MOTOROLA MRF275

Order this document
by MRF275G/D
SEMICONDUCTOR TECHNICAL DATA
The RF MOSFET Line
N–Channel Enhancement–Mode
Designed primarily for wideband large–signal output and driver stages from
100 – 500 MHz.
150 W, 28 V, 500 MHz
N–CHANNEL MOS
BROADBAND
100 – 500 MHz
RF POWER FET
• Guaranteed Performance @ 500 MHz, 28 Vdc
Output Power — 150 Watts
Power Gain — 10 dB (Min)
Efficiency — 50% (Min)
100% Tested for Load Mismatch at all Phase Angles with VSWR 30:1
• Overall Lower Capacitance @ 28 V
Ciss — 135 pF
Coss — 140 pF
Crss — 17 pF
• Simplified AVC, ALC and Modulation
Typical data for power amplifiers in industrial and
commercial applications:
• Typical Performance @ 400 MHz, 28 Vdc
Output Power — 150 Watts
Power Gain — 12.5 dB
Efficiency — 60%
• Typical Performance @ 225 MHz, 28 Vdc
Output Power — 200 Watts
Power Gain — 15 dB
Efficiency — 65%
D
G
S
(FLANGE)
G
CASE 375–04, STYLE 2
D
MAXIMUM RATINGS
Symbol
Value
Unit
Drain–Source Voltage
Rating
VDSS
65
Vdc
Drain–Gate Voltage
(RGS = 1.0 MΩ)
VDGR
65
Vdc
VGS
± 40
Adc
Gate–Source Voltage
Drain Current — Continuous
ID
26
Adc
Total Device Dissipation @ TC = 25°C
Derate above 25°C
PD
400
2.27
Watts
W/°C
Storage Temperature Range
Tstg
– 65 to +150
°C
TJ
200
°C
Symbol
Max
Unit
RθJC
0.44
°C/W
Operating Junction Temperature
THERMAL CHARACTERISTICS
Characteristic
Thermal Resistance, Junction to Case
NOTE – CAUTION – MOS devices are susceptible to damage from electrostatic charge. Reasonable precautions in handling and
packaging MOS devices should be observed.
RF DEVICE DATA
MOTOROLA
Motorola, Inc. 1997
MRF275G
1
ELECTRICAL CHARACTERISTICS (TC = 25°C unless otherwise noted)
Characteristic
Symbol
Min
Typ
Max
Unit
V(BR)DSS
65
—
—
Vdc
Zero Gate Voltage Drain Current
(VDS = 28 V, VGS = 0)
IDSS
—
—
1
mA
Gate–Source Leakage Current
(VGS = 20 V, VDS = 0)
IGSS
—
—
1
µA
Gate Threshold Voltage (VDS = 10 V, ID = 100 mA)
VGS(th)
1.5
2.5
4.5
Vdc
Drain–Source On–Voltage (VGS = 10 V, ID = 5 A)
VDS(on)
0.5
0.9
1.5
Vdc
gfs
3
3.75
—
mhos
Input Capacitance (VDS = 28 V, VGS = 0, f = 1 MHz)
Ciss
—
135
—
pF
Output Capacitance (VDS = 28 V, VGS = 0, f = 1 MHz)
Coss
—
140
—
pF
Reverse Transfer Capacitance (VDS = 28 V, VGS = 0, f = 1 MHz)
Crss
—
17
—
pF
Common Source Power Gain
(VDD = 28 V, Pout = 150 W, f = 500 MHz, IDQ = 2 x 100 mA)
Gps
10
11.2
—
dB
Drain Efficiency
(VDD = 28 V, Pout = 150 W, f = 500 MHz, IDQ = 2 x 100 mA)
η
50
55
—
%
Electrical Ruggedness
(VDD = 28 V, Pout = 150 W, f = 500 MHz, IDQ = 2 x 100 mA,
VSWR 30:1 at all Phase Angles)
ψ
OFF CHARACTERISTICS (1)
Drain–Source Breakdown Voltage
(VGS = 0, ID = 50 mA)
ON CHARACTERISTICS (1)
Forward Transconductance (VDS = 10 V, ID = 2.5 A)
DYNAMIC CHARACTERISTICS (1)
FUNCTIONAL CHARACTERISTICS (2) (Figure 1)
No Degradation in Output Power
(1.) Each side of device measured separately.
(2.) Measured in push–pull configuration.
MRF275G
2
MOTOROLA RF DEVICE DATA
B
A
C17
C18
L5
C14
R1
C15
C16
D.U.T.
Z3
C10
Z5
Z7
C11
C2
B1
C5
C6
C7
C8
C9
B2
C3
C12
Z4
Z2
Z6
Z8
C4
C13
L2
L4
C20
C21
A
B1
B2
C1, C2, C3, C4,
C10, C11, C12, C13
C5, C8
C6
C7
C9
C14, C15, C16,
C20, C21, C22
C17, C18
C19
L1, L2
+
L3
C1
Z1
C19
C22
L1
L3, L4
L6
+28 V
+VGG
B
Balun, 50 Ω, 0.086″ O.D. 2″ Long, Semi Rigid Coax
Balun, 50 Ω, Coax 0.141″ O.D. 2″ Long, Semi Rigid
L5
L6
270 pF, ATC Chip Capacitor
1.0 – 20 pF, Trimmer Capacitor, Johanson
22 pF, Mini–Unelco Capacitor
15 pF, Unelco Capacitor
2.1 pF, ATC Chip Capacitor
R1
W1 – W4
0.1 µF, Ceramic Capacitor
680 pF, Feedthru Capacitor
10 µF, 50 V, Electrolytic Capacitor, Tantalum
10 Turns AWG #24,
0.145″ O.D., 106 nH
Taylor–Spring Inductor
10 Turns AWG #18,
0.340″ I.D., Enameled Wire
Z1, Z2
Z3, Z4, Z5, Z6
Z7, Z8
Ferroxcube VK200 20/4B
4 Turns #16, 0.340″ I.D.,
Enameled Wire
1.0 kΩ,1/4 W Resistor
20 x 200 x 250 mils, Wear Pads,
Beryllium–Copper, (See
Component Location Diagram)
1.10″ x 0.245″, Microstrip Line
0.300″ x 0.245″, Microstrip Line
1.00″ x 0.245″, Microstrip Line
Board material
0.060″ Teflon–fiberglass,
εr = 2.55, copper clad both sides, 2 oz. copper.
Points A are connected together on PCB.
Points B are connected together on PCB.
Figure 1. 500 MHz Test Circuit
MOTOROLA RF DEVICE DATA
MRF275G
3
TYPICAL CHARACTERISTICS
160
225 MHz
250
Pout , OUTPUT POWER (WATTS)
Pout , OUTPUT POWER (WATTS)
300
400 MHz 500 MHz
200
150
100
IDQ = 2 x 100 mA
VDD = 28 V
50
10
15
Pin, INPUT POWER (Watts)
5
100
80
60
VDS = 28 V
IDQ = 2 x 100 mA
Pin = Constant
f = 500 MHz
40
0
–10
25
20
120
20
0
0
140
Figure 2. Output Power versus Input Power
8
Pout , OUTPUT POWER (WATTS)
I D , DRAIN CURRENT (AMPS)
2
4
180
VDS = 10 V
VGS(th) = 2.5 V
9
7
6
5
4
3
2
Pin = 14 W
160
140
10 W
120
100
6W
80
60
40
IDQ = 2 x 100 mA
f = 500 MHz
20
1
0
0.5
1
2
1.5
2.5
3.5
3
VGS, GATE–SOURCE VOLTAGE (V)
4
4.5
0
12
5
Figure 4. Drain Current versus Gate Voltage
(Transfer Characteristics)
14
16
22
18
20
VDD, SUPPLY VOLTAGE (V)
24
26
28
Figure 5. Output Power versus Supply Voltage
250
200
180
12 W
Pin = 14 W
Pout , OUTPUT POWER (WATTS)
Pout , OUTPUT POWER (WATTS)
0
–6
–4
–2
VGS, GATE–SOURCE VOLTAGE (V)
Figure 3. Output Power versus Gate Voltage
10
0
–8
160
140
10 W
120
100
6W
80
60
40
IDQ = 2 x 100 mA
f = 400 MHz
20
0
12
14
16
18
20
22
VDD, SUPPLY VOLTAGE (V)
24
26
Figure 6. Output Power versus Supply Voltage
MRF275G
4
28
200
10 W
150
Pin = 4 W
100
IDQ = 2 x 100 mA
f = 225 MHz
50
0
12
14
16
18
20
22
24
VDD, SUPPLY VOLTAGE (V)
26
28
Figure 7. Output Power versus Supply Voltage
MOTOROLA RF DEVICE DATA
TYPICAL CHARACTERISTICS
VGS, GATE–SOURCE VOLTAGE (NORMALIZED)
1000
C, CAPACITANCE (pF)
Coss
100
Ciss
Crss
10
VGS = 0 V
f = 1.0 MHz
1
0
5
20
10
15
VDS, DRAIN–SOURCE VOLTAGE (V)
25
30
1.3
VDD = 28 V
1.2
1.1
ID = 4 A
1
2A
0.9
3A
0.8
0.7
–25
Figure 8. Capacitance versus Drain–Source Voltage*
*Data shown applies only to one half of
device, MRF275G
0
25
0.1 A
75
50
100 125 150
TC, CASE TEMPERATURE (°C)
175
200
Figure 9. Gate–Source Voltage versus
Case Temperature
I D , DRAIN CURRENT (AMPS)
100
TC = 25°C
10
1
1
10
VDS, DRAIN–SOURCE VOLTAGE (V)
100
Figure 10. DC Safe Operating Area
MOTOROLA RF DEVICE DATA
MRF275G
5
VDD = 28 V, IDQ = 2 x 100 mA, Pout = 150 W
f = 500 MHz
Zo = 10 Ω
400
ZOL*
Zin
225
Zin
Ohms
ZOL*
Ohms
225
1.6 – j2.30
3.2 – j1.50
400
1.9 + j0.48
2.3 – j0.19
500
1.9 + j2.60
2.0 + j1.30
ZOL* = Conjugate of the optimum load impedance
ZOL* = into which the device operates at a given
ZOL* = output power, voltage and frequency.
f = 500 MHz
400
f
(MHz)
Note:
Input and output impedance values given are
measured from gate to gate and drain to
drain respectively.
225
Figure 11. Series Equivalent Input/Output Impedance
MRF275G
6
MOTOROLA RF DEVICE DATA
B
A
L5
C14
C15
L6
BIAS
C10
R1
C11
C1
C12
R2
L3
D.U.T.
L1
C8
Z1
B1
C3
C2
C4
Z3
Z2
C7
Z4
B
C16
C1, C2, C8, C9
C3, C5, C7
C4
C6
C10, C12, C13,
C16, C17
C11
C14, C15
C18
Z6
L4
A
B2
B2
C9
R3
B1
Z5
C6
C5
L2
28 V
C18
C13
Balun, 50 Ω, 0.086″ O.D. 2″ Long,
Semi Rigid Coax
Balun, 50 Ω, 0.141″ O.D. 2″ Long,
Semi Rigid Coax
270 pF, ATC Chip Capacitor
1.0 – 20 pF, Trimmer Capacitor
15 pF, ATC Chip Capacitor
33 pF, ATC Chip Capacitor
0.01 µF, Ceramic Capacitor
1.0 µF, 50 V, Tantalum
680 pF, Feedthru Capacitor
20 µF, 50 V, Tantalum
0.180″
C17
L1, L2
L3, L4
L5
L6
R1
R2, R3
Z1, Z2
Z3, Z4
Z5, Z6
#18 Wire, Hairpin Inductor
12 Turns #18, 0.340″ I.D.,
Enameled Wire
Ferroxcube VK200 20/4B
3 Turns #16, 0.340″ I.D.,
Enameled Wire
1.0 kΩ, 1/4 W Resistor
10 kΩ, 1/4 W Resistor
0.400″ x 0.250″, Microstrip Line
0.870″ x 0.250″, Microstrip Line
0.500″ x 0.250″, Microstrip Line
0.200″
Board material
0.060″ Teflon–fiberglass,
εr = 2.55, copper clad both sides, 2 oz. copper.
Figure 12. 400 MHz Test Circuit
MOTOROLA RF DEVICE DATA
MRF275G
7
L2
R1
BIAS 0 – 6 V
C8
C3
C10
C9
C4
R2
+
28 V
–
L1
D.U.T.
T2
T1
C6
C5
C1
C1
C2, C3, C7, C8
C4, C9
C5
C6
C10
L1
L2
C7
C2
8.0 – 60 pF, Arco 404
1000 pF, Chip Capacitor
0.1 µF, Chip Capacitor
180 pF, Chip Capacitor
100 pF and 130 pF,
Chips in Parallel
0.47 µF, Chip Capacitor, 1215 or
Equivalent, Kemet
10 Turns AWG #16, 1/4″ I.D.,
Enamel Wire, Close Wound
Ferrite Beads of Suitable Material
for 1.5 – 2.0 µH Total Inductance
R1
R2
T1
T2
100 Ω, 1/2 W
1.0 k Ω, 1/2 W
4:1 Impedance Ratio, RF Transformer
Can Be Made of 25 Ω, Semi Rigid Coax,
47 – 52 Mils O.D.
1:9 Impedance Ratio, RF Transformer.
Can Be Made of 15 – 18 Ω, Semi Rigid
Coax, 62 – 90 Mils O.D.
NOTE: For stability, the input transformer T1 should be loaded
NOTE: with ferrite toroids or beads to increase the common
NOTE: mode inductance. For operation below 100 MHz. The
NOTE: same is required for the output transformer.
Board material
062″ fiberglass (G10),
εr
5, Two sided, 1 oz. Copper.
^
Unless otherwise noted, all chip capacitors
are ATC Type 100 or Equivalent.
Figure 13. 225 MHz Test Circuit
MRF275G
8
MOTOROLA RF DEVICE DATA
L5
+
B1
C17
R1
C16
C15
C14
L3
C19
C18
C22
L6
BEADS 1–3
C5
W4
C1
C2
W1
L1
W2
C7
W3
C6
C3
C4
C10
C11
C9
C12
C13
C8
L2
L4 BEADS 4–6
C20
MRF275G
B2
C21
JL
Figure 14. MRF275G Component Location (500 MHz)
(Not to Scale)
MRF275G
JL
Figure 15. MRF275G Circuit Board Photo Master (500 MHz) Scale 1:1
(Reduced 25% in printed data book, DL110/D)
MOTOROLA RF DEVICE DATA
MRF275G
9
Figure 16. MRF275G Test Fixture
RF POWER MOSFET CONSIDERATIONS
MOSFET CAPACITANCES
The physical structure of a MOSFET results in capacitors
between the terminals. The metal oxide gate structure determines the capacitors from gate–to–drain (Cgd), and gate–to–
source (Cgs). The PN junction formed during the fabrication
of the MOSFET results in a junction capacitance from drain–
to–source (Cds).
These capacitances are characterized as input (Ciss), output (Coss) and reverse transfer (Crss) capacitances on data
sheets. The relationships between the inter–terminal capacitances and those given on data sheets are shown below. The
Ciss can be specified in two ways:
1. Drain shorted to source and positive voltage at the gate.
2. Positive voltage of the drain in respect to source and zero
volts at the gate. In the latter case the numbers are lower.
However, neither method represents the actual operating conditions in RF applications.
DRAIN
Cgd
GATE
Cds
Cgs
Ciss = Cgd + Cgs
Coss = Cgd + Cds
Crss = Cgd
SOURCE
The Ciss given in the electrical characteristics table was
measured using method 2 above. It should be noted that
Ciss, Coss, Crss are measured at zero drain current and are
MRF275G
10
provided for general information about the device. They are
not RF design parameters and no attempt should be made to
use them as such.
LINEARITY AND GAIN CHARACTERISTICS
In addition to the typical IMD and power gain, data presented in Figure 3 may give the designer additional information on the capabilities of this device. The graph represents
the small signal unity current gain frequency at a given drain
current level. This is equivalent to fT for bipolar transistors.
Since this test is performed at a fast sweep speed, heating of
the device does not occur. Thus, in normal use, the higher
temperatures may degrade these characteristics to some extent.
DRAIN CHARACTERISTICS
One figure of merit for a FET is its static resistance in the
full–on condition. This on–resistance, VDS(on), occurs in the
linear region of the output characteristic and is specified under specific test conditions for gate–source voltage and drain
current. For MOSFETs, VDS(on) has a positive temperature
coefficient and constitutes an important design consideration
at high temperatures, because it contributes to the power
dissipation within the device.
GATE CHARACTERISTICS
The gate of the MOSFET is a polysilicon material, and is
electrically isolated from the source by a layer of oxide. The
input resistance is very high — on the order of 109 ohms —
resulting in a leakage current of a few nanoamperes.
MOTOROLA RF DEVICE DATA
Gate control is achieved by applying a positive voltage
slightly in excess of the gate–to–source threshold voltage,
VGS(th).
Gate Voltage Rating — Never exceed the gate voltage
rating (or any of the maximum ratings on the front page). Exceeding the rated VGS can result in permanent damage to
the oxide layer in the gate region.
Gate Termination — The gates of this device are essentially capacitors. Circuits that leave the gate open–circuited
or floating should be avoided. These conditions can result in
turn–on of the devices due to voltage build–up on the input
capacitor due to leakage currents or pickup.
Gate Protection — These devices do not have an internal
monolithic zener diode from gate–to–source. If gate protection is required, an external zener diode is recommended.
Using a resistor to keep the gate–to–source impedance
low also helps damp transients and serves another important
function. Voltage transients on the drain can be coupled to
the gate through the parasitic gate–drain capacitance. If the
gate–to–source impedance and the rate of voltage change
on the drain are both high, then the signal coupled to the gate
may be large enough to exceed the gate–threshold voltage
and turn the device on.
HANDLING CONSIDERATIONS
When shipping, the devices should be transported only in
antistatic bags or conductive foam. Upon removal from the
packaging, careful handling procedures should be adhered
to. Those handling the devices should wear grounding straps
and devices not in the antistatic packaging should be kept in
metal tote bins. MOSFETs should be handled by the case
and not by the leads, and when testing the device, all leads
should make good electrical contact before voltage is applied. As a final note, when placing the FET into the system it
is designed for, soldering should be done with grounded
equipment.
MOTOROLA RF DEVICE DATA
DESIGN CONSIDERATIONS
The MRF275G is a RF power N–channel enhancement
mode field–effect transistor (FETs) designed for HF, VHF and
UHF power amplifier applications. Motorola RF MOSFETs
feature a vertical structure with a planar design.
Motorola Application Note AN211A, FETs in Theory and
Practice, is suggested reading for those not familiar with the
construction and characteristics of FETs.
The major advantages of RF power FETs include high
gain, low noise, simple bias systems, relative immunity from
thermal runaway, and the ability to withstand severely mismatched loads without suffering damage. Power output can
be varied over a wide range with a low power dc control signal.
DC BIAS
The MRF275G is an enhancement mode FET and, therefore, does not conduct when drain voltage is applied. Drain
current flows when a positive voltage is applied to the gate.
RF power FETs require forward bias for optimum performance. The value of quiescent drain current (IDQ) is not critical for many applications. The MRF275G was characterized
at IDQ = 100 mA, each side, which is the suggested minimum
value of IDQ. For special applications such as linear amplification, IDQ may have to be selected to optimize the critical
parameters.
The gate is a dc open circuit and draws no current. Therefore, the gate bias circuit may be just a simple resistive divider network. Some applications may require a more elaborate
bias system.
GAIN CONTROL
Power output of the MRF275G may be controlled from its
rated value down to zero (negative gain) by varying the dc
gate voltage. This feature facilitates the design of manual
gain control, AGC/ALC and modulation systems.
MRF275G
11
PACKAGE DIMENSIONS
U
G
1
Q
RADIUS 2 PL
0.25 (0.010)
M
T A
M
DIM
A
B
C
D
E
G
H
J
K
N
Q
R
U
–B–
5
3
4
D
E
B
2
R
K
M
NOTES:
1. DIMENSIONING AND TOLERANCING PER ANSI
Y14.5M, 1982.
2. CONTROLLING DIMENSION: INCH.
J
N
H
–T–
–A–
SEATING
PLANE
C
INCHES
MIN
MAX
1.330
1.350
0.370
0.410
0.190
0.230
0.215
0.235
0.050
0.070
0.430
0.440
0.102
0.112
0.004
0.006
0.185
0.215
0.845
0.875
0.060
0.070
0.390
0.410
1.100 BSC
STYLE 2:
PIN 1.
2.
3.
4.
5.
MILLIMETERS
MIN
MAX
33.79
34.29
9.40
10.41
4.83
5.84
5.47
5.96
1.27
1.77
10.92
11.18
2.59
2.84
0.11
0.15
4.83
5.33
21.46
22.23
1.52
1.78
9.91
10.41
27.94 BSC
DRAIN
DRAIN
GATE
GATE
SOURCE
CASE 375–04
ISSUE D
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the suitability of its products for any particular purpose, nor does Motorola assume any liability arising out of the application or use of any product or circuit, and
specifically disclaims any and all liability, including without limitation consequential or incidental damages. “Typical” parameters which may be provided in Motorola
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MRF275G
12
◊
MRF275G/D
MOTOROLA RF DEVICE
DATA