ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 ADC12EU050 Ultra-Low Power, Octal, 12-bit, 45 MSPS Sigma-Delta Analog-to-Digital Converter Check for Samples: ADC12EU050 FEATURES 1 • • • • • • • • 2 ™ Xignal CT∑Δ ADC Technology 45MSPS Sampling Rate Anti-Alias Filter Free Nyquist Sample Range Unique Instant Overload Recovery (IOR) Wide 2.10 VPP Input Range 1.2V Supply Voltage Integrated Precision LC PLL Serial Control via SPI Compatible Interface APPLICATIONS • • • • Medical Imaging, Ultrasound Industrial Ultrasound, such as Non-Destructive Testing Communications Battery Powered Portable Systems KEY SPECIFICATIONS • • • • • • • • DESCRIPTION The ADC12EU050 is a 12-bit, ultra-low power, octal A/D converter for use in high performance analog to digital applications. The ADC12EU050 uses an innovative continuous time sigma delta architecture offering ultra low power consumption and an alias free sample bandwidth up to 22.5MHz. The input stage of each channel features a proprietary system to ensure instantaneous recovery from overdrive. Instant overload recovery (IOR) with no memory effect ensures the elimination of phase errors resulting from out of range input signals. The ADC12EU050 reduces interconnection complexity by using programmable serialized outputs which offer the industry standard LVDS and SLVS modes. Power consumption of only 46mW per channel @ 45MSPS gives a total chip power consumption of 364mW. The ADC12EU050 can operate entirely from a 1.2V supply, although a separate output driver supply of up to 1.8V can be used. The device operates from 0 to +70 °C and is supplied in a 10 x 10 mm2, 68-pin VQFN package. Resolution 12 Bits Conversion Rate 45 MSPS SNR : 69.3 dBFS (typ) @ 45 MSPS fIN = 4.4MHz THD –76.6 dB (typ) @ 45 MSPS fIN = 4.4MHz Per Channel Power 46 mW/ch (typ) @ 45 MSPS Total Active Power 364 mW (typ) @ 45 MSPS Inter-Channel Isolation >110 dB @ fIN = 4.4 MHz Operating Temp. Range 0 to +70 °C 1 2 Please be aware that an important notice concerning availability, standard warranty, and use in critical applications of Texas Instruments semiconductor products and disclaimers thereto appears at the end of this data sheet. All trademarks are the property of their respective owners. PRODUCTION DATA information is current as of publication date. Products conform to specifications per the terms of the Texas Instruments standard warranty. Production processing does not necessarily include testing of all parameters. Copyright © 2008–2013, Texas Instruments Incorporated ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com Block Diagram ADC12EU050 CMOS IN CLK+ (SE) PLL LVDS Input CLK- Output LVDS SLVS BCLK+ BCLK- LC VCO ADC CONTROL SLEEP RST Output LVDS SLVS Register 1.2V VA Register WCLK+ WCLK- AGND 1.2V to 1.8V 1.2V VD DGND DGND Clipping Control VINn+ 12 bit 3 bit 1.3 kÖ Serializer CTÐ? Digital Decimation Filter Modulator VINn- Register Register Register DCAP RREF IRef DOn+ DOn- Register SPI Control To Registers 0.5V DC Ref select Register SDATA 2 Output LVDS SLVS 8 times Reference and Bias VREFB 1 bit 1.3 kÖ Register VREFT VDR Submit Documentation Feedback SCLK SSEL Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 VIN1- VIN1+ VA VIN2- VIN2+ VA VIN3- VIN3+ VA VIN4- VIN4+ VA VIN5- VIN5+ VA VIN6- VIN6+ Connection Diagram 68 67 66 65 64 63 62 61 60 59 58 57 56 55 54 53 52 VA 1 51 VA VIN0+ 2 50 VIN7- VIN0- 3 49 VIN7+ VREFB 4 48 CLK- VREFT 5 47 CLK+ (SE) DCAP 6 46 SSEL RREF 7 45 SCLK ADC12EU050 VA 8 RST 9 44 SDATA 43 VD Pin 0 - AGND Exposed pad (rear of package) SLEEP 10 42 VD VD 11 41 DGND VD 12 40 DGND DGND 13 39 WCLK- DGND 14 38 WCLK+ DO0+ 15 37 BCLK- DO0- 16 36 BCLK+ 29 30 31 32 33 34 DO7- 28 DO7+ DO3+ 27 DO6- DGND 26 DO6+ DO2- 25 DGND DO2+ 24 DO5- 23 DO5+ 22 VDR 21 DO4- 20 DO4+ 19 DO3- 18 DO1- 35 VDR DO1+ VDR 17 Figure 1. 68-Pin VQFN See NKE0068A Package Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 3 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com PIN DESCRIPTIONS Pin No. Name Type Function and Connection Input Differential analog inputs to the ADC, for channels 0 to 7. The negative input pin may be connected via a capacitor to AGND or the inputs may be transformer coupled for single ended operation. Differential inputs are recommended for best performance. ANALOG I/O 2 3 67 68 64 65 61 62 58 59 55 56 52 53 49 50 VIN0+ VIN0VIN1+ VIN1VIN2+ VIN2VIN3+ VIN3VIN4+ VIN4VIN5+ VIN5VIN6+ VIN6VIN7+ VIN7- 4 VREFB Optional negative reference voltage to improve multi-channel ADC matching. This pin must be connected to AGND. VREFT Optional positive reference voltage to improve multi-channel ADC matching. If using the internal reference, this pin should be left tied to AGND through a 100nF capacitor. If using an external reference voltage, this pin should be connected to the positive reference voltage, which must lie in the range specified in the Electrical Characteristics table. 6 DCAP Input This pin provides the capacitance for the low pass filter in the modulator’s DAC. It must be connected to AGND through a minimum 100nF capacitor. It is possible to decrease the noise close to the carrier by increasing this capacitor, up to a maximum of 10μF. See APPLICATION INFORMATION for further information on the selection of this capacitor. 7 RREF Input/Output External bias reference resistor. This pin must always be connected to AGND through a resistor, whether the internal reference or an external reference voltage is used. The resistor value must be 10kΩ ±1%. 9 RST Input This pin is an active low reset for the entire ADC, both analog and digital components. The pin must be held low for 500ns then returned to high in order to ensure that the chip is reset correctly. 10 SLEEP Input Sleep mode. Toggling this pin to high will cause the ADC to enter the low power sleep mode. When the pin is returned to low, the chip will, after the specified time to exit sleep mode, return to normal operation. 15 16 18 19 20 21 23 24 25 26 28 29 31 32 33 34 DO0+ DO0DO1+ DO1DO2+ DO2DO3+ DO3DO4+ DO4DO5+ DO5DO6+ DO6DO7+ DO7- Output Differential Serial Outputs for channels 0 to 7. Each pair of outputs provides the serial output for the specific channel. The default output is reduced common mode LVDS format, but by programming the appropriate control registers, the output format can be changed to SLVS or LVDS. By programming TX_term (bit 4) in the LVDS Control register, it is possible to internally terminate these outputs with 100 ohm resistors. 36 37 BCLK+ BCLK- Output Bit clock. Differential output clock used for sampling the serial outputs. Information on timing can be seen in the ELECTRICAL CHARACTERISTICS. By programming TX_term (bit 4) in the LVDS Control register, it is possible to internally terminate these outputs with 100 ohm resistors. 5 DIGITAL I/O 4 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 PIN DESCRIPTIONS (continued) Pin No. Name Type Function and Connection 38 39 WCLK+ WCLK- Output Word Clock. Differential output frame clock. Information on timing can be seen in ELECTRICAL CHARACTERISTICS. By programming TX_term (bit 4) in the LVDS Control register, it is possible to internally terminate these outputs with 100 ohm resistors. 44 SDATA Input/Output SPI data input and output. This pin is used to send and receive SPI address and data information. The direction of the pin is controlled internally by the ADC based on the SPI protocol. 45 SCLK Input SPI clock. In order to use the SPI interface, a clock must be provided on this pin. See ELECTRICAL CHARACTERISTICS for SPI clock and timing information. 46 SSEL Input SPI chip select. This active low pin is used to enable the serial interface. 47 48 CLK+ (SE) CLK- Input Differential Input Clock. The input clock must be 45MHz. It is used by the PLL to generate the internal sampling clocks. A single ended clock can also be used, and should be connected to pin 47. 1, 8, 51, 54, 57, 60, 63, 66 VA Power Analog Power Supply. All pins should be connected to the same 1.2V supply, with voltage limits as in the Electrical Specification. POWER SUPPLY 0 AGND Ground Analog Ground Return. 11, 12, 42, 43 VD Power Digital Power Supply. Connect to 1.2V, with voltage limits as in the Electrical Specification. 13, 14, 22, 30, 40, 41 DGND Ground Digital and Output Driver Ground Return. 17, 27, 35 VDR Power Output Driver Power Supply. Can be connected to 1.2V – 1.8V, depending on application requirements. Voltage limits are described in more detail in the Electrical Specification. These devices have limited built-in ESD protection. The leads should be shorted together or the device placed in conductive foam during storage or handling to prevent electrostatic damage to the MOS gates. ABSOLUTE MAXIMUM RATINGS (1) (2) Supply Voltage (VA, VD) −0.3V to 1.4V IO Supply Voltage (VDR) -0.3 to 2.0V Voltage at Analog Inputs -0.3 to 1.4V Voltage at SPI Inputs -0.3 to 2.5V Input Current, VIN+, VIN- ±1mA Input Current, other pins ESD Susceptibility ±10mA Human Body Model 2000V Machine Model 200V Charged Device Mode Soldering Temperature 1,000V Infrared, 10 seconds 235°C −65°C to +125°C Storage Temperature Range Soldering process must comply with Texas Instruments' Reflow Temperature Profile specifications. Refer to www.ti.com/packaging. (1) (2) Absolute maximum ratings are those values beyond which the safety of the device cannot be ensured. They are not meant to imply that the device should be operated at these limits. All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 5 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 OPERATING RATINGS www.ti.com (1) (2) Operating Temperature Range 0°C to +70°C Supply Voltage (VA=VD) +1.16 to +1.26V IO Supply Voltage (VDR) +1.16 to +1.89V Minimum rise time on VA, VD, VDR at power-up 40µs Analog Inputs (VINN+, VINN-) -0.10 to VA SPI Inputs (SDATA, SSEL, SCLK) +1.16 to +2.50V VREFT (When using external reference) 475mV to 525mV VREFB AGND VCM Input Common Mode Range (Differential Input) 0.4V to 1.2V Ground Difference |AGND-DGND| (1) (2) <50mV Operating Ratings indicate conditions for which the device is specified to be functional, but do not specify specific performance limits. Specifications and test conditions are specified in the Electrical Characteristics section. Operation of the device beyond the Operating Ratings is not recommended as it may degrade the device lifetime. All voltages are measured with respect to GND = AGND = DGND = 0V, unless otherwise specified. ELECTRICAL CHARACTERISTICS Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Parameter Typical (1) Conditions Limits Units 12 Bits LSB Static Converter Characteristics Resolution (No missing codes ensured) INL Integral Non Linearity ±0.75 ±3.0 DNL Differential Non Linearity ±0.35 ±0.75 LSB PSE Positive Full Scale Error ±0.66 ±3 %FS NSE Negative Full Scale Error ±0.58 ±3 %FS GE Gain Error ±1.23 %FS Dynamic Converter Characteristics – Instant Overload Recovery (IOR) Off SNR Signal to Noise Ratio (2) SINAD Signal to Noise and Distortion (2) ENOB Effective Number of Bits THD Total Harmonic Distortion H2 Second Harmonic Distortion H3 Third Harmonic Distortion SFDR Spurious Free Dynamic Range IMD Intermodulation Distortion (1) (2) 6 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 69.3 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 69.0 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 68.5 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 68.5 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 11.1 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 11.1 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS -76 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS -78 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS -81 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS -79 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS -83 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS -97 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 77 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 78 dBc -70 dBFS f1 = 9.6MHz, VIN = -6dBFS f2 = 10.1MHz, VIN = -6dBFS 67.0 dBFS (min) 62.5 dBFS (min) dBFS dBFS 10.1 Bits (min) -65 dBc (max) Bits dBc -66 dBc (max) -67 dBc (max) 66 dBc (min) dBc dBc Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. This parameter is specified in dBFS. This indicates the value which would be obtained with a full-scale input. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 ELECTRICAL CHARACTERISTICS (continued) Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Typical (1) Limits Units fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 67.6 65.5 dBFS (min) fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 67.4 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 67.0 61.5 dBFS (min) fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 67.0 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 10.8 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 10.8 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS -76 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS -77 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS -80 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS -78 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS -83 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS -96 fCLK = 45MHz, fIN = 4.4MHz, VIN = -0.5dBFS 76 fCLK = 45MHz, fIN = 9.5MHz, VIN = -0.5dBFS 77 dBc -70 dBFS Parameter Conditions Dynamic Converter Characteristics – Instant Overload Recovery (IOR) On SNR Signal-to-Noise Ratio (3) SINAD Signal-to-Noise and Distortion (3) ENOB Effective Number of Bits THD Total Harmonic Disortion H2 Second Harmonic Distortion H3 Third Harmonic Distortion SFDR Spurious Free Dynamic Range IMD Intermodulation Distortion f1 = 9.6MHz, VIN = -6dBFS f2 = 10.1MHz, VIN = -6dBFS dBFS dBFS 9.9 Bits (min) -64 dBc (max) Bits dBc -65 dBc (max) -67 dBc (max) 65 dBc (min) dBc dBc Inter-channel Characteristics Channel to channel gain match Inter-channel Isolation VIN Full Scale Analog Input Voltage Maximum Input for Instantaneous Recovery from Overload RIN VCM ±0.1 fIN = 4.4MHz @ -0.1dBFS dB IOR mode off 2.10 VPP IOR mode on 1.56 VPP IOR mode on, fIN < 12MHz 2.61 Generated internally Input Impedance of VReft VREFOUT IA Internal Reference Voltage Analog Supply Current dB 110 Adjacent channel terminated Differential Input Impedance Internal Input Common Mode ±0.5 605 2.75 VPP (max) 2.4 kΩ (min) 2.8 kΩ (max) 574 mV (min) 637 mv (max) 480 mV (min) 520 mV (max) 20 Generated internally 502 kΩ fCLK = 45 MHz 147 163 mA (max) Power Characteristics ID Digital Supply Current fCLK = 45 MHz 123 147 mA (max) IDR Output Driver Supply Current LVDS, VDR = 1.8V, fCLK = 45 MHz 37 45 mA (max) Power consumption fCLK = 45 MHz, Equalizer off 364 412 mW (max) fCLK = 45 MHz, Equalizer on 409 470 mW (max) Sleep 40 50 mW (max) Power Down 5 15 mW (max) fCLK = 45 MHz, Equalizer off 46 mW fCLK = 45 MHz, Equalizer off 51 mW Per channel power consumption PSRR Power supply rejection ratio 100mV, 100kHz to 1MHz sinusoid on VA 65 dB CMRR Common mode rejection ratio 100mV, 1MHz sinusoid on VIN+ and VIN- 60 dB (3) This parameter is specified in dBFS. This indicates the value which would be obtained with a full-scale input. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 7 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com ELECTRICAL CHARACTERISTICS (continued) Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Parameter Conditions Typical (1) Limits Units Recovery time from sleep 12 µs (max) Recovery time from power down 18 ms (max) Recovery time from single channel power down 6 µs (max) DIGITAL DECIMATION FILTER CHARACTERISTICS Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Conditions (1) Parameter Typical (2 ) Pass Band fCLK = 45MHz 19.8 Pass Band Transition fCLK = 45MHz, -3dB attenuation 22.5 Pass Band Ripple fIN < 22MHz Stop Band Begin fCLK = 45MHz (1) (2) MHz 31.05 fIN < 22MHz, Equalizer on Units MHz ±0.01 Stop Band Attenuation Group Delay Ripple (peak to peak) Limits dB MHz 72 dB (min) 0.05 Samples (max) As the filter is a digital circuit, Digital Decimation Filter Characteristics scale with input clock frequency, fCLK. Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. EXTERNAL INPUT CLOCK AND PLL CHARACTERISTICS Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Parameter Conditions Typical (1) Limits Units 45 MHz (min) 45.5 MHz (max) 20 % (min) 80 % (max) External Input Clock fCLK Allowed input clock frequency tCLK Allowed input clock period 1/fCLK fCLK DC Allowed input clock duty cycle tJIN Allowed RMS clock jitter on input clock. Integrated from 10Hz to BWloop VCMCLK Allowed input clock common mode See VICLK Allowed input clock voltage swing 50 300 (2) Differential clock input. (2) ns fs rms 400 mV (min) VDR mV (max) 200 mV peak-peak (min) VDR mV peak-peak (max) 400 PLL f∑Δ (1) (2) 8 Over-sampling frequency 712 MHz (min) 728 MHz (max) Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. The combination of common mode and voltage swing on the clock input must ensure that the positive voltage peaks are not above VDR and the negative votlage peaks are not below AGND. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 EXTERNAL INPUT CLOCK AND PLL CHARACTERISTICS (continued) Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Parameter BWloop PLL Loop filter bandwidth tJ RMS Clock Jitter on Bit Clock output Conditions Typical (1) Limits Units Low Bandwidth 400 kHz High Bandwidth 1.4 MHz 2 ps peak DIGITAL INPUT AND OUTPUT CHARACTERISTICS Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Parameter Conditions Typical (1) Limits Units Digital Inputs (SDATA, SSEL, SCLK, SLEEP, RST) VIH Logical input “1” voltage Test run at 2MHz 900 mV (min) VIL Logical input “0” voltage Test run at 2MHz 300 mV (max) IIN1 Logical "1" Input current 1 µA (max) IIN0 Logical "0" Input current -1 µA (min) CIN Input Capacitance Specified by design 5 pF Digital Outputs (SDATA) VOH Logical output “1” voltage Test run at 2MHz, VDR = 1.2V VDR 850 mV (min) VOL Logical output “0” voltage Test run at 2MHz, VDR = 1.2V DRGND 250 mV (max) IOH Logical "1" Output Current -0.75 mA (min) IOL Logical "0" Output Current 1 mA (max) Output Drive Capability (SDATA) CLOAD Load capacitance R = 4.7 kohm, VDR > 1.8V 50 pF R = 4.7 kohm, VDR = 1.2V 50 pF Open Drain Mode VEXT Maximum allowed external voltage on Open Drain mode activated SDATA RSDATA Recommended SDATA external pull-up Open Drain mode activated resistor (1) 2.5 4.7 V kΩ Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 9 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com AC AND TIMING CHARACTERISTICS Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symbol Parameter Typical (1) Conditions Limits Units 44.5 MSPS (min) 45.5 MSPS (max) General ADC Output Timing Parameters fs Sample Rate Conversion Latency 19 Samples ns tBCLK Bit clock period fCLK = 45MHz 3.7 tWCLK Word clock period fCLK = 45MHz 22.2 tS Outputs Data Edge to Output Clock Edge Setup Time fCLK = 45MHz 800 325 ps (min) tH Output Data Edge to Output Clock Edge Hold Time fCLK = 45MHz 850 470 ps (min) tDV Output Data Valid Window fCLK = 45MHz 1380 885 ps (min) tR, tF Output Rise/Fall time fCLK = 45MHz 320 tDFS Data Edge to Word Edge Skew fCLK = 45MHz -295 (2) ns ps (min) -720 ps (min) 220 ps (max) LVDS Output Parameters, OCM = 0 (VDR = 1.2V) VOD Differential Output Voltage VOCM Output Common Mode Voltage LVDS mode, I_drive[1:0] = 00 (2.5mA), RL = 100Ω 270 LVDS mode, I_drive[1:0] = 01 (3.5mA), RL = 100Ω 370 LVDS mode, I_drive[1:0] = 11 (5.0mA), RL = 100Ω 520 LVDS mode, OCM = 0 (for VDR = 1.2V) 945 mV 318 mV (min) 428 mV (max) mV 895 mV (min) 1000 mV (max) LVDS Output Parameters, OCM = 1 (VDR = 1.8V) VOD Differential Output Voltage VOCM Output Common Mode Voltage LVDS mode, I_drive[1:0] = 00 (2.5mA), RL = 100Ω 265 LVDS mode, I_drive[1:0] = 01 (3.5mA), RL = 100Ω 350 LVDS mode, I_drive[1:0] = 11 (5.0mA), RL = 100Ω 485 LVDS mode, OCM = 1 1265 mV 280 mV (min) 417 mV (max) mV 1200 mV (min) 1340 mv (max) SLVS Output Parameters VOD Differential Output Voltage VOCM (1) (2) 10 Output Common Mode Voltage SLVS mode, I_drive[1:0] = 00 (2.5mA), RL = 100Ω 245 SLVS mode, I_drive[1:0] = 01 (3.5mA), RL = 100Ω 330 SLVS mode, I_drive[1:0] = 11 (5.0mA), RL = 100Ω 475 SLVS mode 225 mV 262 mV (min) 393 mV (max) mV 185 mV (min) 270 mV (max) Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. This parameter is specified by design and/or characterization and is not tested in production. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 AC AND TIMING CHARACTERISTICS (SERIAL INTERFACE) Unless otherwise specified, the following conditions apply: VA = VD = 1.2V; VDR = 1.2V; VREF = internal; RREF = 10kohm ±1%; CL = 5pF; 100Ω terminated at the receiver; fCLK = 45MHz; fS = 45MSPS. Boldface limits apply for TA = TMIN to TMAX; All other limits apply for TA = +25°C. Symb ol Parameter Typical (1) Conditions Limits Units Serial Interface tSSELS SSEL setup time 250 tSSELH SSEL hold time 250 ns tWS SDATA setup time, write transaction 250 15 ns (max) tWH SDATA hold time, write transaction 250 10 ns (max) tSCLK SCLK period 1 0.2 µs (min) tSCLKL SCLK low time ns 450 ns (min) tSCLKH SCLK high time 450 ns (min) tSCLKR SCLK rise time 50 ns tSCLKF 50 ns 500 ns SCLK fall time tSSELHI SSEL high time Applies to read and write transactions tRS SDATA valid setup time, read transaction 100 -5 ns (min) tRH SDATA valid hold time, read transaction 250 10 ns (min) (1) Typical figures are at TA = 25°C, and represent most likely parametric norms at the time of product characterization. The typical specifications are not ensured. TIMING DIAGRAMS System Clock tWCLK WCLK- Word Clock WCLK+ tBCLK BCLK+ Bit Clock BCLKtR tH tDV tF DOn+ Output data D10 D11 D0 D1 D2 D3 D4 D5 D6 D7 D8 D9 D10 D11 D0 D1 D2 D3 D4 D5 DOntS Sample n Sample n+1 Figure 2. LVDS/SLVS Output Timing Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 11 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com VDR VOCM + VOD/2 Differential output signal VOCM VOCM - VOD/2 0 Figure 3. Output Level Definitions tSCLK tSSELS tSCLKL tWH tSCLKH SCLK SDATA 90% 90% 10% 10% D7 R/W A7 tSSELH tSCLKF tSCLKR tWS D0 SSEL Figure 4. SPI Write Timing tRH tSSELHI tRS A7 , SDATA , SCLK D7 D0 SSEL Figure 5. SPI Read Timing 12 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 FUNCTIONAL DESCRIPTION The ADC12EU050 employs a number of unique strategies to provide a high performance multi-channel ADC that offers a significant power consumption reduction when compared to compteting architectures, as well as easing system level design. The ultra-low power performance of the ADC12EU050 is derived from the implementation of a fast continuous time sigma delta (CT∑Δ) modulator. Other features of this technology are: • Intrinsic anti-alias filter – the digital decimating filter provides an intrinsic anti-alias filter, eliminating external analog filter components, and simplifying multi-channel designs. • Instant overload recovery (IOR) system ensures extremely fast recovery from overload (<1ps), and no settling errors on return from overload. • Ultra-low inter-channel crosstalk. • Digital Equalizer provides low group delay and hence minimizes signal path delay variation. The major signal path blocks are: clipping control; CT∑Δ modulator; digital decimation filter; 12 bit serializer; and finally the LVDS/SLVS outputs. The PLL is critical to the operation of the ADC12EU050, and the PLL also provides the bit and word clock outputs. The SPI Control Interface gives uncomplicated user access to the ADC registers. 12-BIT SIGMA DELTA ADC CORE The ADC12EU050 comprises eight analog ADC channels using a CT∑Δ architecture, which provides very high dynamic performance with ultra-low power, while operating from a minimal 1.2V supply. The CT∑Δ ADC architecture uses a third order sigma delta modulator operating at a nominal 16 times oversampling rate in combination with a 3-bit quantizer. The modulator output is coupled to a power efficient digital decimation filter that decimates the high rate modulator output (720MHz) to provide output data at a 45 MSPS sample rate. A benefit of the CT∑Δ design is that the ADC requires no external anti-alias filters for most applications. This benefit is derived from a combination of the design of the analog sigma delta modulator and digital decimation filter. The digital filter achieves a steep transition band, and provides 72 dB of attenuation in the stop band. Using the digital equalizer, the signal transfer characteristics including phase performance can be optimized so as to minimise group delay variation. In applications where it is not required, the digital equalizer can be disabled to further save power. DIFFERENTIAL INPUT STAGE The ADC can capture high speed analog signals without resorting to a complex fast sample-and-hold amplifier (SHA) as used in pipeline ADCs. This is where CT∑Δ technology derives much of its power and performance benefits. This feature also assists external circuit design. In the case of the SHA inputs of pipeline ADCs, the effective input capacitance is time variant, requiring a powerful input buffer to drive to the resolution limits of the system. The input stage of the ADC is purely resistive (1.3kΩ single ended) driving into virtual earth. As a result the ADC12EU050 is extremely easy to drive as its input impedance is not complex. It also means that external lower power input buffering circuitry can used, and can be completely eliminated in some cases. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 13 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 CLK www.ti.com CLK VIN+ CLK CLK OPAMP VIN- CLK CLK Figure 6. SHA Input Stage VIN+ OPAMP VIN- Figure 7. Continuous Time Sigma Delta Input Stage INSTANT OVERLOAD RECOVERY The ADC12EU050 features an overload handling system which provides instantaneous recovery from signals driving the ADC inputs beyond the full-scale input range. The ADC can operate in two different modes. In the default ADC mode (IOR mode off) a full-scale input range of 2.10 VPP is supported, here the ADC operates with some inherent overload recovery time, similar to a conventional ADC. In the IOR mode, the ADC has a reduced 1.56 VPP full scale input range, but provides a significant benefit in that the ADC can now be driven by input voltages as high as 5 dB beyond the nominal full-scale (fIN < 12MHz), that is 2.75 VPP, and will recover instantaneously. In a number of applications this feature can help simplify input stage design and manufacturing set-up and calibration. The ADC12EU050 recovers immediately from overload with no missing codes and no settling time. The proprietary strategy used within the ADC12EU050 uses high speed patented clamp techniques to limit the input signal and keep it within the stable input range of the ADC. This process happens at a speed equivalent to the on-chip over-sampling rate of 720MHz. The advantage of this system is that it responds immediately to out of range signals. While the inputs are over-range the ADC outputs a full scale result. As the over-range input is removed the ADC adjusts to the input signal level and is able to provide sampled data instantaneously. The ADC’s behavior on emerging from overload is repeatable and independent of whether the input signal was positive or negative going at the point of overload. The diagram below shows a 5dB overloaded input (2.75 VPP versus 1.56 VPP Full scale), with 240,000 sample periods overlaid. There is no ringing and recovery from overload is instantaneous. 14 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 Figure 8. Instant Overload Recovery INTEGRATED PRECISION LC PLL The ADC12EU050 family includes an integrated high performance “clean up” phase locked loop (PLL), simplifying the need for a low jitter external clock. The PLL serves three important functions; it generates a highly accurate internal sampling clock source of up to 720 MHz; a clock for the LVDS serializers at 540 MHz; and it provides a low jitter clock for other internal components. With its jitter clean-up capability this PLL allows lower performance system clocks to be used. DIGITAL DECIMATION FILTER AND EQUALIZER The digital decimation filter is an integral part of the sigma delta architecture. It decimates the over-sampled data from the modulator down to the sample rate, and its extremely sharp low pass characteristic combined with the modulator’s broad band response provides the intrinsic anti-alias filter. The digital low pass filter exhibits 72dB of attenuation in the stop band. The following diagram shows the digital filter transfer function at 40MSPS, compared to a third order Butterworth transfer function. Due to the digital implementation of the filter, the filter parameters automatically scale with the ADC sampling frequency. Figure 9. Digital Filter Transfer Function Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 15 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com Such steep digital filters introduce group delay problems, but the ADC12EU050 includes a digital equalizer, which reduces group delay ripple variation to less than 0.05 samples. In applications where group delay is not of concern, the equalizer can be turned off through the SPI interface in order to save power. The following two diagrams show the group delay ripple of the digital decimation filter at 50MSPS, firstly with the equalizer disabled, and secondly with the equalizer enabled. Figure 10. Group Delay with Equalizer Off Figure 11. Group Delay with Equalizer On SERIAL DATA OUTPUTS Sampled data is transformed into high speed serial LVDS/SLVS output data streams. The low amplitude differential signal swings of LVDS/SLVS help to reduce digital system noise. It is possible to select between LVDS and SLVS modes by simple programming through the SPI control interface. The output common mode can also be programmed through the SPI control interface, allowing it to be adjusted based on the value of VDR. POWER MANAGEMENT MODES The ADC12EU050 operates normally at ultra-low power levels. In addition, several power management modes are provided: • Power Down (accessible through PD bit of Top Control Register) • Sleep (SLEEP pin, or SLEEP bit of Top Control Register) • Single channel power down (PD0-7 of ADC/LVDS Channel Power Down Register) Power Down is the lowest power consumption mode, but with a longer wake-up time than Sleep mode. In power down mode, all circuits in the chip are turned off, including the PLL, reference and bias circuits. Power consumption in Sleep mode is higher than in Power Down mode, but pin access (SLEEP pin) and fast wake-up enables duty cycle powering of the ADC. The device also allows channel by channel power-down through the ADC/LVDS Channel Power Down register. When a single channel is powered down, the sigma delta modulator, digital decimating filter and LVDS outputs for that channel will be shut off, with the corresponding single channel reduction in power consumption. SPI CONTROL INTERFACE The ADC12EU050 provides configurability via the serial control interface. This provides IOR mode control power management control, output configuration control, data output test patterns to provide LVDS/SLVS training sequences, as well as many other user configurable options. Full details of the SPI registers can be found in Programming Guide. The SPI pins (SDATA, SCLK, SSEL), as well as the pins RST and SLEEP, have been designed to operate with voltage levels up to 2.5V, despite the low 1.2V core voltage. As a result, no external level shift components are required for this control interface. 16 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 UNCORRELATED NOISE REFERENCE FOR EACH CHANNEL In many early multi-channel ADC designs, a single voltage reference was used to provide the reference level for each channel. Unfortunately, this ensures that the noise at each ADC’s reference terminal is cross correlated. Multi-channel systems often make use of a 3 dB processing gain increase that results from each channel doubling. Without a specific technique to prevent the reference terminals seeing correlated noise the expected 3 dB gain is compromised. In the case of the ADC12EU050, a unique system has been implemented to decorrelate the noise at each ADC channel. APPLICATION INFORMATION POWER-UP SEQUENCE The ADC12EU050 has three separate power supplies: Analog (VA), Digital (VD) and the output drive voltage ( VDR). The ADC contains a power on reset circuit, connected to VA, and so to ensure correct reset of both analog and digital logic of the ADC, the power supplies should be provided in the following order: 1. VDR 2. VD 3. VA If this order is not followed, then the user should issue a reset via the reset pin (RST) immediately after power up. Additionally, it is required that the rise time for each voltage supply is longer than the minimum rise time stated in the ELECTRICAL CHARACTERISTICS. There is no required sequence for powering down the ADC. ADC START-UP SEQUENCE After any reset, either power-on reset, software reset via SPI or hardware reset via the RST pin, the chip undergoes a series of internal calibrations and the PLL/VCO will lock to the external clock. After reset, the ADC12EU050’s registers have the default values shown in register tables. The registers can be programmed via the SPI after reset, even during the period while the chip is performing the internal calibrations mentioned in the previous paragraph. During reset and until the PLL is locked, the LVDS outputs will not provide valid data. Furthermore, the ADC has an inherent data conversion latency, which is related to the pipeline stages of the digital decimating filter. Until the data conversion latency has passed, the data outputs will be invalid. Thus the maximum time until valid sampled data is received at the outputs is: PLL lock time + ADC Latency Specific values for these times can be found in the ELECTRICAL CHARACTERISTICS. USING ADC LOW POWER MODES As explained previously in FUNCTIONAL DESCRIPTION, the ADC12EU050 offers several power management modes. Sleep mode offers the fastest wake-up time, and should be used in applications where duty cycle powering of the ADC is required. In this case it is recommended to toggle sleep mode via the SLEEP pin, which will give a faster cycle time than programming the SLEEP bit through the SPI, due to the extra time required to send a command through the SPI port. The Power Down mode is accessible via the SPI port. Due to the power-up time of the ADC coupled with the programming time of the SPI port, this mode should be used to power the chip down for longer time periods. Channel power down allows one or more channels to be turned off independently, with the corresponding power saving. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 17 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com CLOCK SELECTION CONSIDERATIONS The ADC12EU050 has an on-chip PLL, which simplifies the task of clock source selection and clock network design. Clock Input Connection The ADC is designed to accept either single ended or differential clock inputs. Furthermore, the clock source can be a sine or square wave. In order to obtain the best performance, a differential square wave clock should be used. When using a differential clock, the clock traces should be routed as 100Ω differential pairs, and terminated with a 100Ω resistor close to the chip. A single ended clock input should be connected to pin 47 (CLK+/SE), and pin 48 (CLK-) should be grounded. On-chip PLL The benefit of having an on chip PLL is that in most applications a high precision clock source is not required. The external clock's contribution to aperture jitter is reduced dramatically by the jitter clean-up properties of the PLL, which ensures that any RMS jitter outside of the PLL bandwidth is attenuated. The PLL also significantly relaxes the input clock duty cycle requirements, accepting input clock duty cycles of 20% to 80%. 40 40 20 20 0 0 GAIN (dB) GAIN (dB) The PLL offers two choices of bandwidth. For the majority of systems, the default bandwidth of 400kHz is suitable. If the system already contains a high performance clock, with excellent RMS jitter performance up to a 1.4MHz bandwidth, then the PLL’s high bandwidth mode may be used. -20 -40 -20 -40 -60 -60 Loop Bandwidth at 0.415 MHz Loop Bandwidth at 1.50 MHz -80 1 10 10 2 10 3 10 4 5 10 10 6 10 7 Loop Bandwidth at 0.380 MHz Loop Bandwidth at 1.280 MHz 8 10 -80 1 10 OFFSET (Hz) 10 2 10 3 10 4 5 10 10 6 10 7 8 10 OFFSET (Hz) Figure 12. PLL Phase Noise Transfer Function: fs = 40MHz Figure 13. PLL Phase Noise Transfer Function: fs = 50MHz On the input clock, excessive RMS jitter within the PLL bandwidth will be seen in the output spectrum as sidebands, or close in phase noise, around the fundamental signal. Input Clock Selection For systems which do not have a requirement for a high performance clock, any standard product 45MHz crystal oscillator will allow the ADC12EU050 to perform to specifications. If the system requires high performance clocks for other system components, then Texas Instruments' LMK family of clock conditioners are recommended. Output Clock Synchronization Across Multiple Chips In systems containing more than one ADC12EU050, it is often required that the timing of output samples is synchronized across the multiple chips. The PLL in the ADC12EU050 takes care of this automatically by aligning the output clocks with the input clock. The user must ensure, using correct board layout and clock buffering techniques, that the input clock to each ADC12EU050 is synchronized. If this is the case, then the output frame clocks will also be synchronized. This means that output samples are aligned. 18 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 ADC INPUT CONSIDERATIONS The ADC12EU050’s sigma delta architecture offers many flexible options for connecting input signals. In order to obtain maximum performance from the device, it is recommended to use a differential input connection. The device, however, also supports single ended analog input. Differential Input Configurations The ADC12EU050 can be driven either actively or passively. Transformer coupling provides another possibility for converting a single ended signal into a differential signal. The diagram below shows a transformer coupled input configuration. ADC Recommended transformer: Mini-circuits T1-6T VIN+ 1st stage of ÐÂ Modulator VIN- VCM Figure 14. Transformer Coupled Input Single Ended Input Configurations In cost sensitive applications, a single ended input may provide adequate performance, however ADC performance will degrade slightly. When using single ended inputs, the maximum input voltage allowed is 3dB less than the 2.10V full scale input. The diagram below shows a single ended input configuration. ADC VIN+ VIN- 1st stage of ÐÂ Modulator Figure 15. Single Ended Input Input Coupling and Common Mode Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 19 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com The ADC12EU050 internally generates a common mode of 0.62V. It is possible to provide input signals with other common modes however, the full scale input range of the ADC must be kept in mind. For this reason, it is recommended that the device inputs are AC coupled. The recommended capacitor value is 100nF. External Series Resistance Due to the purely resistive input circuit of the sigma delta architecture, the ADC12EU050 allows the user to scale down large input signals by adding external series resistors. The gain achieved by adding external resistors can be calculated as a simple voltage divider, as follows: VFS/VIN = 20 * log (RADC /( RADC + REXT)) dB (1) The diagram below shows this configuration, and defines the values in the equation above. ADC REXT Differential Input p VIN+ Differential Input n VIN- 1st stage of ÐÂ Modulator REXT Figure 16. External Series Resistance RADC, the input resistance of the ADC, is nominally 1.3kΩ. Due to manufacturing the value of this resistance can vary by up to 15%. This is not important for the operation of the ADC, since the ADC depends only on internal resistors being matched, but it should be taken into account when performing calculations. ADC OUTPUT CONSIDERATIONS The ADC12EU050 offers a variety of output settings in order to cater for different system design and integration needs. Output Driver Voltage, VDR The ADC output driver voltage, VDR, can be set between 1.2V and 1.8V. A VDR of 1.2V will offer the lowest power consumption. Because VDR can be varied, the ADC12EU050 provides, via the SPI registers, the ability to adjust the output common mode voltage. Output Modes And Output Common Mode Three different output modes are also supported: SLVS, LVDS and reduced common mode LVDS. SLVS and LVDS modes output data according to their respective specifications. Reduced common mode LVDS must be used when the output driver voltage, VDR, is 1.2V. The standard LVDS common mode voltage is 1.2V, which is obviously not feasible if VDR is 1.2V. Therefore, the output common mode voltage must be set to 1.0V by setting the bit OCM in the LVDS Control Register to 0. 20 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 VDR = 1.2V VOUT+ Optional internal 1005 termination VOUT- VIN- VIN+ VOCM = 1.0V Bias N Reduced Common Mode LVDS Half Bridge VDD Referenced Figure 17. Output Driver Circuit: Reduced Common Mode LVDS When VDR is 1.8V, the standard LVDS common mode voltage of 1.2V must be used, by setting OCM equal to 1. VDR = 1.8V VOUT+ Bias P Optional internal 1005 termination VOUT- VIN- VIN+ VOCM = 1.25V Bias N LVDS Classic full bridge Figure 18. Output Driver Circuit: LVDS SLVS mode offers the lowest power consumption, followed by reduced common mode LVDS then standard LVDS. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 21 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com VDR = 1.2V VOUT+ Bias P Optional internal 1005 termination VOUT- VIN- VIN+ VOCM = 175 mV SLVS Half Bridge VSS Referenced Figure 19. Output Driver Circuit: SLVS As well as the different output modes, the output drive current can also be controlled via the LVDS Control Register. The default output drive current is 2.5mA, but this can be increased to 3.5mA or 5mA, depending on output trace routing and receiver requirements. Power consumption of the ADC12EU050 will increase slightly as the output driver current is increased. Termination The final control feature available in the LVDS Control Register is the choice between internal and external 100Ω termination. Although the termination is recommended to be as close to the receiver as possible, in some cases it may be necessary or desirable to perform this termination at the transmitter. Internal 100Ω termination at the transmitter (the ADC12EU050) is enabled by setting the bit TX_term to 1. LVDS Output Training Sequences Often it is necessary to calibrate the LVDS receiver, for example an FPGA or DSP, so that skew between the eight ADC output channels is minimized. In order to simplify this process, the ADC12EU050 provides three LVDS training modes, where a pre-defined or custom pattern is output on all eight channels simultaneously. While a training mode is active, the word and bit clocks are output as usual. In order to select a training mode, the TSEL bits of the Decimator Control Register (16h) must be programmed via the SPI interface. There are two pre-defined training patterns, or a custom pattern can be loaded via the SPI into the Serializer Custom Pattern 0 and 1 Registers (10h and 12h). In order to return to normal ADC operation after skew calibration, the TSEL bits should be returned to their default value of 00. 22 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 ADC Outputs CH0 Decimator Output Training Sequence 1: 000000111111 CH0 Serializer DO0+ DO0- CH7 Serializer DO7+ DO7- Training Sequence 2: 101010101010 Training Sequence 3: Custom Pattern Serializer Custom Pattern Registers 10h and 11h TSEL[0] TSEL[1] CH7 Decimator Output From Decimator Control Register 16h Figure 20. LVDS Training Select operation USING IOR MODE As discussed in FUNCTIONAL DESCRIPTION, IOR mode provides instantaneous recovery from overload conditions, with no ringing and correct data output as soon as the input returns in range. Standard Use of IOR Mode The recommended way to enable IOR mode is by setting bit 4 (IOR) of the Modulator Overload Control register (04h). Setting this bit will enable IOR mode with the default settings for DGF in the Decimator Clipping Control register (14h) and OL in the Modulator Overload Control register (04h). Setting the IOR mode bit to 0 will restore DGF and OL to their default values, hence putting the chip back into ADC mode. As can be seen in ELECTRICAL CHARACTERISTICS, using IOR mode gives a slight reduction in SNR performance, and also a reduction of the full scale input range to 1.56Vpp differential. Advanced Use of IOR Mode The registers described above allow the user to customize IOR mode. In order to correctly set the DGF and OL values, it is necessary to understand how the IOR mode functions. The implementation of IOR mode in the ADC consists of analog and digital parts working in tandem. The analog clipping circuitry, controlled by OL, is designed to protect the sigma delta modulator from large signal inputs. Using an analog clamp, signals are soft-limited to the less than the 2.10Vpp full scale range of the modulator. OL gives the value at which the circuit will begin to clamp. The digital filter of the ADC12EU050 is where the full scale input range is selected and the hard limiting of the signal takes place. DGF selects the gain of the digital filter, and hence the new full scale input range of the ADC. In order to set a custom value for DGF, CGS, bit 7 of the Decimator Clipping Control register, must be set. The DGF can then be set, based on the application requirements. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 23 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com OL should then be set to a value approximately half-way between the new full scale input range (which was just selected by DGF) and the default full scale input range of 2.10Vpp. OL must be set to a value higher than DGF, otherwise the signal will be limited by the analog clipping circuitry, rather than the digtal circuitry, and overload recovery will be impacted. Input Output Analog Clipping Digital Saturation IOR Mode full scale input 1.56 Vpp differential Analog sigma delta modulator clips at voltage selected by OL register. This protects the Sigma-delta modulator from overload. Over-rage input, up to 5 dB above full scale. Digital Filter saturates at IOR mode full scale, determined by DGF register. Figure 21. IOR Mode Signal Modification THE VOLTAGE REFERENCE The ADC provides an on chip, ±5% tolerance voltage reference, together with all necessary biasing circuits and current sources. A 10kΩ (±1%) resistor must be connected between RREF and AGND in order to establish the biasing current of the ADC. The internal reference voltage, VREF, is available at the RREF pin. When using the internal reference, VREFT should be connected to AGND through a 100nF capacitor, while VREFB must be connected to AGND. Chip-to-chip gain matching between several ADC12EU050 ADCs can be improved by connecting the VREFT pins of the ADCs. This is show in the figure below. 10 k5 (± 1%) 10 k5 (± 1%) VREFB RREF VREFT ADC n VREFB RREF VREFT ADC 2 VREFB VREFT RREF ADC 1 10 k5 (± 1%) AGND plane Figure 22. Reference Sharing If a tighter tolerance reference is required for improved thermal stability, an external voltage reference can be connected between the VREFT and VREFB pins. The RREF resistor must be connected even when using an external reference. 24 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 DCAP CAPACITOR SELECTION The DCAP pin provides the capacitance for the low pass filter between the DAC bias block and the DAC in the sigma-delta modulator. The filter blocks noise from the DAC Bias block from entering the DAC. Any noise which passes through this filter will be seen in the spectrum as side skirts around the carrier. The filter circuit, which is a first order RC filter, is shown in the diagram below. ADC12EU050 ä? Modulator RDCAP DAC Bias DAC 1.5 k5 DCAP CDCAP AGND Figure 23. DCAP RC Filter The DCAP pin must be connected to AGND through a low leakage, minimum 100nF capacitor. If the application is especially sensitive to close to the carrier phase noise, then it is recommended to increase DCAP, up to a maximum of 10µF. For other applications where close to the carrier phase noise is not important, the capacitor can be kept small in order to reduce costs and minimise board space. The corner frequency of this filter is determined by the equation: f = 1/(2πRDCAPCDCAP) (2) BOARD LAYOUT CONSIDERATIONS Proper grounding, layout and routing are essential to ensure accurate conversion in any high speed ADC. Maintaining separate analog and digital areas of the board is recommended in order to achieve the specified performance. This includes using a split ground plane, since the significant digital portion of the chip can produce noise on the digital/IO ground (DGND). When designing the ADC12EU050 into a system, It is critical that the exposed pad is connected to analog ground (AGND). The exposed pad provides the analog ground connection for the ADC12EU050, and so this connection is required for electrical rather than thermal reasons. It is recommended to decouple the power supplies using a large capacitor (e.g. 47µF) for low frequency noise, and small capacitors (e.g. 100nF) placed close to each supply pin. Analog and digital supplies (VA and VD) may be provided from the same supply, however in this case it is recommended that the supplies are isolated from each other with a ferrite bead or inductor. If the IO driver supply (VDR ) is 1.2V, then it may also be taken from the same supply, with isolation as described above. The clock and data output traces, as well as the clock input trace (when using a differential input clock), should be routed as 100Ω impedance differential pairs. If not using the option for 100Ω internal termination, then the clock and data output trances should be terminated with a 100Ω resistor close to the receiver. If the system requires regulators to provide the ADC12EU050 1.2V operating voltage, Texas Instruments recommends the LP3878SD-ADJ Low Noise “Ceramic Stable” Adjustable Regulator or the LP3879 Low Noise “Ceramic Stable” Regulator. Datasheets for both parts are available from the Texas Instruments website. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 25 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com 10 µH 100 nF 100 nF 47 µF 100 nF 100 nF 100 nF 100 nF VDR 47 µF 47 µF 10 µH 10 µH VA VD Transformer drive circuit. Other possible drive circuits shown in Applications Information. 100 nF VA Pins 505 ADT1-6T VCM 100 nF 100 nF 45 MHz clock. See Applications Infomation for more information on clocking the ADC12EU050 VIN0+ VIN0- DO0+ DO0- 1005 VIN1+ VIN1- DO1+ DO1- 1005 VIN2+ VIN2VIN3+ VIN3- DO2+ DO2- 1005 DO3+ DO3- 1005 VIN4+ VIN4VIN5+ VIN5- DO4+ DO4- 1005 DO5+ DO5- 1005 VIN6+ VIN6VIN7+ VIN7- DO6+ DO6- 1005 DO7+ DO7- 1005 WCLK+ WCLK- 1005 BCLK+ BCLK- 1005 CLK+ (SE) CLK100 nF 10 k5 ±1% VDR VDR Pins VD Pins VREFT VREFB RREF Note: External 1005 termination on the ADC12EU050 is optional. Internal termination can be enabled via SPI. DCAP 10 µF RST SLEEP SSEL SCLK SDATA To SPI controller AGND DGND Figure 24. ADC12EU050 Application Diagram 26 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 Programming Guide THE SERIAL CONTROL INTERFACE The ADC12EU050 provides several user controlled functions which are accessed through a standard SPI compatible, 3 wire Serial Interface, as shown in the diagram below. output_enable SPI controller (Master) e.g. DSP, Microcontroller, FPGA serial_out serial_in SDATA clock SCLK chip_select_b SSEL ADC Figure 25. Three Wire Control Interface Wired OR mode is supported in order to connect multiple ADC12EU050 devices to one SPI Master. The clock and data buses are common to all ADC devices, and the chip select SSEL is used to control which SPI is currently active. The SPI master must have a unique pin available for each ADC’s SSEL. The diagram below illustrates the connection. VD SPI Controller (Master) output_enable serial_out serial_in clock e.g. DSP, Microcontroller, chip_select_b_1 FPGA chip_select_b_N SDIO Pads configured in open drain mode SDATA SCLK SSEL ADC SDATA SCLK ADC SSEL Figure 26. Multi-Wire Control Interface When connecting multiple devices, the SDATA pin must be set in Open Drain mode. Open Drain mode is enabled by setting the SPIOD bit in the Top Control Register of all connected ADC12EU050 devices. When SDATA is in open drain mode, the user must ensure that a pull-up resistor is connected to the SDATA bus. Further details on Open Drain mode are given in SDATA PAD OPEN DRAIN MODE. SERIAL CONTROL INTERFACE PROTOCOL Both read and write transactions are made up of eight address bits and eight data bits. The final address bit of the address phase determines whether the transaction will be a read transaction or a write transaction – logic level low for write, logic level high for read. The following diagram shows the protocol. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 27 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com SCLK SSEL SDATA A7 A6 A5 A4 A3 A2 A1 R/W D7 SDATA is driven from externally D6 D5 D4 D3 D2 D1 D0 If R/W = 1 (read), the SPI drives SDATA. If R/W = 0 (write), SDATA is driven from externally. Figure 27. Serial Control Interface Protocol The eight address bits, A[7:1] + R/W, are sent first. The data, D[7:0], is then sent for a write transaction, or D[7:0] is received for a read transaction. Address and data are sent and received with the most-significant-bit (MSB) first. The SPI is enabled using the active low input SSEL. If SSEL is high the SPI cannot be accessed, although SSEL is not a reset signal and registers will maintain their value when SSEL is toggled. SSEL must be held low during the entire transaction. Timing requirements for the Serial Interface are described in ELECTRICAL CHARACTERISTICS. SERIAL INTERFACE TRANSACTION CANCELLATION A transaction may be cancelled before the address and data stages are completed by toggling SSEL to high at any stage during an SPI access. This action is not recommended, as transaction cancellation during a write transaction may corrupt register contents and during a read transaction will result in incorrect data. After canceling a transaction with SSEL the ADC may be in an unknown state due to an incomplete and hence corrupted write to a register. It is therefore recommended to reset the chip via Software Reset (SRES) after a cancelled transaction. SDATA PAD OPEN DRAIN MODE If the SDATA voltage at the board level is required to be higher than the ADC12EU050’s VDR, the Open Drain mode should be used. In Open Drain mode, the ADC’s SDATA will pull the output low, and SDATA will be pulled up to the external level by a pull-up resistor connected to the board’s positive voltage rail, VEXT. The intended use of Open Drain mode is when the ADC, including VDR, is running at 1.2V, and a VEXT of 1.8V is required. Open Drain mode is enabled by setting the SPIOD bit in the Top Control Register via the Serial Interface. When in Open Drain mode, a pull-up resistor (RSDATA) must be connected between SDATA and VEXT. ELECTRICAL CHARACTERISTICS shows the required settings for VEXT and RSDATA. SERIAL CONTROL INTERFACE READ AND WRITE SPEED SCLK (pin 45) controls the speed of interaction with the ADC. The SPI interface supports write to and read from speeds as defined in the ELECTRICAL CHARACTERISTICS. SERIAL CONTROL INTERFACE REGISTER DESCRIPTIONS The following tables show the complete set of user accessible SPI registers, with descriptions of the functionality of each bit. Reset values of all registers are also described in the tables below. 28 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 Register Index Address b[7] b[6] b[5] b[4] b[3] b[2] b[1] b[0] Default Reserved CBR Reserved SRES SPIOD SLEEP PD 00h PD5 PD4 PD3 PD2 PD1 PD0 00h Reserved Reserved IOR OL[3] OL[2] OL[1] OL[0] 00h Reserved Reserved Reserved Reserved Reserved SHBW STCAL 00h 100HYS 50HYS 20HYS 10HYSOFF HYSOFF 00h Top Control Register 00h Reserved ADC / LVDS Channel Power Down Register 02h PD7 PD6 Modulator Overload Control Register 04h Reserved PLL Control Register 08h Reserved LVDS Input Clock Hysteresis 0Ah Reserved Reserved INVCLK Serializer Custom Pattern 0 Register 10h Custom Custom Custom Custom Custom Custom Custom Custom Pattern Pattern Pattern Pattern Pattern Pattern Pattern Pattern [7] [6] [5] [4] [3] [2] [1] [0] Custom Custom Custom Custom Pattern Pattern Pattern Pattern [11] [10] [9] [8] 00h Serializer Custom Pattern 1 Register 12h Reserved Reserved Reserved Reserved 00h Decimator Clipping Control Register 14h Reserved Reserved a[2] a[1] a[0] b[2] b[1] b[0] 00h Reserved Reserved EQON DFS MSB TSEL[1] TSEL[0] 00h Reserved Reserved TX_term I_drive[1] I_drive[0] OCM SLVS 00h ID [6] ID [5] ID [4] ID [3] ID [2] ID [1] ID [0] Decimator Control Register 16h Reserved LVDS Control Register 18h Reserved Chip ID Register 1Eh ID [7] Top Control Register • • • Address: 00h Attributes: Write Only Register 01h reads back contents of register 00h, if CBR is set. The Top Control Register is the basic initialization and control register for the device. b[7] Description b[6] Reserved Default 0 0 b[5] b[4] b[3] b[2] b[1] b[0] CBR Reserved SRES SPIOD SLEEP PD 0 0 0 0 0 0 Bit 7:6 5 HEX 00 h Description Reserved. Write as zero for future compatibility. CBR: Control Bus Read. When asserted register 00h (this register) can be read, but no other registers. When de-asserted all other registers can be read, but not register 00h. 0 Register 00h cannot be read from address 01h. All other registers can be read back. 1 Register 00h can be read from address 01h. All other registers cannot be read back. 4 Reserved: Write as zero for future compatibility. 3 SRES: Software Reset. When asserted the software reset will reset the whole device. SRES performs the same function as the hardware reset (RST pin). Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 29 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com Bit Description The SRES is self clearing in approximately 2µs. 2 0 Software Reset Inactive 1 Software Reset Active SPIOD: SPI Open Drain mode. 1 0 Digital Logic Output 1 Open Drain Mode. Enables SPI Driver to operate above VDR SLEEP: Sleep Mode. Powers down the device with the exception of the PLL and the reference blocks. The time to wake-up from sleep mode is < 10µs. 0 0 Sleep Mode Inactive 1 Sleep Mode Active PD: Power Down Mode. Completely powers down the device. The power up time is approximately 20ms. 0 PD Mode Inactive, device operates normally 1 PD Mode Active, device powered down ADC / LVDS Channel Power Down Register • • • Address: 02h Attributes: Write Only Register 03h reads back contents of register 02h The ADC/LVDS Channel Power Down Register provides the capability to independently power down each ADC channel. Description Default b[7] b[6] b[5] b[4] b[3] b[2] b[1] b[0] PD7 PD6 PD5 PD4 PD3 PD2 PD1 PD0 0 0 0 0 0 0 0 0 Bit 7 6 5 4 3 2 30 HEX 00 h Description PD7: Power Down Channel 7 0 Channel Active 1 Channel Power Down PD6: Power Down Channel 6 0 Channel Active 1 Channel Power Down PD5: Power Down Channel 0 Channel Active 1 Channel Power Down PD4: Power Down Channel 4 0 Channel Active 1 Channel Power Down PD3: Power Down Channel 3 0 Channel Active 1 Channel Power Down PD2: Power Down Channel 2 0 Channel Active 1 Channel Power Down Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 Bit Description 1 PD1: Power Down Channel 1 0 0 Channel Active 1 Channel Power Down PD0: Power Down Channel 0 0 Channel Active 1 Channel Power Down Modulator Overload Control Register • • • Address: 04h Attributes: Write Only Register 05h reads back contents of register 04h b[7] b[6] Description b[5] b[4] Reserved Default 0 0 b[3] b[2] 0 0 IOR 0 0 4 b[0] HEX 0 0 00 h OL[3:0] Bit 7:5 b[1] Description Reserved. Write as zero for future compatibility. IOR: Enable IOR Mode (Instant Overload Recovery) This bit can be used to quickly enable IOR mode with the default IOR settings for DGF (see register 14h) and OL. 3:0 0 IOR Mode Disabled 1 IOR Mode Enabled OL[3:0]: The bits define the differential peak voltage (in VPP) at which the analog input signal is clipped when in IOR mode. In IOR mode the analog clipping is set to 1.746 VPP. In the default ADC mode clipping of the analog input signal is disabled. Should it be decided to over-ride the default setting, it is important to follow the guidelines for setting OL, as described in APPLICATION INFORMATION. OL[3:0] Clipping Voltage VPP 0 (IOR Mode default) 1.746 0001 1.694 0010 1.64 0011 1.586 0100 1.534 0101 1.480 0110 1.426 0111 1.374 1000 2.172 1001 2.120 1010 2.066 1011 2.012 1100 1.960 1101 1.906 1110 1.852 1111 1.800 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 31 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com PLL Control Register • • • Address: 08h Attributes: Write Only Register 09h reads back contents of register 08h b[7] b[6] b[5] 0 0 0 Description b[4] b[3] b[2] 0 0 Reserved Default 0 Bit b[1] b[0] SHBW STCAL 0 0 HEX 00 h Description 7:2 Reserved. Write as zero for future compatibility. 1 SHBW: Set PLL to High Bandwidth. The selection of the PLL bandwidth permits to set the sensitivity of the PLL to input clock jitter. Less bandwidth decreases the sensitivity to input clock jitter. The PLL Bandwidth is related to the sampling frequency, the exact values of which can be found in ELECTRICAL CHARACTERISTICS. The PLL will pass any input clock jitter up to the PLL bandwidth, while jitter above the PLL bandwidth will be attenuated. Low bandwidth mode should be used for high jitter input clocks, while high bandwidth mode can be used for high-quality, low jitter input clocks. 0 0 PLL bandwidth is set to Low Bandwidth (400kHz). 1 PLL bandwidth is set to High Bandwidth (1.4MHz). STCAL: Start VCO calibration. The calibration can be manually started in order to assure that the frequency tuning margin is maximum, for example, in case of large temperature change during operation it can be useful to restart the calibration. 0 The VCO calibration starts automatically if a Loss of Lock is detected 1 The VCO calibration is restarted. LVDS Input Clock – Hysteresis • • • Address: 0Ah Attributes: Write Only Register 0Bh reads back contents of register 0Ah b[7] Description b[6] Reserved Default 0 0 b[5] b[4] b[3] INVCLK 100HYS 50HYS 20HYS 0 0 0 0 Bit 7:6 5 4 3 32 b[2] b[1] 10HYS OFF 0 b[0] HEX HYSOFF 0 00 h Description Reserved. Write as zero for future compatibility. INVCLK: Invert Input Reference Clock. This bit is used to invert the input clock. 0 Reference input clock not inverted. 1 Reference input clock inverted. 100HYS: Enable 100mV hysteresis. This bit enables 100mV hysteresis. It should be used for a CMOS input clock only. 0 Normal operation (10mV hysteresis) 1 100mV hysteresis (CMOS input clock only) 50HYS: Enable 50mV hysteresis. This bit enables 50mV hysteresis. It should be used for a CMOS input clock only. 0 Normal operation (10mV hysteresis) 1 50mV hysteresis. (CMOS input clock only) Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 Bit Description 2 20HYS: Enable 20mV hysteresis. This bit enables 20mV hysteresis. It should be used for an LVDS input clock only. 1 0 Normal operation (10mV hysteresis) 1 20mV hysteresis. (LVDS input clock only) 10HYSOFF: Disable 10mV hysteresis. 10mV hysteresis is the default setting. This bit is used to disable 10mV hysteresis, in the case where another hysteresis setting is desired, for example when using a CMOS input clock. 0 0 10mV hysteresis. (LVDS input clock only) 1 10mV hysteresis disabled. HYSOFF: Disable all hysteresis settings. This bit is used to disable all hysteresis settings. 0 Normal operation (10mV hysteresis) 1 All hysteresis settings disabled. Serializer Custom Pattern 0 Register • • • Address: 10h Attributes: Write Only Register 11h reads back contents of Register 10h This register in conjunction with User Register 12 provides storage for the custom de-skew pattern. See User Register 16 for a description of how this training sequence is used. b[7] b[6] b[5] Description b[4] b[3] b[2] b[1] b[0] HEX 0 0 0 00 h Custom Pattern [7:0] Default 0 0 0 0 0 Bit Description 7:0 Custom Pattern [7:0]. This pattern forms the lower byte of Custom Pattern [11:0] which is output by the serializer when the Training Sequence Select bits (bits 1:0) of the Decimator Control Register are set to select Training sequence 3. Serializer Custom Pattern 1 Register • • • Address: 12h Attributes: Write Only Register 13h reads back contents of Register 12h This register in conjunction with User Register 10 provides storage for the custom de-skew pattern. See User Register 16 for a description of how this training sequence is used. b[7] b[6] Description b[5] b[4] b[3] Reserved Default 0 0 b[2] b[1] b[0] HEX 0 00 h Custom Pattern [11:8] 0 0 0 Bit 0 0 Description 7:4 Reserved. Write as zero for future compatibility. 3:0 Custom Pattern [11:8]. This pattern forms the upper 4 bits of Custom Pattern [11:0] which is output by the serializer when the Training Sequence Select bits (bits 1:0) of the Decimator Control Register are set to select Training sequence 3. Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 33 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com Decimator Clipping Control Register • • • Address: 14h Attributes: Write Only Register 15h reads back contents of Register 14h Description Default b[7] b[6] CGS Reserved 0 0 b[5] b[4] b[3] b[2] 0 0 a[2:0] 0 b[1] b[0] HEX 0 00 h b[2:0] 0 0 Bit Description 7 CGS: Custom Gain Setting. This bit is used to override the automatic gain settings for ADC and IOR modes. If the user wishes to write a custom digital gain coefficient using a[2:0] and b[2:0] of this register, then the CGS bit must be set. 6 5:3 0 Normal operation Automatic gain settings used 1 Custom Gain Setting Gain setting from a[2:0] and b[2:0] used. Reserved. Write as zero for future compatibility. a[2:0]: Digital Gain Coefficient. In clipping mode the input range of an ADC channel is limited to 1.56Vpp. In ADC mode the input range is 2.10Vpp. The output of the digital filter has to be scaled according to the selected mode (the filter data has to be mapped in to the 12bit output data), the difference between 1.6Vpp and 2.2Vpp is -2.6dB, hence the digital filter gain has to be set to 2.6dB when in IOR mode and to 0dB when in clipping mode (default mode) . This is performed by setting a Digital Gain Factor which is calculated using the following formula: DGF = 32 + 4 x DGFa + DGFb 26 The mapping of the coefficient values for a[2:0] is as follows: 011 = Not used. Defaults to 2 010 = 2 001 = 1 000 = 0 111 = -1 110 = -2 101 = Not used. Defaults to -2 100 = Not used. Defaults to -2 The mapping of the coefficient values for b[2:0] is shown below. The table on the following page shows the available Digital Gain Coefficient settings. 2:0 b[2:0]: Digital Gain Coefficient. The mapping of the coefficient values for b[2:0] is as follows: 011 = Not used. Defaults to 2 010 = 2 001 = 1 000 = 0 111 = -1 110 = -2 101 = Not used. Defaults to -2 100 = Not used. Defaults to -2 34 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 Coefficent a[2:0] Coefficent b[2:0] Digital Gain (dB) Equivalent full scale input range (VPP) 010 010 4.16 1.30 010 001 3.95 1.33 010 000 3.74 1.37 010 111 3.52 1.40 010 110 3.29 1.44 001 001 3.06 1.48 001 000 2.82 1.52 001 111 2.58 1.56 001 110 2.33 1.61 000 001 2.07 1.65 000 000 1.80 1.71 000 111 1.53 1.76 000 110 1.24 1.82 111 001 0.95 1.88 111 000 0.64 1.95 111 111 0.33 2.02 111 110 000 2.10 110 001 -0.34 2.18 110 000 -0.70 2.28 110 111 -1.07 2.38 110 110 -1.45 2.48 IOR Mode default setting ADC mode default setting Decimator Control Register • • • Address: 16h Attributes: Write Only Register 17h reads back contents of register 16h b[7] Description b[6] b[5] Reserved Default 0 0 b[4] b[3] b[2] EQON DFS MSB 0 0 0 0 Bit 7:5 4 3 2 b[1] b[0] HEX TSEL[1:0] 0 0 00 h Description Reserved. Write as zero for future compatibility. EQON: Equalizer Enable. This bit is used to enable or disable the digital equalizer. The equalizer can be switched on in order to reduce the group delay of the output data, at the cost of increased power. 0 Equalizer disabled 1 Equalizer enabled DFS: Data Format Select. Selects the format, either Offset Binary or Twos Complement of the output data 0 2s Complement 1 Offset Binary MSB: Select the bit order of the LVDS output data stream 0 LSB first 1 MSB first Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 35 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com Bit Description 1:0 TSEL[1:0]: Training Sequence Select. These bits select the LVDS output data. The default mode of operation is where the filter output data is serialized. In the remaining modes the selected training sequence is repeatedly output from the serializer this allows the receiving data capture circuitry to perform the de-skewing process. One of three known words can be selected, the first two words are hard-coded in the block, the third one, the custom pattern, is written into User Registers 10h and 12h the Serializer Custom Pattern Registers. Note: The outputs bit-clock and word-clock are not affected by the value of the Training Sequence Select bits. 00 ADC data[11:0] 01 Training sequence 1: 000000111111 10 Training sequence 2: 101010101010 11 Training sequence 3: custom pattern LVDS Control Register • • • Address: 18h Attributes: Write Only Register 19h reads back contents of register 18h b[7] Description b[6] b[5] Reserved Default 0 0 b[4] b[3] TX_term 0 0 0 Bit 7:5 4 3:2 1 b[2] I_drive[1:0] 0 b[1] b[0] OCM SLVS 0 0 HEX 00 h Description Reserved. Write as zero for future compatibility. TX_term: Enable Internal 100 Ohm termination for data outputs. 0 Internal 100 ohm termination disabled 1 Internal 100 ohm termination enabled I_drive[1:0]: Controls the current drive of the data outputs. 00 2.5 mA 01 3.5 mA 10 Reserved 11 5 mA OCM: Output Common mode. Allows the output common mode to be shifted depending on the setting of VDR. If bit 0 of this register, SLVS, is set to 1 then changing OCM will have no impact on the output common mode. The output common mode in SLVS mode is fixed, as described in the ELECTRICAL CHARACTERISTICS. For VDR = 1.2V, OCM must be set to 0. For VDR = 1.8V, OCM must be set to 1. 0 0 Output Common Mode, VOCM = 1.0V 1 Output Common Mode, VOCM = 1.25V SLVS: Select the format for output data, either LVDS or SLVS. The differences in timing and electrical specifications between the two modes can be seen in the ELECTRICAL CHARACTERISTICS. If this bit is set to 1 (SLVS mode), OCM has no effect and the output common mode will be set for SLVS as described in the ELECTRICAL CHARACTERISTICS. When LVDS mode is selected, the output common mode must be selected using the OCM bit of this register. 36 0 LVDS Mode 1 SLVS Mode Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 ADC12EU050 www.ti.com SNAS444I – JANUARY 2008 – REVISED APRIL 2013 Chip ID Register • • Address: 1Eh Attributes: Read Only b[7] b[6] b[5] b[4] Description b[3] b[2] b[1] b[0] HEX 0 0 0 00 h ID [7:0] Default 0 0 0 0 Bit 7:0 0 Description ID[7:0]: Chip ID Register. Reading from this register will provide the chip version. The expected Chip ID for the ADC12EU050 is 12.4. X = ID[7]*8 + ID[6]*4 + ID[5]*2 + ID[4] Y = ID[3]*8 + ID[2]*4 + ID[1]*2 + ID[0] Chip ID = Version X.Y Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 37 ADC12EU050 SNAS444I – JANUARY 2008 – REVISED APRIL 2013 www.ti.com REVISION HISTORY Changes from Revision H (April 2013) to Revision I • 38 Page Changed layout of National Data Sheet to TI format .......................................................................................................... 37 Submit Documentation Feedback Copyright © 2008–2013, Texas Instruments Incorporated Product Folder Links: ADC12EU050 PACKAGE OPTION ADDENDUM www.ti.com 13-Sep-2014 PACKAGING INFORMATION Orderable Device Status (1) ADC12EU050CIPLQ/NOPB ACTIVE Package Type Package Pins Package Drawing Qty VQFN NKE 68 168 Eco Plan Lead/Ball Finish MSL Peak Temp (2) (6) (3) Green (RoHS & no Sb/Br) CU SN Level-4-260C-72 HR Op Temp (°C) Device Marking (4/5) -40 to 85 12EU050P (1) The marketing status values are defined as follows: ACTIVE: Product device recommended for new designs. LIFEBUY: TI has announced that the device will be discontinued, and a lifetime-buy period is in effect. NRND: Not recommended for new designs. Device is in production to support existing customers, but TI does not recommend using this part in a new design. PREVIEW: Device has been announced but is not in production. Samples may or may not be available. OBSOLETE: TI has discontinued the production of the device. (2) Eco Plan - The planned eco-friendly classification: Pb-Free (RoHS), Pb-Free (RoHS Exempt), or Green (RoHS & no Sb/Br) - please check http://www.ti.com/productcontent for the latest availability information and additional product content details. TBD: The Pb-Free/Green conversion plan has not been defined. Pb-Free (RoHS): TI's terms "Lead-Free" or "Pb-Free" mean semiconductor products that are compatible with the current RoHS requirements for all 6 substances, including the requirement that lead not exceed 0.1% by weight in homogeneous materials. Where designed to be soldered at high temperatures, TI Pb-Free products are suitable for use in specified lead-free processes. Pb-Free (RoHS Exempt): This component has a RoHS exemption for either 1) lead-based flip-chip solder bumps used between the die and package, or 2) lead-based die adhesive used between the die and leadframe. The component is otherwise considered Pb-Free (RoHS compatible) as defined above. Green (RoHS & no Sb/Br): TI defines "Green" to mean Pb-Free (RoHS compatible), and free of Bromine (Br) and Antimony (Sb) based flame retardants (Br or Sb do not exceed 0.1% by weight in homogeneous material) (3) MSL, Peak Temp. - The Moisture Sensitivity Level rating according to the JEDEC industry standard classifications, and peak solder temperature. (4) There may be additional marking, which relates to the logo, the lot trace code information, or the environmental category on the device. (5) Multiple Device Markings will be inside parentheses. Only one Device Marking contained in parentheses and separated by a "~" will appear on a device. If a line is indented then it is a continuation of the previous line and the two combined represent the entire Device Marking for that device. (6) Lead/Ball Finish - Orderable Devices may have multiple material finish options. Finish options are separated by a vertical ruled line. Lead/Ball Finish values may wrap to two lines if the finish value exceeds the maximum column width. Important Information and Disclaimer:The information provided on this page represents TI's knowledge and belief as of the date that it is provided. TI bases its knowledge and belief on information provided by third parties, and makes no representation or warranty as to the accuracy of such information. Efforts are underway to better integrate information from third parties. TI has taken and continues to take reasonable steps to provide representative and accurate information but may not have conducted destructive testing or chemical analysis on incoming materials and chemicals. TI and TI suppliers consider certain information to be proprietary, and thus CAS numbers and other limited information may not be available for release. In no event shall TI's liability arising out of such information exceed the total purchase price of the TI part(s) at issue in this document sold by TI to Customer on an annual basis. Addendum-Page 1 Samples PACKAGE OPTION ADDENDUM www.ti.com 13-Sep-2014 Addendum-Page 2 PACKAGE OUTLINE NKE0068A VQFN - 0.9 mm max height SCALE 1.700 PLASTIC QUAD FLATPACK - NO LEAD 10.1 9.9 B A PIN 1 ID 10.1 9.9 0.9 MAX C SEATING PLANE 7.7 0.1 4X (45 X0.42) 18 34 17 35 SYMM 4X 8 1 64X 0.5 0.1 C 0.05 0.00 (0.2) 51 52 68 PIN 1 ID (OPTIONAL) SYMM 68X 0.7 0.5 68X 0.3 0.2 0.1 0.05 C A C B 4214820/A 12/2014 NOTES: 1. All linear dimensions are in millimeters. Any dimensions in parenthesis are for reference only. Dimensioning and tolerancing per ASME Y14.5M. 2. This drawing is subject to change without notice. 3. The package thermal pad must be soldered to the printed circuit board for thermal and mechanical performance. www.ti.com EXAMPLE BOARD LAYOUT NKE0068A VQFN - 0.9 mm max height PLASTIC QUAD FLATPACK - NO LEAD ( 7.7) SYMM 68X (0.8) (1.19) TYP 52 68 68X (0.25) 1 51 (1.19) TYP 64X (0.5) SYMM (9.6) ( 0.2) TYP VIA 35 17 34 18 (9.6) LAND PATTERN EXAMPLE SCALE:8X 0.07 MAX ALL AROUND 0.07 MIN ALL AROUND SOLDER MASK OPENING METAL SOLDER MASK OPENING NON SOLDER MASK DEFINED (PREFERRED) METAL UNDER SOLDER MASK SOLDER MASK DEFINED SOLDER MASK DETAILS 4214820/A 12/2014 NOTES: (continued) 4. This package is designed to be soldered to a thermal pad on the board. For more information, see Texas Instruments literature number SLUA271 (www.ti.com/lit/slua271). www.ti.com EXAMPLE STENCIL DESIGN NKE0068A VQFN - 0.9 mm max height PLASTIC QUAD FLATPACK - NO LEAD (9.6) (1.19) TYP 68X (0.8) 68 36X ( 0.99) 52 68X (0.25) 1 51 (1.19) TYP 64X (0.5) SYMM (9.6) METAL TYP 35 17 18 34 SYMM SOLDER PASTE EXAMPLE BASED ON 0.125 mm THICK STENCIL EXPOSED PAD 60% PRINTED SOLDER COVERAGE BY AREA SCALE:8X 4214820/A 12/2014 NOTES: (continued) 5. Laser cutting apertures with trapezoidal walls and rounded corners may offer better paste release. IPC-7525 may have alternate design recommendations. www.ti.com IMPORTANT NOTICE Texas Instruments Incorporated and its subsidiaries (TI) reserve the right to make corrections, enhancements, improvements and other changes to its semiconductor products and services per JESD46, latest issue, and to discontinue any product or service per JESD48, latest issue. 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