C2012X6S1A475K085AB TDK Item Description : C2012X6S1A475KT**** DC Bias Characteristic 0 Application & Main Feature -5 Cap. Change/% Commercial Grade ( General (Up to 50V) ) Series C2012 [EIA CC0805] -10 -15 -20 -25 -30 -35 -40 -45 -50 0 2 4 6 8 10 12 DC Bias/V 2.00mm 1.25mm 0.85mm 0.20mm 0.50mm +/-0.2mm +/-0.2mm +/-0.15mm Min. Min. Temperature Characteristic Temperature Characteristics 20 10 100 0 10 1 0.1 0.01 Rated Voltage 0.001 0.001 0.1 -30 -40 -50 -60 -70 1 10 100 -80 1000 -60 -40 -20 |Z| Capacitance Tolerance ESR 40 60 80 100 120 TCBias(1/2Rated) Ripple Temperature Rise Characteristics 25 Temperature Rise/degC 100 Dissipation Factor 10% Max. 10 AEC-Q200 Not Applicable 20 15 10 5 0 1 0.001 20 Temp.Chara. Cap. vs. Freq. Characteristic K (+/-10%) 0 Temperature/degC Frequency/MHz 4.7uF 21Mohm Min. -20 -90 0.01 Capacitance Insulation Resistance -10 -80 1A (10Vdc) Cap./uF Characterization Sheet ( Multilayer Ceramic Chip Capacitors ) X6S (-55 to 105 degC +/-22%) |Z|, ESR vs. Freq. Characteristics 1000 Cap. Change/% L W T B G |Z|, ESR/ohm Dimensions 0.01 0.1 1 Frequency/MHz 10 100 1000 0 0.5 1 1.5 100kHz All specifications are subject to change without notice. 2 2.5 3 3.5 4 Current/Arms 500kHz 1MHz January 3, 2016