AGILENT N4374B

Agilent
N4374B
4.5 GHz Single-Mode
Lightwave Component Analyzer
for CATV and Radio over Fiber
Data Sheet
General Information
Key benefits
Agilent’s N4374B Lightwave Component Analyzer (LCA) is
optimized for the electro-optical S-parameter measurement
for Cable TV (CATV) and Radio over Fiber (RoF) or radio frequency over Glass (RFoG) applications.
‡
In modern CATV or RoF/RFoG transmission systems analog signals are directly transmitted over optical fiber. This
requires very low distortion of the electro-optical devices at
the transmitter and the receiver side. Therefore it is necessary to have very flat transfer characteristic in amplitude and
delay. The N4374B LCA is the tool of choice to optimize your
design for these parameters.
‡
‡
‡
‡
‡
For frequency dependent responsivity measurements
the N4374B is the successor of the industry standard
8702 LCA series. It supports 75 Ohm test with a minimum
loss pad (MLP).
‡
‡
High absolute and relative accuracy measurements
improve the yield of development and production processes. With the excellent accuracy and reproducibility, measurement results can be compared among test
locations world wide.
High confidence and fast time-to-market with a NISTtraceable turnkey solution.
Significantly increased productivity using the fast and
easy measurement setup with a unique new calibration process leads to lower cost of test.
75 Ohm support
Specified phase uncertainty
More than 5 times faster than predecessor 8702 series
speeds up every test procedure
Identical LCA software and remote control across the
N437xB family simplifies integration
Bias-T included in Network Analyzer
Relative frequency response uncertainty:
± 0.6 dB @ 4.5GHz (typ)
With a completely new design of the optical test set together
with the newest ENA based network analyzer, the N4374B
guarantees excellent electro-optical measurement performance. It’s the excellent accuracy that improves the yield from
tests performed with the N4374B, by narrowing margins needed to pass the tested devices. NIST traceability ensures worldwide comparability of test results.
Absolute frequency response uncertainty:
± 1.3 dB @ 4.5GHz (typ)
Noise floor:
-103 dB W/A for E/O measurements @ 4.5 GHz
-90 dB A/W for O/E measurements @ 4.5 GHz
The fully integrated “turnkey” solution reduces time to market, compared to the time-consuming development of a selfmade setup.
Typical phase uncertanty:
±1.5° max
In addition a unique new calibration concept significantly
reduces time from powering up the LCA until the first calibrated measurement can be made. This increases productivity in R&D and on the manufacturing floor.
Transmitter wavelength:
1550nm ± 20 nm
1310nm ± 20 nm
1290 - 1610 nm with external source input
By optimizing the electrical and optical design of the N4374B
for lowest noise and ripple, the accuracy has been improved
by more than a factor of 5 compared to the 8702 series LCA
and is now independent of the electrical reflection coefficient of the device under test.
Built-in optical power meter
For fast transmitter power verification
Powerful remote control:
State of the art programming interface based on Microsoft
.NET or COM.
The advanced optical design together with temperaturestabilized transmitter and receiver ensures repeatable measurements over days without recalibration.
Using the advanced measurement capabilities of the network analyzer, all S-parameter related characteristics of the
device under test, like responsivity, ripple, group delay and
3dB-cutoff frequency, can be qualified with the new N4374B
Lightwave Component Analyzer from 100kHz to 4.5 GHz.
Warranty:
1 year warranty is standard for N4374B Lightwave Component Analyzer.
Extension to 3 or 5 years available.
The network analyzer
The N4374B is based on the newest E5071C ENA network
analyzer series. The network analyzer includes a Bias-T for
biasing the electro-optical components.
2
Agilent N4374B Applications
Agilent N4374B Features
In photonic CATV or RoF transmission systems, it is necessary to design and qualify subcomponents like direct modulated lasers and receivers, which are analog by nature, with
different parameters. Those parameters are core to the overall system performance.
These electro-optical components significantly influence the
overall performance of the transmission system via the following parameters:
‡ 3dB bandwidth of the electro-optical transmission
‡ Relative frequency response, quantifying the electrooptical shape of the conversion.
‡ Absolute frequency response, relating to the conversion efficiency of signals from the input to the output,
or indicating the gain of a receiver.
‡ Electrical reflection at the RF port
‡ Group delay of the electro-optical transfer function
Turnkey solution
In today’s highly competitive environment, short time-tomarket with high quality is essential for new products. Instead of developing a home-grown measurement solution
which takes a lot of time and is limited in transferability and
support, a fully specified and supported solution helps to focus resources on faster development and on optimizing the
manufacturing process.
In the N4374B all optical and electrical components are
carefully selected and matched to each other to minimize
noise and ripple in the measurement traces. Together with
the temperature stabilized environment of the core components, this improves the repeatability and the accuracy
of the overall system. Extended factory calibration data at
various optical power levels ensures accurate and reliable
measurements that can only be achieved with an integrated
solution like the N4374B.
Only a careful design of these electro-optical components
over a wide modulation signal bandwidth guarantees successful operation in the transmission system.
Easy calibration
An LCA essentially measures the conversion relation between optical and electrical signals. This is why user calibration of such systems can evolve into a time consuming
task. With the new calibration process implemented in the
N4374B, the tasks that have to be done by the user are reduced to one pure electrical calibration. The calibration with
an electrical calibration module is automated and needs
only minimal manual interaction. With the minimum loss
pad (MLP) which is part of the LCA shipment the impedance
match from 50 Ohm LCA system to 75 Ohm test device can
be realized in an easy way. The correction for the 75 Ohm
impedance is enabled with one button in the LCA software
which uses default data to correct the MLP transfer behavior. For higher accuracy an individual calibration of the MLP
can be realized with the adaptor removal tool which is part
of each ENA-C
Electro-optical components
The frequency response of amplified or unamplified detector
diodes, modulators and directly modulated lasers typically
depends on various parameters, like bias voltages, optical
input power, operating current and ambient temperature. To
determine the optimum operating point of these devices, an
LCA helps by making a fast characterization of the electrooptic transfer function while optimizing these operating
conditions. In parallel the LCA also measures the electrical
return loss.
In manufacturing it is important to be able to monitor the
processes regularly to keep up the throughput and yield. In
this case the LCA is the tool of choice to monitor transmission characteristics and absolute responsivity of the manufactured device. The remote control of the N4374B offers another tool to improve the productivity by making automated
measurements and analysis of the measured data.
Built-in performance verification
Sometimes it is necessary to make a quick verification of the
validity of the calibration and the performance of the system.
The N4374B’s unique calibration process allows the user to
perform a self-test without external reference devices. This
gives full confidence that the system performance is within
the user’s required uncertainty bands.
Electrical components
Electrical components such as amplifiers, filters and transmission lines are used in modern transmission systems and
require characterization to ensure optimal performance.
Typical measurements are bandwidth, insertion loss or gain,
impedance match and group delay. The new switched architecture offers direct access to the electrical outputs and inputs of the network-analyzers just by selecting electrical- to
electrical measurement mode in the LCA user interface.
3
State-of-the-art remote control
Testing the frequency response of electro-optical components under a wide range of parameters, which is often
necessary in qualification cycles, is very time consuming.
To support the user in minimizing the effort for performing this huge number of tests, all functions of the LCA can
be controlled remotely via LAN over the state-of-the-art
Microsoft .NET or COM interface. This interface is identical
for all LCA of the N437xB/C series.
Based on programming examples for VBA with Excel, Agilent VEE and C++, it is very easy for every user to build applications for their requirements.
These examples cover applications like integration of complete LCA measurement sequences.
Integrated optical power meter
In applications where optical power dependence characterization is needed, the average power meter can be used to
set the exact average output power of the LCA transmitter
by connecting the LCA optical transmitter output, optionally
through an optical attenuator, to the LCA optical receiver input. By adjusting the transmitter output power in the LCA
user interface or the optical attenuation, the desired transmitter optical power can be set.
In cases where an unexpectedly low responsivity is measured from the device under test, it is very helpful to get a
fast indication of the CW optical power that is launched into
the LCA receiver. The cause might be a bad connection or a
bent fiber in the setup. For this reason too, a measurement
of the average optical power at the LCA receiver is very helpful for fast debugging of the test setup.
Selectable output power of the transmitter
Most PIN diodes and receiver optical subassemblies need to
be characterized at various average optical power levels. In
this case it is necessary to set the average input power of
the device under test to the desired value. The variable average optical output power of the LCA transmitter offers this
feature. Together with an external optical attenuator, this
range can be extended to all desired optical power levels.
Group delay and length measurements
In some applications it is necessary to determine the electrical or optical length of a device. With the internal length
calibration of the electro-optical paths with reference to the
electrical and optical inputs or outputs, it is possible to determine the length of the device under test
External optical source input
For applications where test of opto-electric devices need to
be done at a specific optical wavelength, the N4374B-050
offers an external optical input to the internal modulator
where an external tunable laser can be applied. As modulators are polarization sensitive devices, this input is a PMF
input to a PMF optical switch to maintain the polarization
at the internal modulator.
4
Definitions
Explanation of terms
Generally, all specifications are valid at the stated operating and measurement conditions and settings, with uninterrupted line voltage.
Responsivity
For electro-optical devices (e.g. modulators ) this describes
the ratio of the optical modulated output signal amplitude
compared to the RF input amplitude of the device.
For opto-electrical devices (e.g. photodiodes) this describes
the ratio of at the RF amplitude at the device output to the
amplitude of the modulated optical signal input. .
Specifications (guaranteed)
Describes warranted product performance that is valid under
the specified conditions.
Specifications include guard bands to account for the expected statistical performance distribution, measurement
uncertainties changes in performance due to environmental
changes and aging of components.
Relative frequency response uncertainty
Describes the maximum deviation of the shape of a measured trace from the (unknown) real trace. This specification
has strong influence on the accuracy of the 3-dB cut-off frequency determined for the device under test.
Typical values (characteristics)
Characteristics describe the product performance that is
usually met but not guaranteed. Typical values are based on
data from a representative set of instruments.
Absolute frequency response uncertainty
Describes the maximum difference between any amplitude
point of the measured trace and the (unknown) real value.
This specification is useful to determine the absolute responsivity of the device versus modulation frequency.
General characteristics
Give additional information for using the instrument. These
are general descriptive terms that do not imply a level of
performance.
Frequency response repeatability
Describes the deviation of repeated measurement without
changing any parameter or connection relative to the average of this measurements.
Minimum measurable frequency response
Describes the average measured responsivity when no modulation signal is present at the device under test. This represents the noise floor of the measurement system.
Definition of LCA input and output names
LCA electrical port A
LCA optical output
LCA electrical port B
LCA optical input
5
Agilent N4374B Specifications
Measurement capabilities
3dB cut-off frequency (S21),
Responsivity (S21),
Electrical reflection (S11 or S22),
Group Delay vs. frequency,
Insertion Loss (IL),
Transmission bandwidth,
all electrical S-parameter measurements.
Measurement conditions
‡ Modulation frequency range from 10 MHz to 4.5 GHz
‡ Foreward and reverse RF power +5 dBm
‡ Number of points 899
‡ Number of averages: 1
‡ IFBW 300 Hz
‡ Network analyzer set to “stepped sweep – sweep
moves in discrete steps”
‡ After full two-port electrical calibration using an
Electronic Calibration Module, Agilent 85092C,
at constant temperature (±1° C)
‡ Modulator bias optimization set to “every sweep”
‡ Measurement frequency grid equals electrical
calibration grid
‡ DUT signal delay ≤ 0.1/IF-BW
‡ Specified temperature range: +20° C to +26° C.
‡ After warm-up time of 90 minutes
‡ Using high quality electrical and optical connectors
and RF cables in perfect condition
‡ Using supplied RF cables (8120-8862)
Target test devices
Transmitter (E/O)
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Receiver (O/E)
‡ PIN diodes
‡ Avalanche photodiodes (APD)
‡ Receiver optical subassemblies (ROSA)
Optical (O/O)
‡ Passive optical components
‡ Optical fibers and filters
‡ Optical transmission systems
6
Transmitter and Receiver Specifications
Optical Test set
Option -332, -362
Operation frequency range
100 kHz to 4.5 GHz
Connector type
optical input
SMF angled with Agilent versatile connector interface
optical output
optical source input
(rear)
PMF angled, with Agilent versatile connector interface,
polarization orientation aligned with connector key
RF
N type, female
LCA optical input
Operating input wavelength range
1250 nm to 1640 nm [f4]
Maximum linear average input power [f1]
Optical input 1:
Optical input 2:
+4 dBm
+14 dBm
Maximum safe average input power
Optical input 1:
Optical input 2:
+7 dBm
+17 dBm
Optical return loss (typ.) [f1]
> 27 dBo
[f1]
Average power measurement range
Optical input 1:
Optical input 2:
Average power measurement
uncertainty (typ.) [f1]
±0.5 dBo
-25 dBm to +4 dBm on optical input 1
-15 dBm to +14 dBm on optical input 2
LCA optical output (internal source)
Optical modulation index (OMI)
at 1 GHz (typ.)
Output wavelength
> 30 % @ +5 dBm RF power
option -100, -102 (1310 ± 20) nm
option -101, -102 (1550 ± 20) nm
Average output power range
-2 dBm to +4 dBm
[f2]
Average output power uncertainty (typ.)
±0.5 dBo
Average output power stability,
15 minutes (typ.)
±0.5 dBo
External optical source input (-050)
Optical input power range for typical
performance
+8 dBm to +15dBm
Optical input damage level
+20 dBm
Typical loss at quadrature bias point
9 dB
Operating input wavelength range
1290 nm to 1640 nm [f4]
LCA RF test port input
Maximum safe input level at port A or B
+15 dBm RF, 7V DC
[f1] Wavelength within range as specified for LCA optical output
[f2] After modulator optimization
[f3] Required source characteristics: SMSR : >35 dB, line width <10 MHz, power stability < 0.1 dB, PER > 20dB, unmodulated, single mode
[f4] Excluding water absorption wavelength
7
Specifications for electro-optical measurements at 1310 nm
N4374B system with network analyzer
(E/O mode)
E5071C -245
Specifications are valid under the stated measurement conditions.
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typically the same for
10 dB higher incident average and modulated optical power.
‡ For wavelength:
(1310 ±20) nm
(option -100, 102).
System performance
Relative frequency
response uncertainty
Frequency response
repeatability (typ.)
Group delay uncertainty
0.7 GHz to 4.5 GHz
±0.5 dBe typ.
±0.7 dBe
(±0.5 dBe typ.)
±0.8 dBe
(±0.6 dBe typ.)
±0.5 dBe typ.
±0.5 dBe typ
±0.6 dBe typ.
±1.3 dBe typ
±2.2 dBe
(±1.3 dBe typ.)
±2.2 dBe
(±1.3 dBe typ.)
±0.02 dBe
±0.02 dBe
±0.02 dBe
-98 dB(W/A) typ.
-103 dB(W/A)
-103 dB(W/A)
±1.5°
±1.5°
≥ -18 dB(W/A) [f1]
DUT response
≥ -18 dB(W/A) [f1]
DUT response
≥ -38 dB(W/A) [f1]
Minimum measurable frequency
response (noise floor ) [f2] [f4]
Phase uncertainty
(typ.) [f3]
50 MHz to 0.7 GHz
DUT response
≥ -38 dB(W/A)
Absolute frequency
response uncertainty
10 MHz to 50 MHz
DUT response
≥ -38 dB(W/A) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±1.0° → ±8 ps (0.5 GHz aperture)
[f1] For DUT optical peak output power ≤ +7 dBm.
[f2] IFBW = 100 Hz.
[f3] Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of ≤ 0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty < ±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod
(in deg).
[f4] Average value over frequency range
8
Specifications for electro-optical measurements at 1550 nm
N4374B system with network analyzer
(E/O mode)
E5071C -245
Specifications are valid under the stated measurement conditions.
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typically the same for
10 dB higher incident average and modulated optical power.
‡ For wavelength:
(1550 ±20) nm
(option -101, 102).
System performance
Relative frequency
response uncertainty
Frequency response
repeatability (typ.)
Group delay uncertainty
0.7 GHz to 4.5 GHz
±0.5 dBe typ.
±0.7 dBe
(±0.5 dBe typ.)
±0.8 dBe
(±0.6 dBe typ.)
±0.5 dBe typ.
±0.5 dBe typ
±0.6 dBe typ.
±1.3 dBe typ
±2.2 dBe
(±1.3 dBe typ.)
±2.2 dBe
(±1.3 dBe typ.)
±0.02 dBe
±0.02 dBe
±0.02 dBe
-100 dB(W/A) typ.
-103 dB(W/A)
-103 dB(W/A)
±1.0°
±1.0°
≥ -18 dB(W/A) [f1]
DUT response
≥ -18 dB(W/A) [f1]
DUT response
≥ -38 dB(W/A) [f1]
Minimum measurable frequency
response (noise floor ) [f2] [f4]
Phase uncertainty
(typ.) [f3]
50 MHz to 0.7 GHz
DUT response
≥ -38 dB(W/A)
Absolute frequency
response uncertainty
10 MHz to 50 MHz
DUT response
≥-38 dB(W/A) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±1.0° → ±8 ps (0.5 GHz aperture)
[f1] For DUT optical peak output power ≤ +7 dBm.
[f2] IFBW = 100 Hz.
[f3] Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of ≤ 0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty < ±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod
(in deg).
[f4] Average value over frequency range.
9
Specifications for opto-electrical measurements at 1310 nm
N4374B system with network analyzer
(O/E mode)
E5071C -245
Specifications are valid under the stated measurement conditions.
‡ With external optical source input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1310 ±20) nm
(option -100, 102)
System performance
Relative frequency
response
uncertainty[f2]
Frequency response
repeatability (typ.) [f2]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
[f8]
0.7 GHz to 4.5 GHz
±0.5 dBe typ.
±0.7 dBe
(±0.5 dBe [f8] )
±0.8 dBe
(±0.6 dBe [f8] )
±0.5 dBe typ.
±0.5 dBe typ.
±0.6 dBe typ.
±1.2 dBe typ
±1.8 dBe
(±1.2 dBe [f8] )
±1.8 dBe
(±1.2 dBe [f8] )
±0.02 dBe
±0.02 dBe
±0.03 dBe
-83 dB(A/W) typ.
-92 dB(A/W)
-92 dB(A/W)
±1.0°
±1.0°
≥ -36 dB(A/W) [f1]
DUT response
≥ -36 dB(A/W) [f1]
DUT response
≥ -46 dB(A/W) [f1]
Minimum measurable frequency
response (noise floor ) [f2] [f3] [f5]
Phase uncertainty
(typ.) [f2][f4]
50 MHz to 0.7 GHz
DUT response
≥ -46 dB(A/W)
Absolute frequency
response uncertainty
10 MHz to 50 GHz
DUT response
≥ -36 dB(A/W) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±1.0° → ±8 ps (0.5 GHz aperture)
For DUT response max. +10 dB (A/W).
For +4 dBm average output power from LCA optical output
IFBW = 100 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of ≤0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty <±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod.(in deg).
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -100 or -102.
Typical with internal source.
10
Specifications for opto-electrical measurements at 1550 nm
N4374B system with network analyzer
(O/E mode)
E5071C -245
Specifications are valid under the stated measurement conditions.
‡ With external optical source input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1550 ±20) nm
(option -101, 102)
System performance
Relative frequency
response
uncertainty[f2]
Frequency response
repeatability (typ.) [f2]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
[f8]
0.7 GHz to 4.5 GHz
±0.5 dBe typ.
±0.7 dBe
(±0.5 dBe [f8] )
±0.8 dBe
(±0.6 dBe [f8] )
±0.5 dBe typ.
±0.5 dBe typ.
±0.6 dBe typ.
±1.2 dBe typ
±2.0 dBe
(±1.2 dBe [f8] )
±2.1 dBe
(±1.2 dBe [f8] )
±0.02 dBe
±0.02 dBe
±0.03 dBe
-83 dB(A/W) typ.
-92 dB(A/W)
-90 dB(A/W)
±1.0°
±1.0°
≥ -36 dB(A/W) [f1]
DUT response
≥ -36 dB(A/W) [f1]
DUT response
≥ -46 dB(A/W) [f1]
Minimum measurable frequency
response (noise floor ) [f2] [f3] [f5]
Phase uncertainty
(typ.) [f2][f4]
50 MHz to 0.7 GHz
DUT response
≥ -46 dB(A/W)
Absolute frequency
response uncertainty
10 MHz to 50 MHz
DUT response
≥ -36 dB(A/W) [f1]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±1.0° → ±8 ps (0.5 GHz aperture)
For DUT response max. +10 dB (A/W).
For +4 dBm average output power from LCA optical output
IFBW = 100 Hz.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of ≤0.2 GHz to avoid phase wraps). Excluding a
constant group delay offset of <±0.3 ns typ. (cable length uncertainty <±0.06 m). A constant group delay offset leads to a phase offset ∆φ = 360° × ∆GD × fmod.(in deg).
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -101 or -102.
Typical with internal source.
11
Specifications for optical to optical measurements at 1310 nm
N4374B system with networrk analyzer
(O/O mode)
E5071C -245
Specifications are valid under the stated measurement conditions and after user calibration with LCA optical output set to
maximum average power (+4 dBm)
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typically the same for
10 dB higher incident average and modulated optical power.
‡ With external optical source input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1310 ±20) nm
(option -100, 102).
System performance
10 MHz to 50 MHz
50 MHz to 0.7 GHz
0.7 GHz to 4.5 GHz
Relative frequency
DUT response
response uncertainty[f2]
≥ -13 dBe
( ≥-6.5 dBo) [f4]
±0.25 dBe, (typ.)
(±0.125 dBo ), (typ.)
±0.25 dBe
(±0.125 dBo)
±0.25 dBe
(±0.125 dBo)
±1.0 dBe typ.
(±0.5 dBo typ.)
±1.0 dBe
(±0.5 dBo)
±1.0 dBe
(±0.65dBo)
±0.02 dBe
±0.02 dBe
±0.02 dBe
-76 dBe typ.
(-38 dBo)
-82 dBe
(-41 dBo)
-80 dBe
(-40 dBo )
±0.5°
±0.5°
Absolute frequency
DUT response
response uncertainty[f2]
≥ -13 dBe [f4]
( ≥-6.5 dBo)
Frequency response
repeatability (typ.) [f2]
DUT response
≥ -13 dBe
( ≥-6.5 dBo) [f4]
Minimum measurable frequency
response (noise floor ) [f1] [f3][f5]
Phase uncertainty
(typ.) [f2][f3]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
.
DUT response
≥ -13 dBe
(≥-6.5 dBo) [f4]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±1.0° → ±8 ps (0.5 GHz aperture)
IFBW = 100 Hz.
For +4 dBm average output power from LCA optical output.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of ≤ 0.2 GHz to avoid phase wraps).
For DUT response maximum +6 dBe ( +3dBo ) gain.
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -100 or -102.
12
Specifications for optical to optical measurements at 1550 nm
N4374B system with networrk analyzer
(O/O mode)
E5071C -245
Specifications are valid under the stated measurement conditions and after user calibration with LCA optical output set to
maximum average power (+4 dBm)
‡ At optical input 1 (“+ 7 dBm max”). At optical input 2 (“+ 17 dBm max”), specifications are typically the same for
10 dB higher incident average and modulated optical power.
‡ With external optical source input all specifications are typical [f2][f6][f7]
‡ For wavelength:
(1550 ±20) nm
(option -101, 102).
System performance
10 MHz to 50 MHz
50 MHz to 0.7 GHz
0.7 GHz to 4.5 GHz
Relative frequency
DUT response
response uncertainty[f2]
≥ -13 dBe
( ≥-6.5 dBo) [f4]
±0.25 dBe, (typ.)
(±0.125 dBo ), (typ.)
±0.25 dBe
(±0.125 dBo)
±0.25 dBe
(±0.125 dBo)
Absolute frequency
DUT response
response uncertainty[f2]
≥ -13 dBe [f4]
( ≥-6.5 dBo)
±1.0 dBe typ.
(±0.5 dBo typ.)
±1.0 dBe
(±0.5 dBo)
±1.0 dBe
(±0.65dBo)
±0.02 dBe
±0.02 dBe
±0.02 dBe
-76 dBe typ.
(-38 dBo)
-82 dBe
(-41 dBo)
-80 dBe
(-40 dBo )
±0.5°
±0.5°
Frequency response
repeatability (typ.) [f2]
DUT response
≥ -13 dBe
( ≥-6.5 dBo) [f4]
Minimum measurable frequency
response (noise floor ) [f1] [f3][f5]
Phase uncertainty
(typ.) [f2][f3]
Group delay uncertainty
[f1]
[f2]
[f3]
[f4]
[f5]
[f6]
[f7]
DUT response
≥ -13 dBe
(≥-6.5 dBo) [f4]
-
Derived from phase uncertainty, see section
“Group delay uncertainty”.
Example: ±1.0° → ±8 ps (0.5 GHz aperture)
IFBW = 100 Hz.
For +4 dBm average output power from LCA optical output.
Except phase wrap aliasing (example: a DUT group delay of 5 ns (1 m cable length) requires a frequency step size of ≤ 0.2 GHz to avoid phase wraps).
For DUT response maximum +6 dBe ( +3dBo ) gain.
Average value over frequency range.
After CW responsivity and user calibration with external source.
Requires option -101 or -102.
13
Specifications for electrical-electrical measurements (E/E mode)
All specifications of the E5071C -245 Network Analyzer apply.
Please see the corresponding Network Analyzer data sheet and User’s Guide
Group delay uncertainty
For more details see specifications of the E5071C.
Group delay
Group delay is computed by measuring the phase change within a specified
aperture (for aperture see below.
GD [s] =
Phase change [deg]
----------------------------------------Aperture [Hz] * 360
(1)
Group delay uncertainty
Is calculated from the specified phase uncertainty and from the aperture (for aperture see below):
GD [±s] =
Phase uncertainty [±deg]
--------------------------------------- *sqrt(2)
Aperture [Hz] * 360
(2)
Aperture
Determined by the frequency span and the number of points per sweep
Aperture:
(frequency span) / (number of points–1)
GD Range
The maximum group delay is limited to measuring no more than ±180 degrees of
phase change within the selected aperture (see Equation 1).
14
General Characteristics
Shipping contents
1x Network-analyzer E5071C-245
1x N4374B optical test set
3x 81000 NI optical adapter
1x 4374B-90A01 Getting started
1x 4373B-90CD1 LCA support CD
1x 1150-7896 Keyboard
1x 1150-7799 Mouse
1x 8121-1242 USB cable
1x E5525-10285 UK6 report
2x 8120-8862 N-type male-male RF cable (0.5m)
1x 9320-6677 RoHS addendum for Photonic accessories
1x 9320-6654 RoHS addendum for Photonic T&M products
1x 11852B-CFG001 Minimum loss pad
Assembled dimensions: (H x W x D)
37.1 cm x 43.8 cm x 47.3 cm,
(12.5 in x 17.3 in x 18.7 in)
Weight
Product net weight:
27.3 kg ( lbs)
Packaged product:
47.3 kg (104.3 lbs)
Power Requirements
90 to 132 V AC, or 198 to 264V AC
Automatic switched
47 to 63 Hz
2 power cables
E5071C
Optical test set:
Additional, option dependent shipping contents:
-021 straight connector:
2x N4373-87907 0.5m FC/APC to FC/PC patch cord
1x 1005-0256 FC/PC feedthrough
-022 angled connector:
2x N4373-87906 0.5m FC/APC to FC/APC patch cord
1x 1005-1027 FC/PC adapter for APC
-050 external optical source input
1x PMF patchcord 1.0m FC/APC narrow key
1x 81000NI optical adapter FC
max. 350 VA
max. 40 VA
Network analyzer
Option 332
E5071C -245
Storage temperature range
-40° C to +70° C
LCA connector types at optical testset
LCA electrical input
Type N (f)
LCA electrical output
Type N (f)
LCA optical input 1
9um single-mode angled [1],
with Agilent universal adapter
LCA optical input 2
9um single-mode angled [1],
with Agilent universal adapter
LCA optical output
9um single-mode angled[1], with
Agilent universal adapter
LCA external TX input
9um polarization maintaining
(option -050 only)
single-mode angled, with
Agilent universal adapter
Operating temperature range
+5° C to +35° C
Humidity
15 % to 80 % relative humidity, non-condensing
Altitude (operating)
0 ... 2000 m
Recommended re-calibration period
1 year
[1]
The optical test set always has angled connectors.
Depending on the selected option (-012 straight, -022 angled)
the appropriate jumper cable will be delivered.
This jumper cable must always be used in front to the optical
test set to protect the connectors at the optical test set
Laser Safety Information
All laser sources listed above are classified as Class 1M
according to IEC 60825 1 (2001).
All laser sources comply with 21 CFR 1040.10 except for
deviations pursuant to Laser Notice No. 50,
dated 2001-July-26.
15
Mechanical Outline Drawings, option -332, -362 (all dimensions in mm)
16
Ordering informations
The N4374B consists of an optical test set and an electrical network analyzer which are mechanically connected.
To protect your network analyzer investment, Agilent offers the integration of an already owned ENA-C with the optical
test set as listed below.
All systems have 1 year warranty with the option to extend this to 3 or 5 years.
N4374B LCA ordering options
Network-analyzer options
N4374B - 332
4.5 GHz LCA based on E5071C -245 , including Bias-T
Network-analyzer integration options
N4374B - 362
Integration of customer ENC-C
- E5071C -240,-245
- all other NWA call factory
Optical wavelength options
N4374B-100
1310 nm source optical test set
N4374B-101
1550 nm source optical test set
N4374B-102
1310 nm and 1550 nm source optical test set
Configuration independent options
N4374B-010
Time domain option
N4374B-050
External optical source input
N4374B-021
Straight connector interface (external 0.5 m patch cord)
N4374B-022
Angled connector interface (external 0.5 m patch cord)
Service and Repair
R1280A
1 year Return-to-Agilent warranty extended to 3 or 5 years
R1282A
Agilent calibration up front support plan 3 or 5 year coverage
Required accessories ( to be ordered separtely )
85092C
2 port electrical calibration module
( -00F & 00A recommended)
17
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© Agilent Technologies, Inc. 2008
Printed in USA, December 17th, 2008
5989-9115EN