Microchip MCP3913A1-E/SS 3v six-channel analog front end Datasheet

MCP3913
3V Six-Channel Analog Front End
Features:
Description:
• Six Synchronous Sampling 24-bit Resolution
Delta-Sigma A/D Converters
• 94.5 dB SINAD, -107 dBc Total Harmonic
Distortion (THD) (up to 35th Harmonic), 112 dBFS
SFDR for Each Channel
• Enables 0.1% Typical Active Power Measurement
Error over a 10,000:1 Dynamic Range
• Advanced Security Features:
- 16-bit Cyclic Redundancy Check (CRC)
Checksum on All Communications for Secure
Data Transfers
- 16-bit CRC Checksum and Interrupt Alert for
Register Map Configuration
- Register Map lock with 8-bit Secure Key
• 2.7V-3.6V AVDD, DVDD
• Programmable Data Rate up to 125 ksps:
- 4 MHz Maximum Sampling Frequency
- 16 MHz Maximum Master Clock
• Oversampling Ratio up to 4096
• Ultra-Low Power Shutdown Mode with < 10 µA
• -122 dB Crosstalk between Channels
• Low Drift 1.2V Internal Voltage Reference:
9 ppm/°C
• Differential Voltage Reference Input Pins
• High Gain PGA on Each Channel (up to 32 V/V)
• Phase Delay Compensation with 1 µs Time
Resolution
• Separate Data Ready Pin for Easy
Synchronization
• Individual 24-bit Digital Offset and Gain Error
Correction for Each Channel
• High-Speed 20 MHz SPI Interface with Mode 0,0
and 1,1 Compatibility
• Continuous Read/Write Modes for Minimum
Communication Time with Dedicated 16/32-bit
Modes
• Available in a 40-lead UQFN and 28-lead SSOP
Packages
• Extended Temperature Range: -40°C to +125°C
The MCP3913 is a 3V six-channel Analog Front End
(AFE), containing six synchronous sampling deltasigma, Analog-to-Digital Converters (ADC), six PGAs,
phase delay compensation block, low-drift internal
voltage reference, digital offset and gain error
calibration registers, and high-speed 20 MHz
SPI-compatible serial interface.
The MCP3913 ADCs are fully configurable, with
features such as: 16/24-bit resolution, Oversampling
Ratio (OSR) from 32 to 4096, gain from 1x to 32x,
independent Shutdown and Reset, dithering and autozeroing. The communication is largely simplified with 8bit commands, including various continuous read/write
modes and 16/24/32-bit data formats that can be
accessed by the Direct Memory Access (DMA) of an
8/16- or 32-bit MCU, and with the separate data ready
pin that can directly be connected to an Interrupt
Request (IRQ) input of an MCU.
The MCP3913 includes advanced security features to
secure the communications and the configuration
settings, such as a CRC-16 checksum on both serial
data outputs and static register map configuration. It
also includes a register-map lock through an 8-bit
secure key to stop unwanted write commands from
processing.
The MCP3913 is capable of interfacing with a variety of
voltage and current sensors, including shunts, current
transformers, Rogowski coils and Hall-effect sensors.
 2013 Microchip Technology Inc.
Applications:
•
•
•
•
•
•
Polyphase Energy Meters
Energy Metering and Power Measurement
Automotive
Portable Instrumentation
Medical and Power Monitoring
Audio/Voice Recognition
DS20005227A-page 1
MCP3913
27
26
CH1-
4
25
SDO
CH1+
5
24
SCK
CH2+
6
23
CS
CH2-
7
8
9
10
22
21
20
19
OSC2
NC
DVDD
DGND
26 OSC2
EP
41
5
NC
25 OSC1/CLKI
NC 6
CH4+ 7
24 DGND
NC
CH4- 8
23 NC
DR
CH5- 9
22 DR
DGND
CH5+ 10
13
16
AGND
14
15
REFIN-
* Includes Exposed Thermal Pad (EP); see Table 3-1.
NC
DVDD
CH5+
REFIN+/OUT
21 DGND
11 12 13 14 15 16 17 18 19 20
AVDD
17
AGND
27 CS
OSC1/CLKI
DGND
18
12
CH3+ 4
REFIN+/
OUT
REFINAGND
CH5-
28 SCK
NC
11
CH3- 3
NC
CH4-
CH2- 2
30 SDI
29 SDO
CH2+ 1
SDI
NC
CH4+
40 39 38 37 36 35 34 33 32 31
NC
CH3CH3+
RESET
CH0-
2
3
AVDD
DVDD
RESET
1
CH0+
28
AVDD
CH0+
CH1+
MCP3913
5x5 UQFN*
CH0-
MCP3913
SSOP
CH1-
Package Type
Functional Block Diagram
REFIN+/OUT
AVDD
Voltage
Reference
+
DVDD
Vref
REFIN-
Xtal Oscillator
AMCLK
VREFEXT
Clock
Generation
DMCLK/DRCLK
Vref- Vref+
DMCLK
OFFCAL_CH0
<23:0>
OSR/2PHASE1 <11:0>
CH0+
+
CH0-
-
)
MOD<3:0>
PGA
'6
Modulator
SINC3+
SINC1
Phase
Shifter
OSR/2
CH1+
+
CH1-
PGA
)
MOD<7:4>
'6
Modulator
SINC3+
SINC1
Phase
Shifter
OSR/2PHASE1 <23:12>
CH2+
+
CH2-
PGA
CH3+
+
CH3-
PGA
'6
Modulator
+
CH4-
PGA
+
CH5-
-
'6
Modulator
GAINCAL_CH2
<23:0>
)
+
X
Offset
Cal.
Gain
Cal.
OFFCAL_CH4
<23:0>
GAINCAL_CH4
<23:0>
SINC3+
SINC1
SINC3+
SINC1
)
Phase
Shifter
POR
AVDD
Monitoring
SINC3+
SINC1
+
X
Offset
Cal.
Gain
Cal.
OFFCAL_CH5
<23:0>
GAINCAL_CH5
<23:0>
+
X
Offset
Cal.
Gain
Cal.
OSC1
OSC2
OSR<2:0>
PRE<1:0>
DATA_CH0<23:0>
DATA_CH1<23:0>
DATA_CH2<23:0>
Digital SPI
Interface
DATA_CH3<23:0>
DR
SDO
RESET
SDI
SCK
DATA_CH4<23:0>
CS
DATA_CH5<23:0>
POR
DVDD
Monitoring
ANALOG
AGND
DS20005227A-page 2
OFFCAL_CH2
<23:0>
GAINCAL_CH3
<23:0>
Phase
Shifter
MOD<23:20>
PGA
X
Gain
Cal.
OFFCAL_CH3
<23:0>
OSR/2
CH5+
+
Offset
Cal.
OSR/2
)
MOD<19:16>
GAINCAL_CH1
<23:0>
X
Phase
Shifter
'6
Modulator
OFFCAL_CH1
<23:0>
Gain
Cal.
OSR/2PHASE0<11:0>
CH4+
X
Gain
Cal.
+
SINC3+
SINC1
Phase
Shifter
MOD<15:12>
+
Offset
Cal.
Offset
Cal.
)
MOD<11:8>
'6
Modulator
GAINCAL_CH0
<23:0>
MCLK
DIGITAL
DGND
 2013 Microchip Technology Inc.
MCP3913
1.0
† Notice: Stresses above those listed under “Absolute
Maximum Ratings” may cause permanent damage to
the device. This is a stress rating only and functional
operation of the device at those or any other conditions, above those indicated in the operational listings
of this specification, is not implied. Exposure to maximum rating conditions for extended periods may affect
device reliability.
ELECTRICAL
CHARACTERISTICS
Absolute Maximum Ratings †
VDD ..................................................................... -0.3V to 4.0V
Digital inputs and outputs w.r.t. AGND ................ --0.3V to 4.0V
Analog input w.r.t. AGND ..................................... ....-2V to +2V
VREF input w.r.t. AGND ............................... -0.6V to VDD +0.6V
Storage temperature .....................................-65°C to +150°C
Ambient temp. with power applied ................-65°C to +125°C
Soldering temperature of leads (10 seconds) ............. +300°C
ESD on the analog inputs (HBM,MM) ................. 1.5 kV, 300V
ESD on all other pins (HBM,MM) ...........................2 kV, 300V
1.1
Electrical Specifications
TABLE 1-1:
ANALOG SPECIFICATIONS
Electrical Specifications: Unless otherwise indicated, all parameters apply at AVDD = DVDD = 3V, MCLK = 4 MHz;
PRE<1:0> = 00; OSR = 256; GAIN = 1; VREFEXT = 0, CLKEXT = 1, DITHER<1:0> = 11; BOOST<1:0> = 10, VCM = 0V;
TA = -40°C to +125°C;VIN = -0.5 dBFS @ 50/60 Hz on all channels.
Characteristic
Sym.
Min.
Typ.
Max.
Units
Conditions
24
—
—
bits
OSR = 256 or greater
ADC Performance
Resolution
(No missing codes)
Sampling Frequency
fS(DMCLK)
—
1
4
MHz
For maximum condition,
BOOST<1:0> = 11
Output Data Rate
fD(DRCLK)
—
4
125
ksps
For maximum condition,
BOOST<1:0> = 11,
OSR = 32
CHn+/-
-1
—
+1
V
All analog input channels,
measured to AGND
IIN
—
+/-1
—
nA
RESET<5:0> = 111111,
MCLK running continuously
—
+600/GAIN
mV
VREF = 1.2V,
proportional to VREF
-1
0.2
1
mV
Note 5
—
0.5
—
µV/°C
-4
—
+4
%
—
1
—
ppm/°C
Analog Input Absolute
Voltage on CHn+/- pins,
n between 0 and 5
Analog Input
Leakage Current
Differential Input
Voltage Range
(CHn+-CHn-) -600/GAIN
Offset Error
VOS
Offset Error Drift
Gain Error
GE
Gain Error Drift
Note 5
Note 1:
Dynamic Performance specified at -0.5 dB below the maximum differential input value,
VIN = 1.2 VPP = 424 mVRMS @ 50/60 Hz, VREF = 1.2V. See Section 4.0 “Terminology And Formulas” for definition.
This parameter is established by characterization and not 100% tested.
2:
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 000000,
RESET<5:0> = 000000, VREFEXT = 0, CLKEXT = 0.
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 111111,
VREFEXT = 1, CLKEXT = 1.
Measured on one channel versus all others channels. The average of crosstalk performance over all channels
(see Figure 2-32 for individual channel performance).
Applies to all gains. Offset and gain errors depend on PGA gain setting, see typical performance curves for typical
performance.
Outside of this range, ADC accuracy is not specified. An extended input range of +/-2V can be applied continuously to
the part with no damage.
For proper operation and for optimizing ADC accuracy, AMCLK should be limited to the maximum frequency defined in
Table 5-2, as a function of the BOOST and PGA setting chosen. MCLK can take larger values as long as the prescaler
settings (PRE<1:0>) limit AMCLK = MCLK/PRESCALE in the defined range in Table 5-2.
3:
4:
5:
6:
7:
 2013 Microchip Technology Inc.
DS20005227A-page 3
MCP3913
TABLE 1-1:
ANALOG SPECIFICATIONS (CONTINUED)
Electrical Specifications: Unless otherwise indicated, all parameters apply at AVDD = DVDD = 3V, MCLK = 4 MHz;
PRE<1:0> = 00; OSR = 256; GAIN = 1; VREFEXT = 0, CLKEXT = 1, DITHER<1:0> = 11; BOOST<1:0> = 10, VCM = 0V;
TA = -40°C to +125°C;VIN = -0.5 dBFS @ 50/60 Hz on all channels.
Characteristic
Sym.
Min.
Typ.
Max.
Units
Integral Non-Linearity
INL
Measurement Error
ME
Differential Input
Impedance
ZIN
—
5
—
ppm
—
0.1
—
%
Measured with a 10,000:1
dynamic range
(from 600 mVPeak to 60 µVPeak),
AVDD = DVDD = 3V,
measurement points averaging
time: 20 seconds, measured on
each channel pair (CH0/1,
CH2/3, CH4/5)
232
—
—
k
G = 1, proportional to 1/AMCLK
142
—
—
k
G = 2, proportional to 1/AMCLK
72
—
—
k
G = 4, proportional to 1/AMCLK
38
—
—
k
G = 8, proportional to 1/AMCLK
36
—
—
k
G = 16, proportional to 1/AMCLK
33
—
—
k
G = 32, proportional to 1/AMCLK
Signal-to-Noise and
Distortion Ratio (Note 1)
SINAD
92
94.5
—
dB
Total Harmonic Distortion
(Note 1)
THD
—
-107
-103
dBc
Signal-to-Noise Ratio
(Note 1)
SNR
92
95
—
dB
SFDR
—
112
—
dBFS
Spurious Free Dynamic
Range (Note 1)
Crosstalk (50, 60 Hz)
Conditions
Includes the first 35 harmonics
CTALK
—
-122
—
dB
Note 4
AC Power
Supply Rejection
AC PSRR
—
-73
—
dB
AVDD = DVDD = 3V + 0.6VPP
50/60 Hz, 100/120 Hz
DC Power
Supply Rejection
DC PSRR
—
-73
—
dB
AVDD = DVDD = 2.7V to 3.6V
DC Common
Mode Rejection
DC CMRR
—
-100
—
dB
VCM from -1V to +1V
Note 1:
Dynamic Performance specified at -0.5 dB below the maximum differential input value,
VIN = 1.2 VPP = 424 mVRMS @ 50/60 Hz, VREF = 1.2V. See Section 4.0 “Terminology And Formulas” for definition.
This parameter is established by characterization and not 100% tested.
2:
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 000000,
RESET<5:0> = 000000, VREFEXT = 0, CLKEXT = 0.
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 111111,
VREFEXT = 1, CLKEXT = 1.
Measured on one channel versus all others channels. The average of crosstalk performance over all channels
(see Figure 2-32 for individual channel performance).
Applies to all gains. Offset and gain errors depend on PGA gain setting, see typical performance curves for typical
performance.
Outside of this range, ADC accuracy is not specified. An extended input range of +/-2V can be applied continuously to
the part with no damage.
For proper operation and for optimizing ADC accuracy, AMCLK should be limited to the maximum frequency defined in
Table 5-2, as a function of the BOOST and PGA setting chosen. MCLK can take larger values as long as the prescaler
settings (PRE<1:0>) limit AMCLK = MCLK/PRESCALE in the defined range in Table 5-2.
3:
4:
5:
6:
7:
DS20005227A-page 4
 2013 Microchip Technology Inc.
MCP3913
TABLE 1-1:
ANALOG SPECIFICATIONS (CONTINUED)
Electrical Specifications: Unless otherwise indicated, all parameters apply at AVDD = DVDD = 3V, MCLK = 4 MHz;
PRE<1:0> = 00; OSR = 256; GAIN = 1; VREFEXT = 0, CLKEXT = 1, DITHER<1:0> = 11; BOOST<1:0> = 10, VCM = 0V;
TA = -40°C to +125°C;VIN = -0.5 dBFS @ 50/60 Hz on all channels.
Characteristic
Sym.
Min.
Typ.
Max.
Units
Conditions
VREF
1.176
1.2
1.224
V
TCVREF
—
9
—
ZOUTVREF
—
0.6
—
k
VREFEXT = 0
AIDDVREF
—
54
—
µA
VREFEXT = 0,
SHUTDOWN<5:0> = 111111
—
—
10
pF
Differential Input Voltage
Range (VREF+ – VREF-)
VREF
1.1
—
1.3
V
VREFEXT = 1
Absolute Voltage on
REFIN+ pin
VREF+
VREF+ 1.1
—
VREF+ 1.3
V
VREFEXT = 1
Absolute Voltage
REFIN- pin
VREF-
-0.1
—
+0.1
V
REFIN- should be connected to
AGND when VREFEXT = 0
Master Clock Input
Frequency Range
fMCLK
—
—
20
MHz
CLKEXT = 1, (Note 7)
Crystal Oscillator
Operating Frequency
Range
fXTAL
1
—
20
MHz
CLKEXT = 0, (Note 7)
(Note 7)
Internal Voltage Reference
Tolerance
Temperature Coefficient
Output Impedance
Internal Voltage Reference
Operating Current
VREFEXT = 0,
TA = +25°C only
ppm/°C TA = -40°C to +125°C,
VREFEXT = 0,
VREFCAL<7:0> = 0x50
Voltage Reference Input
Input Capacitance
Master Clock Input
Analog Master Clock
AMCLK
—
—
16
MHz
DIDDXTAL
—
80
—
µA
Operating Voltage, Analog
AVDD
2.7
—
3.6
V
Operating Voltage, Digital
DVDD
2.7
—
3.6
V
Operating Current, Analog
(Note 2)
IDD,A
—
4.5
6
mA
BOOST<1:0> = 00
—
5.4
8
mA
BOOST<1:0> = 01
Crystal Oscillator
Operating Current
CLKEXT = 0
Power Supply
—
7.4
10
mA
BOOST<1:0> = 10
—
12.9
17.5
mA
BOOST<1:0> = 11
Note 1:
Dynamic Performance specified at -0.5 dB below the maximum differential input value,
VIN = 1.2 VPP = 424 mVRMS @ 50/60 Hz, VREF = 1.2V. See Section 4.0 “Terminology And Formulas” for definition.
This parameter is established by characterization and not 100% tested.
2:
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 000000,
RESET<5:0> = 000000, VREFEXT = 0, CLKEXT = 0.
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 111111,
VREFEXT = 1, CLKEXT = 1.
Measured on one channel versus all others channels. The average of crosstalk performance over all channels
(see Figure 2-32 for individual channel performance).
Applies to all gains. Offset and gain errors depend on PGA gain setting, see typical performance curves for typical
performance.
Outside of this range, ADC accuracy is not specified. An extended input range of +/-2V can be applied continuously to
the part with no damage.
For proper operation and for optimizing ADC accuracy, AMCLK should be limited to the maximum frequency defined in
Table 5-2, as a function of the BOOST and PGA setting chosen. MCLK can take larger values as long as the prescaler
settings (PRE<1:0>) limit AMCLK = MCLK/PRESCALE in the defined range in Table 5-2.
3:
4:
5:
6:
7:
 2013 Microchip Technology Inc.
DS20005227A-page 5
MCP3913
TABLE 1-1:
ANALOG SPECIFICATIONS (CONTINUED)
Electrical Specifications: Unless otherwise indicated, all parameters apply at AVDD = DVDD = 3V, MCLK = 4 MHz;
PRE<1:0> = 00; OSR = 256; GAIN = 1; VREFEXT = 0, CLKEXT = 1, DITHER<1:0> = 11; BOOST<1:0> = 10, VCM = 0V;
TA = -40°C to +125°C;VIN = -0.5 dBFS @ 50/60 Hz on all channels.
Characteristic
Sym.
Min.
Typ.
Max.
Units
Operating Current, Digital
IDD,D
—
0.5
1
mA
MCLK = 4 MHz,
proportional to MCLK (Note 2)
—
1.5
—
mA
MCLK = 16 MHz,
proportional to MCLK (Note 2)
IDDS,A
—
0.01
2
µA
AVDD pin only (Note 3)
Shutdown Current, Digital
IDDS,D
—
0.01
7
µA
DVDD pin only (Note 3)
Pull-down Current on
OSC2 Pin (External Clock
mode only)
IOSC2
—
35
—
µA
CLKEXT = 1
Shutdown Current, Analog
Conditions
Note 1:
Dynamic Performance specified at -0.5 dB below the maximum differential input value,
VIN = 1.2 VPP = 424 mVRMS @ 50/60 Hz, VREF = 1.2V. See Section 4.0 “Terminology And Formulas” for definition.
This parameter is established by characterization and not 100% tested.
2:
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 000000,
RESET<5:0> = 000000, VREFEXT = 0, CLKEXT = 0.
For these operating currents, the following configuration bit settings apply: SHUTDOWN<5:0> = 111111,
VREFEXT = 1, CLKEXT = 1.
Measured on one channel versus all others channels. The average of crosstalk performance over all channels
(see Figure 2-32 for individual channel performance).
Applies to all gains. Offset and gain errors depend on PGA gain setting, see typical performance curves for typical
performance.
Outside of this range, ADC accuracy is not specified. An extended input range of +/-2V can be applied continuously to
the part with no damage.
For proper operation and for optimizing ADC accuracy, AMCLK should be limited to the maximum frequency defined in
Table 5-2, as a function of the BOOST and PGA setting chosen. MCLK can take larger values as long as the prescaler
settings (PRE<1:0>) limit AMCLK = MCLK/PRESCALE in the defined range in Table 5-2.
3:
4:
5:
6:
7:
1.2
Serial Interface Characteristics
TABLE 1-2:
SERIAL DC CHARACTERISTICS
Electrical Specifications: Unless otherwise indicated, all parameters apply at DVDD = 2.7 to 3.6 V,
TA = -40°C to +125°C, CLOAD = 30 pF, applies to all digital I/O.
Characteristic
Sym.
Min.
High-Level Input Voltage
VIH
0.7 DVDD
Low-Level Input Voltage
VIL
—
Input Leakage Current
ILI
—
Output Leakage Current
ILO
VHYS
Hysteresis Of
Schmitt-Trigger Inputs
Typ.
Max.
Units
Conditions
—
—
V
Schmitt-Triggered
—
0.3 DVDD
V
Schmitt-Triggered
—
±1
µA
CS = DVDD,
VIN = DGND to DVDD
—
—
±1
µA
CS = DVDD,
VOUT = DGND or DVDD
—
500
—
mV
DVDD = 3.3V only, Note 2
Low-Level Output Voltage
VOL
—
—
0.2 DVDD
V
IOL = +1.7 mA
High-Level Output Voltage
VOH
0.8 DVDD
—
—
V
IOH = -1.7 mA
Internal Capacitance
(All Inputs And Outputs)
CINT
—
—
7
pF
TA = +25°C, SCK = 1.0 MHz,
DVDD =3.3V (Note 1)
Note 1:
2:
This parameter is periodically sampled and not 100% tested.
This parameter is established by characterization and not production tested.
DS20005227A-page 6
 2013 Microchip Technology Inc.
MCP3913
TABLE 1-3:
SERIAL AC CHARACTERISTICS TABLE
Electrical Specifications: Unless otherwise indicated, all parameters apply at DVDD = 2.7 to 3.6 V,
TA = -40°C to +125°C, GAIN = 1, CLOAD = 30 pF
Characteristic
Sym.
Min.
Typ.
Max.
Units
fSCK
—
—
20
MHz
CS Setup Time
tCSS
25
—
—
ns
CS Hold Time
tCSH
50
—
—
ns
CS Disable Time
tCSD
50
—
—
ns
Serial Clock Frequency
Conditions
Data Setup Time
tSU
5
—
—
ns
Data Hold Time
tHD
10
—
—
ns
Serial Clock High Time
tHI
20
—
—
ns
Serial Clock Low Time
tLO
20
—
—
ns
Serial Clock Delay Time
tCLD
50
—
—
ns
Serial Clock Enable Time
tCLE
50
—
—
ns
Output Valid from SCK Low
tDO
—
—
25
ns
Output Hold Time
tHO
0
—
—
ns
Note 1
Output Disable Time
tDIS
—
—
25
ns
Note 1
tMCLR
100
—
—
ns
Data Transfer Time to DR
(Data Ready)
tDODR
—
—
25
ns
Modulator Mode Entry to
Modulator Data Present
tMODSU
—
—
100
ns
tDRP
—
1/(2 x DMCLK)
—
µs
Reset Pulse Width (RESET)
Data Ready Pulse Low Time
Note 1:
2:
Note 2
This parameter is periodically sampled and not 100% tested.
This parameter is established by characterization and not production tested.
TABLE 1-4:
TEMPERATURE SPECIFICATIONS TABLE
Electrical Specifications: Unless otherwise indicated, all parameters apply at AVDD = 2.7 to 3.6V, DVDD = 2.7 to 3.6V.
Parameters
Sym.
Min.
Typ.
Max.
Units.
Operating Temperature Range
TA
-40
—
+125
°C
Storage Temperature Range
TA
-65
—
+150
°C
Thermal Resistance, 28L SSOP
JA
—
80
—
°C/W
Thermal Resistance, 40L 5x5 UQFN
JA
—
41
—
°C/W
Conditions
Temperature Ranges
Note 1
Thermal Package Resistances
Note 1: The internal junction temperature (TJ) must not exceed the absolute maximum specification of +150°C.
 2013 Microchip Technology Inc.
DS20005227A-page 7
MCP3913
CS
fSCK
tHI
tCSH
tLO
Mode 1,1
SCK
Mode 0,0
tDO
tDIS
tHO
MSB out
SDO
LSB out
DON’T CARE
SDI
FIGURE 1-1:
Serial Output Timing Diagram.
tCSD
CS
tHI
Mode 1,1
SCK
tCLE
fSCK
tCSS
tCLD
tCSH
tLO
Mode 0,0
tSU
SDI
tHD
MSB in
LSB in
HI-Z
SDO
FIGURE 1-2:
Serial Input Timing Diagram.
tDRP
1/fD
DR
tDODR
SCK
SDO
FIGURE 1-3:
Data Ready Pulse / Sampling Timing Diagram.
H
Timing Waveform for tDO
Waveform for tDIS
SCK
SDO
VIH
tDO
CS
90%
SDO
tDIS
HI-Z
10%
FIGURE 1-4:
DS20005227A-page 8
Timing Diagrams, continued.
 2013 Microchip Technology Inc.
MCP3913
2.0
TYPICAL PERFORMANCE CURVES
The graphs and tables provided following this note are a statistical summary based on a limited number of
samples and are provided for informational purposes only. The performance characteristics listed herein
are not tested or guaranteed. In some graphs or tables, the data presented may be outside the specified
operating range (e.g., outside specified power supply range) and therefore outside the warranted range.
Note:
Note: Unless otherwise indicated, AVDD = 3V, DVDD = 3V; TA = +25°C, MCLK = 4 MHz; PRESCALE = 1;
OSR = 256; GAIN = 1; Dithering = Maximum; VIN = -0.5 dBFS @ 60 Hz on all channels, VREFEXT = 0; CLKEXT = 1;
BOOST<1:0> = 10.
0
0
Amplitude (dB)
-40
-60
-80
-100
-120
-40
-60
-80
-100
-120
-140
-140
-160
-160
-180
-200
-180
0
500
FIGURE 2-1:
1000
1500
Frequency (Hz)
0
2000
500
FIGURE 2-4:
Spectral Response.
1000
1500
Frequency (Hz)
2000
Spectral Response.
1.0%
VIN = -60 dBFS @ 60 Hz
fD = 3.9 ksps
OSR = 256
Ditering = Off
16 kVDPSOHV FFT
-40
-60
-80
-100
-120
-140
-160
Measurement Error (%)
0
-20
Amplitude (dB)
VIN = -60 dBFS @ 60 Hz
fD = 3.9 ksps
OSR = 256
Ditering = Maximum
16 kVDPSOHV FFT
-20
Amplitude (dB)
VIN = -0.5 dBFS @ 60 Hz
fD = 3.9 ksps
OSR = 256
Ditering = Off
16 kVDPSOHV FFT
-20
% Error Channel 0,1
% Error Channel 2,3
% Error Channel 4,5
0.5%
0.0%
-0.5%
-180
-200
500
FIGURE 2-2:
1000
1500
Frequency (Hz)
0
VIN = -0.5 dBFS @ 60 Hz
fD = 3.9 ksps
OSR = 256
Ditering = Maximum
16 ksDPSOHV FFT
-40
-60
-1.0%
0.01
0.1
1
10
100
1000
Current Channel Input Amplitude (mVPeak)
FIGURE 2-5:
Measurement Error
with 1-Point Calibration.
Spectral Response.
-20
Amplitude (dB)
2000
-80
-100
-120
-140
-160
1.0%
Measurement Error (%)
0
0.5%
% Error Channel 0,1
% Error Channel 2,3
% Error Channel 4,5
0.0%
-0.5%
-180
-200
0
FIGURE 2-3:
500
1000
1500
Frequency (Hz)
Spectral Response.
 2013 Microchip Technology Inc.
2000
-1.0%
0.01
0.1
1
10
100
1000
Current Channel Input Amplitude (mVPeak)
FIGURE 2-6:
Measurement Error
with 2-Point Calibration.
DS20005227A-page 9
MCP3913
Note: Unless otherwise indicated, AVDD = 3V, DVDD = 3V; TA = +25°C, MCLK = 4 MHz; PRESCALE = 1;
OSR = 256; GAIN = 1; Dithering = Maximum; VIN = -0.5 dBFS @ 60 Hz on all channels, VREFEXT = 0; CLKEXT = 1;
BOOST<1:0> = 10.
-107.1
-107.2
-107.3
-107.4
-107.5
-107.6
-107.7
-107.8
-108
-107.9
-108.1
-108.2
-108.3
-108.4
-108.5
-108.6
Frequency of Occurrence
Frequency of Occurrence
Standard Deviation = 80.74 LSB
Noise = 9.62 µV
16 ksamples FFT
Output Code (LSB)
Total Harmonic Distortion (-dBc)
FIGURE 2-7:
Histogram.
FIGURE 2-10:
THD Repeatability
Output Noise Histogram.
Total Harmonic Distortion (dB)
Frequency of Occurrence
-90
Dithering = Maximum
Dithering = Medium
Dithering = Minimum
Dithering = OFF
-95
-100
-105
-110
-115
-120
-125
-130
32
64
Spurious Free Dynamic Range (dBFS)
FIGURE 2-8:
Spurious Free Dynamic
Range Repeatability Histogram.
FIGURE 2-11:
128 256 512 1024 2048 4096
Oversampling Ratio (OSR)
THD vs.OSR.
Signal-to-Noise and Distortion
Ratio (dB)
110
Frequency Occurrence
105
100
95
90
85
80
75
Dithering = Maximum
Dithering = Medium
Dithering = Minimum
Dithering = OFF
70
65
60
94.4
94.45 94.5 94.55 94.6 94.65
Signtal-to-Noise Ratio (dB)
FIGURE 2-9:
Histogram.
DS20005227A-page 10
SINAD Repeatability
94.7
32
FIGURE 2-12:
64
128 256 512 1024 2048 4096
Oversampling Ratio (OSR)
SINAD vs. OSR.
 2013 Microchip Technology Inc.
MCP3913
Note: Unless otherwise indicated, AVDD = 3V, DVDD = 3V; TA = +25°C, MCLK = 4 MHz; PRESCALE = 1;
OSR = 256; GAIN = 1; Dithering = Maximum; VIN = -0.5 dBFS @ 60 Hz on all channels, VREFEXT = 0; CLKEXT = 1;
BOOST<1:0> = 10.
L
100
Signal-to-Noise and Distortion
(dB)
Signal-to-Noise Ratio (dB)
120
100
80
60
40
Dithering = Maximum
Dithering = Medium
Dithering = Minimum
Dithering = OFF
20
0
32
64
80
75
65
120
100
115
95
110
105
100
95
Dithering = Maximum
Dithering = Medium
Dithering = Minimum
Dithering = OFF
90
85
Boost = 00
Boost = 11
Boost = 01
Boost = 10
70
4
6
8
10 12 14 16
MCLK Frequency (MHz)
FIGURE 2-16:
80
SFDR vs. OSR.
20
90
85
80
75
70
Boost = 00
Boost = 11
Boost = 01
Boost = 10
65
64 128 256 512 1024 2048 4096
Oversampling Ratio (OSR)
FIGURE 2-14:
18
SINAD vs. MCLK.
60
32
2
4
6
8
10
12
14
16
MCLK Frequency (MHz)
FIGURE 2-17:
18
20
SNR vs. MCLK.
120
-60
Boost = 00
Boost = 01
Boost = 10
Boost = 11
-65
-70
Spurious Free Dynamic Range
(dBFS)
Total Harmonic Distortion (dB)
85
2
Signal-to-Noise Ratio (dB)
Spurious Free Dynamic Range
(dBFS)
SNR vs.OSR.
90
60
128 256 512 1024 2048 4096
Oversampling Ratio (OSR)
FIGURE 2-13:
95
110
-75
100
-80
-85
-90
-95
-100
-105
90
80
Boost = 00
Boost = 11
Boost = 01
Boost = 10
70
60
-110
2
4
FIGURE 2-15:
6
8
10 12 14 16
MCLK Frequency (MHz)
THD vs. MCLK.
 2013 Microchip Technology Inc.
18
20
2
4
FIGURE 2-18:
6
8
10 12 14 16
MCLK Frequency (MHz)
18
20
SFDR vs. MCLK.
DS20005227A-page 11
MCP3913
0
140
OSR = 32
OSR = 64
OSR = 128
OSR = 256
OSR = 512
OSR = 1024
OSR = 2048
OSR = 4096
-20
-40
-60
-80
-100
-120
Spurious Free Dynamic Range
(dBFS)
Total Harmonic Distorsion (dB)
Note: Unless otherwise indicated, AVDD = 3V, DVDD = 3V; TA = +25°C, MCLK = 4 MHz; PRESCALE = 1;
OSR = 256; GAIN = 1; Dithering = Maximum; VIN = -0.5 dBFS @ 60 Hz on all channels, VREFEXT = 0; CLKEXT = 1;
BOOST<1:0> = 10.
120
100
-140
2
FIGURE 2-19:
4
8
Gain (V/V)
16
40
20
32
THD vs. GAIN.
1
2
FIGURE 2-22:
-20
Total Harmonic Distortion (dB)
120
100
80
60
OSR = 32
OSR = 64
OSR = 128
OSR = 256
OSR = 512
OSR = 1024
OSR = 2048
OSR = 4096
40
20
0
1
2
FIGURE 2-20:
4
8
Gain (V/V)
16
32
120
100
80
60
OSR = 32
OSR = 64
OSR = 128
OSR = 256
OSR = 512
OSR = 1024
OSR = 2048
OSR = 4096
40
20
0
1
2
FIGURE 2-21:
DS20005227A-page 12
4
8
Gain (V/V)
SNR vs. GAIN.
16
-60
32
16
32
SFDR vs. GAIN.
-80
-100
-120
0.001
0.01
0.1
1
10
100
Input Signal Amplitude (mVPK)
FIGURE 2-23:
Amplitude.
SINAD vs. GAIN.
4
8
Gain (V/V)
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
-40
Signal-to-Noise and Distortion
Ratio (dB)
Signal-to-Noise and Distortion
Ratio (dB)
OSR = 32
OSR = 64
OSR = 128
OSR = 256
OSR = 512
OSR = 1024
OSR = 2048
OSR = 4096
60
0
1
Signal-to-Noise Ratio (dB)
80
1000
THD vs. Input Signal
100
80
60
40
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
20
0
-20
0.001
0.01
0.1
1
10
100
Input Signal Amplitude (mVPK)
FIGURE 2-24:
Amplitude.
1000
SINAD vs. Input Signal
 2013 Microchip Technology Inc.
MCP3913
80
60
40
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
20
0
-20
0.001
0.01
0.1
1
10
100
Input Signal Amplitude (mVPK)
FIGURE 2-25:
Amplitude.
-40
-60
-80
-50
-25
0
FIGURE 2-28:
SNR vs. Input Signal
25
50
75
Temperature (°C)
100
125
THD vs. Temperature.
100
120
100
80
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
60
40
20
0
0.001
0.01
0.1
1
10
100
Input Signal Amplitude (mVPK)
FIGURE 2-26:
Amplitude.
OSR = 32
OSR = 64
OSR = 128
OSR = 256
OSR = 512
OSR = 1024
OSR = 2048
OSR = 4096
100
80
60
90
80
70
60
50
40
20
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
40
30
20
10
0
1000
SFDR vs. Input Signal
120
Signal-to-Noise and Distortion
Reatio (dB)
Spurious Free Dyanmic Range
(dBFS)
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
-20
-120
1000
140
Signal-to-Noise and Distortion
Ratio (dB)
0
-100
-50
-25
0
FIGURE 2-29:
25
50
75
Temperature (°C)
100
125
SINAD vs. Temperature.
100
90
Signal-to-Noise Ratio (dB)
Signal-to-Noise Ratio (dB)
100
Total Harmonic Distortion (dB)
Note: Unless otherwise indicated, AVDD = 3V, DVDD = 3V; TA = +25°C, MCLK = 4 MHz; PRESCALE = 1;
OSR = 256; GAIN = 1; Dithering = Maximum; VIN = -0.5 dBFS @ 60 Hz on all channels, VREFEXT = 0; CLKEXT = 1;
BOOST<1:0> = 10.
80
70
60
50
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
40
30
20
10
0
0
10
FIGURE 2-27:
100
1000
10000
Signal Frequency (Hz)
100000
SINAD vs. Input Frequency.
 2013 Microchip Technology Inc.
-50
-25
FIGURE 2-30:
0
25
50
75
Temperature (°C)
100
125
SNR vs. Temperature.
DS20005227A-page 13
MCP3913
Note: Unless otherwise indicated, AVDD = 3V, DVDD = 3V; TA = +25°C, MCLK = 4 MHz; PRESCALE = 1;
OSR = 256; GAIN = 1; Dithering = Maximum; VIN = -0.5 dBFS @ 60 Hz on all channels, VREFEXT = 0; CLKEXT = 1;
BOOST<1:0> = 10.
Spurious Free Dyanmic Range
(dBFS)
120
1000
Channel 0
Channel 1
Channel 2
Channel 3
Channel 4
Channel 5
800
Channel Offset (µV)
100
80
60
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
40
20
0
-50
-25
600
400
200
0
-200
-400
-600
-800
0
FIGURE 2-31:
25
50
75
Temperature (°C)
100
125
SFDR vs. Temperature.
-1000
-40
-20
0
FIGURE 2-34:
vs. Temperature.
20
40
60
80
Temperature (°C)
7
Gain Error (%)
Crosstalk (dB)
40LD UQFN
-40
-60
-80
-100
-120
5
3
1
-1
-3
-140
1
2
3
4
Measured Channel*
* All other channels at maximum amplitude VIN = 600 mVPK @ 60 Hz
FIGURE 2-32:
Channel.
Crosstalk vs. Measured
1000
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
800
600
400
200
-5
5
0
-200
-400
-600
-800
-40
-20
0
20
40
60
80
Temperature (°C)
FIGURE 2-35:
vs. Gain.
Internal Voltage Reference (V)
0
Offset (µV)
GAIN = 1x
GAIN = 2x
GAIN = 4x
GAIN = 8x
GAIN = 16x
GAIN = 32x
9
28LD SSOP
120
Channel Offset Matching
0
-20
100
100
120
Gain Error vs. Temperature
1.2
1.199
1.198
1.197
-1000
-40
-20
0
FIGURE 2-33:
Gain.
DS20005227A-page 14
20
40
60
80
Temperature (°C)
100
120
Offset vs. Temperature vs.
-40
-20
0
FIGURE 2-36:
vs. Temperature.
20 40 60 80
Temperature (°C)
100 120 140
Internal Voltage Reference
 2013 Microchip Technology Inc.
MCP3913
1.1969
1.1968
1.1967
1.1966
IDD (mA)
Internal Voltage Reference (V)
Note: Unless otherwise indicated, AVDD = 3V, DVDD = 3V; TA = +25°C, MCLK = 4 MHz; PRESCALE = 1;
OSR = 256; GAIN = 1; Dithering = Maximum; VIN = -0.5 dBFS @ 60 Hz on all channels, VREFEXT = 0; CLKEXT = 1;
BOOST<1:0> = 10.
1.1965
1.1964
1.1963
1.1962
1.1961
2.5 2.6 2.7 2.8 2.9 3 3.1 3.2 3.3 3.4 3.5 3.6
AVDD (V)
FIGURE 2-37:
Internal Voltage Reference
vs. Supply Voltage.
IDD (mA)
Integral Non Linearity Error
(ppm)
4
-4
-6
-8
-10
-0.6
-0.4
-0.2
0.0
0.2
Input Voltage (V)
0.4
0.6
6
8
10
12
14
16
18
20
FIGURE 2-40:
Operating Current vs. MCLK
Frequency vs. Boost, VDD = 3.3V.
6
0
4
MCLK Frequency (MHz)
8
-2
AIDD BOOST = 0.5
AIDD BOOST = 0.66
AIDD BOOST = 1
AIDD BOOST = 2
DIDD
2
10
2
24
22
20
18
16
14
12
10
8
6
4
2
0
24
22
20
18
16
14
12
10
8
6
4
2
0
AIDD BOOST = 0.5
AIDD BOOST = 0.66
AIDD BOOST = 1
AIDD BOOST = 2
DIDD
2
4
6
8
10
12
14
16
18
20
MCLK (MHz)
FIGURE 2-38:
Integral Non-Linearity
(Dithering Maximum).
FIGURE 2-41:
Operating Current vs. MCLK
Frequency vs. Boost, VDD = 2.7V.
Integral Non Linearity Error
(ppm)
10
8
6
4
2
0
-2
-4
-6
-8
-10
-0.6
-0.4
FIGURE 2-39:
(Dithering Off).
-0.2
0.0
0.2
Input Voltage (V)
0.4
0.6
Integral Non-Linearity
 2013 Microchip Technology Inc.
DS20005227A-page 15
MCP3913
NOTES:
DS20005227A-page 16
 2013 Microchip Technology Inc.
MCP3913
3.0
PIN DESCRIPTION
The description of the pins are listed in Table 3-1.
TABLE 3-1:
SIX CHANNEL MCP3913 PIN FUNCTION TABLE
MCP3913
SSOP
MCP3913
UQFN
Symbol
Function
1
18, 35
AVDD
Analog Power Supply Pin
2
37
CH0+
Non-Inverting Analog Input Pin for Channel 0
3
38
CH0-
Inverting Analog Input Pin for Channel 0
4
39
CH1-
Inverting Analog Input Pin for Channel 1
5
40
CH1+
Non-Inverting Analog Input Pin for Channel 1
6
1
CH2+
Non-Inverting Analog Input Pin for Channel 2
7
2
CH2-
Inverting Analog Input Pin for Channel 2
8
3
CH3-
Inverting Analog Input Pin for Channel 3
9
4
CH3+
Non-Inverting Analog Input Pin for Channel 3
10
7
CH4+
Non-Inverting Analog Input Pin for Channel 4
11
8
CH4-
Inverting Analog Input Pin for Channel 4
12
9
CH5-
Inverting Analog Input Pin for Channel 5
Non-Inverting Analog Input Pin for Channel 5
13
10
CH5+
14
15
REFIN+/OUT
15
16
REFIN-
16
17, 36
AGND
Analog Ground Pin, Return Path for Internal Analog Circuitry
17, 20
21, 24, 32
DGND
Digital Ground Pin, Return Path for Internal Digital Circuitry
18
22
DR
Data Ready Signal Output Pin
19
5, 6, 11,
12, 13, 14,
19, 23, 34
NC
No Connect (for better EMI results connect to AGND)
21
25
OSC1/CLKI
22
26
OSC2
23
27
CS
24
28
SCK
Serial Interface Clock Input Pin for SPI
25
29
SDO
Serial Interface Data Output Pin
26
30
SDI
Serial Interface Data Input Pin
27
31
RESET
Master Reset Logic Input Pin
28
20, 33
DVDD
—
41
EP
 2013 Microchip Technology Inc.
Non-Inverting Voltage Reference Input and Internal Reference Output
Pin
Inverting Voltage Reference Input Pin
Oscillator Crystal Connection Pin or External Clock Input Pin
Oscillator Crystal Connection Pin
Serial Interface Chip Select Input Pin
Digital Power Supply Pin
Exposed Thermal Pad. Must be connected to AGND or floating.
DS20005227A-page 17
MCP3913
3.1
Analog Power Supply (AVDD)
AVDD is the power supply voltage for the analog
circuitry within the MCP3913. It is distributed on several
pins (pins 18 and 35 in the UQFN package, one pin
only in the SSOP-28 package). For optimal
performance, connect these pins together using a star
connection, and connect the appropriate bypass
capacitors (typically a 10 µF in parallel with a 0.1 µF
ceramic). AVDD should be maintained between 2.7V
and 3.6V for specified operation.
To ensure proper functionality of the device, at least
one of these pins must be properly connected. To
ensure optimal performance of the device, all the pins
must be properly connected. If any of these pins are left
floating, the accuracy and noise specifications are not
ensured.
3.2
ADC Differential Analog Inputs
(CHn+/CHn-)
The CHn+/- pins (n comprised between 0 and 5) are
the six fully-differential analog voltage inputs for the
delta-sigma ADCs.
The linear and specified region of the channels are
dependent on the PGA gain. This region corresponds
to a differential voltage range of ±600 mV/GAIN with
VREF = 1.2V.
The maximum absolute voltage, with respect to AGND,
for each CHn+/- input pin is ±1V with no distortion, and
±2V with no breaking after continuous voltage. This
maximum absolute voltage is not proportional to the
VREF voltage.
3.3
Non-Inverting Reference Input,
Internal Reference Output
(REFIN+/OUT)
This pin is the non-inverting side of the differential
voltage reference input for all ADCs or the internal
voltage reference output.
When VREFEXT = 1, an external voltage reference
source can be used, and the internal voltage reference
is disabled. When using an external differential voltage
reference, it should be connected to its VREF+ pin.
When using an external single-ended reference, it
should be connected to this pin.
When VREFEXT = 0, the internal voltage reference is
enabled and connected to this pin through a switch.
This voltage reference has minimal drive capability and
thus needs proper buffering and bypass capacitances
(a 0.1 µF ceramic capacitor is sufficient in most cases),
if used as a voltage source.
DS20005227A-page 18
If the voltage reference is only used as an internal
VREF, adding bypass capacitance on REFIN+/OUT is
not necessary for keeping ADC accuracy, but a minimal
0.1 µF ceramic capacitance can be connected to avoid
EMI/EMC susceptibility issues due to the antenna
created by the REFIN+/OUT pin if left floating.
3.4
Inverting Reference Input (REFIN-)
This pin is the inverting side of the differential voltage
reference input for all ADCs. When using an external
differential voltage reference, it should be connected to
its VREF- pin. When using an external single-ended
voltage reference, or when VREFEXT = 0 (default) and
using the internal voltage reference, the pin should be
directly connected to AGND.
3.5
Analog Ground (AGND)
AGND is the ground reference voltage for the analog
circuitry within the MCP3913. It is distributed on several
pins (pins 17 and 36 in the UQFN package, one pin
only in the SSOP-28 package). For optimal
performance, it is recommended to connect these pins
together using a star connection, and to connect it to
the same ground node voltage as DGND, again
preferably with a star connection.
At least one of these pins need to be properly
connected to ensure proper functionality of the device.
All of these pins need to be properly connected to
ensure optimal performance of the device. If any of
these pins are left floating, the accuracy and noise
specifications are not ensured. If an analog ground
plane is available, it is recommended that these pins be
tied to this plane of the PCB. This plane should also
reference all other analog circuitry in the system.
3.6
Digital Ground (DGND)
DGND is the ground reference voltage for the digital
circuitry within the MCP3913. It is distributed on several
pins: 21, 24 and 32 in the UQFN package (two pins only
in the SSOP-28 package). For optimal performance,
connect these pins together using a star connection
and connect it to the same ground node voltage as
AGND, again preferably with a star connection.
At least one of these pins need to be properly
connected to ensure proper functionality of the device.
All of these pins need to be properly connected to
ensure optimal performance of the device. If any of
these pins are left floating, the accuracy and noise
specifications are not ensured. If a digital ground plane
is available, it is recommended that these pins be tied
to this plane of the Printed Circuit Board (PCB). This
plane should also reference all other digital circuitry in
the system.
 2013 Microchip Technology Inc.
MCP3913
3.7
Data Ready Output (DR)
The data ready pin indicates if a new conversion result
is ready to be read. The default state of this pin is logic
high when DR_HIZ = 1, and is high-impedance when
DR_HIZ = 0 (default). After each conversion is
finished, a logic low pulse will take place on the data
ready pin to indicate the conversion result is ready as
an interrupt. This pulse is synchronous with the master
clock and has a defined and constant width.
The data ready pin is independent of the SPI interface
and acts like an interrupt output. The data ready pin
state is not latched, and the pulse width (and period)
are both determined by the MCLK frequency,
over-sampling rate, and internal clock prescale
settings. The data ready pulse width is equal to half a
DMCLK period and the frequency of the pulses is equal
to DRCLK (see Figure 1-3).
Note:
3.8
This pin should not be left floating when
the DR_HIZ bit is low; a 100 k pull-up
is
resistor
connected
to
DVDD
recommended.
Oscillator and Master Clock
Input Pin (OSC1/CLKI)
OSC1/CLKI and OSC2 provide the master clock for the
device. When CLKEXT = 0, a resonant crystal or clock
source with a similar sinusoidal waveform must be
placed across the OSC1 and OSC2 pins to ensure
proper operation.
The typical clock frequency specified is 4 MHz. For
proper operation, and for optimizing ADC accuracy,
AMCLK should be limited to the maximum frequency
defined in Table 5-2 for the function of the BOOST and
PGA setting chosen. MCLK can take larger values as
long as the prescaler settings (PRE<1:0>) limit
AMCLK = MCLK/PRESCALE in the defined range in
Table 5-2. Appropriate load capacitance should be
connected to these pins for proper operation.
Note:
3.9
When CLKEXT = 1, the crystal oscillator
is disabled. OSC1 becomes the master
clock input CLKI, a direct path for an
external clock source. One example
would be a clock source generated by an
MCU.
Crystal Oscillator (OSC2)
When CLKEXT = 0 (default), a resonant crystal or
clock source with a similar sinusoidal waveform must
be placed across the OSC1 and OSC2 pins to ensure
proper operation. Appropriate load capacitance should
be connected to these pins for proper operation.
3.10
Chip Select (CS)
This pin is the Serial Peripheral Interface (SPI) chip
select that enables serial communication. When this
pin is logic high, no communication can take place. A
chip select falling edge initiates serial communication,
and a chip select rising edge terminates the
communication. No communication can take place
even when CS is logic low, if RESET is also logic low.
This input is Schmitt-triggered.
3.11
Serial Data Clock (SCK)
This is the serial clock pin for SPI communication. Data
is clocked into the device on the rising edge of SCK.
Data is clocked out of the device on the falling edge of
SCK.
The MCP3913 SPI interface is compatible with SPI 0,0
and 1,1 modes. SPI modes can be changed during a
CS high time.
The maximum clock speed specified is 20 MHz. SCK
and MCLK are two different and asynchronous clocks;
SCK is only required when a communication happens,
while MCLK is continuously required when the part is
converting analog inputs.
This input is Schmitt-triggered.
3.12
Serial Data Output (SDO)
This is the SPI data output pin. Data is clocked out of
the device on the falling edge of SCK.
This pin remains in a high-impedance state during the
command byte. It also stays high-impedance during the
entire communication for write commands and when
the CS pin is logic high, or when the RESET pin is logic
low. This pin is active only when a read command is
processed. The interface is half-duplex (inputs and
outputs do not happen at the same time).
3.13
Serial Data Input (SDI)
This is the SPI data input pin. Data is clocked into the
device on the rising edge of SCK. When CS is logic low,
this pin is used to communicate with a series of 8-bit
commands. The interface is half-duplex (inputs and
outputs do not happen at the same time).
Each communication starts with a chip select falling
edge followed by an 8-bit command word, entered
through the SDI pin. Each command is either a Read or
a Write command. Toggling SDI after a Read command
or when CS is logic high has no effect.
This input is Schmitt-triggered.
When CLKEXT = 1, this pin should be connected to
DGND at all times (an internal pull down operates this
function, if the pin is left floating).
 2013 Microchip Technology Inc.
DS20005227A-page 19
MCP3913
3.14
Master Reset (RESET)
This pin is active low and places the entire chip in a
Reset state when active.
When RESET is logic low, all registers are reset to their
default value, no communication can take place, and
no clock is distributed inside the part, except in the
input structure if MCLK is applied (if MCLK is idle, then
no clock is distributed). This state is equivalent to a
Power-On Reset (POR) state.
Since the default state of the ADCs is on, the analog
power consumption when RESET is logic low is
equivalent to when RESET is logic high. Only the digital
power consumption is largely reduced because this
current consumption is essentially dynamic, and is
reduced drastically when there is no clock running.
All the analog biases are enabled during a Reset, so
that the part is fully operational just after a RESET
rising edge, if MCLK is applied when RESET is logic
low. If MCLK is not applied, there is a time after a hard
reset when the conversion may not accurately
correspond to the startup of the input structure.
This input is Schmitt-triggered.
3.15
Digital Power Supply (DVDD)
DVDD is the power supply voltage for the digital circuitry
within the MCP3913. It is distributed on several pins
(pins 20 and 33 in the UQFN package, one pin only in
the SSOP-28 package). For optimal performance, it is
recommended to connect these pins together using a
star connection and to connect appropriate bypass
capacitors (typically a 10 µF in parallel with a 0.1 µF
ceramic). DVDD should be maintained between 2.7V
and 3.6V for specified operation.
At least one of these pins need to be properly connected to ensure proper functionality of the device. All
of these pins need to be properly connected to ensure
optimal performance of the device. If any of these pins
are left floating, the accuracy and noise specifications
are not ensured.
3.16
Exposed Thermal Pad
This pin must be connected to AGND or left floating for
proper operation. Connecting it to AGND is preferable
for lowest noise performance and best thermal
behavior.
DS20005227A-page 20
 2013 Microchip Technology Inc.
MCP3913
4.0
TERMINOLOGY AND
FORMULAS
4.1
This is the fastest clock present on the device. This is
the frequency of the crystal placed at the OSC1/OSC2
inputs when CLKEXT = 0, or the frequency of the
clock input at the OSC1/CLKI when CLKEXT = 1. See
Figure 4-1.
This section defines the terms and formulas used
throughout this data sheet. The following terms are
defined:
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
•
MCLK – Master Clock
MCLK – Master Clock
AMCLK – Analog Master Clock
DMCLK – Digital Master Clock
DRCLK – Data Rate Clock
OSR – Oversampling Ratio
Offset Error
Gain Error
Integral Non-Linearity Error
Signal-to-Noise Ratio (SNR)
Signal-To-Noise Ratio And Distortion (SINAD)
Total Harmonic Distortion (THD)
Spurious-Free Dynamic Range (SFDR)
MCP3913 Delta-Sigma Architecture
Idle Tones
Dithering
Crosstalk
PSRR
CMRR
ADC Reset Mode
Hard Reset Mode (RESET = 0)
ADC Shutdown Mode
Full Shutdown Mode
Measurement Error
4.2
AMCLK – Analog Master Clock
AMCLK is the clock frequency that is present on the
analog portion of the device, after prescaling has
occurred via the CONFIG0 PRE<1:0> register bits (see
Equation 4-1). The analog portion includes the PGAs
and the delta-sigma modulators.
EQUATION 4-1:
MCLK
AMCLK = ------------------------------PRESCALE
TABLE 4-1:
MCP3913 OVERSAMPLING
RATIO SETTINGS
Config.
Analog Master Clock
Prescale
PRE<1:0>
0
0
AMCLK = MCLK/1 (default)
0
1
AMCLK = MCLK/2
1
0
AMCLK = MCLK/4
1
1
AMCLK = MCLK/8
MODE
SCK
CLKEXT
PRE<1:0>
OSR<2:0>
1
OUT
0
1
Multiplexer
OUT
OSC1
1/PRESCALE
AMCLK
1/4
DMCLK
1/OSR
DRCLK
0
OSC2
Xtal Oscillator
FIGURE 4-1:
4.3
MCLK
Multiplexer
Clock Divider
Clock Divider
Clock Divider
Clock Sub-Circuitry.
DMCLK – Digital Master Clock
This is the clock frequency that is present on the digital
portion of the device, after prescaling and division by
four (Equation 4-2). This is also the sampling
frequency, which is the rate at which the modulator
outputs are refreshed. Each period of this clock
corresponds to one sample and one modulator output.
See Figure 4-1.
EQUATION 4-2:
AMCLK
MCLK
DMCLK = --------------------- = ---------------------------------------4
4  PRESCALE
 2013 Microchip Technology Inc.
4.4
DRCLK – Data Rate Clock
This is the output data rate, i.e., the rate at which the
ADCs output new data. Each new data is signaled by a
data ready pulse on the DR pin.
This data rate is depending on the OSR and the
prescaler with the formula in Equation 4-3.
EQUATION 4-3:
AMCLK
DMCLK
MCLK
DRCLK = ---------------------- = --------------------- = ----------------------------------------------------------4  OSR
OSR
4  OSR  PRESCALE
DS20005227A-page 21
MCP3913
Since this is the output data rate, and because the
decimation filter is a SINC (or notch) filter, there is a
notch in the filter transfer function at each integer
multiple of this rate.
TABLE 4-2:
PRE<1:0>
Table 4-2 describes the various combinations of OSR
and PRESCALE, and their associated AMCLK,
DMCLK and DRCLK rates.
DEVICE DATA RATES IN FUNCTION OF MCLK, OSR AND PRESCALE,
MCLK = 4 MHZ
OSR<2:0>
OSR
AMCLK
DMCLK
DRCLK
DRCLK
(ksps)
SINAD
(dB)
Note 1
ENOB
from
SINAD
(bits)
Note 1
1
1
1
1
1
4096
MCLK/8
MCLK/32
MCLK/131072
.035
102.5
16.7
1
1
1
1
0
2048
MCLK/8
MCLK/32
MCLK/65536
.061
100
16.3
1
1
1
0
1
1024
MCLK/8
MCLK/32
MCLK/32768
.122
97
15.8
1
1
1
0
0
512
MCLK/8
MCLK/32
MCLK/16384
.244
96
15.6
1
1
0
1
1
256
MCLK/8
MCLK/32
MCLK/8192
0.488
95
15.5
1
1
0
1
0
128
MCLK/8
MCLK/32
MCLK/4096
0.976
91
14.8
1
1
0
0
1
64
MCLK/8
MCLK/32
MCLK/2048
1.95
84
13.6
1
1
0
0
0
32
MCLK/8
MCLK/32
MCLK/1024
3.9
70
11.3
1
0
1
1
1
4096
MCLK/4
MCLK/16
MCLK/65536
.061
102.5
16.7
1
0
1
1
0
2048
MCLK/4
MCLK/16
MCLK/32768
.122
100
16.3
1
0
1
0
1
1024
MCLK/4
MCLK/16
MCLK/16384
.244
97
15.8
1
0
1
0
0
512
MCLK/4
MCLK/16
MCLK/8192
.488
96
15.6
1
0
0
1
1
256
MCLK/4
MCLK/16
MCLK/4096
0.976
95
15.5
1
0
0
1
0
128
MCLK/4
MCLK/16
MCLK/2048
1.95
91
14.8
1
0
0
0
1
64
MCLK/4
MCLK/16
MCLK/1024
3.9
84
13.6
1
0
0
0
0
32
MCLK/4
MCLK/16
MCLK/512
7.8125
70
11.3
0
1
1
1
1
4096
MCLK/2
MCLK/8
MCLK/32768
.122
102.5
16.7
0
1
1
1
0
2048
MCLK/2
MCLK/8
MCLK/16384
.244
100
16.3
0
1
1
0
1
1024
MCLK/2
MCLK/8
MCLK/8192
.488
97
15.8
0
1
1
0
0
512
MCLK/2
MCLK/8
MCLK/4096
.976
96
15.6
0
1
0
1
1
256
MCLK/2
MCLK/8
MCLK/2048
1.95
95
15.5
0
1
0
1
0
128
MCLK/2
MCLK/8
MCLK/1024
3.9
91
14.8
0
1
0
0
1
64
MCLK/2
MCLK/8
MCLK/512
7.8125
84
13.6
0
1
0
0
0
32
MCLK/2
MCLK/8
MCLK/256
15.625
70
11.3
0
0
1
1
1
4096
MCLK
MCLK/4
MCLK/16384
.244
102.5
16.7
0
0
1
1
0
2048
MCLK
MCLK/4
MCLK/8192
.488
100
16.3
0
0
1
0
1
1024
MCLK
MCLK/4
MCLK/4096
.976
97
15.8
0
0
1
0
0
512
MCLK
MCLK/4
MCLK/2048
1.95
96
15.6
0
0
0
1
1
256
MCLK
MCLK/4
MCLK/1024
3.9
95
15.5
0
0
0
1
0
128
MCLK
MCLK/4
MCLK/512
7.8125
91
14.8
0
0
0
0
1
64
MCLK
MCLK/4
MCLK/256
15.625
84
13.6
0
0
0
0
0
32
MCLK
MCLK/4
MCLK/128
31.25
70
11.3
Note 1: For OSR = 32 and 64, DITHER = None. For OSR = 128 and higher, DITHER = Maximum. The SINAD
values are given from GAIN = 1.
DS20005227A-page 22
 2013 Microchip Technology Inc.
MCP3913
4.5
OSR – Oversampling Ratio
4.8
Integral Non-Linearity Error
This is the ratio of the sampling frequency to the output
data rate; OSR = DMCLK/DRCLK. The default
OSR<2:0> is 256, or with MCLK = 4 MHz,
PRESCALE = 1, AMCLK = 4 MHz, fS = 1 MHz, and
fD = 3.90625 ksps. The OSR<2:0> bits in Table 4-3 in
the CONFIG0 register are used to change the
oversampling ratio (OSR).
Integral non-linearity error is the maximum deviation of
an ADC transition point from the corresponding point of
an ideal transfer function, with the offset and gain
errors removed, or with the end points equal to zero.
TABLE 4-3:
4.9
MCP3913 OVERSAMPLING
RATIO SETTINGS
OSR<2:0>
Oversampling Ratio
OSR
32
0
0
0
0
0
1
64
0
1
0
128
0
1
1
256 (Default)
1
0
0
512
1
0
1
1024
1
1
0
2048
1
1
1
4096
4.6
Offset Error
This is the error induced by the ADC when the inputs
are shorted together (VIN = 0V). The specification
incorporates both PGA and ADC offset contributions.
This error varies with PGA and OSR settings. The
offset is different on each channel and varies from chipto-chip. The offset is specified in µV. The offset error
can be digitally compensated independently on each
channel through the OFFCAL_CHn registers with a
24-bit calibration word.
The offset on the MCP3913 has a low-temperature
coefficient.
4.7
Gain Error
This is the error induced by the ADC on the slope of the
transfer function. It is the deviation expressed in %,
compared to the ideal transfer function defined in
Equation 5-3. The specification incorporates both PGA
and ADC gain error contributions, but not the VREF
contribution (it is measured with an external VREF).
This error varies with PGA and OSR settings. The gain
error can be digitally compensated independently on
each channel through the GAINCAL_CHn registers
with a 24-bit calibration word.
The gain error on the MCP3913 has a low temperature
coefficient.
 2013 Microchip Technology Inc.
It is the maximum remaining error after calibration of
offset and gain errors for a DC input signal.
Signal-to-Noise Ratio (SNR)
For the MCP3913 ADCs, the signal-to-noise ratio is a
ratio of the output fundamental signal power to the
noise power (not including the harmonics of the signal),
when the input is a sine wave at a predetermined
frequency (see Equation 4-4). It is measured in dB.
Usually, only the maximum signal-to-noise ratio is
specified. The SNR figure depends mainly on the OSR
and DITHER settings of the device.
EQUATION 4-4:
SIGNAL-TO-NOISE RATIO
SignalPower
SNR  dB  = 10 log  ----------------------------------
NoisePower
4.10
Signal-To-Noise Ratio And
Distortion (SINAD)
The most important Figure of Merit for analog
performance of the ADCs present on the MCP3913 is
the
Signal-to-Noise
And
Distortion
(SINAD)
specification.
The Signal-to-Noise And Distortion ratio is similar to
signal-to-noise ratio, with the exception that you must
include the harmonic’s power in the noise power
calculation
(see
Equation 4-5).
The
SINAD
specification depends mainly on the OSR and DITHER
settings.
EQUATION 4-5:
SINAD EQUATION
SignalPower
SINAD  dB  = 10 log  ---------------------------------------------------------------------
 Noise + HarmonicsPower
The calculated combination of SNR and THD per the
following formula also yields SINAD, see Equation 4-6.
EQUATION 4-6:
SINAD, THD AND SNR
RELATIONSHIP
SINAD  dB  = 10 log 10
 SNR
-----------
 10 
+ 10
THD
–
----------------
 10 
DS20005227A-page 23
MCP3913
4.11
Total Harmonic Distortion (THD)
The total harmonic distortion is the ratio of the output
harmonic’s power to the fundamental signal power for
a sine wave input, and is defined in Equation 4-7.
EQUATION 4-7:
HarmonicsPower
THD  dB  = 10 log  -----------------------------------------------------
 FundamentalPower
The THD calculation includes the first 35 harmonics for
the MCP3913 specifications. The THD is usually
measured only with respect to the ten first harmonics,
which leads artificially to better figures. THD is
sometimes expressed in %. Equation 4-8 converts the
THD in %.
EQUATION 4-8:
THD  %  = 100  10
THD  dB 
-----------------------20
This specification depends mainly on the DITHER
setting.
4.12
Spurious-Free Dynamic Range
(SFDR)
SFDR is the ratio between the output power of the
fundamental and the highest spur in the frequency
spectrum (see Equation 4-9). The spur frequency is not
necessarily a harmonic of the fundamental, even
though it is usually the case. This figure represents the
dynamic range of the ADC when a full-scale signal is
used at the input. This specification depends mainly on
the DITHER setting.
EQUATION 4-9:
FundamentalPower
SFDR  dB  = 10 log  -----------------------------------------------------
 HighestSpurPower 
4.13
MCP3913 Delta-Sigma
Architecture
The MCP3913 incorporates six delta-sigma ADCs with
a multi-bit architecture. A delta-sigma ADC is an
oversampling converter that incorporates a built-in
modulator, which digitizes the quantity of charges
integrated by the modulator loop (see Figure 5-1). The
quantizer is the block that is performing the
analog-to-digital conversion. The quantizer is typically
1-bit, or a simple comparator, which helps maintain the
linearity performance of the ADC (the DAC structure is,
in this case, inherently linear).
DS20005227A-page 24
Multi-bit quantizers help to lower the quantization error
(the error fed back in the loop can be very large with
1-bit quantizers) without changing the order of the
modulator or the OSR, which leads to better SNR
figures. However, typically, the linearity of such
architectures is more difficult to achieve since the DAC
linearity is as difficult to attain, and its linearity limits the
THD of such ADCs.
The quantizer present in each ADC channel in the
MCP3913 is a Flash ADC composed of four
comparators arranged with equally spaced thresholds
and a thermometer coding. The MCP3913 also
includes proprietary five-level DAC architecture that is
inherently linear for improved THD figures.
4.14
Idle Tones
A delta-sigma converter is an integrating converter. It
also has a finite quantization step (LSB) that can be
detected by its quantizer. A DC input voltage that is
below the quantization step should only provide an
all zeros result, since the input is not large enough to
be detected. As an integrating device, any delta-sigma
ADC will show idle tones. This means that the output
will have spurs in the frequency content that depend on
the ratio between quantization step voltage and the
input voltage. These spurs are the result of the
integrated sub-quantization step inputs that will
eventually cross the quantization steps after a long
enough integration. This will induce an AC frequency at
the output of the ADC, and can be shown in the ADC
output spectrum.
These idle tones are residues that are inherent to the
quantization process and the fact that the converter is
integrating at all times without being reset. They are
residues of the finite resolution of the conversion
process. They are very difficult to attenuate and they
are heavily signal dependent. They can degrade the
SFDR and THD of the converter, even for DC inputs.
They can be localized in the baseband of the converter
and are thus difficult to filter from the actual input signal.
For power metering applications, idle tones can be very
disturbing, because energy can be detected even at
the 50 or 60 Hz frequency, depending on the DC offset
of the ADCs, while no power is really present at the
inputs. The only practical way to suppress or attenuate
the idle tones phenomenon is to apply dithering to the
ADC. The amplitudes of the idle tones are a function of
the order of the modulator, the OSR and the number of
levels in the quantizer of the modulator. A higher order,
a higher OSR or a higher number of levels for the
quantizer will attenuate the amplitudes of the idle
tones.
 2013 Microchip Technology Inc.
MCP3913
4.15
Dithering
In order to suppress or attenuate the idle tones present
in any delta-sigma ADCs, dithering can be applied to
the ADC. Dithering is the process of adding an error to
the ADC feedback loop in order to “decorrelate” the
outputs and “break” the idle tone’s behavior. Usually a
random or pseudo-random generator adds an analog
or digital error to the feedback loop of the delta-sigma
ADC in order to ensure that no tonal behavior can
happen at its outputs. This error is filtered by the feedback loop and typically has a zero average value, so
that the converter static transfer function is not disturbed by the dithering process. However, the dithering
process slightly increases the noise floor (it adds noise
to the part) while reducing its tonal behavior and thus
improving SFDR and THD. The dithering process
scrambles the idle tones into baseband white noise and
ensures that dynamic specs (SNR, SINAD, THD,
SFDR) are less signal dependent. The MCP3913 incorporates a proprietary dithering algorithm on all ADCs in
order to remove idle tones and improve THD, which is
crucial for power metering applications.
4.16
Crosstalk
Crosstalk is defined as the perturbation caused on one
ADC channel by all the other ADC channels present in
the chip. It is a measurement of the isolation between
each channel present in the chip.
The crosstalk for Channel 0 is then calculated with the
formula in Equation 4-10.
EQUATION 4-10:
 CH0Power
CTalk  dB  = 10 log  ---------------------------------
  CHnPower
The crosstalk depends slightly on the position of the
channels in the MCP3913 device. This dependency is
shown in the Figure 2-32, where the inner channels
show more crosstalk than the outer channels, since
they are located closer to the perturbation sources. The
outer channels have the preferred locations to
minimize crosstalk.
4.17
This is the ratio between a change in the power supply
voltage and the ADC output codes. It measures the
influence of the power supply voltage on the ADC
outputs.
The PSRR specification can be DC (the power supply
is taking multiple DC values), or AC (the power supply
is a sine wave at a certain frequency with a certain
common mode). In AC, the amplitude of the sine wave
represents the change in the power supply. It is defined
in Equation 4-11.
EQUATION 4-11:
This measurement is a two-step procedure:
1.
2.
Measure one ADC input with no perturbation on
the other ADC (ADC inputs shorted).
Measure the same ADC input with a
perturbation sine wave signal on all the other
ADCs at a certain predefined frequency.
Crosstalk is the ratio between the output power of the
ADC when the perturbation is and is not present,
divided by the power of the perturbation signal. A lower
crosstalk value implies more independence and
isolation between the channels.
The measurement of this signal is performed under the
default conditions of MCLK = 4 MHz:
•
•
•
•
GAIN = 1
PRESCALE = 1
OSR = 256
MCLK = 4 MHz
Step 1 for CH0 Crosstalk Measurement:
• CH0+ = CH0- = AGND
• CHn+ = CHn- = AGND
n comprised between 1 and 5
Step 2 for CH0 Crosstalk Measurement:
• CH0+ = CH0-=AGND
• CHn+ - CHn- = 1.2VP-P @ 50/60 Hz (full-scale
sine wave), n comprised between 1 and 5
 2013 Microchip Technology Inc.
PSRR
 V OUT
PSRR  dB  = 20 log  -------------------
  AVDD
Where: VOUT is the equivalent input voltage that the
output code translates to, with the ADC transfer
function.
In the MCP3913 specification for DC PSRR, AVDD varies from 2.7V to 3.6V, and for AC PSRR, a 50/60 Hz
sine wave is chosen centered around 3.0V, with a
maximum 300 mV amplitude. The PSRR specification
is measured with AVDD = DVDD.
4.18
CMRR
CMRR is the ratio between a change in the
common-mode input voltage and the ADC output
codes. It measures the influence of the common-mode
input voltage on the ADC outputs.
The CMRR specification can be DC (the
common-mode input voltage is taking multiple DC
values) or AC (the common-mode input voltage is a
sine wave at a certain frequency with a certain common
mode). In AC, the amplitude of the sine wave
represents the change in the power supply. It is defined
in Equation 4-12.
DS20005227A-page 25
MCP3913
EQUATION 4-12:
 VOUT
CMRR  dB  = 20 log  -----------------
  VCM 
Where: VCM = (CHn+ + CHn-)/2 is the common-mode
input voltage, and VOUT is the equivalent input voltage
that the output code translates to, with the ADC transfer
function.
In the MCP3913 specification, VCM varies from -1V to
+1V.
4.19
ADC Reset Mode
ADC Reset mode (also called Soft Reset mode) can
only be entered through setting the RESET<5:0> bits
high in the Configuration register. This mode is defined
as the condition where the converters are active, but
their output is forced to 0.
The Flash ADC output of the corresponding channel
will be reset to its default value (0011) in the MOD
register.
The ADCs can immediately output meaningful codes
after leaving Reset mode (and after the sinc filter
settling time). This mode is both entered and exited
through bit settings in the Configuration register.
Each converter can be placed in Soft Reset mode
independently. The Configuration registers are not
modified by the Soft Reset mode. A data ready pulse
will not be generated by an ADC channel in Reset
mode.
When an ADC exits ADC Reset mode, any phase delay
present before Reset was entered will still be present.
If one ADC was not in Reset, the ADC leaving Reset
mode will automatically resynchronize the phase delay,
relative to the other ADC channel per the phase delay
register block, and give data ready pulses accordingly.
If an ADC is placed in Reset mode while others are
converting, it does not shut down the internal clock.
When coming out of reset, it will be automatically
resynchronized with the clock, which did not stop
during Reset.
If all ADCs are in Soft Reset mode, the clock is no
longer distributed to the digital core for low-power
operation. Once any of the ADCs are back to normal
operation, the clock is automatically distributed again.
However, when the eight channels are in Soft Reset
mode, the input structure is still clocking if MCLK is
applied in order to properly bias the inputs, so that no
leakage current is observed. If MCLK is not applied,
large analog input leakage currents can be observed
for highly negative input voltages (typically below -0.6V
referred to AGND).
DS20005227A-page 26
4.20
Hard Reset Mode (RESET = 0)
This mode is only available during a POR or when the
RESET pin is pulled logic low. The RESET pin logic-low
state places the device in Hard Reset mode. In this
mode, all internal registers are reset to their default
state.
The DC biases for the analog blocks are still active, i.e.,
the MCP3913 is ready to convert. However, this pin
clears all conversion data in the ADCs. The
comparators’ outputs of all ADCs are forced to their
Reset state (0011). The SINC filters are all reset, as
well as their double output buffers. The Hard Reset
mode requires a minimum pulse low time (see
Section 1.0 “Electrical Characteristics”). During a
Hard Reset, no communication with the part is
possible. The digital interface is maintained in a Reset
state.
During this state, the clock MCLK can be applied to the
part in order to properly bias the input structures of all
channels. If not applied, large analog input leakage
currents can be observed for highly negative input
signals and, after removing the Hard Reset state, a
certain start-up time is necessary to bias the input
structure properly. During this delay, the ADC
conversions can be inaccurate.
4.21
ADC Shutdown Mode
ADC Shutdown mode is defined as a state where the
converters and their biases are off, consuming only
leakage current. When one of the SHUTDOWN<5:0>
bits is reset to ‘0’, the analog biases of the
corresponding channel will be enabled, as well as the
clock and the digital circuitry. The ADC of the
corresponding channel will give a data ready after the
SINC filter settling time has occurred. However, since
the analog biases are not completely settled at the
beginning of the conversion, the sampling may not be
accurate during about 1 ms (corresponding to the
settling time of the biasing in worst case conditions). In
order to ensure accuracy, the data ready pulse within
the delay of 1 ms + settling time of the SINC filter
should be discarded.
Each converter can be placed in Shutdown mode
independently. The configuration registers are not
modified by the Shutdown mode. This mode is only
available through programming the SHUTDOWN<5:0>
bits of the CONFIG1 register.
The output data is flushed to all zeros while in ADC
Shutdown mode. No data ready pulses are generated
by any ADC while in ADC Shutdown mode.
 2013 Microchip Technology Inc.
MCP3913
When an ADC exits ADC Shutdown mode, any phase
delay present before shutdown was entered will still be
present. If one ADC was not in Shutdown, the ADC
leaving Shutdown mode will automatically resynchronize the phase delay relative to the other ADC channel
per the phase delay register block, and give data ready
pulses accordingly.
If an ADC is placed in Shutdown mode while others are
converting, it is not shutting down the internal clock.
When coming back out of Shutdown mode, it will
automatically be resynchronized with the clock that did
not stop during reset.
If all ADCs are in ADC Shutdown mode, the clock is not
distributed to the input structure or to the digital core for
low-power operation. This can potentially cause high
analog input leakage currents at the analog inputs, if
the input voltage is highly negative (typically below 0.6V referred to AGND). Once either of the ADCs is
back to normal operation, the clock is automatically
distributed again.
4.22
Full Shutdown Mode
The lowest power consumption can be achieved when
SHUTDOWN<5:0> = 111111,
VREFEXT = CLKEXT = 1. This mode is called Full
Shutdown mode, and no analog circuitry is enabled. In
this mode, both AVDD and DVDD POR monitoring are
also disabled, and no clock is propagated throughout
the chip. All ADCs are in Shutdown mode, and the
internal voltage reference is disabled. This mode does
not reset the writable part of the register map to its
default values.
The clock is no longer distributed to the input structure
as well. This can potentially cause high analog input
leakage currents at the analog inputs, if the input voltage is highly negative (typically below -0.6V referred to
AGND).
The only circuit that remains active is the SPI interface,
but this circuit does not induce any static power
consumption. If SCK is idle, the only current
consumption comes from the leakage currents induced
by the transistors and is less than 5 µA on each power
supply.
This mode can be used to power down the chip
completely and avoid power consumption when there
is no data to convert at the analog inputs. Any SCK or
MCLK edge occurring while in this mode will induce
dynamic power consumption.
Once any of the SHUTDOWN<5:0>, CLKEXT and
VREFEXT bits return to ‘0’, the two POR monitoring
blocks are operational and AVDD and DVDD monitoring
can take place.
 2013 Microchip Technology Inc.
4.23
Measurement Error
The measurement error specification is typically used
in power meter applications. This specification is a
measurement of the linearity of the active energy of a
given power meter across its dynamic range.
For this measurement, the goal is to measure the
active energy of one phase when the voltage Root
Mean Square (RMS) value is fixed, and the current
RMS value is sweeping across the dynamic range
specified by the meter. The measurement error is the
non-linearity error of the energy power across the
current dynamic range. It is expressed in percent (%).
Equation 4-13 shows the formula that calculates the
measurement error:
EQUATION 4-13:
Measured Active Energy – Active Energy present at inputs
Measurement Error  I RMS = --------------------------------------------------------------------------------------------------------------------------------------------  100%
Active Energy present at inputs
In the present device, the calculation of the active
energy is done externally, as a post-processing step
that typically happens in the microcontroller,
considering, for example, the even channels as current
channels and the odd channels as voltage channels.
The odd channels (voltages) are fed with a full-scale
sine wave at 600 mV peak, and are configured with
GAIN = 1 and DITHER = Maximum. To obtain the
active energy measurement error graphs, the even
channels are fed with sine waves with amplitudes that
vary from 600 mV peak to 60 µV peak, representing a
10000:1 dynamic range. The offset is removed on both
current and voltage channels, and the channels are
multiplied together to give instantaneous power. The
active energy is calculated by multiplying the current
and voltage channel, and averaging the results of this
power during 20 seconds, to extract the active energy.
The sampling frequency is chosen as a multiple integer
of line frequency (coherent sampling). Therefore, the
calculation does not take into account any residue
coming from bad synchronization.
The measurement error is a function of IRMS and varies
with the OSR, averaging time, MCLK frequency and is
tightly coupled with the noise and linearity
specifications. The measurement error is a function of
the linearity and THD of the ADCs, while the standard
deviation of the measurement error is a function of the
noise specification of the ADCs. Overall, the low THD
specification enables low measurement error on a very
large dynamic range (e.g. 10,000:1). A low noise and
high SNR specification enables the decreasing of the
measurement time and, therefore, the calibration time,
to obtain a reliable measurement error specification.
Figure 2-5 shows the typical measurement error
curves obtained with the samples acquired by the
MCP3913, using the default settings with a 1-point and
2-point calibration. These calibrations are detailed in
Section 7.0 “Basic Application Recommendations”.
DS20005227A-page 27
MCP3913
NOTES:
DS20005227A-page 28
 2013 Microchip Technology Inc.
MCP3913
5.0
DEVICE OVERVIEW
5.1
Analog Inputs (CHn+/-)
The MCP3913 analog inputs can be connected directly
to current and voltage transducers (such as shunts,
current transformers, or Rogowski coils). Each input
pin is protected by specialized ESD structures that
allow bipolar ±2V continuous voltage, with respect to
AGND, to be present at their inputs without the risk of
permanent damage.
All channels have fully differential voltage inputs for
better noise performance. The absolute voltage at each
pin relative to AGND should be maintained in the ±1V
range during operation in order to ensure the specified
ADC accuracy. The Common mode signals should be
adapted to respect both the previous conditions and
the differential input voltage range. For best
performance, the Common mode signals should be
maintained to AGND.
Note:
5.2
If the analog inputs are held to a potential
of -0.6 to -1V for extended periods of time,
MCLK must be present inside the device
in order to avoid large leakage currents at
the analog inputs. This is true even during
Hard Reset mode, or the Soft Reset of all
ADCs. However, during the Shutdown
mode of all the ADCs or POR state, the
clock is not distributed inside the circuit.
During these states, it is recommended to
keep the analog input voltages above
-0.6V referred to AGND, to avoid high
analog inputs leakage currents.
TABLE 5-1:
PGA CONFIGURATION
SETTING
Gain
PGA_CHn<2:0>
The PGA block can be used to amplify very low signals,
but the differential input range of the delta-sigma
modulator must not be exceeded. The PGA on each
channel is independent and is controlled by the
PGA_CHn<2:0> bits in the GAIN register. Table 5-1
displays the gain settings for the PGA.
 2013 Microchip Technology Inc.
Gain
(dB)
0
VIN = (CHn+) – (CHn-)
Differential
Input Range (V)
0
0
0
1
0
0
1
2
6
±0.3
0
1
0
4
12
±0.15
0
1
1
8
18
±0.075
1
0
0
16
24
±0.0375
1
±0.6
0
1
32
30
±0.01875
Note: The two undefined settings are G = 1. This
table is defined with VREF = 1.2V.
5.3
Delta-Sigma Modulator
5.3.1
ARCHITECTURE
All ADCs are identical in the MCP3913, and they
include a proprietary second-order modulator with a
multi-bit 5-level DAC architecture (see Figure 5-1). The
quantizer is a Flash ADC composed of four
comparators with equally spaced thresholds and a
thermometer output coding. The proprietary 5-level
architecture ensures minimum quantization noise at
the outputs of the modulators without disturbing
linearity or inducing additional distortion. The sampling
frequency is DMCLK (typically 1 MHz with
MCLK = 4 MHz) so the modulators are refreshed at a
DMCLK rate.
Figure 5-1 represents a simplified block diagram of the
delta-sigma ADC present on MCP3913.
Programmable Gain Amplifiers
(PGA)
The six Programmable Gain Amplifiers (PGAs) reside
at the front-end of each delta-sigma ADC. They have
two functions: translate the common-mode voltage of
the input from AGND to an internal level between AGND
and AVDD, and amplify the input differential signal. The
translation of the common-mode voltage does not
change the differential signal, but recenters the Common mode so that the input signal can be properly
amplified.
Gain
(V/V)
Loop
Filter
Quantizer
Output
Differential
SecondOrder
Integrator
Voltage Input
5-level
Flash ADC
Bitstream
DAC
MCP3913 Delta-Sigma Modulator
FIGURE 5-1:
Block Diagram.
Simplified Delta-Sigma ADC
DS20005227A-page 29
MCP3913
5.3.2
MODULATOR INPUT RANGE AND
SATURATION POINT
5.3.3
The delta-sigma modulators include a programmable
biasing circuit, in order to further adjust the power
consumption to the sampling speed applied through
the MCLK. This can be programmed through the
BOOST<1:0> bits, which are applied to all channels
simultaneously.
For a specified voltage reference value of 1.2V, the
specified differential input range is ±600 mV. The input
range is proportional to VREF and scales according to
the VREF voltage. This range ensures the stability of the
modulator over amplitude and frequency. Outside of
this range, the modulator is still functional; however, its
stability is no longer ensured and therefore it is not
recommended to exceed this limit. The saturation point
for the modulator is VREF/1.5, since the transfer
function of the ADC includes a gain of 1.5 by default
(independent from the PGA setting). See Section 5.5
“ADC Output Coding”).
TABLE 5-2:
The maximum achievable analog master clock speed
(AMCLK), the maximum sampling frequency (DMCLK)
and the maximum achievable data rate (DRCLK),
highly depend on BOOST<1:0> and PGA_CHn<2:0>
settings. Table 5-2 specifies the maximum AMCLK
possible to keep optimal accuracy in the function of
BOOST<1:0> and PGA_CHn<2:0> settings.
MAXIMUM AMCLK LIMITS AS A FUNCTION OF BOOST AND PGA GAIN
Conditions
Boost
BOOST SETTINGS
Gain
VDD = 3.0V to 3.6V,
TA from -40°C to +125°C
Maximum AMCLK
(MHz)
(SINAD within -3 dB
from its maximum)
Maximum AMCLK
(MHz)
(SINAD within -5 dB
from its maximum)
VDD = 2.7V to 3.6V,
TA from -40°C to +125°C
Maximum AMCLK
(MHz)
(SINAD within -3 dB
from its maximum)
Maximum AMCLK
(MHz)
(SINAD within -5 dB
from its maximum)
0.5x
1
4
4
4
4
0.66x
1
6.4
7.3
6.4
7.3
1x
1
11.4
11.4
10.6
10.6
2x
1
16
16
16
16
0.5x
2
4
4
4
4
0.66x
2
6.4
7.3
6.4
7.3
1x
2
11.4
11.4
10.6
10.6
2x
2
16
16
13.3
14.5
0.5x
4
2.9
2.9
2.9
2.9
0.66x
4
6.4
6.4
6.4
6.4
1x
4
10.7
10.7
9.4
10.7
2x
4
16
16
16
16
0.5x
8
2.9
4
2.9
4
0.66x
8
7.3
8
6.4
7.3
1x
8
11.4
12.3
8
8.9
2x
8
16
16
10
11.4
0.5x
16
2.9
2.9
2.9
2.9
0.66x
16
6.4
7.3
6.4
7.3
1x
16
11.4
11.4
9.4
10.6
2x
16
13.3
16
8.9
11.4
0.5x
32
2.9
2.9
2.9
2.9
0.66x
32
7.3
7.3
7.3
7.3
1x
32
10.6
12.3
9.4
10,6
2x
32
13.3
16
10
11.4
DS20005227A-page 30
 2013 Microchip Technology Inc.
MCP3913
5.3.4
DITHER SETTINGS
SINC3 + SINC1 Filter
5.4
All modulators include a dithering algorithm that can be
enabled through the DITHER<1:0> bits in the
Configuration register. This dithering process improves
THD and SFDR (for high OSR settings), while slightly
increasing the noise floor of the ADCs. For power
metering applications and applications that are
distortion sensitive, it is recommended to keep DITHER
at maximum settings for best THD and SFDR
performance. In the case of power metering
applications, THD and SFDR are critical specifications.
Optimizing SNR (noise floor) is not problematic due to
the large averaging factor at the output of the ADCs.
Therefore, even for low OSR settings, the dithering
algorithm will show a positive impact on the
performance of the application.
The decimation filter present in all channels of the
MCP3913 is a cascade of two sinc filters (sinc3+sinc1):
a third order sinc filter with a decimation ratio of OSR3,
followed by a first order sinc filter with a decimation
ratio of OSR1 (moving average of OSR1 values).
Figure 5-2 represents the decimation filter architecture.
OSR1=1
Modulator
Output
SINC3
SINC1
4
Decimation
Filter Output
16 (WIDTH=0)
24 (WIDTH=1)
OSR3
OSR1
Decimation Filter
FIGURE 5-2:
MCP3913 Decimation Filter Block Diagram.
Equation 5-1 calculates the filter z-domain transfer
function.
EQUATION 5-1:
SINC FILTER TRANSFER
FUNCTION
- OSR 3 3
- OSR 1  OSR 3
1 – z

1 – z





H  z  = ----------------------------------------------  --------------------------------------------------------3
–
1
OSR
 OSR  1 – z  
3
3
OSR   1 – z

1 
Where z = EXP   2   j  f in    DMCLK  
Equation 5-2 calculates the settling time of the ADC as
a function of DMCLK periods.
The SINC1 filter following the SINC3 filter is only
enabled for the high OSR settings (OSR > 512). This
SINC1 filter provides additional rejection at a low cost
with little modification to the -3 dB bandwidth. The
resolution (number of possible output codes expressed
in powers of two or in bits) of the digital filter is 24-bit
maximum for any OSR and data format choice. The
resolution depends only on the OSR<2:0> settings in
the CONFIG0 register per the Table 5-3. Once the OSR
is chosen, the resolution is fixed and the output code
respects the data format defined by the
WIDTH_DATA<1:0> setting in the STATUSCOM
register (see Section 5.5 “ADC Output Coding”).
EQUATION 5-2:
SettlingTime  DMCLKperiods = 3  OSR +  OSR – 1   OSR
3
1
3
 2013 Microchip Technology Inc.
DS20005227A-page 31
MCP3913
The gain of the transfer function of this filter is 1 at each
multiple of DMCLK (typically 1 MHz), so a proper antialiasing filter must be placed at the inputs. This will
attenuate the frequency content around DMCLK and
keep the desired accuracy over the baseband of the
converter. This anti-aliasing filter can be a simple, firstorder RC network, with a sufficiently low-time constant
to generate high rejection at the DMCLK frequency.
Any unsettled data is automatically discarded to avoid
data corruption. Each data-ready pulse corresponds to
fully settled data at the output of the decimation filter.
The first data available at the output of the decimation
TABLE 5-3:
filter is present after the complete settling time of the
filter (see Table 5-3). After the first data has been
processed, the delay between two data-ready pulses
coming from the same ADC channel is one DRCLK
period. The data stream from input to output is delayed
by an amount equal to the settling time of the filter
(which is the group delay of the filter).
The achievable resolution, the -3 dB bandwidth and the
settling time at the output of the decimation filter (the
output of the ADC), is dependent on the OSR of each
sinc filter and is summarized in Table 5-3.
OVERSAMPLING RATIO AND SINC FILTER SETTLING TIME
OSR<2:0>
OSR3
OSR1
Total OSR
Resolution in Bits
(No Missing Code)
Settling Time
-3 dB Bandwidth
0
0
0
32
1
32
17
96/DMCLK
0.26*DRCLK
0
0
1
64
1
64
20
192/DMCLK
0.26*DRCLK
0
1
0
128
1
128
23
384/DMCLK
0.26*DRCLK
0
1
1
256
1
256
24
768/DMCLK
0.26*DRCLK
1
0
0
512
1
512
24
1536/DMCLK
0.26*DRCLK
1
0
1
512
2
1024
24
2048/DMCLK
0.37*DRCLK
1
1
0
512
4
2048
24
3072/DMCLK
0.42*DRCLK
1
1
1
512
8
4096
24
5120/DMCLK
0.43*DRCLK
0
0
-20
Magnitude (dB)
Ma
agnitude (dB)
-20
-40
-60
-80
-100
-40
-60
-80
-100
-120
-140
-120
1
10
100
1000
10000
100000
Input Frequency (Hz)
FIGURE 5-3:
SINC Filter Frequency
Response, OSR = 256, MCLK = 4 MHz,
PRE<1:0> = 00.
DS20005227A-page 32
-160
1
100
10000
Input Frequency (Hz)
1000000
FIGURE 5-4:
SINC Filter Frequency
Response, OSR = 4096 (in pink), OSR = 512 (in
blue), MCLK = 4 MHz, PRE<1:0> = 00.
 2013 Microchip Technology Inc.
MCP3913
5.5
Equation 5-3 is only true for DC inputs. For AC inputs,
this transfer function needs to be multiplied by the
transfer function of the SINC3+SINC1 filter (see
Equation 5-1 and Equation 5-3).
ADC Output Coding
The second order modulator, SINC3+SINC1 filter, PGA,
VREF and the analog input structure all work together to
produce the device transfer function for the analog-todigital conversion (see Equation 5-3).
EQUATION 5-3:
Each channel data is calculated on 24-bit (23-bit plus
sign) and coded in two's complement format, MSB first.
The output format can then be modified by the
WIDTH_DATA<1:0> settings in the STATUSCOM
register to allow 16-/24-/32-bit formats compatibility
(see Section 8.6 “STATUSCOM Register – Status
and Communication Register” for more information).
  CH n+ – CH n-  
DATA_CHn =  -----------------------------------------  8,388,608  G  1.5
 V REF+ – V REF-
For 24-bit Mode, WIDTH_Data<1:0> = 01(Default)
For other than the default 24-bit data formats,
Equation 5-3 should be multiplied by a scaling factor,
depending on the data format used (defined by
WIDTH_DATA<1:0>). The data format and associated
scaling factors are given in Figure 5-5.
In case of positive saturation (CHn+ – CHn> VREF/1.5), the output is locked to 7FFFFF for 24-bit
mode.
In
case
of
negative
saturation
(CHn+ - CHn- < -VREF/1.5), the output code is locked
to 800000 for 24-bit mode.
23
0
Scaling
Factor
DATA DATA DATA
<23:16> <15:8> <7:0>
15
WIDTH_DATA<1:0> = 00
16-bit
0
DATA DATA
<23:16> <15:8>
DATA
<7>
Unformatted ADC data
x1/256
Rounded
WIDTH_DATA<1:0> = 01
24-bit
23
WIDTH_DATA<1:0> = 10
32-bit with zeros padded
31
WIDTH_DATA<1:0> = 11
32-bit with sign extension
FIGURE 5-5:
0
DATA DATA DATA
<23:16> <15:8> <7:0>
x1
0
DATA DATA DATA
<23:16> <15:8> <7:0>
31
DATA DATA DATA DATA
<23> <23:16> <15:8> <7:0>
0x00
x256
0
x1
Output Data Formats.
The ADC resolution is a function of the OSR
(Section 5.4 “SINC3 + SINC1 Filter”). The resolution
is the same for all channels. No matter what the
resolution is, the ADC output data is always calculated
in 24-bit words, with added zeros at the end, if the OSR
is not large enough to produce 24-bit resolution (left
justification).
 2013 Microchip Technology Inc.
DS20005227A-page 33
MCP3913
TABLE 5-4:
OSR = 256 (AND HIGHER) OUTPUT CODE EXAMPLES
ADC Output Code (MSB First)
0
0
0
1
1
1
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
TABLE 5-5:
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
0
0
1
1
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
TABLE 5-6:
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
0
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
0
0
1
1
0
0
0
0
0
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
TABLE 5-7:
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
0
0
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
+ 8,388,607
+ 8,388,606
0
-1
- 8,388,607
- 8,388,608
Hexadecimal
Decimal,
23-bit Resolution
0x7FFFFE
0x7FFFFC
0x000000
0xFFFFFE
0x800002
0x800000
+ 4,194,303
+ 4,194,302
0
-1
- 4,194,303
- 4,194,304
Hexadecimal
Decimal,
20-bit resolution
0x7FFFF0
0x7FFFE0
0x000000
0xFFFFF0
0x800010
0x800000
+ 524, 287
+ 524, 286
0
-1
- 524,287
- 524, 288
Hexadecimal
Decimal,
17-bit resolution
0x7FFF80
0x7FFF00
0x000000
0xFFFF80
0x800080
0x800000
+ 65, 535
+ 65, 534
0
-1
- 65,535
- 65, 536
OSR = 32 OUTPUT CODE EXAMPLES
ADC Output code (MSB First)
0
0
0
1
1
1
0x7FFFFF
0x7FFFFE
0x000000
0xFFFFFF
0x800001
0x800000
OSR = 64 OUTPUT CODE EXAMPLES
ADC Output code (MSB First)
0
0
0
1
1
1
Decimal,
24-bit Resolution
OSR = 128 OUTPUT CODE EXAMPLES
ADC Output Code (MSB First)
0
0
0
1
1
1
Hexadecimal
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
DS20005227A-page 34
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
1
0
1
0
0
1
0
0
1
1
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
0
 2013 Microchip Technology Inc.
MCP3913
5.6.1
Voltage Reference
INTERNAL VOLTAGE REFERENCE
The MCP3913 contains an internal voltage reference
source specially designed to minimize drift over
temperature. In order to enable the internal voltage
reference, the VREFEXT bit in the Configuration
register must be set to ‘0’ (default mode). This internal
VREF supplies reference voltage to all channels. The
typical value of this voltage reference is 1.2V ±2%. The
internal reference has a very low typical temperature
coefficient of ±7 ppm/°C, allowing the output to have
minimal variation, with respect to temperature, since
they are proportional to (1/VREF).
The noise of the internal voltage reference is low
enough not to significantly degrade the SNR of the
ADC, if compared to a precision external low-noise
voltage reference. The output pin for the internal voltage reference is REFIN+/OUT.
If the voltage reference is only used as an internal
VREF, adding bypass capacitance on REFIN+/OUT is
not necessary for keeping ADC accuracy, but a minimal
0.1 µF ceramic capacitance can be connected to avoid
EMI/EMC susceptibility issues due to the antenna
created by the REFIN+/OUT pin, if left floating.
The bypass capacitors also help applications where the
voltage reference output is connected to other circuits.
In this case, additional buffering may be needed since
the output drive capability of this output is low.
Adding too much capacitance on the REFIN+/OUT pin
may slightly degrade the THD performance of the
ADCs.
5.6.2
DIFFERENTIAL EXTERNAL
VOLTAGE INPUTS
When the VREFEXT bit is set to ‘1’, the two reference
pins (REFIN+/OUT, REFIN-) become a differential
voltage reference input. The voltage at the
REFIN+/OUT is noted VREF+, and the voltage at the
REFIN- pin is noted VREF-. The differential voltage
input value is shown in Equation 5-4.
as their offset, so that the SNR of the system is not
limited by this noise component, even at maximum
OSR. This auto-zeroing algorithm is performed
synchronously with the MCLK coming to the device.
5.6.3
TEMPERATURE COMPENSATION
(VREFCAL<7:0>)
The internal voltage reference consists of a proprietary
circuit and algorithm to compensate first order and second order temperature coefficients. The compensation
enables very low temperature coefficients (typically
9 ppm/°C) on the entire range of temperatures, from
- 40°C to +125°C. This temperature coefficient varies
from part to part.
This temperature coefficient can be adjusted on each
part through the VREFCAL<7:0> bits present in the
CONFIG0 register (bits 7 to 0). These register settings
are only for advanced users. VREFCAL<7:0> should
not be modified unless the user wants to calibrate the
temperature coefficient of the whole system or
application. The default value of this register is set to
0x50. The default value (0x50) was chosen to optimize
the standard deviation of the tempco across process
variation. The value can be slightly improved to around
7 ppm/°C if the VREFCAL<7:0> is written at 0x50, but
this setting degrades the standard deviation of the
VREF tempco.The typical variation of the temperature
coefficient of the internal voltage reference with respect
to the VREFCAL register code is shown in Figure 5-6.
Modifying the value stored in the VREFCAL<7:0> bits
may also vary the voltage reference, in addition to the
temperature coefficient.
60
50
VREF Drift (ppm)
5.6
40
30
20
10
0
EQUATION 5-4:
0
VREF = VREF+ – VREFThe specified VREF range is from 1.1V to 1.3V. The
REFIN- pin voltage (VREF-) should be limited to ±0.1V,
with respect to AGND. Typically, for single-ended
reference applications, the REFIN- pin should be
directly connected to AGND, with its own separate track
to avoid any spike due to switching noise.
These buffers are injecting a certain quantity of
1/f noise into the system, noise that can be modulated
with the incoming input signals and that can limit the
SNR at very high OSR (OSR>256). To overcome this
limitation, these buffers include an auto-zeroing
algorithm that greatly diminishes their 1/f noise as well
 2013 Microchip Technology Inc.
64
128
192
VREFCAL Register Trim Code (decimal)
FIGURE 5-6:
Trim Code Chart.
5.6.4
256
VREF Tempco vs. VREFCAL
VOLTAGE REFERENCE BUFFERS
Each channel includes a voltage reference buffer tied
to the REFIN+/OUT pin, which allows the internal
capacitors to properly charge with the voltage
reference signals, even in the case of an external
voltage reference connection with weak load regulation
specifications. This ensures that the correct amount of
current is sourced to each channel to guarantee their
accuracy specifications, and diminishes the constraints
on the voltage reference load regulation.
DS20005227A-page 35
MCP3913
5.7
Figure 5-7 illustrates the different conditions at a
power-up and a power-down event in typical
conditions. All internal DC biases are not settled until at
least 1 ms in worst case conditions after system POR.
Any data-ready pulse occurring within 1 ms plus the
SINC filter settling time after system reset, should be
ignored to ensure proper accuracy. After POR, data
ready pulses are present at the pin with all the default
conditions in the Configuration registers.
Power-on Reset
The MCP3913 contains an internal POR circuit that
monitors both analog and digital supply voltages during
operation. The typical threshold for a power-up event
detection is 2.0V ±10% and a typical start-up time
(tPOR) of 50 µs. The POR circuit has a built-in hysteresis for improved transient spike immunity that has a
typical value of 200 mV. Proper decoupling capacitors
(0.1 µF in parallel with 10 µF) should be mounted as
close as possible to the AVDD and DVDD pins, providing
additional transient immunity.
Both AVDD and DVDD are monitored, so either power
supply can sequence first.
Voltage
(AVDD, DVDD)
Any data-read pulse occurring
during this time can yield
inaccurate output data. It is
recommended to discard them.
POR Threshold
up (2.0V typical)
(1.8V typical)
tPOR
POR
State
Analog biases
settling time
SINC filter
settling
time
Power-Up
Biases are
unsettled.
Conversions
started here may
not be accurate
FIGURE 5-7:
5.8
Normal
Operation
POR
State
Time
Biases are settled.
Conversions started
here are accurate.
Power-On Reset Operation.
Hard Reset Effect On Delta-Sigma
Modulator/SINC Filter
When the RESET pin is logic low, all ADCs will be in
Reset and output code 0x000000h. The RESET pin
performs a hard reset (DC biases are still on, the part
is ready to convert) and clears all charges contained in
the delta-sigma modulators. The comparator’s output is
‘0011’ for each ADC.
The SINC filters are all reset, as well as their double
output buffers. This pin is independent of the serial
interface. It brings all the registers to the default state.
When RESET is logic low, any write with the SPI
interface will be disabled and will have no effect. All
output pins (SDO, DR) are high-impedance.
If an external clock (MCLK) is applied, the input structure is enabled and is properly biasing the substrate of
the input transistors. In this case, the leakage current
on the analog inputs is low if the analog input voltages
are kept between -1V and +1V.
5.9
Phase Delay Block
The MCP3913 incorporates a phase delay generator
which ensures that each pair of ADCs (CH0/1, CH2/3,
CH4/5) are converting the inputs with a fixed delay
between them. The six ADCs are synchronously
sampling, but the averaging of modulator outputs is
delayed so that the SINC filter outputs (thus the ADC
outputs) show a fixed phase delay, as determined by
the PHASE0/1 register setting. The odd channels
(CH1,3,5) are the reference channels for the phase
delays of each pair, they set the time reference.
Typically, these channels can be the voltage channels
for a polyphase energy metering application. These
odd channels are synchronous at all times, so they are
becoming ready, and output a data ready pulse, at the
same time. The even channels (CH0/2/4) are delayed,
compared to the time reference (CH1/3/5), by a fixed
amount of time defined for each pair channel in the
PHASE0/1 registers.
If MCLK is not applied when in Reset mode, the
leakage can be high if the analog inputs are
below -0.6V, as referred to AGND.
DS20005227A-page 36
 2013 Microchip Technology Inc.
MCP3913
The two PHASE0/1 registers are split into three 12-bit
banks that represent the delay between each pair of
channels. The equivalence is defined in Table 5-8.
Each phase value (PHASEA/B/C) represents the delay
of the even channel with respect to the associated odd
channel with an 11-bit plus sign, MSB-first two's
complement code. This code indicates how many
DMCLK periods there are between each channel in the
pair. (see Equation 5-5). Since the odd channels are
the time reference, when PHASEX<11:0> is positive,
the even channel of the pair is lagging and the odd
channel is leading. When PHASEX<11:0> is negative,
the even channel of the pair is leading and the odd
channel is lagging.
TABLE 5-8:
Pair of
channels
PHASE DELAYS
EQUIVALENCE
Phase Bank
Register Map
Position
CH1/CH0
PHASEA<11:0>
PHASE1<11:0>
CH3/CH2
PHASEB<11:0>
PHASE1<23:12>
CH5/CH4
PHASEC<11:0>
PHASE0<11:0>
EQUATION 5-5:
PHASEX<11:0> Decimal Code
Total Delay = ----------------------------------------------------------------------------------DMCLK
where: X = A/B/C
The timing resolution of the phase delay is 1/DMCLK or
1 µs in the default configuration with MCLK = 4 MHz.
Given the definition of DMCLK, the phase delay is
affected by a change in the prescaler settings
(PRE<1:0>) and the MCLK frequency.
The data ready signals are affected by the phase delay
settings. Typically, the time difference between the data
ready pulses of odd and even channels is equal to the
associated phase delay setting.
Each ADC conversion start and, therefore, each data
ready pulse is delayed by a timing of OSR/2 x DMCLK
periods (equal to half a DRCLK period). This timing
allows for the odd channel’s data ready signals to be
located at a fixed time reference (OSR/2 x DMCLK
periods from the reset), while the even channel can be
leading or lagging around this time reference with the
corresponding PHASEX<11:0> delay value.
Note:
For a detailed explanation of the data
ready pin (DR) with phase delay, see
Figure 5.11.
 2013 Microchip Technology Inc.
5.9.1
PHASE DELAY LIMITS
The limits of the phase delays are determined by the
OSR settings: the phase delays can only go from
-OSR/2 to +OSR/2-1 DMCLK periods.
If larger delays between the two channels are needed,
they can be implemented externally to the chip with an
MCU. A FIFO in the MCU can save incoming data from
the leading channel for a number N of DRCLK clocks.
In this case, DRCLK would represent the coarse timing
resolution, and DMCLK the fine timing resolution. The
total delay will then be equal to:
EQUATION 5-6:
Total Delay = N/DRCLK + PHASE/DMCLK
Note:
Rewriting the PHASE registers with the
same value automatically resets and
restarts all ADCs.
The Phase delay registers can be programmed once
with the OSR = 4096 setting, and will adjust the OSR
automatically afterwards without the need to change
the value of the phase registers.
• OSR = 4096: The delay can go from -2048 to
+2047. PHASEX<11> is the sign bit.
PHASEX<10> is the MSB and PHASEX<0> the
LSB.
• OSR = 2048: The delay can go from -1024 to
+1023. PHASEX<10> is the sign bit. PHASEX<9>
is the MSB and PHASEX<0> the LSB.
• OSR = 1024: The delay can go from -512 to +511.
PHASEX<9> is the sign bit. PHASEX<8> is the
MSB and PHASEX<0> the LSB.
• OSR = 512: The delay can go from -256 to +255
PHASEX<8> is the sign bit. PHASEX<7> is the
MSB and PHASEX<0> the LSB.
• OSR = 256: The delay can go from -128 to +127.
PHASEX<7> is the sign bit. PHASEX<6> is the
MSB and PHASEX<0> the LSB.
• OSR = 128: The delay can go from -64 to +63.
PHASEX<6> is the sign bit. PHASEX<5> is the
MSB and PHASEX<0> the LSB.
• OSR = 64: The delay can go from -32 to +31.
PHASEX<5> is the sign bit. PHASEX<4> is the
MSB and PHASEX<0> the LSB.
• OSR = 32: The delay can go from -16 to +15.
PHASEX<4> is the sign bit. PHASEX<3> is the
MSB and PHASEX<0> the LSB.
DS20005227A-page 37
MCP3913
TABLE 5-9:
PHASE VALUES WITH
MCLK = 4 MHZ, OSR = 4096,
PRE<1:0> = 00
PHASEX<11:0> for
the Channel Pair
CH<n/n+1>
Hex
Delay
(CH<n> relative
to CH<n+1>)
0 1 1 1 1 1 1 1 1 1 1 1 0x7FF
+ 2047 µs
0 1 1 1 1 1 1 1 1 1 1 0 0x7FE
+ 2046 µs
0 0 0 0 0 0 0 0 0 0 0 1 0x001
+ 1 µs
0 0 0 0 0 0 0 0 0 0 0 0 0x000
0 µs
1 1 1 1 1 1 1 1 1 1 1 1 0xFFF
- 1 µs
1 0 0 0 0 0 0 0 0 0 0 1 0x801
- 2047 µs
1 0 0 0 0 0 0 0 0 0 0 0 0x800
-2048 µs
5.10
Data Ready Link
There are two modes defined with the DR_LINK bit in
the STATUSCOM register that control the data ready
pulses. The position of the data ready pulses varies
with respect to this mode, to the OSR<2:0> and to the
PHASE0/1 register settings. Figure 5.11 represents the
behavior of the data ready pin with the two DR_LINK
configurations
• DR_LINK = 0: Data ready pulses from all enabled
channels are output on the DR pin.
• DR_LINK = 1 (Recommended and Default mode):
Only the data ready pulses from the most lagging
ADC between all the active ADCs are present on
the DR pin.
The lagging ADC data ready position depends on the
PHASE0/1 registers, the PRE<1:0> and the OSR<2:0>
settings. In this mode, the active ADCs are linked
together, so their data is latched together when the
lagging ADC output is ready. For power metering
applications, DR_LINK = 1 is recommended (Default
mode); it allows the host MCU to gather all channels
synchronously within a unique interrupt pulse and it
ensures that all channels have been latched at the
same time, so that no data corruption is happening.
5.11
Data Ready Status Bits
In addition to the data ready pin indicator, the
MCP3913 device includes a separate data-ready
status bit for each channel. Each ADC channel CHn is
associated to the corresponding DRSTATUS<n> that
can be read at all times in the STATUSCOM register.
These status bits can be used to synchronize the data
retrieval, in case the DR pin is not connected (see
Section 6.8 “ADC Channels Latching and
Synchronization”).
DS20005227A-page 38
The DRSTATUS<5:0> bits are not writable; writing on
them has no effect. They have a default value of '1',
which indicates that the data of the corresponding ADC
is not ready. This means that the ADC output register
has not been updated since the last reading (or since
the last reset). The DRSTATUS bits take the '0' state,
once the ADC channel register is updated (which happens at a DRCLK rate). A simple read of the STATUSCOM register clears all the DRSTATUS bits to their
default value ('1').
In the case of DR_LINK = 1, the DRSTATUS<5:0> bits
are all updated synchronously with the most lagging
channel, at the same time the DR pulse is generated.
In case of DR_LINK = 0, each DRSTATUS bit is
updated independently and synchronously with its
corresponding channel.
5.12
Crystal Oscillator
The MCP3913 includes a Pierce-type crystal oscillator
with very high stability and ensures very low tempco
and jitter for the clock generation. This oscillator can
handle crystal frequencies up to 20 MHz, provided
proper load capacitances and quartz quality factors are
used. The crystal oscillator is enabled when
CLKEXT = 0 in the CONFIG1 register.
For a proper start-up, the load capacitors of the crystal
should be connected between OSC1 and DGND and
between OSC2 and DGND. They should also respect
Equation 5-7.
EQUATION 5-7:
2
6
1
R M < 1.6  10   ------------------------
 f  CLOAD
Where:
f = crystal frequency in MHz
CLOAD = load capacitance in pF including
parasitics from the PCB
RM = motional resistance in ohms of the
quartz
When CLKEXT = 1, the crystal oscillator is bypassed
by a digital buffer, to allow direct clock input for an
external clock (see Figure 4-1). In this case, the OSC2
pin is pulled down internally to DGND and should be
connected to DGND externally for better EMI/EMC
immunity.
 2013 Microchip Technology Inc.
MCP3913
PHASE<0
PHASE>0
DR
DR_LINK=0
All channels data
ready are present
Data ready pulse from odd
channels (reference)
PHASE=0
Data ready pulse from
most lagging ADC channel
Data ready pulse from odd
channels (reference)
PHASE=0
Data ready pulse from
most lagging ADC channel
DR
DR_LINK=1
Only the most lagging data ready is present
All channels are latched together at DR
falling edge
FIGURE 5-8:
One DRCLK period (OSR times DMCLK periods)
DR_LINK Configurations.
The external clock should not be higher than 20 MHz
before prescaling (MCLK < 20 MHz) for proper
operation.
Note:
5.13
In addition to the conditions defining the
maximum MCLK input frequency range,
the AMCLK frequency should be
maintained inferior to the maximum limits
defined in Table 5-2, to ensure the
accuracy of the ADCs. If these limits are
exceeded, it is recommended to choose
either a larger OSR, or a larger prescaler
value so that AMCLK can respect these
limits.
Digital System Offset and Gain
Calibration Registers
The MCP3913 incorporates two sets of additional
registers per channel to perform system digital offset
and gain error calibration. Each channel has its own set
of associated registers that will modify the output result
of the channel, if calibration is enabled. The gain and
offset calibrations can be enabled or disabled through
two CONFIG0 bits (EN_OFFCAL and EN_GAINCAL).
These two bits enable or disable system calibration on
all channels at the same time. When both calibrations
are enabled, the output of the ADC is modified per
Equation 5.13.1.
 2013 Microchip Technology Inc.
5.13.1
DIGITAL OFFSET ERROR
CALIBRATION
The OFFCAL_CHn registers are 23-bit plus two’s
complement registers, and whose LSB value is the
same as the Channel ADC Data. These registers are
added bit by bit to the ADC output codes, if the
EN_OFFCAL bit is enabled. Enabling the EN_OFFCAL
bit does not create a pipeline delay; the offset addition
is instantaneous. For low OSR values, only the
significant digits are added to the output (up to the
resolution of the ADC; for example, at OSR = 32, only
the 17 first bits are added).
The offset is not added when the corresponding
channel is in Reset or Shutdown mode. The
corresponding input voltage offset value added by each
LSB in these 24-bit registers is:
OFFSET(1LSB) = VREF/(PGA_CHn x 1.5 x 8388608)
This registers are a “Don't Care” if EN_OFFCAL = 0
(offset calibration disabled), but their value is not
cleared by the EN_OFFCAL bit.
DS20005227A-page 39
MCP3913
5.13.2
DIGITAL GAIN ERROR
CALIBRATION
These registers are signed 24-bit MSB – first registers
coded with a range of -1x to +(1 - 2-23)x (from
0x800000 to 0x7FFFFF). The gain calibration adds 1x
to this register and multiplies it to the output code of the
channel bit by bit, after offset calibration. The range of
the gain calibration is thus from 0x to 1.9999999x (from
0x800000 to 0x7FFFFF). The LSB corresponds to
a 2-23 increment in the multiplier.
Enabling EN_GAINCAL creates a pipeline delay of
24 DMCLK periods on all channels. All data ready
pulses are delayed by 24 DMCLK periods, starting
from data ready following the command enabling
EN_GAINCAL bit. The gain calibration is effective on
the next data ready following the command enabling
EN_GAINCAL bit.
EQUATION 5-8:
The digital gain calibration does not function when the
corresponding channel is in Reset or Shutdown mode.
The gain multiplier value for an LSB in these 24-bit
registers is:
GAIN (1LSB) = 1/8388608
This register is a “Don't Care” if EN_GAINCAL = 0
(offset calibration disabled), but its value is not cleared
by the EN_GAINCAL bit.
The output data on each channel is kept to either 7FFF
or 8000 (16-bit mode) or 7FFFFF or 800000 (24-bit
mode) if the output results are out of bounds after all
calibrations are performed.
DIGITAL OFFSET AND GAIN ERROR CALIBRATION REGISTERS
CALCULATIONS
DATA_CHn  post – cal  =  DATA_CHn  pre – cal  + OFFCAL_CHn    1 + GAINCAL_CHn 
DS20005227A-page 40
 2013 Microchip Technology Inc.
MCP3913
6.0
SPI SERIAL INTERFACE
DESCRIPTION
6.1
Overview
The MCP3913 device includes a four-wire (CS, SCK,
SDI, SDO) digital serial interface that is compatible with
SPI Modes 0,0 and 1,1. Data is clocked out of the
MCP3913 on the falling edge of SCK, and data is
clocked into the MCP3913 on the rising edge of SCK.
In these modes, the SCK clock can idle either high (1,1)
or low (0,0). The digital interface is asynchronous with
the MCLK clock that controls the ADC sampling and
digital filtering. All the digital input pins are Schmitttriggered to avoid system noise perturbations on the
communications.
Each SPI communication starts with a CS falling edge
and stops with the CS rising edge. Each SPI communication is independent. When CS is logic high, SDO is
in high-impedance, transitions on SCK, and SDI have
no effect. Changing from an SPI Mode 1,1 to an SPI
Mode 0,0 and vice versa is possible and can be done
while the CS pin is logic high. Any CS rising edge clears
the communication and resets the SPI digital interface.
Additional control pins (RESET, DR) are also provided
on separate pins for advanced communication
features. The Data Ready pin (DR) outputs pulses
when a new ADC channel data is available for reading,
which can be used as an interrupt for an MCU. The
master reset pin (RESET) acts like a hard reset and
can reset the part to its default power-up configuration
(equivalent to a POR state).
The MCP3913 interface has a simple command
structure. Every command is either a READ command
from a register, or a WRITE command to a register. The
MCP3913 device includes 32 registers defined in the
Table 8-1 register map. The first byte (8-bit wide)
transmitted is always the CONTROL byte that defines
the address of the register and the type of command
(Read or Write). It is followed by the register itself,
which can be in a 16-, 24- or 32-bit format, depending
on the multiple format settings defined in the
STATUSCOM register. The MCP3913 is compatible
with multiple formats that help reduce overhead in the
data handling for most MCUs and processors available
on the market (8-/16- or 32-bit MCUs) and improve
MCU-code compaction and efficiency.
The MCP3913 digital interface is capable of handling
various continuous read and write modes, which allow
it to perform ADC data streaming or full register map
writing within only one communication (and therefore
with only one unique control byte). The internal
registers can be grouped together with various
configurations through the READ<1:0> and WRITE
bits. The internal address counter of the serial interface
can be automatically incremented with no additional
control byte needed, in order to loop through the
various groups of registers within the register map. The
groups are defined in Table 8-2.
 2013 Microchip Technology Inc.
The MCP3913 device also includes advanced security
features to secure each communication, to avoid
unwanted write commands being processed to change
the desired configuration, and to alert the user in case
of a change in the desired configuration.
Each SPI read communication can be secured through
a selectable CRC-16 checksum provided on the SDO
pin at the end of every communication sequence. This
CRC-16 computation is compatible with the DMA CRC
hardware of the PIC24 and PIC32 MCUs, resulting in
no additional overhead for the added security.
For securing the entire configuration of the device, the
MCP3913 includes an 8-bit lock code (LOCK<7:0>),
which blocks all write commands to the full register
map if the value of the LOCK<7:0> is not equal to a
defined password (0xA5). The user can protect its
configuration by changing the LOCK<7:0> value to
0x00 after the full programming, so that any unwanted
write command will not result in a change to the
configuration (because LOCK<7:0> is different than the
password 0xA5).
An additional CRC-16 calculation is also running continuously in the background to ensure the integrity of
the full register map. All writable registers of the register map (except the MOD register) are processed
through a CRC-16 calculation engine and give a CRC16 checksum that depends on the configuration. This
checksum is readable on the LOCK/CRC register and
updated at all times. If a change in this checksum happens, a selectable interrupt can give a flag on the DR
pin (DR pin becomes logic low) to warn the user that
the configuration is corrupted.
6.2
Control Byte
The control byte of the MCP3913 contains two device
Address bits (A<6:5>), five register Address bits
(A<4:0>) and a Read/Write bit (R/W). The first byte
transmitted to the MCP3913 in any communication is
always the control byte. During the control byte transfer, the SDO pin is always in a high-impedance state.
The MCP3913 interface is device addressable
(through A<6:5>), so that multiple chips can be present
on the same SPI bus with no data bus contention, even
if they use the same CS pin, they use a provided halfduplex SPI interface, with a different address identifier.
This functionality enables, for example, a Serial
EEPROM like 24AAXXX/24LCXXX or 24FCXXX and
the MCP3913 to share all the SPI pins and consume
less I/O pins in the application processor, since all
these Serial EEPROM circuits use A<6:5> = 00.
.
A<6> A<5> A<4> A<3> A<2> A<1> A<0> R/W
Device
Address
FIGURE 6-1:
Register Address
Read/
Write
Control Byte.
DS20005227A-page 41
MCP3913
The default device address bits are A<6:5> = 01 (contact the Microchip factory for other available device
address bits). For more information, see the Product
Identification System section. The register map is
defined in Table 8-1.
6.3
Four different Read mode configurations can be
defined through the READ<1:0> bits in the
STATUSCOM register for the address increment (see
Section 6.5,
Continuous
Communications,
Looping on Register Sets and Table 8-2). The data
on SDO is clocked out of the MCP3913 on the falling
edge of SCK. The reading format for each register is
defined
on
Section 6.5
“Continuous
Communications, Looping on Register Sets”.
Reading from the Device
The first register read on the SDO pin is the one defined
by the address (A<4:0>) given in the CONTROL byte.
After this first register is fully transmitted, if the CS pin
is maintained logic low, the communication continues
without an additional control byte and the SDO pin
transmits another register with the address
automatically incremented or not, depending on the
READ<1:0> bit settings.
CS
Device latches SDI on rising edge
Device latches SDO on falling edge
DATA<1>
DATA<2>
DATA<3>
DATA<4>
DATA<5>
DATA<6>
DATA<7>
DATA<8>
DATA<9>
DATA<10>
DATA<12>
DATA<13>
DATA<14>
DATA<15>
DATA<16>
DATA<17>
DATA<18>
DATA<19>
DATA<20>
DATA<21>
DATA<22>
DATA<23>
Hi-Z
SDO
Don’t care
R/W
DATA<11>
A<0>
A<1>
A<2>
A<3>
A<4>
Don’t care
A<5>
SDI
A<6>
SCK
DATA<0>
Hi-Z
READ Communication (SPI mode 1,1)
FIGURE 6-2:
SPI Mode 1,1).
Read on a Single Register with 24-bit Format (WIDTH_DATA<1:0> = 01,
CS
Device latches SDI on rising edge
Device latches SDO on falling edge
DATA<0>
DATA<1>
DATA<2>
DATA<3>
DATA<4>
DATA<5>
DATA<6>
DATA<7>
DATA<8>
DATA<9>
DATA<10>
DATA<11>
DATA<12>
DATA<13>
DATA<14>
DATA<15>
DATA<16>
DATA<17>
DATA<18>
DATA<19>
DATA<20>
A<0>
A<1>
A<2>
A<3>
R/W
DATA<23>
DATA<21>
Hi-Z
Don’t care
DATA<22>
SDO
A<4>
Don’t care
A<5>
SDI
A<6>
SCK
Don’t care
Hi-Z
READ Communication (SPI mode 0,0)
FIGURE 6-3:
SPI Mode 0,0).
DS20005227A-page 42
Read on a Single Register with 24-bit Format (WIDTH_DATA<1:0> = 01,
 2013 Microchip Technology Inc.
MCP3913
6.4
Two different Write-mode configurations for the
address increment can be defined through the WRITE
bit in the STATUSCOM register (see Section 6.5, Continuous Communications, Looping on Register
Sets and Table 8-2). The SDO pin stays in a highimpedance state during a write communication. The
data on SDI is clocked into the MCP3913 on the rising
edge of SCK. The writing format for each register is
defined in Section 6.5, Continuous Communications, Looping on Register Sets. A write on an undefined or non-writable address, such as the ADC
channel’s register addresses, will have no effect and
also will not increment the address counter.
Writing to the Device
The first register written from the SDI pin to the device
is the one defined by the address (A<4:0>) given in the
CONTROL byte. After this first register is fully
transmitted, if the CS pin is maintained logic low, the
communication continues without an additional control
byte and the SDI pin transmits another register with the
address automatically incremented or not, depending
on the WRITE bit setting.
CS
Device latches SDI on rising edge
DATA<4>
DATA<3>
DATA<2>
DATA<1>
DATA<3>
DATA<2>
DATA<1>
DATA<5>
DATA<4>
DATA<6>
DATA<7>
DATA<8>
DATA<9>
DATA<10>
DATA<11>
DATA<12>
DATA<13>
DATA<14>
DATA<15>
DATA<16>
DATA<17>
DATA<18>
DATA<19>
DATA<20>
DATA<21>
DATA<22>
R/W
DATA<23>
A<0>
A<1>
A<2>
A<3>
A<4>
Don’t care
A<5>
SDI
A<6>
SCK
DATA<0>
Don’t
care
Hi-Z
SDO
WRITE Communication (SPI mode 1,1)
FIGURE 6-4:
Write to a Single Register with 24-bit Format (SPI Mode 1,1).
CS
Device latches SDI on rising edge
DATA<0>
DATA<5>
DATA<6>
DATA<7>
DATA<8>
DATA<9>
DATA<10>
DATA<11>
DATA<12>
DATA<13>
DATA<14>
DATA<15>
DATA<16>
DATA<17>
DATA<18>
DATA<19>
DATA<20>
DATA<21>
DATA<23>
DATA<22>
R/W
A<0>
A<1>
A<2>
A<3>
A<4>
Don’t care
A<5>
SDI
A<6>
SCK
Don’t care
Hi-Z
SDO
WRITE Communication (SPI mode 0,0)
FIGURE 6-5:
Write to a Single Register with 24-bit Format (SPI Mode 0,0).
 2013 Microchip Technology Inc.
DS20005227A-page 43
MCP3913
6.5
high. The SPI internal register address pointer starts by
transmitting/receiving the address defined in the control byte. After this first transmission/reception, the SPI
internal register address pointer automatically increments to the next available address in the register set
for each transmission/reception. When it reaches the
last address of the set, the communication sequence is
finished. The address pointer automatically loops back
to the first address of the defined set and restarts a new
sequence with auto-increment (see Table 6-6). This
internal address pointer automatic selection allows the
following functionality:
Continuous Communications,
Looping on Register Sets
The MCP3913 digital interface can process communications in Continuous mode, without having to enter an
SPI command between each read or write to a register.
This feature allows the user to reduce communication
overhead to the strict minimum, which diminishes EMI
emissions and reduces switching noise in the system.
The registers can be grouped into multiple sets for continuous communications. The grouping of the registers
in the different sets is defined by the READ<1:0> and
WRITE bits that control the internal SPI communication
address pointer. For a graphical representation of the
register map sets in function of the READ<1:0> and
WRITE bits, please see Table 8-2.
• Read one ADC channel data, pairs of ADC
channels or all ADC channels continuously
• Continuously read the entire register map
• Continuously read or write each separate register
• Continuously read or write all configuration
registers
In the case of a continuous communication, there is
only one control byte on SDI to start the communication
after a CS pin falling edge. The part stays within the
same communication loop until the CS pin returns logic
CS
ADDRESS SET
SCK
8x
24x
24x
...
24x
24x
24x
...
24x
ADDR
ADDR + 1
SDI
CONTROL
BYTE
Don’t care
Don’t care
...
Starts read sequence
at address ADDR
Hi-Z
SDO
Complete
READ
sequence
ADDR + n
Roll-over
ADDR
ADDR + 1
...
ADDR + n
ADDR
ADDR + 1
Complete READ sequence
...
ADDR + n
Complete READ sequence
Continuous READ communication (24-bit format)
CS
ADDRESS SET
SCK
8x
SDI
CONTROL
BYTE
24x
24x
...
24x
24x
24x
...
24x
ADDR
ADDR + 1
Don’t care
Starts write sequence
at address ADDR
SDO
ADDR
ADDR + 1
...
ADDR + n
ADDR
ADDR + 1
Complete WRITE sequence
...
Complete WRITE sequence
ADDR + n
...
Complete
WRITE
sequence
ADDR + n
Roll-over
Hi-Z
Continuous WRITE communication (24-bit format)
FIGURE 6-6:
DS20005227A-page 44
Continuous Communication Sequences.
 2013 Microchip Technology Inc.
MCP3913
6.5.1
CONTINUOUS READ
READ<1:0> = 10, WIDTH_DATA<1:0> = 01) in case of
the SPI Mode 0,0 (Figure 6-7) and SPI Mode 1,1
(Figure 6-8).
The STATUSCOM register contains the read
communication loop settings for the internal register
address pointer (READ<1:0> bits). For Continuous
Read modes, the address selection can take the
following four values:
TABLE 6-1:
Note:
ADDRESS SELECTION IN
CONTINUOUS READ
Register Address Set Grouping
for Continuous Read
Communications
READ<1:0>
00
Static (no incrementation)
01
Groups
10
Types (default)
11
Full Register Map
Any SDI data coming after the control byte is not
considered during a continuous read communication.
The following figures represent a typical, continuous
read communication on all six ADC channels in TYPES
mode with the default settings (DR_LINK = 1,
For continuous reading of ADC data in
SPI Mode 0,0 (see Figure 6-7), once the
data has been completely read after a
data ready, the SDO pin will take the MSB
value of the previous data at the end of the
reading (falling edge of the last SCK
clock). If SCK stays idle at logic low (by
definition of Mode 0,0), the SDO pin will
be updated at the falling edge of the next
data ready pulse (synchronously with the
DR pin falling edge with an output timing
of tDODR) with the new MSB of the data
corresponding to the data ready pulse.
This mechanism allows the MCP3913 to
continuously read ADC data outputs
seamlessly, even in SPI Mode (0,0).
In SPI Mode (1,1), the SDO pin stays in the last state
(LSB of previous data) after a complete reading which
also allows seamless continuous Read mode (see
Figure 6-8).
CS
SCK
SDI
8x
Don’t care
24x
24x
...
24x
24x
24x
...
DATA_CH0
DATA_CH1
...
24x
Don’t care
0x01
Starts read sequence
at address00000
Hi-Z
SDO
DATA_CH0
DATA_CH1
...
DATA_CH
DATA_CH0<23>
Old data
DATA_CH0<23>
New data
DATA_CH
Complete READ sequence on new ADC outputs channels 0 to Complete READ sequence on ADC outputs channels 0 to DR
FIGURE 6-7:
Typical Continuous Read Communication (WIDTH_DATA<1:0> = 01, SPI Mode 0,0).
CS
SCK
SDI
8x
Don’t care
24x
24x
...
24x
24x
24x
...
24x
DATA_CH0
DATA_CH1
...
DATA_CH
Don’t care
0x01
Starts read sequence
at address 00000
SDO
Hi-Z
DATA_CH0
DATA_CH1
...
DATA_CH
Complete READ sequence on ADC outputs channels 0 to Stays at
DATA_CH<0>
Complete READ sequence on new ADC outputs, channels 0 to DR
FIGURE 6-8:
Typical Continuous Read Communication (WIDTH_DATA<1:0> = 01, SPI Mode 1,1).
 2013 Microchip Technology Inc.
DS20005227A-page 45
MCP3913
6.5.2
CONTINUOUS WRITE
The STATUSCOM register contains the write loop
settings for the internal register address pointer
(WRITE). For a continuous write, the address selection
can take the following two values:
TABLE 6-2:
WRITE
ADDRESS SELECTION IN
CONTINUOUS WRITE
Register Address Set Grouping for
Continuous Read Communications
0
Static (no incrementation)
1
Types (default)
SDO is always in a high-impedance state during a
continuous write communication. Writing to a
non-writable address (such as addresses 0x00 to
0x07) has no effect and does not increment the
address pointer. In this case, the user needs to stop the
communication and restart a communication with a
control byte pointing to a writable address (0x08 to
0x1F).
Note:
6.6
When LOCK<7:0> is different than 0xA5,
all the addresses, except 0x1F, become
non-writable
(see
Section 4.13
“MCP3913 Delta-Sigma Architecture”)
Situations that Reset and Restart
Active ADCs
Immediately after the following actions, the active
ADCs (the ones not in Soft Reset or Shutdown modes)
are reset and automatically restarted in order to provide
proper operation:
1.
2.
3.
4.
5.
6.
Change in PHASE0/1 registers.
Overwrite of the same PHASE0/1 register value.
Change in the OSR<2:0> settings.
Change in the PRE<1:0> settings.
Change in the CLKEXT setting.
Change in the VREFEXT setting.
After these temporary resets, the ADCs go back to
Normal operation, with no need for an additional
command. Each ADC data output register is cleared
during this process. The PHASE0/1 registers can be
used to serially soft reset the ADCs, without using the
RESET<5:0> bits in the Configuration register, if the
same value is written in one of the PHASE0/1 registers.
DS20005227A-page 46
6.7
Data Ready Pin (DR)
To communicate when channel data is ready for transmission, the data ready signal is available on the Data
Ready pin (DR) at the end of a channel conversion.
The data ready pin outputs an active-low pulse with a
pulse width equal to half a DMCLK clock period. After a
data ready pulse falling edge has occurred, the ADC
output data is updated within the tDODR timing and can
then be read through SPI communication.
The first data ready pulse after a Hard or a Soft Reset
is located after the settling time of the sinc filter (see
Table 5-3) plus the phase delay of the corresponding
channel (see Section 5.9 “Phase Delay Block”).
Each subsequent pulse is then periodic, and the period
is equal to a DRCLK clock period (see Equation 4-3
and Figure 1-3). The data ready pulse is always synchronous with the internal DRCLK clock.
The DR pin can be used as an interrupt pin when connected to an MCU or DSP, which will synchronize the
readings of the ADC data outputs. When not active-low,
this pin can either be in high-impedance (when
DR_HIZ = 0) or in a defined logic high state (when
DR_HIZ = 1). This is controlled through the STATUSCOM register. This allows multiple devices to share the
same data ready pin (with a pull-up resistor connected
between DR and DVDD). If only the MCP3913 device is
connected on the interrupt bus, the DR pin does not
require a pull-up resistor, and therefore it is recommended to use DR_HIZ = 1 configuration for such
applications.
The CS pin has no effect over the DR pin, which means
even if the CS pin is logic high, the data ready pulses
coming from the active ADC channels will still be
provided; the DR pin behavior is independent from the
SPI interface. While the RESET pin is logic low, the DR
pin is not active. The DR pin is latched in the logic low
state when the interrupt flag on the CRCREG is present
to signal that the desired registers configuration has
been corrupted (see Section 6.11 “Detecting
Configuration Change Through CRC-16 Checksum
On Register Map and its Associated Interrupt
Flag”).
 2013 Microchip Technology Inc.
MCP3913
6.8
ADC Channels Latching and
Synchronization
6.9
Securing Read Communications
Through CRC-16 Checksum
The ADC channel’s data output registers (addresses
0x00 to 0x05) have a double buffer output structure.
The two sets of latches in series are triggered by the
data ready signal and an internal signal indicating the
beginning of a read communication sequence (read
start).
Since power/energy metering systems can generate or
receive large EMI/EMC interferences and large
transient spikes, it is helpful to secure SPI
communications as much as possible to maintain data
integrity and desired configurations during the lifetime
of the application.
The first set of latches holds each ADC channel data
output register when the data is ready, and latches all
active outputs together when DR_LINK = 1. This
behavior is synchronous with the DMCLK clock.
The communication data on the SDO pin can be
secured through the insertion of a Cyclic Redundancy
Check (CRC) checksum at the end of each continuous
reading sequence. The CRC checksum on
communications can be enabled or disabled through
the EN_CRCCOM bit in the STATUSCOM register. The
CRC message ensures the integrity of the read
sequence bits transmitted on the SDO pin, and the
CRC checksum is inserted in between each read
sequence (see Figure 6-9).
The second set of latches ensures that when reading
starts on an ADC output, the corresponding data is
latched, so that no data corruption can occur within a
read. This behavior is synchronous with the SCK clock.
If an ADC read has started, in order to read the following ADC output, the current reading needs to be fully
completed (all bits must be read on the SDO pin from
the ADC output data registers).
Since the double output buffer structure is triggered
with two events that depend on two asynchronous
clocks (data ready with DMCLK and read start with
SCK), implement one of the three following methods on
the MCU or processor, in order to synchronize the
reading of the channels:
1.
2.
3.
Use the data ready pin pulses as an
interrupt: once a falling edge occurs on the DR
pin, the data is available for reading on the ADC
output registers after the tDODR timing. If this
timing is not respected, data corruption can
occur.
Use a timer clocked with MCLK as a
synchronization event: since the data ready is
synchronous with DMCLK, the user can
calculate the position of the data ready
depending on the PHASE0/1, the OSR<2:0>
and the PRE<1:0> settings for each channel.
Again, the tDODR timing needs to be added to
this calculation, to avoid data corruption.
Poll the DRSTATUS<5:0> bits in the
STATUSCOM register: this method consists of
continuously reading the STATUSCOM register
and waiting for the DRSTATUS bits to be equal
to '0'. When this event happens, the user can
start a new communication to read the desired
ADC data. In this case, no additional timing is
required.
The first method is the preferred one, as it can be used
without adding additional MCU code space, but
requires connecting the DR pin to an I/O pin of the
MCU. The last two methods require more MCU code
space and execution time, but they allow synchronized
reading of the channels without connecting the DR pin,
which saves one I/O pin on the MCU.
 2013 Microchip Technology Inc.
DS20005227A-page 47
MCP3913
CS
ADDRESS SET
SCK
16x/24x/32x
Depending on
data format
8x
16x/24x/32x
Depending on
data format
...
16x/24x/32x
Depending on
data format
16x/24x/32x
Depending on
data format
16x/24x/32x
Depending on
data format
16x/24x/32x
Depending on
data format
...
ADDR
ADDR + 1
SDI
CONTROL
BYTE
Don’t care
Don’t care
...
Starts read sequence
at address ADDR
ADDR + n
Roll-over
Hi-Z
SDO
Complete
READ
sequence
ADDR
ADDR + 1
...
ADDR + n
ADDR
Complete READ sequence
ADDR + 1
...
ADDR + n
Complete READ sequence
Continuous READ communication without CRC checksum (EN_CRCCOM=0)
CS
ADDRESS SET
SCK
16x/24x/32x
Depending on
data format
8x
16x/24x/32x
Depending on
data format
...
16x/24x/32x
Depending on
data format
16x or 32x
Depending on
CRC format
16x/24x/32x
Depending on
data format
16x/24x/32x
Depending on
data format
...
16x/24x/32x
Depending on
data format
16x or 32x
Depending on
CRC format
ADDR
ADDR + 1
SDI
CONTROL
BYTE
Don’t care
Don’t care
...
Starts read sequence
at address ADDR
SDO
Complete
READ
sequence
ADDR + n
Hi-Z
ADDR
ADDR + 1
...
ADDR + n
CRC Checksum
ADDR
ADDR + 1
...
ADDR + n
CRC Checksum
CRC Checksum
(not part of register map)
Roll-over
Complete READ sequence = Message for CRC Calculation
Checksum
New Message
New Checksum
Continuous READ communication with CRC checksum (EN_CRCCOM=1)
* n depends on the READ<1:0>
FIGURE 6-9:
Continuous Read Sequences With and Without CRC Checksum Enabled.
The CRC checksum in the MCP3913 device uses the
16-bit CRC-16 ANSI polynomial as defined in the IEEE
802.3 standard: x16 + x15 + x2 + 1. This polynomial can
also be noted as 0x8005. CRC-16 detects all single
and double-bit errors, all errors with an odd number of
bits, all burst errors of length 16 or less, and most errors
for longer bursts. This allows an excellent coverage of
the SPI communication errors that can happen in the
system, and heavily reduces the risk of a
miscommunication, even under noisy environments.
The CRC-16 format displayed on the SDO pin depends
on the WIDTH_CRC bit in the STATUSCOM register
(see Figure 6-10). It can be either 16-bit or 32-bit
format, to be compatible with both 16-bit and 32-bit
MCUs. The CRCCOM<15:0> bits calculated by the
MCP3913 device are not dependent on the format (the
device always calculates only a 16-bit CRC checksum).
If a 32-bit MCU is used in the application, it is
recommended
to
use
32-bit
formats
(WIDTH_CRC = 1) only.
WIDTH_CRC = 0
16-bit format
WIDTH_CRC = 1
32-bit format
15
The CRC calculation computed by the MCP3913
device is fully compatible with CRC hardware
contained in the Direct Memory Access (DMA) of the
PIC24 and PIC32 MCU product lines. The CRC
message that should be considered in the PIC® device
DMA is the concatenation of the read sequence and its
associated checksum. When the DMA CRC hardware
computes this extended message, the resulted
checksum should be 0x0000. Any other result indicates
that a miscommunication has happened and that the
current communication sequence should be stopped
and restarted.
Note:
The CRC will be generated only at the end
of the selected address set, before the
rollover of the address pointer occurs (see
Figure 6-9).
0
CRCCOM CRCCOM
<15:8>
<7:0>
31
FIGURE 6-10:
DS20005227A-page 48
0
CRCCOM CRCCOM
<15:8>
<7:0>
0x00
0x00
CRC Checksum Format.
 2013 Microchip Technology Inc.
MCP3913
6.10
Locking/Unlocking Register Map
Write Access
The MCP3913 digital interface includes an advanced
security feature that permits locking or unlocking the
register map write access. This feature prevents the
miscommunications that can corrupt the desired
configuration of the device, especially an SPI read
becoming an SPI write because of the noisy
environment.
The last register address of the register map
(0x1F: LOCK/CRC) contains the LOCK<7:0> bits. If
these bits are equal to the password value (which is
equal to the default value of 0xA5), the register map
write access is not locked. Any write can take place and
the communications are not protected.
When the LOCK<7:0> bits are different than 0xA5, the
register map write access is locked. The register map,
and therefore the full device configuration, is writeprotected. Any write to an address other than 0x1F will
yield no result. All the register addresses, except the
address 0x1F, become read-only. In this case, if the
user wants to change the configuration, the
LOCK<7:0> bits have to be reprogrammed back to
0xA5 before sending the desired write command.
The LOCK<7:0> bits are located in the last register, so
the user can program the whole register map, starting
from 0x09 to 0x1E within one continuous write
sequence, and then lock the configuration at the end of
the sequence by writing all zeros, in the address 0x1F
for example.
6.11
Detecting Configuration Change
Through CRC-16 Checksum On
Register Map and its Associated
Interrupt Flag
In order to prevent internal corruption of the register
and to provide additional security on the register map
configuration, the MCP3913 device includes an
automatic and continuous CRC checksum calculation
on the full register map configuration bits. This
calculation is not the same as the communication CRC
checksum described in Section 6.9 “Securing Read
Communications Through CRC-16 Checksum”.
This calculation takes the full register map as the CRC
message and outputs a checksum on the
CRCREG<15:0> bits located in the LOCK/CRC
register (address 0x1F).
 2013 Microchip Technology Inc.
Since this feature is intended for protecting the
configuration of the device, this calculation is run
continuously only when the register map is locked
(LOCK<7:0> different than 0xA5, see Section 6.10,
Locking/Unlocking Register Map Write Access). If
the register map is unlocked, the CRCREG<15:0> bits
are cleared and no CRC is calculated.
The calculation is fully completed in 21 DMCLK periods
and refreshed every 21 DMCLK periods continuously.
The CRCREG<15:0> bits are reset when a POR or a
hard reset occurs. All the bits contained in the registers
from addresses 0x09 — 0x1F are processed by the
CRC engine to give the CRCREG<15:0>. The
DRSTATUS<5:0> bits are set to '1' (default) and the
CRCREG<15:0> bits are set to '0' (default) for this
calculation engine, as they could vary during the
calculation.
An interrupt flag can be enabled through the EN_INT
bit in the STATUSCOM register and provided on the DR
pin when the configuration has changed without a write
command being processed. This interrupt is a logic low
state. This interrupt is cleared when the register map is
unlocked (since the CRC calculation is not processed).
At power-up, the interrupt is not present and the
register map is unlocked. As soon as the user finishes
writing its configuration, the user needs to lock the
register map (writing 0x00 for example in the LOCK
bits) to be able to use the interrupt flag. The
CRCREG<15:0> bits will be calculated for the first time
in 21 DMCLK periods. This first value will then be the
reference checksum value and will be latched
internally, until a hard reset, a POR, or an unlocking of
the register map happens. The CRCREG<15:0> will
then be calculated continuously and checked against
the reference checksum. If the CRCREG<15:0> is
different than the reference, the interrupt sends a flag
by setting the DR pin to a logic low state until it is
cleared.
DS20005227A-page 49
MCP3913
NOTES:
DS20005227A-page 50
 2013 Microchip Technology Inc.
MCP3913
7.0
BASIC APPLICATION
RECOMMENDATIONS
7.1
Typical Application Examples
Since all channels are identical in the MCP3913, any
channel can be chosen as the voltage channel (preferably CH0 or CH5 since they are on the edges and can
lead to a cleaner layout).
For power strip power metering applications, such as
the MCP3914 application referenced in Figure 7-1, it
can be used as a starting point for MCP3913
applications.The most common solution is to use one
channel for voltage measurement and the rest of the
channels for current measurement. Since all current
lines are at the same potential, shunts can be used as
current sensors, even if they do not provide any
galvanic isolation.
MCP3914
40LD UQFN
FIGURE 7-1:
MCP3914 Power Strip Application Example Schematic (may be used as starting point
for MCP3913 applications).
For polyphase metering applications, such as threephase meters, it is recommended to use a current
sensor that provides galvanic isolations: current
 2013 Microchip Technology Inc.
transformers, Rogowski coils, Hall sensors, etc.
DS20005227A-page 51
MCP3913
7.2
Power Supply Design and
Bypassing
The MCP3913 device was designed to measure positive and negative voltages that might be generated by
a current sensing device. This current sensing device,
with a common mode voltage close to 0V, is referred to
as AGND, which is a shunt or current transformer (CT)
with burden resistors attached to ground. The high performance and good flexibility that characterize this
ADC enables them to be used in other applications, as
long as the absolute voltage on each pin, referred to
AGND, stays in the -1V to +1V interval.
In any system, the analog ICs (such as references or
operational amplifiers) are always connected to the
analog ground plane. The MCP3913 should also be
considered as a sensitive analog component, and connected to the analog ground plane. The ADC features
two pairs of pins: AGND, AVDD, DGND and DVDD. For
best performance, it is recommended to keep the two
pairs connected to two different networks (Figure 7-2).
This way, the design will feature two ground traces and
two power supplies (Figure 7-3).
This means the analog circuitry (including MCP3913)
and the digital circuitry (MCU) should have separate
power supplies and return paths to the external ground
reference, as described in Figure 7-2. An example of a
typical power supply circuit, with different lines for analog and digital power, is shown in Figure 7-3. A possible
split example is shown in Figure 7-4, where the ground
star connection can be done at the bottom of the device
with the exposed pad. The split here between analog
and digital can be done under the device, and AVDD
and DVDD can be connected together with lines coming
under the ground plane.
Another possibility, sometimes easier to implement in
terms of PCB layout, is to consider the MCP3913 as an
analog component and, therefore, connect both AVDD
and DVDD together, and AGND and DGND together, with
a star connection. In this scheme, the decoupling
capacitors may be larger, due to the ripple on the digital
power supply (caused by the digital filters and the SPI
interface of the MCP3913) now causing glitches on the
analog power supply.
ID
IA
0.1 μF
0.1 μF
C
VA
AVDD DVDD
VD
MCP39XX
MCU
AGND
DGND
IA
ID
“Star” Point
D-=
A-=
FIGURE 7-2:
All Analog and Digital
Return Paths Need to Stay Separate with Proper
Bypass Capacitors.
FIGURE 7-3:
Power Supply with Separate Lines for Analog and Digital Sections. Note the "Net Tie"
Object NT2 that Represents the Start Ground Connection.
DS20005227A-page 52
 2013 Microchip Technology Inc.
MCP3913
7.3
SPI Interface Digital Crosstalk
The MCP3913 incorporates a high-speed 20 MHz SPI
digital interface. This interface can induce a crosstalk,
especially with the outer channels (CH0, for example),
if it is running at its full speed without any precautions.
The crosstalk is caused by the switching noise created
by the digital SPI signals (also called ground bouncing).
This crosstalk would negatively impact the SNR in this
case. The noise is attenuated if a proper separation
between the analog and digital power supplies is put in
place (see Section 7.2 “Power Supply Design and
Bypassing”).
FIGURE 7-4:
Separation of Analog and
Digital Circuits on Layout.
Figure 7-5 shows a more detailed example with a direct
connection to a high-voltage line (e.g., a two-wire 120V
or 220V system). A current-sensing shunt is used for
current measurement on the high side/line side that
also supplies the ground for the system. This is
necessary as the shunt is directly connected to the
channel input pins of the MCP3913. To reduce
sensitivity to external influences, such as EMI, these
two wires should form a twisted pair, as noted in
Figure 7-5. The power supply and MCU are separated
on the right side of the PCB, surrounded by the digital
ground plane. The MCP3913 is kept on the left side,
surrounded by the analog ground plane. There are two
separate power supplies going to the digital section of
the system and the analog section, including the
MCP3913. With this placement, there are two separate
current supply paths and current return paths, IA and ID.
Analog Ground Plane
IA
Digital Ground Plane
ID
MCU
MCP3913
ID
IA
VD VA
Power Supply
Circuitry
Twisted
Pair
LINE
In order to further remove the influence of the SPI
communication on measurement accuracy, it is
recommended to add series resistors on the SPI lines
to reduce the current spikes caused by the digital
switching noise (see Figure 7-5 where these resistors
have been implemented). The resistors also help to
keep the level of electromagnetic emissions low.
The measurement graphs provided in this MCP3913
data sheet have been performed with 100 series
resistors connected on each SPI I/O pin. Measurement
accuracy disturbances have not been observed even at
the full speed of 20 MHz interfacing.
The crosstalk performance is dependent on the
package choice due to the difference in the pin
arrangement (dual in-line or quad), and is improved in
the UQFN-40 package.
7.4
Sampling Speed and Bandwidth
If ADC power consumption is not a concern in the
design, the boost settings can be increased for best
performance so that the OSR is always kept at the
maximum settings to improve the SINAD performance
(see Table 7-1). If the MCU cannot generate a clock
fast enough, it is possible to tap the OSC1/OSC2 pins
of the MCP3913 crystal oscillator directly to the crystal
of the microcontroller. When the sampling frequency is
enlarged, the phase resolution is improved, and with
the OSR increased, the phase compensation range
can be kept in the same range as the default settings.
TABLE 7-1:
“Star” Point
SAMPLING SPEED VS.
MCLK AND OSR,
ADC PRESCALE 1:1
SHUNT
MCLK
(MHz)
NEUTRAL
FIGURE 7-5:
Connection Diagram.
The ferrite bead between the digital and analog ground
planes helps keep high-frequency noise from entering
the device. This ferrite bead is recommended to be low
resistance; most often it is a THT component. Ferrite
beads are typically placed on the shunt inputs and into
the power supply circuit for additional protection.
 2013 Microchip Technology Inc.
Boost<1:0>
OSR
Sampling
Speed
(ksps)
16
11
1024
3.91
14
11
1024
3.42
12
11
1024
2.93
10
10
1024
2.44
8
10
512
3.91
6
01
512
2.93
4
01
256
3.91
DS20005227A-page 53
MCP3913
7.5
Differential Inputs
Anti-Aliasing Filter
Due to the nature of the ADCs used in the MCP3913
(oversampling converters), each differential input of the
ADC channels requires an anti-aliasing filter so that the
oversampling frequency (DMCLK) is largely attenuated
and does not generate any disturbances on the ADC
accuracy. This anti-aliasing filter also needs to have a
gain close to one in the signal bandwidth of interest.
Typically for 50/60 Hz measurement and default settings (DMCLK = 1 MHz), a simple RC filter with 1 k
and 100 nF can be used. The anti-aliasing filter used
for the measurement graphs is a first-order RC filter
with 1 k and 15 nF. The typical schematic for connecting a current transformer to the ADC is shown in
Figure 7-6. If wires are involved, twisting them is also
recommended.
The MCP3913 is highly recommended in applications
using di/dt as current sensors because of the extremely
low noise floor at low frequencies. In such applications,
a low-pass filter (LPF) with a cut-off frequency much
lower than the signal frequency (50-60 Hz for metering)
is used to compensate for the 90 degree shift and for
the 20 db/decade attenuation induced by the di/dt sensor. Because of this filter, the SNR will be decreased,
since the signal will attenuate by a few orders of magnitude, while the low-frequency noise will not be attenuated. Usually, a high-order high-pass filter (HPF) is
used to attenuate the low-frequency noise in order to
prevent a dramatic degradation of the SNR, which can
be very important in other parts. A high-order filter will
also consume a significant portion of the computation
power of the MCU. When using the MCP3913, such a
high-order HPF is not required, since this part has a low
noise floor at low frequencies. A first-order HPF is
enough to achieve very good accuracy.
7.6
Energy Measurement
Error Considerations
The measurement error is a typical representation of
the non-linearity of a pair of ADCs (see Section 4.0
“Terminology And Formulas” for the definition of
measurement error). The measurement error is
dependent on the THD and on the noise floor of the
ADCs.
FIGURE 7-6:
First-Order Anti-Aliasing
Filter for CT-Based Designs.
The di/dt current sensors, such as Rogowski coils, can
be an alternative to current transformers. Since these
sensing elements are highly sensitive to highfrequency electromagnetic fields, using a second order
anti-aliasing filter is recommended to increase the
attenuation of potential perturbing RF signals.
FIGURE 7-7:
Second-Order Anti-Aliasing
Filter for Rogowski Coil-Based Designs.
DS20005227A-page 54
Improving the measurement error specification on the
MCP3913 can be realized by increasing the OSR (to
get a better SINAD and THD performance) and, to
some extent, the BOOST settings (if the bandwidth of
the measurements is too limited by the bandwidth of
the amplifiers in the sigma-delta ADCs). In most of the
energy metering AC applications, high-pass filters are
used to cancel the offset on each ADC channel (current
and voltage channels), and therefore a single-point
calibration is necessary to calibrate the system for
active energy measurement. This calibration is a
system gain calibration, and the user can utilize the
EN_GAINCAL bit and the GAINCAL_CHn registers to
perform this digital calibration. After such calibration,
typical measurement error curves like Figure 2-7 can
be generated by sweeping the current channel
amplitude and measuring the energy at the outputs (the
energy calculations here are being realized off-chip).
The error is measured using a gain of 1x, as it is
commonly used in most CT-based applications.
 2013 Microchip Technology Inc.
MCP3913
At low signal amplitude values (typically 1000:1
dynamic range and higher), the crosstalk between
channels, mainly caused by the PCB, becomes a
significant part of the perturbation as the measurement
error increases. The 1-point measurement error curves
in Figure 2-5 have been performed with a full-scale
sine wave on all the inputs that are not measured,
which means that these channels induce a maximum
amount of crosstalk on the measurement error curve.
In order to avoid such behavior, a 2-point calibration
can be put in place in the calculation section.
This 2-point calibration can be a simple linear
interpolation between two calibration points (one at
high amplitudes, one at low amplitudes at each end of
the dynamic range) and helps to significantly lower the
effect of crosstalk between channels. A 2-point
calibration is very effective in maintaining the
measurement error close to zero on the whole dynamic
range, since the non-linearity and distortion of the
MCP3913 is very low. Figure 2-6 shows the
measurement error curves obtained with the same
ADC data taken for Figure 2-5, but where a 2-point
calibration has been applied. The difference is
significant only at the low end of the dynamic range,
where all the perturbing factors are a bigger part of the
ADC output signals. These curves show extremely tight
measurement error across the full dynamic range
(here, typically 10,000:1), which is required in
high-accuracy class meters.
 2013 Microchip Technology Inc.
DS20005227A-page 55
MCP3913
NOTES:
DS20005227A-page 56
 2013 Microchip Technology Inc.
MCP3913
8.0
MCP3913 INTERNAL
REGISTERS
The addresses associated with the internal registers
are listed in Table 8-1. This section also describes the
registers in detail. All registers are 24-bit long registers,
which can be addressed and read separately.
TABLE 8-1:
The format of the data registers (0x00 to 0x05) can be
changed with WIDTH_DATA<1:0> bits in the
STATUSCOM register. The READ<1:0> and WRITE
bits define the groups and types of registers for
continuous read/write communication or looping on
address sets, as shown in Table 8-2.
MCP3913 REGISTER MAP
Address
Name
Bits
R/W
0x00
CHANNEL0
24
R
Channel 0 ADC Data <23:0>, MSB first
0x01
CHANNEL1
24
R
Channel 1 ADC Data <23:0>, MSB first
0x02
CHANNEL2
24
R
Channel 2 ADC Data <23:0>, MSB first
0x03
CHANNEL3
24
R
Channel 3 ADC Data <23:0>, MSB first
0x04
CHANNEL4
24
R
Channel 4 ADC Data <23:0>, MSB first
0x05
CHANNEL5
24
R
Channel 5 ADC Data <23:0>, MSB first
0x06
Unused
24
U
Unused
0x07
Unused
24
U
Unused
0x08
MOD
24
R/W
Delta-Sigma Modulators Output Value
0x09
PHASE0
24
R/W
Phase Delay Configuration Register - Channel pairs 4/5
0x0A
PHASE1
24
R/W
Phase Delay Configuration Register - Channel pairs 0/1 and 2/3
0x0B
GAIN
24
R/W
Gain Configuration Register
0x0C
STATUSCOM
24
R/W
Status and Communication Register
0x0D
CONFIG0
24
R/W
Configuration Register
0x0E
CONFIG1
24
R/W
Configuration Register
0x0F
OFFCAL_CH0
24
R/W
Offset Correction Register - Channel 0
0x10
GAINCAL_CH0
24
R/W
Gain Correction Register - Channel 0
0x11
OFFCAL_CH1
24
R/W
Offset Correction Register - Channel 1
0x12
GAINCAL_CH1
24
R/W
Gain Correction Register - Channel 1
0x13
OFFCAL_CH2
24
R/W
Offset Correction Register - Channel 2
0x14
GAINCAL_CH2
24
R/W
Gain Correction Register - Channel 2
0x15
OFFCAL_CH3
24
R/W
Offset Correction Register - Channel 3
0x16
GAINCAL_CH3
24
R/W
Gain Correction Register - Channel 3
0x17
OFFCAL_CH4
24
R/W
Offset Correction Register - Channel 4
0x18
GAINCAL_CH4
24
R/W
Gain Correction Register - Channel 4
0x19
OFFCAL_CH5
24
R/W
Offset Correction Register - Channel 5
0x1A
GAINCAL_CH5
24
R/W
0x1B
Unused
24
U
Unused
0x1C
Unused
24
U
Unused
0x1D
Unused
24
U
Unused
0x1E
Unused
24
U
0x1F
LOCK/CRC
24
R/W
 2013 Microchip Technology Inc.
Description
Gain Correction Register - Channel 5
Unused
Security Register (Password and CRC-16 on Register Map)
DS20005227A-page 57
MCP3913
TABLE 8-2:
REGISTER MAP GROUPING FOR ALL CONTINUOUS READ/WRITE MODES
READ<1:0>
0x02
CHANNEL 3
0x03
CHANNEL 4
0x04
CHANNEL 5
0x05
MOD
0x08
PHASE0
0x09
PHASE1
0x0A
GAIN
0x0B
STATUSCOM
0x0C
CONFIG0
0x0D
CONFIG1
0x0E
OFFCAL_CH0
0x0F
GAINCAL_CH0
0x10
OFFCAL_CH1
0x11
GAINCAL_CH1
0x12
OFFCAL_CH2
0x13
GAINCAL_CH2
0x14
OFFCAL_CH3
0x15
GAINCAL_CH3
0x16
OFFCAL_CH4
0x17
GAINCAL_CH4
0x18
OFFCAL_CH5
0x19
GAINCAL_CH5
0x1A
LOCK/CRC
0x1F
= “00”
= “1”
= “0”
GROUP
Static
Not Writable
(Address undefined
for Write access)
CHANNEL 2
= “01”
Not Writable
(Address undefined
for Write access)
0x01
Static
TYPE
0x00
GROUP
Static
Static
GROUP
Static
Static
GROUP
LOOP ENTIRE REGISTER MAP
CHANNEL 0
CHANNEL 1
= “10”
GROUP
Static
Static
Static
Static
Static
Static
Static
Static
Static
Static
Static
GROUP
Static
Static
GROUP
Static
Static
GROUP
Static
Static
GROUP
Static
Static
GROUP
Static
LOOP ONLY ON WRITABLE REGISTERS
= “11”
DS20005227A-page 58
WRITE
Address
TYPE
Function
Static
Static
Static
Static
Static
Static
Static
Static
Static
Static
Static
Static
Static
Static
GROUP
Static
Static
Static
Static
GROUP
Static
Static
 2013 Microchip Technology Inc.
MCP3913
8.1
The ADC Channel Data Output registers always
contain the most recent A/D conversion data for each
channel. These registers are read-only. They can be
accessed independently or linked together (with
READ<1:0> bits). These registers are latched when an
ADC read communication occurs. When a data ready
event occurs during a read communication, the most
current ADC data is also latched to avoid data
corruption issues. These registers are updated and
latched together if DR_LINK = 1 synchronously with
the data ready pulse (toggling on the most lagging
ADC channel data ready event).
CHANNEL Registers ADC Channel Data
Output Registers
Name
Bits
Address
Cof.
CHANNEL0
24
0x00
R
CHANNEL1
24
0x01
R
CHANNEL2
24
0x02
R
CHANNEL3
24
0x03
R
CHANNEL4
24
0x04
R
CHANNEL5
24
0x05
R
REGISTER 8-1:
MCP3913 CHANNEL REGISTERS
R-0
R-0
R-0
R-0
R-0
R-0
R-0
R-0
DATA_CHn
<23> (MSB)
DATA_CHn
<22>
DATA_CHn
<21>
DATA_CHn
<20>
DATA_CHn
<19>
DATA_CHn
<18>
DATA_CHn
<17>
DATA_CHn
<16>
bit 23
bit 16
R-0
R-0
R-0
R-0
R-0
R-0
R-0
R-0
DATA_CHn
<15>
DATA_CHn
<14>
DATA_CHn
<13>
DATA_CHn
<12>
DATA_CHn
<11>
DATA_CHn
<10>
DATA_CHn
<9>
DATA_CHn
<8>
bit 15
bit 8
R-0
R-0
R-0
R-0
R-0
R-0
R-0
R-0
DATA_CHn
<7>
DATA_CHn
<6>
DATA_CHn
<5>
DATA_CHn
<4>
DATA_CHn
<3>
DATA_CHn
<2>
DATA_CHn
<1>
DATA_CHn
<0>
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
bit 23-0
x = Bit is unknown
DATA_CHn: Output code from ADC Channel n. This data is post-calibration if the EN_OFFCAL or
EN_GAINCAL bits are enabled. This data can be formatted in 16-/24-/32-bit modes, depending on the
WIDTH_DATA<1:0> settings. (see Section 5.5 “ADC Output Coding”)
 2013 Microchip Technology Inc.
DS20005227A-page 59
MCP3913
8.2
on all ADCs. Each bit in this register corresponds to
one comparator output on one of the channels. Do not
write to this register to ensure the accuracy of each
ADC.
MOD Register – Modulators
Output Register
Name
Bits
Address
Cof.
MOD
24
0x08
R/W
The MOD register contains the most recent modulator
data output and is updated at a DMCLK rate. The
default value corresponds to an equivalent input of 0V
.
REGISTER 8-2:
MOD REGISTER
R/W-0
R/W-0
R/W-1
R/W-1
R/W-0
R/W-0
R/W-1
R/W-1
COMP3_CH5
COMP2_CH5
COMP1_CH5
COMP0_CH5
COMP3_CH4
COMP2_CH4
COMP1_CH4
COMP0_CH4
bit 23
bit 16
R/W-0
R/W-0
R/W-1
R/W-1
R/W-0
R/W-0
R/W-1
R/W-1
COMP3_CH3
COMP2_CH3
COMP1_CH3
COMP0_CH3
COMP3_CH2
COMP2_CH2
COMP1_CH2
COMP0_CH2
bit 15
bit 8
R/W-0
R/W-0
R/W-1
R/W-1
R/W-0
R/W-0
R/W-1
R/W-1
COMP3_CH1
COMP2_CH1
COMP1_CH1
COMP0_CH1
COMP3_CH0
COMP2_CH0
COMP1_CH0
COMP0_CH0
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
bit 23-20
COMPn_CH5: Comparator Outputs from ADC Channel 5
bit 19-16
COMPn_CH4: Comparator Outputs from ADC Channel 4
bit 15-12
COMPn_CH3: Comparator Outputs from ADC Channel 3
bit 11-8
COMPn_CH2: Comparator Outputs from ADC Channel 2
bit 7-4
COMPn_CH1: Comparator Outputs from ADC Channel 1
bit 3-0
COMPn_CH0: Comparator Outputs from ADC Channel 0
DS20005227A-page 60
x = Bit is unknown
 2013 Microchip Technology Inc.
MCP3913
8.3
PHASE0 Register – Phase
Configuration Register for
Channel Pair 4/5
Name
Bits
Address
Cof.
PHASE0
24
0x09
R/W
Any write to this register automatically resets and
restarts all active ADCs.
REGISTER 8-3:
PHASE0 REGISTER
U-0
U-0
U-0
U-0
U-0
U-0
U-0
U-0
—
—
—
—
—
—
—
—
bit 23
bit 16
U-0
U-0
U-0
U-0
R/W-0
R/W-0
R/W-0
R/W-0
—
—
—
—
PHASEC<11>
PHASEC<10>
PHASEC<9>
PHASEC<8>
bit 15
bit 8
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
PHASEC<7>
PHASEC<6>
PHASEC<5>
PHASEC<4>
PHASEC<3>
PHASEC<2>
PHASEC<1>
PHASEC<0>
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
x = Bit is unknown
bit 23-12
Unimplemented: Read as 0
bit 11-0
PHASEC<11:0> Phase delay between channels CH4 and CH5 (reference). Delay = PHASEC<11:0>
decimal code/DMCLK
 2013 Microchip Technology Inc.
DS20005227A-page 61
MCP3913
8.4
PHASE1 Register – Phase
Configuration Register for
Channel Pairs 2/3 and 0/1
Name
Bits
Address
Cof.
PHASE1
24
0x0A
R/W
Any write to this register automatically resets and
restarts all active ADCs.
REGISTER 8-4:
PHASE REGISTER
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
PHASEB<11>
PHASEB<10>
PHASEB<9>
PHASEB<8>
PHASEB<7>
PHASEB<6>
PHASEB<5>
PHASEB<4>
bit 23
bit 16
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
PHASEB<3>
PHASEB<2>
PHASEB<1>
PHASEB<0>
PHASEA<11>
PHASEA<10>
PHASEA<9>
PHASEA<8>
bit 15
bit 8
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
PHASEA<7>
PHASEA<6>
PHASEA<5>
PHASEA<4>
PHASEA<3>
PHASEA<2>
PHASEA<1>
PHASEA<0>
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
x = Bit is unknown
bit 23-12
PHASEB<11:0> Phase delay between channels CH2 and CH3 (reference). Delay = PHASEB<11:0>
decimal code/DMCLK
bit 11-0
PHASEA<11:0> Phase delay between channels CH0 and CH1(reference). Delay = PHASEA<11:0>
decimal code/DMCLK
DS20005227A-page 62
 2013 Microchip Technology Inc.
MCP3913
8.5
GAIN Register – PGA Gain
Configuration Register
Name
Bits
Address
Cof.
GAIN
24
0x0B
R/W
REGISTER 8-5:
GAIN REGISTER
U-0
U-0
U-0
U-0
U-0
U-0
—
—
—
—
—
—
R/W-0
R/W-0
PGA_CH5<2> PGA_CH5<1>
bit 23
bit 16
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
PGA_CH5<0> PGA_CH4<2> PGA_CH4<1> PGA_CH4<0> PGA_CH3<2>
R/W-0
PGA_CH3<1>
R/W-0
R/W-0
PGA_CH3<0> PGA_CH2<2>
bit 15
bit 8
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
PGA_CH2<1> PGA_CH2<0> PGA_CH1<2> PGA_CH1<1> PGA_CH1<0>
R/W-0
PGA_CH0<2>
R/W-0
R/W-0
PGA_CH0<1> PGA_CH0<0>
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
bit 23-18
Unimplemented: Read as 0
bit 17-0
PGA_CHn<2:0>: PGA Setting for Channel n
111 = Reserved (Gain = 1)
110 = Reserved (Gain = 1)
101 = Gain is 32
100 = Gain is 16
011 = Gain is 8
010 = Gain is 4
001 = Gain is 2
000 = Gain is 1 (DEFAULT)
 2013 Microchip Technology Inc.
x = Bit is unknown
DS20005227A-page 63
MCP3913
8.6
STATUSCOM Register – Status
and Communication Register
Name
Bits
Address
Cof.
STATUSCOM
24
0x0C
R/W
REGISTER 8-6:
STATUSCOM REGISTER
R/W-1
R/W-0
R/W-1
R/W-0
R/W-1
R/W-0
READ<1>
READ<0>
WRITE
DR_HIZ
DR_LINK
WIDTH_ CRC
R/W-0
R/W-1
WIDTH_ DATA<1> WIDTH_ DATA<0>
bit 23
bit 16
R/W-0
R/W-0
R/W-0
R/W-0
U-0
U-0
U-0
U-0
EN_CRCCOM
EN_INT
Reserved
Reserved
—
—
—
—
bit 15
bit 8
U-0
U-0
R-1
R-1
R-1
R-1
R-1
R-1
—
—
DRSTATUS<5>
DRSTATUS<4>
DRSTATUS<3>
DRSTATUS<2>
DRSTATUS<1>
DRSTATUS<0>
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
x = Bit is unknown
bit 23-22
READ<1:0>: Address counter increment setting for Read Communication
11 = Address counter auto-increments, loops on the entire register map
10 = Address counter auto-increments, loops on register TYPES (DEFAULT)
01 = Address counter auto-increments, loops on register GROUPS
00 = Address not incremented, continually reads the same single-register address
bit 21
WRITE: Address counter increment setting for Write Communication
1 = Address counter auto-increments and loops on writable part of the register map (DEFAULT)
0 = Address not incremented, continually writes to the same single register address
bit 20
DR_HIZ: Data Ready Pin Inactive State Control
1 = The DR pin state is a logic high when data is NOT ready
0 = The DR pin state is high-impedance when data is NOT ready (DEFAULT)
bit 19
DR_LINK Data Ready Link Control
1 = Data Ready link enabled. Only one pulse is generated on the DR pin for all ADC channels,
corresponding to the data ready pulse of the most lagging ADC.
0 = Data Ready link disabled. Each ADC produces its own data ready pulse on the DR pin.
bit 18
WIDTH_CRC Format for CRC-16 on communications
1 = 32-bit (CRC-16 code is followed by sixteen zeros). This coding is compatible with CRC
implementation in most 32-bit MCUs (including PIC32 MCUs).
0 = 16 bit (default)
bit 17-16
WIDTH_DATA<1:0>: ADC Data Format Settings for all ADCs (see Section 5.5 “ADC Output Coding”)
11 = 32-bit with sign extension
10 = 32-bit with zeros padding
01 = 24-bit (default)
00 = 16-bit (with rounding)
bit 15
EN_CRCCOM: Enable CRC CRC-16 Checksum on Serial communications
1 = CRC-16 Checksum is provided at the end of each communication sequence (therefore each
communication is longer). The CRC-16 Message is the complete communication sequence (see
section Section 6.9 “Securing Read Communications Through CRC-16 Checksum” for more
details).
0 = Disabled (Default)
DS20005227A-page 64
 2013 Microchip Technology Inc.
MCP3913
REGISTER 8-6:
STATUSCOM REGISTER (CONTINUED)
bit 14
EN_INT: Enable for the CRCREG interrupt function
1 = The interrupt flag for the CRCREG checksum verification is enabled. The data ready pin (DR) will
become logic low and stays logic low if a CRCREG checksum error happens. This interrupt is
cleared if the LOCK<7:0> value is made equal to the PASSWORD value (0xA5).
0 = The interrupt flag for the CRCREG checksum verification is disabled. The CRCREG<15:0> bits are
still calculated properly and can still be read in this mode. No interrupt is generated even when a
CRCREG checksum error happens. (Default)
bit 13-12
Reserved: Should be kept equal to 0 at all times
bit 11-6
Unimplemented: Read as 0
bit 5-0
DRSTATUS<5:0>: Data ready status bit for each individual ADC channel
DRSTATUS<n> = 1 - Channel CHn data is not ready (DEFAULT)
DRSTATUS<n> = 0 - Channel CHn data is ready. The status bit is set back to '1' after reading the
STATUSCOM register. The status bit is not set back to '1' by the read of the corresponding channel
ADC data.
 2013 Microchip Technology Inc.
DS20005227A-page 65
MCP3913
8.7
CONFIG0 Register –
Configuration Register 0
Name
Bits
Address
Cof.
CONFIG0
24
0x0D
R/W
REGISTER 8-7:
CONFIG0 REGISTER
R/W-0
R/W-0
R/W-1
R/W-1
R/W-1
R/W-0
R/W-0
R/W-0
EN_OFFCAL
EN_GAINCAL
DITHER<1>
DITHER<0>
BOOST<1>
BOOST<0>
PRE<1>
PRE<0>
bit 23
bit 16
R/W-0
R/W-1
R/W-1
U-0
U-0
U-0
U-0
U-0
OSR<2>
OSR<1>
OSR<0>
—
—
—
—
—
bit 15
bit 8
R/W-0
R/W-1
R/W-0
R/W-1
R/W-0
R/W-0
R/W-0
R/W-0
VREFCAL<7>
VREFCAL<6>
VREFCAL<5>
VREFCAL<4>
VREFCAL<3>
VREFCAL<2>
VREFCAL<1>
VREFCAL<0>
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
x = Bit is unknown
bit 23
EN_OFFCAL: Enables the 24-bit digital offset error calibration on all channels
1 = Enabled. This mode does not add any group delay to the ADC data.
0 = Disabled (DEFAULT)
bit 22
EN_GAINCAL: Enables or disables the 24-bit digital gain error calibration on all channels
1 = Enabled. This mode adds a group delay on all channels of 24 DMCLK periods. All data ready
pulses are delayed by 24 DMCLK clock periods, compared to the mode with EN_GAINCAL = 0.
0 = Disabled (DEFAULT)
bit 21-20
DITHER<1:0>: Control for dithering circuit for idle tone’s cancellation and improved THD on all channels
11 = Dithering ON, Strength = Maximum (DEFAULT)
10 = Dithering ON, Strength = Medium
01 = Dithering ON, Strength = Minimum
00 = Dithering turned OFF
bit 19-18
BOOST<1:0>: Bias Current Selection for all ADCs (impacts achievable maximum sampling speed, see
Table 5-2)
11 = All channels have current x 2
10 = All channels have current x 1 (Default)
01 = All channels have current x 0.66
00 = All channels have current x 0.5
bit 17-16
PRE<1:0> Analog Master Clock (AMCLK) Prescaler Value
11 = AMCLK = MCLK/8
10 = AMCLK = MCLK/4
01 = AMCLK = MCLK/2
00 = AMCLK = MCLK (Default)
DS20005227A-page 66
 2013 Microchip Technology Inc.
MCP3913
REGISTER 8-7:
CONFIG0 REGISTER (CONTINUED)
bit 15-13
OSR<2:0> Oversampling Ratio for delta sigma A/D Conversion (ALL CHANNELS, fd / fS)
111 = 4096 (fd = 244 sps for MCLK = 4 MHz, fs = AMCLK = 1 MHz)
110 = 2048 (fd = 488 sps for MCLK = 4 MHz, fs = AMCLK = 1 MHz)
101 = 1024 (fd = 976 sps for MCLK = 4 MHz, fs = AMCLK = 1 MHz)
100 = 512 (fd = 1.953 ksps for MCLK = 4 MHz, fs = AMCLK = 1 MHz)
011 = 256 (fd = 3.90625 ksps for MCLK = 4 MHz, fs = AMCLK = 1 MHz) (Default)
010 = 128 (fd = 7.8125 ksps for MCLK = 4 MHz, fs = AMCLK = 1 MHz)
001 = 64 (fd = 15.625 ksps for MCLK = 4 MHz, fs = AMCLK = 1 MHz)
000 = 32 (fd = 31.25 ksps for MCLK = 4 MHz, fs = AMCLK = 1 MHz)
bit 12-8
Unimplemented: Read as 0
bit 7-0
VREFCAL<7:0>: Internal Voltage Temperature coefficient VREFCAL<7:0> value. (See Section 5.6.3
“Temperature compensation (VREFCAL<7:0>)” for complete description).
 2013 Microchip Technology Inc.
DS20005227A-page 67
MCP3913
8.8
CONFIG1 Register –
Configuration Register 1
Name
Bits
Address
Cof.
CONFIG1
24
0x0F
R/W
REGISTER 8-8:
CONFIG1 REGISTER
U-0
U-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
—
—
RESET<5>
RESET<4>
RESET<3>
RESET<2>
RESET<1>
RESET<0>
bit 23
bit 16
U-0
U-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
R/W-0
—
—
SHUTDOWN<5>
SHUTDOWN<4>
SHUTDOWN<3>
SHUTDOWN<2>
SHUTDOWN<1>
SHUTDOWN<0>
bit 15
bit 8
R/W-0
R/W-1
U-0
U-0
U-0
U-0
U-0
U-0
VREFEXT
CLKEXT
—
—
—
—
—
—
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
x = Bit is unknown
bit 23-22
Unimplemented: Read as 0
bit 21-16
RESET<5:0>: Soft Reset mode setting for each individual ADC
RESET<n> = 1: Channel CHn in soft reset mode
RESET<n> = 0: Channel CHn not in soft reset mode
bit 15-14
Unimplemented: Read as 0
bit 13-8
SHUTDOWN<5:0>: Shutdown Mode setting for each individual ADC
SHUTDOWN<n> = 1: ADC Channel CHn in Shutdown
SHUTDOWN<n> = 0: ADC Channel CHn not in Shutdown
bit 7
VREFEXT: Internal Voltage Reference selection bit
1 = Internal Voltage Reference Disabled. An external reference voltage needs to be applied across the
REFIN+/- pins. The analog power consumption (AIDD) is slightly diminished in this mode since the
internal voltage reference is placed into Shutdown mode.
0 = Internal Reference enabled. For optimal accuracy, the REFIN+/OUT pin needs proper decoupling
capacitors. REFIN- pin should be connected to AGND, when in this mode.
bit 6
CLKEXT: Internal Clock selection bit
1 = MCLK is generated externally and should be provided on the OSC1 pin: the crystal oscillator is disabled
and consumes no current (Default)
0 = Crystal oscillator enabled. A crystal must be placed between OSC1 and OSC2 with proper decoupling
capacitors. The digital power consumption (DIDD) is increased in this mode due to the oscillator.
bit 5-0
Unimplemented: Read as 0
DS20005227A-page 68
 2013 Microchip Technology Inc.
MCP3913
8.9
OFFCAL_CHn and GAINCAL_CHn
Registers – Digital Offset and Gain
Error Calibration Registers
Name
Bits
Address
Cof.
OFFCAL_CH0
24
0x0F
R/W
GAINCAL_CH0
24
0x10
R/W
OFFCAL_CH1
24
0x11
R/W
GAINCAL_CH1
24
0x12
R/W
OFFCAL_CH2
24
0x13
R/W
GAINCAL_CH2
24
0x14
R/W
OFFCAL_CH3
24
0x15
R/W
GAINCAL_CH3
24
0x16
R/W
OFFCAL_CH4
24
0x17
R/W
GAINCAL_CH4
24
0x18
R/W
OFFCAL_CH5
24
0x19
R/W
GAINCAL_CH5
24
0x1A
R/W
REGISTER 8-9:
OFFCAL_CHN REGISTERS
R/W-0
OFFCAL_CHn<23>
R/W-0
R/W-0
OFFOFFCAL_CHn<22> CAL_CHn<21>
...
R/W-0
R/W-0
R/W-0
R/W-0
...
OFFCAL_CHn<3>
OFFCAL_CHn<2>
OFFCAL_CHn<1>
OFFCAL_CHn<0>
bit 23
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
bit 23-0
x = Bit is unknown
OFFCAL_CHn: Digital Offset calibration value for the corresponding channel CHn. This register is
simply added to the output code of the channel bit-by-bit. This register is 24-bit two's complement
MSB first coding. CHn Output Code = OFFCAL_CHn + ADC CHn Output Code. This register is a
Don't Care if EN_OFFCAL = 0 (Offset calibration disabled), but its value is not cleared by the
EN_OFFCAL bit.
 2013 Microchip Technology Inc.
DS20005227A-page 69
MCP3913
REGISTER 8-10:
GAINCAL_CHN REGISTERS
R/W-0
R/W-0
R/W-0
...
R/W-0
R/W-0
R/W-0
R/W-0
GAINCAL_CHn<23>
GAINCAL_CHn<22>
GAINCAL_CHn<21>
...
GAINCAL_CHn<3>
GAINCAL_CHn<2>
GAINCAL_CHn<1>
GAINCAL_CHn<0>
bit 23
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
bit 23-0
8.10
x = Bit is unknown
GAINCAL_CHn: Digital gain error calibration value for the corresponding channel CHn. This register
is 24-bit signed MSB first coding with a range of -1x to +0.9999999x (from 0x800000 to 0x7FFFFF).
The gain calibration adds 1x to this register and multiplies it to the output code of the channel bit-by-bit,
after offset calibration. The range of the gain calibration is thus from 0x to 1.9999999x (from 0x800000
to 0x7FFFFF). The LSB corresponds to a 2-23 increment in the multiplier. CHn Output
Code = (GAINCAL_CHn+1)*ADC CHn Output Code. This register is a Don't Care if EN_GAINCAL = 0
(Gain calibration disabled) but its value is not cleared by the EN_GAINCAL bit.
SECURITY Register – Password
And CRC-16 On Register Map
Name
Bits
Address
Cof.
LOCK/CRC
24
0x1F
R/W
REGISTER 8-11:
LOCK/CRC REGISTER
R/W-1
R/W-0
R/W-1
R/W-0
R/W-0
R/W-1
R/W-0
R/W-1
LOCK<7>
LOCK<6>
LOCK<5>
LOCK<4>
LOCK<3>
LOCK<2>
LOCK<1>
LOCK<0>
bit 23
bit 16
R-0
R-0
R-0
R-0
R-0
R-0
R-0
R-0
CRCREG<15>
CRCREG<14>
CRCREG<13>
CRCREG<12>
CRCREG<11>
CRCREG<10>
CRCREG<9>
CRCREG<8>
bit 15
bit 8
R-0
R-0
R-0
R-0
R-0
R-0
R-0
R-0
CRCREG<7>
CRCREG<6>
CRCREG<5>
CRCREG<4>
CRCREG<3>
CRCREG<2>
CRCREG<1>
CRCREG<0>
bit 7
bit 0
Legend:
R = Readable bit
W = Writable bit
U = Unimplemented bit, read as ‘0’
-n = Value at POR
‘1’ = Bit is set
‘0’ = Bit is cleared
x = Bit is unknown
bit 23-16
LOCK<7:0>: Lock Code for the writable part of the register map
LOCK<7:0> = PASSWORD =0xA5 (Default value): The entire register map is writable. The CRCREG<15:0> bits
and the CRC Interrupt are cleared. No CRC-16 checksum on register map is calculated.
LOCK<7:0> different than 0xA5: The only writable register is the LOCK/CRC register. All other registers will appear
as undefined while in this mode. The CRCREG checksum is calculated continuously and can generate interrupts if the CRC Interrupt EN_INT bit has been enabled. If a write to a register needs to be performed, the user
needs to unlock the register map beforehand by writing 0xA5 to the LOCK<7:0> bits.
bit 15-0
CRCREG<15:0>: CRC-16 Checksum that is calculated with the writable part of the register map as a message. This
is a read-only 16-bit code. This checksum is continuously recalculated and updated every 21 DMCLK periods.
It is reset to its default value (0x0000) when LOCK<7:0> = 0xA5.
DS20005227A-page 70
 2013 Microchip Technology Inc.
MCP3913
9.0
PACKAGING INFORMATION
9.1
Package Marking Information
28-Lead SSOP (5.30 mm)
Example
MCP3913A1
e3
E/SS^^
1327256
40-Lead UQFN (5x5x0.5 mm)
PIN 1
Example
PIN 1
MCP3913
A1
e3
E/MV ^^
1327256
Legend: XX...X
Y
YY
WW
NNN
e3
*
Note:
Customer-specific information
Year code (last digit of calendar year)
Year code (last 2 digits of calendar year)
Week code (week of January 1 is week ‘01’)
Alphanumeric traceability code
Pb-free JEDEC designator for Matte Tin (Sn)
This package is Pb-free. The Pb-free JEDEC designator ( e3 )
can be found on the outer packaging for this package.
In the event the full Microchip part number cannot be marked on one line, it will
be carried over to the next line, thus limiting the number of available
characters for customer-specific information.
 2013 Microchip Technology Inc.
DS20005227A-page 71
MCP3913
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DS20005227A-page 72
 2013 Microchip Technology Inc.
MCP3913
Note:
For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
 2013 Microchip Technology Inc.
DS20005227A-page 73
MCP3913
Note:
For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
DS20005227A-page 74
 2013 Microchip Technology Inc.
MCP3913
Note:
For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
 2013 Microchip Technology Inc.
DS20005227A-page 75
MCP3913
Note:
For the most current package drawings, please see the Microchip Packaging Specification located at
http://www.microchip.com/packaging
DS20005227A-page 76
 2013 Microchip Technology Inc.
MCP3913
APPENDIX A:
REVISION HISTORY
Revision A (October 2013)
• Original Release of this Document.
 2013 Microchip Technology Inc.
DS20005227A-page 77
MCP3913
NOTES:
 2013 Microchip Technology Inc.
DS20005227A-page 78
MCP3913
PRODUCT IDENTIFICATION SYSTEM
To order or obtain information, e.g., on pricing or delivery, refer to the factory or the listed sales office.
PART NO.
Device
[X](1)
X
/XX
Tape and Temperature
Reel
Range
Package
Device:
MCP3913:
Six-Channel Analog Front-End Converter
Address Options:
XX
A6
A5
A0
=
0
0
A1*
=
0
1
A2
=
1
0
A3
=
1
1
Examples:
a)
MCP3913A1-E/SS:
Extended Temperature,
28LD SSOP package
b)
MCP3913A1T-E/SS:
Tape and Reel,
Extended Temperature,
28LD SSOP package
c)
MCP3913A1-E/MV:
Extended Temperature,
40LD UQFN package
d)
MCP3913A1T-E/MV: Tape and Reel,
Extended Temperature,
40LD UQFN package
* Default option. Contact Microchip factory for other address
options.
Tape and Reel Option: Blank = Standard packaging (tube or tray)
T
= Tape and Reel(1)
Note 1:
Temperature Range:
E
= -40°C to +125°C
Package:
MV = Plastic Ultra Thin Quad Flat, No Lead package
(UQFN)
SS = Plastic Shrink Small Outline, 5.30 mm body
(SSOP)
 2013 Microchip Technology Inc.
Tape and Reel identifier only appears in the
catalog part number description. This identifier is used for ordering purposes and is not
printed on the device package. Check with
your Microchip sales office for package
availability for the Tape and Reel option.
DS20005227A-page 79
MCP3913
NOTES:
 2013 Microchip Technology Inc.
DS20005227A-page 80
Note the following details of the code protection feature on Microchip devices:
•
Microchip products meet the specification contained in their particular Microchip Data Sheet.
•
Microchip believes that its family of products is one of the most secure families of its kind on the market today, when used in the
intended manner and under normal conditions.
•
There are dishonest and possibly illegal methods used to breach the code protection feature. All of these methods, to our
knowledge, require using the Microchip products in a manner outside the operating specifications contained in Microchip’s Data
Sheets. Most likely, the person doing so is engaged in theft of intellectual property.
•
Microchip is willing to work with the customer who is concerned about the integrity of their code.
•
Neither Microchip nor any other semiconductor manufacturer can guarantee the security of their code. Code protection does not
mean that we are guaranteeing the product as “unbreakable.”
Code protection is constantly evolving. We at Microchip are committed to continuously improving the code protection features of our
products. Attempts to break Microchip’s code protection feature may be a violation of the Digital Millennium Copyright Act. If such acts
allow unauthorized access to your software or other copyrighted work, you may have a right to sue for relief under that Act.
Information contained in this publication regarding device
applications and the like is provided only for your convenience
and may be superseded by updates. It is your responsibility to
ensure that your application meets with your specifications.
MICROCHIP MAKES NO REPRESENTATIONS OR
WARRANTIES OF ANY KIND WHETHER EXPRESS OR
IMPLIED, WRITTEN OR ORAL, STATUTORY OR
OTHERWISE, RELATED TO THE INFORMATION,
INCLUDING BUT NOT LIMITED TO ITS CONDITION,
QUALITY, PERFORMANCE, MERCHANTABILITY OR
FITNESS FOR PURPOSE. Microchip disclaims all liability
arising from this information and its use. Use of Microchip
devices in life support and/or safety applications is entirely at
the buyer’s risk, and the buyer agrees to defend, indemnify and
hold harmless Microchip from any and all damages, claims,
suits, or expenses resulting from such use. No licenses are
conveyed, implicitly or otherwise, under any Microchip
intellectual property rights.
Trademarks
The Microchip name and logo, the Microchip logo, dsPIC,
FlashFlex, KEELOQ, KEELOQ logo, MPLAB, PIC, PICmicro,
PICSTART, PIC32 logo, rfPIC, SST, SST Logo, SuperFlash
and UNI/O are registered trademarks of Microchip Technology
Incorporated in the U.S.A. and other countries.
FilterLab, Hampshire, HI-TECH C, Linear Active Thermistor,
MTP, SEEVAL and The Embedded Control Solutions
Company are registered trademarks of Microchip Technology
Incorporated in the U.S.A.
Silicon Storage Technology is a registered trademark of
Microchip Technology Inc. in other countries.
Analog-for-the-Digital Age, Application Maestro, BodyCom,
chipKIT, chipKIT logo, CodeGuard, dsPICDEM,
dsPICDEM.net, dsPICworks, dsSPEAK, ECAN,
ECONOMONITOR, FanSense, HI-TIDE, In-Circuit Serial
Programming, ICSP, Mindi, MiWi, MPASM, MPF, MPLAB
Certified logo, MPLIB, MPLINK, mTouch, Omniscient Code
Generation, PICC, PICC-18, PICDEM, PICDEM.net, PICkit,
PICtail, REAL ICE, rfLAB, Select Mode, SQI, Serial Quad I/O,
Total Endurance, TSHARC, UniWinDriver, WiperLock, ZENA
and Z-Scale are trademarks of Microchip Technology
Incorporated in the U.S.A. and other countries.
SQTP is a service mark of Microchip Technology Incorporated
in the U.S.A.
GestIC and ULPP are registered trademarks of Microchip
Technology Germany II GmbH & Co. KG, a subsidiary of
Microchip Technology Inc., in other countries.
All other trademarks mentioned herein are property of their
respective companies.
© 2013, Microchip Technology Incorporated, Printed in the
U.S.A., All Rights Reserved.
Printed on recycled paper.
ISBN: 978-1-62077-519-6
QUALITY MANAGEMENT SYSTEM
CERTIFIED BY DNV
== ISO/TS 16949 ==
 2013 Microchip Technology Inc.
Microchip received ISO/TS-16949:2009 certification for its worldwide
headquarters, design and wafer fabrication facilities in Chandler and
Tempe, Arizona; Gresham, Oregon and design centers in California
and India. The Company’s quality system processes and procedures
are for its PIC® MCUs and dsPIC® DSCs, KEELOQ® code hopping
devices, Serial EEPROMs, microperipherals, nonvolatile memory and
analog products. In addition, Microchip’s quality system for the design
and manufacture of development systems is ISO 9001:2000 certified.
DS20005227A-page 81
Worldwide Sales and Service
AMERICAS
ASIA/PACIFIC
ASIA/PACIFIC
EUROPE
Corporate Office
2355 West Chandler Blvd.
Chandler, AZ 85224-6199
Tel: 480-792-7200
Fax: 480-792-7277
Technical Support:
http://www.microchip.com/
support
Web Address:
www.microchip.com
Asia Pacific Office
Suites 3707-14, 37th Floor
Tower 6, The Gateway
Harbour City, Kowloon
Hong Kong
Tel: 852-2401-1200
Fax: 852-2401-3431
India - Bangalore
Tel: 91-80-3090-4444
Fax: 91-80-3090-4123
Austria - Wels
Tel: 43-7242-2244-39
Fax: 43-7242-2244-393
Denmark - Copenhagen
Tel: 45-4450-2828
Fax: 45-4485-2829
Atlanta
Duluth, GA
Tel: 678-957-9614
Fax: 678-957-1455
Boston
Westborough, MA
Tel: 774-760-0087
Fax: 774-760-0088
Chicago
Itasca, IL
Tel: 630-285-0071
Fax: 630-285-0075
Cleveland
Independence, OH
Tel: 216-447-0464
Fax: 216-447-0643
Dallas
Addison, TX
Tel: 972-818-7423
Fax: 972-818-2924
Detroit
Farmington Hills, MI
Tel: 248-538-2250
Fax: 248-538-2260
Indianapolis
Noblesville, IN
Tel: 317-773-8323
Fax: 317-773-5453
Los Angeles
Mission Viejo, CA
Tel: 949-462-9523
Fax: 949-462-9608
Santa Clara
Santa Clara, CA
Tel: 408-961-6444
Fax: 408-961-6445
Toronto
Mississauga, Ontario,
Canada
Tel: 905-673-0699
Fax: 905-673-6509
Australia - Sydney
Tel: 61-2-9868-6733
Fax: 61-2-9868-6755
China - Beijing
Tel: 86-10-8569-7000
Fax: 86-10-8528-2104
China - Chengdu
Tel: 86-28-8665-5511
Fax: 86-28-8665-7889
China - Chongqing
Tel: 86-23-8980-9588
Fax: 86-23-8980-9500
China - Hangzhou
Tel: 86-571-2819-3187
Fax: 86-571-2819-3189
China - Hong Kong SAR
Tel: 852-2943-5100
Fax: 852-2401-3431
China - Nanjing
Tel: 86-25-8473-2460
Fax: 86-25-8473-2470
China - Qingdao
Tel: 86-532-8502-7355
Fax: 86-532-8502-7205
China - Shanghai
Tel: 86-21-5407-5533
Fax: 86-21-5407-5066
China - Shenyang
Tel: 86-24-2334-2829
Fax: 86-24-2334-2393
China - Shenzhen
Tel: 86-755-8864-2200
Fax: 86-755-8203-1760
China - Wuhan
Tel: 86-27-5980-5300
Fax: 86-27-5980-5118
China - Xian
Tel: 86-29-8833-7252
Fax: 86-29-8833-7256
India - Pune
Tel: 91-20-3019-1500
Japan - Osaka
Tel: 81-6-6152-7160
Fax: 81-6-6152-9310
Japan - Tokyo
Tel: 81-3-6880- 3770
Fax: 81-3-6880-3771
Korea - Daegu
Tel: 82-53-744-4301
Fax: 82-53-744-4302
Korea - Seoul
Tel: 82-2-554-7200
Fax: 82-2-558-5932 or
82-2-558-5934
Malaysia - Kuala Lumpur
Tel: 60-3-6201-9857
Fax: 60-3-6201-9859
France - Paris
Tel: 33-1-69-53-63-20
Fax: 33-1-69-30-90-79
Germany - Munich
Tel: 49-89-627-144-0
Fax: 49-89-627-144-44
Italy - Milan
Tel: 39-0331-742611
Fax: 39-0331-466781
Netherlands - Drunen
Tel: 31-416-690399
Fax: 31-416-690340
Spain - Madrid
Tel: 34-91-708-08-90
Fax: 34-91-708-08-91
UK - Wokingham
Tel: 44-118-921-5869
Fax: 44-118-921-5820
Malaysia - Penang
Tel: 60-4-227-8870
Fax: 60-4-227-4068
Philippines - Manila
Tel: 63-2-634-9065
Fax: 63-2-634-9069
Singapore
Tel: 65-6334-8870
Fax: 65-6334-8850
Taiwan - Hsin Chu
Tel: 886-3-5778-366
Fax: 886-3-5770-955
Taiwan - Kaohsiung
Tel: 886-7-213-7828
Fax: 886-7-330-9305
Taiwan - Taipei
Tel: 886-2-2508-8600
Fax: 886-2-2508-0102
Thailand - Bangkok
Tel: 66-2-694-1351
Fax: 66-2-694-1350
China - Xiamen
Tel: 86-592-2388138
Fax: 86-592-2388130
China - Zhuhai
Tel: 86-756-3210040
Fax: 86-756-3210049
DS20005227A-page 82
India - New Delhi
Tel: 91-11-4160-8631
Fax: 91-11-4160-8632
08/20/13
 2013 Microchip Technology Inc.
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