MOTOROLA MRF141G

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by MRF141G/D
SEMICONDUCTOR TECHNICAL DATA
The RF MOSFET Line
N–Channel Enhancement–Mode MOSFET
Designed for broadband commercial and military applications at frequencies
to 175 MHz. The high power, high gain and broadband performance of this
device makes possible solid state transmitters for FM broadcast or TV channel
frequency bands.
• Guaranteed Performance at 175 MHz, 28 V:
Output Power — 300 W
Gain — 12 dB (14 dB Typ)
Efficiency — 50%
300 W, 28 V, 175 MHz
N–CHANNEL
BROADBAND
RF POWER MOSFET
• Low Thermal Resistance — 0.35°C/W
• Ruggedness Tested at Rated Output Power
• Nitride Passivated Die for Enhanced Reliability
D
G
S
(FLANGE)
G
CASE 375–04, STYLE 2
D
MAXIMUM RATINGS
Rating
Symbol
Value
Unit
Drain–Source Voltage
VDSS
65
Vdc
Drain–Gate Voltage
VDGO
65
Vdc
VGS
± 40
Vdc
Drain Current — Continuous
ID
32
Adc
Total Device Dissipation @ TC = 25°C
Derate above 25°C
PD
500
2.85
Watts
W/°C
Storage Temperature Range
Tstg
– 65 to +150
°C
TJ
200
°C
Symbol
Max
Unit
RθJC
0.35
°C/W
Gate–Source Voltage
Operating Junction Temperature
THERMAL CHARACTERISTICS
Characteristic
Thermal Resistance, Junction to Case
NOTE — CAUTION — MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
REV 2
RF DEVICE DATA
MOTOROLA
Motorola, Inc. 1997
MRF141G
1
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
V(BR)DSS
65
—
—
Vdc
Zero Gate Voltage Drain Current
(VDS = 28 V, VGS = 0)
IDSS
—
—
5.0
mAdc
Gate–Body Leakage Current
(VGS = 20 V, VDS = 0)
IGSS
—
—
1.0
µAdc
Gate Threshold Voltage
(VDS = 10 V, ID = 100 mA)
VGS(th)
1.0
3.0
5.0
Vdc
Drain–Source On–Voltage
(VGS = 10 V, ID = 10 A)
VDS(on)
0.1
0.9
1.5
Vdc
Forward Transconductance
(VDS = 10 V, ID = 5.0 A)
gfs
5.0
7.0
—
mhos
Input Capacitance
(VDS = 28 V, VGS = 0, f = 1.0 MHz)
Ciss
—
350
—
pF
Output Capacitance
(VDS = 28 V, VGS = 0, f = 1.0 MHz)
Coss
—
420
—
pF
Reverse Transfer Capacitance
(VDS = 28 V, VGS = 0, f = 1.0 MHz)
Crss
—
35
—
pF
Gps
12
14
—
dB
Drain Efficiency
(VDD = 28 V, Pout = 300 W, f = 175 MHz, ID (Max) = 21.4 A)
η
45
55
—
%
Load Mismatch
(VDD = 28 V, Pout = 300 W, IDQ = 500 mA, f = 175 MHz,
VSWR 5:1 at all Phase Angles)
ψ
OFF CHARACTERISTICS (1)
Drain–Source Breakdown Voltage
(VGS = 0, ID = 100 mA)
ON CHARACTERISTICS (1)
DYNAMIC CHARACTERISTICS (1)
FUNCTIONAL TESTS (2)
Common Source Amplifier Power Gain
(VDD = 28 V, Pout = 300 W, IDQ = 500 mA, f = 175 MHz)
No Degradation in Output Power
NOTES:
1. Each side measured separately.
2. Measured in push–pull configuration.
MRF141G
2
MOTOROLA RF DEVICE DATA
R1
+
BIAS 0 – 6 V
–
L2
C4
C5
C10
C2
+
28 V
–
OUTPUT
C12
L1
T2
DUT
INPUT
C11
T1
HIGH
IMPEDANCE
WINDINGS
9:1
IMPEDANCE
RATIO
CENTER
TAP
CENTER
TAP
C13
C6
C7
C1
C3
CONNECTIONS
TO LOW
IMPEDANCE
WINDINGS
4:1
IMPEDANCE
RATIO
C8 C9
T1 — 9:1 RF Transformer. Can be made of 15 – 18 Ohms
T1 — Semirigid Co–Ax, 62 – 90 Mils O.D.
T2 — 1:9 RF Transformer. Can be made of 15 – 18 Ohms
T2 — Semirigid Co–Ax, 70 – 90 Mils O.D.
C1 — Arco 402, 1.5 – 20 pF
C2 — Arco 406, 15 – 115 pF
C3, C4, C8, C9, C10 — 1000 pF Chip
C5, C11 — 0.1 µF Chip
C6 — 330 pF Chip
C7 — 200 pF and 180 pF Chips in Parallel
C12 — 0.47 µF Ceramic Chip, Kemet 1215 or Equivalent
C13 — Arco 403, 3.0 – 35 pF
L1 — 10 Turns AWG #16 Enameled Wire,
L1 — Close Wound, 1/4″ I.D.
L2 — Ferrite Beads of Suitable Material for
L2 — 1.5 – 2.0 µH Total Inductance
R1 — 100 Ohms, 1/2 W
R2 — 1.0 kOhm, 1/2 W
Board Material — 0.062″ Fiberglass (G10),
1 oz. Copper Clad, 2 Sides, εr = 5
NOTE: For stability, the input transformer T1 must be loaded
NOTE: with ferrite toroids or beads to increase the common
NOTE: mode inductance. For operation below 100 MHz. The
NOTE: same is required for the output transformer.
See pictures for construction details.
Unless Otherwise Noted, All Chip Capacitors are ATC Type 100 or Equivalent.
Figure 1. 175 MHz Test Circuit
VGS, GATE-SOURCE VOLTAGE (NORMALIZED)
TYPICAL CHARACTERISTICS
I D, DRAIN CURRENT (AMPS)
100
10
TC = 25°C
1
1
10
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
Figure 2. DC Safe Operating Area
MOTOROLA RF DEVICE DATA
100
1.04
1.03
1.02
1.01
1
0.99
0.98
0.97
0.96
0.95
0.94
0.93
0.92
0.91
0.9
– 25
ID = 5 A
4A
2A
1A
0.5 A
0
25
50
TC, CASE TEMPERATURE (°C)
0.25 A
75
100
Figure 3. Gate–Source Voltage versus
Case Temperature
MRF141G
3
TYPICAL CHARACTERISTICS
2000
Coss
VDS = 20 V
C, CAPACITANCE (pF)
f T, UNITY GAIN FREQUENCY (MHz)
2000
10 V
1000
0
0
2
4
6
8
10
12
14
ID, DRAIN CURRENT (AMPS)
16
18
Ciss
200
Crss
20
20
0
NOTE: Data shown applies to each half of MRF141G.
5
10
15
20
VDS, DRAIN–TO–SOURCE VOLTAGE (VOLTS)
NOTE: Data shown applies to each half of MRF141G.
Figure 4. Common Source Unity Gain Frequency
versus Drain Current
Figure 5. Capacitance versus
Drain–Source Voltage
400
Pout , OUTPUT POWER (WATTS)
G PS , POWER GAIN (dB)
30
25
20
15
VDD = 28 V
IDQ = 2 x 250 mA
Pout = 300 W
10
5
25
2
5
350
Pin = 30 W
f = 175 MHz
300
20 W
IDQ = 250 mA x 2
250
10 W
200
150
100
50
10
30
f, FREQUENCY (MHz)
100
200
0
12
Figure 6. Power Gain versus Frequency
100
18
20
22
SUPPLY VOLTAGE (VOLTS)
24
26
28
f = 175 MHz
INPUT, Zin
(GATE TO GATE)
125
100
150
f = 175 MHz
30
30
16
Figure 7. Output Power versus Supply Voltage
150
125
14
OUTPUT, ZOL*
(DRAIN TO DRAIN)
Zo = 10 Ω
ZOL* = Conjugate of the optimum load impedance
ZOL* = into which the device output operates at a
ZOL* = given output power, voltage and frequency.
Figure 8. Input and Output Impedances
MRF141G
4
MOTOROLA RF DEVICE DATA
RF POWER MOSFET CONSIDERATIONS
MOSFET CAPACITANCES
The physical structure of a MOSFET results in capacitors
between the terminals. The metal anode gate structure determines the capacitors from gate–to–drain (Cgd), and gate–
to–source (C gs ). The PN junction formed during the
fabrication of the MOSFET results in a junction capacitance
from drain–to–source (Cds).
These capacitances are characterized as input (Ciss), output (Coss) and reverse transfer (Crss) capacitances on data
sheets. The relationships between the inter–terminal capacitances and those given on data sheets are shown below. The
Ciss can be specified in two ways:
1. Drain shorted to source and positive voltage at the gate.
2. Positive voltage of the drain in respect to source and zero
volts at the gate. In the latter case the numbers are lower.
However, neither method represents the actual operating conditions in RF applications.
DRAIN
Cgd
GATE
Cds
Cgs
Ciss = Cgd = Cgs
Coss = Cgd = Cds
Crss = Cgd
SOURCE
LINEARITY AND GAIN CHARACTERISTICS
In addition to the typical IMD and power gain data presented, Figure 4 may give the designer additional information
on the capabilities of this device. The graph represents the
small signal unity current gain frequency at a given drain current level. This is equivalent to fT for bipolar transistors.
Since this test is performed at a fast sweep speed, heating of
the device does not occur. Thus, in normal use, the higher
temperatures may degrade these characteristics to some extent.
DRAIN CHARACTERISTICS
One figure of merit for a FET is its static resistance in the
full–on condition. This on–resistance, VDS(on), occurs in the
linear region of the output characteristic and is specified under specific test conditions for gate–source voltage and drain
current. For MOSFETs, VDS(on) has a positive temperature
coefficient and constitutes an important design consideration
at high temperatures, because it contributes to the power
dissipation within the device.
GATE CHARACTERISTICS
The gate of the MOSFET is a polysilicon material, and is
electrically isolated from the source by a layer of oxide. The
input resistance is very high — on the order of 109 ohms —
resulting in a leakage current of a few nanoamperes.
Gate control is achieved by applying a positive voltage
slightly in excess of the gate–to–source threshold voltage,
VGS(th).
Gate Voltage Rating — Never exceed the gate voltage
rating. Exceeding the rated VGS can result in permanent
damage to the oxide layer in the gate region.
Gate Termination — The gate of this device is essentially
capacitor. Circuits that leave the gate open–circuited or floatMOTOROLA RF DEVICE DATA
ing should be avoided. These conditions can result in turn–
on of the device due to voltage build–up on the input
capacitor due to leakage currents or pickup.
Gate Protection — This device does not have an internal
monolithic zener diode from gate–to–source. If gate protection is required, an external zener diode is recommended.
Using a resistor to keep the gate–to–source impedance
low also helps damp transients and serves another important
function. Voltage transients on the drain can be coupled to
the gate through the parasitic gate–drain capacitance. If the
gate–to–source impedance and the rate of voltage change
on the drain are both high, then the signal coupled to the gate
may be large enough to exceed the gate–threshold voltage
and turn the device on.
HANDLING CONSIDERATIONS
When shipping, the devices should be transported only in
antistatic bags or conductive foam. Upon removal from the
packaging, careful handling procedures should be adhered
to. Those handling the devices should wear grounding straps
and devices not in the antistatic packaging should be kept in
metal tote bins. MOSFETs should be handled by the case
and not by the leads, and when testing the device, all leads
should make good electrical contact before voltage is applied. As a final note, when placing the FET into the system it
is designed for, soldering should be done with a grounded
iron.
DESIGN CONSIDERATIONS
The MRF141G is an RF Power, MOS, N–channel enhancement mode field–effect transistor (FET) designed for
HF and VHF power amplifier applications.
Motorola Application Note AN211A, FETs in Theory and
Practice, is suggested reading for those not familiar with the
construction and characteristics of FETs.
The major advantages of RF power MOSFETs include
high gain, low noise, simple bias systems, relative immunity
from thermal runaway, and the ability to withstand severely
mismatched loads without suffering damage. Power output
can be varied over a wide range with a low power dc control
signal.
DC BIAS
The MRF141G is an enhancement mode FET and, therefore, does not conduct when drain voltage is applied. Drain
current flows when a positive voltage is applied to the gate.
RF power FETs require forward bias for optimum performance. The value of quiescent drain current (IDQ) is not critical for many applications. The MRF141G was characterized
at IDQ = 250 mA, each side, which is the suggested minimum
value of IDQ. For special applications such as linear amplification, IDQ may have to be selected to optimize the critical
parameters.
The gate is a dc open circuit and draws no current. Therefore, the gate bias circuit may be just a simple resistive divider network. Some applications may require a more elaborate
bias sytem.
GAIN CONTROL
Power output of the MRF141G may be controlled from its
rated value down to zero (negative gain) by varying the dc
gate voltage. This feature facilitates the design of manual
gain control, AGC/ALC and modulation systems.
MRF141G
5
PACKAGE DIMENSIONS
U
G
Q
RADIUS 2 PL
0.25 (0.010)
1
M
T A
M
DIM
A
B
C
D
E
G
H
J
K
N
Q
R
U
–B–
5
3
4
D
E
B
2
R
K
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
J
N
H
–T–
–A–
SEATING
PLANE
C
INCHES
MIN
MAX
1.330
1.350
0.370
0.410
0.190
0.230
0.215
0.235
0.050
0.070
0.430
0.440
0.102
0.112
0.004
0.006
0.185
0.215
0.845
0.875
0.060
0.070
0.390
0.410
1.100 BSC
STYLE 2:
PIN 1.
2.
3.
4.
5.
MILLIMETERS
MIN
MAX
33.79
34.29
9.40
10.41
4.83
5.84
5.47
5.96
1.27
1.77
10.92
11.18
2.59
2.84
0.11
0.15
4.83
5.33
21.46
22.23
1.52
1.78
9.91
10.41
27.94 BSC
DRAIN
DRAIN
GATE
GATE
SOURCE
CASE 375–04
ISSUE D
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MRF141G
6
◊
*MRF141G/D*
MRF141G/D
MOTOROLA RF DEVICE
DATA