ETC HM62W16255HCSERIES

HM62W16255HC Series
4M High Speed SRAM (256-kword × 16-bit)
ADE-203-1200D (Z)
Rev. 3.0
Dec. 5, 2002
Description
The HM62W16255HC is a 4-Mbit high speed static RAM organized 256-kword × 16-bit. It has realized high
speed access time by employing CMOS process (6-transistor memory cell) and high speed circuit designing
technology. It is most appropriate for the application which requires high speed, high density memory and
wide bit width configuration, such as cache and buffer memory in system. The HM62W16255HC is
packaged in 400-mil 44-pin SOJ and 400-mil 44-pin plastic TSOPII for high density surface mounting.
Features
• Single 3.3 V supply: 3.3 V ± 0.3 V
• Access time: 10/12 ns (max)
• Completely static memory
 No clock or timing strobe required
• Equal access and cycle times
• Directly TTL compatible
 All inputs and outputs
• Operating current: 145/130 mA (max)
• TTL standby current: 40 mA (max)
• CMOS standby current : 5 mA (max)
: 1 mA (max) (L-version)
• Data retention current: 0.6 mA (max) (L-version)
• Data retention voltage: 2.0 V (min) (L-version)
• Center VCC and VSS type pin out
HM62W16255HC Series
Ordering Information
Type No.
Access time Device marking
Package
HM62W16255HCJP-10
HM62W16255HCJP-12
10 ns
12 ns
400-mil 44-pin plastic SOJ (CP-44D)
HM62W16255CJP10
HM62W16255CJP12
HM62W16255HCLJP-10 10 ns
HM62W16255HCLJP-12 12 ns
HM62W16255CLJP10
HM62W16255CLJP12
HM62W16255HCTT-10
HM62W16255HCTT-12
HM62W16255CTT10
HM62W16255CTT12
10 ns
12 ns
HM62W16255HCLTT-10 10 ns
HM62W16255HCLTT-12 12 ns
Rev.3, Dec. 2002, page 2 of 18
HM62W16255CLTT10
HM62W16255CLTT12
400-mil 44-pin plastic TSOPII (TTP-44DE)
HM62W16255HC Series
Pin Arrangement
44-pin SOJ
A0
A1
A2
A3
A4
I/O1
I/O2
I/O3
I/O4
VCC
VSS
I/O5
I/O6
I/O7
I/O8
A5
A6
A7
A8
A9
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
(Top View)
44-pin TSOP
A17
A16
A15
I/O16
I/O15
I/O14
I/O13
VSS
VCC
I/O12
I/O11
I/O10
I/O9
NC
A14
A13
A12
A11
A10
A0
A1
A2
A3
A4
I/O1
I/O2
I/O3
I/O4
VCC
VSS
I/O5
I/O6
I/O7
I/O8
A5
A6
A7
A8
A9
44
43
42
41
40
39
38
37
36
35
34
33
32
31
30
29
28
27
26
25
24
23
1
2
3
4
5
6
7
8
9
10
11
12
13
14
15
16
17
18
19
20
21
22
A17
A16
A15
I/O16
I/O15
I/O14
I/O13
VSS
VCC
I/O12
I/O11
I/O10
I/O9
NC
A14
A13
A12
A11
A10
(Top View)
Pin Description
Pin name
Function
A0 to A17
Address input
I/O1 to I/O16
Data input/output
CS
Chip select
OE
Output enable
WE
Write enable
UB
Upper byte select
LB
Lower byte select
VCC
Power supply
VSS
Ground
NC
No connection
Rev.3, Dec. 2002, page 3 of 18
HM62W16255HC Series
Block Diagram
(LSB)
A14
A13
A12
A5
A6
A7
A11
A10
A3
(MSB) A1
VCC
Row
decoder
Memory matrix
1024 rows × 32 columns ×
8 blocks × 16 bit
(4,194,304 bits)
VSS
CS
I/O1
..
.
I/O8
Column I/O
Input
data
control
I/O9
..
.
I/O16
Column decoder
CS
(LSB) A8 A9 A17 A15 A16 A0 A2 A4 (MSB)
CS
Rev.3, Dec. 2002, page 4 of 18
HM62W16255HC Series
Operation Table
CS
OE
WE
LB
UB
Mode
VCC current
I/O1−
−I/O8
I/O9−
−I/O16
Ref. cycle
H
×
×
×
×
Standby
ISB, ISB1
High-Z
High-Z

L
H
H
×
×
Output disable
ICC
High-Z
High-Z

L
L
H
L
L
Read
ICC
Output
Output
Read cycle
L
L
H
L
H
Lower byte read ICC
Output
High-Z
Read cycle
L
L
H
H
L
Upper byte read ICC
High-Z
Output
Read cycle
L
L
H
H
H

ICC
High-Z
High-Z

L
×
L
L
L
Write
ICC
Input
Input
Write cycle
L
×
L
L
H
Lower byte write ICC
Input
High-Z
Write cycle
L
×
L
H
L
Upper byte write ICC
High-Z
Input
Write cycle
L
×
L
H
H

High-Z
High-Z

ICC
Note: H: VIH, L: VIL, ×: VIH or VIL
Absolute Maximum Ratings
Parameter
Symbol
Value
Supply voltage relative to VSS
VCC
−0.5 to +4.6
Voltage on any pin relative to VSS
VT
−0.5* to VCC + 0.5*
V
Power dissipation
PT
1.0
W
Operating temperature
Topr
0 to +70
°C
Storage temperature
Tstg
−55 to +125
°C
Storage temperature under bias
Tbias
−10 to +85
°C
1
Unit
V
2
Notes: 1. VT (min) = −2.0 V for pulse width (under shoot) ≤ 6 ns.
2. VT (max) = VCC + 2.0 V for pulse width (over shoot) ≤ 6 ns.
Rev.3, Dec. 2002, page 5 of 18
HM62W16255HC Series
Recommended DC Operating Conditions
(Ta = 0 to +70°C)
Parameter
Symbol
Supply voltage
Min
Typ
Max
Unit
3
3.0
3.3
3.6
V
4
0
0
0
VIH
2.0

VCC + 0.5*
V
VIL
−0.5*

0.8
V
VCC*
VSS*
Input voltage
Notes: 1.
2.
3.
4.
1
V
2
VIL (min) = −2.0 V for pulse width (under shoot) ≤ 6 ns.
VIH (max) = VCC + 2.0 V for pulse width (over shoot) ≤ 6 ns.
The supply voltage with all VCC pins must be on the same level.
The supply voltage with all VSS pins must be on the same level.
DC Characteristics
(Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, VSS = 0 V)
Parameter
Symbol Min
Input leakage current
|ILI|

Output leakage current
|ILO|
Operation power
supply current
1
Max
Unit
Test conditions

2
µA
VIN = VSS to VCC


2
µA
VIN = VSS to VCC
10 ns cycle ICC


145
mA
Min cycle
CS = VIL, IOUT = 0 mA
Other inputs = VIH/VIL
12 ns cycle ICC
Standby power supply current


130
mA
ISB


40
mA
Min cycle, CS = VIH,
Other inputs = VIH/VIL
ISB1

2.5
5
mA
f = 0 MHz
VCC ≥ CS ≥ VCC − 0.2 V,
(1) 0 V ≤ VIN ≤ 0.2 V or
(2) VCC ≥ VIN ≥ VCC − 0.2 V
*
0.5*
1.0*
mA
VOL


0.4
V
IOL = 8 mA
VOH
2.4


V
IOH = −4 mA
2
Output voltage
Typ*
2
2
Notes: 1. Typical values are at VCC = 3.3 V, Ta = +25°C and not guaranteed.
2. This characteristics is guaranteed only for L-version.
Rev.3, Dec. 2002, page 6 of 18
HM62W16255HC Series
Capacitance
(Ta = +25°C, f = 1.0 MHz)
Parameter
Input capacitance*
1
1
Input/output capacitance*
Note:
Symbol
Min
Typ
Max
Unit
Test conditions
CIN


6
pF
VIN = 0 V
CI/O


8
pF
VI/O = 0 V
1. This parameter is sampled and not 100% tested.
Rev.3, Dec. 2002, page 7 of 18
HM62W16255HC Series
AC Characteristics
(Ta = 0 to +70°C, VCC = 3.3 V ± 0.3 V, unless otherwise noted.)
Test Conditions
• Input pulse levels: 3.0 V/0.0 V
• Input rise and fall time: 3 ns
• Input and output timing reference levels: 1.5 V
• Output load: See figures (Including scope and jig)
3.3 V
1.5 V
RL = 50 Ω
DOUT Zo = 50 Ω
319 Ω
DOUT
353 Ω
30 pF
5 pF
Output load (B)
(for tCLZ, tOLZ, tBLZ, tCHZ, tOHZ,
tBHZ, tWHZ, and tOW)
Output load (A)
Read Cycle
HM62W16255HC
-10
-12
Parameter
Symbol
Min
Max
Min
Max
Unit
Read cycle time
tRC
10

12

ns
Address access time
tAA

10

12
ns
Chip select access time
tACS

10

12
ns
Output enable to output valid
tOE

5

6
ns
Byte select to output valid
tBA

5

6
ns
Notes
Output hold from address change
tOH
3

3

ns
Chip select to output in low-Z
tCLZ
3

3

ns
1
Output enable to output in low-Z
tOLZ
0

0

ns
1
Byte select to output in low-Z
tBLZ
0

0

ns
1
Chip deselect to output in high-Z
tCHZ

5

6
ns
1
Output disable to output in high-Z
tOHZ

5

6
ns
1
Byte deselect to output in high-Z
tBHZ

5

6
ns
1
Rev.3, Dec. 2002, page 8 of 18
HM62W16255HC Series
Write Cycle
HM62W16255HC
-10
-12
Parameter
Symbol
Min
Max
Min
Max
Unit
Notes
Write cycle time
tWC
10

12

ns
Address valid to end of write
tAW
7

8

ns
Chip select to end of write
tCW
7

8

ns
8
Write pulse width
tWP
7

8

ns
7
Byte select to end of write
tBW
7

8

ns
Address setup time
tAS
0

0

ns
5
Write recovery time
tWR
0

0

ns
6
Data to write time overlap
tDW
5

6

ns
Data hold from write time
tDH
0

0

ns
Write disable to output in low-Z
tOW
3

3

ns
1
Output disable to output in high-Z
tOHZ

5

6
ns
1
Write enable to output in high-Z
tWHZ

5

6
ns
1
Notes: 1. Transition is measured ±200 mV from steady voltage with output load (B). This parameter is
sampled and not 100% tested.
2. If the CS or LB or UB low transition occurs simultaneously with the WE low transition or after the
WE transition, output remains a high impedance state.
3. WE and/or CS must be high during address transition time.
4. If CS, OE, LB and UB are low during this period, I/O pins are in the output state. Then the data
input signals of opposite phase to the outputs must not be applied to them.
5. tAS is measured from the latest address transition to the latest of CS, WE, LB or UB going low.
6. tWR is measured from the earliest of CS, WE, LB or UB going high to the first address transition.
7. A write occurs during the overlap of a low CS, a low WE and a low LB or a low UB (tWP). A write
begins at the latest transition among CS going low, WE going low and LB going low or UB going
low. A write ends at the earliest transition among CS going high, WE going high and LB going
high or UB going high.
8. tCW is measured from the later of CS going low to the end of write.
Rev.3, Dec. 2002, page 9 of 18
HM62W16255HC Series
Timing Waveforms
Read Timing Waveform (1) (WE = VIH)
t RC
Address
Valid address
tAA
tACS
CS
tOE
tCHZ *1
tBA
tOHZ *1
tBLZ *1
tBHZ *1
OE
LB, UB
tOLZ *1
tOH
tCLZ *1
DOUT
High impedance *4
Rev.3, Dec. 2002, page 10 of 18
Valid data
*4
HM62W16255HC Series
Read Timing Waveform (2) (WE = VIH, LB = VIL, UB = VIL)
tRC
Address
Valid address
tOH
tAA
tACS
CS
tOE
tCHZ*1
tOHZ*1
OE
tOLZ*1
tCLZ *1
DOUT
High impedance *4
Valid data
*4
Rev.3, Dec. 2002, page 11 of 18
HM62W16255HC Series
Write Timing Waveform (1) (WE Controlled)
tWC
Valid address
Address
tWR
tAW
tAS
tWP
WE*3
tCW
CS*3
OE
tBW
LB, UB
tOLZ
tWHZ
tOW
tOHZ
High impedance
DOUT
*2
DIN
Rev.3, Dec. 2002, page 12 of 18
tDW
tDH
Valid data
HM62W16255HC Series
Write Timing Waveform (2) (CS Controlled)
tWC
Valid address
Address
tWR
tAW
tAS
tWP
WE *3
tCW
CS *3
OE
tBW
LB, UB
tOLZ
tWHZ
tOW
tOHZ
High impedance *
4
DOUT
*2
DIN
tDW
tDH
Valid data
Rev.3, Dec. 2002, page 13 of 18
HM62W16255HC Series
Write Timing Waveform (3) (LB, UB Controlled, OE = VIH)
tWC
Address
Valid address
tAW
tWR
tWP
WE*3
tCW
CS*3
tAS
tBW
UB (LB)
tBW
LB (UB)
tDW
DIN-UB
(DIN-LB)
tDH
Valid data
tDW
DIN-LB
(DIN-UB)
DOUT
Rev.3, Dec. 2002, page 14 of 18
tDH
Valid data
High impedance
HM62W16255HC Series
Low VCC Data Retention Characteristics
(Ta = 0 to +70°C)
This characteristics is guaranteed only for L-version.
Parameter
Symbol
Min
Typ
Max
Unit
Test conditions
VCC for data retention
VDR
2.0


V
VCC ≥ CS ≥ VCC − 0.2 V,
(1) 0 V ≤ VIN ≤ 0.2 V or
(2) VCC ≥ VIN ≥ VCC − 0.2 V
Data retention current
ICCDR


600
µA
VCC = 3 V
VCC ≥ CS ≥ VCC − 0.2 V,
(1) 0 V ≤ VIN ≤ 0.2 V or
(2) VCC ≥ VIN ≥ VCC − 0.2 V
Chip deselect to data retention time
tCDR
0


ns
See retention waveform
Operation recovery time
tR
5


ms
Low VCC Data Retention Timing Waveform
t CDR
Data retention mode
tR
V CC
3.0 V
V DR
2.0 V
0V
VCC ≥
≥ VCC – 0.2 V
Rev.3, Dec. 2002, page 15 of 18
HM62W16255HC Series
Package Dimensions
HM62W16255HCJP/HCLJP Series (CP-44D)
As of July, 2002
Unit: mm
28.33
28.90 Max
1.27
*0.43 ± 0.10
0.41 ± 0.08
0.10
*Dimension including the plating thickness
Base material dimension
Rev.3, Dec. 2002, page 16 of 18
2.65 ± 0.12
1.30 Max
0.80 +0.25
–0.17
22
0.74
3.50 ± 0.26
1
11.18 ± 0.13
23
10.16 ± 0.13
44
9.40 ± 0.25
Hitachi Code
JEDEC
JEITA
Mass (reference value)
CP-44D
Conforms
—
1.8 g
HM62W16255HC Series
HM62W16255HCTT/HCLTT Series (TTP-44DE)
As of July, 2002
Unit: mm
18.41
18.81 Max
23
10.16
44
0.80
*0.27 ± 0.07
0.25 ± 0.05
22
0.80
0.13 M
11.76 ± 0.20
1.005 Max
*Dimension including the plating thickness
Base material dimension
0.13 ± 0.05
0.10
*0.145 ± 0.05
0.125 ± 0.04
1.20 Max
0˚ – 5˚
0.50 ± 0.10
Hitachi Code
JEDEC
JEITA
Mass (reference value)
0.68
1
TTP-44DE
—
—
0.43 g
Rev.3, Dec. 2002, page 17 of 18
HM62W16255HC Series
Disclaimer
1. Hitachi neither warrants nor grants licenses of any rights of Hitachi’s or any third party’s patent,
copyright, trademark, or other intellectual property rights for information contained in this document.
Hitachi bears no responsibility for problems that may arise with third party’s rights, including intellectual
property rights, in connection with use of the information contained in this document.
2. Products and product specifications may be subject to change without notice. Confirm that you have
received the latest product standards or specifications before final design, purchase or use.
3. Hitachi makes every attempt to ensure that its products are of high quality and reliability. However,
contact Hitachi’s sales office before using the product in an application that demands especially high
quality and reliability or where its failure or malfunction may directly threaten human life or cause risk of
bodily injury, such as aerospace, aeronautics, nuclear power, combustion control, transportation, traffic,
safety equipment or medical equipment for life support.
4. Design your application so that the product is used within the ranges guaranteed by Hitachi particularly
for maximum rating, operating supply voltage range, heat radiation characteristics, installation conditions
and other characteristics. Hitachi bears no responsibility for failure or damage when used beyond the
guaranteed ranges. Even within the guaranteed ranges, consider normally foreseeable failure rates or
failure modes in semiconductor devices and employ systemic measures such as fail-safes, so that the
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products.
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Copyright © Hitachi, Ltd., 2002. All rights reserved. Printed in Japan.
Colophon 7.0
Rev.3, Dec. 2002, page 18 of 18