) Gate threshold Voltage (V) VG 3.5 3.0 ID = 250μA 2.5 2.0 1.5 -75 -50 -25 VGS 0 25 50 75 100 125 150 175 200 T J , Temperature ( °C ) 3mA IG ID Current Sampling Resistors Fig 14. Threshold Voltage Vs. Temperature Fig 13b. Gate Charge Test Circuit www.irf.com 7 AUIRFR3504 10000 Duty Cycle = Single Pulse Avalanche Current (A) 1000 100 Allowed avalanche Current vs avalanche pulsewidth, tav assuming Δ Tj = 25°C due to avalanche losses 0.01 0.05 10 0.10 1 0.1 1.0E-08 1.0E-07 1.0E-06 1.0E-05 1.0E-04 1.0E-03 1.0E-02 1.0E-01 tav (sec) Fig 15. Typical Avalanche Current Vs.Pulsewidth EAR , Avalanche Energy (mJ) 250 TOP Single Pulse BOTTOM 10% Duty Cycle ID = 30A 200 150 100 50 0 25 50 75 100 125 150 Starting T J , Junction Temperature (°C) Notes on Repetitive Avalanche Curves , Figures 15, 16: (For further info, see AN-1005 at www.irf.com) 1. Avalanche failures assumption: Purely a thermal phenomenon and failure occurs at a temperature far in excess of T jmax. This is validated for every part type. 2. Safe operation in Avalanche is allowed as long asT jmax is not exceeded. 3. Equation below based on circuit and waveforms shown in Figures 12a, 12b. 4. PD (ave) = Average power dissipation per single avalanche pulse. 5. BV = Rated breakdown voltage (1.3 factor accounts for voltage increase during avalanche). 6. Iav = Allowable avalanche current. 7. ΔT = Allowable rise in junction temperature, not to exceed Tjmax (assumed as 25°C in Figure 15, 16). tav = Average time in avalanche. 175 D = Duty cycle in avalanche = tav ·f ZthJC(D, tav ) = Transient thermal resistance, see figure 11) PD (ave) = 1/2 ( 1.3·BV·Iav) = DT/ ZthJC Iav = 2DT/ [1.3·BV·Zth] EAS (AR) = PD (ave)·tav Fig 16. Maximum Avalanche Energy Vs. Temperature 8 www.irf.com AUIRFR3504 D.U.T Driver Gate Drive + - * D.U.T. ISD Waveform Reverse Recovery Current + RG V DD • dv/dt controlled by RG • Driver same type as D.U.T. • I SD controlled by Duty Factor "D" • D.U.T. - Device Under Test P.W. Period VGS=10V Circuit Layout Considerations • Low Stray Inductance • Ground Plane • Low Leakage Inductance Current Transformer - D= Period P.W. + + Body Diode Forward Current di/dt D.U.T. VDS Waveform Diode Recovery dv/dt Re-Applied Voltage - Body Diode VDD Forward Drop Inductor Curent Ripple ≤ 5% * ISD VGS = 5V for Logic Level Devices Fig 17. Peak Diode Recovery dv/dt Test Circuit for N-Channel HEXFET® Power MOSFETs V DS V GS RG RD D.U.T. + -V DD 10V Pulse Width ≤ 1 µs Duty Factor ≤ 0.1 % Fig 18a. Switching Time Test Circuit VDS 90% 10% VGS td(on) tr t d(off) tf Fig 18b. Switching Time Waveforms www.irf.com 9 AUIRFR3504 D-Pak (TO-252AA) Package Outline Dimensions are shown in millimeters (inches) D-Pak Part Marking Information Part Number AUFR3504 YWWA IR Logo XX or Date Code Y= Year WW= Work Week A= Automotive, LeadFree XX Lot Code Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ 10 www.irf.com AUIRFR3504 D-Pak (TO-252AA) Tape & Reel Information Dimensions are shown in millimeters (inches) TR TRR 16.3 ( .641 ) 15.7 ( .619 ) 12.1 ( .476 ) 11.9 ( .469 ) FEED DIRECTION TRL 16.3 ( .641 ) 15.7 ( .619 ) 8.1 ( .318 ) 7.9 ( .312 ) FEED DIRECTION NOTES : 1. CONTROLLING DIMENSION : MILLIMETER. 2. ALL DIMENSIONS ARE SHOWN IN MILLIMETERS ( INCHES ). 3. OUTLINE CONFORMS TO EIA-481 & EIA-541. 13 INCH 16 mm NOTES : 1. OUTLINE CONFORMS TO EIA-481. Note: For the most current drawing please refer to IR website at http://www.irf.com/package/ www.irf.com 11 AUIRFR3504 Ordering Information 12 Base part number Package Type AUIRFR3504 Dpak Standard Pack Form Tube Tape and Reel Tape and Reel Left Tape and Reel Right Complete Part Number Quantity 75 2000 3000 3000 AUIRFR3504 AUIRFR3504TR AUIRFR3504TRL AUIRFR3504TRR www.irf.com AUIRFR3504 IMPORTANT NOTICE Unless specifically designated for the automotive market, International Rectifier Corporation and its subsidiaries (IR) reserve the right to make corrections, modifications, enhancements, improvements, and other changes to its products and services at any time and to discontinue any product or services without notice. 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