IS43R32800B 8Mx32 256Mb DDR Synchronous DRAM FEATURES • Vdd/Vddq=2.5V+0.2V (-5, -6, -75) • Double data rate architecture; two data transfers per clock cycle • Bidirectional, data strobe (DQS) is transmitted/ received with data • Differential clock input (CLK and /CLK) • DLL aligns DQ and DQS transitions with CLK transitions edges of DQS • Commands entered on each positive CLK edge; • Data and data mask referenced to both edges of DQS • 4 bank operation controlled by BA0, BA1 (Bank Address) • /CAS latency –2.0/2.5/3.0 (programmable) • Burst length - 2/4/8 (programmable) • Burst type - Sequential/ Interleave (programmable) • Auto precharge / All bank precharge controlled by A8 • 4096 refresh cycles/ 64ms (4 banks concurrent refresh) • Auto refresh and Self refresh • Row address A0-11/ Column address A0-7, A9SSTL_2 Interface • Package 144-ball FBGA • Available in Industrial Temperature • Temperature Range: Commercial (0oC to +70oC) Industrial (-40oC to +85oC) PRELIMINARY INFORMATION MAY 2008 DESCRIPTION: IS43R32800B is a 4-bank x 2,097,152-word x32bit Double Data Rate Synchronous DRAM, with SSTL_2 interface. All control and address signals are referenced to the rising edge of CLK. Input data is registered on both edges of data strobe, and output data and data strobe are referenced on both edges of CLK. The IS43R32800B achieves very high speed clock rate up to 200 MHz. It is packaged in 144-ball FBGA. KEY TIMING PARAMETERS Parameter -5 -6 -75 Clk Cycle Time CAS Latency = 3 5 6 7.5 CAS Latency = 2.5 5 6 7.5 CAS Latency = 2 7.5 7.5 7.5 Clk Frequency CAS Latency = 3 200 167 143 CAS Latency = 2.5 200 167 143 CAS Latency = 2 143 143 143 Access Time from Clock CAS Latency = 3 +0.70 +0.70 +0.70 CAS Latency = 2.5 +0.70 +0.70 +0.70 CAS Latency = 2 +0.75 +0.75 +0.70 Unit ns ns ns MHz MHz MHz ns ns ns ADDRESS TABLE Parameter 8M x 32 Configuration 2M x 32 x 4 banks Bank Address Pins BA0, BA1 Autoprecharge Pins A8/AP Row Addresses A0 – A11 Column Addresses A0 – A7, A9 Refresh Count 4096 / 64ms Copyright © 2006 Integrated Silicon Solution, Inc. All rights reserved. ISSI reserves the right to make changes to this specification and its products at any time without notice. ISSI assumes no liability arising out of the application or use of any information, products or services described herein. Customers are advised to obtain the latest version of this device specification before relying on any published information and before placing orders for products. Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 1 IS43R32800B FUNCTIONAL BLOCK DIAGRAM DLL Memory Array Ba nk #0 DQ 0 - 31 DQS0 - 3 I/O Buffer DQ S B uffer Memory Array Ba nk #1 Memory Array Ba nk #2 Memory Array Ba nk #3 Mode Re gister Control C ircu itry Addres s B uffer Control Signal B uffer Cl ock B uffer A0-1 1 /CS /RAS /CAS BA 0,1 CLK 2 /CLK /WE D M0- 3 CKE Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B PIN CONFIGURATION Package Code: B 144-ball FBGA (Top View) (12.00mm x 12.00mm Body, 0.8mm Ball Pitch 1 2 3 4 5 6 7 8 9 10 11 12 A DQS0 DM0 VSSQ DQ 3 DQ 2 DQ 0 DQ 31 DQ 29 DQ 28 VSSQ DM3 DQS3 B DQ 4 VDDQ NC VDDQ DQ 1 VDDQ VDDQ DQ 30 VDDQ NC VDDQ DQ 27 C DQ 6 DQ 5 VSSQ VSSQ VSSQ VD D VD D VSSQ VSSQ VSSQ DQ 26 DQ 25 D DQ 7 VDDQ VD D VSS VSSQ VSS VSS VSSQ VSS VD D VDDQ DQ 24 E DQ 17 DQ 16 VDDQ VSSQ VSS VSS VSS VSS VSSQ VDDQ DQ 15 DQ 14 F DQ 19 DQ 18 VDDQ VSSQ VSS VSS VSS VSS VSSQ VDDQ DQ 13 DQ 12 G DQS2 DM2 NC VSSQ VSS VSS VSS VSS VSSQ NC DM1 DQS1 H DQ 21 DQ 20 VDDQ VSSQ VSS VSS VSS VSS VSSQ VDDQ DQ 11 DQ 10 J DQ 22 DQ 23 VDDQ VSSQ VSS VSS VSS VSS VSSQ VDDQ DQ 9 DQ 8 K /CAS /W E VD D VSS A1 0 VD D VD D NC VSS VD D NC NC L /R AS NC NC BA 1 A2 A1 1 A9 A5 NC CL K /CLK NC M /CS NC BA 0 A0 A1 A3 A4 A6 A7 A8 /AP CK E VREF PIN DESCRIPTIONS CLK, /CLK CKE /CS /RAS /CAS /WE DQ 0-31 DM 0-3 : Ma ster Cl ock : Clock En able : Ch ip Select : Ro w Address Strobe : Column A ddress Strobe : Write Enab le : Data I/O : Write Mask Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 A0-11 BA 0,1 VDD VDDQ Vs s VssQ DQ S0-3 VREF : Address Inpu t : Ba nk A ddress Inpu t : Pow er Supply : Power Supply for Output : Ground : Ground for Output : Data Strobe : Reference Voltage 3 IS43R32800B PIN FUNCTIONS SYMBOL DESCRIPTION Input Cl ock: CL K a nd/CLK are differential clock inputs. A ll address and control input signals are sampled on the crossing of the positive edge of CL K a nd negative edgeof /CLK . Output (read) data is referenced to the crossings of CL K a nd /CLK (both directions of crossing). CK E I nput Cl ock E nable: CK E controls internal clock. W hen CKE is low, internal clock for the following cycle is ceased. C KE is also used to select auto/ self refresh. Af ter self refresh mode is started, CK E becomes asynchronous input. Self refresh is maintained as long as CK E i s low. /CS I nput Chip Select: W hen /CS is high, any command means No Operation. /RAS , /CAS, /WE I nput Combination of /RA S, /CAS , /WE defines basic commands. CL K, /CLK A0-1 1 specify the Row / Column Address in conjunction with BA0,1. T he Row Address is specifi ed by A0-11. The Column Address is specified by A0-7 ,A 9. A8 is also used to indicate precharge option. W hen A8 is high at a read / write command, an auto precharge is performed. When A8 is high at a precharge command, all banks are precharged. A0-1 1 Input BA 0,1 Input DQ0-31 Input / Output Data Input/Output: D ata bus Input / Output Data Strobe: Outputwith read data, inputwith write data. E dge-aligned with read data, centered in write data. Used to capture write data. DQS 0 for DQ0 - DQ7, DQS 1 for DQ8 - DQ15, DQS2 for DQ16 - DQ23, DQS3 for DQ24 - DQ31. DQS0- 3 DM0- 3 Input VDD, Vs s Power Supply VDDQ , VssQ Vref 4 TYPE Power Supply Input Bank Address: BA 0,1 specifies one of four banks to which a command is applied. BA 0,1 must be set with ACT, PR E, READ, WR IT E commands. Input Data Mask: DM is an inputmask signal for write data. I nput data is masked when DM is sampled HIG H along with that input data during a WR IT E access. DM is sampled on both edges of D QS. Al though DM pins are input only, the DM loading matches the DQ andDQS loading. DM 0 for DQ0 - DQ7, DM1 for DQ8 - DQ15, DM 2 for DQ16 - DQ23, DM 3 for DQ24 - DQ31. Power Supply for the memory array and peripheral circuitry. VDDQ and VssQ are supplied to the Output Buffers only. SST L_ 2 reference voltage. Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B FUNCTIONAL DESCRIPTION ISSI's 256-Mbit DDR SDRAM provides basic functions, bank (row) activate, burst read / write, bank (row) precharge, and auto / self refresh. E ach command is defined by control signals of /RA S, /CAS and /WE at CLK rising edge. I n addition to 3 signals, /CS ,C KE and A8 are usedas chip select, refresh option, and prechargeoption, respectively. To know the detailed definition of commands, please see the command truth table. /CLK CL K /CS Chip Select : L =select, H=deselect /RAS Command /CAS Command /WE Command CK E Refresh Option @ refresh command A8 Precharge Option @ precharge or read/write command define basic commands Activate ( ACT) [/RA S =L, /CAS =/WE =H ] AC T c ommand activates a row in an idle bank indicated by BA . Read (R EAD) [/RAS =H , /CA S =L, /WE = H] RE AD command starts burst read from the active bank indicated by BA . F irst output data appears after /CAS latency. When A8 =H at this command, the bank is deactivated after the burst read (autoprecharge READ A ) Write (WRITE) [/RA S =H, /CAS =/WE =L ] WR IT E c ommand starts burst write to the active bank indicated by BA . T otal data length to be written is set by burst length. W hen A8 =H at this command, the bank is deactivated after the burst write (auto-precharge, WRITEA ) Prechar ge (P RE ) [ /RAS =L , /CA S =H, /WE = L] PR E c ommand deactivates the active bank indicated by BA . T his command also terminates burst read /write operation. When A8 =H at this command, all banks are deactivated (precharge all, PREA ). Auto-Ref resh (REFA ) [ /RAS =/CA S =L, /WE = CK E = H] RE FA command starts auto-refresh cycle. R efresh address including bank address are generated internally. A fter this command, the banks are precharged automatically. Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 5 IS43R32800B COMMAND TRUTH TABLE MNEMONIC CKE n-1 CKE n /CS /RAS /CAS DESEL H X H X X X X X X No Operation NOP H X L H H H X X X Row Address Entry & Bank Activate ACT H H L L H H V V V Single Bank Precharge PRE H H L L H L V L X PrechargeAll Banks PREA H H L L H L X H X Column Address Entry & Write WRITE H H L H L L V L V Column Address Entry & Write with Auto-Precharge WRITEA H H L H L L V H V Column Address Entry & Read READ H H L H L H V L V Column Address Entry & Read with Auto-Precharge READA H H L H L H V H V Auto-Refresh REFA H H L L L H X X X Self-RefreshEntry REFS H L L L L H X X X Self-RefreshExit REFSX L H H X X X X X X L H L H H H X X X Burst Terminate TERM H H L H H L X X X 1 ModeRegisterSet MRS H H L L L L L L V 2 COMMAND Deselect /WE BA0,1 A8 /AP A0-7, note A9-11 H=High Level, L=Low Level, V=Valid, X=Don't Care, n=CLK cycle number NOTE: 1. Applies only to read bursts with autoprecharge disabled; this command is undefi ned (and should not be used) for read bursts wi th autoprecharge enabled, and for write bursts. 2. BA 0-BA 1 select either the Baseor the Extended Mode Register (BA 0 = 0, BA 1 = 0 selects Mode Register;BA0=1 , BA 1 = 0 selects Extended Mode Register; other combinations of BA 0-BA 1 are reserved; A 0-A11 provide the op-code to be written to the selected Mode Register. 6 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B FUNCTIONAL TRUTH TABLE Current State IDLE ROW A CT IV E RE AD(Au toPrecharge Disabled) /CS /RAS /CAS /WE Address H X X X X C ommand D ES EL Action NO P L L H H H H H L X BA N OP TERM NO P ILLE GAL L L L H L L L H H X H L BA , C A, A8 BA , R A BA , A 8 RE AD / WRITE A CT PRE / PRE A ILLEGAL Bank Active, L atch RA N OP 2 L L L H R EF A A uto-Refresh 5 L L L MR S M ode Register Set 5 H L L X H H X H H X Op-C ode, ModeL Add X X H X L BA DE SE L NOP TER M L H L H BA , C A, A8 RE AD / READA L H L L BA , C A, A8 WR ITE / WR ITEA L L H H BA , R A A CT N OP NO P I LLEGA L Begin Read, L atch CA , Determine Auto-Precharge Begin Write, L atch CA , Determine Auto-Precharge Bank Active / ILLEG AL 2 L L L L H L L H PRE / PRE A R EF A P recharge / Precharge All I LLE GA L L L L L MR S I LLE GA L H L X H X H X H BA , A 8 X Op-C ode, ModeAdd X X D ES EL NOP NOP (C ontinueBurst to END) NO P (Continue Burst to END) L H H L BA TER M L H L H BA , C A, A8 RE AD / REA DA L H L L BA , C A, A8 WR IT E / WR ITEA T erminate Burst Terminate Burst, L atch CA , B egin New Read, Determine AutoPrecharge ILLE GA L L L L L H H H L BA , R A BA , A 8 A CT PRE / PRE A Bank Active / ILLE GAL T erminate Burst, Precharge L L L H L L L L X REF A Op-C ode, ModeMR S Add Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 Notes 2 4 3 2 I LLE GAL I LLE GAL 7 IS43R32800B FUNCTIONAL TRUTH TABLE (continued) Current State WR IT E( AutoPrecharge Disabled) READ with Auto-Precharge WRITE with Auto-Precharge 8 /CS /RAS /CAS /WE Addres s H X X X X L H H H X Command DES EL NOP Action NO P (Continue Burst to END) NO P (Continue Burst to END) Notes L H H L BA TERM L H L H BA , C A, A8 READ / READA L H L L BA , C A, A8 WR ITE / WR IT EA L L H H BA , R A ACT IL LE GAL Terminate Burst, L atchCA , B egin Read, Determine Auto-Precharge Terminate Burst, L atchCA , B egin Write, Determine Auto-Precharge Bank Active / ILLE GAL L L H L BA , A 8 PRE / PRE A T erminate Burst, Precharge L L L H I LL EGAL L L L L H X X X X REF A Op-C ode, ModeMR S Add X DES EL L H H H X NOP NO P (Continue Burst to END) L L L L L H H H L L H L L H H L H L H L BA BA , C A, A8 BA , C A, A8 BA , R A BA , A 8 TERM READ / READA WRIT E / WR IT EA ACT PRE / PRE A ILLE GAL ILLE GAL IL LE GAL Bank Active / ILLE GAL P recharge / ILLEGAL L L L H I LLEGAL L L L L H X X X X REF A Op-C ode, M odeMR S Add X DES EL L L L L L H H H H L H H L L H H L H L H X BA BA , C A, A8 BA , C A, A8 BA , R A NOP TERM READ / READA WR IT E / WR ITEA A CT NOP (Continue Burst to END) ILLE GAL ILLEGAL ILLE GAL Bank Active / ILLEGAL 2 L L H L BA , A 8 PRE / PRE A P recharge / ILLEGAL 2 L L L H L L L L X REF A Op-C ode, ModeMRS Add 3 3 2 I LL EGAL NO P (Continue Burst to END) 2 2 I LLEGAL NOP (Continue Burst to END) I LLEGAL I LLEGAL Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B FUNCTIONAL TRUTH TABLE (continued) Current State PR EC HARGI NG ROW ACTI VATING WRITER ECOVERING /CS /RAS /CAS /W E Address H X X X X Action NOP (I dle after tRP) L H H H X NOP NOP (I dle after tRP) L L L H H L H L H L X H BA BA , C A, A8 BA , R A TERM READ / WRITE A CT IL LEG AL IL LEG AL IL LE GA L PRE / PRE A L L H L BA , A 8 L L L H I LLEGAL L L L L H X X X X REF A Op-C ode, M odeMRS Add X DES EL L H H H X NOP NOP (R ow Active after tRC D) L L L H H L H L H L X H BA BA , C A, A8 BA , R A TERM READ / WRITE ACT IL LEG AL IL LEG AL IL LE GA L NOP (I dle after tRP) PRE / PRE A I LLEG AL Notes 2 2 2 4 I LLEGAL NOP (R ow Active after tRC D) 2 2 2 2 L L H L BA , A 8 L L L H I LLEG AL L L L L H X X X X REF A Op-C ode, M odeMR S Add X DESEL L H H H X NOP NOP L L L H H L H L H L X H BA BA , C A, A8 BA , R A TERM READ / WRITE ACT IL LE GA L IL LE GA L IL LEGA L 2 2 2 PRE / PRE A I LLEGAL 2 L L H L BA , A 8 L L L H L L L L X REF A Op-C ode, M odeMRS Add Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 Command DES EL I LLEGAL NOP I LLEGAL I LLEGA L 9 IS43R32800B FUNCTIONAL TRUTH TABLE (continued) Current State REFRESHING MODE REGISTER SETTING / CS /RAS /C AS /WE Address H X X X X Command DES EL Action NO P (Idle after tRC ) NOP TERM READ / WRI TE ACT PRE / PRE A NO P (Idle after tRC ) ILLE GAL ILLEGAL ILLEGAL ILLEG AL L L L L L H H H L L H H L H H H L X H L X BA BA , C A, A8 BA , R A BA , A 8 L L L H L L L L H X X X X REF A Op-C ode, ModeMRS Add X DES EL NO P (Row Active after tRSC ) L L L L L H H H L L H H L H H H L X H L X BA BA , C A, A8 BA , R A BA , A 8 NO P (Row Active after tRSC ) ILLEGAL ILLEGAL ILLEGAL ILLEGAL L L L H L L L L X REF A Op-C ode, M odeMR S Add Notes ILLEGAL ILLEGAL NOP TERM READ / WRI TE ACT PRE / PRE A ILLEG AL ILLEG AL ABBREVIATIONS : H=Hi gh Level, L= Low L evel, X =Don't Care BA =Bank A ddress, R A=Row A ddress, CA =Column Address, NOP =No Operation NO TES : 1. Al l entries assume that CK E was Hi gh during the preceding clock cycle and the current clock cycle. 2. ILLEGAL to bank in specified state; function may be legal in the bank indicated by B A, depending on the state of that bank. 3. Must satisfy bus contention, bus turn around, write recovery requirements. 4. NOP to bank precharging or in idle state. May precharge bank indicated by B A. 5. ILLE GAL if any bank is not idle. ILLE GA L = Device operation and/or data-integrity are not guaranteed. 10 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B CKE TRUTH TABLE Current State SELF REFR ESHI NG POWER DOWN ALL BANKS IDLE ANY STATE other than listed above CKE n-1 CKE n /CS /RAS /CAS /WE Address A ction Notes H X X X X X X I NV ALID 1 L H H X X X X Exit Self-Refresh (Idle after tRC ) 1 L H L H H H X Exit Self-Refresh (Idle after tRC ) 1 L H L H H L X I LL EGAL 1 L H L H L X X I LL EGAL 1 L H L L X X X I LL EGAL 1 L L X X X X X N OP (M aintain Self- Refresh) 1 H X X X X X X I NV AL ID L H X X X X X Exit Power Downto Idle L L X X X X X N OP (M aintain Self- Refresh) H H X X X X X R efer to FunctionTruth Table 2 H L L L L H X Enter Self-R efresh 2 H L H X X X X Enter Power Down 2 H L L H H H X Enter Power Down 2 H L L H H L X I LL EGAL 2 H L L H L X X I LL EGAL 2 H L L L X X X I LL EG AL 2 L X X X X X X R efer to Current State =Power Down 2 H H X X X X X R efer to FunctionTruth Table H L X X X X X B egin CL K S uspend at Next Cycle 3 L H X X X X X Exit CLK Suspend at Next Cycle 3 L L X X X X X M aintain CLK Suspend ABBR EVIATI ONS : H=Hi gh Level, L= Low L evel, X =Don't Care NO TES : 1. CKE L ow to Hi gh transition will re-enable CLK and other inputs asynchronously. A minimum setup time must be satisfied before any command other than EXIT. 2. Power-Down and Self-Refresh can be entered only from the Al l B anks Idle State. 3. Must be legal command. Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 11 IS43R32800B STATE DIAGRAM POWE R AP PL IE D POWER ON PR E CH AR GE AL L PREA SE LF RE FR ES H REFS MR S MODE REGISTER SE T REFSX MR S AU TO RE FR ES H REFA ID LE CKEL CKEH Active Power Down AC T POWER DOW N CKEL CKEH RO W AC TI VE WR IT E BU RS T ST OP WR IT E RE AD WR IT EA WR IT E RE AD A RE AD WR IT EA RE AD RE AD TE RM RE AD A RE AD A WR IT EA RE ADA PR E PR E PR E PR E CH AR GE Automatic Sequence Command Sequence 12 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B ABSOLUTE MAXIMUM RATINGS Symbol Parameter Conditions R atings Unit VDD Supply V oltage with respect to V ss -0.5 ~ 3.7 V VDDQ Supply Voltage for Output with respect to V ssQ -0.5 ~ 3.7 V VI Input V oltage with respect to V ss -0.5 ~ V dd+0.5 V VO Output Voltage with respect to Vs sQ -0.5 ~ V ddQ+0.5 V IO Output Current 50 mA Pd Power Dissipation 2000 mW T opr Operating Temperature Ts tg Storage Temperature 5 o Ta = 25 C Commercial Industrial 0 to +70 -40 to +85 o -65 ~ 150 o C C DC OPERATING CONDITIONS Parameter Limits Unit Not es Min. Typ. Max. Supply Voltage 2.3 2.5 2.7 V -5, -6, -75 Supply Voltage for Output 2.3 2.5 2.7 V -5, -6, -75 VREF +0.15 V DD+0.3 -0.3 VREF -0.15 V V -2 2 uA -5 5 uA High-Le vel I nput Voltage Low-Le vel I nputVoltage InputL eakage Current Any input0V <V IN<VDD (A ll other pins not under test = 0V ) OutputL eakage Current:D Q are disabled:0V< Vout<VDDQ OutputLe vels: OutputHigh Voltage (Iout=-4mA) OutputLow V oltage(I out=4mA) V 2.4 0.4 V (Ta=0 ~70oC CAPACITANCE CHARACTERISTICS VDD = VDDQ = 2.5V + 0.2V, V ss = V ssQ = 0V , unless otherwise noted) Symbol CI (A ) CI (C ) CI (K ) CI /O Parameter Test Condition I nput Capacitance, address pin VI =1.25V I nput Capacitance, control pin f=100MHz I nput Capacitance, CL K pin VI= 25mVr ms I/O C apacitance, I/O, DQ S, DM pin Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 Delta Limits Unit Notes Min. Max. Cap.(Max.) 1.2 2.2 pF 0.75 1.2 2.2 pF 1.2 2.2 0.25 pF 2.2 4.2 1.3 pF 13 IS43R32800B AVERAGE SUPPLY CURRENT FROM VDD VDD = VDDQ = 2.5V + 0.2V, V ss = V ssQ = 0V , Output Open, unless otherwise noted Symbol Parameter/TestConditions -5 Limits(Max.) -6 -75 IDD1 OPER AT IN G C URRENT : One Bank; A ctive-Read-Precharge ;Burst = 2; tRC = t RC MI N; t CK = t CK M IN ; I OUT = 0mA; A ddress andcontrol inputs changing once per clock cycle 250 230 230 IDD2 P PR ECHA RG E P OW ER- DOW N S TA NDB Y C URRENT : A ll banks idle; power-down mode; CK E < VI L ( MA X) ; t CK = t CK MI N 40 35 35 ID LE STANDB Y C URRENT : /CS > VI H ( MI N) ; A ll banks idle; IDD2 N CK E > VI H ( MI N) ; t CK = t CK MI N; Address andother control inputs changingonce per clock cycle 70 65 65 IDD3 P AC TI VE POWE R DOW N S TA NDB Y C URRENT : One bankactive;power down mode;C KE < VI L( MA X) ;t CK = t CK MI N 55 50 50 IDD3 N AC TI VE STANDB Y C URRE NT: /CS > VI H ( MI N) ; C KE > VI H ( MI N) ; One bank; Ac tive-Precharge; t RC = t RA S M AX ; t CK = t CK MI N; DQ,DM andDQS inputs changing twice per clock cycle; address andother control i nputs changing once per clock cycle 105 100 100 OPER AT IN G C URRENT : B urst =2; R ead ; Continuous burst;Al l banks IDD4 R active; Address andcontrol i nputs changing once per clock cycle;t CK = t CK MI N; IOUT = 0 mA 400 360 360 OPER AT IN G C URRENT : B urst =2; W rite ; C ontinuous burst;Al l banks IDD4 W active; Address andcontrol i nputs changingonce per clock cycle;t CK = t CK MI N; DQ andDQS inputs changingtwice per clock cycle 400 360 360 250 240 240 5 5 IDD5 AU TO REFRESH C URRENT : t RC = t RF C ( MI N) IDD6 SELF REFRESH C URRENT : C KE < 0.2V 14 Unit Notes mA 5 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B AC TIMING REQUIREMENTS Symbol tAC -5 AC Characteristics Parameter D Q Output access time from CLK //CL K tDQS CK DQS O utput access time from CLK //CL K tCH C LK Highlevel width tCL C LK Low level width tCK CL K c ycle time tDS I nput Setup time (DQ ,DM) tDH I nput Hold time(DQ,DM ) tIPW Control & address input pulse width(for eachinput) tLZ Data-out-low impedance time fromCL K//CLK Min. Max Min. Max Unit -0.70 +0.70 -0.70 +0.70 -0.75 +0.75 -0.6 +0.6 -0.60 +0.60 -0.75 +0.75 ns 0.45 0.55 0.45 0.55 0.45 0.55 tCK tCK 0.55 0.45 0.55 0.45 0.55 5 7.5 6 12 7.5 12 ns CL =2.5 5 12 6 12 7.5 12 ns 7.5 12 7.5 12 7.5 12 0.4 0.4 0.5 ns 0.45 0.5 ns ns 2.2 2.2 2.2 1.75 1.75 +0.70 -0.70 tDQS Q DQ V alid data delay time from DQS +0.70 ns 0.45 1.75 +0.70 -0.70 0.40 +0.70 -0.75 0.45 ns +0.75 ns 14 +0.75 ns 14 0.5 ns tHP C lock half period tCLmin or tCHmin tCLmin or tCHmin tCLmin or tCHmin ns tQH DQ output hold time from DQS (per access) tHP-tQHS tHP-tQHS tHP-tQHS ns tQHS tDQS S Data hold skew factor (for DQ S & a ssociated DQ signals) W rite command to first DQS latchingtransition 0.50 0.72 1.25 0.55 0.75 1.25 1.25 tCK 0.35 0.35 0.35 tCK tDQS L D QS input Low level width 0.35 0.35 0.35 tCK 0.2 tCK tDSS DQS falling edge to CLK setup time DQS falling edge hold time from CLK tMRD Mode Register Set command cycle time tWPR ES Write preamble setup time tWPST Write postamble tWPR E W rite preamble 0.2 0.2 0.2 0.2 0.2 tCK 2 2 2 tCK 0 0.4 0 0.6 0.4 0 0.6 20 0.75 0.75 tDQS H DQS input High level width tDSH Notes ns 0.45 tDIP W D Q and DM input pulse width (for each input) Data-out-highimpedance time from CLK //CL K -75 Max CL =3.0 CL =2.0 tHZ -6 Min. 0.4 0.25 0.25 0.25 0.6 ns 16 tCK 15 tCK tIS I nput Setup time (address and control) 0.6 0.75 0.9 ns 19 tIH I nput Hold time (address and control) 0.6 0.75 0.9 ns 19 tRPST Read postamble 0.4 tRPR E R ead preamble Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 0.9 0.6 0.4 0.6 0.4 0.6 tCK 1.1 0.9 1.1 0.9 1.1 tCK 15 IS43R32800B AC TIMING REQUIREMENTS (Continued) ( Symbol -5 AC CharacteristicsParameter -6 -75 Min. Max Min. Max Min. Max 120,000 42 120,000 45 120,000 tRAS Row Active time 40 Unit ns tRC R ow Cycle time(operation) 55 60 65 ns tRFC Auto Ref. to Active/Auto Ref. command period 70 72 75 ns tRCD Row to Column Delay 15 18 20 ns 15 18 20 10 15 12 15 15 15 ns tWR+tRP tWR +tRP tWR+tRP ns 2 1 1 tCK tRP R ow Precharge time tRRD Act to Act Delay time tWR W rite Recovery time tDAL Auto Prechargewrite recovery + precharge time tWTR Internal Write to ReadCommand Delay ns ns tXSN R E xit Self R ef. to non-R ead command 75 75 75 ns tXSR D E xit Self R ef. to -Read command 200 200 200 tCK tXPN R E xit Power down to command 1 1 1 tCK tXPR D E xit Power down to -Readcommand 1 tREF I A verage Periodic Refresh interval 1 15.6 1 15.6 Notes 15.6 tCK 18 µs 17 Output Load Condition V RE F DQS DQ V TT =V REF V RE F 50 Ω V OUT Zo=50 Ω 30pF 16 V RE F OutputTi ming Measurement Reference Point Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B Notes 1. Al l voltages referenced to Vss. 2. Tests for AC timing, I DD, and electrical, AC and DC characteristics, may be conducted at nominal reference/supply voltagelevels, but the related specifications and device operation are guaranteed for the full voltagerange specified. 3. AC timing and IDD tests may use a VI L to V IH swing of up to 1.5V i n the test environment, but inputtiming is still referenced to VR EF (or to the crossing point for CK //CK), and parameter specifications are guaranteedfor the specified AC input levels under normal use conditions. The minimum slew rate for the inputsignals is 1V/ns in the rangebetween V IL (AC) and V IH (AC) . 4. The AC and DC input level specifications are as defined in the SST L_ 2 Standard (i.e. the receiver will effectively switch as a result of the signal crossing the AC input level, and will remain in that state as long as the signal does not ring back above (below) the DC i nput LO W ( HI GH ) l evel. 5. VR EF is expected to be equal to 0.5*VDDQ of the transmitting device, and to track variations in the DC l evel of the same. Peak-to-peak noise on VR EF may not exceed +2% of the DC value. 6. VT T i s not applied directly to the device. VT T i s a system supply for signal termination resistors, is expected to be set equal to V RE F, and must track variations in the DC l evel of VR EF . 7. VI D i s the magnitude of the difference between the input level on CLK and the inputlevel on /CL K. 8. The value of VI X i s expected to equal 0.5*VDDQ of the transmitting device and must track variations in the DC l evel of the same. 9. Enables on-chip refresh and address counters. 10. ID D specifi cations are tested after the device is properly initialized. 11. This parameter is sampled. V DDQ = 2.5V+ 0.2V , V DD = 2.5V + 0.2V , f = 100 MH z, Ta = 25oC, VO UT (DC) = VDDQ /2, V OUT( PE AK TO PE AK ) = 25mV . D M i nputs are grouped with I/O pins - reflecting the fact that they are matched in loading (to facili tatetrace matching at the board level). 12. The CLK// CL K i nput reference level (for timing referenced to CL K //CLK ) i s the point at which CL K a nd /CLK cross; the inputreference level for signals other than CLK// CL K, is VR EF . 13. Inputs are not recognized as valid until V RE F stabili zes. Ex ception: during the period before V RE F stabili zes, CKE< 0.3VDDQ is recognized as LOW. 14. t HZ and tLZ transitions occur in the same access time windows as valid data transitions. T hese parameters are not referenced to a specific voltagelevel, but specify when the device outputis no longer driving (HZ ), or begins driving (LZ) . 15. The maximum limit for this parameter is not a device limit. The device will operate with a greater value for this parameter, but system performance (bus turnaround) will degrade accordingly. 16. The specific requirement is that DQS be vali d (HI GH , L OW , or at some point on a valid transition) on or before this CL K e dge. A vali d transition is defined as monotonic, and meeting the inputslew rate specifications of the device. When no writes were previously in progress on the bus, DQS wil l be transitioning from Hi gh-Z to logic L OW . I f a previous write was in progress, DQS could be HIG H, LOW, or transitioning from HI GH to LO W at this time, depending on tDQSS. 17. A maximum of eight AUT O R EF RE SH commands can be posted to any given DDR SD RA M device. 18. tX PR D should be 200 tCLK in the condition of the unstable CL K o peration during the power down mode. 19. For command/address and CK & / CK slew rate > 1.0V/ns. 20. Mi n (tCL, tCH) refers to the smaller of the actual clock low time and the actual clock high time as provided to the devi ce. Ti ming patterns: tCK= min,tRRD =2*tCK,B L= 4,tRCD=3*tCK ,R ead with Autoprecharge Read:A0 N A1 R0 A2 R1 N R 3 A 0 N A1 R 0 – repeat the same timing with random address changing *100% of datachanging at every burst Legend: A =Activate,R= Read,P=Precharge,N =NOP Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 17 IS43R32800B FUNCTIONAL DESCRIPTION The IS43R32800B is a 256Mb DDR SDRAM internally configured as a quad--bank DRAM. These 256Mb device contains 4 banks x 2,097,152 x32 bits. The DDR SDRAM uses a double--data--rate architecture to achieve high-speed operation. The double data rate architecture is essentially a 2n prefetch architecture, with an interface designed to transfer two data words per clock cycle at the I/O pins. A single read or write access for the DDR SDRAM consists of a single 2n-bit wide, one clock cycle data transfer at the internal DRAM core and two corresponding n-bit wide, one-half clock cycle data transfers at the I/O pins. Read and write accesses to the DDR SDRAM are burst oriented; accesses start at a selected location and continue for a programmed number of locations in a programmed sequence. Accesses begin with the registration of an ACTIVE command, which is then followed by a READ or WRITE command. The address bits registered coincident with the ACTIVE command are used to select the bank and row to be accessed (BA0, BA1 select the bank; A0-A11 select the row). The address bits registered coincident with the READ or WRITE command are used to select the starting column location for the burst access. Prior to normal operation, the DDR SDRAM must be initialized. The following sections provide detailed information covering device initialization, register definition, command descriptions and device operation. INITIALIZATION DDR SDRAMs must be powered up and initialized in a predefined manner. POWER ON SEQUENCE Before starting normal operation, the following power on sequence is necessary to prevent a DDR SDRAM from damaged or multi functioning. 1. Apply VDD before or the same time as VDDQ 2. Apply VDDQ before or at the same time as VTT & Vref 3. Maintain stable condition for 200us after stable power and CLK, apply NOP or DSEL 4. Issue precharge command for all banks of the device 5. Issue EMRS 6. Issue MRS for the Mode Register and to reset the DLL 7. Issue 2 or more Auto Refresh commands 8. Maintain stable condition for 200cycles After these sequence, the DDR SDRAM is idle state and ready for normal operation. 18 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B REGISTER DEFINITION MODE REGISTER The Mode Register is used to define the specific mode of operation of the DDR SDRAM. This definition includes the selection of a burst length, a burst type, a CAS latency, and an operating mode, as shown in Figure “MODE REGISTER DEFINITION”. The Mode Register is programmed via the MODE REGISTER SET (MRS) command (with BA0 = 0 and BA1 = 0) and will retain stored information until it is programmed again or the device loses power. Mode Register bits A0-A2 specify the burst length, A3 specifies the type of burst (sequential or interleaved), A4-A6 specify the CAS latency, and A7-A11 specify the operating mode. The Mode Register must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the specified time before initiating any subsequent operation. After tMRD from a MRS command the DDR SDRAM is ready for a new command. Violating either of these requirements will result in unspecified operation. CL K /CLK /CS /RAS /CAS /WE BA 1 B A0 A11 A 10 A9 A8 A7 A6 A5 A4 A3 A2 A1 BA 0 A0 BA 1 0 0 0 0 0 Latency Mode DR CL 0 0 0 0 0 1 0 1 1 0 1 0 1 1 1 1 LT MO DE 0 0 1 0 1 0 1 0 1 /CAS La tency R R 2 3 R R 2.5 R BT BL A11-A0 BL 0 0 0 0 0 1 0 1 1 0 1 0 1 1 1 1 Burst Le ngth Burst Type DL L R eset 0 NO 1 Y ES 0 1 0 1 0 1 0 1 V BT =0 R 2 4 8 R R R R BT =1 R 2 4 8 R R R R 0 Sequential 1 Interleaved R: Reserved for Future Use MODE REGISTER DEFINITION Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 19 IS43R32800B Burst Length Read and write accesses to the DDR SDRAM are burst oriented, with the burst length being programmable, as shown in Figure “CAS LATENCY”. The burst length determines the maximum number of column locations that can be accessed for a given READ or WRITE command. Burst lengths of 2, 4, or 8 locations are available for both the sequential and the interleaved burst types. Reserved states should not be used, as unknown operation or incompatibility with future versions may result. When a READ or WRITE command is issued, a block of columns equal to the burst length is effectively selected. All accesses for that burst take place within this block, meaning that the burst will wrap within the block if a boundary is reached. The block is uniquely selected by A1--Ai when the burst length is set to two, by A2--Ai when the burst length is set to four and by A3--Ai when the burst length is set to eight (where Ai is the most significant column address bit for a given configuration). The remaining (least significant) address bit(s) is (are) used to select the starting location within the block. The programmed burst length applies to both read and write bursts. Burst Type Accesses within a given burst may be programmed to be either sequential or interleaved; this is referred to as the burst type and is selected via bit A3. The ordering of accesses within a burst is determined by the burst length, the burst type and the starting column address, as shown in Table “BURST DEFINITION”. Read Latency The READ latency is the delay, in clock cycles, between the registration of a READ command and the availability of the first piece of output data. If a READ command is registered at clock edge n, and the latency is m clocks, the data will be available nominally coincident with clock edge n + m. Reserved states should not be used as unknown operation, or incompatibility with future versions may result. 20 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B CAS LATENCY /CLK CL K Read Command Address Wr ite Y Y DQS Q0 Q1 Q2 Q3 DQ CL = 2 BL = 4 D0 D1 D2 D3 Burst Length Burst Length /CAS La tency BURST DEFINITION Initial A ddress BL Column Addressing A2 A1 A0 Sequential Interleaved 0 0 0 0 1 2 3 4 5 6 7 0 1 2 3 4 5 6 7 0 0 1 1 2 3 4 5 6 7 0 1 0 3 2 5 4 7 6 0 1 0 2 3 4 5 6 7 0 1 2 3 0 1 6 7 4 5 0 1 1 3 4 5 6 7 0 1 2 3 2 1 0 7 6 5 4 8 1 0 0 4 5 6 7 0 1 2 3 4 5 6 7 0 1 2 3 1 0 1 5 6 7 0 1 2 3 4 5 4 7 6 1 0 3 2 1 1 0 6 7 0 1 2 3 4 5 6 7 4 5 2 3 0 1 1 1 1 7 0 1 2 3 4 5 7 6 5 4 2 1 0 - 0 0 0 1 2 3 0 1 2 3 - 0 1 1 2 3 0 1 0 3 2 6 3 4 - 1 0 2 3 0 1 2 3 0 1 - 1 1 3 0 1 2 3 2 1 0 - - 0 0 1 0 1 1 0 1 0 - - 1 2 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 21 IS43R32800B EXTENDED MODE REGISTER The Extended Mode Register controls functions beyond those controlled by the Mode Register; these additional functions include DLL enable/disable, output drive strength selection (optional). These functions are controlled via the bits shown in Figure EXTENDED MODE REGISTER. The Extended Mode Register is programmed via the MODE REGISTER SET command (with BA0 = 1 and BA1 = 0) and will retain the stored information until it is programmed again or the device loses power. The Extended Mode Register must be loaded when all banks are idle and no bursts are in progress, and the controller must wait the specified time before initiating any subsequent operation. After tMRD from a MRS command the DDR SDRAM is ready for a new command. Violating either of these requirements will result in unspecified operation. DLL Enable/Disable The DLL must be enabled for normal operation. DLL enable is required during power-up initialization, and upon returning to normal operation after having disabled the DLL for the purpose of debug or evaluation (upon exiting Self Refresh Mode, the DLL is enabled automatically). Any time the DLL is enabled a DLL Reset must follow and 200 clock cycles must occur before any executable command can be issued. Output Drive Strength The normal drive strength for all outputs is specified to be SSTL_2, Class II. The ISSI DDR SDRAM also supports a weak driver strength option, intended for lighter load and/or point-to-point environments. CL K /CLK /CS /RAS /CAS EXTENDED MODE REGISTER BA 1 B A0 A11 A 10 A9 A8 A7 A6 A5 A4 A3 A2 A1 /WE A0 BA 0 0 1 0 0 0 0 0 0 0 0 0 0 DS DD BA 1 V A11-A0 DL L D isable Drive Strength 22 0 1 0 1 DLL Enable DLL Disable Normal Weak Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B Read Operation tCK /CLK tCH tCL CL K tIS Cm d & Add. Va lid Da ta tDQS CK DQ S tIH VREF tR PS T tR PR E tQH tDQS Q DQ tAC Write O pe ra tion / tDQSS=max. /CLK CL K tDQS S tWPS T tDSS tWPR ES DQ S tDQS L tWPR E tDQS H tDS t DH DQ Write O pe ra tion / tDQSS=min. /CLK CL K DQ S tDSH tDQS S tWPS T tWPR ES tWPR E tDQS L tDS tDQ SH t DH DQ Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 23 IS43R32800B OPERATIONAL DESCRIPTION BANK ACTIVATE The DDR SDRAM has four independent banks. E ach bank is activated by the ACT command with the bank addresses (BA 0,1). A row is indicated by the row address A0-11. The minimum activation interval betweenone bank and the other bank is tRRD . PRECHARGE The PRE command deactivates the bank indicated by BA 0,1. When multiple banks are active, the prechargeall command (PRE A, PRE+ A8 =H) is available to deactivate them at the same time. A fter tRP from the precharge, an AC T c ommand to the same bank can be issued. Bank Activation and PrechargeAll (BL=8, CL=2) /CLK CL K 2 ACT command / tRCmi n tRCmin Command AC T AC T RE AD tRRD A0-7 ,9-11 Xa Xb BA 0,1 AC T tRP tRAS Y tRCD A8 PR E Xb BL /2 Xa Xb 0 00 01 00 1 Xb 01 DQS DQ Qa0 Qa1 Qa2 Qa3 Qa4 Qa5 Qa6 Qa7 Precharge all A precharge command can be issued at BL/2 from a read command without data loss. 24 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B READ Af ter tRCD from the bank activation, a REA D command can be issued. 1st Output data is available after the /CAS La tency from the RE AD , followed by (BL-1 ) consecutive data when the Burst Le ngth is BL . T he start address is specified by A0 -7,9, and the address sequence of burst data is defined by the Burst Ty pe. A RE AD command may be applied to any active bank, so the row precharge time (tRP ) can be hidden behind continuous output data by interleaving the multiple banks. When A8 is high at a REA D command, the auto-precharge (READA ) is performed. A ny command(RE AD ,W RI TE,P RE ,A CT ) to the same bank is inhibited till the internal precharge is complete. T he internal precharge starts at BL/2 after RE AD A. The next ACT command can be issued after (BL/2+t RP ) from the previous RE AD A. Mu lti B ank I nterleaving R EA D ( BL =8, C L=2) /CLK CL K Command AC T RE AD AC T RE AD PR E tRCD A0-7 ,9-11 Xa Y Xb Y A8 Xa 0 Xb 0 0 00 00 10 10 00 BA 0,1 DQS DQ Qa0 Qa1 Qa2 Qa3 Qa4 Qa5 Qa6 Qa7 Qb0 Qb1 Qb2 Qb3 Qb4 Qb5 Qb7 Qb8 Burst Length /CAS latency Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 25 IS43R32800B READ with Auto-Precharge(BL=8, CL=2,2.5,3.0) 0 1 2 3 4 5 /CLK CL K Command A8 BA 0,1 7 8 9 10 11 12 BL /2 + tRP AC T RE AD tRCD A0-7 ,9-11 6 tRP BL /2 Xa Y Xa 1 00 00 DQS CL =2 DQ Qa0 Qa1 Qa2 Qa3 Qa4 Qa5 Qa6 Qa7 Qa0 Qa1 Qa2 Qa3 Qa4 Qa5 Qa6 Qa7 Qa0 Qa1 Qa2 Qa3 Qa4 Qa5 Qa6 DQS CL =2.5 DQ DQS CL =3.0 DQ Qa7 Internal Precharge Start Timing 26 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B WRITE Af ter tRCD from the bank activation, a WRI TE command can be issued. 1st input data is set from the WRI TE command with data strobe input, following (B L- 1) data are written into RA M, when the Burst Length is BL . T he start address is specified by A0 -7,9, and the address sequence of burst data is defined by the Burst Type. A W RI TE command may be applied to any active bank, so the row precharge time (tRP ) can be hidden behind continuous input data by interleaving the multiple banks. From the last data to the PR E command, the write recovery time (tWR P) is required. W hen A8 is high at a WRI TE command, the auto-precharge(WRI TE A) is performed. Any command(RE AD ,W RI TE,P RE ,A CT ) to the same bank is inhibited till the internal precharge is complete. T he next AC T c ommand can be issued after tDAL from the last input data cycle. Multi B ank I nterleaving WRITE (B L=8) /CLK CL K Command A0-7 ,9-11 A8 BA 0,1 AC T Xa WR IT E tRCD D WR IT E AC T tRCD D PR E PR E Ya Xb Yb Xa Xa 0 Xb 0 0 0 00 00 10 10 00 10 DQS DQ Da0 Da1 Da2 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 Da3 Da4 Da5 Da6 Da7 Db0 Db1 Db2 Db3 Db4 Db5 Db6 Db7 27 IS43R32800B WRITE w ith A uto-Prechar ge (B L=8) 0 1 2 3 4 5 6 7 8 9 10 11 12 /CLK CL K Command AC T WR IT E AC T tDAL tRC A0-7 ,9-11 A8 BA 0,1 Xa Y Xb Xa 1 Xb 00 00 00 D DQS DQ 28 Da0 Da1 Da2 Da3 Da4 Da5 Da6 Da7 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B BURST INTERRUPTION Read I nterru pted by Read Burst read operation can be interrupted by new read of any bank. R andom column access is allowed. RE AD to RE AD interval is minimum 1CL K. Read Int err upted by Read (B L=8, CL=2 ) /CLK CL K Command A0-7 ,9-11 A8 BA 0,1 RE AD RE AD RE AD Yi Yj Yk 0 0 0 00 00 10 RE AD Yl 0 01 DQS DQ Qai0 Qai1 Qaj0 Qaj1 Qaj2 Qaj3 Qak0 Qak1 Qak2 Qak3 Qak4 Qak5 Qal0 Qal1 Qal2 Qal3 Qal4 Qal5 Qal6 Qal7 R ead I nterru pted by prechar ge Burst read operation can be interrupted by precharge of the same bank. R EA D to PRE interval is minimum 1 CL K. A P RE command to output disable latency is equivalent to the /CA S L atency. As a result, RE AD to PR E i nterval determines valid data length to be output. T he figure below shows examples of B L=8. Read Int err upted by Prechar ge (B L=8) /CLK CL K Command RE AD PR E DQS DQ Command CL=2 .0 Q0 Q1 Q2 Q3 Q0 Q1 Q2 Q3 Q0 Q1 Q4 Q5 PR E RE AD DQS DQ Command RE AD PR E DQS DQ Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 29 IS43R32800B Read Int err upted by Prechar ge (B L=8) /CLK CL K Command RE AD PR E DQS DQ Command CL=2 .5 RE AD Q0 Q1 Q2 Q3 Q0 Q1 Q2 Q3 Q0 Q1 Q4 Q5 PR E DQS DQ Command RE AD PR E DQS DQ Read Int err upted by Prechar ge (B L=8) /CLK CL K Command RE AD PR E DQS DQ Command CL=3 .0 Q0 Q1 Q2 Q3 Q0 Q1 Q2 Q3 Q0 Q1 Q4 Q5 PR E RE AD DQS DQ Command RE AD PR E DQS DQ 30 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B Read I nterru pted by Bu rs t Stop Burst read operation can be interrupted by a burst stop command(TE RM). RE AD to TE RM interval is minimum 1 CL K. A T ER M command to output disable latency is equivalent to the /CA S L atency. As a result, RE AD to TE RM interval determines valid data length to be output. The figure below shows examples of B L=8. Read Int err upted by TER M ( BL =8) /CLK CL K Command RE AD TE RM DQS Q0 DQ Command CL=2 .0 RE AD Q1 Q2 Q3 Q0 Q1 Q2 Q3 Q0 Q1 Q4 Q5 Q4 TE RM DQS DQ Command RE AD TE RM DQS DQ Command RE AD TE RM DQS DQ Command CL=2 .5 RE AD Q0 Q1 Q2 Q3 Q0 Q1 Q2 Q3 Q0 Q1 Q5 TE RM DQS DQ Command RE AD TE RM DQS DQ Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 31 IS43R32800B Read Int err upted by TER M ( BL =8) /CLK CL K RE AD Command TE RM DQS DQ RE AD Command CL=3 .0 Q0 Q1 Q2 Q3 Q0 Q1 Q2 Q3 Q0 Q1 Q4 Q5 TE RM DQS DQ RE AD TE RM Command DQS DQ R ead I nterru pted by Wr ite with T ER M Read Int err upted by TER M ( BL =8) /CLK CL K Command CL=2 .0 RE AD Command Q0 RE AD Q2 D0 Q3 D1 D2 D3 D4 D5 D6 D7 D0 D1 D2 D3 D4 D5 D0 D2 D3 D4 D5 WR IT E DQS Command Q0 RE AD Q1 Q2 Q3 TER M WR IT E DQS DQ 32 Q1 TER M DQ CL=3 .0 WR IT E DQS DQ CL=2 .5 TER M Q0 Q1 Q2 Q3 D1 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B W rite interr uptedby Write Burst write operation can be interrupted by write of any bank. R andom column access is allowed. WRIT E to WRI TE interval is minimum 1 CL K. Wr ite Interrupted by Wr ite (BL =8) /CLK CL K Command A0-7 ,9-11 A8 BA 0,1 WR IT E WR IT E WR IT E WR IT E Yi Yj Yk Yl 0 0 0 0 00 00 10 00 DQS DQ Dai0 Dai1 Daj0 Daj1 Daj2 Daj3 Dak0 Dak1 Dak2 Dak3 Dak4 Dak5 Dal0 Dal1 Dal2 Dal3 Dal4 Dal5 Dal6 Dal7 Wri te interr upted by Read Burst write operation can be interrupted by read of the same or the other bank. Ra ndom column access is allowed. I nternal W RI TE to RE AD command interval(tWT R) is minimum 1 CL K. The inputdata on DQ at the interrupting REA D cycle is "don't care". tWTR is referenced from the first positive edgeafter the last data input. Wr ite Interrupted by Read (BL=8, CL=2 .5) /CLK CL K Command A0-7 ,9-11 A8 BA 0,1 WR IT E RE AD Yi Yj 0 0 00 00 DM tWTR QS DQ Dai0 Dai1 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 Qaj0 Qaj1 Qaj2 Qaj3 Qaj4 Qaj5 Qaj6 Qaj7 33 IS43R32800B W ri te interrupted by Pr echarge Burst write operation can be interrupted by precharge of the same or all bank. Ra ndom column access is allowed. tWR is referenced from the first positive CL K e dgeafter the last data input. Wr ite Interr upted by Prechar ge (B L=8, CL=2 .5) /CLK CL K Command A0-7 ,9-11 A8 BA 0,1 WR IT E PR E Yi 0 00 00 tWR DM QS DQ 34 Dai0 Dai1 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B I nitial ize and Mode Registersets In itia li ze and M RS /CLK CL K CK E Command NOP PR E A0-7 ,9-11 1 A8 BA 0,1 EM RS MR S Code Code Code Code 10 00 PR E AR AR MR S AC T Xa 1 Code Xa 00 Xa DQS DQ tMRD Ex tendedMode Register Set tMRD tRP tRFC tRFC tMRD Mode Register Set, Reset DLL AUTO R EFRESH Single cycle of auto-refresh is initiated with a REF A( /CS=/R AS =/CA S=L, /WE=CK E=H) command. The refresh address is generated internally. 4096 RE FA cycles within 64ms refresh 256Mbits memory cells. The auto-refresh is performed on 4 banks concurrently. B efore performing an auto refresh, all banks must be in the idle state. A uto-refresh to auto-refresh interval is minimum tRFC . A ny command must not be supplied to the device before tRF C from the RE FA command. Auto-Ref resh /CLK CL K /CS NOP or DESEL EC T /RAS /CAS /WE CK E tRFC A0-1 1 BA 0,1 Auto Refresh on Al l B anks Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 Auto Refresh on All Ba nks 35 IS43R32800B S ELF REFRESH Self -refresh mode is entered by issuing a REF S command (/CS=/RA S=/CAS =L ,/WE =H,C KE =L ). Once the self-refresh is initiated, it is maintained as long as C KE is kept low. During the selfrefresh mode, CK E i s asynchronous and the only enable input, all other inputs including CL K a re disabled and ignored, so that power consumption dueto synchronous inputs is saved. T o exit the self-refresh, supplying stable CLK inputs, asserting DESEL or NOP command and then asserting CK E f or longer than tX SNR/ tXSRD. Self-R efresh /CLK CL K /CS /RAS /CAS /WE CK E A0-1 1 X Y BA 0,1 X Y tX SN R tX SR D Self Refresh Exit 36 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B P ower DOWN The purpose of CL K s uspend is power down. CK E i s synchronous input except during the selfrefresh mode. A c ommand at cycle is ignored. F rom CKE =H to normal function, D LL recovery time is NOT required in the condition of the stable CLK operation during the power down mode. Power D own by C KE /CLK CL K Standby Power Down CK E Command PR E NOP NOP Va lid tX PNR /tXPR D Active Power Down CK E Command AC T NOP NOP Va lid D M C ONTROL DM is defined as the data mask for writes. During writes,D M masks inputdata word by word. D M to write mask latency is 0. DM F unction(B L=8, CL=2 ) /CLK CL K Command WR IT E RE AD DM Don't Care DQS DQ D0 D1 D3 D4 D5 D6 D7 Q0 Q1 Q2 Q3 Q4 Q5 Q6 masked by DM=H Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 37 IS43R32800B ORDERING INFORMATION - Vdd = 2.5V Commercial Range: 0oC to +70oC Frequency Speed (ns) Order Part No. Organization Package 200 MHz 5 IS43R32800B-5B 8Mx32 144-ball fBGA 200 MHz 5 IS43R32800B-5BL 8Mx32 144-ball fBGA, Lead-free 166 MHz 6 IS43R32800B-6B 8Mx32 144-ball fBGA 166 MHz 6 IS43R32800B-6BL 8Mx32 144-ball fBGA, Lead-free 133 MHz 7.5 IS43R32800B-75B 8Mx32 144-ball fBGA 133 MHz 7.5 IS43R32800B-75BL 8Mx32 144-ball fBGA, Lead-free Industrial Range: -40oC to +85oC Frequency Speed (ns) Order Part No. Organization Package 200 MHz 5 IS43R32800B-5BI 8Mx32 144-ball fBGA 200 MHz 5 IS43R32800B-5BLI 8Mx32 144-ball fBGA, Lead-free 166 MHz 6 IS43R32800B-6BI 8Mx32 144-ball fBGA 166 MHz 6 IS43R32800B-6BLI 8Mx32 144-ball fBGA, Lead-free 133 MHz 7.5 IS43R32800B-75BI 8Mx32 144-ball fBGA 133 MHz 7.5 IS43R32800B-75BLI 8Mx32 144-ball fBGA, Lead-free 38 Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 IS43R32800B Mini Ball Grid Array Package Code: B (144-Ball) ø 0.45 +/− 0.05 (144X) 12 11 10 9 8 7 6 5 4 3 2 1 1 2 3 4 5 6 7 8 9 10 11 12 A B C D E F G H J K L M A B C D E F G H J K L M e D1 D E1 e E A1 A Notes: 1. Controlling dimensions are in millimeters. 2. 0.8 mm Ball Pitch SEATING PLANE mBGA - 12mm x 12mm MILLIMETERS Sym. Min. Typ. Max. N0. Leads 144 A 1.17 A1 0.32 D 11.95 D1 — INCHES Min. Typ. Max. 0.046 0.049 0.055 1.25 1.40 0.35 0.38 0.013 0.014 0.015 12.00 12.05 0.470 0.472 0.474 — 0.346 — 8.80 — E 11.95 0.470 0.472 0.474 E1 — 12.00 12.05 8.80 — — 0.346 — e — 0.80 — — 0.031 — Integrated Silicon Solution, Inc. — www.issi.com Rev. 00D 03/19/08 39