STMicroelectronics HCF4042BC1 Quad clocked d latch Datasheet

HCC/HCF4042B
QUAD CLOCKED ”D” LATCH
..
..
.
.
..
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CLOCK POLARITY CONTROL
Q AND Q OUTPUTS
COMMON CLOCK
LOW POWER TTL COMPATIBLE
STANDARDIZED SYMMETRICAL OUTPUT
CHARACTERISTICS
QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
5V, 10V, AND 15V PARAMETRIC RATINGS
INPUT CURRENT OF 100nA AT 18V AND 25°C
FOR HCC DEVICE
100% TESTED FOR QUIESCENT CURRENT
MEETS ALL REQUIREMENTS OF JEDEC TENTATIVE STANDARD N° 13A, ”STANDARD SPECIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
EY
(Plastic Package)
M1
(Micro Package)
F
(Ceramic Package)
C1
(Plastic Chip Carrier)
ORDER CODES :
HCC4042BF
HCF4042BM1
HCF4042BEY
HCF4042BC1
PIN CONNECTIONS
DESCRIPTION
The HCC4042B (extended temperature range) and
HCF4042B (intermediate temperature range) are
monolithic integrated circuit, available in 16-lead
dual in-line plastic or ceramic package and plastic
micro package.
The HCC/HCF4042B types contain four latch circuits, each strobed by a common clock. Complementary buffered outputs are available from
each circuit. The impedance of the n- and p-channel
output devices is balanced and all outputs are electrically identical.
Information present at the data input is transferred
to outputs Q and Q during the CLOCK level which
is programmed by the POLARITY input. For POLARITY = 0 the transfer occurs during the 0 CLOCK
level and for POLARITY = 1 the transfer occurs during the 1 CLOCK level. The outputs follow the data
input providing the CLOCK and POLARITY levels
defined above are present. When a CLOCK transition occurs (positive for POLARITY = 0 and negative
for POLARITY = 1) the information present at the
input during the CLOCK transition is retained at the
outputs until an opposite CLOCK transition occurs.
June 1989
1/13
HCC/HCF4042B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
V DD*
Parameter
Supply Voltage : HC C Types
H C F Types
Value
Unit
– 0.5 to + 20
– 0.5 to + 18
V
V
Vi
Input Voltage
– 0.5 to V DD + 0.5
V
II
DC Input Current (any one input)
± 10
mA
Total Power Dissipation (per package)
Dissipation per Output Transistor
for T o p = Full Package-temperature Range
200
mW
100
mW
Pt ot
Top
Operating Temperature : HCC Types
H CF Types
– 55 to + 125
– 40 to + 85
°C
°C
Tstg
Storage Temperature
– 65 to + 150
°C
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other conditions above those indicated in the operational sections
of this specification is not implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
Value
Unit
Supply Voltage HCC Types
:
HCF Types
3 to 18
3 to 15
V
V
VI
Input Voltage
0 to V DD
V
Top
Operating Temperature : HCC Types
HCF Types
– 55 to + 125
– 40 to + 85
°C
°C
VDD
2/13
Parameter
HCC/HCF4042B
LOGIC BLOCK DIAGRAM AND TRUTH TABLE
Clock
Polarity
Q
0
__
__/
0
D
0
Latch
1
1
D
\__
1
Latch
__
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Test Conditions
Symbol
IL
V OH
V OL
Parameter
Quiescent
Current
Output High
Voltage
Output Low
Voltage
VI
(V)
VO
(V)
Input High
Voltage
|I O | V D D
T L o w*
25 °C
T Hi g h *
(µA) (V) Min. Max. Min. Typ. Max. Min. Max.
0/ 5
5
1
0.02
1
30
0/10
HCC
Types 0/15
10
2
0.02
2
60
15
4
0.02
4
120
0/20
20
20
0.04
20
600
0/5
HCF
0/10
Types
0/15
5
4
0.02
4
30
10
8
0.02
8
60
15
16
0.02
16
120
0/ 5
<1
5
4.95
4.95
4.95
0/10
<1
10
9.95
9.95
9.95
0/15
<1
15
14.95
14.95
14.95
5/0
<1
5
0.05
0.05
0.05
10/0
<1
10
0.05
0.05
0.05
15/0
V IH
Value
<1
15
0.5/4.5
<1
5
3.5
0.05
3.5
0.05
3.5
1/9
<1
10
7
7
7
1.5/13.5 < 1
15
11
11
11
Unit
µA
V
V
0.05
V
* TLo w = – 55°C for HCC device : – 40°C for HCF device.
* THigh = + 125°C for HCC device : + 85°C for HCF device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5V min. with VDD = 15V.
3/13
HCC/HCF4042B
STATIC ELECTRICAL CHARACTERISTICS (continued)
Test Conditions
Symbol
V IL
I OH
I OL
Parameter
VI
(V)
Input Low
Voltage
Output
Drive
Current
Output
Sink
Current
CI
Input
leakage
Curent
|I O | V D D
T L o w*
25 °C
T Hi g h *
(µA) (V) Min. Max. Min. Typ. Max. Min. Max.
4.5/0.5
<1
5
1.5
1.5
1.5
9/1
<1
10
3
3
3
13.5/1.5 < 1
15
4
4
4
0/ 5
2.5
5
– 2
– 1.6 – 3.2
– 1.15
0/ 5
HCC
Types 0/10
4.6
5
– 0.64
– 0.51 – 1
– 0.36
9.5
10
– 1.6
– 1.3 – 2.6
– 0.9
0/15
13.5
15
– 4.2
– 3.4 – 6.8
– 2.4
0/ 5
2.5
5
– 1.53
– 1.36 – 3.2
– 1.1
0/ 5
HCF
Types 0/10
4.6
5
– 0.52
– 0.44 – 1
– 0.36
9.5
10
– 1.3
– 1.1 – 2.6
– 0.9
0/15
13.5
15
– 3.6
– 3.0 – 6.8
– 2.4
0/ 5
0.4
5
0.64
0.51
1
0.36
HCC
0/10
Types
0/15
0.5
10
1.6
1.3
2.6
0.9
1.5
15
4.2
3.4
6.8
2.4
0/ 5
0.4
5
0.52
0.44
1
0.36
0.5
10
1.3
1.1
2.6
0.9
1.5
15
3.6
3.0
6.8
2.4
HCF
0/10
Types
0/15
I IH , I IL
VO
(V)
Value
HCC 0/18
Types
± 0.1
±10 -5 ± 0.1
15
± 0.3
±10
V
mA
mA
± 1
µA
Any Input
HCF
0/15
Types
Input Capacitance
18
Unit
Any Input
5
-5
± 0.3
± 1
7.5
pF
* TLow = – 55°C for HCC device : – 40°C for HCF device.
* THigh = + 125°C for HCC device : + 85°C for HCF device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5V min. with VDD = 15V.
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25°C, C L = 50pF, R L = 200kΩ,
typical temperature coefficient for all V DD values is 0.3%/°C, all input rise and fall times = 20ns)
Symbol
Parameter
t PL H, t PHL
Propagation Delay Data in to Q
Time
Data in to Q
Clock to Q
Clock to Q
4/13
Test Conditions
Value
V D D ( V ) Min.
Typ.
Max.
5
110
220
10
55
110
15
40
80
5
150
300
10
75
150
15
50
100
5
225
450
10
100
200
15
80
160
5
250
500
10
115
230
15
90
180
Unit
ns
HCC/HCF4042B
DYNAMIC ELECTRICAL CHARACTERISTICS (continued)
Test Conditions
Symbol
t T HL , t TL H
tW
tsetup
t h o ld
t r,t f
Parameter
Transition Time
Clock Pulse Width
Setup Time
Hold Time
Clock Input Rise or Fall Time
Value
V D D ( V ) Min.
Typ.
Max.
5
100
200
10
50
100
15
40
80
5
200
100
10
100
50
15
60
30
5
50
0
10
30
0
15
25
0
5
120
60
10
60
30
15
50
25
Unit
ns
ns
ns
ns
5
10
Not Rise or Fall
Time Sensitive
µs
15
Typical Output Low (sink) Current Characteristics.
Minimum Output Low (sink) Current
Characteristics.
5/13
HCC/HCF4042B
Typical Output High (source) Current
Characteristics.
Minimum Output High (source) Current
Characteristics.
Typical Transition Time vs. Load Capacitance.
Typical Propagation Delay Time vs. Load
Capacitance (data to Q).
Typical Propagation Delay Time vs. Load
Capacitance (data to Q).
Typical Propagation Delay Time vs. Load
Capacitance (clock to Q).
6/13
HCC/HCF4042B
Typical Propagation Delay Time vs. Load
Capacitance (clock to Q).
Typical Power Dissipation/device vs. Frequency.
Dynamic Test Parameters.
7/13
HCC/HCF4042B
TEST CIRCUITS
Quiescent Device Current.
Input Leakage Current.
8/13
Noise Immunity.
HCC/HCF4042B
Plastic DIP16 (0.25) MECHANICAL DATA
mm
DIM.
MIN.
a1
0.51
B
0.77
TYP.
inch
MAX.
MIN.
TYP.
MAX.
0.020
1.65
0.030
0.065
b
0.5
0.020
b1
0.25
0.010
D
20
0.787
E
8.5
0.335
e
2.54
0.100
e3
17.78
0.700
F
7.1
0.280
I
5.1
0.201
L
Z
3.3
0.130
1.27
0.050
P001C
9/13
HCC/HCF4042B
Ceramic DIP16/1 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
20
0.787
B
7
0.276
D
E
3.3
0.130
0.38
e3
0.015
17.78
0.700
F
2.29
2.79
0.090
0.110
G
0.4
0.55
0.016
0.022
H
1.17
1.52
0.046
0.060
L
0.22
0.31
0.009
0.012
M
0.51
1.27
0.020
0.050
N
P
Q
10.3
7.8
8.05
5.08
0.406
0.307
0.317
0.200
P053D
10/13
HCC/HCF4042B
SO16 (Narrow) MECHANICAL DATA
mm
DIM.
MIN.
TYP.
A
a1
inch
MAX.
MIN.
TYP.
1.75
0.1
0.068
0.2
a2
MAX.
0.004
0.007
1.65
0.064
b
0.35
0.46
0.013
0.018
b1
0.19
0.25
0.007
0.010
C
0.5
0.019
c1
45° (typ.)
D
9.8
E
5.8
10
0.385
6.2
0.228
0.393
0.244
e
1.27
0.050
e3
8.89
0.350
F
3.8
4.0
0.149
0.157
G
4.6
5.3
0.181
0.208
L
0.5
1.27
0.019
0.050
M
S
0.62
0.024
8° (max.)
P013H
11/13
HCC/HCF4042B
PLCC20 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
9.78
10.03
0.385
0.395
B
8.89
9.04
0.350
0.356
D
4.2
4.57
0.165
0.180
d1
2.54
0.100
d2
0.56
0.022
E
7.37
8.38
0.290
0.330
e
1.27
0.050
e3
5.08
0.200
F
0.38
0.015
G
0.101
0.004
M
1.27
0.050
M1
1.14
0.045
P027A
12/13
HCC/HCF4042B
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use ascritical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
 1994 SGS-THOMSON Microelectronics - All Rights Reserved
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