IDT IDT74FCT2240ATSO

IDT74FCT2240AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
FAST CMOS OCTAL
BUFFER/LINE DRIVER
DESCRIPTION:
FEATURES:
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IDT74FCT2240AT/CT
The IDT octal buffer/line driver is built using an advanced dual metal
CMOS technology. The FCT2240T is designed to be employed as a
memory and address driver, clock driver, and bus-oriented transmitter/
receiver which provides improved board density.
The FCT2240T has balanced output drive with current limiting resistors.
This offers low ground bounce, minimal undershoot, and controlled output
fall times, reducing the need for external series terminating resistors. The
FCT2240T is a plug-in replacement for the FCT240T.
A and C grades
Low input and output leakage ≤1µA (max.)
CMOS power levels
True TTL input and output compatibility:
– VOH = 3.3V (typ.)
– VOL = 0.3V (typ.)
Meets or exceeds JEDEC standard 18 specifications
Resistor outputs (-15mA IOH, 12mA IOL)
Reduced system switching noise
Available in SOIC and QSOP packages
FUNCTIONAL BLOCK DIAGRAM
OE A
OE B
DA 0
OA 0
OB 0
DB 0
DA 1
OA 1
OB 1
DB 1
DA 2
OA 2
OB 2
DB 2
DA 3
OA 3
OB 3
DB 3
The IDT logo is a registered trademark of Integrated Device Technology, Inc.
INDUSTRIAL TEMPERATURE RANGE
JUNE 2002
1
© 2002 Integrated Device Technology, Inc.
DSC-5585/2
IDT74FCT2240AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
ABSOLUTE MAXIMUM RATINGS(1)
PIN CONFIGURATION
OEA
1
20
VCC
DA0
2
3
19
18
OEB
OA0
4
17
DB0
OB1
5
16
OA1
DA2
6
15
OB2
7
14
DB1
OA2
DA3
8
13
DB2
OB3
GND
9
12
OA3
10
11
DB3
OB0
DA1
Symbol
Description
VTERM(2)
Max
Unit
VTERM(3)
Terminal Voltage with Respect to GND
–0.5 to +7
V
Terminal Voltage with Respect to GND
–0.5 to VCC+0.5
V
TSTG
Storage Temperature
–65 to +150
°C
IOUT
DC Output Current
–60 to +120
mA
NOTES:
1. Stresses greater than those listed under ABSOLUTE MAXIMUM RATINGS may cause
permanent damage to the device. This is a stress rating only and functional operation
of the device at these or any other conditions above those indicated in the operational
sections of this specification is not implied. Exposure to absolute maximum rating
conditions for extended periods may affect reliability. No terminal voltage may exceed
Vcc by +0.5V unless otherwise noted.
2. Inputs and Vcc terminals only.
3. Output and I/O terminals only.
CAPACITANCE (TA = +25°C, F = 1.0MHz)
Parameter(1)
Symbol
SOIC/ QSOP
TOP VIEW
Conditions
Typ.
Max.
CIN
Input Capacitance
VIN = 0V
6
10
pF
COUT
Output Capacitance
VOUT = 0V
8
12
pF
NOTE:
1. This parameter is measured at characterization but not tested.
PIN DESCRIPTION
Pin Names
OEA, OEB
Description
3-State Output Enable Inputs (Active LOW)
Dxx
Inputs
Oxx
Outputs
FUNCTION TABLE(1)
OEA
L
L
H
Inputs
OEB
L
L
H
NOTE:
1. H = HIGH Voltage Level
X = Don’t Care
L = LOW Voltage Level
Z = High Impedance
2
Unit
D
L
H
X
Outputs
H
L
Z
IDT74FCT2240AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
DC ELECTRICAL CHARACTERISTICS OVER OPERATING RANGE
Following Conditions Apply Unless Otherwise Specified:
Industrial: TA = –40°C to +85°C, VCC = 5.0V ±5%
Symbol
Test Conditions(1)
Parameter
Min.
Typ.(2)
Max.
Unit
VIH
Input HIGH Level
Guaranteed Logic HIGH Level
2
—
—
V
VIL
Input LOW Level
Guaranteed Logic LOW Level
—
—
0.8
V
IIH
Input HIGH Current
VCC = Max.
VI = 2.7V
—
—
±1
µA
IIL
Input LOW Current
VCC = Max.
VI = 0.5V
—
—
±1
µA
IOZH
High Impedance Output Current
VCC = Max.
VI = 2.7V
—
—
±1
µA
IOZL
(3-State Output Pins)
VI = 0.5V
—
—
±1
II
Input HIGH Current
VCC = Max., VI = VCC (Max.)
—
—
±1
VIK
Clamp Diode Voltage
VCC = Min., IIN = –18mA
VH
Input Hysteresis
ICC
Quiescent Power Supply Current
—
VCC = Max.
VIN = GND or VCC
µA
—
–0.7
–1.2
V
—
200
—
mV
—
0.01
1
mA
Min.
16
-16
2.4
Typ.(2)
48
-48
3.3
Max.
—
—
—
Unit
mA
mA
V
—
0.3
0.5
V
OUTPUT DRIVE CHARACTERISTICS
Symbol
IODL
IODH
VOH
VOL
Parameter
Output LOW Current
Output HIGH Current
Output HIGH Voltage
Output LOW Voltage
Test Conditions(1)
VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3)
VCC = 5V, VIN = VIH or VIL, VOUT = 1.5V(3)
VCC = Min
IOH = –15mA
VIN = VIH or VIL
VCC = Min
IOL = 12mA
VIN = VIH or VIL
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Not more than one output should be tested at one time. Duration of the test should not exceed one second.
3
IDT74FCT2240AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
POWER SUPPLY CHARACTERISTICS
Test Conditions(1)
Min.
Typ.(2)
Max.
Unit
—
0.5
2
mA
VIN = VCC
VIN = GND
—
0.06
0.12
mA/
MHz
VCC = Max.
Outputs Open
fi = 10MHz
VIN = VCC
VIN = GND
—
0.6
2.2
mA
50% Duty Cycle
OEA or OEB = GND
One Bit Toggling
VIN = 3.4V
VIN = GND
—
0.9
3.2
VCC = Max.
Outputs Open
fi = 2.5MHz
VIN = VCC
VIN = GND
—
1.2
3.4(5)
50% Duty Cycle
OEA or OEB = GND
Four Bits Toggling
VIN = 3.4V
VIN = GND
—
3.2
11.4(5)
Symbol
Parameter
∆ICC
Quiescent Power Supply Current
TTL Inputs HIGH
VCC = Max.
VIN = 3.4V(3)
ICCD
Dynamic Power Supply
Current(4)
VCC = Max.
Outputs Open
OEA or OEB = GND
One Input Toggling
50% Duty Cycle
IC
Total Power Supply Current(6)
NOTES:
1. For conditions shown as Min. or Max., use appropriate value specified under Electrical Characteristics for the applicable device type.
2. Typical values are at VCC = 5.0V, +25°C ambient.
3. Per TTL driven input (VIN = 3.4V). All other inputs at VCC or GND.
4. This parameter is not directly testable, but is derived for use in Total Power Supply Calculations.
5. Values for these conditions are examples of ∆ICC formula. These limits are guaranteed but not tested.
6. IC = IQUIESCENT + IINPUTS + IDYNAMIC
IC = ICC + ∆ICC DHNT + ICCD (fCP/2+ fiNi)
ICC = Quiescent Current
∆ICC = Power Supply Current for a TTL High Input (VIN = 3.4V)
DH = Duty Cycle for TTL Inputs High
NT = Number of TTL Inputs at DH
ICCD = Dynamic Current caused by an Input Transition Pair (HLH or LHL)
fCP = Clock Frequency for Register Devices (Zero for Non-Register Devices)
fi = Output Frequency
Ni = Number of Outputs at fi
All currents are in milliamps and all frequencies are in megahertz.
SWITCHING CHARACTERISTICS OVER OPERATING RANGE
FCT2240AT
FCT2240CT
Parameter
Condition(1)
tPLH
tPHL
Propagation Delay
Dx to Ox
CL = 50pF
RL = 500Ω
tPZH
tPZL
Output Enable Time
1.5
6.2
1.5
5.8
ns
tPHZ
tPLZ
Output Disable Time
1.5
5.6
1.5
5.2
ns
Symbol
NOTES:
1. See test circuit and waveforms.
2. Minimum limits are guaranteed but not tested on Propagation Delays.
4
Min.(2)
1.5
Max.
Min.(2)
Max.
Unit
4.8
1.5
4.3
ns
IDT74FCT2240AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
TEST CIRCUITS AND WAVEFORMS
V CC
SWITCH POSITION
7.0V
500Ω
V OUT
VIN
Pulse
Generator
D.U.T
.
50pF
RT
500Ω
Test
Switch
Open Drain
Disable Low
Enable Low
Closed
All Other Tests
Open
DEFINITIONS:
CL = Load capacitance: includes jig and probe capacitance.
RT = Termination resistance: should be equal to ZOUT of the Pulse Generator.
CL
Octal link
Test Circuits for All Outputs
DATA
INPUT
tH
tSU
TIMING
INPUT
ASYNCHRONOUS CONTROL
PRESET
CLEAR
ETC.
SYNCHRONOUS CONTROL
PRESET
CLEAR
CLOCK ENABLE
ETC.
3V
1.5V
0V
3V
1.5V
0V
tREM
tSU
LOW-HIGH-LOW
PULSE
1.5V
tW
3V
1.5V
0V
HIGH-LOW-HIGH
PULSE
3V
1.5V
0V
tH
1.5V
Octal link
Pulse Width
Octal link
Set-Up, Hold, and Release Times
ENABLE
SAME PHASE
INPUT TRANSITION
tPLH
tPHL
OUTPUT
tPLH
OPPOSITE PHASE
INPUT TRANSITION
tPHL
3V
1.5V
0V
DISABLE
3V
1.5V
CONTROL
INPUT
OUTPUT
NORMALLY
LOW
3V
1.5V
0V
OUTPUT
NORMALLY
HIGH
Octal link
SWITCH
CLOSED
tPZH
SWITCH
OPEN
0V
tPLZ
tPZL
VOH
1.5V
VOL
3.5V
3.5V
1.5V
0.3V
VOL
tPHZ
0.3V
1.5V
0V
VOH
0V
Octal link
Propagation Delay
Enable and Disable Times
NOTES:
1. Diagram shown for input Control Enable-LOW and input Control Disable-HIGH.
2. Pulse Generator for All Pulses: Rate ≤ 1.0MHz; tF ≤ 2.5ns; tR ≤ 2.5ns.
5
IDT74FCT2240AT/CT
FAST CMOS OCTAL BUFFER/LINE DRIVER
INDUSTRIAL TEMPERATURE RANGE
ORDERING INFORMATION
IDT
XX
Temperature
Range
FCT
X
X
Device
Type
Package
SO
Q
Small Outline IC
Quarter-size Small Outline Package
2240AT Fast CMOS Octal Buffer/Line Driver
2240CT
74
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6
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