MGCHIP MDU5593S Dual asymmetric n-channel trench mosfet 30v Datasheet

Dual Asymmetric N-channel Trench MOSFET 30V
General Description
Features
The MDU5593S uses advanced MagnaChip’s MOSFET
Technology, which provides high performance in on-state
resistance, fast switching performance and excellent
quality. MDU5593S is suitable for DC/DC converter and
general purpose applications.
FET1
VDS = 30V
ID = 34A
RDS(ON)
< 8.0mΩ
< 11.0mΩ
100% UIL Tested
100% Rg Tested





5
FET2
VDS = 30V
ID = 40A @VGS = 10V
< 3.3mΩ @VGS = 10V
< 5.0mΩ @VGS = 4.5V
S2
6
S2
7
S2
8
G2
S1/D2
1
3
D1
2
3
2
D1
1
D1
4
G1
Absolute Maximum Ratings (Ta = 25oC)
Characteristics
Symbol
Drain-Source Voltage
FET1
VDSS
Gate-Source Voltage
VGSS
TC=25oC (Silicon Limited)
Continuous Drain Current (1)
TC=25oC (Package Limited)
ID
o
TA=25 C
Pulsed Drain Current
IDM
o
TC=25 C
Power Dissipation
PD
o
TA=25 C
Single Pulse Avalanche Energy (2)
EAS
Junction and Storage Temperature Range
FET2
Unit
30
V
±20
±20
52
95
34
40
13
21
40
100
35.7
44.6
2.2
2.5
60
60
TJ, Tstg
V
A
A
W
mJ
o
-55~150
C
Thermal Characteristics
Characteristics
Thermal Resistance, Junction-to-Ambient
(1)
Thermal Resistance, Junction-to-Case
Jun. 2013 Ver1.2
1
Symbol
FET1
FET2
RθJA
57
50
RθJC
3.5
2.8
Unit
o
C/W
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
MDU5593S
Part Number
Temp. Range
Package
Packing
RoHS Status
MDU5593SVRH
-55~150oC
Dual PDFN56
Tape & Reel
Halogen Free
FET1 Electrical Characteristics (Ta =25oC)
Characteristics
Symbol
Test Condition
Min
Typ
Max
Unit
Static Characteristics
Drain-Source Breakdown Voltage
BVDSS
ID = 1mA, VGS = 0V
30
-
-
Gate Threshold Voltage
VGS(th)
VDS = VGS, ID = 250μA
1.0
1.8
3.0
Drain Cut-Off Current
IDSS
VDS = 24V, VGS = 0V
-
-
1
Gate Leakage Current
IGSS
VGS = ±20V, VDS = 0V
-
-
±0.1
VGS = 10V, ID = 13A
-
5.1
8.0
VGS = 4.5V, ID = 11A
-
7.2
11.0
VDS = 5V, ID = 13A
-
35
-
Drain-Source ON Resistance
Forward Transconductance
RDS(ON)
gfs
V
μA
mΩ
S
Dynamic Characteristics
Total Gate Charge
Qg(10V)
-
18.0
-
Total Gate Charge
Qg(4.5V)
-
9.5
-
-
3.2
-
Gate-Source Charge
Qgs
VDS = 15.0V, ID = 10A,
VGS = 10V
Gate-Drain Charge
Qgd
-
3.2
-
Input Capacitance
Ciss
-
1,142
-
-
446
-
Output Capacitance
Coss
VDS = 15.0V, VGS = 0V,
f = 1.0MHz
nC
pF
Reverse Transfer Capacitance
Crss
-
83
-
Turn-On Delay Time
td(on)
-
9.9
-
-
12.1
-
-
28.5
-
-
6.9
-
-
1.0
-
-
0.7
1.0
V
-
31.8
-
ns
-
29.4
-
nC
Rise Time
Turn-Off Delay Time
Fall Time
Gate Resistance
tr
td(off)
VDD=15V, ID=10A, Rg=3Ω
tf
Rg
f=1 MHz
ns
Ω
Drain-Source Body Diode Characteristics
Source-Drain Diode Forward Voltage
VSD
Body Diode Reverse Recovery Time
trr
Body Diode Reverse Recovery Charge
Qrr
IS = 1A, VGS = 0V
IF = 10A, dl/dt = 100A/μs
Note :
1. Surface mounted FR-4 board by JEDEC (jesd51-7). Continuous current at TC=25℃ is silicon limited.
2. EAS is tested at starting Tj = 25℃, L = 0.5mH, IAS = 15.5A, VDD = 27V, VGS = 10V. And 100% UIL Test at L = 0.1mH, IAS = 18.0A.
Jun. 2013 Ver1.2
2
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
Ordering Information
VGS = 10V
Drain-Source On-Resistance [mΩ]
4.5V
8.0V
4.0V
40
ID, Drain Current [A]
5.0V
30
3.5V
20
10
3.0V
0
0.0
0.2
0.4
0.6
0.8
8
VGS = 4.5V
7
6
VGS = 10V
5
4
1.0
10
20
VDS, Drain-Source Voltage [V]
30
40
Fig.2 On-Resistance Variation with
Drain Current and Gate Voltage
Fig.1 On-Region Characteristics
1.8
20
※ Notes :
※ Notes :
1. VGS = 10 V
2. ID = 13 A
1.6
ID = 13A
RDS(ON) [mΩ ],
Drain-Source On-Resistance
RDS(ON), (Normalized)
Drain-Source On-Resistance
50
ID, Drain Current [A]
1.4
1.2
1.0
0.8
0.6
-50
-25
0
25
50
75
100
125
16
12
TJ = 25
℃
8
4
150
3
4
5
6
7
8
9
10
o
TJ, Junction Temperature [ C]
VGS, Gate to Source Volatge [V]
Fig.3 On-Resistance Variation with
Temperature
Area
Fig.4 On-Resistance Variation with
Gate to Source Voltage
25
※ Notes :
※ Notes :
VGS = 0V
IDR, Reverse Drain Current [A]
VDS = 5V
ID, Drain Current [A]
20
15
TJ=25
℃
10
5
1
10
TJ=25
℃
0
10
-1
10
0
1
2
3
4
5
Fig.5 Transfer Characteristics
Jun. 2013 Ver1.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
1.1
VSD, Source-Drain voltage [V]
VGS, Gate-Source Voltage [V]
Fig.6 Body Diode Forward Voltage
Variation with Source Current and
Temperature
3
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
9
50
8
1200
Capacitance [F]
VGS, Gate-Source Voltage [V]
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
Ciss
※ Note : ID = 10A
6
4
800
※ Notes ;
Coss
1. VGS = 0 V
2. f = 1 MHz
400
2
Crss
0
0
5
10
15
0
20
0
10
QG, Total Gate Charge [nC]
Fig.7 Gate Charge Characteristics
10
20
30
VDS, Drain-Source Voltage [V]
Fig.8 Capacitance Characteristics
2
60
50
10
1
Operation in This Area
is Limited by R DS(on)
10
ID, Drain Current [A]
ID, Drain Current [A]
10 ms
100 ms
1s
10 s
DC
0
40
30
Limited by Package
20
10
Single Pulse
TJ=Max Rated
TA=25
℃
10
-1
10
-1
10
0
10
1
10
0
25
2
50
75
100
125
150
TC, Case Temperature [ ]
VDS, Drain-Source Voltage [V]
℃
Fig.10 Maximum Drain Current vs. Case
Temperature
Fig.9 Maximum Safe Operating Area
1
D=0.5
0
10 0.2
0.1
0.05
-1
10
※ Notes :
0.02
Duty Factor, D=t 1/t2
PEAK TJ = PDM * Zθ JA* Rθ JA(t) + TA
0.01
single pulse
-2
10
Zθ
JA
, Normalized Thermal Response
10
-3
10
-4
10
-3
10
-2
10
-1
10
0
10
1
10
2
10
3
10
t1, Rectangular Pulse Duration [sec]
Fig.11 Transient Thermal Response Curve
Jun. 2013 Ver1.2
4
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
1600
10
Characteristics
Symbol
Test Condition
Min
Typ
Max
Unit
Static Characteristics
Drain-Source Breakdown Voltage
BVDSS
ID = 1mA, VGS = 0V
30
-
-
Gate Threshold Voltage
VGS(th)
VDS = VGS, ID = 250μA
1.3
1.8
3.0
Drain Cut-Off Current
IDSS
VDS = 24V, VGS = 0V
-
-
500
Gate Leakage Current
IGSS
VGS = ±20V, VDS = 0V
-
-
±0.1
VGS = 10V, ID = 27A
-
2.8
3.3
VGS = 4.5V, ID = 21A
-
4.0
5.0
VDS = 5V, ID = 21A
-
46
-
Qg(10V)
-
26.1
-
Qg(4.5V)
-
12.6
-
-
4.5
-
Drain-Source ON Resistance
Forward Transconductance
RDS(ON)
gfs
V
μA
mΩ
S
Dynamic Characteristics
Total Gate Charge
Total Gate Charge
VDS = 15.0V, ID = 20A,
VGS = 10V
Gate-Source Charge
Qgs
Gate-Drain Charge
Qgd
-
4.2
-
Input Capacitance
Ciss
-
1785
-
Output Capacitance
Coss
-
652
-
98
-
VDS = 15.0V, VGS = 0V,
f = 1.0MHz
Reverse Transfer Capacitance
Crss
-
Turn-On Delay Time
td(on)
-
11.9
-
tr
-
8.9
-
-
45.5
-
Rise Time
Turn-Off Delay Time
Fall Time
td(off)
VDD=15V, ID=20A, Rg=6Ω
pF
ns
-
14.5
-
Rg
f=1 MHz
-
1.0
-
Source-Drain Diode Forward Voltage
VSD
IS = 1.0A, VGS = 0V
-
0.4
0.7
V
Body Diode Reverse Recovery Time
trr
-
33.2
-
ns
Body Diode Reverse Recovery Charge
Qrr
-
28.5
-
nC
Gate Resistance
tf
nC
Ω
Drain-Source Body Diode Characteristics
IF = 27A, dl/dt = 150A/μs
Note :
1. Surface mounted FR-4 board by JEDEC (jesd51-7). Continuous current at TC=25℃ is silicon limited.
2. EAS is tested at starting Tj = 25℃, L = 0.5mH, IAS = 15.5A, VDD = 27V, VGS = 10V. And 100% UIL Test at L = 0.1mH, IAS = 18.0A.
Jun. 2013 Ver1.2
5
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
FET2 Electrical Characteristics (Ta =25oC)
Drain-Source On-Resistance [mΩ]
VGS = 10V
4.5V
ID, Drain Current [A]
40
4.0V
3.5V
30
20
3.0V
10
0
0.0
0.2
0.4
0.6
0.8
4.5
VGS = 4.5V
4.0
3.5
VGS = 10V
3.0
2.5
2.0
1.0
10
20
VDS, Drain-Source Voltage [V]
40
50
Fig.2 On-Resistance Variation with
Drain Current and Gate Voltage
Fig.1 On-Region Characteristics
1.8
20
※ Notes :
※ Notes :
18
1. VGS = 10 V
2. ID = 21 A
1.6
RDS(ON) [mΩ ],
Drain-Source On-Resistance
RDS(ON), (Normalized)
Drain-Source On-Resistance
30
ID, Drain Current [A]
1.4
1.2
1.0
0.8
ID = 21A
16
14
12
10
8
6
TJ = 25
℃
4
2
0.6
-50
-25
0
25
50
75
100
125
0
150
2
3
4
o
TJ, Junction Temperature [ C]
5
6
7
8
9
10
VGS, Gate to Source Volatge [V]
Fig.3 On-Resistance Variation with
Temperature
Area
Fig.4 On-Resistance Variation with
Gate to Source Voltage
25
※ Notes :
※ Notes :
VGS = 0V
VDS = 5V
15
TJ=25
IDR, Reverse Drain Current [A]
ID, Drain Current [A]
20
℃
10
5
0
1
2
3
TJ=25
℃
0
10
-1
4
10
VGS, Gate-Source Voltage [V]
0.0
0.1
0.2
0.3
0.4
0.5
0.6
0.7
0.8
0.9
1.0
VSD, Source-Drain voltage [V]
Fig.5 Transfer Characteristics
Jun. 2013 Ver1.2
1
10
Fig.6 Body Diode Forward Voltage
Variation with Source Current and
Temperature
6
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
5.0
50
Ciss = Cgs + Cgd (Cds = shorted)
Coss = Cds + Cgd
Crss = Cgd
※ Note : ID = 20A
Capacitance [F]
VGS, Gate-Source Voltage [V]
8
6
4
2000
Ciss
Coss
1000
※ Notes ;
1. VGS = 0 V
2. f = 1 MHz
2
Crss
0
0
0
10
20
0
30
10
QG, Total Gate Charge [nC]
Fig.7 Gate Charge Characteristics
10
2
100
ID, Drain Current [A]
ID, Drain Current [A]
80
1
100 ms
Operation in This Area
is Limited by R DS(on)
1s
10
30
Fig.8 Capacitance Characteristics
10 ms
10
20
VDS, Drain-Source Voltage [V]
10 s
DC
0
60
40
Limited by Package
20
Single Pulse
TJ=Max Rated
TA=25
℃
10
-1
10
-2
10
-1
10
0
10
1
10
0
25
2
50
75
100
125
150
TC, Case Temperature [ ]
VDS, Drain-Source Voltage [V]
℃
Fig.10 Maximum Drain Current vs. Case
Temperature
Fig.9 Maximum Safe Operating Area
1
D=0.5
0
10
0.2
0.1
0.05
-1
※ Notes :
Duty Factor, D=t1/t2
PEAK TJ = PDM * Zθ JA* Rθ JA(t) + TA
0.02
10
0.01
-2
10
Zθ
JA
, Normalized Thermal Response
10
single pulse
-3
10
-4
10
-3
10
-2
10
-1
10
0
10
1
10
2
10
3
10
t1, Rectangular Pulse Duration [sec]
Fig.11 Transient Thermal Response Curve
Jun. 2013 Ver1.2
7
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
3000
10
MDU5593S - Dual N-Channel Trench MOSFET 30V
Package Dimension
Dual PDFN56 (5x6mm)
Dimensions are in millimeters, unless otherwise specified
Jun. 2013 Ver1.2
8
MagnaChip Semiconductor Ltd.
MDU5593S - Dual N-Channel Trench MOSFET 30V
DISCLAIMER:
The Products are not designed for use in hostile environments, including, without limitation, aircraft, nuclear power
generation, medical appliances, and devices or systems in which malfunction of any Product can reasonably be
expected to result in a personal injury. Seller’s customers using or selling Seller’s products for use in such
applications do so at their own risk and agree to fully defend and indemnify Seller.
MagnaChip reserves the right to change the specifications and circuitry without notice at any time. MagnaChip does not consider responsibility
for use of any circuitry other than circuitry entirely included in a MagnaChip product.
is a registered trademark of MagnaChip
Semiconductor Ltd.
Jun. 2013 Ver1.2
9
MagnaChip Semiconductor Ltd.
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