IDT IDT74FCT521A

IDT54/74FCT521
IDT54/74FCT521A
IDT54/74FCT521B
IDT54/74FCT521C
FAST CMOS 8-BIT
IDENTITY COMPARATOR
Integrated Device Technology, Inc.
FEATURES:
DESCRIPTION:
The IDT54/74FCT521/A/B/C are 8-bit identity comparators
built using an advanced dual metal CMOS technology. These
devices compare two words of up to eight bits each and
provide a LOW output when the two words match bit for bit.
The expansion input IA = B also serves as an active LOW
enable input.
FUNCTIONAL BLOCK DIAGRAM
PIN CONFIGURATIONS
A0
B0
A2
B2
A3
B3
20
A0
2
3
19
OA=B
18
B7
17
A7
16
B6
15
14
A6
B5
13
A5
4
P20-1
D20-1
SO20-2
&
E20-1
VCC
B1
A2
5
B2
A3
7
B3
GND
9
12
B4
10
11
A4
6
8
OA=B
2604 drw 01
DIP/SOIC/CERPACK
TOP VIEW
A5
B5
INDEX
A6
B6
3 2
A7
B7
IA=B
1
B0
A1
A1
B1
A4
B4
IA=B
A0
IA=B
VCC
•
•
•
•
•
IDT54/74FCT521 equivalent to FAST speed
IDT54/74FCT521A 35% faster than FAST
IDT54/74FCT521B 50% faster than FAST
IDT54/74FCT521C 60% faster than FAST
Equivalent to FAST output drive over full temperature
and voltage supply extremes
IOL = 48mA (commercial), and 32mA (military)
CMOS power levels (1mW typ. static)
TTL input and output level compatible
CMOS output level compatible
Substantially lower input current levels than FAST
(5µA max.)
B0
•
•
•
•
•
• Product available in Radiation Tolerant and Radiation
Enhanced versions
• JEDEC standard pinout for DIP and LCC
• Military product compliant to MIL-STD-883, Class B
TM
2604 drw 03
A1
4
B1
5
A2
6
B2
A3
7
1
OA=B

20 19
18
L20-2
8
17
B7
A7
16
B6
15
A6
14
B5
B4
A4
A5
2604 drw 02
LCC
TOP VIEW
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
FAST is a trademark of National Semiconductor Co.
MILITARY AND COMMERCIAL TEMPERATURE RANGES
1992 Integrated Device Technology, Inc.
GND
B3
9 10 11 12 13
7.16
MAY 1992
DSC-4617/2
1
IDT54/74FCT521/A/B/C FAST CMOS
8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
FUNCTION TABLE(1)
PIN DESCRIPTION
Pin Names
A0 - A 7
Word A Inputs
B0 - B 7
Word B Inputs
IA
OA
INPUTS
Description
IA
=B
Expansion or Enable Input (Active LOW)
=B
Identity Output (Active LOW)
=B
L
L
H
H
2604 tbl* 05
OUTPUT
A, B
OA
A = B*
A≠B
A = B*
A≠B
NOTE:
1. H = HIGH Voltage Level
L = LOW Voltage Level
*A0 = B0, A1 = B1, A2 = B2, etc.
ABSOLUTE MAXIMUM RATINGS(1)
=B
L
H
H
H
2604 tbl* 06
CAPACITANCE (TA = +25°C, f = 1.0MHz)
Symbol
Rating
Commercial
Military
Unit
VTERM(2)
Terminal Voltage
with Respect to
GND
–0.5 to +7.0
–0.5 to +7.0
V
VTERM(3)
Terminal Voltage
with Respect to
GND
–0.5 to VCC
–0.5 to VCC
V
Symbol
Parameter(1)
Input
CIN
Capacitance
COUT
Output
Capacitance
Conditions
VIN = 0V
Typ.
6
Max.
10
Unit
pF
VOUT = 0V
8
12
pF
NOTE:
2604 tbl* 02
1. This parameter is measured at characterization but not tested.
TA
Operating
Temperature
0 to +70
–55 to +125
°C
TBIAS
Temperature
Under Bias
–55 to +125
–65 to +135
°C
TSTG
Storage
Temperature
–55 to +125
–65 to +150
°C
PT
Power
Dissipation
0.5
0.5
W
IOUT
DC Output
Current
120
120
mA
NOTES:
2604 tbl* 01
1. Stresses greater than those listed under ABSOLUTE MAXIMUM
RATINGS may cause permanent damage to the device. This is a stress
rating only and functional operation of the device at these or any other
conditions above those indicated in the operational sections of this
specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage
may exceed VCC by +0.5V unless otherwise noted.
2. Input and VCC terminals only.
3. Outputs and I/O terminals only.
7.16
2
IDT54/74FCT521/A/B/C FAST CMOS
8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified: V LC = 0.2V; VHC = VCC – 0.2V
Commercial: TA = 0°C to +70°C, VCC = 5.0V ± 5%; Military: TA = –55°C to +125°C, VCC = 5.0V ± 10%
Parameter
Input HIGH Level
Test Conditions(1)
Guaranteed Logic HIGH Level
VIL
Input LOW Level
II H
Input HIGH Current
Symbol
VIH
II L
Input LOW Current
VIK
Clamp Diode Voltage
IOS
Short Circuit Current
VOH
Output HIGH Voltage
VOL
Output LOW Voltage
Min.
2.0
Typ.(2)
—
Max.
—
Unit
V
Guaranteed Logic LOW Level
—
—
0.8
V
VCC = Max.
µA
VI = VCC
—
—
5
VI = 2.7V
—
—
5(4)
VI = 0.5V
—
—
–5(4)
VI = GND
—
—
–5
—
–0.7
–1.2
V
–60
–120
—
mA
V
VCC = Min., IN = –18mA
VCC =
Max.(3) ,
VO = GND
VCC = 3V, VIN = VLC or VHC, IOH = –32µA
VHC
VCC
—
VCC = Min.
IOH = –300µA
VHC
VCC
—
VIN = VIH or VIL
IOH = –12mA MIL.
2.4
4.3
—
IOH = –15mA COM'L.
2.4
4.3
—
—
GND
VLC
VCC = 3V, VIN = VLC or VHC, IOL = 300µA
VCC = Min.
IOL = 300µA
—
GND
VLC(4)
VIN = VIH or VIL
IOL = 32mA MIL.
—
0.3
0.5
IOL = 48mA COM'L.
—
0.3
0.5
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient and maximum loading.
3. Not more than one output should be shorted at one time. Duration of the short circuit test should not exceed one second.
4. This parameter is guaranteed but not tested.
7.16
V
2604 tbl* 03
3
IDT54/74FCT521/A/B/C FAST CMOS
8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
POWER SUPPLY CHARACTERISTICS VLC = 0.2V; VHC = VCC – 0.2V
Test Conditions(1)
Symbol
ICC
Parameter
Quiescent Power Supply Current
∆ICC
ICCD
Quiescent Power Supply Current
TTL Inputs HIGH
Dynamic Power Supply Current (4)
IC
Total Power Supply Current (5)
VCC = Max.
VIN ≥ VHC; VIN ≤ VLC
VCC = Max.
VIN = 3.4V(3)
VCC = Max.
Outputs Open
One Input Toggling
50% Duty Cycle
VCC = Max.
Outputs Open
fi = 10MHz
One Bit Toggling
50% Duty Cycle
Min.
—
Typ.(2)
0.2
Max.
1.5
Unit
mA
—
0.5
2.0
mA
VIN ≥ VHC
VIN ≤ VLC
—
0.15
0.25
mA/
MHz
VIN ≥ VHC
VIN ≤ VLC (FCT)
VIN = 3.4V
VIN = GND
—
1.7
4.0
mA
—
2.0
5.0
NOTES:
1. For conditions shown as Max. or Min., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V); all other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply calculations.
5. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2 + fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current Caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Input Frequency
Ni = Number of Inputs at fi
All currents are in milliamps and all frequencies are in megahertz.
2604 tbl* 04
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
IDT54/74FCT521
Com'l.
Symbol
Mil.
IDT54/74FCT521A
IDT54/74FCT521B
IDT54/74FCT521C
Com'l.
Com'l.
Com'l.
Mil.
Mil.
Mil.
Parameter Condition(1) Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max. Min.(2) Max.
tPLH
Propagation CL = 50pF
tPHL
Delay
RL = 500Ω
Unit
1.5
11.0
1.5
15.0
1.5
7.2
1.5
9.5
1.5
5.5
1.5
7.3
1.5
4.5
1.5
5.1
ns
1.5
10.0
1.5
9.0
1.5
6.0
1.5
7.8
1.5
4.6
1.5
6.0
1.5
4.1
1.5
4.5
ns
An or Bn to
OA
=B
tPLH
Propagation
tPHL
Delay
IA = B to
OA = B
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
2604 tbl* 07
7.16
4
IDT54/74FCT521/A/B/C FAST CMOS
8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
TEST CIRCUITS AND WAVEFORMS
SWITCH POSITION
TEST CIRCUITS FOR ALL OUTPUTS
VCC
7.0V
500Ω
V OUT
VIN
Pulse
Generator
D.U.T.
50pF
RT
500Ω
SET-UP, HOLD AND RELEASE TIMES
Closed
All Other Tests
Open
3V
1.5V
0V
tH
TIMING
INPUT
3V
1.5V
0V
LOW-HIGH-LOW
PULSE
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
1.5V
tW
t REM
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
Open Drain
Disable Low
Enable Low
PULSE WIDTH
DATA
INPUT
ASYNCHRONOUS CONTROL
Switch
DEFINITIONS:
2604 tbl 08
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse
Generator.
CL
t SU
Test
t SU
1.5V
3V
1.5V
0V
tH
PROPAGATION DELAY
ENABLE AND DISABLE TIMES
ENABLE
DISABLE
3V
3V
1.5V
SAME PHASE
INPUT TRANSITION
t PLH
t PHL
CONTROL
INPUT
OUTPUT
NORMALLY SWITCH
LOW CLOSED
t PZH
VOL
t PLH
t PHL
OUTPUT SWITCH
NORMALLY OPEN
HIGH
3V
OPPOSITE PHASE
INPUT TRANSITION
1.5V
0V
t PLZ
t PZL
0V
VOH
1.5V
OUTPUT
1.5V
3.5V
1.5V
3.5V
0.3V
V OL
t PHZ
0.3V
1.5V
0V
V OH
0V
0V
NOTES
2604 drw 04
1. Diagram shown for input Control Enable-LOW and input Control
Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0 MHz; ZO ≤ 50Ω; tF ≤ 2.5ns;
tR ≤ 2.5ns.
7.16
5
IDT54/74FCT521/A/B/C FAST CMOS
8-BIT IDENTITY COMPARATOR
MILITARY AND COMMERCIAL TEMPERATURE RANGES
ORDERING INFORMATION
IDT
XX
Temp. Range
FCT
XXXX
X
X
Device Type
Package
Process
Blank
B
Commercial
MIL-STD-883, Class B
P
D
E
L
SO
Plastic DIP
CERDIP
CERPACK
Leadless Chip Carrier
Small Outline IC
521
521A
521B
521C
8-Bit Comparator
Fast 8-Bit Comparator
Very Fast 8-Bit Comparator
Super Fast 8-Bit Comparator
54
74
–55°C to +125°C
0°C to +70°C
2604 cnv* 09
7.16
6