FUNCTIONAL BLOCK DIAGRAMS APPLICATIONS General-purpose multichannel isolation Serial peripheral interface (SPI)/data converter isolation Industrial field bus isolation VDD1 1 GND1 2 VIA 3 VIB 4 VIC 5 NIC 6 DISABLE1 7 GND1 8 The ADuM130D/ADuM130E/ADuM131D/ADuM131E data channels are independent and are available in a variety of configurations with a withstand voltage rating of 3.0 kV rms or 3.75 kV rms (see the Ordering Guide). The devices operate with the supply voltage on either side ranging from 1.8 V to 5 V, providing compatibility with lower voltage systems as well as enabling voltage translation functionality across the isolation barrier. 1 16 VDD2 ENCODE DECODE 15 GND2 14 VOA ENCODE DECODE 13 VOB ENCODE DECODE 12 VOC 11 NIC 10 NIC 9 GND2 NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. Figure 1. ADuM130D Functional Block Diagram 1 ADuM130E 2 16 VDD2 15 GND2 3 ENCODE DECODE 14 VOA 4 ENCODE DECODE 13 VOB ENCODE DECODE 12 VOC 11 NIC 5 NIC 6 NIC 7 GND1 8 10 VE2 9 GND2 NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. 13348-002 VDD1 GND1 VIA VIB VIC Figure 2. ADuM130E Functional Block Diagram VDD1 GND1 VIA VIB VOC 1 ADuM131D 2 16 VDD2 15 GND2 3 ENCODE DECODE 14 VOA 4 ENCODE DECODE DECODE ENCODE 13 VOB 12 VIC 5 NIC 6 DISABLE1 7 GND1 8 11 NIC 10 DISABLE2 9 GND2 NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. Figure 3. ADuM131D Functional Block Diagram VDD1 GND1 VIA VIB VOC GENERAL DESCRIPTION The ADuM130D/ADuM130E/ADuM131D/ADuM131E1 are triple-channel digital isolators based on Analog Devices, Inc., iCoupler® technology. Combining high speed, complementary metal-oxide semiconductor (CMOS) and monolithic air core transformer technology, these isolation components provide outstanding performance characteristics superior to alternatives such as optocoupler devices and other integrated couplers. The maximum propagation delay is 13 ns with a pulse width distortion of less than 3 ns at 5 V operation. Channel matching is tight at 3.0 ns maximum. ADuM130D 13348-101 High common-mode transient immunity: 100 kV/μs High robustness to radiated and conducted noise Low propagation delay: 13 ns maximum for 5 V operation, 15 ns maximum for 1.8 V operation 150 Mbps maximum guaranteed data rate Safety and regulatory approvals (pending) UL recognition 3000 V rms/3750 V rms for 1 minute per UL 1577 CSA Component Acceptance Notice 5A VDE certificate of conformity DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 VIORM = 849 V peak CQC certification per GB4943.1-2011 Backward compatibility ADuM130E1/ADuM131E1 pin-compatible with ADuM1300/ADuM1301 Low dynamic power consumption 1.8 V to 5 V level translation High temperature operation: 125°C Fail-safe high or low options 16-lead, RoHS compliant, SOIC package 13348-001 FEATURES 1 ADuM131E 2 3 ENCODE DECODE 4 ENCODE DECODE DECODE ENCODE 5 NIC 6 VE1 7 GND1 8 16 VDD2 15 GND2 14 VOA 13 VOB 12 VIC 11 NIC 10 VE2 9 GND2 NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. 13348-102 Data Sheet 3.0 kV RMS/3.75 kV RMS Triple-Channel Digital Isolators ADuM130D/ADuM130E/ADuM131D/ADuM131E Figure 4. ADuM131E Functional Block Diagram Unlike other optocoupler alternatives, dc correctness is ensured in the absence of input logic transitions. Two different fail-safe options are available, in which the outputs transition to a predetermined state when the input power supply is not applied or the inputs are disabled. The ADuM130E1/ADuM131E1 are pincompatible with the ADuM1300/ADuM1301. Protected by U.S. Patents 5,952,849; 6,873,065; 6,903,578; and 7,075,329. Other patents are pending. Rev. A Document Feedback Information furnished by Analog Devices is believed to be accurate and reliable. However, no responsibility is assumed by Analog Devices for its use, nor for any infringements of patents or other rights of third parties that may result from its use. Specifications subject to change without notice. No license is granted by implication or otherwise under any patent or patent rights of Analog Devices. Trademarks and registered trademarks are the property of their respective owners. One Technology Way, P.O. Box 9106, Norwood, MA 02062-9106, U.S.A. Tel: 781.329.4700 ©2015 Analog Devices, Inc. All rights reserved. Technical Support www.analog.com ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet TABLE OF CONTENTS Features .............................................................................................. 1 Recommended Operating Conditions .................................... 12 Applications ....................................................................................... 1 Absolute Maximum Ratings ......................................................... 13 General Description ......................................................................... 1 ESD Caution................................................................................ 13 Functional Block Diagrams ............................................................. 1 Truth Tables................................................................................. 14 Revision History ............................................................................... 2 Pin Configurations and Function Descriptions ......................... 15 Specifications..................................................................................... 3 Typical Performance Characteristics ........................................... 17 Electrical Characteristics—5 V Operation................................ 3 Applications Information .............................................................. 18 Electrical Characteristics—3.3 V Operation ............................ 4 Overview ..................................................................................... 18 Electrical Characteristics—2.5 V Operation ............................ 6 Printed Circuit Board (PCB) Layout ....................................... 18 Electrical Characteristics—1.8 V Operation ............................ 7 Propagation Delay Related Parameters ................................... 19 Insulation and Safety Related Specifications ............................ 9 Jitter Measurement ..................................................................... 19 Package Characteristics ............................................................... 9 Insulation Lifetime ..................................................................... 19 Regulatory Information ............................................................. 10 Outline Dimensions ....................................................................... 21 DIN V VDE V 0884-10 (VDE V 0884-10) Insulation Characteristics ............................................................................ 11 Ordering Guide .......................................................................... 22 REVISION HISTORY 11/15—Rev. 0 to Rev. A Added 16-Lead, Narrow Body SOIC Package ................ Universal Changes to Title, Features Section, and General Description Section ................................................................................................ 1 Added Table 9; Renumbered Sequentially .................................... 9 Changes to Table 10 and Table 11 .................................................. 9 Added Table 12 ............................................................................... 10 Changes to Table 13 ........................................................................ 10 Changes to Table 15 Title............................................................... 12 Added Figure 5; Renumbered Sequentially ................................ 12 Changes to Table 17 and Table 19 ................................................ 13 Added Table 18 ............................................................................... 13 Updated Outline Dimensions ....................................................... 21 Changes to Ordering Guide .......................................................... 22 7/15—Revision 0: Initial Version Rev. A | Page 2 of 22 Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E SPECIFICATIONS ELECTRICAL CHARACTERISTICS—5 V OPERATION All typical specifications are at TA = 25°C, VDD1 = VDD2 = 5 V. Minimum/maximum specifications apply over the entire recommended operation range of 4.5 V ≤ VDD1 ≤ 5.5 V, 4.5 V ≤ VDD2 ≤ 5.5 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals. Table 1. Parameter SWITCHING SPECIFICATIONS Pulse Width Data Rate 1 Propagation Delay Pulse Width Distortion Change vs. Temperature Propagation Delay Skew Channel Matching Codirectional Opposing Direction Jitter Symbol Min PW 6.6 150 4.8 tPHL, tPLH PWD 7.2 0.5 1.5 tPSK Max Unit Test Conditions/Comments 13 3 ns Mbps ns ns ps/°C ns Within pulse width distortion (PWD) limit Within PWD limit 50% input to 50% output |tPLH − tPHL| 6.1 tPSKCD tPSKOD 0.5 0.5 630 80 DC SPECIFICATIONS Input Threshold Logic High Logic Low Output Voltage Logic High VIH VIL 0.7 × VDDx VOH VDDx − 0.1 VDDx − 0.4 Logic Low VOL Input Current per Channel VE2 Enable Input Pull-Up Current DISABLE1 Input Pull-Down Current Tristate Output Current per Channel Quiescent Supply Current ADuM130D/ADuM130E Typ 3.0 3.0 0.3 × VDDx VDDx VDDx − 0.2 0.0 0.2 +0.01 −3 9 +0.01 IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) ns ns ps p-p ps rms Between any two devices at the same temperature, voltage, and load See the Jitter Measurement section See the Jitter Measurement section V V V V IOx 2 = −20 µA, VIx = VIxH 3 IOx2 = −4 mA, VIx = VIxH3 15 +10 V V µA µA µA µA IOx2 = 20 µA, VIx = VIxL 4 IOx2 = 4 mA, VIx = VIxL4 0 V ≤ VIx ≤ VDDx VE2 = 0 V DISABLE1 = VDDx 0 V ≤ VOx ≤ VDDx 1.35 1.73 9.7 1.87 2.6 2.9 15.2 3.0 mA mA mA mA VI 5 = 0 (E0, D0), 1 (E1, D1) 6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) 1.62 1.61 7.4 5.34 2.7 2.8 11.4 7.2 mA mA mA mA VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDDI (D) IDDO (D) UVLO VDDxUV+ VDDxUV− VDDxUVH 0.01 0.02 mA/Mbps mA/Mbps Inputs switching, 50% duty cycle Inputs switching, 50% duty cycle 1.6 1.5 0.1 V V V II IPU IPD IOZ −10 −10 −10 0.1 0.4 +10 ADuM131D/ADuM131E Dynamic Supply Current Dynamic Input Dynamic Output Undervoltage Lockout Positive VDDx Threshold Negative VDDx Threshold VDDx Hysteresis Rev. A | Page 3 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E Parameter AC SPECIFICATIONS Output Rise/Fall Time Common-Mode Transient Immunity 7 Symbol Min Typ tR/tF |CMH| 75 |CML| 75 Data Sheet Max Unit Test Conditions/Comments 2.5 100 ns kV/µs 100 kV/µs 10% to 90% VIx = VDDx, VCM = 1000 V, transient magnitude = 800 V VIx = 0 V, VCM = 1000 V, transient magnitude = 800 V 150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible. IOx is the Channel x output current, where x = A, B, or C. VIxH is the input side logic high. 4 VIxL is the input side logic low. 5 VI is the voltage input. 6 E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section. 7 |CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode voltage edges. 1 2 3 Table 2. Total Supply Current vs. Data Throughput Parameter SUPPLY CURRENT ADuM130D/ADuM130E Supply Current Side 1 Supply Current Side 2 ADuM131D/ADuM131E Supply Current Side 1 Supply Current Side 2 Symbol Min 1 Mbps Typ Max Min 25 Mbps Typ Max Min 100 Mbps Typ Max Unit IDD1 IDD2 5.6 1.9 9.0 3.7 6.3 3.1 9.8 4.9 9.4 6.8 14.3 10 mA mA IDD1 IDD2 4.6 3.6 7.2 5.8 5.5 4.6 8.3 6.8 8.8 8.0 11.9 11.3 mA mA ELECTRICAL CHARACTERISTICS—3.3 V OPERATION All typical specifications are at TA = 25°C, VDD1 = VDD2 = 3.3 V. Minimum/maximum specifications apply over the entire recommended operation range: 3.0 V ≤ VDD1 ≤ 3.6 V, 3.0 V ≤ VDD2 ≤ 3.6 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals. Table 3. Parameter SWITCHING SPECIFICATIONS Pulse Width Data Rate 1 Propagation Delay Pulse Width Distortion Change vs. Temperature Propagation Delay Skew Channel Matching Codirectional Opposing Direction Jitter DC SPECIFICATIONS Input Threshold Logic High Logic Low Symbol Min PW 6.6 150 4.8 tPHL, tPLH PWD Typ 6.8 0.7 1.5 tPSK Unit Test Conditions/Comments 14 3 ns Mbps ns ns ps/°C ns Within PWD limit Within PWD limit 50% input to 50% output |tPLH − tPHL| 7.5 tPSKCD tPSKOD VIH VIL Max 0.7 0.7 640 75 3.0 3.0 0.7 × VDDx 0.3 × VDDx Rev. A | Page 4 of 22 ns ns ps p-p ps rms V V Between any two devices at the same temperature, voltage, and load See the Jitter Measurement section See the Jitter Measurement section Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E Parameter Output Voltage Logic High Logic Low Symbol Min Typ VOH VDDx − 0.1 VDDx − 0.4 VDDx VDDx − 0.2 0.0 0.2 +0.01 −3 9 +0.01 VOL Input Current per Channel VE2 Enable Input Pull-Up Current DISABLE1 Input Pull-Down Current Tristate Output Current per Channel II IPU IPD IOZ −10 −10 −10 Max Unit Test Conditions/Comments 15 +10 V V V V µA µA µA µA IOx 2 = −20 µA, VIx = VIxH 3 IOx2 = −2 mA, VIx = VIxH3 IOx2 = 20 µA, VIx = VIxL 4 IOx2 = 2 mA, VIx = VIxL4 0 V ≤ VIx ≤ VDDx VE2 = 0 V DISABLE1 = VDDx 0 V ≤ VOx ≤ VDDx 0.1 0.4 +10 Quiescent Supply Current ADuM130D/ADuM130E IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) 1.25 1.65 9.57 1.79 2.5 2.8 15.0 2.9 mA mA mA mA VI 5 = 0 (E0, D0), 1 (E1, D1) 6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) 1.52 1.52 7.28 5.24 2.6 2.6 11.3 7.1 mA mA mA mA VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDDI (D) IDDO (D) UVLO VDDxUV+ VDDxUV− VDDxUVH 0.01 0.01 mA/Mbps mA/Mbps Inputs switching, 50% duty cycle Inputs switching, 50% duty cycle 1.6 1.5 0.1 V V V ADuM131D/ADuM131E Dynamic Supply Current Dynamic Input Dynamic Output Undervoltage Lockout Positive VDDx Threshold Negative VDDx Threshold VDDx Hysteresis AC SPECIFICATIONS Output Rise/Fall Time Common-Mode Transient Immunity 7 tR/tF |CMH| 75 2.5 100 ns kV/µs |CML| 75 100 kV/µs 10% to 90% VIx = VDDx, VCM = 1000 V, transient magnitude = 800 V VIx = 0 V, VCM = 1000 V, transient magnitude = 800 V 150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible. IOx is the Channel x output current, where x = A, B, or C. 3 VIxH is the input side logic high. 4 VIxL is the input side logic low. 5 VI is the voltage input. 6 E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section. 7 |CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode voltage edges. 1 2 Table 4. Total Supply Current vs. Data Throughput Parameter SUPPLY CURRENT ADuM130D/ADuM130E Supply Current Side 1 Supply Current Side 2 ADuM131D/ADuM131E Supply Current Side 1 Supply Current Side 2 Symbol Min 1 Mbps Typ Max Min 25 Mbps Typ Max Min 100 Mbps Typ Max Unit IDD1 IDD2 5.4 1.8 8.8 3.6 6.0 2.9 9.4 4.7 8.5 6.2 12.7 8.4 mA mA IDD1 IDD2 4.4 3.4 7.1 5.6 5.2 4.3 8.0 6.5 8.1 7.4 10.7 9.5 mA mA Rev. A | Page 5 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet ELECTRICAL CHARACTERISTICS—2.5 V OPERATION All typical specifications are at TA = 25°C, VDD1 = VDD2 = 2.5 V. Minimum/maximum specifications apply over the entire recommended operation range: 2.25 V ≤ VDD1 ≤ 2.75 V, 2.25 V ≤ VDD2 ≤ 2.75 V, −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals. Table 5. Parameter SWITCHING SPECIFICATIONS Pulse Width Data Rate 1 Propagation Delay Pulse Width Distortion Change vs. Temperature Propagation Delay Skew Channel Matching Codirectional Opposing Direction Jitter Symbol Min PW 6.6 150 5.0 tPHL, tPLH PWD Typ 7.0 0.7 1.5 tPSK tPSKCD tPSKOD 0.7 0.7 770 160 VIH VIL 0.7 × VDDx VOH VDDx − 0.1 VDDx − 0.4 Logic Low VOL II IPU IPD IOZ Unit Test Conditions/Comments 14 3 ns Mbps ns ns ps/°C ns Within PWD limit Within PWD limit 50% input to 50% output |tPLH − tPHL| 6.8 DC SPECIFICATIONS Input Threshold Logic High Logic Low Output Voltage Logic High Input Current per Channel VE2 Enable Input Pull-Up Current DISABLE1 Input Pull-Down Current Tristate Output Current per Channel Quiescent Supply Current ADuM130D/ADuM130E Max 3.0 3.0 0.3 × VDDx −10 −10 −10 VDDx VDDx − 0.2 0.0 0.2 +0.01 −3 9 +0.01 ns ns ps p-p ps rms Between any two devices at the same temperature, voltage, load See the Jitter Measurement section See the Jitter Measurement section V V 15 +10 V V V V µA µA µA µA IOx 2 = −20 µA, VIx = VIxH 3 IOx2 = −2 mA, VIx = VIxH3 IOx2 = 20 µA, VIx = VIxL 4 IOx2 = 2 mA, VIx = VIxL4 0 V ≤ VIx ≤ VDDx VE2 = 0 V DISABLE1 = VDDx 0 V ≤ VOx ≤ VDDx 0.1 0.4 +10 IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) 1.2 1.61 9.52 1.76 2.4 2.7 14.9 2.8 mA mA mA mA VI 5 = 0 (E0, D0), 1 (E1, D1) 6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) 1.47 1.48 7.23 5.19 2.5 2.5 11.2 7.0 mA mA mA mA VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDDI (D) IDDO (D) 0.01 0.01 mA/Mbps mA/Mbps Inputs switching, 50% duty cycle Inputs switching, 50% duty cycle VDDxUV+ VDDxUV− VDDxUVH 1.6 1.5 0.1 V V V ADuM131D/ADuM131E Dynamic Supply Current Dynamic Input Dynamic Output Undervoltage Lockout Positive VDDx Threshold Negative VDDx Threshold VDDx Hysteresis Rev. A | Page 6 of 22 Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E Parameter AC SPECIFICATIONS Output Rise/Fall Time Common-Mode Transient Immunity 7 Symbol Min Typ tR/tF |CMH| 75 |CML| 75 Max Unit Test Conditions/Comments 2.5 100 ns kV/µs 100 kV/µs 10% to 90% VIx = VDDx, VCM = 1000 V, transient magnitude = 800 V VIx = 0 V, VCM = 1000 V, transient magnitude = 800 V 150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible. IOx is the Channel x output current, where x = A, B, or C. VIxH is the input side logic high. 4 VIxL is the input side logic low. 5 VI is the voltage input. 6 E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section. 7 |CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode voltage edges. 1 2 3 Table 6. Total Supply Current vs. Data Throughput Parameter SUPPLY CURRENT ADuM130E/ADuM130D Supply Current Side 1 Supply Current Side 2 ADuM131E/ADuM131D Supply Current Side 1 Supply Current Side 2 Symbol 1 Mbps Typ Max Min Min 25 Mbps Typ Max Min 100 Mbps Typ Max Unit IDD1 IDD2 5.3 1.8 8.7 3.6 5.9 2.6 9.3 4.4 8.2 5.2 12.3 7.4 mA mA IDD1 IDD2 4.4 3.4 7.1 5.6 5.0 4.1 7.8 6.3 7.5 6.6 10.1 8.7 mA mA ELECTRICAL CHARACTERISTICS—1.8 V OPERATION All typical specifications are at TA = 25°C, VDD1 = VDD2 = 1.8 V. Minimum/maximum specifications apply over the entire recommended operation range: 1.7 V ≤ VDD1 ≤ 1.9 V, 1.7 V ≤ VDD2 ≤ 1.9 V, and −40°C ≤ TA ≤ +125°C, unless otherwise noted. Switching specifications are tested with CL = 15 pF and CMOS signal levels, unless otherwise noted. Supply currents are specified with 50% duty cycle signals. Table 7. Parameter SWITCHING SPECIFICATIONS Pulse Width Data Rate 1 Propagation Delay Pulse Width Distortion Change vs. Temperature Propagation Delay Skew Channel Matching Codirectional Opposing Direction Jitter DC SPECIFICATIONS Input Threshold Logic High Logic Low Output Voltage Logic High Symbol Min PW 6.6 150 5.8 tPHL, tPLH PWD Typ 8.7 0.7 1.5 tPSK Max Unit Test Conditions/Comments 15 3 ns Mbps ns ns ps/°C ns Within PWD limit Within PWD limit 50% input to 50% output |tPLH − tPHL| 7.0 tPSKCD tPSKOD 0.7 0.7 600 90 VIH VIL 0.7 × VDDx VOH VDDx − 0.1 VDDx − 0.4 3.0 3.0 0.3 × VDDx VDDx VDDx − 0.2 Rev. A | Page 7 of 22 ns ns ps p-p ps rms Between any two devices at the same temperature, voltage, and load See the Jitter Measurement section See the Jitter Measurement section V V V V IOx 2 = −20 µA, VIx = VIxH 3 IOx2 = −2 mA, VIx = VIxH3 ADuM130D/ADuM130E/ADuM131D/ADuM131E Parameter Logic Low Input Current per Channel VE2 Enable Input Pull-Up Current DISABLE1 Input Pull-Down Current Tristate Output Current per Channel Quiescent Supply Current ADuM130D/ADuM130E Symbol VOL Min II IPU IPD IOZ −10 −10 Data Sheet Typ 0.0 0.2 +0.01 −3 9 +0.01 Max 0.1 0.4 +10 15 +10 Unit V V µA µA µA µA Test Conditions/Comments IOx2 = 20 µA, VIx = VIxL 4 IOx2 = 2 mA, VIx = VIxL4 0 V ≤ VIx ≤ VDDx VE2 = 0 V DISABLE1 = VDDx 0 V ≤ VOx ≤ VDDx IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) 1.15 1.58 9.41 1.72 2.3 2.6 14.8 2.7 mA mA mA mA VI 5 = 0 (E0, D0), 1 (E1, D1) 6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDD1 (Q) IDD2 (Q) IDD1 (Q) IDD2 (Q) 1.42 1.44 7.15 5.13 2.4 2.4 11.1 6.9 mA mA mA mA VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 0 (E0, D0), 1 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 VI5 = 1 (E0, D0), 0 (E1, D1)6 IDDI (D) IDDO (D) UVLO VDDxUV+ VDDxUV− VDDxUVH 0.01 0.01 mA/Mbps mA/Mbps Inputs switching, 50% duty cycle Inputs switching, 50% duty cycle 1.6 1.5 0.1 V V V −10 ADuM131D/ADuM131E Dynamic Supply Current Dynamic Input Dynamic Output Undervoltage Lockout Positive VDDx Threshold Negative VDDx Threshold VDDx Hysteresis AC SPECIFICATIONS Output Rise/Fall Time Common-Mode Transient Immunity 7 tR/tF |CMH| 75 2.5 100 ns kV/µs |CML| 75 100 kV/µs 10% to 90% VIx = VDDx, VCM = 1000 V, transient magnitude = 800 V VIx = 0 V, VCM = 1000 V, transient magnitude = 800 V 150 Mbps is the highest data rate that can be guaranteed, although higher data rates are possible. IOx is the Channel x output current, where x = A, B, or C. 3 VIxH is the input side logic high. 4 VIxL is the input side logic low. 5 VI is the voltage input. 6 E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section. 7 |CMH| is the maximum common-mode voltage slew rate that can be sustained while maintaining the voltage output (VO) > 0.8 VDDx. |CML| is the maximum commonmode voltage slew rate that can be sustained while maintaining VOx > 0.8 V. The common-mode voltage slew rates apply to both rising and falling common-mode voltage edges. 1 2 Table 8. Total Supply Current vs. Data Throughput Parameter SUPPLY CURRENT ADuM130D/ADuM130E Supply Current Side 1 Supply Current Side 2 ADuM131D/ADuM131E Supply Current Side 1 Supply Current Side 2 Symbol Min 1 Mbps Typ Max Min 25 Mbps Typ Max Min 100 Mbps Typ Max Unit IDD1 IDD2 5.2 1.7 8.6 3.5 5.8 2.5 9.3 4.3 8.1 5.2 12.2 7.3 mA mA IDD1 IDD2 4.3 3.3 7.0 5.5 4.9 4.0 7.7 6.2 7.26 6.5 10.0 8.6 mA mA Rev. A | Page 8 of 22 Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E INSULATION AND SAFETY RELATED SPECIFICATIONS For additional information, see www.analog.com/icouplersafety. Table 9. R-16 Narrow Body [SOIC_N] Package Parameter Rated Dielectric Insulation Voltage Minimum External Air Gap (Clearance) Symbol L (I01) Value 3000 4.0 Unit V rms mm min Minimum External Tracking (Creepage) L (I02) 4.0 mm min Minimum Clearance in the Plane of the Printed Circuit Board (PCB Clearance) L (PCB) 4.5 mm min CTI 25.5 >400 II μm min V Unit V rms mm min Minimum Internal Gap (Internal Clearance) Tracking Resistance (Comparative Tracking Index) Material Group Test Conditions/Comments 1-minute duration Measured from input terminals to output terminals, shortest distance through air Measured from input terminals to output terminals, shortest distance path along body Measured from input terminals to output terminals, shortest distance through air, line of sight, in the PCB mounting plane Insulation distance through insulation DIN IEC 112/VDE 0303 Part 1 Material Group (DIN VDE 0110, 1/89, Table 1) Table 10. RW-16 Wide Body [SOIC_W] Package Parameter Rated Dielectric Insulation Voltage Minimum External Air Gap (Clearance) Symbol L (I01) Value 3750 7.8 Minimum External Tracking (Creepage) L (I02) 7.8 mm min Minimum Clearance in the Plane of the Printed Circuit Board (PCB Clearance) L (PCB) 8.1 mm min CTI 25.5 >400 II μm min V Minimum Internal Gap (Internal Clearance) Tracking Resistance (Comparative Tracking Index) Material Group Test Conditions/Comments 1-minute duration Measured from input terminals to output terminals, shortest distance through air Measured from input terminals to output terminals, shortest distance path along body Measured from input terminals to output terminals, shortest distance through air, line of sight, in the PCB mounting plane Insulation distance through insulation DIN IEC 112/VDE 0303 Part 1 Material Group (DIN VDE 0110, 1/89, Table 1) PACKAGE CHARACTERISTICS Table 11. Parameter Resistance (Input to Output) 1 Capacitance (Input to Output)1 Input Capacitance 2 IC Junction to Ambient Thermal Resistance R-16 Narrow Body [SOIC_N] Package RW-16 Wide Body [SOIC_W] Package 1 2 Symbol RI-O CI-O CI θJA θJA Min Typ 1013 2.2 4.0 76 45 Max Unit Ω pF pF Test Conditions/Comments °C/W °C/W Thermocouple located at center of package underside Thermocouple located at center of package underside f = 1 MHz The device is considered a 2-terminal device: Pin 1 through Pin 8 are shorted together, and Pin 9 through Pin 16 are shorted together. Input capacitance is from any input data pin to ground. Rev. A | Page 9 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet REGULATORY INFORMATION See Table 19 and the Insulation Lifetime section for details regarding recommended maximum working voltages for specific crossisolation waveforms and insulation levels. Table 12. R-16 Narrow Body [SOIC_N] Package UL (Pending) Recognized Under UL 1577 Component Recognition Program 1 Single Protection, 3000 V rms Isolation Voltage Double Protection, 3000 V rms Isolation Voltage File E214100 CSA (Pending) Approved under CSA Component Acceptance Notice 5A VDE (Pending) Certified according to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 2 CQC (Pending) Certified under CQC11-471543-2012 CSA 60950-1-07+A1+A2 and IEC 60950-1, second edition, +A1+A2: Basic insulation at 400 V rms (565 V peak) Reinforced insulation at 200 V rms (283 V peak) IEC 60601-1 Edition 3.1: Basic insulation (one means of patient protection (1 MOPP)), 250 V rms (354 V peak) CSA 61010-1-12 and IEC 61010-1 third edition: Basic insulation at 300 V rms mains, 400 V rms secondary (565 V peak) Reinforced insulation at 300 V rms mains, 200 V secondary (282 V peak) File 205078 Reinforced insulation, VIORM = 565 V peak, VIOSM = 6000 V peak Basic insulation, VIORM = 565 V peak, VIOSM = 10 kV peak GB4943.1-2011: File 2471900-4880-0001 Basic insulation at 770 V rms (1089 V peak) Reinforced insulation at 385 V rms (545 V peak) Tropical climate, altitude ≤5000 m File (pending) In accordance with UL 1577, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the R-16 narrow body [SOIC_N] package is proof tested by applying an insulation test voltage ≥ 3600 V rms for 1 sec. 2 In accordance with DIN V VDE V 0884-10, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the R-16 narrow body [SOIC_N] package is proof tested by applying an insulation test voltage ≥ 1059 V peak for 1 sec (partial discharge detection limit = 5 pC). The * marking branded on the component designates DIN V VDE V 0884-10 approval. 1 Table 13. RW-16 Wide Body [SOIC_W] Package UL (Pending) Recognized Under UL 1577 Component Recognition Program 1 Single Protection, 3750 V rms Isolation Voltage Double Protection, 3750 V rms Isolation Voltage File E214100 CSA (Pending) Approved under CSA Component Acceptance Notice 5A VDE (Pending) Certified according to DIN V VDE V 0884-10 (VDE V 0884-10):2006-12 2 CQC (Pending) Certified under CQC11-471543-2012 CSA 60950-1-07+A1+A2 and IEC 60950-1, second edition, +A1+A2: Basic insulation at 780 V rms (1103 V peak) Reinforced insulation at 390 V rms (552 V peak) IEC 60601-1 Edition 3.1: basic insulation (1 means of patient protection (MOPP)), 490 V rms (693 V peak) CSA 61010-1-12 and IEC 61010-1 third edition: Basic insulation at 300 V rms mains, 780 V secondary (1103 V peak) Reinforced insulation at 300 V rms mains, 390 V secondary (552 V peak) File 205078 Reinforced insulation, VIORM = 849 V peak, VIOSM = 6000 V peak Basic insulation, VIORM = 849 V peak, VIOSM = 10 kV peak GB4943.1-2011 File 2471900-4880-0001 Basic insulation at 780 V rms (1103 V peak) Reinforced insulation at 390 V rms (552 V peak) Tropical climate, altitude ≤5000 m File (pending) In accordance with UL 1577, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the RW-16 wide body [SOIC_W] package is proof tested by applying an insulation test voltage ≥ 4500 V rms for 1 sec. 2 In accordance with DIN V VDE V 0884-10, each ADuM130D/ADuM130E/ADuM131D/ADuM131E in the RW-16 wide body [SOIC_W] package is proof tested by applying an insulation test voltage ≥ 1592 V peak for 1 sec (partial discharge detection limit = 5 pC). The * marking branded on the component designates DIN V VDE V 0884-10 approval. 1 Rev. A | Page 10 of 22 Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E DIN V VDE V 0884-10 (VDE V 0884-10) INSULATION CHARACTERISTICS These isolators are suitable for reinforced electrical isolation only within the safety limit data. Protective circuits ensure the maintenance of the safety data. The * marking on packages denotes DIN V VDE V 0884-10 approval. Table 14. R-16 Narrow Body [SOIC_N] Package Description Installation Classification per DIN VDE 0110 For Rated Mains Voltage ≤ 150 V rms For Rated Mains Voltage ≤ 300 V rms For Rated Mains Voltage ≤ 600 V rms Climatic Classification Pollution Degree per DIN VDE 0110, Table 1 Maximum Working Insulation Voltage Input to Output Test Voltage, Method B1 Input to Output Test Voltage, Method A After Environmental Tests Subgroup 1 After Input and/or Safety Test Subgroup 2 and Subgroup 3 Highest Allowable Overvoltage Surge Isolation Voltage Basic Surge Isolation Voltage Reinforced Safety Limiting Values Maximum Junction Temperature Total Power Dissipation at 25°C Insulation Resistance at TS Test Conditions/Comments VIORM × 1.875 = Vpd (m), 100% production test, tini = tm = 1 sec, partial discharge < 5 pC Symbol Characteristic Unit VIORM Vpd (m) I to IV I to IV I to III 40/125/21 2 565 1059 V peak V peak 848 V peak 678 V peak VIOTM VIOSM 4200 10000 V peak V peak VIOSM 6000 V peak TS PS RS 150 1.64 >109 °C W Ω Vpd (m) VIORM × 1.5 = Vpd (m), tini = 60 sec, tm = 10 sec, partial discharge < 5 pC VIORM × 1.2 = Vpd (m), tini = 60 sec, tm = 10 sec, partial discharge < 5 pC V peak = 10 kV, 1.2 µs rise time, 50 µs, 50% fall time V peak = 10 kV, 1.2 µs rise time, 50 µs, 50% fall time Maximum value allowed in the event of a failure (see Figure 5) VIO = 500 V Rev. A | Page 11 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet Table 15. RW-16 Wide Body [SOIC_W] Package Description Installation Classification per DIN VDE 0110 For Rated Mains Voltage ≤ 150 V rms For Rated Mains Voltage ≤ 300 V rms For Rated Mains Voltage ≤ 600 V rms Climatic Classification Pollution Degree per DIN VDE 0110, Table 1 Maximum Working Insulation Voltage Input to Output Test Voltage, Method B1 Test Conditions/Comments VIORM × 1.875 = Vpd (m), 100% production test, tini = tm = 1 sec, partial discharge < 5 pC Input to Output Test Voltage, Method A After Environmental Tests Subgroup 1 Characteristic Unit VIORM Vpd (m) I to IV I to IV I to III 40/125/21 2 849 1592 V peak V peak 1274 V peak 1019 V peak VIOTM 5300 V peak VIOSM VIOSM 12,000 6000 V peak V peak TS PS RS 150 2.78 >109 °C W Ω Vpd (m) VIORM × 1.5 = Vpd (m), tini = 60 sec, tm = 10 sec, partial discharge < 5 pC VIORM × 1.2 = Vpd (m), tini = 60 sec, tm = 10 sec, partial discharge < 5 pC After Input and/or Safety Test Subgroup 2 and Subgroup 3 Highest Allowable Overvoltage Surge Isolation Voltage Basic Reinforced Safety Limiting Values VPEAK = 12.8 kV, 1.2 µs rise time, 50 µs, 50% fall time VPEAK = 10 kV, 1.2 µs rise time, 50 µs, 50% fall time Maximum value allowed in the event of a failure (see Figure 6) Maximum Junction Temperature Total Power Dissipation at 25°C Insulation Resistance at TS VIO = 500 V 3.0 1.8 1.6 SAFE LIMITING POWER (W) 2.5 1.4 1.2 1.0 0.8 0.6 0.4 2.0 1.5 1.0 0.5 0 0 0 50 100 150 AMBIENT TEMPERATURE (°C) 200 Figure 5. Thermal Derating Curve for R-16 Narrow Body [SOIC_N] Package, Dependence of Safety Limiting Values with Ambient Temperature per DIN V VDE V 0884-10 0 50 100 150 200 AMBIENT TEMPERATURE (°C) 13348-003 0.2 13348-202 SAFE OPERATING PVDD1 , PVDDA OR PVDDB POWER (W) Symbol Figure 6. Thermal Derating Curve, Dependence of Safety Limiting Values with Ambient Temperature per DIN V VDE V 0884-10 RECOMMENDED OPERATING CONDITIONS Table 16. Parameter Operating Temperature Supply Voltages Input Signal Rise and Fall Times Rev. A | Page 12 of 22 Symbol TA VDD1, VDD2 Rating −40°C to +125°C 1.7 V to 5.5 V 1.0 ms Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E ABSOLUTE MAXIMUM RATINGS TA = 25°C, unless otherwise noted. Stresses at or above those listed under Absolute Maximum Ratings may cause permanent damage to the product. This is a stress rating only; functional operation of the product at these or any other conditions above those indicated in the operational section of this specification is not implied. Operation beyond the maximum operating conditions for extended periods may affect product reliability. Table 17. Parameter Storage Temperature (TST) Range Ambient Operating Temperature (TA) Range Supply Voltages (VDD1, VDD2) Input Voltages (VIA, VIB, VIC, VE1, VE2, DISABLE1, DISABLE2) Output Voltages (VOA, VOB, VOC) Average Output Current per Pin3 Side 1 Output Current (IO1) Side 2 Output Current (IO2) Common-Mode Transients4 Rating −65°C to +150°C −40°C to +125°C −0.5 V to +7.0 V −0.5 V to VDDI1 + 0.5 V ESD CAUTION −0.5 V to VDDO2 + 0.5 V −10 mA to +10 mA −10 mA to +10 mA −150 kV/μs to +150 kV/μs VDDI is the input side supply voltage. VDDO is the output side supply voltage. 3 See Figure 5 for the R-16 narrow body [SOIC_N] package or Figure 6 for the RW-16 wide body [SOIC_W] package for the maximum rated current values for various ambient temperatures. 4 Refers to the common-mode transients across the insulation barrier. Common-mode transients exceeding the absolute maximum ratings may cause latch-up or permanent damage. 1 2 Table 18. Maximum Continuous Working Voltage R-16 Narrow Body [SOIC_N] Package 1 Parameter AC Voltage Bipolar Waveform Basic Insulation Reinforced Insulation Unipolar Waveform Basic Insulation Reinforced Insulation DC Voltage Basic Insulation Reinforced Insulation 1 2 Rating Constraint 2 789 V peak 403 V peak Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 909 V peak 469 V peak Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 558 V peak 285 V peak Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 Refers to the continuous voltage magnitude imposed across the isolation barrier. See the Insulation Lifetime section for more details. Insulation lifetime for the specified test condition is greater than 50 years. Table 19. Maximum Continuous Working Voltage RW-16 Wide Body [SOIC_W] Package 1 Parameter AC Voltage Bipolar Waveform Basic Insulation Reinforced Insulation Unipolar Waveform Basic Insulation Reinforced Insulation DC Voltage Basic Insulation Reinforced Insulation 1 2 Rating Constraint 2 849 V peak 768 V peak 50-year minimum insulation lifetime Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 1698 V peak 768 V peak 50-year minimum insulation lifetime Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 1092 V peak 543 V peak Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 Lifetime limited by package creepage maximum approved working voltage per IEC 60950-1 Refers to the continuous voltage magnitude imposed across the isolation barrier. See the Insulation Lifetime section for more details. Insulation lifetime for the specified test condition is greater than 50 years. Rev. A | Page 13 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet TRUTH TABLES Table 20. ADuM130D/ADuM131D Truth Table (Positive Logic) VIx Input1, 2 L H X X4 X4 VDISABLEx Input1, 2 L or NC L or NC H X4 X4 VDDI State2 Powered Powered Powered Unpowered Powered VDDO State2 Powered Powered Powered Powered Unpowered Default Low (D0), VOx Output1, 2, 3 L H L L Indeterminate Default High (D1), VOx Output1, 2, 3 L H H H Indeterminate Test Conditions/Comments Normal operation Normal operation Inputs disabled, fail-safe output Fail-safe output 1 L means low, H means high, X means don’t care, and NC means not connected. VIx and VOx refer to the input and output signals of a given channel (A, B, or C). VDISABLEx refers to the input disable signal on the same side as the VIx inputs. VDDI and VDDO refer to the supply voltages on the input and output sides of the given channel, respectively. 3 E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section. 4 Input pins (VIx, DISABLE1, and DISABLE2) on the same side as an unpowered supply must be in a low state to avoid powering the device through its ESD protection circuitry. 2 Table 21. ADuM130E/ADuM131E Truth Table (Positive Logic) VIx Input1, 2 L H X L X4 X4 VEx Input1, 2 H or NC H or NC L H or NC L4 X4 VDDI State2 Powered Powered Powered Unpowered Unpowered Powered VDDO State2 Powered Powered Powered Powered Powered Unpowered Default Low (E0), VOx Output1, 2, 3 L H Z L Z Indeterminate 1 Default High (E1), VOx Output1, 2, 3 L H Z H Z Indeterminate Test Conditions/Comments Normal operation Normal operation Outputs disabled Fail-safe output Outputs disabled L means low, H means high, X means don’t care, and NC means not connected, and Z means high impedance. VIx and VOx refer to the input and output signals of a given channel (A, B, C, or D). VEx refers to the output enable signal on the same side as the VOx outputs. VDDI and VDDO refer to the supply voltages on the input and output sides of the given channel, respectively. 3 E0 refers to the ADuM130E0/ADuM131E0 models, D0 refers to the ADuM130D0/ADuM131D0 models, E1 refers to the ADuM130E1/ADuM131E1 models, and D1 refers to the ADuM130D1/ADuM131D1 models. See the Ordering Guide section. 4 Input pins (VIx, VE1, and VE2) on the same side as an unpowered supply must be in a low state to avoid powering the device through its ESD protection circuitry. 2 Rev. A | Page 14 of 22 Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E PIN CONFIGURATIONS AND FUNCTION DESCRIPTIONS VDD1 1 16 VDD2 VDD1 1 16 VDD2 GND1 2 15 GND2 GND1 2 15 GND2 VIA 3 14 VOA VIA 3 13 VOB VIB 4 12 VOC VIC 5 NIC 6 11 NIC NIC 6 11 NIC DISABLE1 7 10 NIC NIC 7 10 VE2 GND1 8 9 GND2 TOP VIEW (Not to Scale) NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. GND1 8 ADuM130E TOP VIEW (Not to Scale) 14 VOA 13 VOB 12 VOC 9 GND2 NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. 13348-005 VIC 5 ADuM130D 13348-004 VIB 4 Figure 8. ADuM130E Pin Configuration Figure 7. ADuM130D Pin Configuration Table 22. Pin Function Descriptions Pin No. 1 ADuM130D ADuM130E 1 1 2, 8 2, 8 3 3 4 4 5 5 6, 10, 11 6, 7, 11 7 Not applicable Mnemonic VDD1 GND1 VIA VIB VIC NIC DISABLE1 9, 15 Not applicable 9, 15 10 GND2 VE2 12 13 14 16 12 13 14 16 VOC VOB VOA VDD2 1 Description Supply Voltage for Isolator Side 1. Ground 1. Ground reference for Isolator Side 1. Logic Input A. Logic Input B. Logic Input C. No Internal Connection. Leave these pins floating. Input Disable 1. This pin disables the isolator inputs. Outputs take on the logic state determined by the fail-safe option shown in the Ordering Guide. Ground 2. Ground reference for Isolator Side 2. Output Enable 2. Active high logic input. When VE2 is high or disconnected, the VOA, VOB, and VOC outputs are enabled. When VE2 is low, the VOA, VOB, and VOC outputs are disabled to the high-Z state. Logic Output C. Logic Output B. Logic Output A. Supply Voltage for Isolator Side 2. Reference the AN-1109 Application Note for specific layout guidelines. Rev. A | Page 15 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet VDD1 1 16 VDD2 VDD1 1 16 VDD2 GND1 2 15 GND2 GND1 2 15 GND2 VIA 3 14 VOA VIA 3 13 VOB VIB 4 12 VIC VOC 5 NIC 6 11 NIC NIC 6 11 NIC DISABLE1 7 10 DISABLE2 VE1 7 10 VE2 GND1 8 9 GND2 TOP VIEW (Not to Scale) NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. GND1 8 ADuM131E TOP VIEW (Not to Scale) 14 VOA 13 VOB 12 VIC 9 GND2 NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. 13348-105 VOC 5 ADuM131D 13348-104 VIB 4 Figure 10. ADuM131E Pin Configuration Figure 9. ADuM131D Pin Configuration Table 23. Pin Function Descriptions Pin No. 1 ADuM131D ADuM131E 1 1 2, 8 2, 8 3 3 4 4 5 5 6, 11 6, 11 7 Not applicable Mnemonic VDD1 GND1 VIA VIB VOC NIC DISABLE1 Not applicable 7 VE1 9, 15 10 9, 15 Not applicable GND2 DISABLE2 Not applicable 10 VE2 12 13 14 16 12 13 14 16 VIC VOB VOA VDD2 1 Description Supply Voltage for Isolator Side 1. Ground 1. Ground reference for Isolator Side 1. Logic Input A. Logic Input B. Logic Output C. No Internal Connection. Leave this pin floating. Input Disable 1. This pin disables the isolator inputs. Outputs take on the logic state determined by the fail-safe option shown in the Ordering Guide. Output Enable 1. Active high logic input. When VE1 is high or disconnected, the VOC output is enabled. When VE1 is low, the VOC output is disabled to the high-Z state. Ground 2. Ground reference for Isolator Side 2. Input Disable 2. This pin disables the isolator inputs. Outputs take on the logic state determined by the fail-safe option shown in the Ordering Guide. Output Enable 2. Active high logic input. When VE2 is high or disconnected, the VOA and VOB outputs are enabled. When VE2 is low, the VOA and VOB outputs are disabled to the high-Z state. Logic Input C. Logic Output B. Logic Output A. Supply Voltage for Isolator Side 2. Reference the AN-1109 Application Note for specific layout guidelines. Rev. A | Page 16 of 22 Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E TYPICAL PERFORMANCE CHARACTERISTICS 16 12 10 8 6 4 2 8 6 4 120 140 160 16 10 8 6 4 40 60 80 100 120 140 160 DATA RATE (Mbps) Figure 12. ADuM130D/ADuM130E IDD2 Supply Current vs. Data Rate at Various Voltages 16 10 8 6 4 40 60 80 100 DATA RATE (Mbps) 120 140 160 Figure 13. ADuM131D/ADuM131E IDD1 Supply Current vs. Data Rate at Various Voltages 140 160 5.0V 3.3V 2.5V 1.8V 8 6 4 2 12 –20 0 20 40 60 80 100 120 140 5.0V 3.3V 2.5V 1.8V 10 8 6 4 2 0 –40 13348-112 20 120 Figure 15. Propagation Delay (tPLH) vs. Temperature at Various Voltages 2 0 100 80 TEMPERATURE (°C) PROPAGATION DELAY (tPHL ) (ns) 12 60 10 14 5.0V 3.3V 2.5V 1.8V 14 12 0 –40 13348-111 20 40 Figure 14. ADuM131D/ADuM131E IDD2 Supply Current vs. Data Rate at Various Voltages 2 0 20 DATA RATE (Mbps) PROPAGATION DELAY (tPLH) (ns) 12 0 0 14 5.0V 3.3V 2.5V 1.8V 14 0 13348-113 100 60 80 DATA RATE (Mbps) 13348-114 40 Figure 11. ADuM130D/ADuM130E IDD1 Supply Current vs. Data Rate at Various Voltages IDD2 SUPPLY CURRENT (mA) 10 –20 0 20 40 60 80 TEMPERATURE (°C) 100 120 140 13348-115 20 13348-110 0 IDD1 SUPPLY CURRENT (mA) 12 2 0 0 5.0V 3.3V 2.5V 1.8V 14 IDD2 SUPPLY CURRENT (mA) 14 IDD1 SUPPLY CURRENT (mA) 16 5.0V 3.3V 2.5V 1.8V Figure 16. Propagation Delay( tPHL) vs. Temperature at Various Voltages Rev. A | Page 17 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet APPLICATIONS INFORMATION PRINTED CIRCUIT BOARD (PCB) LAYOUT The ADuM130D/ADuM130E/ADuM131D/ADuM131E use a high frequency carrier to transmit data across the isolation barrier using iCoupler chip scale transformer coils separated by layers of polyimide isolation. Using an on/off keying (OOK) technique and the differential architecture shown in Figure 18 and Figure 19, the ADuM130D/ADuM130E/ADuM131D/ADuM131E have very low propagation delay and high speed. Internal regulators and input/output design techniques allow logic and supply voltages over a wide range from 1.7 V to 5.5 V, offering voltage translation of 1.8 V, 2.5 V, 3.3 V, and 5 V logic. The architecture is designed for high common-mode transient immunity and high immunity to electrical noise and magnetic interference. Radiated emissions are minimized with a spread spectrum OOK carrier and other techniques. The ADuM130D/ADuM130E/ADuM131D/ADuM131E digital isolators require no external interface circuitry for the logic interfaces. Power supply bypassing is strongly recommended at the input and output supply pins (see Figure 17). Bypass capacitors are most conveniently connected between Pin 1 and Pin 2 for VDD1 and between Pin 15 and Pin 16 for VDD2. The recommended bypass capacitor value is between 0.01 µF and 0.1 µF. The total lead length between both ends of the capacitor and the input power supply pin must not exceed 10 mm. Bypassing between Pin 1 and Pin 8 and between Pin 9 and Pin 16 must also be considered, unless the ground pair on each package side is connected close to the package. Figure 18 illustrates the waveforms for models of the ADuM130D/ ADuM130E/ADuM131D/ADuM131E that have the condition of the fail-safe output state equal to low, where the carrier waveform is off when the input state is low. If the input side is off or not operating, the fail-safe output state of low (the ADuM130D0, ADuM131D0, ADuM130E0, and ADuM131E0 models) sets the output to low. For the ADuM130D/ADuM130E/ADuM131D/ ADuM131E that have a fail-safe output state of high, Figure 19 illustrates the conditions where the carrier waveform is off when the input state is high. When the input side is off or not operating, the fail-safe output state of high (the ADuM130D1, ADuM131D1, ADuM130E1, and ADuM131E1 models) sets the output to high. See the Ordering Guide for the model numbers that have the fail-safe output state of low or the fail-safe output state of high. VDD1 GND1 VIA VIB VIC/VOC NIC DISABLE1/VE1 GND1 VDD2 GND2 VOA VOB VIC/VOC NIC DISABLE2/VE2 GND2 NIC = NO INTERNAL CONNECTION. LEAVE THIS PIN FLOATING. 13348-010 OVERVIEW Figure 17. Recommended PCB Layout In applications involving high common-mode transients, ensure that board coupling across the isolation barrier is minimized. Furthermore, design the board layout such that any coupling that does occur equally affects all pins on a given component side. Failure to ensure this can cause voltage differentials between pins exceeding the Absolute Maximum Ratings of the device, thereby leading to latch-up or permanent damage. See the AN-1109 Application Note for board layout guidelines. REGULATOR REGULATOR TRANSMITTER RECEIVER VIN GND1 13348-014 VOUT GND2 Figure 18. Operational Block Diagram of a Single Channel with a Low Fail-Safe Output State REGULATOR REGULATOR TRANSMITTER RECEIVER VIN GND1 GND2 Figure 19. Operational Block Diagram of a Single Channel with a High Fail-Safe Output State Rev. A | Page 18 of 22 13348-015 VOUT Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E PROPAGATION DELAY RELATED PARAMETERS INSULATION LIFETIME Propagation delay is a parameter that describes the time it takes a logic signal to propagate through a component. The propagation delay to a Logic 0 output may differ from the propagation delay to a Logic 1 output. All insulation structures eventually break down when subjected to voltage stress over a sufficiently long period. The rate of insulation degradation is dependent on the characteristics of the voltage waveform applied across the insulation as well as on the materials and material interfaces. INPUT (VIx) 50% OUTPUT (VOx) 13348-011 tPHL tPLH 50% Figure 20. Propagation Delay Parameters Pulse width distortion is the maximum difference between these two propagation delay values and is an indication of how accurately the timing of the input signal is preserved. Channel matching is the maximum amount the propagation delay differs between channels within a single ADuM130D/ ADuM130E/ADuM131D/ADuM131E component. Propagation delay skew is the maximum amount the propagation delay differs between multiple ADuM130D/ADuM130E/ ADuM131D/ADuM131E components operating under the same conditions. JITTER MEASUREMENT Figure 21 shows the eye diagram for the ADuM130D/ADuM130E/ ADuM131D/ADuM131E. The measurement was taken using an Agilent 81110A pulse pattern generator at 150 Mbps with pseudorandom bit sequences (PRBS), 2(n − 1), n = 14, for 5 V supplies. Jitter was measured with the Tektronix Model 5104B oscilloscope, at 1 GHz, 10 GSPS with the DPOJET jitter and eye diagram analysis tools. The result shows a typical measurement on the ADuM130D/ADuM130E/ADuM131D/ADuM131E with 630 ps p-p jitter. 5 Surface Tracking Surface tracking is addressed in electrical safety standards by setting a minimum surface creepage based on the working voltage, the environmental conditions, and the properties of the insulation material. Safety agencies perform characterization testing on the surface insulation of components that allows the components to be categorized in different material groups. Lower material group ratings are more resistant to surface tracking and, therefore, can provide adequate lifetime with smaller creepage. The minimum creepage for a given working voltage and material group is in each system level standard and is based on the total rms voltage across the isolation, pollution degree, and material group. The material group and creepage for the ADuM130D/ADuM130E/ ADuM131D/ADuM131E isolators are presented in Table 9. Insulation Wear Out The lifetime of insulation caused by wear out is determined by its thickness, material properties, and the voltage stress applied. It is important to verify that the product lifetime is adequate at the application working voltage. The working voltage supported by an isolator for wear out may not be the same as the working voltage supported for tracking. It is the working voltage applicable to tracking that is specified in most standards. Testing and modeling have shown that the primary driver of long-term degradation is displacement current in the polyimide insulation causing incremental damage. The stress on the insulation can be broken down into broad categories, such as dc stress, which causes very little wear out because there is no displacement current, and an ac component time varying voltage stress, which causes wear out. 3 2 1 0 –10 –5 0 TIME (ns) 5 10 13348-012 VOLTAGE (V) 4 The two types of insulation degradation of primary interest are breakdown along surfaces exposed to the air and insulation wear out. Surface breakdown is the phenomenon of surface tracking and the primary determinant of surface creepage requirements in system level standards. Insulation wear out is the phenomenon where charge injection or displacement currents inside the insulation material cause long-term insulation degradation. Figure 21. Eye Diagram Rev. A | Page 19 of 22 ADuM130D/ADuM130E/ADuM131D/ADuM131E The working voltage across the barrier from Equation 1 is The ratings in certification documents are usually based on 60 Hz sinusoidal stress because this reflects isolation from line voltage. However, many practical applications have combinations of 60 Hz ac and dc across the barrier as shown in Equation 1. Because only the ac portion of the stress causes wear out, the equation can be rearranged to solve for the ac rms voltage, as shown in Equation 2. For insulation wear out with the polyimide materials used in these products, the ac rms voltage determines the product lifetime. VRMS = VAC RMS2 + VDC 2 (1) VAC RMS = VRMS 2 − VDC 2 (2) VRMS = VAC RMS2 + VDC 2 VRMS = 2402 + 4002 VRMS = 466 V This VRMS value is the working voltage used together with the material group and pollution degree when looking up the creepage required by a system standard. To determine if the lifetime is adequate, obtain the time varying portion of the working voltage. To obtain the ac rms voltage, use Equation 2. or VAC RMS = VRMS 2 − VDC 2 where: VAC RMS is the time varying portion of the working voltage. VRMS is the total rms working voltage. VDC is the dc offset of the working voltage. VAC RMS = 4662 − 4002 VAC RMS = 240 V rms In this case, the ac rms voltage is simply the line voltage of 240 V rms. This calculation is more relevant when the waveform is not sinusoidal. The value is compared to the limits for working voltage in Table 19 for the expected lifetime, less than a 60 Hz sine wave, and it is well within the limit for a 50-year service life. Calculation and Use of Parameters Example The following example frequently arises in power conversion applications. Assume that the line voltage on one side of the isolation is 240 V ac rms and a 400 V dc bus voltage is present on the other side of the isolation barrier. The isolator material is polyimide. To establish the critical voltages in determining the creepage, clearance, and lifetime of a device, see Figure 22 and the following equations. Note that the dc working voltage limit in Table 19 is set by the creepage of the package as specified in IEC 60664-1. This value can differ for specific system level standards. VAC RMS VPEAK VRMS VDC TIME Figure 22. Critical Voltage Example Rev. A | Page 20 of 22 13348-013 ISOLATION VOLTAGE Data Sheet Data Sheet ADuM130D/ADuM130E/ADuM131D/ADuM131E OUTLINE DIMENSIONS 10.00 (0.3937) 9.80 (0.3858) 9 16 4.00 (0.1575) 3.80 (0.1496) 1 8 1.27 (0.0500) BSC 0.50 (0.0197) 0.25 (0.0098) 1.75 (0.0689) 1.35 (0.0531) 0.25 (0.0098) 0.10 (0.0039) COPLANARITY 0.10 6.20 (0.2441) 5.80 (0.2283) SEATING PLANE 0.51 (0.0201) 0.31 (0.0122) 45° 8° 0° 0.25 (0.0098) 0.17 (0.0067) 1.27 (0.0500) 0.40 (0.0157) COMPLIANT TO JEDEC STANDARDS MS-012-AC 060606-A CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. Figure 23. 16-Lead Standard Small Outline Package [SOIC_N] Narrow Body (R-16) Dimensions shown in millimeters and (inches) 10.50 (0.4134) 10.10 (0.3976) 9 16 7.60 (0.2992) 7.40 (0.2913) 8 1.27 (0.0500) BSC 0.30 (0.0118) 0.10 (0.0039) COPLANARITY 0.10 0.51 (0.0201) 0.31 (0.0122) 10.65 (0.4193) 10.00 (0.3937) 0.75 (0.0295) 45° 0.25 (0.0098) 2.65 (0.1043) 2.35 (0.0925) SEATING PLANE 8° 0° 0.33 (0.0130) 0.20 (0.0079) COMPLIANT TO JEDEC STANDARDS MS-013-AA CONTROLLING DIMENSIONS ARE IN MILLIMETERS; INCH DIMENSIONS (IN PARENTHESES) ARE ROUNDED-OFF MILLIMETER EQUIVALENTS FOR REFERENCE ONLY AND ARE NOT APPROPRIATE FOR USE IN DESIGN. Figure 24. 16-Lead Standard Small Outline Package [SOIC_W] Wide Body (RW-16) Dimensions shown in millimeters and (inches) Rev. A | Page 21 of 22 1.27 (0.0500) 0.40 (0.0157) 03-27-2007-B 1 ADuM130D/ADuM130E/ADuM131D/ADuM131E Data Sheet ORDERING GUIDE Model1 ADuM130D1BRZ ADuM130D1BRZ-RL7 ADuM130D0BRZ ADuM130D0BRZ-RL7 ADuM130E1BRZ ADuM130E1BRZ-RL7 ADuM130E0BRZ ADuM130E0BRZ-RL7 ADuM130D1BRWZ ADuM130D1BRWZ-RL ADuM130D0BRWZ ADuM130D0BRWZ-RL ADuM130E1BRWZ ADuM130E1BRWZ-RL ADuM130E0BRWZ ADuM130E0BRWZ-RL ADuM131D1BRZ ADuM131D1BRZ-RL7 ADuM131D0BRZ ADuM131D0BRZ-RL7 ADuM131E1BRZ ADuM131E1BRZ-RL7 ADuM131E0BRZ ADuM131E0BRZ-RL7 ADuM131D1BRWZ ADuM131D1BRWZ-RL ADuM131D0BRWZ ADuM131D0BRWZ-RL ADuM131E1BRWZ ADuM131E1BRWZ-RL ADuM131E0BRWZ ADuM131E0BRWZ-RL 1 Temperature Range −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C −40°C to +125°C No. of Inputs, VDD1 Side 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 2 No. of Inputs, VDD2 Side 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 1 Withstand Voltage Rating (kV rms) 3.0 3.0 3.0 3.0 3.0 3.0 3.0 3.0 3.75 3.75 3.75 3.75 3.75 3.75 3.75 3.75 3.0 3.0 3.0 3.0 3.0 3.0 3.0 3.0 3.75 3.75 3.75 3.75 3.75 3.75 3.75 3.75 Fail-Safe Output State High High Low Low High High Low Low High High Low Low High High Low Low High High Low Low High High Low Low High High Low Low High High Low Low Z = RoHS Compliant Part. ©2015 Analog Devices, Inc. All rights reserved. Trademarks and registered trademarks are the property of their respective owners. D13348-0-11/15(A) Rev. A | Page 22 of 22 Input Disable Yes Yes Yes Yes No No No No Yes Yes Yes Yes No No No No Yes Yes Yes Yes No No No No Yes Yes Yes Yes No No No No Output Enable No No No No Yes Yes Yes Yes No No No No Yes Yes Yes Yes No No No No Yes Yes Yes Yes No No No No Yes Yes Yes Yes Package Description 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_N 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W 16-Lead SOIC_W Package Option R-16 R-16 R-16 R-16 R-16 R-16 R-16 R-16 RW-16 RW-16 RW-16 RW-16 RW-16 RW-16 RW-16 RW-16 R-16 R-16 R-16 R-16 R-16 R-16 R-16 R-16 RW-16 RW-16 RW-16 RW-16 RW-16 RW-16 RW-16 RW-16