HDSEMI MUR1020-28F-29CT To-220 plastic-encapsulate diode Datasheet

MUR1020(F)CT THRU MUR1060(F)CT
HD TO73
TO-220 Plastic-Encapsulate Diodes
Super Fast Recovery Rectifier Diode
Features
●Io
10A
ITO- 220 AB
TO- 220 AB
●VRRM
200V-600V
●High surge current capability
●Glass passivated chip
Applications
● Rectifier
1
Marking
1
2
● MUR10XX(F)CT
XX : From 20 To 60
Item
Symbol
Unit
3
PIN 1
PIN 2
PIN 3
CASE
2
3
MUR10-(F)CT
Test Conditions
20
40
60
200
400
600
Repetitive Peak Reverse Voltage
VRRM
V
Average Rectified Output Current
Io
A
60HZ Half-sine wave, Resistance
load, Tc(Fig.1)
10
IFSM
A
60Hz Half-sine wave ,1 cycle ,
Ta =25℃
120
TJ
℃
-55~+150
TSTG
℃
-55 ~ +150
Surge(Non-repetitive)Forward
Current
Junction Temperature
Storage Temperature
Electrical Characteristics (Ta=25℃ Unless otherwise specified)
MUR10-(F)CT
Item
Peak Forward Voltage
Peak Reverse Current
Reverse Recovery Time
Thermal
Resistance(Typical) (Note1)
Typical Junction
Capacitance(Note2)
Symbol
Unit
VF
V
IRRM1
IRRM2
uA
Test Condition
IF =5.0A
V RM=VRRM
20
40
60
1.0
1.3
1.7
Ta =25℃
Ta =125℃
IF=0.5A IRM=1A
IRR=0.25A
10
500
Trr
ns
RθJ-A
℃/W
30
Cj
pF
150
50
NOTE1. Leads maintained at ambient temperature at a distance of 9.5mm from the case
NOTE2. Measured at 1.0 MHz and applied reverse voltage of 4.0V D.C.
High Diode Semiconductor
1
Typical Characteristics
FIG.2: MAXIMUM NON-REPETITIVE FORWARD URGE CURRENT
IFSM(A)
IO(A)
FIG.1: FORWARD CURRENT DERATING CURVE
24
10
140
120
8.3ms Single Half Sine Wave
JEDEC Method
100
8
80
6
60
4
40
2
20
0
50
70
90
110
130
150
Tc(℃)
0
1
10
100
Number of Cycles
IR(uA)
IF(A)
FIG3:Instantaneous Forward Voltage
45
30
FIG.4:TYPICAL REVERSE CHARACTERISTICS
1000
15
100
MUR1020(F)CT
10
Tj=125℃
10
5.0
Tj=100℃
1.0
MUR1040(F)CT
1.0
MUR1060(F)CT
Tj=25℃
0.1
0.5
0.2
0.1
0.01
0
Ta=25℃
0
0.2
0.4
0.6
0.8
1.0
1.2
1.4
1.6
1.8
2.2
2.0
20
40
60
80
2.4
VF(V)
100
Voltage(%)
FIG.5: Diagram of circuit and Testing wave form of reverse recovery time
I
D
t rr
IF
VR
IF
RL
t
0
IRR
IR
High Diode Semiconductor
2
TO- 220
TO- 220 AB
ITO- 220 AB
JSHD
JSHD
High Diode Semiconductor
3
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