### DLZ Series Group B, H2 - Unidirectional

```MIL PROCESSING GROUP B TEST PLAN FOR DLZ SERIES – H2 VERSIONS
(Unidirectional)
TEST
CONDITION
MIL-STD-750
TEST
METHOD
SUBGROUP1
Solderability
2026
Resistance to
Solvents
1022
SUBGROUP 2
Temp Cycle
10 cylces, 15 minutes @ min/max rated
temperatures
1051
Fine Leak
1 x 10-8 atmcc/sec
1071G/H
Gross Leak
TA = +125°C, no bubbles
1071D
Electrical
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
4016
4022
SUBGROUP 3
Electrical
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
Pulse
20 pulses @ IPP = 10A, tp = 8 x 20µs
Electrical
Reverse Current (IR) @ rated VWM
4016
(HRTB)
TA = +125°C @ rated VWM for 340 hours
1027
Electrical
Reverse Current (IR) @ rated VWM, D-IR = 100% or
20% of Grp A Limit, Whichever is greater
Breakdown Voltage (V(BR)) @ IT, D-V(BR) = ±5% from
SAMPLE
PLAN
(Units)
SMALL
LOT
(Units)
15 c=0
4 c=0
22 c=0
6 c=0
45 c=0
12 c=0
32 c=0
12 c=0
4016
4022
4016
4022
SUBGROUP 4
Decap, Internal
Visual
Design Verification, 1 device c=0
2075
Bond Strength
11 wires c=0
2037
SUBGROUP 5
Not Applicable
SUBGROUP 6
Electrical
Reverse Current (IR) @ rated VWM
Breakdown Voltage (V(BR)) @ IT
4016
4022
High Temperature
Life (no-op)
Tstg = +150°C for 340 hours
1032
Electrical
Reverse Current (IR) @ rated VWM, D-IR = 100% or
20% of Grp A Limit, Whichever is greater
Breakdown Voltage (V(BR)) @ IT, D-V(BR) = ±5% from