AMD AM29LV160MT90WAI

Am29LV160M
Data Sheet
RETIRED
PRODUCT
This product has been retired and is not available for designs. For new and current designs,
S29GL016A supersedes Am29LV160M and is the factory-recommended migration path. Please refer
to the S29GL016A datasheet for specifications and ordering information. Availability of this document is retained for reference and historical purposes only.
The following document contains information on Spansion memory products.
Continuity of Specifications
There is no change to this data sheet as a result of offering the device as a Spansion product. Any
changes that have been made are the result of normal data sheet improvement and are noted in the
document revision summary.
For More Information
Please contact your local sales office for additional information about Spansion memory solutions.
Publication Number 25974 Revision B
Amendment 5 Issue Date January 31, 2007
THIS PAGE LEFT INTENTIONALLY BLANK.
Am29LV160M
16 Megabit (2 M x 8-Bit/1 M x 16-Bit) MirrorBitTM
3.0 Volt-only Boot Sector Flash Memory
This product has been retired and is not available for designs. For new and current designs, S29GL016A supersedes Am29LV160M and is the factory-recommended migration path. Please refer to the S29GL016A datasheet for specifications and ordering information. Availability of this document is retained for
reference and historical purposes only.
Distinctive Characteristics
Architectural Advantages
„
Low power consumption (typical values at 5 MHz)
„
Single power supply operation
— 3 V for read, erase, and program operations
— 400 nA standby mode current
„
Manufactured on 0.23 µm MirrorBit process
technology
— Fully compatible with Am29LV160D device
— 40 mA program/erase current
„
Secured Silicon Sector region
— 128-word/256-byte sector for permanent, secure
identification through an 8-word/16-byte random
Electronic Serial Number, accessible through a
command sequence
— May be programmed and locked at the factory or by
the customer
„
Flexible sector architecture
— One 16 Kbyte, two 8 Kbyte, one 32 Kbyte, and thirtyone 64 Kbyte sectors (byte mode)
— One 8 Kword, two 4 Kword, one 16 Kword, and thirtyone 32 Kword sectors (word mode)
„
Compatibility with JEDEC standards
— Provides pinout and software compatibility for singlepower supply flash, and superior inadvertent write
protection
„
Top or bottom boot block configurations available
„
Minimum 100,000 erase cycle guarantee per sector
„
20-year data retention at 125°C
Performance Characteristics
„
— 15 mA read current
TM
— 400 nA Automatic Sleep mode current
„
Package options
— 48-ball Fine-pitch BGA
— 64-ball Fortified BGA
— 48-pin TSOP
Software Features
— Program Suspend & Resume: read other sectors
before programming operation is completed
— Erase Suspend & Resume: read/program other
sectors before an erase operation is completed
— Data# polling & toggle bits provide status
— Unlock Bypass Program command reduces overall
multiple-word programming time
— CFI (Common Flash Interface) compliant: allows host
system to identify and accommodate multiple flash
devices
Hardware Features
— Sector Protection: hardware-level method of
preventing write operations within a sector
— Temporary Sector Unprotect: VID-level method of
changing code in locked sectors
— Hardware reset input (RESET#) resets device
— Ready/Busy# output (RY/BY#) indicates program or
erase cycle completion
High performance
— Access times as fast as 70 ns
— 0.7 s typical sector erase time
Publication Number 25974
Revision B
Amendment 5
Issue Date January 31, 2007
This Data Sheet states AMD’s current specifications regarding the Products described herein. This Data Sheet may be revised by subsequent versions or modifications
due to changes in technical specifications.
D a t a
S h e e t
General Description
The Am29LV160M is a 16 Mbit, 3.0 Volt-only Flash memory organized as
2,097,152 bytes or 1,048,576 words. The device is offered in a 48-ball Fine-pitch
BGA, 64-ball Fortified BGA, and 48-pin TSOP packages. The word-wide data (x16)
appears on DQ15–DQ0; the byte-wide (x8) data appears on DQ7–DQ0. The device requires only a single 3.0 volt power supply for both read and write
functions, designed to be programmed in-system with the standard system 3.0
volt VCC supply. The device can also be programmed in standard
EPROM programmers.
The device offers access times of 70, 85, 90, and 100 ns. To eliminate bus contention the device contains separate chip enable (CE#), write enable (WE#) and
output enable (OE#) controls.
The device is entirely command set compatible with the JEDEC single-powersupply Flash standard. Commands are written to the device using standard
microprocessor write timing. Write cycles also internally latch addresses and data
needed for the programming and erase operations.
The sector erase architecture allows memory sectors to be erased and reprogrammed without affecting the data contents of other sectors. The device is fully
erased when shipped from the factory.
Device programming and erasure are initiated through command sequences.
Once a program or erase operation starts, the host system need only poll the
DQ7 (Data# Polling) or DQ6 (toggle) status bits or monitor the Ready/Busy#
(RY/BY#) output to determine whether the operation is complete. To facilitate
programming, an Unlock Bypass mode reduces command sequence overhead
by requiring only two write cycles to program data instead of four.
Hardware data protection measures include a low VCC detector that automatically inhibits write operations during power transitions. The hardware sector
protection feature disables both program and erase operations in any combination of sectors of memory. This can be achieved in-system or via programming
equipment.
The Erase Suspend/Erase Resume feature allows the host system to pause an
erase operation in a given sector to read or program any other sector and then
complete the erase operation. The Program Suspend/Program Resume feature enables the host system to pause a program operation in a given sector to
read any other sector and then complete the program operation.
The hardware RESET# pin terminates any operation in progress and resets the
device, after which it is then ready for a new operation. The RESET# pin may be
tied to the system reset circuitry. A system reset would thus also reset the device, enabling the host system to read boot-up firmware from the Flash memory
device.
The device reduces power consumption in the standby mode when it detects
specific voltage levels on CE# and RESET#, or when addresses are stable for a
specified period of time.
The Secured Silicon Sector provides a 128-word/256-byte area for code or
data that can be permanently protected. Once this sector is protected, no further
changes within the sector can occur.
MirrorBit flash technology combines years of Flash memory manufacturing experience to produce the highest levels of quality, reliability and cost effectiveness.
The device electrically erases all bits within a sector simultaneously via hot-hole
assisted erase. The data is programmed using hot electron injection.
2
Am29LV160M
25974B5 January 31, 2007
D a t a
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Table of Contents
Product Selector Guide . . . . . . . . . . . . . . . . . . . . . 4
Block Diagram . . . . . . . . . . . . . . . . . . . . . . . . . . . . 4
Connection Diagrams . . . . . . . . . . . . . . . . . . . . . . . 5
Logic Symbol . . . . . . . . . . . . . . . . . . . . . . . . . . . . . 8
Ordering Information . . . . . . . . . . . . . . . . . . . . . . . 9
Device Bus Operations . . . . . . . . . . . . . . . . . . . . . 10
Table 1. Am29LV160M Device Bus Operations .......................10
Word/Byte Configuration .................................................................. 10
Requirements for Reading Array Data ........................................... 10
Writing Commands/Command Sequences .....................................11
Program and Erase Operation Status ...............................................11
Standby Mode ...........................................................................................11
Automatic Sleep Mode .........................................................................12
RESET#: Hardware Reset Pin .............................................................12
Output Disable Mode ...........................................................................12
Table 2. Sector Address Tables (Am29LV160MT) ...................13
Table 3. Sector Address Tables (Am29LV160MB) ...................14
Autoselect Mode ....................................................................................15
Table 4. Autoselect Codes (High Voltage Method) ..................15
Sector Protection/Unprotection .......................................................15
Temporary Sector Unprotect ............................................................16
Figure 1. Temporary Sector Unprotect Operation................... 16
Figure 2. In-System Single High Voltage Sector Protect/
Unprotect Algorithms ........................................................ 17
Secured Silicon Sector Flash Memory Region .............................. 18
Table 5. Secured Silicon Sector Addressing ...........................18
Customer Lockable: Secured Silicon Sector NOT Programmed
or Protected At the Factory .............................................................. 18
Figure 3. Secured Silicon Sector Protect Verify ...................... 19
Common Flash Memory Interface (CFI) ....................................... 20
Table 6. CFI Query Identification String ...............................20
Table 7. System Interface String .........................................21
Table 8. Device Geometry Definition ....................................21
Table 9. Primary Vendor-Specific Extended Query .................22
Hardware Data Protection ................................................................22
Low VCC Write Inhibit ........................................................................22
Write Pulse “Glitch” Protection ......................................................22
Logical Inhibit ..........................................................................................23
Power-Up Write Inhibit ......................................................................23
Command Definitions . . . . . . . . . . . . . . . . . . . . . . 23
Reading Array Data ..............................................................................23
Reset Command ....................................................................................23
Autoselect Command Sequence ......................................................24
Word/Byte Program Command Sequence ...................................24
Unlock Bypass Command Sequence ...............................................25
Figure 4. Program Operation .............................................. 26
Chip Erase Command Sequence ......................................................26
Sector Erase Command Sequence ...................................................27
Erase Suspend/Erase Resume Commands .....................................27
Figure 5. Erase Operation .................................................. 29
DQ7: Data# Polling .............................................................................. 33
Figure 7. Data# Polling Algorithm ....................................... 34
RY/BY#: Ready/Busy# ..........................................................................34
DQ6: Toggle Bit I .................................................................................. 35
DQ2: Toggle Bit II ................................................................................. 35
Reading Toggle Bits DQ6/DQ2 ........................................................36
Figure 8. Toggle Bit Algorithm ............................................ 37
DQ5: Exceeded Timing Limits .......................................................... 37
DQ3: Sector Erase Timer ...................................................................38
Table 12. Write Operation Status ........................................ 38
Absolute Maximum Ratings . . . . . . . . . . . . . . . . . .39
Figure 9. Maximum Negative Overshoot Waveform ............... 39
Figure 10. Maximum Positive Overshoot Waveform ............... 39
Operating Ranges . . . . . . . . . . . . . . . . . . . . . . . . . 39
DC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . 40
Test Conditions . . . . . . . . . . . . . . . . . . . . . . . . . . . . 41
Figure 11. Test Setup........................................................ 41
Table 13. Test Specifications .............................................. 41
Figure 12. Input Waveforms and Measurement Levels ........... 41
AC Characteristics . . . . . . . . . . . . . . . . . . . . . . . . .42
Read Operations ...................................................................................42
Figure 13. Read Operations Timings.................................... 42
Hardware Reset (RESET#) .................................................................43
Figure 14. RESET# Timings ............................................... 43
Word/Byte Configuration (BYTE#) ..............................................44
Figure 15. BYTE# Timings for Read Operations..................... 44
Figure 16. BYTE# Timings for Write Operations .................... 44
Erase/Program Operations ................................................................45
Figure 17. Program Operation Timings ................................
Figure 18. Chip/Sector Erase Operation Timings ...................
Figure 19. Data# Polling Timings
(During Embedded Algorithms) ..........................................
Figure 20. Toggle Bit Timings
(During Embedded Algorithms) ..........................................
Figure 21. DQ2 vs. DQ6 for Erase and
Erase Suspend Operations .................................................
Figure 22. Temporary Sector Unprotect/Timing Diagram........
Figure 23. Sector Protect/Unprotect Timing Diagram .............
Figure 24. Alternate CE# Controlled Write Operation Timings .
46
47
48
48
49
49
50
52
Erase and Programming Performance . . . . . . . . .53
Latchup Characteristics . . . . . . . . . . . . . . . . . . . . 53
TSOP Pin and BGA Package Capacitance . . . . . 53
Data Retention. . . . . . . . . . . . . . . . . . . . . . . . . . . . 53
Physical Dimensions . . . . . . . . . . . . . . . . . . . . . . . .54
TS 048—48-Pin Standard TSOP ......................................................54
TSR048—48-Pin Reverse TSOP ......................................................55
FBA048—48-Ball Fine-Pitch Ball Grid Array (BGA)
6 x 8 mm Package .................................................................................56
LAA064—64-Ball Fortified Ball Grid Array (BGA)
13 x 11 mm Package ................................................................................57
Revision Summary . . . . . . . . . . . . . . . . . . . . . . . . 58
Program Suspend/Program Resume Command Sequence .......29
Figure 6. Program Suspend/Program Resume ....................... 30
Command Definitions Tables .............................................................31
Write Operation Status . . . . . . . . . . . . . . . . . . . . 33
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Am29LV160M
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D a t a
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Product Selector Guide
Family Part Number
Am29LV160M
70R
(Note 2)
Regulated Voltage Range: VCC = 3.0–3.6 V
Speed Option
Full Voltage Range: VCC = 2.7–3.6 V
85
(Note 2)
90
100
Max access time, ns (tACC)
70
85
90
100
Max CE# access time, ns (tCE)
70
85
90
100
Max OE# access time, ns (tOE)
30
35
35
50
Notes:
1. See “AC Characteristics” on page 42 for full specifications.
2. Contact sales office or representative for availability and ordering information.
Block Diagram
DQ15–DQ0 (A-1)
RY/BY#
VCC
Sector Switches
VSS
Erase Voltage
Generator
RESET#
WE#
BYTE#
Input/Output
Buffers
State
Control
Command
Register
PGM Voltage
Generator
Chip Enable
Output Enable
Logic
CE#
OE#
VCC Detector
Address Latch
STB
Timer
A19–A0
4
Am29LV160M
STB
Data
Latch
Y-Decoder
Y-Gating
X-Decoder
Cell Matrix
25974B5 January 31, 2007
D a t a
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Connection Diagrams
A15
A14
A13
A12
A11
A10
A9
A8
A19
NC
WE#
RESET#
NC
NC
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
A16
BYTE#
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
January 31, 2007 25974B5
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
23
24
Standard TSOP
Reverse TSOP
Am29LV160M
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
48
47
46
45
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
A16
BYTE#
VSS
DQ15/A-1
DQ7
DQ14
DQ6
DQ13
DQ5
DQ12
DQ4
VCC
DQ11
DQ3
DQ10
DQ2
DQ9
DQ1
DQ8
DQ0
OE#
VSS
CE#
A0
A15
A14
A13
A12
A11
A10
A9
A8
A19
NC
WE#
RESET#
NC
NC
RY/BY#
A18
A17
A7
A6
A5
A4
A3
A2
A1
5
D a t a
S h e e t
Connection Diagrams
Fine-pitch BGA
Top View, Balls Facing Down
6
A6
B6
C6
D6
E6
A13
A12
A14
A15
A16
A5
B5
C5
D5
E5
F5
G5
H5
A9
A8
A10
A11
DQ7
DQ14
DQ13
DQ6
A4
B4
C4
D4
E4
F4
G4
H4
WE#
RESET#
NC
A19
DQ5
DQ12
VCC
DQ4
A3
B3
C3
D3
E3
F3
G3
H3
RY/BY#
NC
A18
NC
DQ2
DQ10
DQ11
DQ3
A2
B2
C2
D2
E2
F2
G2
H2
A7
A17
A6
A5
DQ0
DQ8
DQ9
DQ1
A1
B1
C1
D1
E1
F1
G1
H1
A3
A4
A2
A1
A0
CE#
OE#
VSS
Am29LV160M
F6
G6
BYTE# DQ15/A-1
H6
VSS
25974B5 January 31, 2007
D a t a
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Connection Diagrams
64-Ball Fortified BGA
Top View, Balls Facing Down
A8
B8
C8
D8
E8
F8
G8
H8
NC
NC
NC
NC
VSS
NC
NC
NC
A7
B7
C7
D7
E7
F7
G7
H7
A13
A12
A14
A15
A16
A6
B6
C6
D6
E6
F6
G6
H6
A9
A8
A10
A11
DQ7
DQ14
DQ13
DQ6
A5
B5
C5
D5
E5
F5
G5
H5
WE#
RESET#
NC
A19
DQ5
DQ12
VCC
DQ4
A4
B4
C4
D4
E4
F4
G4
H4
RY/BY#
NC
A18
NC
DQ2
DQ10
DQ11
DQ3
A3
B3
C3
D3
E3
F3
G3
H3
A7
A17
A6
A5
DQ0
DQ8
DQ9
DQ1
A2
B2
C2
D2
E2
F2
G2
H2
A3
A4
A2
A1
A0
CE#
OE#
VSS
A1
B1
C1
D1
E1
F1
G1
H1
NC
NC
NC
NC
NC
NC
NC
NC
BYTE# DQ15/A-1
VSS
Special Package Handling Instructions
Special handling is required for Flash Memory products in molded packages
(TSOP, BGA, SSOP, PDIP, PLCC). The package and/or data integrity may be
compromised if the package body is exposed to temperatures above 150°C for
prolonged periods of time.
January 31, 2007 25974B5
Am29LV160M
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Pin Configuration
A19–A0
DQ14–DQ0
DQ15/A-1
=
=
=
BYTE#
CE#
OE#
WE#
RESET#
RY/BY#
VCC
=
=
=
=
=
=
=
VSS
NC
=
=
20 addresses
15 data inputs/outputs
DQ15 (data input/output, word mode),
A-1 (LSB address input, byte mode)
Selects 8-bit or 16-bit mode
Chip enable
Output enable
Write enable
Hardware reset pin
Ready/Busy output
3.0 volt-only single power supply
(see Product Selector Guide for speed
options and voltage supply tolerances)
Device ground
Pin not connected internally
Logic Symbol
20
A19–A0
16 or 8
DQ15–DQ0
(A-1)
CE#
OE#
WE#
RESET#
BYTE#
8
RY/BY#
Am29LV160M
25974B5 January 31, 2007
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Ordering Information
Standard Products
Spansion standard products are available in several packages and operating
ranges. The order number (Valid Combination) is formed by a combination of the
elements below.
Am29LV160M
T
100
E
I
TEMPERATURE RANGE
I
= Industrial (–40°C to +85°C)
PACKAGE TYPE
E
F
WA
PC
= 48-Pin Thin Small Outline Package (TSOP) Standard Pinout (TS 048)
= 48-Pin Thin Small Outline Package (TSOP) Reverse Pinout (TSR048)
= 48-ball Fine-Pitch Ball Grid Array (FBGA)
0.80 mm pitch, 6 x 8 mm package (FBA048)
= 64-ball Fortified Ball Grid Array (BGA)
1.0 mm pitch, 13 x 11 mm package (LAA064)
SPEED OPTION
See Product Selector Guide and Valid Combinations
BOOT CODE SECTOR ARCHITECTURE
T
B
=
=
Top sector
Bottom sector
DEVICE NUMBER/DESCRIPTION
Am29LV160M
16 Megabit (2M x 8-Bit/1M x 16-Bit) MirrorBitTM Flash Memory
3.0 Volt-only Read, Program, and Erase
Access
Time
(ns)
Valid Combinations
for TSOP Packages
Am29LV160MT90,
Am29LV160MB90
VCC
Voltage
Range
Valid Combinations for FBGA Packages
Order Number
90
Am29LV160MT100,
Am29LV160MB100
EI, FI
2.7–3.6 V
100
Package
Marking
Am29LV160MT90,
Am29LV160MB90
Am29LV160MT100,
Am29LV160MB100
WAI
L160MT90VI,
L160MB90VI
PCI
L160MT90PI,
L160MB90PI
WAI
L160MT10VI,
L160MB10VI
PCI
L160MT10PI,
L160MB10PI
Access
Time
(ns)
VCC
Voltage
Range
90
2.7–
3.6 V
100
Note: For 70R and 85 speed options shown in product selector
guide, contact a sales office or representative for availability
and ordering information.
Valid Combinations
Valid Combinations list configurations planned to be supported in volume for this device.
Consult your local sales office to confirm availability of specific valid combinations and to
check on newly released combinations.
January 31, 2007 25974B5
Am29LV160M
9
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Device Bus Operations
This section describes the requirements and use of the device bus operations,
which are initiated through the internal command register. The command register
itself does not occupy any addressable memory location. The register is composed of latches that store the commands, along with the address and data
information needed to execute the command. The contents of the register serve
as inputs to the internal state machine. The state machine outputs dictate the
function of the device. Table 1 lists the device bus operations, the inputs and control levels they require, and the resulting output. The following subsections
describe each of these operations in further detail.
Table 1.
Am29LV160M Device Bus Operations
DQ8–DQ15
Operation
CE#
OE# WE# RESET#
Addresses
(Note 1)
DQ0–
DQ7
BYTE#
= VIH
BYTE#
= VIL
Read
L
L
H
H
AIN
DOUT
DOUT
Write
L
H
L
H
AIN
DIN
DIN
DQ8–DQ14 = High-Z,
DQ15 = A-1
VCC ±
0.3 V
X
X
VCC ±
0.3 V
X
High-Z
High-Z
High-Z
Output Disable
L
H
H
H
X
High-Z
High-Z
High-Z
Reset
X
X
X
L
X
High-Z
High-Z
High-Z
DIN
X
X
Standby
Sector Protect (Note 2)
L
H
L
VID
Sector Address,
A6 = L, A1 = H,
A0 = L
Sector Unprotect (Note 2)
L
H
L
VID
Sector Address,
A6 = H, A1 = H,
A0 = L
DIN
X
X
Temporary Sector
Unprotect
X
X
X
VID
AIN
DIN
DIN
High-Z
Legend: L = Logic Low = VIL, H = Logic High = VIH, VID = 12.0 ± 0.5 V, X = Don’t Care, AIN = Address In, DIN = Data In, DOUT
= Data Out
Notes:
1. Addresses are A19:A0 in word mode (BYTE# = VIH), A19:A-1 in byte mode (BYTE# = VIL).
2. The sector protect and sector unprotect functions may also be implemented via programming equipment. See “Sector
Protection/Unprotection” on page 15.
Word/Byte Configuration
The BYTE# pin controls whether the device data I/O pins DQ15–DQ0 operate in
the byte or word configuration. If the BYTE# pin is set at logic ‘1’, the device is in
word configuration, DQ15–DQ0 are active and controlled by CE# and OE#.
If the BYTE# pin is set at logic ‘0’, the device is in byte configuration, and only
data I/O pins DQ0–DQ7 are active and controlled by CE# and OE#. The data I/
O pins DQ8–DQ14 are tri-stated, and the DQ15 pin is used as an input for the
LSB (A-1) address function.
Requirements for Reading Array Data
To read array data from the outputs, the system must drive the CE# and OE# pins
to VIL. CE# is the power control and selects the device. OE# is the output control
and gates array data to the output pins. WE# should remain at VIH. The BYTE#
pin determines whether the device outputs array data in words or bytes.
10
Am29LV160M
25974B5 January 31, 2007
D a t a
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The internal state machine is set for reading array data upon device power-up,
or after a hardware reset. This ensures that no spurious alteration of the memory content occurs during the power transition. No command is necessary in
this mode to obtain array data. Standard microprocessor read cycles that assert valid addresses on the device address inputs produce valid data on the
device data outputs. The device remains enabled for read access until the command register contents are altered.
See “Reading Array Data” on page 23 for more information. Refer to the table
“Read Operations” on page 42 for timing specifications and to Figure 13, on page
42 for the timing diagram. ICC1 in the table “CMOS Compatible” on page 40 represents the active current specification for reading array data.
Writing Commands/Command Sequences
To write a command or command sequence (which includes programming data
to the device and erasing sectors of memory), the system must drive WE# and
CE# to VIL, and OE# to VIH.
For program operations, the BYTE# pin determines whether the device accepts
program data in bytes or words. Refer to “Word/Byte Configuration” on page 10
for more information.
The device features an Unlock Bypass mode to facilitate faster programming.
Once the device enters the Unlock Bypass mode, only two write cycles are required to program a word or byte, instead of four. The “Word/Byte Program
Command Sequence” on page 24 contains details on programming data to the
device using both standard and Unlock Bypass command sequences.
An erase operation can erase one sector, multiple sectors, or the entire device.
Table 2, on page 13 and Table 3, on page 14 indicate the address space that each
sector occupies. A “sector address” consists of the address bits required to
uniquely select a sector. The sector “Command Definitions” on page 23 contains
details on erasing a sector or the entire chip, or suspending/resuming the erase
operation.
After the system writes the autoselect command sequence, the device enters the
autoselect mode. The system can then read autoselect codes from the internal
register (which is separate from the memory array) on DQ7–DQ0. Standard read
cycle timings apply in this mode. Refer to the sections “Autoselect Mode” on
page 15 and “Autoselect Command Sequence” on page 24 for more information.
ICC2 in the DC Characteristics table represents the active current specification for
the write mode. The section “AC Characteristics” on page 42 contains timing
specification tables and timing diagrams for write operations.
Program and Erase Operation Status
During an erase or program operation, the system may check the status of the
operation by reading the status bits on DQ7–DQ0. Standard read cycle timings
and ICC read specifications apply. Refer to “Write Operation Status” on page 33
for more information, and to “AC Characteristics” on page 42 for timing diagrams.
Standby Mode
When the system is not reading or writing to the device, it can place the device
in the standby mode. In this mode, current consumption is greatly reduced, and
the outputs are placed in the high impedance state, independent of the OE#
input.
January 31, 2007 25974B5
Am29LV160M
11
D a t a
S h e e t
The device enters the CMOS standby mode when the CE# and RESET# pins are
both held at VCC ± 0.3 V. (Note that this is a more restricted voltage range than
VIH.) If CE# and RESET# are held at VIH, but not within VCC ± 0.3 V, the device
is in the standby mode, but the standby current is greater. The device requires
standard access time (tCE) for read access when the device is in either of these
standby modes, before it is ready to read data.
If the device is deselected during erasure or programming, the device draws active current until the operation is completed.
In the table “CMOS Compatible” on page 40, ICC3 and ICC4 represents the standby
current specification.
Automatic Sleep Mode
The automatic sleep mode minimizes Flash device energy consumption. The
device automatically enables this mode when addresses remain stable for tACC +
30 ns. The automatic sleep mode is independent of the CE#, WE#, and OE#
control signals. Standard address access timings provide new data when
addresses are changed. While in sleep mode, output data is latched and always
available to the system. ICC4 in the table “CMOS Compatible” on page 40
represents the automatic sleep mode current specification.
RESET#: Hardware Reset Pin
The RESET# pin provides a hardware method of resetting the device to reading
array data. When the system drives the RESET# pin to VIL for at least a period of
tRP, the device immediately terminates any operation in progress, tristates all
data output pins, and ignores all read/write attempts for the duration of the RESET# pulse. The device also resets the internal state machine to reading array
data. The operation that was interrupted should be reinitiated once the device is
ready to accept another command sequence, to ensure data integrity.
Current is reduced for the duration of the RESET# pulse. When RESET# is held
at VSS±0.3 V, the device draws CMOS standby current (ICC4). If RESET# is held
at VIL but not within VSS±0.3 V, the standby current is greater.
The RESET# pin may be tied to the system reset circuitry. A system reset would
thus also reset the Flash memory, enabling the system to read the boot-up firmware from the Flash memory.
If RESET# is asserted during a program or erase operation, the RY/BY# pin remains a “0” (busy) until the internal reset operation is complete, which requires
a time of tREADY (during Embedded Algorithms). The system can thus monitor
RY/BY# to determine whether the reset operation is complete. If RESET# is asserted when a program or erase operation is not executing (RY/BY# pin is “1”),
the reset operation is completed within a time of tREADY (not during Embedded
Algorithms). The system can read data tRH after the RESET# pin returns to VIH.
Refer to the “AC Characteristics” on page 42 for RESET# parameters and to Figure 14, on page 43 for the timing diagram.
Output Disable Mode
When the OE# input is at VIH, output from the device is disabled. The output pins
are placed in the high impedance state.
12
Am29LV160M
25974B5 January 31, 2007
D a t a
Table 2.
Sector
S h e e t
Sector Address Tables (Am29LV160MT)
A19 A18 A17 A16 A15 A14 A13 A12
Sector Size
(Kbytes/
Kwords)
Address Range (in hexadecimal)
Byte Mode (x8)
Word Mode (x16)
000000–007FFF
SA0
0
0
0
0
0
X
X
X
64/32
000000–00FFFF
SA1
0
0
0
0
1
X
X
X
64/32
010000–01FFFF
008000–00FFFF
SA2
0
0
0
1
0
X
X
X
64/32
020000–02FFFF
010000–017FFF
SA3
0
0
0
1
1
X
X
X
64/32
030000–03FFFF
018000–01FFFF
SA4
0
0
1
0
0
X
X
X
64/32
040000–04FFFF
020000–027FFF
SA5
0
0
1
0
1
X
X
X
64/32
050000–05FFFF
028000–02FFFF
SA6
0
0
1
1
0
X
X
X
64/32
060000–06FFFF
030000–037FFF
SA7
0
0
1
1
1
X
X
X
64/32
070000–07FFFF
038000–03FFFF
SA8
0
1
0
0
0
X
X
X
64/32
080000–08FFFF
040000–047FFF
SA9
0
1
0
0
1
X
X
X
64/32
090000–09FFFF
048000–04FFFF
SA10
0
1
0
1
0
X
X
X
64/32
0A0000–0AFFFF
050000–057FFF
SA11
0
1
0
1
1
X
X
X
64/32
0B0000–0BFFFF
058000–05FFFF
SA12
0
1
1
0
0
X
X
X
64/32
0C0000–0CFFFF
060000–067FFF
SA13
0
1
1
0
1
X
X
X
64/32
0D0000–0DFFFF
068000–06FFFF
SA14
0
1
1
1
0
X
X
X
64/32
0E0000–0EFFFF
070000–077FFF
SA15
0
1
1
1
1
X
X
X
64/32
0F0000–0FFFFF
078000–07FFFF
SA16
1
0
0
0
0
X
X
X
64/32
100000–10FFFF
080000–087FFF
SA17
1
0
0
0
1
X
X
X
64/32
110000–11FFFF
088000–08FFFF
SA18
1
0
0
1
0
X
X
X
64/32
120000–12FFFF
090000–097FFF
SA19
1
0
0
1
1
X
X
X
64/32
130000–13FFFF
098000–09FFFF
SA20
1
0
1
0
0
X
X
X
64/32
140000–14FFFF
0A0000–0A7FFF
SA21
1
0
1
0
1
X
X
X
64/32
150000–15FFFF
0A8000–AFFFF
SA22
1
0
1
1
0
X
X
X
64/32
160000–16FFFF
0B0000–0B7FFF
SA23
1
0
1
1
1
X
X
X
64/32
170000–17FFFF
0B8000–0BFFFF
SA24
1
1
0
0
0
X
X
X
64/32
180000–18FFFF
0C0000–0C7FFF
SA25
1
1
0
0
1
X
X
X
64/32
190000–19FFFF
0C8000–0CFFFF
SA26
1
1
0
1
0
X
X
X
64/32
1A0000–1AFFFF
0D0000–0D7FFF
SA27
1
1
0
1
1
X
X
X
64/32
1B0000–1BFFFF
0D8000–0DFFFF
SA28
1
1
1
0
0
X
X
X
64/32
1C0000–1CFFFF
0E0000–0E7FFF
SA29
1
1
1
0
1
X
X
X
64/32
1D0000–1DFFFF
0E8000–0EFFFF
SA30
1
1
1
1
0
X
X
X
64/32
1E0000–1EFFFF
0F0000–0F7FFF
SA31
1
1
1
1
1
0
X
X
32/16
1F0000–1F7FFF
0F8000–0FBFFF
SA32
1
1
1
1
1
1
0
0
8/4
1F8000–1F9FFF
0FC000–0FCFFF
SA33
1
1
1
1
1
1
0
1
8/4
1FA000–1FBFFF
0FD000–0FDFFF
SA34
1
1
1
1
1
1
1
X
16/8
1FC000–1FFFFF
0FE000–0FFFFF
Note: Address range is A19:A-1 in byte mode and A19:A0 in word mode. See “Word/Byte Configuration” on page 10
section.
January 31, 2007 25974B5
Am29LV160M
13
D a t a
Table 3.
Sector
S h e e t
Sector Address Tables (Am29LV160MB)
A19 A18 A17 A16 A15 A14 A13 A12
Sector Size
(Kbytes/
Kwords)
Address Range (in hexadecimal)
Byte Mode (x8)
Word Mode (x16)
SA0
0
0
0
0
0
0
0
X
16/8
000000–003FFF
000000–001FFF
SA1
0
0
0
0
0
0
1
0
8/4
004000–005FFF
002000–002FFF
SA2
0
0
0
0
0
0
1
1
8/4
006000–007FFF
003000–003FFF
SA3
0
0
0
0
0
1
X
X
32/16
008000–00FFFF
004000–007FFF
SA4
0
0
0
0
1
X
X
X
64/32
010000–01FFFF
008000–00FFFF
SA5
0
0
0
1
0
X
X
X
64/32
020000–02FFFF
010000–017FFF
SA6
0
0
0
1
1
X
X
X
64/32
030000–03FFFF
018000–01FFFF
SA7
0
0
1
0
0
X
X
X
64/32
040000–04FFFF
020000–027FFF
SA8
0
0
1
0
1
X
X
X
64/32
050000–05FFFF
028000–02FFFF
SA9
0
0
1
1
0
X
X
X
64/32
060000–06FFFF
030000–037FFF
SA10
0
0
1
1
1
X
X
X
64/32
070000–07FFFF
038000–03FFFF
SA11
0
1
0
0
0
X
X
X
64/32
080000–08FFFF
040000–047FFF
SA12
0
1
0
0
1
X
X
X
64/32
090000–09FFFF
048000–04FFFF
SA13
0
1
0
1
0
X
X
X
64/32
0A0000–0AFFFF
050000–057FFF
SA14
0
1
0
1
1
X
X
X
64/32
0B0000–0BFFFF
058000–05FFFF
SA15
0
1
1
0
0
X
X
X
64/32
0C0000–0CFFFF
060000–067FFF
SA16
0
1
1
0
1
X
X
X
64/32
0D0000–0DFFFF
068000–06FFFF
SA17
0
1
1
1
0
X
X
X
64/32
0E0000–0EFFFF
070000–077FFF
SA18
0
1
1
1
1
X
X
X
64/32
0F0000–0FFFFF
078000–07FFFF
SA19
1
0
0
0
0
X
X
X
64/32
100000–10FFFF
080000–087FFF
SA20
1
0
0
0
1
X
X
X
64/32
110000–11FFFF
088000–08FFFF
SA21
1
0
0
1
0
X
X
X
64/32
120000–12FFFF
090000–097FFF
SA22
1
0
0
1
1
X
X
X
64/32
130000–13FFFF
098000–09FFFF
SA23
1
0
1
0
0
X
X
X
64/32
140000–14FFFF
0A0000–0A7FFF
SA24
1
0
1
0
1
X
X
X
64/32
150000–15FFFF
0A8000–0AFFFF
SA25
1
0
1
1
0
X
X
X
64/32
160000–16FFFF
0B0000–0B7FFF
SA26
1
0
1
1
1
X
X
X
64/32
170000–17FFFF
0B8000–0BFFFF
SA27
1
1
0
0
0
X
X
X
64/32
180000–18FFFF
0C0000–0C7FFF
SA28
1
1
0
0
1
X
X
X
64/32
190000–19FFFF
0C8000–0CFFFF
SA29
1
1
0
1
0
X
X
X
64/32
1A0000–1AFFFF
0D0000–0D7FFF
SA30
1
1
0
1
1
X
X
X
64/32
1B0000–1BFFFF
0D8000–0DFFFF
SA31
1
1
1
0
0
X
X
X
64/32
1C0000–1CFFFF
0E0000–0E7FFF
SA32
1
1
1
0
1
X
X
X
64/32
1D0000–1DFFFF
0E8000–0EFFFF
SA33
1
1
1
1
0
X
X
X
64/32
1E0000–1EFFFF
0F0000–0F7FFF
SA34
1
1
1
1
1
X
X
X
64/32
1F0000–1FFFFF
0F8000–0FFFFF
Note: Address range is A19:A-1 in byte mode and A19:A0 in word mode. See the “Word/Byte Configuration” on page 10
section.
14
Am29LV160M
25974B5 January 31, 2007
D a t a
S h e e t
Autoselect Mode
The autoselect mode provides manufacturer and device identification, and sector
protection verification, through identifier codes output on DQ7–DQ0. This mode
is primarily intended for programming equipment to automatically match a device
to be programmed with its corresponding programming algorithm. However, the
autoselect codes can also be accessed in-system through the command register.
When using programming equipment, the autoselect mode requires VID (11.5 V
to 12.5 V) on address pin A9. Address pins A6, A1, and A0 must be as shown in
Table 4. In addition, when verifying sector protection, the sector address must
appear on the appropriate highest order address bits (see Table 2, on page 13
and Table 3, on page 14). Table 3 shows the remaining address bits that are don’t
care. When all necessary bits are set as required, the programming equipment
may then read the corresponding identifier code on DQ7-DQ0.
To access the autoselect codes in-system, the host system can issue the autoselect command via the command register, as shown in Table 10, on page 31 and
Table 11, on page 32. This method does not require VID. See “Command Definitions” on page 23 for details on using the autoselect mode.
Table 4.
Mod
e
Description
Manufacturer ID
CE#
Autoselect Codes (High Voltage Method)
A19 A11
to
to
OE# WE# A12 A10
L
L
H
L
L
H
Device ID:
Am29LV160M
(Top Boot Block)
Word
Byte
L
L
H
Device ID:
Am29LV160M
(Bottom Boot
Block)
Word
L
L
H
Byte
L
L
H
Sector Protection
Verification
Secured Silicon Sector
Indicator Bit (DQ7)
L
L
L
L
H
H
A9
A8
to
A7
A6
A5
to
A2
A1
A0
DQ8
to
DQ15
DQ7
to
DQ0
X
01h (AMD)
22h
C4h
X
C4h
22h
49h
X
49h
X
01h
(protected)
X
00h
(unprotected)
X
83h (factory
locked
03h (not
factory locked)
X
X
VID
X
L
X
L
L
X
X
VID
X
L
X
L
H
X
SA
X
X
X
X
VID
VID
VID
X
X
X
L
L
H
X
X
X
L
H
L
H
L
H
L = Logic Low = VIL, H = Logic High = VIH, SA = Sector Address, X = Don’t care.
Note: The autoselect codes may also be accessed in-system via command sequences. See Table 10, on page 31 and
Table 11, on page 32.
Sector Protection/Unprotection
The hardware sector protection feature disables both program and erase operations in any sector. The hardware sector unprotection feature re-enables both
program and erase operations in previously protected sectors.
The device is normally shipped with all sectors unprotected. However, the ExpressFlash™ Service offers the option of programming and protecting sectors at
January 31, 2007 25974B5
Am29LV160M
15
D a t a
S h e e t
the factory prior to shipping the device. Contact a sales office or representative
for details.
It is possible to determine whether a sector is protected or unprotected. See “Autoselect Mode” on page 15 for details.
Sector protection and unprotection requires VID on the RESET# pin only, and can
be implemented either in-system or via programming equipment. Figure 2, on
page 17 shows the algorithms and Figure 23, on page 50 shows the timing diagram. This method uses standard microprocessor bus cycle timing. For sector
unprotect, all unprotected sectors must first be protected prior to the first sector
unprotect write cycle.
Temporary Sector Unprotect
This feature allows temporary unprotection of previously protected sectors to
change data in-system. The Sector Unprotect mode is activated by setting the
RESET# pin to VID. During this mode, formerly protected sectors can be programmed or erased by selecting the sector addresses. Once VID is removed from
the RESET# pin, all the previously protected sectors are protected again. Figure
2, on page 17 shows the algorithm, and Figure 22, on page 49 shows the timing
diagrams, for this feature.
START
RESET# = VID
(Note 1)
Perform Erase or
Program Operations
RESET# = VIH
Temporary Sector
Unprotect Completed
(Note 2)
Notes:
1. All protected sectors unprotected.
2. All previously protected sectors are protected once again.
Figure 1.
16
Temporary Sector Unprotect Operation
Am29LV160M
25974B5 January 31, 2007
D a t a
S h e e t
START
START
Protect all sectors:
The indicated portion
of the sector protect
algorithm must be
performed for all
unprotected sectors
prior to issuing the
first sector
unprotect address
PLSCNT = 1
RESET# = VID
Wait 1 ms
Temporary Sector
Unprotect Mode
No
PLSCNT = 1
RESET# = VID
Wait 1 ms
No
First Write
Cycle = 60h?
First Write
Cycle = 60h?
Yes
Yes
Set up sector
address
No
All sectors
protected?
Sector Protect:
Write 60h to sector
address with
A6 = 0, A1 = 1,
A0 = 0
Yes
Set up first sector
address
Sector Unprotect:
Write 60h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
Wait 150 µs
Verify Sector
Protect: Write 40h
to sector address
with A6 = 0,
A1 = 1, A0 = 0
Increment
PLSCNT
Temporary Sector
Unprotect Mode
Reset
PLSCNT = 1
Wait 15 ms
Read from
sector address
with A6 = 0,
A1 = 1, A0 = 0
Verify Sector
Unprotect: Write
40h to sector
address with
A6 = 1, A1 = 1,
A0 = 0
Increment
PLSCNT
No
No
PLSCNT
= 25?
Read from
sector address
with A6 = 1,
A1 = 1, A0 = 0
Data = 01h?
Yes
Yes
No
Yes
Device failed
PLSCNT
= 1000?
Protect another
sector?
No
Yes
Remove VID
from RESET#
Device failed
Write reset
command
In-System Single
High Voltage
Sector Protect
Algorithm
Sector Protect
complete
Set up
next sector
address
No
Data = 00h?
Yes
Last sector
verified?
No
Yes
In-System Single
High Voltage
Sector Unprotect
Algorithm
Remove VID
from RESET#
Write reset
command
Sector Unprotect
complete
Figure 2.
January 31, 2007 25974B5
In-System Single High Voltage Sector Protect/Unprotect Algorithms
Am29LV160M
17
D a t a
S h e e t
Secured Silicon Sector Flash Memory Region
The Secured Silicon Sector feature provides a Flash memory region that enables
permanent part identification through an Electronic Serial Number (ESN). The
Secured Silicon Sector is 256 bytes in length, and uses a Secured Silicon Sector
Indicator Bit (DQ7) to indicate whether or not the Secured Silicon Sector is
locked when shipped from the factory. This bit is permanently set at the factory
and cannot be changed, which prevents cloning of a factory locked part. This ensures the security of the ESN once the product is shipped to the field.
The device is offered with the Secured Silicon Sector either customer lockable
(standard shipping option) or factory locked (contact a sales office or representative for ordering information). The customer-lockable version is shipped with
the Secured Silicon Sector unprotected, allowing customers to program the sector after receiving the device. The customer-lockable version also has the
Secured Silicon Sector Indicator Bit permanently set to a “0.” The factory-locked
version is always protected when shipped from the factory, and has the Secured
Silicon Sector Indicator Bit permanently set to a “1.” Thus, the Secured Silicon
Sector Indicator Bit prevents customer-lockable devices from being used to replace devices that are factory locked. Note that the ACC function and unlock
bypass modes are not available when the Secured Silicon Sector is enabled.
The Secured Silicon sector address space in this device is allocated as follows:
Table 5.
Secured Silicon Sector Addressing
Secured Silicon Sector Address
Range
x16
x8
0F8000h–
0F8007h
1F0000h–
1F000Fh
0F8008h–
0F807Fh
1F0010h–
1F00FFh
Customer
Lockable
Determined by
customer
ESN Factory
Locked
ExpressFlash
Factory Locked
ESN
ESN or determined
by customer
Unavailable
Determined
by customer
The system accesses the Secured Silicon Sector through a command sequence
(see “Enter Secured Silicon Sector/Exit Secured Silicon Sector Command Sequence”). After the system writes the Enter Secured Silicon Sector command
sequence, it may read the Secured Silicon Sector by using the addresses given
in Table 5. This mode of operation continues until the system issues the Exit Secured Silicon Sector command sequence, or until power is removed from the
device. On power-up, or following a hardware reset, the device reverts to sending commands to sector SA0.
Customer Lockable: Secured Silicon Sector NOT Programmed or
Protected At the Factory
Unless otherwise specified, the device is shipped such that the customer may
program and protect the 256-byte Secured Silicon sector.
The system may program the Secured Silicon Sector using the write-buffer, accelerated and/or unlock bypass methods, in addition to the standard
programming command sequence. See “Command Definitions” on page 23.
Programming and protecting the Secured Silicon Sector must be used with caution since, once protected, there is no procedure available for unprotecting the
Secured Silicon Sector area and none of the bits in the Secured Silicon Sector
memory space can be modified in any way.
18
Am29LV160M
25974B5 January 31, 2007
D a t a
S h e e t
The Secured Silicon Sector area can be protected using one of the following
procedures:
„ Write the three-cycle Enter Secured Silicon Sector Region command sequence, and then follow the in-system sector protect algorithm as shown in
Figure 2, on page 17, except that RESET# may be at either VIH or VID. This
allows in-system protection of the Secured Silicon Sector without raising any
device pin to a high voltage. Note that this method is only applicable to the
Secured Silicon Sector.
„ To verify the protect/unprotect status of the Secured Silicon Sector, follow the
algorithm shown in Figure 3.
Once the Secured Silicon Sector is programmed, locked and verified, the system
must write the Exit Secured Silicon Sector Region command sequence to return
to reading and writing within the remainder of the array.
Factory Locked: Secured Silicon Sector Programmed and
Protected At the Factory
In devices with an ESN, the Secured Silicon Sector is protected when the device
is shipped from the factory. The Secured Silicon Sector cannot be modified in any
way. An ESN Factory Locked device has a 16-byte random ESN at addresses
0F8000h–0F8007h. Please contact your local sales office or representative for
details on ordering ESN Factory Locked devices.
Customers may opt to have their code programmed by the manufacturer
through the ExpressFlash service (Express Flash Factory Locked). The devices
are then shipped from the factory with the Secured Silicon Sector permanently
locked. Contact an sales office or representative for details on using the ExpressFlash service.
START
RESET# =
VIH or VID
Wait 1 ms
Write 60h to
any address
Write 40h to SecSi
Sector address
with A6 = 0,
A1 = 1, A0 = 0
Read from SecSi
Sector address
with A6 = 0,
A1 = 1, A0 = 0
Figure 3.
January 31, 2007 25974B5
If data = 00h,
SecSi Sector is
unprotected.
If data = 01h,
SecSi Sector is
protected.
Remove VIH or VID
from RESET#
Write reset
command
SecSi Sector
Protect Verify
complete
Secured Silicon Sector Protect Verify
Am29LV160M
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Common Flash Memory Interface (CFI)
The Common Flash Interface (CFI) specification outlines device and host system
software interrogation handshake, which allows specific vendor-specified software algorithms to be used for entire families of devices. Software support can
then be device-independent, JEDEC ID-independent, and forward- and backward-compatible for the specified flash device families. Flash vendors can
standardize their existing interfaces for long-term compatibility.
This device enters the CFI Query mode when the system writes the CFI Query
command, 98h, to address 55h in word mode (or address AAh in byte mode), any
time the device is ready to read array data. The system can read CFI information
at the addresses given in Table 6, on page 20 to Table 9, on page 22. In word
mode, the upper address bits (A7–MSB) must be all zeros. To terminate reading
CFI data, the system must write the reset command.
The system can also write the CFI query command when the device is in the autoselect mode. The device enters the CFI query mode, and the system can read
CFI data at the addresses given in Table 6, on page 20 to Table 9, on page 22.
The system must write the reset command to return the device to the read/reset
mode.
For further information, please refer to the CFI Specification and CFI Publication
100, available online at http://www.amd.com/flash/cfi. Alternatively, contact an
sales office or representative for copies of these documents.
Table 6.
CFI Query Identification String
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
10h
11h
12h
20h
22h
24h
0051h
0052h
0059h
Query Unique ASCII string “QRY”
13h
14h
26h
28h
0002h
0000h
Primary OEM Command Set
15h
16h
2Ah
2Ch
0040h
0000h
Address for Primary Extended Table
17h
18h
2Eh
30h
0000h
0000h
Alternate OEM Command Set (00h = none exists)
19h
1Ah
32h
34h
0000h
0000h
Address for Alternate OEM Extended Table (00h = none exists)
20
Description
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Table 7.
System Interface String
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
1Bh
36h
0027h
VCC Min. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
1Ch
38h
0036h
VCC Max. (write/erase)
D7–D4: volt, D3–D0: 100 millivolt
1Dh
3Ah
0000h
VPP Min. voltage (00h = no VPP pin present)
1Eh
3Ch
0000h
VPP Max. voltage (00h = no VPP pin present)
1Fh
3Eh
0007h
Typical timeout per single byte/word write 2N µs
20h
40h
0000h
Typical timeout for Min. size buffer write 2N µs (00h = not supported)
21h
42h
000Ah
Typical timeout per individual block erase 2N ms
22h
44h
0000h
Typical timeout for full chip erase 2N ms (00h = not supported)
23h
46h
0001h
Max. timeout for byte/word write 2N times typical
24h
48h
0000h
Max. timeout for buffer write 2N times typical
25h
4Ah
0004h
Max. timeout per individual block erase 2N times typical
26h
4Ch
0000h
Max. timeout for full chip erase 2N times typical (00h = not supported)
Table 8.
Description
Device Geometry Definition
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
27h
4Eh
0015h
Device Size = 2N byte
28h
29h
50h
52h
0002h
0000h
Flash Device Interface description (refer to CFI publication 100)
2Ah
2Bh
54h
56h
0000h
0000h
Max. number of byte in multi-byte write = 2N
(00h = not supported)
2Ch
58h
0004h
Number of Erase Block Regions within device
2Dh
2Eh
2Fh
30h
5Ah
5Ch
5Eh
60h
0000h
0000h
0040h
0000h
Erase Block Region 1 Information
(refer to the CFI specification or CFI publication 100)
31h
32h
33h
34h
62h
64h
66h
68h
0001h
0000h
0020h
0000h
Erase Block Region 2 Information
35h
36h
37h
38h
6Ah
6Ch
6Eh
70h
0000h
0000h
0080h
0000h
Erase Block Region 3 Information
39h
3Ah
3Bh
3Ch
72h
74h
76h
78h
001Eh
0000h
0000h
0001h
Erase Block Region 4 Information
January 31, 2007 25974B5
Description
Am29LV160M
21
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Table 9.
S h e e t
Primary Vendor-Specific Extended Query
Addresses
(Word Mode)
Addresses
(Byte Mode)
Data
40h
41h
42h
80h
82h
84h
0050h
0052h
0049h
Query-unique ASCII string “PRI”
43h
86h
0031h
Major version number, ASCII
44h
88h
0033h
Minor version number, ASCII
Description
Address Sensitive Unlock (Bit 1–0)
0b = Required, 1b = Not Required
45h
8Ah
0008h
46h
8Ch
0002h
Erase Suspend
0 = Not Supported, 1 = To Read Only, 2 = To Read & Write
47h
8Eh
0001h
Sector Protect
0 = Not Supported, X = Number of sectors in per group
48h
90h
0001h
Sector Temporary Unprotect
00 = Not Supported, 01 = Supported
49h
92h
0004h
Sector Protect/Unprotect scheme
01 = 29F040 mode, 02 = 29F016 mode,
03 = 29F400 mode, 04 = 29LV800A mode
4Ah
94h
0000h
Simultaneous Operation
00 = Not Supported, 01 = Supported
4Bh
96h
0000h
Burst Mode Type
00 = Not Supported, 01 = Supported
4Ch
98h
0000h
Page Mode Type
00 = Not Supported, 01 = 4 Word Page, 02 = 8 Word Page
Process Technology (Bits 7–2)
0010b = 0.23 µm MirrorBit
Hardware Data Protection
The command sequence requirement of unlock cycles for programming or erasing
provides data protection against inadvertent writes (refer to Table 10, on page 31
and Table 11, on page 32 for command definitions). In addition, the following
hardware data protection measures prevent accidental erasure or programming,
which might otherwise be caused by spurious system level signals during VCC
power-up and power-down transitions, or from system noise.
Low VCC Write Inhibit
When VCC is less than VLKO, the device does not accept any write cycles. This protects data during VCC power-up and power-down. The command register and all
internal program/erase circuits are disabled, and the device resets. Subsequent
writes are ignored until VCC is greater than VLKO. The system must provide the
proper signals to the control pins to prevent unintentional writes when VCC is
greater than VLKO.
Write Pulse “Glitch” Protection
Noise pulses of less than 5 ns (typical) on OE#, CE# or WE# do not initiate a write
cycle.
22
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25974B5 January 31, 2007
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Logical Inhibit
Write cycles are inhibited by holding any one of OE# = VIL, CE# = VIH or WE# =
VIH. To initiate a write cycle, CE# and WE# must be a logical zero while OE# is a
logical one.
Power-Up Write Inhibit
If WE# = CE# = VIL and OE# = VIH during power up, the device does not accept
commands on the rising edge of WE#. The internal state machine is automatically
reset to reading array data on power-up.
Command Definitions
Writing specific address and data commands or sequences into the command
register initiates device operations. Table 10, on page 31 and Table 11, on
page 32 define the valid register command sequences. Note that writing incorrect
address and data values or writing them in the improper sequence may place the
device in an unknown state. A reset command is then required to set the device
for the next operation.
All addresses are latched on the falling edge of WE# or CE#, whichever happens
later. All data is latched on the rising edge of WE# or CE#, whichever happens
first. Refer to the appropriate timing diagrams in “AC Characteristics” on page 42.
Reading Array Data
The device is automatically set to reading array data after device power-up. No
commands are required to retrieve data. The device is also ready to read array
data after completing an Embedded Program or Embedded Erase algorithm.
After the device accepts an Erase Suspend command, the device enters the
Erase Suspend mode. The system can read array data using the standard read
timings, except that if it reads at an address within erase-suspended sectors,
the device outputs status data. After completing a programming operation in
the Erase Suspend mode, the system may once again read array data with the
same exception. See “Erase Suspend/Erase Resume Commands” on page 27
for more information on this mode.
The system must issue the reset command to re-enable the device for reading
array data if DQ5 goes high, or while in the autoselect mode. See the “Reset Command” section, next.
See also “Requirements for Reading Array Data” on page 10 for more information. The table “Read Operations” on page 42s provides the read parameters, and
Figure 13, on page 42 shows the timing diagram.
Reset Command
Writing the reset command to the device resets the device to reading array data.
Address bits are don’t care for this command.
The reset command may be written between the sequence cycles in an erase
command sequence before erasing begins. This resets the device to reading array
data. Once erasure begins, however, the device ignores reset commands until the
operation is complete.
The reset command may be written between the sequence cycles in a program
command sequence before programming begins. This resets the device to reading array data (also applies to programming in Erase Suspend mode). Once
January 31, 2007 25974B5
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23
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programming begins, however, the device ignores reset commands until the operation is complete.
The reset command may be written between the sequence cycles in an autoselect
command sequence. Once in the autoselect mode, the reset command must be
written to return to reading array data (also applies to autoselect during Erase
Suspend).
If DQ5 goes high during a program or erase operation, writing the reset command
returns the device to reading array data (also applies during Erase Suspend).
Autoselect Command Sequence
The autoselect command sequence allows the host system to access the manufacturer and devices codes, and determine whether or not a sector is protected.
Table 10, on page 31 and Table 11, on page 32 show the address and data requirements. This method is an alternative to that shown in Table 4, on page 15,
which is intended for PROM programmers and requires VID on address bit A9.
The autoselect command sequence is initiated by writing two unlock cycles, followed by the autoselect command. The device then enters the autoselect mode,
and the system may read at any address any number of times, without initiating
another command sequence.
A read cycle at address XX00h retrieves the manufacturer code. A read cycle at
address XX01h returns the device code. A read cycle containing a sector address
(SA) and the address XX02h in word mode (or XX04h in byte mode) returns
XX01h if that sector is protected, or 00h if it is unprotected. Refer to Table 2, on
page 13 and Table 3, on page 14 for valid sector addresses.
The system must write the reset command to exit the autoselect mode and return
to reading array data.
Word/Byte Program Command Sequence
The system may program the device by word or byte, depending on the state
of the BYTE# pin. Programming is a four-bus-cycle operation. The program
command sequence is initiated by writing two unlock write cycles, followed by
the program set-up command. The program address and data are written next,
which in turn initiate the Embedded Program algorithm. The system is not required to provide further controls or timings. The device automatically
generates the program pulses and verifies the programmed cell margin.
Table 10, on page 31 and Table 11, on page 32 show the address and data requirements for the byte program command sequence. Note that the Secured
Silicon Sector, autoselect, and CFI functions are unavailable when a program
operation is in progress.
When the Embedded Program algorithm is complete, the device then returns to
reading array data and addresses are no longer latched. The system can determine the status of the program operation by using DQ7, DQ6, or RY/BY#. See
“Write Operation Status” on page 33 for information on these status bits.
Any commands written to the device during the Embedded Program Algorithm
are ignored. Note that a hardware reset immediately terminates the programming operation. The Byte Program command sequence should be reinitiated once
the device resets to reading array data, to ensure data integrity.
Programming is allowed in any sequence and across sector boundaries. A bit
cannot be programmed from a “0” back to a “1”. Attempting to do so may
halt the operation and set DQ5 to “1,” or cause the Data# Polling algorithm to
24
Am29LV160M
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indicate the operation was successful. However, a succeeding read shows that the
data is still “0”. Only erase operations can convert a “0” to a “1”.
Unlock Bypass Command Sequence
The unlock bypass feature allows the system to program bytes or words to the
device faster than using the standard program command sequence. The unlock
bypass command sequence is initiated by first writing two unlock cycles. This is
followed by a third write cycle containing the unlock bypass command, 20h. The
device then enters the unlock bypass mode. A two-cycle unlock bypass program
command sequence is all that is required to program in this mode. The first cycle
in this sequence contains the unlock bypass program command, A0h; the second
cycle contains the program address and data. Additional data is programmed in
the same manner. This mode dispenses with the initial two unlock cycles required
in the standard program command sequence, resulting in faster total programming time. Table 10, on page 31 and Table 11, on page 32 show the
requirements for the command sequence.
During the unlock bypass mode, only the Unlock Bypass Program and Unlock Bypass Reset commands are valid. To exit the unlock bypass mode, the system
must issue the two-cycle unlock bypass reset command sequence. The first cycle
must contain the data 90h; the second cycle the data 00h. Addresses are don’t
care for both cycles. The device then returns to reading array data.
Figure 4, on page 26 illustrates the algorithm for the program operation. See the
table “Erase/Program Operations” on page 45 for parameters, and Figure 17, on
page 46 for timing diagrams.
January 31, 2007 25974B5
Am29LV160M
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START
Write Program
Command Sequence
Data Poll
from System
Embedded
Program
algorithm
in progress
Verify Data?
No
Yes
Increment Address
No
Last Address?
Yes
Programming
Completed
Notes: See Tables 10 and 11 for program command sequence.
Figure 4.
Program Operation
Chip Erase Command Sequence
Chip erase is a six bus cycle operation. The chip erase command sequence is initiated by writing two unlock cycles, followed by a set-up command. Two
additional unlock write cycles are then followed by the chip erase command,
which in turn invokes the Embedded Erase algorithm. The device does not require
the system to preprogram prior to erase. The Embedded Erase algorithm automatically preprograms and verifies the entire memory for an all zero data pattern
prior to electrical erase. The system is not required to provide any controls or timings during these operations. Table 10, on page 31 and Table 11, on page 32
show the address and data requirements for the chip erase command sequence.
Note that the Secured Silicon Sector, autoselect, and CFI functions are unavailable when an erase operation is in progress.
Any commands written to the chip during the Embedded Erase algorithm are ignored. Note that a hardware reset during the chip erase operation immediately
terminates the operation. The Chip Erase command sequence should be reinitiated once the device returns to reading array data, to ensure data integrity.
The system can determine the status of the erase operation by using DQ7, DQ6,
DQ2, or RY/BY#. See “Autoselect Command Sequence” on page 24 for information on these status bits. When the Embedded Erase algorithm is complete, the
device returns to reading array data and addresses are no longer latched.
26
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Figure 5, on page 29 illustrates the algorithm for the erase operation. See the
table “Erase/Program Operations” on page 45 for parameters, and Figure 18, on
page 47 for timing diagrams.
Sector Erase Command Sequence
Sector erase is a six bus cycle operation. The sector erase command sequence is
initiated by writing two unlock cycles, followed by a set-up command. Two additional unlock write cycles are then followed by the address of the sector to be
erased, and the sector erase command. Table 10, on page 31 and Table 11, on
page 32 show the address and data requirements for the sector erase command
sequence. Note that the Secured Silicon Sector, autoselect, and CFI functions
are unavailable when an erase operation is in progress.
The device does not require the system to preprogram the memory prior to erase.
The Embedded Erase algorithm automatically programs and verifies the sector for
an all zero data pattern prior to electrical erase. The system is not required to
provide any controls or timings during these operations.
After the command sequence is written, a sector erase time-out of 50 µs begins.
During the time-out period, additional sector addresses and sector erase commands may be written. Loading the sector erase buffer may be done in any
sequence, and the number of sectors may be from one sector to all sectors. The
time between these additional cycles must be less than 50 µs, otherwise the last
address and command might not be accepted, and erasure may begin. It is recommended that processor interrupts be disabled during this time to ensure all
commands are accepted. The interrupts can be re-enabled after the last Sector
Erase command is written. If the time between additional sector erase commands
can be assumed to be less than 50 µs, the system need not monitor DQ3. Any
command other than Sector Erase or Erase Suspend during the time-out
period resets the device to reading array data. The system must rewrite the
command sequence and any additional sector addresses and commands.
The system can monitor DQ3 to determine if the sector erase timer timed out.
(See “DQ3: Sector Erase Timer” on page 38.) The time-out begins from the rising
edge of the final WE# pulse in the command sequence.
Once the sector erase operation starts, only the Erase Suspend command is valid.
All other commands are ignored. Note that a hardware reset during the sector
erase operation immediately terminates the operation. The Sector Erase command sequence should be reinitiated once the device returns to reading array
data, to ensure data integrity.
When the Embedded Erase algorithm is complete, the device returns to reading
array data and addresses are no longer latched. The system can determine the
status of the erase operation by using DQ7, DQ6, DQ2, or RY/BY#. (Refer to
“Write Operation Status” on page 33 for information on these status bits.)
Figure 5, on page 29 illustrates the algorithm for the erase operation. Refer to the
table “Erase/Program Operations” on page 45 for parameters, and Figure 18, on
page 47 for timing diagrams.
Erase Suspend/Erase Resume Commands
The Erase Suspend command allows the system to interrupt a sector erase operation and then read data from, or program data to, any sector not selected for
erasure. This command is valid only during the sector erase operation, including
the 50 µs time-out period during the sector erase command sequence. The Erase
January 31, 2007 25974B5
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Suspend command is ignored if written during the chip erase operation or Embedded Program algorithm. Writing the Erase Suspend command during the
Sector Erase time-out immediately terminates the time-out period and suspends
the erase operation. Addresses are “don’t-cares” when writing the Erase Suspend
command.
When the Erase Suspend command is written during a sector erase operation, the
device requires a maximum of 20 µs to suspend the erase operation. However,
when the Erase Suspend command is written during the sector erase time-out,
the device immediately terminates the time-out period and suspends the erase
operation.
After the erase operation is suspended, the system can read array data from or
program data to any sector not selected for erasure. (The device “erase suspends” all sectors selected for erasure.) Normal read and write timings and
command definitions apply. Reading at any address within erase-suspended sectors produces status data on DQ7–DQ0. The system can use DQ7, or DQ6 and
DQ2 together, to determine if a sector is actively erasing or is erase-suspended.
See “Write Operation Status” on page 33 for information on these status bits.
After an erase-suspended program operation is complete, the system can once
again read array data within non-suspended sectors. The system can determine
the status of the program operation using the DQ7 or DQ6 status bits, just as in
the standard program operation. See “Write Operation Status” on page 33 for
more information.
The system may also write the autoselect command sequence when the device
is in the Erase Suspend mode. The device allows reading autoselect codes even
at addresses within erasing sectors, since the codes are not stored in the memory
array. When the device exits the autoselect mode, the device reverts to the Erase
Suspend mode, and is ready for another valid operation. See “Autoselect Command Sequence” on page 24 for more information.
The system must write the Erase Resume command (address bits are “don’t
care”) to exit the erase suspend mode and continue the sector erase operation.
Further writes of the Resume command are ignored. Another Erase Suspend
command can be written after the device resumes erasing.
Note: During an erase operation, this flash device performs multiple internal operations which are invisible to the system. When an erase operation is
suspended, any of the internal operations that were not fully completed must be
restarted. As such, if this flash device is continually issued suspend/resume commands in rapid succession, erase progress is impeded as a function of the number
of suspends. The result is a longer cumulative erase time than without suspends.
Note that the additional suspends do not affect device reliability or future performance. In most systems rapid erase/suspend activity occurs only briefly. In such
cases, erase performance is not significantly impacted.
28
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START
Write Erase
Command Sequence
Data Poll
from System
Embedded
Erase
algorithm
in progress
No
Data = FFh?
Yes
Erasure Completed
Notes:
1. See Table 10, on page 31 and Table 11, on page 32 for erase command sequence.
2. See “DQ3: Sector Erase Timer” on page 38 for more information.
Figure 5.
Erase Operation
Program Suspend/Program Resume Command Sequence
The Program Suspend command allows the system to interrupt a programming
operation so that data can be read from any non-suspended sector. When the
Program Suspend command is written during a programming process, the device halts the program operation within 15 μs maximum (5 μs typical) and
updates the status bits. Addresses are not required when writing the Program
Suspend command.
After the programming operation is suspended, the system can read array data
from any non-suspended sector. The Program Suspend command may also be
issued during a programming operation while an erase is suspended. In this
case, data may be read from any addresses not in Erase Suspend or Program
Suspend. If a read is needed from the Secured Silicon Sector area (One-time
Program area), then user must use the proper command sequences to enter and
exit this region.
The system may also write the autoselect command sequence when the device
is in the Program Suspend mode. The system can read as many autoselect
codes as required. When the device exits the autoselect mode, the device reverts to the Program Suspend mode, and is ready for another valid operation.
See Autoselect Command Sequence for more information.
After the Program Resume command is written, the device reverts to programming. The system can determine the status of the program operation using the
January 31, 2007 25974B5
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DQ7 or DQ6 status bits, just as in the standard program operation. See “Write
Operation Status” on page 33 for more information.
The system must write the Program Resume command (address bits are don’t
care) to exit the Program Suspend mode and continue the programming operation. Further writes of the Resume command are ignored. Another Program
Suspend command can be written after the device resumes programming.
Program Operation
Sequence in Progress
Write address/data
XXXh/B0h
Write Program Suspend
Command Sequence
Command is also valid for
Erase-suspended-program
operations
Wait 15 ms
Autoselect and SecSi Sector
read operations are also allowed
Read data as
required
No
Data cannot be read from erase- or
program-suspended sectors
Done
reading?
Yes
Write address/data
XXXh/30h
Write Program Resume
Command Sequence
Device reverts to
operation prior to
Program Suspend
Figure 6.
30
Program Suspend/Program Resume
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Command Definitions Tables
Table 10.
Read (Note 5)
Autoselect (Note 7)
Reset (Note 6)
Bus Cycles (Notes 2–5)
Cycles
Command
Sequence
(Note 1)
Command Definitions (x16 Mode, BYTE# = VIH)
Addr
Data
1
RA
RD
First
Second
Addr
Data
Third
Addr
Fourth
Data
Addr
Fifth
Data
1
XXX
F0
Manufacturer ID
4
555
AA
2AA
55
555
90
X00
0001
Device ID, Top Boot (Note 8)
6
555
AA
2AA
55
555
90
X01
22C4
Device ID, Bottom Boot (Note 8)
6
555
AA
2AA
55
555
90
X01
2249
Secured Silicon Sector Factory
Protect
(Note 15)
4
555
AA
2AA
55
555
90
X03
83/03
Sector Group Protect Verify
(Note 9)
4
555
AA
2AA
55
555
90
(SA)X02
00/01
Sixth
Addr
Data
Addr
Data
Enter Secured Silicon Sector Region
3
555
AA
2AA
55
555
88
Exit Secured Silicon Sector Region
4
555
AA
2AA
55
555
90
XXX
00
Program
4
555
AA
2AA
55
555
A0
PA
PD
Unlock Bypass
3
555
AA
2AA
55
555
20
Unlock Bypass Program (Note 10)
2
XXX
A0
PA
PD
Unlock Bypass Reset (Note 11)
2
XXX
90
XXX
00
Chip Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
555
10
Sector Erase
6
555
AA
2AA
55
555
80
555
AA
2AA
55
SA
30
Program/Erase Suspend (Note 12)
1
XXX
B0
Program/Erase Resume (Note 13)
1
XXX
30
CFI Query (Note 14)
1
55
98
Legend:
X = Don’t care
RA = Read Address of memory location to be read.
RD = Read Data read from location RA during read operation.
PA = Program Address. Addresses latch on falling edge of WE# or CE# pulse, whichever happens later.
PD = Program Data for location PA. Data latches on rising edge of WE# or CE# pulse, whichever happens first.
SA = Sector Address of sector to be verified (in autoselect mode) or erased. Address bits A19–A15 uniquely select any sector.
Notes:
1. See Table 1, on page 10 for description of bus operations.
2. All values are in hexadecimal.
9. Data is 00h for an unprotected sector group and 01h for a
protected sector group.
3. Shaded cells indicate read cycles. All others are write
cycles.
10. Unlock Bypass command is required prior to Unlock
Bypass Program command.
4. During unlock and command cycles, when lower address
bits are 555 or 2AA as shown in table, address bits above
A11 and data bits above DQ7 are don’t care.
11. Unlock Bypass Reset command is required to return to
read mode when device is in unlock bypass mode.
5. No unlock or command cycles required when device is in
read mode.
6. Reset command is required to return to read mode (or to
erase-suspend-read mode if previously in Erase Suspend)
when device is in autoselect mode, or if DQ5 goes high
while device is providing status information.
7. Fourth cycle of the autoselect command sequence is a
read cycle. Data bits DQ15–DQ8 are don’t care. See
“Autoselect Command Sequence” on page 24 for more
information.
12. System may read and program in non-erasing sectors, or
enter autoselect mode, when in Erase Suspend mode.
Erase Suspend command is valid only during a sector
erase operation.
13. Erase Resume command is valid only during Erase
Suspend mode.
14. Command is valid when device is ready to read array data
or when device is in autoselect mode.
15. Data is 83h for factory locked and 03h for not factory
locked.
8. Device ID must be read in three cycles.
January 31, 2007 25974B5
Am29LV160M
31
D a t a
Table 11.
Command Definitions (x8 Mode, BYTE# = VIL)
Bus Cycles (Notes 2–5)
Addr
Read (Note 5)
1
RA
Reset (Note 6)
Autoselect (Note 7)
Cycles
Command
Sequence
(Note 1)
S h e e t
First
Second
Data
RD
Addr
Data
Third
Addr
Fourth
Data
Addr
Fifth
Data
1
XXX
F0
Manufacturer ID
4
AAA
AA
555
55
AAA
90
X00
01
Device ID, Top Boot (Note 8)
6
AAA
AA
555
55
AAA
90
X02
C4
Device ID, Bottom Boot (Note
8)
6
AAA
AA
555
55
AAA
90
X02
49
Secured Silicon Sector Factory
Protect
(Note 15)
4
AAA
AA
555
55
AAA
90
X06
83/03
Sector Group Protect Verify
(Note 9)
(SA)X04
00/01
4
AAA
AA
555
55
AAA
90
Enter Secured Silicon Sector Region
3
AAA
AA
555
55
AAA
88
Exit Secured Silicon Sector Region
4
AAA
AA
555
55
AAA
90
XXX
00
Program
4
AAA
AA
555
55
AAA
A0
PA
PD
Unlock Bypass
3
AAA
AA
555
55
AAA
20
Unlock Bypass Program (Note 10)
2
XXX
A0
PA
PD
Sixth
Addr
Data
Addr
Data
Unlock Bypass Reset (Note 11)
2
XXX
90
XXX
00
Chip Erase
6
AAA
AA
555
55
AAA
80
AAA
AA
555
55
AAA
10
Sector Erase
6
AAA
AA
555
55
AAA
80
AAA
AA
555
55
SA
30
Program/Erase Suspend (Note 12)
1
XXX
B0
Program/Erase Resume (Note 13)
1
XXX
30
CFI Query (Note 14)
1
AA
98
Legend:
X = Don’t care
RA = Read Address of memory location to be read.
RD = Read Data read from location RA during read operation.
PA = Program Address. Addresses latch on falling edge of WE# or CE# pulse, whichever happens later.
PD = Program Data for location PA. Data latches on rising edge of WE# or CE# pulse, whichever happens first.
SA = Sector Address of sector to be verified (in autoselect mode) or erased. Address bits A19–A15 uniquely select any sector.
Notes:
1. See Table 1, on page 10 for description of bus operations.
2. All values are in hexadecimal.
9. Data is 00h for an unprotected sector group and 01h for a
protected sector group.
3. Shaded cells indicate read cycles. All others are write
cycles.
10. Unlock Bypass command is required prior to Unlock
Bypass Program command.
4. During unlock and command cycles, when lower address
bits are 555 or AAA as shown in table, address bits above
A11 are don’t care.
11. Unlock Bypass Reset command is required to return to
read mode when device is in unlock bypass mode.
5. No unlock or command cycles required when device is in
read mode.
12. System may read and program in non-erasing sectors, or
enter autoselect mode, when in Erase Suspend mode.
Erase Suspend command is valid only during a sector
erase operation.
6. Reset command is required to return to read mode (or to
erase-suspend-read mode if previously in Erase Suspend)
when device is in autoselect mode, or if DQ5 goes high
while device is providing status information.
13. Erase Resume command is valid only during Erase
Suspend mode.
7. Fourth cycle of autoselect command sequence is a read
cycle. Data bits DQ15–DQ8 are don’t care. See
“Autoselect Command Sequence” on page 24 for more
information.
15. Data is 83h for factory locked and 03h for not factory
locked.
14. Command is valid when device is ready to read array data
or when device is in autoselect mode.
8. Device ID must be read in three cycles.
32
Am29LV160M
25974B5 January 31, 2007
D a t a
S h e e t
Write Operation Status
The device provides several bits to determine the status of a write operation:
DQ2, DQ3, DQ5, DQ6, DQ7, and RY/BY#. Table 12, on page 38 and the following
subsections describe the functions of these bits. DQ7, RY/BY#, and DQ6 each
offer a method for determining whether a program or erase operation is complete
or in progress. These three bits are discussed first.
DQ7: Data# Polling
The Data# Polling bit, DQ7, indicates to the host system whether an Embedded
Algorithm is in progress or completed, or whether the device is in Erase Suspend.
Data# Polling is valid after the rising edge of the final WE# pulse in the program
or erase command sequence.
During the Embedded Program algorithm, the device outputs on DQ7 the complement of the datum programmed to DQ7. This DQ7 status also applies to
programming during Erase Suspend. When the Embedded Program algorithm is
complete, the device outputs the datum programmed to DQ7. The system must
provide the program address to read valid status information on DQ7. If a program address falls within a protected sector, Data# Polling on DQ7 is active for
approximately 1 µs, then the device returns to reading array data.
During the Embedded Erase algorithm, Data# Polling produces a “0” on DQ7.
When the Embedded Erase algorithm is complete, or if the device enters the
Erase Suspend mode, Data# Polling produces a “1” on DQ7. This is analogous to
the complement/true datum output described for the Embedded Program algorithm: the erase function changes all the bits in a sector to “1”; prior to this, the
device outputs the “complement,” or “0.” The system must provide an address
within any of the sectors selected for erasure to read valid status information on
DQ7.
After an erase command sequence is written, if all sectors selected for erasing
are protected, Data# Polling on DQ7 is active for approximately 100 µs, then the
device returns to reading array data. If not all selected sectors are protected, the
Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are protected.
When the system detects DQ7 changes from the complement to true data, it can
read valid data at DQ7–DQ0 on the following read cycles. This is because DQ7
may change asynchronously with DQ0–DQ6 while Output Enable (OE#) is ass e r t e d l o w. F i g u r e 1 9 , o n p a g e 4 8 , D a t a # Po l l i n g T i m i n g s
(During Embedded Algorithms), illustrates this.
Table 12, on page 38 shows the outputs for Data# Polling on DQ7. Figure 7, on
page 34 shows the Data# Polling algorithm.
January 31, 2007 25974B5
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33
D a t a
S h e e t
START
Read DQ7–DQ0
Addr = VA
DQ7 = Data?
Yes
No
No
DQ5 = 1?
Yes
Read DQ7–DQ0
Addr = VA
DQ7 = Data?
Yes
No
PASS
FAIL
Notes:
1. VA = Valid address for programming. During a sector erase operation, a valid
address is an address within any sector selected for erasure. During chip erase, a
valid address is any non-protected sector address.
2. DQ7 should be rechecked even if DQ5 = “1” because DQ7 may change simultaneously with DQ5.
Figure 7.
Data# Polling Algorithm
RY/BY#: Ready/Busy#
The RY/BY# is a dedicated, open-drain output pin that indicates whether an Embedded Algorithm is in progress or complete. The RY/BY# status is valid after the
rising edge of the final WE# pulse in the command sequence. Since RY/BY# is an
open-drain output, several RY/BY# pins can be tied together in parallel with a
pull-up resistor to VCC.
34
Am29LV160M
25974B5 January 31, 2007
D a t a
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If the output is low (Busy), the device is actively erasing or programming. (This
includes programming in the Erase Suspend mode.) If the output is high (Ready),
the device is ready to read array data (including during the Erase Suspend
mode), or is in the standby mode.
Table 12, on page 38 shows the outputs for RY/BY#. Figure 13, on page 42, Figure 14, on page 43, Figure 17, on page 46 and Figure 18, on page 47 show RY/
BY# for read, reset, program, and erase operations, respectively.
DQ6: Toggle Bit I
Toggle Bit I on DQ6 indicates whether an Embedded Program or Erase algorithm
is in progress or complete, or whether the device entered the Erase Suspend
mode. Toggle Bit I may be read at any address, and is valid after the rising edge
of the final WE# pulse in the command sequence (prior to the program or erase
operation), and during the sector erase time-out.
During an Embedded Program or Erase algorithm operation, successive read cycles to any address cause DQ6 to toggle. (The system may use either OE# or CE#
to control the read cycles.) When the operation is complete, DQ6 stops toggling.
After an erase command sequence is written, if all sectors selected for erasing
are protected, DQ6 toggles for approximately 100 µs, then returns to reading
array data. If not all selected sectors are protected, the Embedded Erase algorithm erases the unprotected sectors, and ignores the selected sectors that are
protected.
The system can use DQ6 and DQ2 together to determine whether a sector is actively erasing or is erase-suspended. When the device is actively erasing (that is,
the Embedded Erase algorithm is in progress), DQ6 toggles. When the device enters the Erase Suspend mode, DQ6 stops toggling. However, the system must
also use DQ2 to determine which sectors are erasing or erase-suspended. Alternatively, the system can use DQ7 (see the subsection on “DQ7: Data# Polling”).
If a program address falls within a protected sector, DQ6 toggles for approximately 1 µs after the program command sequence is written, then returns to
reading array data.
DQ6 also toggles during the erase-suspend-program mode, and stops toggling
once the Embedded Program algorithm is complete.
Table 12, on page 38 shows the outputs for Toggle Bit I on DQ6. Figure 8, on page
37 shows the toggle bit algorithm in flowchart form, and the section “Reading
Toggle Bits DQ6/DQ2” on page 36 explains the algorithm. Figure 20, on page 48
in the “AC Characteristics” section shows the toggle bit timing diagrams. Figure
21, on page 49 shows the differences between DQ2 and DQ6 in graphical form.
See also the subsection on “DQ2: Toggle Bit II”.
DQ2: Toggle Bit II
The “Toggle Bit II” on DQ2, when used with DQ6, indicates whether a particular
sector is actively erasing (that is, the Embedded Erase algorithm is in progress),
or whether that sector is erase-suspended. Toggle Bit II is valid after the rising
edge of the final WE# pulse in the command sequence.
DQ2 toggles when the system reads at addresses within those sectors that were
selected for erasure. (The system may use either OE# or CE# to control the read
cycles.) But DQ2 cannot distinguish whether the sector is actively erasing or is
erase-suspended. DQ6, by comparison, indicates whether the device is actively
erasing, or is in Erase Suspend, but cannot distinguish which sectors are selected
January 31, 2007 25974B5
Am29LV160M
35
D a t a
S h e e t
for erasure. Thus, both status bits are required for sector and mode information.
Refer to Table 12, on page 38 to compare outputs for DQ2 and DQ6.
Figure 8, on page 37 shows the toggle bit algorithm in flowchart form, and the
section “Reading Toggle Bits DQ6/DQ2” explains the algorithm. See also the
“DQ6: Toggle Bit I” on page 35 subsection.Figure 20, on page 48 shows the toggle bit timing diagram. Figure 21, on page 49 shows the differences between DQ2
and DQ6 in graphical form.
Reading Toggle Bits DQ6/DQ2
Refer to Figure 8, on page 37 for the following discussion. Whenever the system
initially begins reading toggle bit status, it must read DQ7–DQ0 at least twice
in a row to determine whether a toggle bit is toggling. Typically, the system
would note and store the value of the toggle bit after the first read. After the
second read, the system would compare the new value of the toggle bit with
the first. If the toggle bit is not toggling, the device completed the program or
erase operation. The system can read array data on DQ7–DQ0 on the following
read cycle.
However, if after the initial two read cycles, the system determines that the toggle
bit is still toggling, the system also should note whether the value of DQ5 is high
(see the section on DQ5). If it is, the system should then determine again
whether the toggle bit is toggling, since the toggle bit may have stopped toggling
just as DQ5 went high. If the toggle bit is no longer toggling, the device successfully completed the program or erase operation. If it is still toggling, the device
did not complete the operation successfully, and the system must write the reset
command to return to reading array data.
The remaining scenario is that the system initially determines that the toggle bit
is toggling and DQ5 did not go high. The system may continue to monitor the toggle bit and DQ5 through successive read cycles, determining the status as
described in the previous paragraph. Alternatively, it may choose to perform
other system tasks. In this case, the system must start at the beginning of the
algorithm when it returns to determine the status of the operation (top of Figure
8, on page 37).
36
Am29LV160M
25974B5 January 31, 2007
D a t a
S h e e t
START
Read DQ7–DQ0
Read DQ7–DQ0
(Note 1)
Toggle Bit
= Toggle?
No
Yes
No
DQ5 = 1?
Yes
Read DQ7–DQ0
Twice
(Notes
1, 2)
Toggle Bit
= Toggle?
No
Yes
Program/Erase
Operation Not
Complete, Write
Reset Command
Figure 8.
Program/Erase
Operation Complete
Toggle Bit Algorithm
Notes:
1. Read toggle bit twice to determine whether or not it is toggling. See text.
2. Recheck toggle bit because it may stop toggling as DQ5 changes to “1”. See text.
DQ5: Exceeded Timing Limits
DQ5 indicates whether the program or erase time exceeded a specified internal
pulse count limit. Under these conditions DQ5 produces a “1.” This is a failure
condition that indicates the program or erase cycle was not successfully
completed.
The DQ5 failure condition may appear if the system tries to program a “1” to a
location that is previously programmed to “0.” Only an erase operation can
January 31, 2007 25974B5
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change a “0” back to a “1.” Under this condition, the device halts the operation, and when the operation exceeds the timing limits, DQ5 produces a “1.”
Under both these conditions, the system must issue the reset command to return
the device to reading array data.
DQ3: Sector Erase Timer
After writing a sector erase command sequence, the system may read DQ3 to determine whether or not an erase operation starts. (The sector erase timer does
not apply to the chip erase command.) If additional sectors are selected for erasure, the entire time-out also applies after each additional sector erase command.
When the time-out is complete, DQ3 switches from “0” to “1.” The system may
ignore DQ3 if the system can guarantee that the time between additional sector erase commands is always less than 50 μs. See also the “Sector Erase
Command Sequence” on page 27.
After the sector erase command sequence is written, the system should read the
status on DQ7 (Data# Polling) or DQ6 (Toggle Bit I) to ensure the device accepted
the command sequence, and then read DQ3. If DQ3 is “1”, the internally controlled erase cycle started; all further commands (other than Erase Suspend) are
ignored until the erase operation is complete. If DQ3 is “0”, the device accepts
additional sector erase commands. To ensure the command is accepted, the system software should check the status of DQ3 prior to and following each
subsequent sector erase command. If DQ3 is high on the second status check,
the last command might not have been accepted. Table 12 shows the outputs for
DQ3.
Table 12.
DQ7
(Note
2)
DQ6
DQ5
(Note 1)
DQ3
DQ2
(Note 2)
Embedded Program Algorithm
DQ7#
Toggle
0
N/A
No toggle
0
Embedded Erase Algorithm
0
Toggle
0
1
Toggle
0
Operation
Standard
Mode
Program
Suspend
Mode
Erase
Suspend
Mode
Write Operation Status
ProgramSuspend Read
RY/BY#
ProgramSuspended Sector
Invalid (not allowed)
1
Non-Program
Suspended Sector
Data
1
Reading within Erase
Suspended Sector
1
No toggle
0
N/A
Toggle
1
Reading within Non-Erase Suspended
Sector
Data
Data
Data
Data
Data
1
Erase-Suspend-Program
DQ7#
Toggle
0
N/A
N/A
0
Notes:
1. DQ5 switches to ‘1’ when an Embedded Program or Embedded Erase operation exceeds the maximum timing limits.
See “DQ5: Exceeded Timing Limits” on page 37 for more information.
2. DQ7 and DQ2 require a valid address when reading status information. Refer to the appropriate subsection for further
details.
38
Am29LV160M
25974B5 January 31, 2007
D a t a
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Absolute Maximum Ratings
Storage Temperature, Plastic Packages . . . . . . . . . . . . . . . . .–65°C to +150°C
Ambient Temperature with Power Applied . . . . . . . . . . . . . . .–65°C to +125°C
Voltage with Respect to Ground
VCC (Note 1). . . . . . . . . . . . . . . . . . . . . . . . . . . . . . .–0.5 V to +4.0 V
A9, OE#, and RESET# (Note 2) . . . . . . . . . . . . . . . . –0.5 V to +12.5 V
All other pins (Note 1) . . . . . . . . . . . . . . . . . . . . . –0.5 V to VCC+0.5 V
Output Short Circuit Current (Note 3). . . . . . . . . . . . . . . . . . . . . . . . 200 mA
Notes:
1. Minimum DC voltage on input or I/O pins is –0.5 V. During voltage transitions,
input or I/O pins may overshoot VSS to –2.0 V for periods of up to 20 ns. See Figure
9. Maximum DC voltage on input or I/O pins is VCC +0.5 V. During voltage
transitions, input or I/O pins may overshoot to VCC +2.0 V for periods up to 20 ns.
See Figure 10.
2. Minimum DC input voltage on pins A9, OE#, and RESET# is -0.5 V. During voltage
transitions, A9, OE#, and RESET# may overshoot VSS to –2.0 V for periods of up
to 20 ns. See Figure 9. Maximum DC input voltage on pin A9 is +12.5 V which
may overshoot to 14.0 V for periods up to 20 ns.
3. No more than one output may be shorted to ground at a time. Duration of the short
circuit should not be greater than one second.
Stresses above those listed under “Absolute Maximum Ratings” may cause permanent
damage to the device. This is a stress rating only; functional operation of the device
at these or any other conditions above those indicated in the operational sections of
this data sheet is not implied. Exposure of the device to absolute maximum rating conditions for extended periods may affect device reliability.
20 ns
20 ns
20 ns
VCC
+2.0 V
VCC
+0.5 V
+0.8 V
–0.5 V
–2.0 V
2.0 V
20 ns
20 ns
Figure 9. Maximum Negative
Overshoot Waveform
20 ns
Figure 10. Maximum Positive
Overshoot Waveform
Operating Ranges
Industrial (I) Devices
Ambient Temperature (TA) . . . . . . . . . . . . . . . . . . . . . . . . . –40°C to +85°C
VCC Supply Voltages
VCC for regulated voltage range . . . . . . . . . . . . . . . . . . . . . . . 3.0 V to 3.6 V
VCC for full voltage range . . . . . . . . . . . . . . . . . . . . . . . . . . . . 2.7 V to 3.6 V
Operating ranges define those limits between which the functionality of the device is
guaranteed.
January 31, 2007 25974B5
Am29LV160M
39
D a t a
S h e e t
DC Characteristics
CMOS Compatible
Parameter
Description
Test Conditions
Min
Typ
Max
Unit
±1.0
µA
ILI
Input Load Current
VIN = VSS to VCC,
VCC = VCC max
ILIT
A9 Input Load Current
VCC = VCC max; A9 = 12.5 V
35
µA
ILR
Reset Leakage Current
VCC = VCC max; RESET# = 12.5 V
35
µA
ILO
Output Leakage Current
VOUT = VSS to VCC,
VCC = VCC max
±1.0
µA
ICC1
VCC Active Read Current
(Notes 1, 2)
CE# = VIL, OE# = VIH, 5 MHz
Byte Mode
1 MHz
15
30
2
10
5 MHz
CE# = VIL, OE# = VIH,
Word Mode
1 MHz
15
30
2
10
CE# = VIL, OE# = VIH
40
60
mA
mA
ICC2
VCC Active Write Current
(Notes 2, 3, 5)
ICC3
VCC Standby Current (Notes 2, 4) CE#, RESET# = VCC±0.3 V
0.4
5
µA
ICC4
VCC Standby Current During Reset
RESET# = VSS ± 0.3 V
(Notes 2, 4)
0.8
5
µA
ICC5
Automatic Sleep Mode
(Notes 2, 4, 6)
0.4
5
µA
VIL1
Input Low Voltage 1(6, 7)
–0.5
0.8
V
VIH1
Input High Voltage 1 (6, 7)
1.9
VCC + 0.5
V
VIL2
Input Low Voltage 2 (6, 8)
–0.5
0.3 x VIO
V
VIH2
Input High Voltage 2 (6, 8)
1.9
VIO + 0.5
V
VID
Voltage for Autoselect and
Temporary Sector Unprotect
VCC = 3.3 V
11.5
12.5
V
VOL
Output Low Voltage
IOL = 4.0 mA, VCC = VCC min
0.45
V
VOH1
VOH2
VLKO
Output High Voltage
VIH = VCC ± 0.3 V;
VIL = VSS ± 0.3 V
IOH = -2.0 mA, VCC = VCC min
0.85 x VCC
IOH = -100 µA, VCC = VCC min
VCC–0.4
Low VCC Lock-Out Voltage (Note 4)
2.3
V
2.5
V
Notes:
1. The ICC current listed is typically less than 2 mA/MHz, with OE# at VIH. Typical VCC is 3.0 V.
2. Maximum ICC specifications are tested with VCC = VCCmax.
3. ICC active while Embedded Erase or Embedded Program is in progress.
4. At extended temperature range (>+85°C), typical current is 5 µA and maximum current is 10 µA.
5. Automatic sleep mode enables the low power mode when addresses remain stable for tACC + 30 ns.
6. Not 100% tested.
7. VCC voltage requirements.
8. VIO voltage requirements.
40
Am29LV160M
25974B5 January 31, 2007
D a t a
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Test Conditions
Table 13.
3.3 V
2.7 kΩ
Device
Under
Test
CL
Test Specifications
70R,
85
Test Condition
Output Load
30
Input Rise and Fall Times
Figure 11.
30
pF
5
ns
0.0–3.0
V
Input timing measurement
reference levels
1.5
V
Output timing measurement
reference levels
1.5
V
Input Pulse Levels
Note: Diodes are IN3064 or equivalent
Unit
1 TTL gate
Output Load Capacitance, CL
(including jig capacitance)
6.2 kΩ
90, 100
Test Setup
Key to Switching Waveforms
WAVEFORM
INPUTS
OUTPUTS
Steady
Changing from H to L
Changing from L to H
3.0 V
Input
Don’t Care, Any Change Permitted
Changing, State Unknown
Does Not Apply
Center Line is High Impedance State (High Z)
1.5 V
Measurement Level
1.5 V
Output
0.0 V
Figure 12.
January 31, 2007 25974B5
Input Waveforms and Measurement Levels
Am29LV160M
41
D a t a
S h e e t
AC Characteristics
Read Operations
Parameter
Speed Options
JEDEC
Std
Description
tAVAV
tRC
Read Cycle Time (Note 1)
tAVQV
tACC
Address to Output Delay
tELQV
tCE
Chip Enable to Output Delay
tGLQV
tOE
tEHQZ
tGHQZ
tAXQX
Test Setup
70R
85
90
100
Unit
Min
70
85
90
100
ns
CE# = VIL
OE# = VIL
Max
70
85
90
100
ns
OE# = VIL
Max
70
85
90
100
ns
Output Enable to Output Delay
Max
30
35
35
50
ns
tDF
Chip Enable to Output High Z (Note 1)
Max
25
30
30
30
ns
tDF
Output Enable to Output High Z (Note 1)
Max
25
30
30
30
ns
Read
Output Enable
Hold Time (Note 1) Toggle and
Data# Polling
Min
0
ns
tOEH
Min
10
ns
tOH
Output Hold Time From Addresses, CE#
or OE#, Whichever Occurs First (Note 1)
Min
0
ns
Notes:
1. Not 100% tested.
2. See Figure 11, on page 41 and Table 13, on page 42 for test specifications.
tRC
Addresses Stable
Addresses
tACC
CE#
tDF
tOE
OE#
tOEH
WE#
tCE
tOH
HIGH Z
HIGH Z
Output Valid
Outputs
RESET#
RY/BY#
0V
Figure 13.
42
Read Operations Timings
Am29LV160M
25974B5 January 31, 2007
D a t a
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AC Characteristics
Hardware Reset (RESET#)
Parameter
JEDEC
Std
Description
Test Setup
All Speed Options
Unit
tREADY
RESET# Pin Low (During Embedded Algorithms)
to Read or Write (See Note)
Max
20
µs
tREADY
RESET# Pin Low (NOT During Embedded
Algorithms) to Read or Write (See Note)
Max
500
ns
tRP
RESET# Pulse Width
Min
500
ns
tRH
RESET# High Time Before Read (See Note)
Min
50
ns
tRPD
RESET# Low to Standby Mode
Min
20
µs
tRB
RY/BY# Recovery Time
Min
0
ns
Note: Not 100% tested.
RY/BY#
CE#, OE#
tRH
RESET#
tRP
tReady
Reset Timings NOT during Embedded Algorithms
Reset Timings during Embedded Algorithms
tReady
RY/BY#
tRB
CE#, OE#
RESET#
tRP
Figure 14.
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RESET# Timings
Am29LV160M
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AC Characteristics
Word/Byte Configuration (BYTE#)
Parameter
JEDEC
Speed Options
Std
Description
tELFL/tELFH
70R
85
90
100
5
Unit
CE# to BYTE# Switching Low or High
Max
ns
tFLQZ
BYTE# Switching Low to Output HIGH Z
Max
25
30
30
30
ns
tFHQV
BYTE# Switching High to Output Active
Min
70
85
90
100
ns
CE#
OE#
BYTE#
BYTE#
Switching
from word
to byte
mode
DQ0–DQ14
tELFL
Data Output
(DQ0–DQ7)
Data Output
(DQ0–DQ14)
Address
Input
DQ15
Output
DQ15/A-1
tFLQZ
tELFH
BYTE#
BYTE#
Switching
from byte
to word
mode
Data Output
(DQ0–DQ7)
DQ0–DQ14
Address
Input
DQ15/A-1
Data Output
(DQ0–DQ14)
DQ15
Output
tFHQV
Figure 15.
BYTE# Timings for Read Operations
CE#
The falling edge of the last WE# signal
WE#
BYTE#
Figure 16.
tSET
(tAS)
tHOLD (tAH)
BYTE# Timings for Write Operations
Note: Refer to the table “Erase/Program Operations” on page 45 for tAS and tAH specifications.
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AC Characteristics
Erase/Program Operations
Parameter
Speed Options
JEDEC
Std
Description
70R
85
90
100
Unit
tAVAV
tWC
Write Cycle Time (Note 1)
Min
70
85
90
100
ns
tAVWL
tAS
Address Setup Time
Min
tWLAX
tAH
Address Hold Time
Min
45
45
45
50
ns
tDVWH
tDS
Data Setup Time
Min
35
45
45
50
ns
tWHDX
tDH
Data Hold Time
Min
0
ns
tOES
Output Enable Setup Time
Min
0
ns
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
0
ns
tGHWL
tGHWL
tELWL
tCS
CE# Setup Time
Min
0
ns
tWHEH
tCH
CE# Hold Time
Min
0
ns
tWLWH
tWP
Write Pulse Width
Min
tWHWL
tWPH
Write Pulse Width High
Min
30
tWHWH1
tWHWH1
Byte
Typ
12
Word
Typ
12
Sector Erase Operation (Note 2)
Typ
0.7
sec
tVCS
VCC Setup Time (Note 1)
Min
50
µs
tRB
Recovery Time from RY/BY#
Min
0
ns
tBUSY
Program/Erase Valid to RY/BY# Delay
Max
90
ns
tPOLL
Program Valid Before Status Polling (Note 3)
Max
4
µs
tWHWH2
tWHWH2
Programming Operation (Note 2)
35
35
35
50
ns
ns
µs
Notes:
1. Not 100% tested.
2. See the “Erase and Programming Performance” on page 59 section for more information.
3. When using the program suspend/resume feature, if the suspend command is issued within tPOLL, tPOLL must
be fully re-applied upon resuming the programming operation. If the suspend command is issued after tPOLL,
tPOLL is not required again prior to reading the status bits upon resuming.
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45
D a t a
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AC Characteristics
Program Command Sequence (last two cycles)
tAS
tWC
Addresses
Read Status Data (last two cycles)
555h
PA
PA
PA
tAH
CE#
tCH
OE#
tPOLL
tWP
WE#
tWPH
tCS
tDS
tDH
A0h
Data
tWHWH1
PD
Status
tBUSY
DOUT
tRB
RY/BY#
VCC
tVCS
Notes:
1. PA = program address, PD = program data, DOUT is the true data at the program address.
2. Illustration shows device in word mode.
Figure 17.
46
Program Operation Timings
Am29LV160M
25974B5 January 31, 2007
D a t a
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AC Characteristics
Erase Command Sequence (last two cycles)
tAS
tWC
2AAh
Addresses
Read Status Data
VA
SA
555h for chip erase
VA
tAH
CE#
tCH
OE#
tWP
WE#
tWPH
tCS
tWHWH2
tDS
tDH
Data
55h
In
Progress
30h
Complete
10 for Chip Erase
tBUSY
tRB
RY/BY#
tVCS
VCC
Notes:
1. SA = sector address (for Sector Erase), VA = Valid Address for reading status data (see “Write Operation Status”).
2. Illustration shows device in word mode.
Figure 18.
January 31, 2007 25974B5
Chip/Sector Erase Operation Timings
Am29LV160M
47
D a t a
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AC Characteristics
tRC
Addresses
VA
tPOLL
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
tOEH
tDF
WE#
tOH
DQ15 and DQ7
DQ14–DQ8, DQ6–DQ0
Complement
Complement
Status Data
Status Data
Valid Data
True
Valid Data
True
High Z
High Z
tBUSY
RY/BY#
Note: VA = Valid address. Illustration shows first status cycle after command sequence, last status read cycle, and array
data read cycle.
Figure 19. Data# Polling Timings
(During Embedded Algorithms)
tRC
Addresses
VA
VA
VA
VA
tACC
tCE
CE#
tCH
tOE
OE#
tOEH
tDF
WE#
tOH
High Z
DQ6/DQ2
tBUSY
Valid Status
Valid Status
(first read)
(second read)
Valid Status
Valid Data
(stops toggling)
RY/BY#
Note: VA = Valid address; not required for DQ6. Illustration shows first two status cycle after command sequence, last
status read cycle, and array data read cycle.
Figure 20. Toggle Bit Timings
(During Embedded Algorithms)
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25974B5 January 31, 2007
D a t a
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AC Characteristics
Enter
Embedded
Erasing
Erase
Suspend
Erase
WE#
Enter Erase
Suspend Program
Erase
Suspend
Program
Erase Suspend
Read
Erase
Resume
Erase
Erase Suspend
Read
Erase
Complete
DQ6
DQ2
Note: The system may use CE# or OE# to toggle DQ2 and DQ6. DQ2 toggles only when read at an address within an
erase-suspended sector.
Figure 21. DQ2 vs. DQ6 for Erase and
Erase Suspend Operations
Temporary Sector Unprotect
Parameter
JEDEC
Std
tVIDR
tRSP
Description
VID Rise and Fall Time (See Note)
RESET# Setup Time for Temporary Sector
Unprotect
All Speed Options
Unit
Min
500
ns
Min
4
µs
Note: Not 100% tested.
12 V
RESET#
0 or 3 V
tVIDR
tVIDR
Program or Erase Command Sequence
CE#
WE#
tRSP
RY/BY#
Figure 22.
January 31, 2007 25974B5
Temporary Sector Unprotect/Timing Diagram
Am29LV160M
49
D a t a
S h e e t
AC Characteristics
VID
VIH
RESET#
SA, A6,
A1, A0
Valid*
Valid*
Sector Protect/Unprotect
Data
60h
Valid*
Verify
60h
40h
Status
Sector Protect: 150 µs
Sector Unprotect: 15 ms
1 µs
CE#
WE#
OE#
Note: For sector protect, A6 = 0, A1 = 1, A0 = 0. For sector unprotect, A6 = 1, A1 = 1, A0 = 0.
Figure 23.
50
Sector Protect/Unprotect Timing Diagram
Am29LV160M
25974B5 January 31, 2007
D a t a
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AC Characteristics
Alternate CE# Controlled Erase/Program Operations
Parameter
Speed Options
JEDEC
Std
Description
tAVAV
tWC
Write Cycle Time (Note 1)
Min
tAVEL
tAS
Address Setup Time
Min
tELAX
tAH
Address Hold Time
Min
45
45
45
50
ns
tDVEH
tDS
Data Setup Time
Min
35
45
45
50
ns
tEHDX
tDH
Data Hold Time
Min
0
ns
tOES
Output Enable Setup Time
Min
0
ns
tGHEL
tGHEL
Read Recovery Time Before Write
(OE# High to WE# Low)
Min
0
ns
tWLEL
tWS
WE# Setup Time
Min
0
ns
tEHWH
tWH
WE# Hold Time
Min
0
ns
tELEH
tCP
CE# Pulse Width
Min
tEHEL
tCPH
CE# Pulse Width High
Min
30
Byte
Typ
12
Word
Typ
12
Typ
0.7
tWHWH1
tWHWH2
tWHWH1
tWHWH2
Programming Operation (Note 2)
Sector Erase Operation (Note 2)
70R
85
90
100
Unit
70
85
90
100
ns
0
35
35
ns
35
50
ns
ns
µs
sec
Notes:
1. Not 100% tested.
2. See “Erase and Programming Performance” on page 59 for more information.
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D a t a
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AC Characteristics
555 for program
2AA for erase
PA for program
SA for sector erase
555 for chip erase
Data# Polling
Addresses
PA
tWC
tAS
tAH
tWH
WE#
tPOLL
tGHEL
OE#
tWHWH1 or 2
tCP
CE#
tWS
tCPH
tBUSY
tDS
tDH
DQ7#,
DQ15
Data
tRH
A0 for program
55 for erase
DOUT
PD for program
30 for sector erase
10 for chip erase
RESET#
RY/BY#
Notes:
1. PA = program address, PD = program data, DQ7# = complement of the data written to the device, DOUT = data written to
the device.
2. Figure indicates the last two bus cycles of the command sequence.
3. Word mode address used as an example.
Figure 24.
52
Alternate CE# Controlled Write Operation Timings
Am29LV160M
25974B5 January 31, 2007
D a t a
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Erase and Programming Performance
Parameter
Typ (Note 1)
Max (Note 2)
Sector Erase Time
0.7
15
Chip Erase Time
32
Byte Programming Time
18
300
Word Programming Time
18
300
Byte Mode
36
100
Word Mode
19
66
Chip Programming Time
(Note 3)
Unit
Comments
sec
Excludes 00h programming prior to
erasure (Note 4)
µs
Excludes system level overhead
(Note 5)
sec
Notes:
1. Typical program and erase times assume the following conditions: 25°C, VCC = 3.0V, 100,000 cycles. Additionally,
programming typicals assume checkerboard pattern.
2. Under worst case conditions of 90°C, VCC = 2.7 V, 100,000 cycles.
3. The typical chip programming time is considerably less than the maximum chip programming time listed, since most bytes
program faster than the maximum program times listed.
4. In the pre-programming step of the Embedded Erase algorithm, all bytes are programmed to 00h before erasure.
5. System-level overhead is the time required to execute the two- or four-bus-cycle sequence for the program command. See
Table 10, on page 31 and Table 11, on page 32 for further information on command definitions.
6. The device has a minimum erase and program cycle endurance of 100,000 cycles.
Latchup Characteristics
Description
Min
Max
Input voltage with respect to VSS on all pins except I/O pins
(including A9, OE#, and RESET#)
–1.0 V
12.5 V
Input voltage with respect to VSS on all I/O pins
–1.0 V
VCC + 1.0 V
–100 mA
+100 mA
VCC Current
Note: Includes all pins except VCC. Test conditions: VCC = 3.0 V, one pin at a time.
TSOP Pin and BGA Package Capacitance
Parameter Symbol
Parameter Description
Test Setup
CIN
Input Capacitance
VIN = 0
COUT
Output Capacitance
VOUT = 0
CIN2
Control Pin Capacitance
VIN = 0
Typ
Max
TSOP
6
7.5
Unit
pF
Fine-pitch BGA
4.2
5.0
pF
TSOP
8.5
12
pF
Fine-pitch BGA
5.4
6.5
pF
TSOP
7.5
9
pF
Fine-pitch BGA
3.9
4.7
pF
Notes:
1. Sampled, not 100% tested.
2. Test conditions TA = 25°C, f = 1.0 MHz.
Data Retention
Parameter
Test Conditions
Min
Unit
150°C
10
Years
125°C
20
Years
Minimum Pattern Data Retention Time
January 31, 2007 25974B5
Am29LV160M
53
D a t a
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Physical Dimensions
TS 048—48-Pin Standard TSOP
Dwg rev AA; 10/99
Note: BSC is an ANSI standard for Basic Space Centering.
54
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25974B5 January 31, 2007
D a t a
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Physical Dimensions
TSR048—48-Pin Reverse TSOP
Dwg rev AA; 10/99
Note: BSC is an ANSI standard for Basic Space Centering.
January 31, 2007 25974B5
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55
D a t a
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Physical Dimensions
FBA048—48-Ball Fine-Pitch Ball Grid Array (BGA)
6 x 8 mm Package
Dwg rev AF; 10/99
Note: BSC is an ANSI standard for Basic Space Centering.
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Am29LV160M
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D a t a
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Physical Dimensions
LAA064—64-Ball Fortified Ball Grid Array (BGA)
13 x 11 mm Package
Note: BSC is an ANSI standard for Basic Space Centering.
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57
D a t a
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Revision Summary
Revision A (June 24, 2002)
Initial release.
Revision A+1 (July 3, 2002)
Added LAA064 package.
Corrected power consumption currents.
Changed DC Characteristics Zero Power Flash tables to TBD.
Corrected minimum erase and program cycle endurance.
Revision A+2 (December 6, 2002)
Global
Removed 44-pin SO package. Deleted dashes from ordering part numbers.
Distinctive Characteristics
Added information for Secured Silicon sector, Program Suspend & Resume. Corrected erase endurance to 100K cycles. Changed section flow to match other
MirrorBit data sheets.
General Description
Changed section flow to match other MirrorBit data sheets.
Connection Diagrams
Corrected Fortified BGA diagram: balls C5, D8, D4, and F1 are now NC.
Ordering Information and Operating Ranges
Removed Commercial and Extended temperature ranges. Corrected Fine-pitch
BGA type to 6 x 8 mm package, FBA048.
Added package markings for the LAA064.
Secured Silicon Sector Flash Memory Region
Added section.
Program Suspend/Program Resume Command Sequence
Added text and flowchart.
Sector Protection/Unprotection
Deleted reference to alternate, high-voltage method of sector protection.
Command Definitions
Modified introductory paragraph to indicate device behavior when presented with
incorrect commands and data. Added mode restrictions to first paragraphs of program, sector erase and chip erase subsections.
Command Definitions tables
Replaced previous table with two tables. Byte mode and word mode are now
shown separately. Added Secured Silicon Sector Factory Protect command
sequence.
Table 10. Write Operation Status
Added Program Suspend Mode rows to table.
BGA and TSOP Capacitance
Added fine-pitch BGA capacitance to table.
AC Characteristics tables
Typical sector erase time is now 0.4 s in all tables.
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D a t a
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Physical Dimensions
Corrected Fortified BGA drawing to FBA048.
Revision A+3 (January 6, 2003)
Global
Deleted references to WP# and ACC. The Am29LV160M does not offer those
features.
Command Definitions table
Deleted references to write buffers. This device does not offer that feature.
AC Characteristics
Erase and Program Operations table; Alternate CE# Controlled Erase/Operations
table: Changed tWHWH1 to TBD.
Revision A+4 (June 16, 2003)
Global
Changed status from Advance Information to Preliminary.
Modified speed options available.
Product Selector Guide
Added Note #2.
Ordering Information
Corrected OPN tables and added Note.
Secured Silicon Sector Flash Memory Region
Replaced text in this section.
Command Definitions
Modified Legend.
Erase/Program Operations and Alternate CE# Controlled Erase/
Program Operations
Inserted values for all TBD.
Erase and Programming Performance
Inserted values for all TBD.
Revision B (August 11, 2003)
Global
Modified speed options available. Converted document formatting to Spansion
template. Changed data sheet status from Advance Information to Preliminary.
Revision B+1 (February 27, 2004)
Autoselect Mode, Table 4
Added Secured Silicon Sector Indicator Bit (DQ7).
Secured Silicon Sector Flash Memory Region, Table 5
Corrected Secured Silicon Sector Address Ranges.
Factory Locked: Secured Silicon Sector Programmed and Protected At the Factory: Corrected addresses associated with 16-byte random ESN.
Command Definitions Tables
Tables 10 and 11: Corrected Fourth Address of Secured Silicon Sector Factory
Protect.
January 31, 2007 25974B5
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59
D a t a
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AC Characteristics
Added tPOLL.
Revision B+2 (September 24, 2004)
Erase and Programming Performance
Corrected chip erase, byte/word programming, and chip programming
specifications.
Command Definitions, Table 10
Corrected command definitions for Secured Silicon Sector Factory Protect and
Program
Command Definitions, Table 11
Corrected command definitions for Secured Silicon Sector Factory Protect.
Cover sheet and Title page
Added notation referencing superseding documentation.
Revision B+3 (November 11, 2004)
Global
Added cross-reference links.
Secured Silicon Sector Addressing Table
Updated the x8 address ranges.
Revision B+4 (January 10, 2006)
This product has been retired and is not available for designs. For new and current designs, S29GL016A supersedes Am29LV160M and is the factoryrecommended migration path. Please refer to the S29GL016A datasheet for specifications and ordering information. Availability of this document is retained for
reference and historical purposes only.
Revision B5 (January 31, 2007)
Global
Changed SecSi to Secured Silicon.
Erase and Program Operations table
Changed tBUSY to a maximum specification.
60
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D a t a
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Colophon
The products described in this document are designed, developed and manufactured as contemplated for general use, including without limitation, ordinary
industrial use, general office use, personal use, and household use, but are not designed, developed and manufactured as contemplated (1) for any use that
includes fatal risks or dangers that, unless extremely high safety is secured, could have a serious effect to the public, and could lead directly to death, personal
injury, severe physical damage or other loss (i.e., nuclear reaction control in nuclear facility, aircraft flight control, air traffic control, mass transport control,
medical life support system, missile launch control in weapon system), or (2) for any use where chance of failure is intolerable (i.e., submersible repeater and
artificial satellite). Please note that Spansion will not be liable to you and/or any third party for any claims or damages arising in connection with above-mentioned uses of the products. Any semiconductor devices have an inherent chance of failure. You must protect against injury, damage or loss from such failures
by incorporating safety design measures into your facility and equipment such as redundancy, fire protection, and prevention of over-current levels and other
abnormal operating conditions. If any products described in this document represent goods or technologies subject to certain restrictions on export under
the Foreign Exchange and Foreign Trade Law of Japan, the US Export Administration Regulations or the applicable laws of any other country, the prior authorization by the respective government entity will be required for export of those products
Trademarks and Notice
Copyright © 2006–2007 Spansion Inc. All rights reserved. Spansion, the Spansion logo, MirrorBit, ORNAND, HD-SIM, and combinations thereof, are trademarks of Spansion Inc. Other company and product names used in this publication are for identification purposes only and may be trademarks of their respective companies.
Copyright © 2002–2005 Advanced Micro Devices, Inc. All rights reserved. AMD, the AMD logo, and combinations thereof are registered trademarks of Advanced Micro Devices, Inc. ExpressFlash is a trademark of Advanced Micro Devices, Inc. Product names used in this publication are for identification purposes
only and may be trademarks of their respective companies.
January 31, 2007 25974B5
Am29LV160M
61