STMicroelectronics HCF4021BC1 8-stage static shift register Datasheet

HCC/HCF4014B
HCC/HCF4021B
8-STAGE STATIC SHIFT REGISTERS
4014B
SYNCHRONOUS PARALLEL OR
SERIAL INPUT/SERIAL OUTPUT
4021B
.
..
.
..
..
ASYNCHRONOUS PARALLEL
INPUT OR SYNCHRONOUS
SERIAL INPUT/SERIAL OUTPUT
MEDIUM-SPEED OPERATION-12MHz (typ.)
CLOCK RATE AT VDD – VSS = 10V
FULLY STATIC OPERATION
8 MASTER-SLAVE FLIP-FLOPS PLUS OUTPUT BUFFERING AND CONTROL GATING
QUIESCENT CURRENT SPECIFIED TO 20V
FOR HCC DEVICE
5V, 10V AND 15V PARAMETRIC RATINGS
INPUT CURRENT OF 100nA AT 18V AND 25°C
FOR HCC DEVICE
100% TESTED FOR QUIESCENT CURRENT
MEETS ALL REQUIREMENTS OF JEDEC TENTATIVE STANDARD No 13A, ”STANDARD
SPECIFICATIONS FOR DESCRIPTION OF ”B”
SERIES CMOS DEVICES”
DESCRIPTION
The HCC4014B, HCC4021B (extended temperature range) and the HCF4014B, HCF4021B (intermediate temperature range) are monolithic integrated
circuits, available in 16-lead dual in-line plastic or ceramic package and plastic micro package. The
HCC/HCF4014B and HCC/HCF4021B series types
are 8-stage parallel-or serial-input/serial-output registers having common CLOCK and PARALLEL/SERIAL CONTROL inputs, a single SERIAL
data input, and individual parallel ”JAM” inputs to
each register stage. Each register stage is a D type,
master-slave flip-flop in addition to an output from
stage 8, ”Q” outputs are also available from stages
6 and 7. Parallel as well as serial entry is made into
the register synchronously with the positive clock line transition in the HCC/HCF4014B. In the
HCC/HCF4021B serial entry is synchronous with
the clock but parallel entry is asynchronous. In both
types, entry is controlled by the PARALLEL/SERIAL
CONTROL input. When the PARALLEL/SERIAL
CONTROL input is low, data is serially shifted into
the 8-stage register synchronously with the positive
transition of the clock line. When the PARALLEL/SERIAL CONTROL input is high, data is jammed into the 8-stage register via the parallel input
November 1996
lines and synchronous with the positive transition of
the clock line. In the HCC/HCF4021B, the CLOCK
input of the internal stage is ”forced” whenasynchronous parallel entry is made. Register expansion
using multiple package is permitted.
EY
(Plastic Package)
M1
(Micro Package)
F
(Ceramic Package)
C1
(Plastic Chip Carrier)
ORDER CODES :
HCC40XXBF
HCF40XXBM1
HCF40XXBEY
HCF40XXBC1
PIN CONNECTIONS
1/13
HCC/HCF4014B/4021B
FUNCTIONAL DIAGRAM
ABSOLUTE MAXIMUM RATINGS
Symbol
V DD *
Parameter
Supply Voltage : HC C Types
H CF Types
Value
Unit
– 0.5 to + 20
– 0.5 to + 18
V
V
Vi
Input Voltage
– 0.5 to V DD + 0.5
V
II
DC Input Current (any one input)
± 10
mA
Total Power Dissipation (per package)
Dissipation per Output Transistor
for T o p = Full Package-temperature Range
200
mW
100
mW
Pto t
T op
Operating Temperature : HCC Types
H CF Types
– 55 to + 125
– 40 to + 85
°C
°C
T stg
Storage Temperature
– 65 to + 150
°C
Stresses above those listed under ”Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only and
functional operation of the device at these or any other conditions above those indicated in the operational sections of this specification is not
implied. Exposure to absolute maximum rating conditions for external periods may affect device reliability.
* All voltage values are referred to VSS pin voltage.
RECOMMENDED OPERATING CONDITIONS
Symbol
V DD
VI
Top
2/13
Parameter
Supply Voltage : HCC Types
HC F Types
Input Voltage
Operating Temperature : HCC Types
H CF Types
Value
Unit
3 to 18
3 to 15
V
V
0 to V DD
V
– 55 to + 125
– 40 to + 85
°C
°C
HCC/HCF4014B/4021B
LOGIC DIAGRAMS
4014B
4021B
3/13
HCC/HCF4014B/4021B
TRUTH TABLES
HCC/HCF4021B
HCC/HCF 4014B
CL
Q1
Serial Parallel/
Pl– 1 Pl– n
Qn
Input Serial
(internal)
Control
–
–/
–
–/
–
–/
–
–/
–
–/
–
–/
–\
–
CL
Serial Parallel/
Q1
Qn
Pl– 1 Pl– n
(internal)
Input Serial
Control
X
1
0
0
0
0
X
X
1
0
0
0
0
X
1
1
0
1
0
X
X
1
0
1
0
1
X
X
1
1
0
1
0
X
X
1
1
1
1
1
–
0
1
0
0
X
X
X
X
0
1
–
X
0
X
X
Q1
X
1
0
1
0
1
X
1
1
1
1
1
0
0
X
X
0
Q n –1
1
0
X
X
1
Q n –1 I
X
X
X
X
Q1
Qn
–/
–\
Q n –1
Q n –1 I
NC
Qn
X = don’t care case.
NC = no change.
NC
X = don’t care case.
NC = no change.
STATIC ELECTRICAL CHARACTERISTICS (over recommended operating conditions)
Test Conditions
Symbol
IL
VOH
VOL
Parameter
Quiescent
Current
Output High
Voltage
Output Low
Voltage
VI
(V)
VO
(V)
VIL
Input High
Voltage
Input Low
Voltage
| IO | V DD
(µA) (V)
25 °C
TLow*
Min. Max. Min.
Typ.
Max. Min.
Max.
0/ 5
5
5
0.04
5
150
HCC
Types 0/15
10
10
0.04
10
300
15
20
0.04
20
600
0/20
20
100
0.08
100
3000
0/ 5
HCF
0/10
Types
0/15
5
20
0.04
20
150
10
40
0.04
40
300
15
80
0.04
80
600
0/ 5
< 1
5
4.95
4.95
4.95
0/10
< 1
10
9.95
9.95
9.95
0/15
< 1
15
14.95
14.95
14.95
5/0
< 1
5
0.05
0.05
0.05
< 1
10
0.05
0.05
0.05
< 1
15
0.5/4.5
< 1
5
1/9
0.05
3.5
0.05
3.5
µA
V
10/0
V
0.05
3.5
V
< 1
10
7
7
7
1.5/13.5 < 1
15
11
11
11
4.5/0.5
< 1
5
1.5
1.5
1.5
9/1
< 1
10
3
3
3
13.5/1.5 < 1
15
4
4
4
* TLow = – 55°C for HCC device : – 40°C for HCF device.
* THigh = + 125°C for HCC device : + 85°C for HCF device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5 V min. with VDD = 15V.
4/13
Unit
T High*
0/10
15/0
VIH
Value
V
HCC/HCF4014B/4021B
STATIC ELECTRICAL CHARACTERISTICS (continued)
Test Conditions
Symbol
I OH
I OL
I IH , I IL
CI
Parameter
Output
Drive
Current
Output
Sink
Current
Input
Leakage
Current
Value
|I O | V D D
T L o w*
25 °C
T Hi g h *
(µA) (V) Min. Max. Min. Typ. Max. Min. Max.
VI
(V)
VO
(V)
0/ 5
2.5
HCC 0/ 5
Types 0/10
0/15
13.5
15
0/ 5
2.5
5
0/ 5
HCF
Types 0/10
4.6
5
9.5
10
0/15
13.5
0/ 5
HCC
0/10
Types
0/15
0/ 5
HCF
0/10
Types
0/15
HCC 0/18
Types
5
– 2
– 1.6 – 3.2
– 1.15
4.6
5
9.5
10
– 0.64
– 0.51 – 1
– 0.36
– 1.6
– 1.3 – 2.6
– 0.9
– 4.2
– 3.4 – 6.8
– 2.4
– 1.53
– 1.36 – 3.2
– 1.1
– 0.52
– 0.44 – 1
– 0.36
– 1.3
– 1.1 – 2.6
– 0.9
15
– 3.6
– 3.0 – 6.8
– 2.4
0.4
5
0.64
0.51
1
0.36
0.5
10
1.6
1.3
2.6
0.9
1.5
15
4.2
3.4
6.8
2.4
0.4
5
0.52
0.44
1
0.36
0.5
10
1.3
1.1
2.6
0.9
1.5
15
3.6
3.0
6.8
2.4
Input Capacitance
mA
± 0.1
±10
± 0.1
± 1
15
± 0.3
±10 – 5 ± 0.3
± 1
Any Input
HCF
0/15
Types
mA
18
Any Input
–5
5
Unit
7.5
µA
pF
* TLow = – 55°C for HCC device : – 40°C for HCF device.
* THigh = + 125°C for HCC device : + 85°C for HCF device.
The Noise Margin for both ”1” and ”0” level is : 1V min. with VDD = 5V, 2V min. with VDD = 10V, 2.5 V min. with VDD = 15V.
DYNAMIC ELECTRICAL CHARACTERISTICS (T amb = 25°C, C L = 50pF, R L = 200kΩ,
typical temperature coefficient for all V DD = 0.3%/°C values, all input rise and fall time = 20ns)
Symbol
Parameter
Test Conditions
Value
V D D (V) Min.
Typ.
Max.
5
160
320
10
80
160
15
60
120
Unit
CLOCKED OPERATION
t P L H , t P HL Propagation Delay Time
t THL , t T L H Transition Time
f CL *
tW
Maximum Clock Input Frequency
Clock Pulse Width
5
100
200
10
50
100
15
40
80
5
3
6
10
6
12
15
8.5
17
5
180
90
10
80
40
15
50
25
ns
ns
MHz
ns
* If more than one unit is cascaded t rCL should be made less than or equal to the sum of the transition time and the fixed propagation delay of
the output of the driving stage of the estimated capacitive load.
5/13
HCC/HCF4014B/4021B
DYNAMIC ELECTRICAL CHARACTERISTICS (Continued)
Symbol
Parameter
CLOCKED OPERATION
Clock Input Rise or Fall Time
tr, tf
tsetup
tsetup
tsetup
tsetup
thold
tWH
trem
Setup Time, serial Input (ref. to CL)
Setup Time, parallel Input (4014B)
(ref. to CL)
Setup Time, parallel Input (4021B)
(ref. to P/S)
Setup Time, parallel/serial Control (4014B)
(ref. to CL)
Hold Time, serial in, parallel in,
parallel/serial Cotrol
P/S Pulse Width (4021B)
P/S Removal time (4021B)
(ref. to CL)
Test Conditions
VDD (V)
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
5
10
15
Min.
Value
Typ.
Max.
15
15
15
120
80
60
80
50
40
50
30
20
180
80
60
0
0
0
160
80
50
280
140
100
60
40
30
40
25
20
25
15
10
90
40
30
Unit
µs
ns
ns
ns
ns
ns
80
40
25
140
70
50
ns
ns
* If more than one unit is cascaded t rCL should be made less than or equal to the sum of the transition time and the fixed propagation delay of
the output of the driving stage of the estimated capacitive load.
Typical Output Low (sink) Current Characteristics.
6/13
Minimum Output Low (sink) Current Characteristics.
HCC/HCF4014B/4021B
Typical Output High (source) Current Characteristics.
Minimum Output High (source) Current Characteristics.
Typical Transition Time vs. Load Capacitance.
Typical Propagation Delay Time vs. Load Capacitance.
Typical Dynamic Power Dissapating vs. Clock
Input Frequency.
7/13
HCC/HCF4014B/4021B
TEST CIRCUITS
Quiescent Device Current.
Noise Immunity.
Input Leakage Current.
Dynamic Power Dissipation.
8/13
HCC/HCF4014B/4021B
Plastic DIP16 (0.25) MECHANICAL DATA
mm
DIM.
MIN.
a1
0.51
B
0.77
TYP.
inch
MAX.
MIN.
TYP.
MAX.
0.020
1.65
0.030
0.065
b
0.5
0.020
b1
0.25
0.010
D
20
0.787
E
8.5
0.335
e
2.54
0.100
e3
17.78
0.700
F
7.1
0.280
I
5.1
0.201
L
Z
3.3
0.130
1.27
0.050
P001C
9/13
HCC/HCF4014B/4021B
Ceramic DIP16/1 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
20
0.787
B
7
0.276
D
E
3.3
0.130
0.38
e3
0.015
17.78
0.700
F
2.29
2.79
0.090
0.110
G
0.4
0.55
0.016
0.022
H
1.17
1.52
0.046
0.060
L
0.22
0.31
0.009
0.012
M
0.51
1.27
0.020
0.050
N
P
Q
10.3
7.8
8.05
5.08
0.406
0.307
0.317
0.200
P053D
10/13
HCC/HCF4014B/4021B
SO16 (Narrow) MECHANICAL DATA
mm
DIM.
MIN.
TYP.
A
a1
inch
MAX.
MIN.
TYP.
1.75
0.1
0.2
a2
MAX.
0.068
0.004
0.007
1.65
0.064
b
0.35
0.46
0.013
0.018
b1
0.19
0.25
0.007
0.010
C
0.5
0.019
c1
45° (typ.)
D
9.8
10
0.385
0.393
E
5.8
6.2
0.228
0.244
e
1.27
e3
0.050
8.89
0.350
F
3.8
4.0
0.149
0.157
G
4.6
5.3
0.181
0.208
L
0.5
1.27
0.019
0.050
M
S
0.62
0.024
8° (max.)
P013H
11/13
HCC/HCF4014B/4021B
PLCC20 MECHANICAL DATA
mm
DIM.
MIN.
TYP.
inch
MAX.
MIN.
TYP.
MAX.
A
9.78
10.03
0.385
0.395
B
8.89
9.04
0.350
0.356
D
4.2
4.57
0.165
0.180
d1
2.54
0.100
d2
0.56
0.022
E
7.37
8.38
0.290
0.330
e
1.27
0.050
e3
5.08
0.200
F
0.38
0.015
G
0.101
0.004
M
1.27
0.050
M1
1.14
0.045
P027A
12/13
HCC/HCF4014B/4021B
Information furnished is believed to be accurate and reliable. However, SGS-THOMSON Microelectronics assumes no responsability for the
consequences of use of such information nor for any infringement of patents or other rights of third parties which may results from its use. No
license is granted by implication or otherwise under any patent or patent rights of SGS-THOMSON Microelectronics. Specifications mentioned
in this publication are subject to change without notice. This publication supersedes and replaces all information previously supplied.
SGS-THOMSON Microelectronics products are not authorized for use as critical components in life support devices or systems without express
written approval of SGS-THOMSON Microelectonics.
 1996 SGS-THOMSON Microelectronics - Printed in Italy - All Rights Reserved
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