Bipolar or CMOS Process

ID 06-09-0104
REV A
TEST AND EOL FLOWCHART E-GRADE FLOW
TEST AND EOL FLOWCHART
E-GRADE FLOW
INCOMING
UPDATED 08/25/08
QUALITY INSPECTION AND GATE
Vendor:
Product:
Package:
Location of Wafer Fab:
Assembly:
Final Test:
Q.C. Test:
Source Accept Test:
Quality Contact:
FLOW
CHART
Linear Technology Corporation
Bipolar or CMOS Products
All Package Types
Linear Technology Corp., Milpitas, CA., or Camas, WA
Linear Technology Corporation, Penang, or Malaysia
or any approved assembly subcontractor
Linear Technology Corp., Milpitas, CA., or Singapore
Linear Technology Corp., Milpitas, CA., or Singapore
Linear Technology Corp., Milpitas, CA., or Singapore
Naib Girn, LTC Milpitas, CA
(408) 432-1900 Ext. 2519
PROCESS STEP
LTC INCOMING
INSPECTION
DESCRIPTION
INSPECTION/TEST
CRITERIA
CHECK QUALITY OF
PACKAGE DIMENSION
INCOMING
ASSEMBLED MATERIAL
METHOD &
EQUIPMENT
MANUFACTURING PROCESS
QUALITY MONITOR / SURVEILLANCE
REWORK
SAMPLING PLAN
OPTICAL
COMPARATOR &
CALIPERS
S/S = 2, ACC = 0
EXTERNAL VISUAL
3X TO 30X
MICROSCOPE
S/S 45, ACC = 0
MARK PERMANENCY (IF
INK MARK)
MIL-STD-883
METHOD 2015
S/S = 4, ACC = 0
SOLDERABILITY
MIL-STD-883
METHOD 2003
S/S = 3, ACC = 0
DIE ATTACH QUALITY
DIE SHEAR
S/S = 11. ACC = 0
LEAD FATIGUE TEST
LEAD FATIGUE
TESTER
S/S = 10, ACC = 0
SPC TECHNIQUE
% LAR TREND
CHART
CLASS TEST
ELECTRICAL TEST
TEST TO GUARD BANDED
DATASHEET TEST LIMITS
INTEGRATED
CIRCUIT TEST
SYSTEM
100%
MINIMUM YIELD
CONTROL
QA ELECTRICAL
TEST @ +25°C
ELECTRICAL
QUALITY
TEST TO GUARD BANDED
DATASHEET TEST LIMITS
INTEGRATED
CIRCUIT TEST
SYSTEM
S/S = 315, ACC = 0
PPM CHART
QA ELECTRICAL
TEST @ +85°C
AND @ 0°C OR AS
SPECIFIED IN THE
DATA SHEET
ELECTRICAL
QUALITY
TEST TO GUARD BANDED
DATASHEET TEST LIMITS
INTEGRATED
CIRCUIT TEST
SYSTEM
S/S = 125 MIN
ACC = 0
PPM CHART
EXTERNAL VISUAL
INSPECTION
CHECK FOR
PACKAGE QUALITY
VISUAL: BENT LEADS,
LEAD FORM CRITERIA,
MOLD VOIDS/CRACKS
ETC
UNAIDED EYE
100%
YIELD CHART
QA POST PACK
INSPECTION
PACKAGE/PACK
QUALITY INSPECTION
VERIFY CORRECT TOP
MARK, CORRECT PACK
METHOD, CORRECT
LABELING, EXTERNAL
VISUAL INSPECTION,
BENT LEADS
3X TO 10X
MICROSCOPE
INSPECTION
S/S = 116, ACC = 0
% LAR AND PPM
P.A. CHART
QA SHIPBENCH
INSPECTION
PLANT CLEARANCE
INSPECTION
PAPERWORK CHECK,
VERIFY CORRECT PART
NUMBER AND QUANTITY
UNAIDED EYE
INSPECTION
EVERY SHIPMENT
SHIP TO
CUSTOMER
LINEAR TECHNOLOGY CORPORATION
PAGE 1 OF 1
Similar pages