Am29LV001B Data Sheet RETIRED PRODUCT This product has been retired and is not recommended for designs. Please contact your Spansion representative for alternates. Availability of this document is retained for reference and historical purposes only. The following document contains information on Spansion memory products. Continuity of Specifications There is no change to this data sheet as a result of offering the device as a Spansion product. Any changes that have been made are the result of normal data sheet improvement and are noted in the document revision summary. For More Information Please contact your local sales office for additional information about Spansion memory solutions. Publication Number 21553 Revision F Amendment 4 Issue Date May 5, 2006 THIS PAGE LEFT INTENTIONALLY BLANK. DATA SHEET Am29LV001B 1 Megabit (128 K x 8-Bit) CMOS 3.0 Volt-only Boot Sector Flash Memory This product has been retired and is not recommended for designs. Please contact your Spansion representative for alternates. Availability of this document is retained for reference and historical purposes only. DISTINCTIVE CHARACTERISTICS ■ Single power supply operation — Full voltage range: 2.7 to 3.6 volt read and write operations for battery-powered applications — Regulated voltage range: 3.0 to 3.6 volt read and write operations and for compatibility with high performance 3.3 volt microprocessors ■ Manufactured on 0.32 µm process technology ■ High performance — Full voltage range: access times as fast as 55 ns — Regulated voltage range: access times as fast as 45 ns ■ Ultra low power consumption (typical values at 5 MHz) — 200 nA Automatic Sleep mode current — 200 nA standby mode current — 7 mA read current — 15 mA program/erase current ■ Flexible sector architecture ■ Unlock Bypass Mode Program Command — Reduces overall programming time when issuing multiple program command sequences ■ Top or bottom boot block configurations available ■ Embedded Algorithms — Embedded Erase algorithm automatically preprograms and erases the entire chip or any combination of designated sectors — Embedded Program algorithm automatically writes and verifies data at specified addresses ■ Minimum 1 million erase cycle guarantee per sector ■ 20 Year data retention at 125°C — Reliable operation for the life of the system ■ Package option — 32-pin TSOP — 32-pin PLCC ■ Compatibility with JEDEC standards — One 8 Kbyte, two 4 Kbyte, and seven 16 Kbyte — Pinout and software compatible with singlepower supply Flash — Supports full chip erase — Superior inadvertent write protection — Sector Protection features: Hardware method of locking a sector to prevent any program or erase operations within that sector Sectors can be locked in-system or via programming equipment Temporary Sector Unprotect feature allows code changes in previously locked sectors ■ Data# Polling and toggle bits — Provides a software method of detecting program or erase operation completion ■ Erase Suspend/Erase Resume — Supports reading data from or programming data to a sector that is not being erased ■ Hardware reset pin (RESET#) — Hardware method for resetting the device to reading array data This Data Sheet states AMD’s current technical specifications regarding the Products described herein. This Data Sheet may be revised by subsequent versions or modifications due to changes in technical specifications. Publication# 21557 Rev: F Amendment: 4 Issue Date: May 5, 2006 DATA SHEET GENERAL DESCRIPTION The Am29LV001B is a 1 Mbit, 3.0 Volt-only Flash memory device organized as 131,072 bytes. The Am29LV001B has a boot sector architecture. The device is offered in 32-pin PLCC and 32-pin TSOP packages. The byte-wide (x8) data appears on DQ7-DQ0. All read, erase, and program operations are accomplished using only a single power supply. The device can also be programmed in standard EPROM programmers. The standard Am29LV001B offers access times of 45, 55, 70, and 90 ns, allowing high speed microprocessors to operate without wait states. To eliminate bus contention, the device has separate chip enable (CE#), write enable (WE#) and output enable (OE#) controls. The device requires only a single power supply (2.7 V–3.6V) for both read and write functions. Internally generated and regulated voltages are provided for the program and erase operations. The Am29LV001B is entirely command set compatible with the JEDEC single-power-supply Flash standard. Commands are written to the command register using standard microprocessor write timings. Register contents serve as input to an internal state-machine that controls the erase and programming circuitry. Write cycles also internally latch addresses and data needed for the programming and erase operations. Reading data out of the device is similar to reading from other Flash or EPROM devices. Device programming occurs by executing the program command sequence. This initiates the Embedded Program algorithm—an internal algorithm that automatically times the program pulse widths and verifies proper cell margin. The Unlock Bypass mode facilitates faster programming times by requiring only two write cycles to program data instead of four. Device erasure occurs by executing the erase command sequence. This initiates the Embedded Erase algorithm— an internal algorithm that automatically preprograms the array (if it is not already programmed) before executing the 2 erase operation. During erase, the device automatically times the erase pulse widths and verifies proper cell margin. The host system can detect whether a program or erase operation is complete by reading the DQ7 (Data# Polling) and DQ6 (toggle) status bits. After a program or erase cycle has been completed, the device is ready to read array data or accept another command. The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully erased when shipped from the factory. Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. The hardware sector protection feature disables both program and erase operations in any combination of the sectors of memory. This can be achieved in-system or via programming equipment. The Erase Suspend feature enables the user to put erase on hold for any period of time to read data from, or program data to, any sector that is not selected for erasure. True background erase can thus be achieved. The hardware RESET# pin terminates any operation in progress and resets the internal state machine to reading array data. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the device, enabling the system microprocessor to read the boot-up firmware from the Flash memory. The device offers two power-saving features. When addresses are stable for a specified amount of time, the device enters the automatic sleep mode. The system can also place the device into the standby mode. Power consumption is greatly reduced in both these modes. AMD’s Flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness. The device electrically erases all bits within a sector simultaneously via Fowler-Nordheim tunneling. The data is programmed using hot electron injection. Am29LV001B 21557F4 May 5, 2006 DATA SHEET TABLE OF CONTENTS Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 4 Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4 Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 5 Pin Configuration . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . 5 Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 6 Device Bus Operations . . . . . . . . . . . . . . . . . . . . . . 7 DQ6: Toggle Bit I .................................................................... 18 DQ2: Toggle Bit II ................................................................... 19 Reading Toggle Bits DQ6/DQ2 ............................................... 19 DQ5: Exceeded Timing Limits ................................................ 19 Table 1. Am29LV001B Device Bus Operations ................................ 7 Absolute Maximum Ratings . . . . . . . . . . . . . . . . 22 Requirements for Reading Array Data ..................................... 7 Writing Commands/Command Sequences .............................. 7 Program and Erase Operation Status ...................................... 8 Standby Mode .......................................................................... 8 Automatic Sleep Mode ............................................................. 8 RESET#: Hardware Reset Pin ................................................. 8 Output Disable Mode ................................................................ 8 Figure 7. Maximum Negative Overshoot Waveform ...................... 22 Figure 8. Maximum Positive Overshoot Waveform ........................ 22 Table 2. Am29LV001B Top Boot Sector Architecture ...................... 9 Table 3. Am29LV001B Bottom Boot Sector Architecture.................. 9 Autoselect Mode ....................................................................... 9 Table 4. Am29LV001B Autoselect Codes....................................... 10 Figure 6. Toggle Bit Algorithm ........................................................ 20 DQ3: Sector Erase Timer ....................................................... 20 Table 6. Write Operation Status..................................................... 21 Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 22 DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 23 Figure 9. ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents) .............................................................................. 24 Figure 10. Typical ICC1 vs. Frequency ........................................... 24 Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . 25 Figure 11. Test Setup ..................................................................... 25 Table 7. Test Specifications ........................................................... 25 Key to Switching Waveforms. . . . . . . . . . . . . . . . 25 Figure 12. Input Waveforms and Measurement Levels ................. 25 Sector Protection/Unprotection ............................................... 10 Temporary Sector Unprotect .................................................. 10 AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 26 Figure 1. In-System Sector Protect/Unprotect Algorithms ...............11 Figure 2. Temporary Sector Unprotect Operation ...........................12 Hardware Reset (RESET#) .................................................... 27 Hardware Data Protection ...................................................... 12 Low VCC Write Inhibit .............................................................. 12 Write Pulse “Glitch” Protection ............................................... 12 Logical Inhibit .......................................................................... 12 Power-Up Write Inhibit ............................................................ 12 Command Definitions . . . . . . . . . . . . . . . . . . . . . . 13 Reading Array Data ................................................................ 13 Reset Command ..................................................................... 13 Autoselect Command Sequence ............................................ 13 Byte Program Command Sequence ....................................... 13 Unlock Bypass Command Sequence ..................................... 14 Figure 3. Program Operation ..........................................................14 Chip Erase Command Sequence ........................................... 14 Sector Erase Command Sequence ........................................ 15 Erase Suspend/Erase Resume Commands ........................... 15 Figure 4. Erase Operation ...............................................................16 Command Definitions ............................................................. 17 Table 5. Am29LV001B Command Definitions ................................ 17 Write Operation Status . . . . . . . . . . . . . . . . . . . . . 18 DQ7: Data# Polling ................................................................. 18 Figure 13. Read Operations Timings ............................................. 26 Figure 14. RESET# Timings .......................................................... 27 Erase/Program Operations ..................................................... 28 Figure 15. Program Operation Timings .......................................... 29 Figure 16. Chip/Sector Erase Operation Timings .......................... 30 Figure 17. Data# Polling Timings (During Embedded Algorithms) . 31 Figure 18. Toggle Bit Timings (During Embedded Algorithms) ...... 31 Figure 19. DQ2 vs. DQ6 ................................................................. 32 Temporary Sector Unprotect .................................................. 32 Figure 20. Temporary Sector Unprotect Timing Diagram .............. 32 Figure 21. In-System Sector Protect/Unprotect Timing Diagram ... 33 Alternate CE# Controlled Erase/Program Operations ............ 34 Figure 22. Alternate CE# Controlled Write Operation Timings ...... 35 Erase and Programming Performance . . . . . . . 36 Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 36 TSOP Pin Capacitance . . . . . . . . . . . . . . . . . . . . . 36 PLCC Pin Capacitance . . . . . . . . . . . . . . . . . . . . . 36 Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 37 Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . 38 PL 032—32-Pin Plastic Leaded Chip Carrier ......................... 38 TS 032—32-Pin Standard Thin Small Outline Package ......... 39 Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 40 Figure 5. Data# Polling Algorithm ...................................................18 May 5, 2006 21557F4 Am29LV001B 3 DATA SHEET PRODUCT SELECTOR GUIDE Family Part Number Am29LV001B Regulated Voltage Range: VCC = 3.0–3.6 V Speed Options -45R Full Voltage Range: VCC = 2.7–3.6 V -55 -70 -90 Max access time, ns (tACC) 45 55 70 90 Max CE# access time, ns (tCE) 45 55 70 90 Max OE# access time, ns (tOE) 25 30 30 35 Note: See “AC Characteristics” for full specifications. BLOCK DIAGRAM DQ7–DQ0 VCC Sector Switches VSS Erase Voltage Generator RESET# WE# Input/Output Buffers State Control Command Register PGM Voltage Generator Chip Enable Output Enable CE# OE# VCC Detec- Timer A16–A0 4 Am29LV001B Address Latch STB STB Data Y-Decoder Y-Gating X-Decoder Cell Matrix 21557F4 May 5, 2006 DATA SHEET CONNECTION DIAGRAMS 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 32 31 30 29 28 27 26 25 24 23 22 21 20 19 18 17 OE# A10 CE# DQ7 DQ6 DQ5 DQ4 DQ3 VSS DQ2 DQ1 DQ0 A0 A1 A2 A3 WE# NC VCC RESET# A16 32-Pin Standard TSOP A12 A15 A11 A9 A8 A13 A14 NC WE# VCC RESET# A16 A15 A12 A7 A6 A5 A4 4 3 2 1 32 31 30 A7 5 29 A14 A6 6 28 A13 A5 A4 7 8 27 26 A8 A9 A3 9 25 A11 A2 10 24 OE# A1 11 23 A10 A0 12 22 DQ0 13 CE# DQ7 PLCC Am29LV001 21 = DQ5 DQ6 DQ4 LOGIC SYMBOL PIN CONFIGURATION A0–A16 VSS DQ3 DQ1 DQ2 14 15 16 17 18 19 20 17 addresses 17 DQ0–DQ7 = 8 data inputs/outputs CE# = Chip enable OE# = Output enable WE# = Write enable CE# RESET# = Hardware reset pin, active low OE# VCC = 3.0 volt-only single power supply (see Product Selector Guide for speed options and voltage supply tolerances) WE# VSS = Device ground NC = Pin not connected internally May 5, 2006 21557F4 A0–A16 8 DQ0–DQ7 Am29LV001B RESET# 5 DATA SHEET ORDERING INFORMATION Standard Products AMD standard products are available in several packages and operating ranges. The order number (Valid Combination) is formed by a combination of the elements below. Am29LV001B T -45R E C TEMPERATURE RANGE C I E D F K = = = = = = Commercial (0°C to +70°C) Industrial (–40°C to +85°C) Extended (–55°C to +125°C) Commercial (0°C to +70°C) for Pb-free Package Industrial (–40°C to +85°C) for Pb-free Package Extended (–55°C to +125°C) for Pb-free Package PACKAGE TYPE E = J = 32-Pin Thin Small Outline Package (TSOP) Standard Pinout (TS 032) 32-Pin Rectangular Plastic Leaded Chip Carrier (PL 032) SPEED OPTION See Product Selector Guide and Valid Combinations BOOT CODE SECTOR ARCHITECTURE T B = = Top Sector Bottom Sector DEVICE NUMBER/DESCRIPTION Am29LV001B 1 Megabit (128 K x 8-Bit) CMOS Flash Memory 3.0 Volt-only Read, Program and Erase Valid Combinations AM29LV001BT-45R, AM29LV001BB-45R, EC, EI, EF, JC, JI, JD, JF AM29LV001BT-55, AM29LV001BB-55, AM29LV001BT-70, AM29LV001BB-70, EC, EI, EE, ED, EF, EK, JC, JI, JE, JD, JF, JK AM29LV001BT-90, AM29LV001BB-90, Valid Combinations Valid Combinations list configurations planned to be supported in volume for this device. Consult the local AMD sales office to confirm availability of specific valid combinations and to check on newly released combinations. 6 Am29LV001B 21557F4 May 5, 2006 DATA SHEET DEVICE BUS OPERATIONS This section describes the requirements and use of the device bus operations, which are initiated through the internal command register. The command register itself does not occupy any addressable memory location. The register is composed of latches that store the commands, along with the address and data information needed to execute the command. The contents of Table 1. Operation CE# the register serve as inputs to the internal state machine. The state machine outputs dictate the function of the device. Table 1 lists the device bus operations, the inputs and control levels they require, and the resulting output. The following subsections describe each of these operations in further detail. Am29LV001B Device Bus Operations OE# WE# RESET# Addresses (Note 1) DQ0–DQ7 Read L L H H AIN DOUT Write L H L H AIN DIN VCC ± 0.3 V X X VCC ± 0.3 V X High-Z Output Disable L H H H X High-Z Reset X X X L X High-Z Sector Protect (Note 2) L H L VID Sector Address, A6 = L, A1 = H, A0 = L DIN, DOUT Sector Unprotect (Note 2) L H L VID Sector Address, A6 = H, A1 = H, A0 = L DIN, DOUT Temporary Sector Unprotect X X X VID AIN DIN Standby Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, DOUT = Data Out Notes: 1. Addresses are A16–A0. 2. The in-system method of sector protection/unprotection is available. Sector protection/unprotection can be implemented by using programming equipment. See ““Sector Protection/Unprotection” on page 10” . Requirements for Reading Array Data Writing Commands/Command Sequences To read array data from the outputs, the system must drive the CE# and OE# pins to VIL. CE# is the power control and selects the device. OE# is the output control and gates array data to the output pins. WE# should remain at VIH. To write a command or command sequence (which includes programming data to the device and erasing sectors of memory), the system must drive WE# and CE# to VIL, and OE# to VIH. The internal state machine is set for reading array data upon device power-up, or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in this mode to obtain array data. Standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the device data outputs. The device remains enabled for read access until the command register contents are altered. See “Reading Array Data” on page 13 for more information. Refer to the AC “Read Operations” on page 26 table for timing specifications and to Figure 13, on page 26 for the timing diagram. ICC1 in the DC Characteristics table represents the active current specification for reading array data. May 5, 2006 21557F4 The device features an Unlock Bypass mode to facilitate faster programming. Once the device enters the Unlock Bypass mode, only two write cycles are required to program a byte, instead of four. The “Byte Program Command Sequence” on page 13 section contains details on programming data to the device using both standard and Unlock Bypass command sequences. An erase operation can erase one sector, multiple sectors, or the entire device. Table 2 on page 9 indicate the address space that each sector occupies. A “sector address” consists of the address bits required to uniquely select a sector. The “Command Definitions” on page 13 section contains details on erasing a sector or the entire chip, or suspending/resuming the erase operation. After the system writes the autoselect command sequence, the device enters the autoselect mode. The system can then read autoselect codes from the Am29LV001B 7 DATA SHEET internal register (which is separate from the memory array) on DQ7–DQ0. Standard read cycle timings apply in this mode. Refer to “Autoselect Mode” on page 9 and “Autoselect Command Sequence” on page 13 for more information. ICC2 in the DC Characteristics table represents the active current specification for the write mode. The “AC Characteristics” on page 26 section contains timing specification tables and timing diagrams for write operations. Automatic Sleep Mode The automatic sleep mode minimizes Flash device energy consumption. The device automatically enables this mode when addresses remain stable for tACC + 30 ns. The automatic sleep mode is independent of the CE#, WE#, and OE# control signals. Standard address access timings provide new data when addresses are changed. While in sleep mode, output data is latched and always available to the system. ICC5 in the DC Characteristics table represents the automatic sleep mode current specification. Program and Erase Operation Status During an erase or program operation, the system may check the status of the operation by reading the status bits on DQ7–DQ0. Standard read cycle timings and ICC read specifications apply. Refer to “Write Operation Status” on page 18 for more information, and to “AC Characteristics” on page 26 for timing diagrams. Standby Mode When the system is not reading or writing to the device, it can place the device in the standby mode. In this mode, current consumption is greatly reduced, and the outputs are placed in the high impedance state, independent of the OE# input. The device enters the CMOS standby mode when the CE# and RESET# pins are both held at VCC ± 0.3 V. (Note that this is a more restricted voltage range than VIH.) If CE# and RESET# are held at VIH, but not within VCC ± 0.3 V, the device will be in the standby mode, but the standby current is greater. The device requires standard access time (tCE) for read access when the device is in either of these standby modes, before it is ready to read data. The device also enters the standby mode when the RESET# pin is driven low. Refer to the next section, RESET#: Hardware Reset Pin. If the device is deselected during erasure or programming, the device draws active current until the operation is completed. ICC3 in the DC Characteristics table represents the standby current specification. 8 RESET#: Hardware Reset Pin The RESET# pin provides a hardware method of resetting the device to reading array data. When the RESET# pin is driven low for at least a period of tRP, the device immediately terminates any operation in progress, tristates all output pins, and ignores all read/write commands for the duration of the RESET# pulse. The device also resets the internal state machine to reading array data. The operation that was interrupted should be reinitiated once the device is ready to accept another command sequence, to ensure data integrity. Current is reduced for the duration of the RESET# pulse. When RESET# is held at VSS±0.3 V, the device draws CMOS standby current (ICC4). If RESET# is held at VIL but not within VSS±0.3 V, the standby current is greater. The RESET# pin may be tied to the system reset circuitry. A system reset would thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory.The system may use the RESET# pin to force the device into the standby mode. Refer to “Standby Mode” on page 8 for more information. Refer to the AC Characteristics tables for RESET# parameters and to Figure 14, on page 27 for the timing diagram. Output Disable Mode When the OE# input is at VIH, output from the device is disabled. The output pins are placed in the high impedance state. Am29LV001B 21557F4 May 5, 2006 DATA SHEET Table 2. Am29LV001B Top Boot Sector Architecture Sector A16 A15 A14 A13 A12 Sector Size (Kbytes) Address Range (in hexadecimal) SA0 0 0 0 X X 16 Kbytes 00000h–03FFFh SA1 0 0 1 X X 16 Kbytes 04000h–07FFFh SA2 0 1 0 X X 16 Kbytes 08000h–0BFFFh SA3 0 1 1 X X 16 Kbytes 0C000h–0FFFFh SA4 1 0 0 X X 16 Kbytes 10000h–13FFFh SA5 1 0 1 X X 16 Kbytes 14000h–17FFFh SA6 1 1 0 X X 16 Kbytes 18000h–1BFFFh SA7 1 1 1 0 0 4 Kbytes 1C000h–1CFFFh SA8 1 1 1 0 1 4 Kbytes 1D000h–1DFFFh SA9 1 1 1 1 X 8 Kbytes 1E000h–1FFFFh Table 3. Am29LV001B Bottom Boot Sector Architecture Sector A16 A15 A14 A13 A12 Sector Size (Kbytes) Address Range (in hexadecimal) SA0 0 0 0 0 X 8 Kbytes 00000h–01FFFh SA1 0 0 0 1 0 4 Kbytes 02000h–02FFFh SA2 0 0 0 1 1 4 Kbytes 03000h–03FFFh SA3 0 0 1 X X 16 Kbytes 04000h–07FFFh SA4 0 1 0 X X 16 Kbytes 08000h–0BFFFh SA5 0 1 1 X X 16 Kbytes 0C000h–0FFFFh SA6 1 0 0 X X 16 Kbytes 10000h–13FFFh SA7 1 0 1 X X 16 Kbytes 14000h–17FFFh SA8 1 1 0 X X 16 Kbytes 18000h–1BFFFh SA9 1 1 1 X X 16 Kbytes 1C000h–1FFFFh Autoselect Mode The autoselect mode provides manufacturer and device identification, and sector protection verification, through identifier codes output on DQ7–DQ0. This mode is primarily intended for programming equipment to automatically match a device to be programmed with its corresponding programming algorithm. However, the autoselect codes can also be accessed in-system through the command register. When using programming equipment, the autoselect mode requires VID (11.5 V to 12.5 V) on address pin A9. Address pins A6, A1, and A0 must be as shown in Table 4. In addition, when verifying sector protection, May 5, 2006 21557F4 the sector address must appear on the appropriate highest order address bits (see Table 2 on page 9). Table 4 shows the remaining address bits that are don’t care. When all necessary bits are set as required, the programming equipment may then read the corresponding identifier code on DQ7-DQ0. To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 5 on page 17. This method does not require VID. See “Command Definitions” on page 13 for details on using the autoselect mode. Am29LV001B 9 DATA SHEET Table 4. Am29LV001B Autoselect Codes CE# OE# WE# A16 to A12 Manufacturer ID: AMD L L H X X VID X L X L L 01h Device ID: Am29LV001BT (Top Boot Block) L L H X X VID X L X L H EDh Device ID: Am29LV001BB (Bottom Boot Block) L L H X X VID X L X L H 6Dh Description Sector Protection Verification A11 to A10 A9 A8 to A7 A6 A5 to A2 A1 A0 DQ7 to DQ0 01h (protected) L L H SA X VID X L X H L 00h (unprotected) L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care. Sector Protection/Unprotection The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both program and erase operations in previously protected sectors. Sector protection/unprotection can be implemented via two methods. The primary method requires VID on the RESET# pin only, and can be implemented either in-system or via programming equipment. Figure 1, on page 11 shows the algorithms and Figure 21, on page 33 shows the timing diagram. This method uses standard microprocessor bus cycle timing. For sector unprotect, all unprotected sectors must first be protected prior to the first sector unprotect write cycle. The alternate method intended only for programming equipment requires VID on address pin A9, OE#, and RESET#. This method is compatible with programmer routines written for earlier 3.0 volt-only AMD flash devices. Publication number 22134 contains further 10 details; contact an AMD representative to request a copy. The device is shipped with all sectors unprotected. AMD offers the option of programming and protecting sectors at its factory prior to shipping the device through AMD’s ExpressFlash™ Service. Contact an AMD representative for details. It is possible to determine whether a sector is protected or unprotected. See “Autoselect Mode” on page 9” for details. Temporary Sector Unprotect This feature allows temporary unprotection of previously protected sectors to change data in-system. The Sector Unprotect mode is activated by setting the RESET# pin to VID. During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. Once VID is removed from the RESET# pin, all the previously protected sectors are protected again. Figure 2, on page 12 shows the algorithm, and Figure 20, on page 32 shows the timing diagrams, for this feature. Am29LV001B 21557F4 May 5, 2006 DATA SHEET START START Protect all sectors: The indicated portion of the sector protect algorithm must be performed for all unprotected sectors prior to issuing the first sector unprotect address PLSCNT = 1 RESET# = VID Wait 1 μs Temporary Sector Unprotect Mode No PLSCNT = 1 RESET# = VID Wait 1 μs No First Write Cycle = 60h? First Write Cycle = 60h? Yes Yes Set up sector address No All sectors protected? Sector Protect: Write 60h to sector address with A6 = 0, A1 = 1, A0 = 0 Yes Set up first sector address Sector Unprotect: Write 60h to sector address with A6 = 1, A1 = 1, A0 = 0 Wait 150 µs Increment PLSCNT Temporary Sector Unprotect Mode Verify Sector Protect: Write 40h to sector address with A6 = 0, A1 = 1, A0 = 0 Reset PLSCNT = 1 Wait 15 ms Read from sector address with A6 = 0, A1 = 1, A0 = 0 Verify Sector Unprotect: Write 40h to sector address with A6 = 1, A1 = 1, A0 = 0 Increment PLSCNT No No PLSCNT = 25? Yes Yes No Yes Device failed Read from sector address with A6 = 1, A1 = 1, A0 = 0 Data = 01h? PLSCNT = 1000? Protect another sector? No Data = 00h? Yes Yes Remove VID from RESET# Device failed Last sector verified? Write reset command Sector Protect Algorithm Sector Protect complete Set up next sector address No No Yes Sector Unprotect Algorithm Remove VID from RESET# Write reset command Sector Unprotect complete Figure 1. May 5, 2006 21557F4 In-System Sector Protect/Unprotect Algorithms Am29LV001B 11 DATA SHEET for command definitions). In addition, the following hardware data protection measures prevent accidental erasure or programming, which might otherwise be caused by spurious system level signals during VCC power-up and power-down transitions, or from system noise. START RESET# = VID (Note 1) Low VCC Write Inhibit When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all internal program/erase circuits are disabled, and the device resets. Subsequent writes are ignored until VCC is greater than VLKO. The system must provide the proper signals to the control pins to prevent unintentional writes when VCC is greater than VLKO. Perform Erase or Program Operations RESET# = VIH Temporary Sector Unprotect Completed (Note 2) Write Pulse “Glitch” Protection Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write cycle. Logical Inhibit Notes: 1. All protected sectors unprotected. Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE# = VIH. To initiate a write cycle, CE# and WE# must be a logical zero while OE# is a logical one. 2. All previously protected sectors are protected once again. Figure 2. Temporary Sector Unprotect Operation Hardware Data Protection The command sequence requirement of unlock cycles for programming or erasing provides data protection against inadvertent writes (refer to Table 5 on page 17 12 Power-Up Write Inhibit If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept commands on the rising edge of WE#. The internal state machine is automatically reset to reading array data on power-up. Am29LV001B 21557F4 May 5, 2006 DATA SHEET COMMAND DEFINITIONS Writing specific address and data commands or sequences into the command register initiates device operations. Table 5 on page 17 defines the valid register command sequences. Note that writing incorrect address and data values or writing them in the improper sequence may place the device in an unknown state. A reset command is required to return the device to reading array data. Erase Suspend mode). Once programming begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in an autoselect command sequence. Once in the autoselect mode, the reset command must be written to return to reading array data (also applies to autoselect during Erase Suspend). All addresses are latched on the falling edge of WE# or CE#, whichever happens later. All data is latched on the rising edge of WE# or CE#, whichever happens first. Refer to the appropriate timing diagrams in “AC Characteristics” on page 26. If DQ5 goes high during a program or erase operation, writing the reset command returns the device to reading array data (also applies dur ing Erase Suspend). Reading Array Data See “AC Characteristics” on page 26 for parameters, and Figure 14, on page 27 for the timing diagram. The device is automatically set to reading array data after device power-up. No commands are required to retrieve data. The device is also ready to read array data after completing an Embedded Program or Embedded Erase algorithm. After the device accepts an Erase Suspend command, the device enters the Erase Suspend mode. The system can read array data using the standard read timings, except that if it reads at an address within erase-suspended sectors, the device outputs status data. After completing a programming operation in the Erase Suspend mode, the system may once again read array data with the same exception. See “Erase Suspend/Erase Resume Commands” on page 15 for more information on this mode. The system must issue the reset command to reenable the device for reading array data if DQ5 goes high, or while in the autoselect mode. See the “Reset Command” on page 13 section. See also “Requirements for Reading Array Data” on page 7 for more information. The Read Operations table provides the read parameters, and Figure 13, on page 26 shows the timing diagram. The autoselect command sequence allows the host system to access the manufacturer and devices codes, and determine whether or not a sector is protected. Table 5 on page 17 shows the address and data requirements. This method is an alternative to that shown in Table 4 on page 10, which is intended for PROM programmers and requires VID on address bit A9. The autoselect command sequence is initiated by writing two unlock cycles, followed by the autoselect command. The device then enters the autoselect mode, and the system may read at any address any number of times, without initiating another command sequence. A read cycle at address XX00h retrieves the manufacturer code. A read cycle at address XX01h returns the device code. A read cycle containing a sector address (SA) and the address 02h returns 01h if that sector is protected, or 00h if it is unprotected. Refer to Table 2 on page 9 for valid sector addresses. The system must write the reset command to exit the autoselect mode and return to reading array data. Byte Program Command Sequence Reset Command Writing the reset command to the device resets the device to reading array data. Address bits are don’t care for this command. The reset command may be written between the sequence cycles in an erase command sequence before erasing begins. This resets the device to reading array data. Once erasure begins, however, the device ignores reset commands until the operation is complete. The reset command may be written between the sequence cycles in a program command sequence before programming begins. This resets the device to reading array data (also applies to programming in May 5, 2006 21557F4 Autoselect Command Sequence The device programs one byte of data for each program operation. The command sequence requires four bus cycles, and is initiated by writing two unlock write cycles, followed by the program set-up command. The program address and data are written next, which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically provides internally generated program pulses and verify the programmed cell margin. Table 5 on page 17 shows the address and data requirements for the byte program command sequence. When the Embedded Program algorithm is complete, the device then returns to reading array data and Am29LV001B 13 DATA SHEET addresses are no longer latched. The system can determine the status of the program operation by using DQ7 or DQ6. See “Write Operation Status” on page 18 for information on these status bits. START Any commands written to the device during the Embedded Program Algorithm are ignored. Note that a hardware reset immediately terminates the programmin g o peration. Th e B yte Pro gram comma nd sequence should be reinitiated once the device has reset to reading array data, to ensure data integrity. Write Program Command Sequence Programming is allowed in any sequence and across sector boundaries. A bit cannot be programmed from a “0” back to a “1”. Attempting to do so may halt the operation and set DQ5 to “1,” or cause the Data# Polling algorithm to indicate the operation was successful. However, a succeeding read shows that the data is still “0”. Only erase operations can convert a “0” to a “1”. Data Poll from System Embedded Program algorithm in progress Verify Data? Unlock Bypass Command Sequence The unlock bypass feature allows the system to program bytes to the device faster than using the standard program command sequence. The unlock bypass command sequence is initiated by first writing two unlock cycles. This is followed by a third write cycle containing the unlock bypass command, 20h. The device then enters the unlock bypass mode. A twocycle unlock bypass program command sequence is all that is required to program in this mode. The first cycle in this sequence contains the unlock bypass program command, A0h; the second cycle contains the program address and data. Additional data is programmed in the same manner. This mode dispenses with the initial two unlock cycles required in the standard program command sequence, resulting in faster total programming time. Table 5 on page 17 shows the requirements for the command sequence. During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system must issue the two-cycle unlock bypass reset command sequence. The first cycle must contain the data 90h; the second cycle the data 00h. Addresses are don’t cares for both cycles. The device then returns to reading array data. Figure 3 illustrates the algorithm for the program operation. See the table “Erase/Program Operations” on page 28 for parameters, and Figure 15, on page 29 for timing diagrams. No Yes Increment Address No Last Address? Yes Programming Completed Note: See Table 5 on page 17 for program command sequence. Figure 3. Program Operation Chip Erase Command Sequence Chip erase is a six bus cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the chip erase command, which in turn invokes the Embedded Erase algorithm. The device does not require the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. Table 5 on page 17 shows the address and data requirements for the chip erase command sequence. Any commands wr itten to the chip dur ing the Embedded Erase algorithm are ignored. Note that a hardware reset during the chip erase operation immediately terminates the operation. The Chip Erase command sequence should be reinitiated once the 14 Am29LV001B 21557F4 May 5, 2006 DATA SHEET device has returned to reading array data, to ensure data integrity. The system can determine the status of the erase operation by using DQ7, DQ6, or DQ2. See “Write Operation Status” on page 18 for information on these status bits. When the Embedded Erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. Figure 4, on page 16 illustrates the algorithm for the erase operation. See the tables “Erase/Program Operations” on page 28 for parameters, and Figure 16, on page 30 for timing diagrams. Sector Erase Command Sequence Sector erase is a six bus cycle operation. The sector erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the address of the sector to be erased, and the sector erase command. Table 5 on page 17 shows the address and data requirements for the sector erase command sequence. The device does not require the system to preprogram the memory prior to erase. The Embedded Erase algorithm automatically programs and verifies the sector for an all zero data pattern prior to electrical erase. The system is not required to provide any controls or timings during these operations. After the command sequence is written, a sector erase time-out of 50 µs begins. During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any sequence, and the number of sectors may be from one sector to all sectors. The time between these additional cycles must be less than 50 µs, otherwise the last address and command might not be accepted, and erasure may begin. It is recommended that processor interrupts be disabled during this time to ensure all commands are accepted. The interrupts can be re-enabled after the last Sector Erase command is written. If the time between additional sector erase commands can be assumed to be less than 50 µs, the system need not monitor DQ3. Any command other than Sector Erase or Erase Suspend during the time-out period resets the device to reading array data. The system must rewrite the command sequence and any additional sector addresses and commands. The system can monitor DQ3 to determine if the sector erase timer has timed out. (See “DQ3: Sector Erase Timer” on page 20.) The time-out begins from the rising edge of the final WE# pulse in the command sequence. Once the sector erase operation has begun, only the Erase Suspend command is valid. All other commands are ignored. Note that a hardware reset during the May 5, 2006 21557F4 sector erase operation immediately terminates the operation. The Sector Erase command sequence should be reinitiated once the device has returned to reading array data, to ensure data integrity. When the Embedded Erase algorithm is complete, the device returns to reading array data and addresses are no longer latched. The system can determine the status of the erase operation by using DQ7, DQ6, or DQ2. (Refer to “Write Operation Status” on page 18 for information on these status bits.) Figure 4 illustrates the algorithm for the erase operation. Refer to the tables “Erase/Program Operations” on page 28 for parameters, and Figure 16, on page 30 for timing diagrams. Erase Suspend/Erase Resume Commands The Erase Suspend command allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for erasure. This command is valid only during the sector erase operation, including the 50 µs time-out period during the sector erase command sequence. The Erase Suspend command is ignored if written during the chip erase operation or Embedded Program algorithm. Writing the Erase Suspend command during the Sector Erase time-out immediately terminates the time-out period and suspends the erase operation. Addresses are “don’t-cares” when writing the Erase Suspend command. When the Erase Suspend command is written during a sector erase operation, the device requires a maximum of 20 µs to suspend the erase operation. However, when the Erase Suspend command is written during the sector erase time-out, the device immediately terminates the time-out period and suspends the erase operation. After the erase operation has been suspended, the system can read array data from or program data to any sector not selected for erasure. (The device “erase suspends” all sectors selected for erasure.) Normal read and write timings and command definitions apply. Reading at any address within erase-suspended sectors produces status data on DQ7–DQ0. The system can use DQ7, or DQ6 and DQ2 together, to determine if a sector is actively erasing or is erase-suspended. See “Write Operation Status” on page 18 for information on these status bits. After an erase-suspended program operation is complete, the system can once again read array data within non-suspended sectors. The system can determine the status of the program operation using the DQ7 or DQ6 status bits, just as in the standard program operation. See “Write Operation Status” on page 18 for more information. Am29LV001B 15 DATA SHEET The system may also write the autoselect command sequence when the device is in the Erase Suspend mode. The device allows reading autoselect codes even at addresses within erasing sectors, since the codes are not stored in the memory array. When the device exits the autoselect mode, the device reverts to the Erase Suspend mode, and is ready for another valid operation. See “Autoselect Command Sequence” on page 13 for more information. START Write Erase Command Sequence The system must write the Erase Resume command (address bits are “don’t care”) to exit the erase suspend mode and continue the sector erase operation. Further writes of the Resume command are ignored. Another Erase Suspend command can be written after the device has resumed erasing. Data Poll from System No Embedded Erase algorithm in progress Data = FFh? Yes Erasure Completed Notes: 1. See Table 5 on page 17 for erase command sequence. 2. See “DQ3: Sector Erase Timer” on page 20 for more information. Figure 4. 16 Am29LV001B Erase Operation 21557F4 May 5, 2006 DATA SHEET Command Definitions Command Sequence (Note 1) Cycles Table 5. Am29LV001B Command Definitions Bus Cycles (Notes 2–4) First Second Addr Data RD Third Fourth Addr Data Addr Data Addr Data 01 Read (Note 5) 1 RA Reset (Note 6) 1 XXX F0 4 555 AA 2AA 55 555 90 X00 4 555 AA 2AA 55 555 90 X01 Autoselect (Note 7) Manufacturer ID Device ID, Top Boot Block Sixth Data Addr Data ED Device ID, Bottom Boot Block Sector Protect Verify (Note 8) Fifth Addr 6D 4 555 AA 2AA 55 555 90 SA X02 00 PA PD 01 Byte Program 4 555 AA 2AA 55 555 A0 Unlock Bypass 3 555 AA 2AA 55 555 20 Unlock Bypass Program (Note 9) 2 XXX A0 PA PD Unlock Bypass Reset (Note 10) 2 XXX 90 XXX 00 Chip Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 555 10 Sector Erase 6 555 AA 2AA 55 555 80 555 AA 2AA 55 SA 30 Erase Suspend (Note 11) 1 XXX B0 Erase Resume (Note 12) 1 XXX 30 Legend: X = Don’t care PD = Data to be programmed at location PA. Data is latched on the rising edge of WE# or CE# pulse. RA = Address of the memory location to be read. RD = Data read from location RA during read operation. PA = Address of the memory location to be programmed. Addresses are latched on the falling edge of the WE# or CE# pulse. Notes: 1. See Table 1 on page 7 for descriptions of bus operations. 2. All values are in hexadecimal. SA = Address of the sector to be erased or verified. Address bits A16–A12 uniquely select any sector. cycle is composed of the sector address (A16–A12), A1 = 1, and A0 = 0. 3. Except when reading array or autoselect data, all bus cycles are write operations. 9. The Unlock Bypass command is required prior to the Unlock Bypass Program command. 4. Address bits A16–A11 are don’t care for unlock and command cycles, unless SA or PA required. 10. The Unlock Bypass Reset command is required to return to reading array data when the device is in the Unlock Bypass mode. 5. No unlock or command cycles required when device is in read mode. 6. The Reset command is required to return to the read mode when the device is in the autoselect mode or if DQ5 goes high. 7. The fourth cycle of the autoselect command sequence is a read cycle. 8. The data is 00h for an unprotected sector and 01h for a protected sector. The complete bus address in the fourth May 5, 2006 21557F4 11. The system may read and program functions in nonerasing sectors, or enter the autoselect mode, when in the Erase Suspend mode. The Erase Suspend command is valid only during a sector erase operation. 12. The Erase Resume command is valid only during the Erase Suspend mode. 13. See “Erase and Programming Performance” on page 36 for more information. Am29LV001B 17 DATA SHEET WRITE OPERATION STATUS The device provides several bits to determine the status of a write operation: DQ2, DQ3, DQ5, DQ6, and DQ7. Table 6 on page 21 and the following subsections describe the functions of these bits. DQ7, and DQ6 each offer a method for determining whether a program or erase operation is complete or in progress. These three bits are discussed first. START Read DQ7–DQ0 Addr = VA DQ7: Data# Polling The Data# Polling bit, DQ7, indicates to the host system whether an Embedded Algorithm is in progress or completed, or whether the device is in Erase Suspend. Data# Polling is valid after the rising edge of the final WE# pulse in the program or erase command sequence. During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to programming during Erase Suspend. When the Embedded Program algorithm is complete, the device outputs the datum programmed to DQ7. The system must provide the program address to read valid status information on DQ7. If a program address falls within a protected sector, Data# Polling on DQ7 is active for approximately 1 µs, then the device returns to reading array data. During the Embedded Erase algorithm, Data# Polling produces a “0” on DQ7. When the Embedded Erase algorithm is complete, or if the device enters the Erase Suspend mode, Data# Polling produces a “1” on DQ7. This is analogous to the complement/true datum output described for the Embedded Program algorithm: the erase function changes all the bits in a sector to “1”; prior to this, the device outputs the “complement,” or “0.” The system must provide an address within any of the sectors selected for erasure to read valid status information on DQ7. After an erase command sequence is written, if all sectors selected for erasing are protected, Data# Polling on DQ7 is active for approximately 100 µs, then the device returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. When the system detects DQ7 has changed from the complement to true data, it can read valid data at DQ7– DQ0 on the following read cycles. This is because DQ7 may change asynchronously with DQ0–DQ6 while Output Enable (OE#) is asserted low. Figure 17, on page 31, Data# Polling Timings (During Embedded Algorithms), illustrates this. Table 6 on page 21 shows the outputs for Data# Polling on DQ7. Figure 5 shows the Data# Polling algorithm. 18 DQ7 = Data? Yes No No DQ5 = 1? Yes Read DQ7–DQ0 Addr = VA DQ7 = Data? Yes No FAIL PASS Notes: 1. VA = Valid address for programming. During a sector erase operation, a valid address is an address within any sector selected for erasure. During chip erase, a valid address is any non-protected sector address. 2. DQ7 should be rechecked even if DQ5 = “1” because DQ7 may change simultaneously with DQ5. Figure 5. Data# Polling Algorithm DQ6: Toggle Bit I Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm is in progress or complete, or whether the device has entered the Erase Suspend mode. Toggle Bit I may be read at any address, and is valid after the rising edge of the final WE# pulse in the Am29LV001B 21557F4 May 5, 2006 DATA SHEET command sequence (prior to the program or erase operation), and during the sector erase time-out. During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle (The system may use either OE# or CE# to control the read cycles). When the operation is complete, DQ6 stops toggling. After an erase command sequence is written, if all sectors selected for erasing are protected, DQ6 toggles for approximately 100 µs, then returns to reading array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected. The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erasesuspended. When the device is actively erasing (that is, the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the subsection on DQ7: Data# Polling). If a program address falls within a protected sector, DQ6 toggles for approximately 1 µs after the program command sequence is written, then returns to reading array data. DQ6 also toggles during the erase-suspend-program mode, and stops toggling once the Embedded Program algorithm is complete. Table 6 on page 21 shows the outputs for Toggle Bit I on DQ6. Figure 6, on page 20 shows the toggle bit algorithm in flowchart form, and the section “Reading Toggle Bits DQ6/DQ2” on page 19 explains the algorithm. Figure 18, on page 31 shows the toggle bit timing diagrams. Figure 19, on page 32 shows the differences between DQ2 and DQ6 in graphical form. See also the subsection on “DQ2: Toggle Bit II”, next. DQ2: Toggle Bit II The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular sector is actively erasing (that is, the Embedded Erase algorithm is in progress), or whether that sector is erase-suspended. Toggle Bit II is valid after the rising edge of the final WE# pulse in the command sequence. DQ2 toggles when the system reads at addresses within those sectors that were selected for erasure. (The system may use either OE# or CE# to control the read cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or is erase-suspended. DQ6, by comparison, indicates whether the device is actively erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected for erasure. Thus, both May 5, 2006 21557F4 status bits are required for sector and mode information. Refer to Table 6 on page 21 to compare outputs for DQ2 and DQ6. Figure 6, on page 20 shows the toggle bit algorithm in flowchart form, and the section “Reading Toggle Bits DQ6/DQ2” explains the algorithm. See also the DQ6: Toggle Bit I subsection. Figure 18, on page 31 shows the toggle bit timing diagram. Figure 19, on page 32 shows the differences between DQ2 and DQ6 in graphical form. Reading Toggle Bits DQ6/DQ2 Refer to Figure 6, on page 20 for the following discussion. Whenever the system initially begins reading toggle bit status, it must read DQ7–DQ0 at least twice in a row to determine whether a toggle bit is toggling. Typically, the system would note and store the value of the toggle bit after the first read. After the second read, the system would compare the new value of the toggle bit with the first. If the toggle bit is not toggling, the device has completed the program or erase operation. The system can read array data on DQ7–DQ0 on the following read cycle. However, if after the initial two read cycles, the system determines that the toggle bit is still toggling, the system also should note whether the value of DQ5 is high (see the section on “DQ5: Exceeded Timing Limits” on page 19). If it is, the system should then determine again whether the toggle bit is toggling, since the toggle bit may have stopped toggling just as DQ5 went high. If the toggle bit is no longer toggling, the device has successfully completed the program or erase operation. If it is still toggling, the device did not completed the operation successfully, and the system must write the reset command to return to reading array data. The remaining scenario is that the system initially determines that the toggle bit is toggling and DQ5 has not gone high. The system may continue to monitor the toggle bit and DQ5 through successive read cycles, determining the status as described in the previous paragraph. Alternatively, it may choose to perform other system tasks. In this case, the system must start at the beginning of the algorithm when it returns to determine the status of the operation (top of Figure 6, on page 20). Table 6 on page 21 shows the outputs for Toggle Bit I on DQ6. Figure 6, on page 20 shows the toggle bit algorithm. Figure 18, on page 31 shows the toggle bit timing diagrams. Figure 19, on page 32 shows the differences between DQ2 and DQ6 in graphical form. See also the subsection on “DQ2: Toggle Bit II” on page 19. DQ5: Exceeded Timing Limits DQ5 indicates whether the program or erase time has exceeded a specified internal pulse count limit. Under Am29LV001B 19 DATA SHEET these conditions DQ5 produces a “1.” This is a failure condition that indicates the program or erase cycle was not successfully completed. START The DQ5 failure condition may appear if the system tries to program a “1” to a location that is previously programmed to “0.” Only an erase operation can change a “0” back to a “1.” Under this condition, the device halts the operation, and when the operation has exceeded the timing limits, DQ5 produces a “1.” Read DQ7–DQ0 Read DQ7–DQ0 Toggle Bit = Toggle? (Note 1) Under both these conditions, the system must issue the reset command to return the device to reading array data. No DQ3: Sector Erase Timer After writing a sector erase command sequence, the system may read DQ3 to determine whether or not an erase operation has begun. (The sector erase timer does not apply to the chip erase command.) If additional sectors are selected for erasure, the entire timeout also applies after each additional sector erase command. When the time-out is complete, DQ3 switches from “0” to “1.” If the time between additional sector erase commands from the system can be assumed to be less than 50 µs, the system need not monitor DQ3. See also “Sector Erase Command Sequence” on page 15. Yes No DQ5 = 1? Yes Read DQ7–DQ0 Twice Toggle Bit = Toggle? (Notes 1, 2) No Yes Program/Erase Operation Not Complete, Write Reset Command Program/Erase Operation Complete Notes: 1. Read toggle bit twice to determine whether or not it is toggling. See text. 2. Recheck toggle bit because it may stop toggling as DQ5 changes to “1”. See text. Figure 6. 20 After the sector erase command sequence is written, the system should read the status on DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure the device has accepted the command sequence, and then read DQ3. If DQ3 is “1”, the internally controlled erase cycle has begun; all further commands (other than Erase Suspend) are ignored until the erase operation is complete. If DQ3 is “0”, the device accepts additional sector erase commands. To ensure the command has been accepted, the system software should check the status of DQ3 prior to and following each subsequent sector erase command. If DQ3 is high on the second status check, the last command might not have been accepted. Table 6 on page 21 shows the outputs for DQ3. Toggle Bit Algorithm Am29LV001B 21557F4 May 5, 2006 DATA SHEET Table 6. DQ7 (Note 2) DQ6 DQ5 (Note 1) DQ3 DQ2 (Note 2) DQ7# Toggle 0 N/A No toggle Embedded Erase Algorithm 0 Toggle 0 1 Toggle Reading within Erase Suspended Sector 1 No toggle 0 N/A Toggle Reading within Non-Erase Suspended Sector Data Data Data Data Data Erase-Suspend-Program DQ7# Toggle 0 N/A N/A Operation Standard Mode Erase Suspend Mode Write Operation Status Embedded Program Algorithm Notes: 1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation has exceeded the maximum timing limits. See “DQ5: Exceeded Timing Limits” for more information. 2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further details. May 5, 2006 21557F4 Am29LV001B 21 DATA SHEET ABSOLUTE MAXIMUM RATINGS Storage Temperature Plastic Packages . . . . . . . . . . . . . . . –65°C to +150°C Ambient Temperature with Power Applied. . . . . . . . . . . . . . –65°C to +125°C Voltage with Respect to Ground All pins except A9, OE# and RESET# (Note 1) . . . . . . . . . . . . . . . . . . . –0.5 V to VCC+0.5 V VCC (Note 1). . . . . . . . . . . . . . . . . . . . –0.5 V to +3.6 V 20 ns 20 ns +0.8 V –0.5 V –2.0 A9, OE#, and RESET# (Note 2) . . . –0.5 V to +12.5 V 20 ns Output Short Circuit Current (Note 3) . . . . . . 200 mA Notes: 1. Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions, input or I/O pins may undershoot VSS to –2.0 V for periods of up to 20 ns. See Figure 7. Maximum DC voltage on input or I/O pins is VCC +0.5 V. During voltage transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20 ns. See Figure 8. 2. Minimum DC input voltage on pins A9, OE#, and RESET# is –0.5 V. During voltage transitions, A9, OE#, and RESET# may undershoot VSS to –2.0 V for periods of up to 20 ns. See Figure 7. Maximum DC input voltage on pin A9 is +12.5 V which may overshoot to 14.0 V for periods up to 20 ns. 3. No more than one output may be shorted to ground at a time. Duration of the short circuit should not be greater than one second. Figure 7. Maximum Negative Overshoot Waveform 20 ns VCC +2.0 V VCC +0.5 V 2.0 V 4. Stresses above those listed under “Absolute Maximum Ratings” may cause permanent damage to the device. This is a stress rating only; functional operation of the device at these or any other conditions above those indicated in the operational sections of this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability. 20 ns 20 ns Figure 8. Maximum Positive Overshoot Waveform OPERATING RANGES Commercial (C) Devices Ambient Temperature (TA) . . . . . . . . . . . 0°C to +70°C Industrial (I) Devices Ambient Temperature (TA) . . . . . . . . . –40°C to +85°C Extended (E) Devices Ambient Temperature (TA) . . . . . . . . –55°C to +125°C VCC Supply Voltages VCC for regulated voltage range. . . . . . +3.0 V to 3.6 V VCC for full voltage range . . . . . . . . . . . +2.7 V to 3.6 V Operating ranges define those limits between which the functionality of the device is guaranteed. 22 Am29LV001B 21557F4 May 5, 2006 DATA SHEET DC CHARACTERISTICS CMOS Compatible Parameter Description Test Conditions Min Typ Max Unit ±1.0 µA ILI Input Load Current VIN = VSS to VCC, VCC = VCC max ILIT A9 Input Load Current VCC = VCC max; A9 = 12.5 V 35 µA ILR RESET# Input Load Current VCC = VCC max; RESET# = 12.5 V 35 µA ILO Output Leakage Current VOUT = VSS to VCC, VCC = VCC max ±1.0 µA ICC1 VCC Active Read Current (Notes 1, 2) CE# = VIL, OE# = VIH ICC2 VCC Active Write Current (Notes 2, 3, 5) ICC3 5 MHz 7 12 1 MHz 2 4 CE# = VIL, OE# = VIH 15 30 mA VCC Standby Current (Note 2) CE#, RESET# = VCC ± 0.3 V 0.2 5 µA ICC4 VCC Reset Current (Note 2) RESET# = VSS ± 0.3 V 0.2 5 µA ICC5 Automatic Sleep Mode (Notes 2, 4) VIH = VCC ± 0.3 V; VIL = VSS ± 0.3 V 0.2 5 µA VIL Input Low Voltage –0.5 0.8 V VIH Input High Voltage 0.7 x VCC VCC + 0.3 V VID Voltage for Autoselect and VCC = 3.3 V Temporary Sector Unprotect 11.5 12.5 V VOL Output Low Voltage 0.45 V VOH1 Output High Voltage VOH2 VLKO mA IOL = 4.0 mA, VCC = VCC min IOH = –2.0 mA, VCC = VCC min 0.85 VCC IOH = –100 µA, VCC = VCC min VCC–0.4 Low VCC Lock-Out Voltage (Note 5) 2.3 V 2.5 V Notes: 1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. 2. Maximum ICC specifications are tested with VCC = VCCmax. 3. ICC active while Embedded Erase or Embedded Program is in progress. 4. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns. Typical sleep mode current is 200 nA. 5. Not 100% tested. May 5, 2006 21557F4 Am29LV001B 23 DATA SHEET DC CHARACTERISTICS (CONTINUED) Zero Power Flash Supply Current in mA 20 15 10 5 0 0 500 1000 1500 2000 2500 3000 3500 4000 Time in ns Note: Addresses are switching at 1 MHz Figure 9. ICC1 Current vs. Time (Showing Active and Automatic Sleep Currents) 10 Supply Current in mA 8 3.6 V 6 2.7 V 4 2 0 1 2 3 4 5 Frequency in MHz Note: T = 25 °C Figure 10. 24 Typical ICC1 vs. Frequency Am29LV001B 21557F4 May 5, 2006 DATA SHEET TEST CONDITIONS Table 7. Test Specifications 3.3 -45R, -55 Test Condition 2.7 kW Device Under Test CL Output Load 30 Input Rise and Fall Times Figure 11. Test Setup 100 pF 5 ns 0.0–3.0 V Input timing measurement reference levels 1.5 V Output timing measurement reference levels 1.5 V Input Pulse Levels Note: Diodes are IN3064 or equivalent Unit 1 TTL gate Output Load Capacitance, CL (including jig capacitance) 6.2 kW -70, -90 KEY TO SWITCHING WAVEFORMS WAVEFORM INPUTS OUTPUTS Steady Changing from H to L Changing from L to H 3.0 V Input Don’t Care, Any Change Permitted Changing, State Unknown Does Not Apply Center Line is High Impedance State (High Z) 1.5 V Measurement Level 1.5 V Output 0.0 V Figure 12. May 5, 2006 21557F4 Input Waveforms and Measurement Levels Am29LV001B 25 DATA SHEET AC CHARACTERISTICS Read Operations Parameter Speed Option JEDEC Std Description tAVAV tRC Read Cycle Time (Note 1) tAVQV tACC Address to Output Delay tELQV tCE Chip Enable to Output Delay tGLQV tOE tEHQZ tGHQZ tAXQX Test Setup -45R -55 -70 -90 Unit Min 45 55 70 90 ns CE# = VIL OE# = VIL Max 45 55 70 90 ns OE# = VIL Max 45 55 70 90 ns Output Enable to Output Delay Max 25 30 30 35 ns tDF Chip Enable to Output High Z (Note 1) Max 10 15 16 16 ns tDF Output Enable to Output High Z (Note 1) Max 10 15 16 16 ns Read Output Enable Hold Time (Note 1) Toggle and Data# Polling Min 0 ns tOEH Min 10 ns tOH Output Hold Time From Addresses, CE# or OE#, Whichever Occurs First (Note 1) Min 0 ns Note: 1. Not 100% tested. 2. See Figure 11 and Table 7 for test specifications. tRC Addresses Stable Addresses tACC CE# tDF tOE OE# tOEH WE# tCE tOH HIGH Z HIGH Z Output Valid Outputs RESET# n/a Am29F002NB Figure 13. 26 Read Operations Timings Am29LV001B 21557F4 May 5, 2006 DATA SHEET AC CHARACTERISTICS Hardware Reset (RESET#) Parameter JEDEC Std Description Test Setup All Speed Options Unit tREAD RESET# Pin Low (During Embedded Algorithms) to Read or Write (See Note) Y Max 20 µs RESET# Pin Low (NOT During Embedded Algorithms) to Read or Write (See Note) Max 500 ns tRP RESET# Pulse Width Min 500 ns tRH RESET# High Time Before Read (See Note) Min 50 ns tRPD RESET# Low to Standby Mode Min 20 µs tREAD Y Note: Not 100% tested. CE#, OE# tRH RESET# n/a Am29F002NB tRP tReady Reset Timings NOT during Embedded Algorithms Reset Timings during Embedded Algorithms RESET# n/a Am29F002NB tRP Figure 14. May 5, 2006 21557F4 RESET# Timings Am29LV001B 27 DATA SHEET AC CHARACTERISTICS Erase/Program Operations Parameter Speed Options JEDEC Std Description tAVAV tWC Write Cycle Time (Note 1) Min tAVWL tAS Address Setup Time Min tWLAX tAH Address Hold Time Min 35 45 45 45 ns tDVWH tDS Data Setup Time Min 20 20 35 45 ns tWHDX tDH Data Hold Time Min 0 ns tOES Output Enable Setup Time (Note 1) Min 0 ns tGHWL tGHWL Read Recovery Time Before Write (OE# High to WE# Low) Min 0 ns tELWL tCS CE# Setup Time Min 0 ns tWHEH tCH CE# Hold Time Min 0 ns tWLWH tWP Write Pulse Width Min tWHWL tWPH Write Pulse Width High Min 30 ns Programming Operation (Note 2) Typ 9 µs Sector Erase Operation (Note 2) Typ 0.7 sec VCC Setup Time (Note 1) Min 50 µs tWHWH1 tWHWH2 tWHWH -45R -55 -70 -90 Unit 45 55 70 90 ns 0 25 30 ns 35 35 ns 1 tWHWH 2 tVCS Notes: 1. Not 100% tested. 2. See “Erase and Programming Performance” for more information. 28 Am29LV001B 21557F4 May 5, 2006 DATA SHEET AC CHARACTERISTICS Program Command Sequence (last two cycles) tAS tWC Addresses Read Status Data (last two cycles) 555h PA PA PA tAH CE# tCH OE# tWHWH1 tWP WE# tWPH tCS tDS tDH A0h Data PD Status DOUT VCC tVCS Note: PA = program address, PD = program data, DOUT is the true data at the program address. Figure 15. May 5, 2006 21557F4 Program Operation Timings Am29LV001B 29 DATA SHEET AC CHARACTERISTICS Erase Command Sequence (last two cycles) tAS tWC 2AAh Addresses Read Status Data VA SA VA 555h for chip erase tAH CE# tCH OE# tWP WE# tWPH tCS tWHWH2 tDS tDH Data 55h 30h In Progress Complete 10 for Chip Erase tVCS VCC Note: SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status”). Figure 16. 30 Chip/Sector Erase Operation Timings Am29LV001B 21557F4 May 5, 2006 DATA SHEET AC CHARACTERISTICS tRC Addresses VA VA VA tACC tCE CE# tCH tOE OE# tOEH tDF WE# tOH High Z DQ7 Complement Complement DQ0–DQ6 Status Data Status Data Valid Data True High Z Valid Data True Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array data read cycle. Figure 17. Data# Polling Timings (During Embedded Algorithms) tRC Addresses VA VA VA VA tACC tCE CE# tCH tOE OE# tOEH tDF WE# tOH DQ6/DQ2 High Z Valid Status Valid Status (first read) (second read) Valid Status Valid Data (stops toggling) Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last status read cycle, and array data read cycle. Figure 18. May 5, 2006 21557F4 Toggle Bit Timings (During Embedded Algorithms) Am29LV001B 31 DATA SHEET AC CHARACTERISTICS Enter Embedded Erasing Erase Suspend Erase Resume Erase Erase Suspend Suspend Read Program Erase Suspend Read Erase WE# Enter Erase Suspend Program Erase Complete Erase DQ6 DQ2 Note: The system can use OE# or CE# to toggle DQ2/DQ6. DQ2 toggles only when read at an address within an erase-suspended sector. Figure 19. DQ2 vs. DQ6 Temporary Sector Unprotect Parameter JEDEC Std Description All Speed Options Unit tVIDR VID Rise and Fall Time Min 500 ns tRSP RESET# Setup Time for Temporary Sector Unprotect Min 4 µs Note: Not 100% tested. 12 V RESET# 0 or 3 V 0 or 3 V tVIDR tVIDR Program or Erase Command Sequence CE# WE# tRSP Figure 20. 32 Temporary Sector Unprotect Timing Diagram Am29LV001B 21557F4 May 5, 2006 DATA SHEET AC CHARACTERISTICS VID VIH RESET# SA, A6, A1, A0 Valid* Valid* Sector Protect/Unprotect Data 60h 1 µs Valid* Verify 60h 40h Status Sector Protect: 100 µs Sector Unprotect: 10 ms CE# WE# OE# Note: For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0. Figure 21. May 5, 2006 21557F4 In-System Sector Protect/Unprotect Timing Diagram Am29LV001B 33 DATA SHEET AC CHARACTERISTICS Alternate CE# Controlled Erase/Program Operations Parameter Speed Options JEDEC Std Description -45 -55 -70 -90 Unit tAVAV tWC Write Cycle Time (Note 1) Min 45 55 70 90 ns tAVEL tAS Address Setup Time Min tELAX tAH Address Hold Time Min 35 45 45 45 ns tDVEH tDS Data Setup Time Min 20 20 35 45 ns tEHDX tDH Data Hold Time Min 0 ns tOES Output Enable Setup Time (Note 1) Min 0 ns tGHEL tGHEL Read Recovery Time Before Write (OE# High to WE# Low) Min 0 ns tWLEL tWS WE# Setup Time Min 0 ns tEHWH tWH WE# Hold Time Min 0 ns tELEH tCP CE# Pulse Width Min tEHEL tCPH CE# Pulse Width High Min 30 ns tWHWH1 tWHWH1 Programming Operation (Notes 1, 2) Typ 9 µs tWHWH2 tWHWH2 Sector Erase Operation (Notes 1, 2) Typ 0.7 sec 0 25 30 ns 35 35 ns Notes: 1. Not 100% tested. 2. See “Erase and Programming Performance” on page 36 for more information. 34 Am29LV001B 21557F4 May 5, 2006 DATA SHEET AC CHARACTERISTICS 555 for program 2AA for erase PA for program SA for sector erase 555 for chip erase Data# Polling Addresses PA tWC tAS tAH tWH WE# tGHEL OE# tCP CE# tWS tWHWH1 or 2 tCPH tDS tDH DQ7# Data tRH A0 for program 55 for erase DOUT PD for program 30 for sector erase 10 for chip erase RESET# Notes: 1. Figure indicates the last two bus cycles of the program or erase command sequence. 2. PA program address, SA = Sector Address, PD = program data, DQ7# = complement of the data written to the device, DOUT = data written to the device. Figure 22. May 5, 2006 21557F4 Alternate CE# Controlled Write Operation Timings Am29LV001B 35 DATA SHEET ERASE AND PROGRAMMING PERFORMANCE Parameter Typ (Note 1) Max (Note 2) Unit Comments 0.7 15 s Excludes 00h programming prior to erasure (Note 4) Sector Erase Time Chip Erase Time 7 Byte Programming Time 9 300 µs 1.1 3.3 s Chip Programming Time (Note 3) s Excludes system level overhead (Note 5) Notes: 1. Typical program and erase times assume the following conditions: 25×C, 3.0 V VCC, 1,000,000 cycles. Additionally, programming typicals assume checkerboard pattern. 2. Under worst case conditions of 90°C, VCC = 2.7 V (3.0 V for -45R), 1,000,000 cycles. 3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes program faster than the maximum program times listed. 4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure. 5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See Table 5 on page 17 for further information on command definitions. 6. The device has a minimum erase and program cycle endurance of 1,000,000 cycles. LATCHUP CHARACTERISTICS Description Min Max Input voltage with respect to VSS on all pins except I/O pins (including A9, OE#, and RESET#) –1.0 V 13.0 V Input voltage with respect to VSS on all I/O pins –1.0 V VCC + 1.0 V –100 mA +100 mA VCC Current Includes all pins except VCC. Test conditions: VCC = 3.0 V, one pin at a time. TSOP PIN CAPACITANCE Parameter Symbol Parameter Description Test Setup Typ Max Unit CIN Input Capacitance VIN = 0 6 7.5 pF COUT Output Capacitance VOUT = 0 8.5 12 pF CIN2 Control Pin Capacitance VIN = 0 7.5 9 pF Typ Max Unit Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. PLCC PIN CAPACITANCE Parameter Symbol CIN Parameter Description Test Setup Input Capacitance VIN = 0 4 6 pF COUT Output Capacitance VOUT = 0 8 12 pF CIN2 Control Pin Capacitance VPP = 0 8 12 pF Notes: 1. Sampled, not 100% tested. 2. Test conditions TA = 25°C, f = 1.0 MHz. 36 Am29LV001B 21557F4 May 5, 2006 DATA SHEET DATA RETENTION Parameter Test Conditions Min Unit 150×C 10 Years 125×C 20 Years Minimum Pattern Data Retention Time May 5, 2006 21557F4 Am29LV001B 37 DATA SHEET PHYSICAL DIMENSIONS PL 032—32-Pin Plastic Leaded Chip Carrier Dwg rev AH; 10/99 38 Am29LV001B 21557F4 May 5, 2006 DATA SHEET PHYSICAL DIMENSIONS* TS 032—32-Pin Standard Thin Small Outline Package Dwg rev AA; 10/99 * For reference only. BSC is an ANSI standard for Basic Space Centering. May 5, 2006 21557F4 Am29LV001B 39 DATA SHEET REVISION SUMMARY Revision A (January 1998) Physical Dimensions Initial release. (This revision also represented the Am29LV010B device.) Replaced figures with more detailed illustrations. Revision A+1 (February 1998) Revision E+1 (November 13, 2000) Added table of contents. Deleted the burn-in option from the Ordering Information section. Logic Symbol Deleted the BYTE# input from the drawing. (This revision also represented the Am29LV010B device.) Revision F (September 26, 2002) Revision B (April 1998) The 45 ns speed option is now available in the industrial temperature range. Split the Am29LV001B/Am29LV010B data sheet, with the elimination of all references to Am29LV010B. Revision C (April 1998) Global Command Definitions In the introductory paragraph, modified text to indicate that incorrectly written command sequences may place the device in an unknown state. Global Deleted 120 ns speed option; added 90 ns speed option. DC Characteristics Distinctive Characteristics Added RESET# input load current specification to table. Changed process technology to 0.35 µm. AC Characteristics, Read Operations Temporary Sector Unprotect Changed tDF to 16 ns for 70 and 90 ns speed options. Entered timing specifications for tVIDR and tRSP. Revision F+1 (October 21, 2004) Erase and Programming Performance Changed endurance in Note 2 to 1 million cycles; added worst case voltage for -45R speed option. Global Added Colophon Ordering Information Revision D (January 1999) Added temperature ranges for Pb-free package types Distinctive Characteristics Valid Combinations Changed process technology to 0.32 µm. Added valid combination types DC Characteristics—CMOS Compatible ICC1, ICC2, ICC3, ICC4, ICC5: Added Note 2 “Maximum ICC specifications are tested with VCC = VCCmax”. Revision F+2 (July 20, 2005) ICC3, ICC4: Deleted VCC = VCCmax. Changed to include Pb-free for PDIP or PLCC package. Figure 20. Temporary Sector Unprotect Timing Diagram Modified second tVIDR parameter. Ordering Information Revision F3 (February 20, 2006) Global Data Retention Removed Reverse TSOP option. Added new table. Revision F4 (May 5, 2006) Revision E (November 17, 1999) Global AC Characteristics—Figure 15. Program Operations Timing and Figure 16. Chip/Sector Erase Operations Added obsolescence information. Deleted tGHWL and changed OE# waveform to start at high. 40 Am29LV001B 21557F4 May 5, 2006 DATA SHEET Colophon The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control, medical life support system, missile launch control in weapon system), or (2) for any use where chance of failure is intolerable (i.e., submersible repeater and artificial satellite). Please note that Spansion LLC will not be liable to you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior authorization by the respective government entity will be required for export of those products. Trademarks Copyright © 2000–2006 Advanced Micro Devices, Inc. All rights reserved. AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc. ExpressFlash is a trademark of Advanced Micro Devices, Inc. Product names used in this publication are for identification purposes only and may be trademarks of their respective companies. May 5, 2006 21557F4 Am29LV001B 41